JP2005121567A - Scratching testing device and scratching test method - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a scratching testing device and a scratching test method capable of securing high scratching accuracy, while shortening a processing time of a scratching test. <P>SOLUTION: This device is equipped with a test material holding table 49 for holding a plurality of sheet-shaped test materials flatly in parallel, a plurality of scratching arms wherein a scratching needle 63 for scratching the test material held on the test material holding table 49 is held in the drooped state on one end, and a balance deadweight 75 for adjusting a pushing pressure of the scratching needle 63 to the test material at a prescribed fixed load is disposed movably in the arm longitudinal direction on the other end, respectively, rocking by fulcruming a point between the scratching needle 63 and the balance deadweight 75, and a sending means for moving relatively each scratching needle 63 of the plurality of scratching arms 59R, 59L integrally to the test materials. Concerning the scratching needle 63 of each scratching arm 59R, 59L, the same spot corresponding respectively of each test material is scratched by the same scratching needle 63. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention relates to a scratch test apparatus and a scratch test method for scratching a surface of a sheet-like material under test with a scratch needle and evaluating a sample from scratches on the sample surface.

  A photographic photosensitive material (hereinafter referred to as “photosensitive material”) may cause a so-called pressure failure that causes a photographic change (fogging, feeling of increase / decrease) due to an external pressure history. It is known that this pressure failure varies depending on how external force is applied and the state of the photosensitive material. The external force may be rubbed, pressed, bent or the like, and the sensitive material may be dry or in a processing solution. These are organized and there are currently the following evaluation items. That is, 1) dry scratch increase / decrease, 2) wet scratch increase / decrease, 3) dry push increase / decrease, 4) wet press increase / decrease, 5) knick increase / decrease, and 6) long-time nick.

  Since the manner of occurrence of pressure increase / decrease differs before exposure and after exposure, evaluation according to it is necessary. The above items 1), 3), 5) and 6) are tested before and after exposure, and 2) and 4) are tested after exposure.

  By the way, the above-mentioned feeling of increase / decrease in scratches is evaluated by a scratch test in which a sheet-like photosensitive material as a test material is scratched with a needle. This scratch test is also employed in the evaluation of emulsion strength.

  In this scratch test, a scratch test apparatus that can apply a desired test load to the needle is used. As shown in FIG. 13, in the scratch testing apparatus 1, the bed 7 is horizontally installed by the leg portion 5 provided with the adjuster 3. A photosensitive material holding table 9 is provided on the upper surface of the bed 7, and the photosensitive material holding table 9 is movable in one direction by a linear moving mechanism 11 (left and right direction in FIG. 13). A sheet-like long photosensitive material 13 is held on the upper surface of the photosensitive material holding base 9.

  A support column 15 is erected on the bed 7, and the support column 15 supports a substantially central portion of the scratch arm 17 in a swingable manner. A scratching needle 19 is attached to one end of the scratching arm 17 in a hanging manner, and the scratching needle 19 is pressed against the photosensitive material 13 with a predetermined load by a weight 21 attached upward. On the other hand, a counterweight 23 is attached to the other end side of the scratch arm 17.

  Further, a bolt 25 protruding from the other end surface of the scratch arm 17 is provided in the extending direction of the arm, and a screw-type fine adjustment weight (balancer) 27 is attached to the bolt 25. At the position of the bed 7 corresponding to the end of the bolt 25, a stopper rod 29 that can be moved up and down is provided. The stopper rod 29 is moved up and down by driving a motor 31 fixed to the bed 7. A U-shaped stopper 35 having a receiving portion 33 is fixed to the upper end of the stopper rod 29. Bolts 25 are arranged in the accommodating portion 33 of the stopper 35.

  In the scratch testing apparatus 1 configured as described above, first, the light-sensitive material holding table 9 holds the light-sensitive material 13 as the material to be tested. Next, in a state where the weight 21 is not attached, the scratching arm 17 is balanced to a substantially horizontal state while adjusting the counterweight 23, and then the scratching arm 17 is balanced to a horizontal state while finely adjusting the balancer 27. In this state, the bolt 25 is disposed in a non-contact state at the central portion of the accommodating portion 33 of the stopper 35.

  Next, the stopper rod 29 is lowered, and the other end side of the scratch arm 17 is pushed down by the stopper 35. Thereby, the one end side with the scratching needle 19 of the scratching arm 17 moves up. In this state, a weight 21 having a desired test load is attached to one end of the scratch arm 17. Next, the photosensitive material holding base 9 is moved leftward in FIG. 13, and the scratch test start position is made to coincide with the scratch needle 19.

  Next, by gradually raising the stopper rod 29, one end side of the scratch arm 17 is lowered, and the scratch needle 19 is landed on the photosensitive material 13 with a predetermined load. By moving the photosensitive material holding base 9 in the right direction in FIG. 13 from this state, the photosensitive material 13 is scratched by the scratching needle 19 pressed with a predetermined load. By comparing a plurality of scratches with different loads applied in this way, the feeling of increase / decrease in scratches and the evaluation of emulsion strength were evaluated.

The above-described conventional photosensitive material scratch test apparatus is equipped with a plurality of (for example, 10) weights for one sensitive material by gradually changing the weight to be attached in order of 1 g, 2 g, 5 g, 10 g, 20 g, and the like. Degree) scratches. At this time, the leveling of the scratch arm is performed when each weight is replaced.
However, it took a predetermined time to adjust the balancer to balance the left and right sides of the scratching arm and to balance the scratching arm in a horizontal state. Therefore, when 10 scratches are applied to the photosensitive material with different loads, if it takes 1 minute to level one time, it will take 10 minutes to scratch the photosensitive material. There was a problem that the processing time was long. Further, since the scratch arm is finely adjusted using the balancer, there is a possibility that the accuracy of the load may be reduced due to the backlash generated between the balancer and the bolt.

  The present invention has been made in view of the above situation, and it is an object of the present invention to provide a scratch test apparatus and a scratch test method capable of ensuring high scratch accuracy while shortening the processing time of the scratch test.

  In order to achieve the above object, a scratch test apparatus according to claim 1 of the present invention comprises a test material holding table for holding a plurality of sheet-like test materials in parallel and holding the test material. A scratching needle for scratching the material to be tested held on the table is suspended and held at one end, and a balance weight for adjusting the pressing force of the scratching needle to the material to be tested to a predetermined constant load is held at the other end. A plurality of scratching arms that are arranged so as to be movable in the longitudinal direction of the arm and swing around a point between the scratching needle and the balance weight, and each scratching needle of the plurality of scratching arms is integrated with the material under test. And a feeding means for relative movement to each other, wherein the scratching needles of the respective scratching arms scratch the corresponding portions of the respective test materials with the same scratching needles.

  In this scratch test apparatus, when the test material held on the test material holding base is moved relative to the scratch needle, the test material is scratched by the scratch needle. At this time, by providing a plurality of scratching needles, it is possible to scratch at a plurality of positions at the same time, and a plurality of different photosensitive materials can be scratched simultaneously.

  The scratch testing apparatus according to claim 2 is for scratching the material to be tested that holds a plurality of sheet-like materials to be tested in parallel in a plane, and the material to be tested that is held on the material to be tested. The scratching needle is suspended and held at one end, and the other end is provided with a balance weight that adjusts the pressing force of the scratching needle to the test material to a predetermined constant load so as to be movable in the longitudinal direction of the arm. A scratching arm that swings between the scratching needle and the balance weight as a fulcrum, a feeding means that moves the scratching needle of the scratching arm relative to the material to be tested, and the other end of the scratching arm. It is equipped with a linear motor mechanism that moves the balance weight.

  In this scratch test apparatus, a correlation between the position of the balance weight on the other end side of the scratch arm and the load applied to the scratch needle on the one end side of the scratch arm is obtained in advance, whereby the balance weight is determined by the linear motor mechanism. The desired load can be quickly applied to the scratching needle by moving it to the position. Moreover, since it is a linear motor mechanism, there is no backlash in the case of the conventional balancer.

  The scratch test apparatus according to claim 3 is for scratching the test material holding table for holding a plurality of sheet-shaped test materials in parallel and holding the test material held on the test material holding table. The scratching needle is suspended and held at one end, and the other end is provided with a balance weight that adjusts the pressing force of the scratching needle to the test material to a predetermined constant load so as to be movable in the longitudinal direction of the arm. A plurality of scratching arms that swing around a fulcrum between the scratching needle and the balance weight; a feed means that integrally moves the scratching needles of the plurality of scratching arms relative to the material to be tested; and each of the scratching A linear motor mechanism for moving a balance weight provided at the other end of the arm, and the scratching needles of the respective scratching arms are respectively connected to the same corresponding portions of the respective test materials with the same scratching needle. Characterized in that the scratching Tsu.

  In this scratch test apparatus, when the test material held on the test material holding base is moved relative to the scratch needle, the test material is scratched by the scratch needle. At this time, by providing a plurality of scratching needles, it is possible to scratch at a plurality of positions at the same time, and a plurality of different materials to be tested can be scratched simultaneously. Then, by obtaining in advance a correlation between the position of the balance weight on the other end side of each scratch arm and the load applied to the scratch needle on one end side of the scratch arm, the balance weight is brought to a predetermined position by the linear motor mechanism. By moving, a desired load is quickly applied to the scratching needle. Moreover, since it is a linear motor mechanism, there is no backlash in the case of the conventional balancer.

  The scratch test method according to claim 4 is a scratch test method in which a plurality of sheet-like materials to be held in parallel in a plane are scratched and evaluated while applying a predetermined load with a plurality of scratching needles. The scratching position by the first scratching needle on the test material and the scratching position by the second scratching needle are made different at the same time, and the same scratching position on each test material is set to the same. It is characterized by scratching with a scratching needle.

  In this scratch test method, the scratching position by the first scratching needle on the material to be tested and the scratching position by the second scratching needle are made different at the same time, and the same scratching position on each material to be tested is repeated. By using the same scratching needle, the same scratching needle was used as a result of applying the same load to the scratching, and as a result, the comparison of test results included factors of individual differences in the scratching needle. This makes it possible to improve testing accuracy.

  The scratch test method according to claim 5 is a scratch test method for evaluating a sheet-like material to be tested, which is held in parallel in a planar shape, by applying a predetermined load with a scratch needle, and evaluating it. The scratching needle is suspended and held at one end, and a balance weight for adjusting the pressing force of the scratching needle to the test material to a predetermined constant load is disposed at the other end so as to be movable in the longitudinal direction of the arm. A scratch arm that swings between the scratch needle and the balance weight as a fulcrum; once the balance weight is disposed on the other end side of the scratch arm, a desired pressing force is obtained from the other end side; A scratch test method, wherein the balance weight is moved to a predetermined position by a linear motor mechanism to bring the scratch needle into contact with a material to be tested.

  In this scratch test method, after the balance weight is once arranged on the other end side of the scratch arm, the balance weight is moved from the other end side to a position where a desired pressing force is obtained by a linear motor mechanism, and the scratch needle is moved. By contacting the material to be tested, the work of balancing horizontally for each scratch test becomes unnecessary, and the work of the scratch test can be simplified.

According to the scratch test apparatus according to the present invention, since a plurality of scratch arms holding the scratch needle are provided, the test material held on the test material holding table can be scratched at a plurality of positions at the same time. Different materials to be tested can be scratched simultaneously. As a result, the processing time of the scratch test can be greatly shortened.
In addition, since the balance weight of the scratch arm is moved by the linear motor mechanism and the pressing force applied to the material to be tested is set, it is easy to change the pressing force, and the change time of the pressing force can be shortened. In addition, the processing time of the scratch test can be greatly shortened.

According to the scratch test method according to the present invention, different positions of different materials to be tested are scratched using the same scratching needle, so that the materials to be tested are scratched with a plurality of different loads, It is possible to accurately compare the individual flaws between the materials to be tested. As a result, the processing time of the scratch test in which various materials to be tested are compared with various loads can be significantly shortened.
In addition, after the balance weight is once arranged on the other end side of the scratch arm, the balance weight is moved from the other end side to a position where a desired pressing force can be obtained by the linear motor mechanism, so that the pressing force applied to the material to be tested is applied. The pressure can be easily changed, and the change time of the pressing force can be shortened. This can also greatly reduce the processing time of the scratch test.

DESCRIPTION OF EMBODIMENTS Hereinafter, preferred embodiments of a scratch test apparatus and a scratch test method according to the present invention will be described in detail with reference to the drawings.
1 is a plan view of a scratch testing apparatus according to the present invention, FIG. 2 is a view taken along the line AA of FIG. 1, and FIG. 3 is a view taken along the line B of FIG.

  The scratch test apparatus 100 according to the present invention includes a holding mechanism portion R and a scratch mechanism portion S as main components. The holding mechanism R and the scratching mechanism S may be provided integrally on the same bed 41, or may be provided independently of each other. In the holding mechanism R, a base 43 is provided on the bed 41, and an X-axis robot (feeding means) 45 is provided on the base 43. The X-axis robot 45 is configured such that a Y-axis robot (feeding means) 47 fixed on the upper part is movable in the X direction (vertical direction in FIG. 1).

  A Y-axis robot 47 fixed to the X-axis robot 45 places a photosensitive material holding base 49 on which a photosensitive material as a test material is set on the upper surface, and the photosensitive material holding base 49 is placed in the Y direction ( It is movable in the left and right direction in FIG. A sensitive material holding sheet 51 described later is detachably attached to the sensitive material holding base 49. Therefore, the photosensitive material holding sheet 51 attached to the photosensitive material holding base 49 is movable in the XY directions.

  The scratching mechanism S has a support column 55 in which a base 53 is fixed to the bed 41. The support column 55 supports a rocking shaft 57 in the X direction at the top. A center portion of a plurality (a pair in this embodiment) of the scratching arms 59L and 59R is supported by the swing shaft 57 with a low friction through a bearing (not shown).

  The pair of scratching arms 59L and 59R are arranged in parallel with the Y direction being the longitudinal direction, and each of them can swing independently. One end of each of the scratching arms 59L and 59R serves as a head portion 59a. The head portions 59a of the scratching arms 59L and 59R are provided with turret-type needle holders 61 and 61 that are rotatable around a rotation shaft 60 in the X direction, and the circumferential direction of the needle holders 61 and 61 is provided. A plurality of scratching needles 63 protruding radially outward can be mounted. The scratching needle 63 is formed by, for example, fixing diamond to the tip. Further, although the scratch needle 63 is drawn in a straight line in the drawing, it may be held by the needle holder 61 via a cantilever bent in a V shape. The head portion 59a is configured to be as light as possible in order to keep the moment of inertia during swinging as small as possible. In FIG. 2, only one scratch needle 63 is shown.

  The interval between the scratching needles 63 and 63 held in the respective needle holders 61 and 61 is set to a predetermined interval P as shown in FIG. As will be described later, the interval P has a relationship that coincides with a predetermined scratch position of the adjacent photosensitive materials 73 and 73. A swing restriction stopper 65 is provided on the upper portion of the support column 55. The swing restricting stopper 65 is a support rod 65a that protrudes horizontally from the upper end of the support column 55 to one end of the scratching arms 59L and 59R, and from the tip of the support rod 65a toward the upper side of each needle holder 61. It consists of a restriction rod 65b protruding in the X direction.

  The scratching arms 59L and 59R have a large load at the other end, and when one end is moved upward, the one end abuts against the restriction rod 65b, so that further swinging is restricted. Yes. That is, as shown in FIG. 5, when one end side of the scratching arms 59L and 59R rises from the horizontal position by a certain angle θ, the scratching arms 59L and 59R come into contact with the restriction rod 65b and stop. The stop positions of the scratching arms 59L and 59R are the retracted positions.

  FIG. 4 is a plan view of the photosensitive material holding table holding the photosensitive material. As shown in FIG. 4, the photosensitive material holding sheet 51 has a rectangular window portion 69 in a rectangular sheet material 67. Holding tapes 71 and 71 are provided on a pair of parallel sides of the window 69. The holding tapes 71 and 71 are fixed to the sheet material 67 at both ends of a plurality (eight in the present embodiment) of the long photosensitive material 73 serving as a sample. As shown in FIG. 1, the photosensitive material holding sheet 51 is attached to the photosensitive material holding base 49 in such a direction that the longitudinal direction of the photosensitive material 73 is the Y direction.

  Accordingly, the photosensitive material 73 held on the photosensitive material holding base 49 via the photosensitive material holding sheet 51 is pressed by the scratching needle 63 by swinging in the direction in which one end side of the scratching arms 59L and 59R is lowered. It becomes.

  A linear motor mechanism 77 that allows the balance weight 75 to move in the Y direction is provided on the other end side of the scratch arms 59L and 59R. The linear motor mechanism 77 has a movable coil incorporated in a balance weight holding unit (not shown) and a plurality of permanent magnets (not shown) arranged in parallel with the rail unit 79 in its main part. Permanent magnets having different polarities are alternately arranged in the longitudinal direction of the rail portion 79. The balance weight 75 is driven in the longitudinal direction of the rail portion 79 by generating a magnetic field by applying a drive current to the movable coil and generating a magnetic force with a permanent magnet fixed to the rail portion 79. Is done. At this time, the movement position of the balance weight 75 is detected by, for example, a position detection unit (not shown) provided on the rail unit 79.

  The respective scratching arms 59L, 59R are balanced in a horizontal state by the balance weight 75 being moved to a predetermined position. Therefore, as shown in a side view of the photosensitive material scratch test apparatus in which the scratch arm is swung to the retracted position in FIG. 5, the balance weight 75 in the horizontal position moves to the other ends of the scratch arms 59L and 59R. Then, one end of the scratching arms 59L and 59R rises and the swinging restriction stopper 65 restricts the swinging.

  In the scratching mechanism section S, the origin position of the balance weight 75 that causes the scratching arms 59L and 59R to be in a horizontal state is obtained in advance at the time of installation or the like. The balance weight 75 can be positioned at the origin position by a linear motor mechanism 77, a control unit (not shown) connected to the linear motor mechanism 77, and an input unit (not shown) connected to the control unit.

  Similarly, in the scratching mechanism portion S, the position of the balance weight 75 for applying a predetermined load to the scratching needle 63 is obtained in advance. The correlation between the load applied to the scratching needle 63 and the position of the balance weight 75 is obtained, for example, by arranging a pressure detector on the same plane as the photosensitive material 73 and the balance weight 75 when the pressure detector detects a predetermined load. It is calculated by reading the moving position of. Therefore, a desired load is applied to the scratching needle 63 by moving the balance weight 75 to positions (target positions) corresponding to various loads obtained in advance in this way. The balance weight 75 can be moved to the target position by controlling the linear motor mechanism 77 by the control unit based on the load setting signal input from the input means.

FIG. 6 shows a graph showing the correlation between the balance weight time and the moving distance when the target load is applied.
In order to apply a desired load to the scratch needle 63, the balance weight 75 is moved to a target position corresponding to each load. At this time, the movement of the balance weight 75 by the linear motor mechanism 77 may be moved at a constant speed as shown by the straight line a in FIG. 6, but as shown by the curve b, as it approaches the target position, It is preferable to use movement control that gradually decelerates the movement speed. By performing movement control in this way, the application of a load is stabilized in a short time. In addition, as the movement control, as shown by the curve c, after gradually accelerating up to approximately half the distance to the target position and reaching the substantially intermediate point to the target position, the movement speed is gradually increased. It is good also as movement control which decelerates. Thereby, the balance weight 75 can be quickly reached to the target position without causing unnecessary vibration.

  The balance weight 75 is disposed below the swing shaft 57. Further, although the scratch mechanism S is corrected in advance at the time of manufacture, a horizontal detection sensor (not shown) may be provided so that the calibration can be automatically performed at the start. In such automatic home position calibration, at the start, the balance weight 75 is moved so that the level of the scratching arms 59L and 59R is detected by the horizontal detection sensor. Calibration is performed with the movement position of as the origin position. Therefore, in this case, the target position corresponding to each load stored in advance may be corrected based on the error of the calibration value.

  For the scratch mechanism S, the load setting range is set to, for example, 0 to 250 g. Further, the setting accuracy at this time is suppressed to about ± 3%. The stabilization time of the scratch needle 63 is set within 3 seconds. Further, a display device (not shown) in which the movement position of the balance weight 75 can be easily visually recognized may be attached to the rail portion 79 or the like.

  Here, the distance P between the pair of scratching needles 63 and 63 attached to the scratching arms 59L and 59R is such that when the adjacent photosensitive materials 73 and 73 are simultaneously scratched, the same scratching position of any photosensitive material 73 is the same. The relative positional relationship is set so that the needle 63 can be scratched. By simultaneously scratching the photosensitive materials 73 and 73 held adjacent to each other by the pair of scratching needles 63 and 63, the plurality of photosensitive materials 73 can be simultaneously scratched under a plurality of scratching conditions. Become. That is, the same position corresponding to each photosensitive material 73 is scratched by the same scratching needle 63.

Next, a scratch test method using the scratch test apparatus 100 configured as described above will be described.
7 is a plan view of adjacent photosensitive materials scratched at the same position, FIG. 8 is a procedure explanatory diagram as an example of a scratch test in which the same position of each photosensitive material is scratched by the same needle, and FIG. 9 is adjacent. It is explanatory drawing showing the space | interval of the scratch and the space | interval of a pair of scratching needles attached simultaneously to the sensitive material to perform.
This scratch test method uses a plurality of (in this embodiment, a pair of) scratching needles 63, 63, and each of a plurality of (eight in this embodiment) sheet-like sensitizing materials 73, which are materials to be tested. The photosensitive material 73 is evaluated by scratching under conditions.

  The outline of the configuration is that the same scratching needle 63 is handled by changing the photosensitive material 73 to be scratched by the scratching needle 63 after simultaneously pressing and scratching different scratching needles 63 at different positions of the different photosensitive material 73. By scratching the changed photosensitive material 73 at the scratch position, the same corresponding position of each photosensitive material 73 is scratched using the same scratching needle 63.

  Specifically, as shown in FIG. 7, ten scratches F1 to F10 are scratched in the longitudinal direction of the light-sensitive material 73. Explain as a thing). For the scratch, the photosensitive material 73 is placed below the scratching needle 63, the scratching needle 63 to which a predetermined load is applied is pressed onto the photosensitive material 73, and then the Y-axis robot 47 moves the photosensitive material holding base 49 to the scratch. It is attached by moving it to the left of 1.

  Here, for example, the left side sensitive material 73 and the right side sensitive material 73 shown in FIG. In the present embodiment, the interval between the scratch position F1 of the adjacent left photosensitive material 73 and the scratch position F7 of the right photosensitive material 73 is set to the interval P between the pair of scratch needles 63 and 63.

  In order to perform the photosensitive material scratch test, first, the position corresponding to F7 of the first photosensitive material 73A held below in FIG. 1 is scratched by the scratch needle 63 attached to the right scratch arm 59R. This state is shown in FIG. Next, the X-axis robot 45 is moved by a predetermined amount, and F8 is scratched by the same scratching needle 63. This state is shown in FIG. Next, as shown in FIGS. 8A-3 and 8A-4, scratches to F9 and F10 are similarly performed.

  When the scratching of the first photosensitive material 73A to F10 is completed, the photosensitive material holding base 49 is moved downward in FIG. 1, and the needle 63 of the right scratching arm 59R is shown in FIG. 8 (b-1). Positioning is performed so that the second photosensitive material 73B is positioned at F7. Accordingly, since the interval between the scratching needles 63 and 63 is set at P, the scratching needle 63 of the left scratching arm 59L is simultaneously positioned at the position F1 of the first photosensitive material 73A.

  Next, as shown in FIGS. 8 (b-1), (b-2), (b-3), and (b-4), the second photosensitive material is formed by the scratching needle 63 attached to the right scratching arm 59R. At the same time as scratching F7 to F10 of 73B, scratching is performed on F1 to F4 of the first photosensitive material 73A with the scratching needle 63 attached to the left scratching arm 59L.

  Thereafter, the right scratching arm 59R is placed in the horizontal position or the retracted position, and the scratching process is continued only by the left scratching arm 59L. As shown in FIGS. 8 (b-5) and (b-6), F1 and F6 are scratched on one photosensitive material 73A.

  When the F5 scratching of the first photosensitive material 73A is completed, the photosensitive material holding base 49 is moved downward in FIG. 1, and the scratching needle 63 attached to the right scratching arm 59R is F7 of the third photosensitive material 73C. Then, the scratch needle 63 attached to the left scratch arm 59L is positioned so as to be disposed at F1 of the second photosensitive material 73B. Hereinafter, in the same manner as described above, as shown in FIGS. 8 (c-1), (c-2), (c-3), and (c-4), the right scratching needle 63 and the left scratching needle 63 By simultaneously scratching F7 to F10 of the third photosensitive material 73C and F1 to F4 of the second photosensitive material 73B, as shown in FIGS. 8 (d-1) and (d-2), the left side scratching is performed. Only the arm 59L scratches F5 and F6 of the second photosensitive material 73B.

  As shown in FIG. 9, such scratching process is performed over the first photosensitive material 73 </ b> A to the eighth photosensitive material 73 </ b> H, so that the same position is the same for all of the eight photosensitive materials 73. The scratches are scratched by the scratch needle 63, and a total of 10 scratch marks are made on each of the photosensitive materials 73.

  As described above, in the scratch testing apparatus 100 described above, when the photosensitive material 73 held on the photosensitive material holding base 49 is moved relative to the scratch tension 63 in the Y direction, the photosensitive material 73 is scratched by the scratch needle 63. It is. At this time, by providing a plurality of scratching needles 63, 63, it is possible to simultaneously scratch at a plurality of positions, and a plurality of different photosensitive materials 63 can be scratched simultaneously. As a result, the processing time of the scratch test can be shortened.

  Further, a correlation between the position of the balance weight 75 at the other end of the scratch arms 59L and 59R and the load applied to the needle 63 at one end of the scratch arms 59L and 59R is obtained in advance, and the balance weight 75 is set to a predetermined value by the linear motor mechanism 77. The desired load is quickly applied to the scratching needle 63 by being moved to the position. Moreover, since it is the linear motor mechanism 77, there is no backlash in the case of the conventional balancer. Therefore, the load applied to the scratching needle 63 for scratching the photosensitive material 73 can be automatically and quickly applied regardless of the conventional balancer. Moreover, since there is no backlash of the balancer, a desired load can be applied with high accuracy, and a stable desired load can be obtained quickly. Furthermore, since there is no backlash, fluctuations in the load during the scratch test can be suppressed. As a result, high scratch accuracy can be ensured while shortening the processing time of the scratch test.

  In addition, since the pair of scratching needles 63 and 63 are arranged in a relative positional relationship in which the same scratching position of an arbitrary photosensitive material 73 can be scratched by the same scratching needle 63, each of the plurality of photosensitive materials 73 is arranged. It can be tested at the same time under a plurality of the same scratch conditions.

  Then, according to the present scratch test method, the scratching position by the first scratching needle on the photosensitive material 73 and the scratching position by the second scratching needle are made different from each other, and the scratching is repeated on each photosensitive material 73. Since the same corresponding position is scratched by the same scratch needle 63, scratches of a plurality of different loads are applied to the photosensitive material 73, and the individual scratches are compared with each other between the arbitrary photosensitive materials 73. Can do. As a result, the processing time of the scratch test for comparing various photosensitive materials 73 with various loads can be greatly shortened.

Next, a modified example of the above-described photosensitive material scratch test apparatus 100 will be described.
FIG. 10 is a front view (a) and side view (b) of the close contact means using the pressure roller, FIG. 11 is a cross-sectional view of the main part of the photosensitive material holding base showing the close contact means using the blower, and FIG. It is sectional drawing of the sensitive material holding stand principal part showing the close_contact | adherence means by a structure.
At one end of each of the scratch arms 59L, 59R, it is preferable to provide a close means for bringing the sensitive material 73 into close contact with the sensitive material holding base 49. As the close contact means, as shown in FIG. 10, a frame 83 having a pressing roller 81 at the lower portion is extrapolated to one end side of each of the scratching arms 59L and 59R, and this frame 83 is moved by an urging means 85 such as a coil spring. It can be pressed against the photosensitive material holder 49 side. In this case, the urging means 85 is supported by, for example, a swing restriction stopper 65 other than the scratching arms 59L and 59R.

  According to this modification, when the pressing roller 81 is pressed upstream of the scratching needle 63 of the photosensitive material 73 in the scratching direction during the scratching process by the scratching needle 63, the photosensitive material 73 that has floated from the photosensitive material holding base 49 is lifted. The curled photosensitive material 73, which is held in close contact with the holding surface of the photosensitive material holding base 49, for example, is corrected flat before reaching the scratch needle 63. That is, the surface of the sensitive material 73 scratched by the needle 63 is free from undulations and irregularities. As a result, the light-sensitive material 73 can be brought into close contact with the light-sensitive material holding base 49 to be flattened, a constant load can be applied to the light-sensitive material 73, and uniform scratching becomes possible.

  In addition, as a close contact means, as shown in FIG. 11, air 93 may be blown from the surface of the sensitive material 73 by a blower 91.

  Further, as the close contact means, as shown in FIG. 12, for example, a porous adsorption layer 95 is formed on the upper layer of the photosensitive material holding base 49, and a vacuum pump 97 is connected to the adsorption layer 95 to perform air suction. By using an adsorption device, the photosensitive material 73 may be adsorbed and held on the surface of the adsorption layer 95. According to this close contact means, it is not necessary to provide a support member or the like in the vicinity of the scratching arms 59L and 59R, interference with the scratching arms 59L and 59R can be avoided, and the photosensitive material 73 is reliably sucked and held over the entire surface. be able to.

It is a top view of the photosensitive material scratch test apparatus which concerns on this invention. It is an AA arrow line view of FIG. It is a B arrow line view of FIG. It is a top view of the sensitive material holding stand holding the sensitive material. It is a side view of a photosensitive material scratch test apparatus in which a scratch arm is swung to a retracted position. It is a graph showing the correlation of the time of the balance weight at the time of applying a target load, and movement distance. It is a top view of the adjacent sensitive material which was scratched in the same position. It is procedure explanatory drawing of the photosensitive material scratch test which scratches the same position of each photosensitive material with the same scratching needle. It is explanatory drawing showing the space | interval of the scratch | flaw and the space | interval of a pair of needle | hook which are simultaneously attached to the adjacent photosensitive material. It is explanatory drawing which represented the close_contact | adherence means by a press roller by the front view (a) and the side view (b). It is sectional drawing of the sensitive material holding stand main part showing the close_contact | adherence means by a blower. It is sectional drawing of the sensitive material holding stand main part showing the close_contact | adherence means by a suction structure. It is a side view showing the outline of the conventional photosensitive material scratch test apparatus.

Explanation of symbols

49 Sensitive material holder (test material holder)
57 Oscillating shaft 59L, 59R Scratching arm 63 Scratching needle 73 Sensitive material (material to be tested)
75 Balance weight 77 Linear motor mechanism 81 Pressing roller (close contact means)
91 Blower (close means)
95 Adsorption layer (air adsorption device)
97 Vacuum pump (air adsorption device)
100 Scratch test device F1-F10 Scratch P Predetermined interval

Claims (5)

A specimen holding base for holding a plurality of sheet-like specimens in parallel in a plane; and
A scratching needle for scratching the test material held on the test material holding base is suspended and held at one end, and the pressing force of the scratching needle on the test material is set to a predetermined constant load at the other end. A plurality of scratching arms, wherein a balance weight to be adjusted is movably arranged in the longitudinal direction of the arm, and swings about a fulcrum between the scratching needle and the balance weight;
A feeding means for moving the material to be tested relative to each of the scratching needles of the plurality of scratching arms;
A scratch testing apparatus, wherein the scratching needle of each scratching arm scratches the same corresponding portion of each material under test with the same scratching needle. A specimen holding base for holding a plurality of sheet-like specimens in parallel in a plane; and
A scratching needle for scratching the test material held on the test material holding base is suspended and held at one end, and the pressing force of the scratching needle on the test material is set to a predetermined constant load at the other end. A balance arm to be adjusted is movably arranged in the longitudinal direction of the arm, and a scratch arm that swings between the scratch needle and the balance weight as a fulcrum;
Feeding means for moving the DUT relative to the scratching needle of the scratching arm;
A scratch test apparatus comprising: a linear motor mechanism that moves a balance weight provided at the other end of the scratch arm. A specimen holding base for holding a plurality of sheet-like specimens in parallel in a plane; and
A scratching needle for scratching the test material held on the test material holding base is suspended and held at one end, and the pressing force of the scratching needle on the test material is set to a predetermined constant load at the other end. A plurality of scratching arms, wherein a balance weight to be adjusted is arranged movably in the longitudinal direction of the arm, and swings about a fulcrum between the scratching needle and the balance weight;
Feed means for moving the DUT relative to each of the scratching needles of the plurality of scratching arms;
A linear motor mechanism for moving a balance weight provided at the other end of each scratch arm;
A scratch testing apparatus, wherein the scratching needle of each scratching arm scratches the same corresponding portion of each material under test with the same scratching needle. A scratch test method for evaluating a sheet-like material to be tested, which is held in parallel in a plurality of planes, by applying a predetermined load with a plurality of scratching needles,
The scratching position by the first scratching needle on the material to be tested and the scratching position by the second scratching needle are made different at the same time and repeatedly scratched. Scratch test method characterized by scratching. A scratch test method for evaluating a sheet-like material to be tested, which is held in parallel in a plane, by scratching and applying a predetermined load with a scratch needle,
The scratching needle is suspended and held at one end, and a balance weight for adjusting the pressing force of the scratching needle to the test material to a predetermined constant load is disposed at the other end so as to be movable in the longitudinal direction of the arm. A scratching arm that swings between the scratching needle and the balance weight as a fulcrum;
After the balance weight is once arranged on the other end side of the scratch arm, the balance weight is moved by a linear motor mechanism from the other end side to a position where a desired pressing force is obtained, and the scratch needle is moved to the material to be tested. A scratch test method characterized by contacting.

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