JP2005093544A - Tape carrier for semiconductor device, and its manufacturing method - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a tape carrier for a semiconductor device and its manufacturing method, wherein low-cost polyethylene telephthalate (PET) can be used for insulating substrate and productivity is high. <P>SOLUTION: In this manufacturing method, polyethylene telephthalate (PET) as heat-resistant insulator is heated and treated beforehand, at a temperature higher than the heating temperature which is applied in all processes, a copper foil is formed on the heat-resistant insulator and processed by a photoetching method, and fine wiring is formed. By using the PET which has been heated and treated beforehand as the heat-resistant insulator, heat shrinkage of a PET tape becomes small in subsequent thermal treatment. By using the tape-shape PET, productivity is improved. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention relates to a tape carrier for a semiconductor device such as a TAB (Tape Automated Bonding) tape, a BGA (Ball Grid Array) tape, and a COF (Chip On Film) tape on which an electronic component element is mounted, and a manufacturing method thereof. The present invention relates to a tape carrier for a semiconductor device and a method for manufacturing the same, which makes it possible to use polyethylene terephthalate (PET) as an insulating substrate.

  Today, as seen in personal computers and mobile phones, the progress in performance such as miniaturization, higher functionality, and higher speed of various electronic devices is remarkable. These are supported by innovations in various semiconductor devices such as LSI (Large Scale Integration) and packaging technology. For this reason, the role played by package technology has become more important than ever.

  Conventionally, plastic packages such as QFP (Quad Flat Package) and TSOP (Thin Small Outline Package) have been mainstream. However, the area array terminal type package represented by BGA has recently become the center of the high-density mounting package due to a demand for further improvement in mounting density.

  TAB is a term that refers to a bonding technique in which IC chips with bumps are continuously incorporated using a long film carrier (TAB tape) originally produced in a standardized format. TAB tape has been developed mainly for LCD driver IC applications. However, with the practical application of area array type packages such as BGA that correspond to the progress of higher integration, higher pin count, and higher speed of LSI, these TAB tapes have been developed. In terms of applications, it has grown into one of the main electronic component mounting boards.

  The most common conventional TAB tape manufacturing method is as follows. As the heat resistant insulating film, a polyimide tape excellent in chemical resistance and mechanical strength is used. Holes such as frame feed holes (sprocket holes), device holes, and outer lead holes are opened by punching on a polyimide tape coated with a thermosetting adhesive. Next, the thermosetting adhesive and the copper foil are bonded together while applying heat (laminate). After applying a photoresist on this, exposure and development are performed to form a chemical-resistant resist film in a necessary pattern shape. This is sprayed with an etching solution such as ferric chloride or a cupric chloride aqueous solution to dissolve and remove unnecessary copper foil to form a fine copper foil pattern. After applying an insulating resist film as necessary, a plating process such as tin plating or gold plating necessary for package assembly is performed to complete a TAB tape.

  As a method of joining the TAB tape and the IC electrode pad, an ILB (Inner Lead Bonding) method is generally used, in which a flying lead of the TAB tape and a gold bump on the aluminum electrode are collectively bonded. For this reason, an opening (device hole) is opened in the IC mounting portion of the TAB tape, and a flying lead structure is formed in which the inner lead protrudes.

  Since liquid crystals are now actively used in mobile terminals, the demand for finer wiring in tape materials is increasing. When the inner lead pin pitch is narrowed, it becomes difficult to manufacture flying leads mainly due to deformation of the leads. Therefore, COF (Chip On Film) for flip-chip (FC) bonding an IC to a plated copper foil wiring on a polyimide tape is rapidly spreading.

  By the way, the movement of joining the electrode of the IC and the inner lead on the substrate by remodeling the conventional inner lead bonder for TAB has been activated. For this purpose, a method of aligning and bonding the electrodes and leads through the tape surface side is employed, and therefore the polyimide tape material is required to be transparent.

  Currently, an effective base material for COF tape material is manufactured by a method (metalizing method) in which a nickel alloy is formed by sputtering on a transparent polyimide tape, and a copper foil is formed by electroplating using this as a cathode. .

  When a polyimide tape is used as a BGA (Ball Grid Array) substrate, a gold wire bonding method is often applied to the connection between the copper foil pattern of the tape and the electrode pad of the IC. In this case, gold plating is performed on the copper foil wiring pattern of the tape using nickel plating as a base plating layer. In addition, the bottom of the via hole on the back surface of the wiring pattern is also plated with gold under a nickel base for solder ball attachment.

  On the other hand, a conventional method for manufacturing an electronic component mounting substrate using polyethylene terephthalate (PET), which is cheaper than polyimide tape, is known (for example, see Patent Document 1).

This conventional method for manufacturing an electronic component mounting substrate uses PET as an insulating substrate when a multilayer substrate is formed by repeating printing on the insulating substrate, and the highest temperature applied in advance in all steps of the PET substrate. By performing the heat treatment as described above (for example, at 160 ° C. for 5 minutes), subsequent heat shrinkage can be suppressed.
JP-A-10-112586

  However, according to the conventional TAB tape using polyimide as the base material, polyimide is extremely high in heat resistance, chemical resistance and mechanical strength among organic materials, and is easy to process into a film. However, there is a problem that the cost of the polyimide tape is high and the cost of the product is increased.

  According to the conventional example of Patent Document 1, a multilayer substrate is manufactured by forming an insulating pattern and a conductive pattern on a sheet-fed PET substrate by a printing method, and productivity is poor.

  Accordingly, an object of the present invention is to provide a tape carrier for a semiconductor device and a method for producing the same, which makes it possible to use inexpensive polyethylene terephthalate (PET) as an insulating base material.

  In order to achieve the above object, a first invention includes a heat-resistant insulating material made of a polyethylene terephthalate tape that has been heat-treated in advance, and a fine wiring formed on the heat-resistant insulating material through an adhesive. A tape carrier for a semiconductor device is provided.

  According to a second aspect of the present invention, there is provided a tape carrier manufacturing method for a semiconductor device, wherein a copper layer is formed on a heat-resistant insulating material and then the copper layer is processed by a photo-etching method to form fine wiring. The method of manufacturing a tape carrier for a semiconductor device, wherein a heat-treated polyethylene terephthalate tape is used as the heat-resistant insulating material.

  According to the first and second inventions, by using a polyethylene terephthalate tape (PET) that has been heat-treated in advance as the heat-resistant insulating material, the thermal contraction of the PET tape is reduced in the subsequent heat treatment. Further, productivity is increased by using tape-like PET.

  According to the method for manufacturing a tape carrier for a semiconductor device of the present invention, by using a polyethylene terephthalate (PET) tape that has been heat-treated in advance as a heat-resistant insulating material, thermal contraction of the PET tape is reduced in the subsequent heat treatment. Therefore, a PET tape having a price of 1/10 or less of the polyimide tape can be used as the base material, whereby the material cost can be reduced and a low-cost flexible tape carrier for a semiconductor device can be provided. Further, by using tape-like PET, fine wiring can be continuously formed, so that productivity is increased.

  A method for manufacturing a TAB tape as a tape carrier for a semiconductor device according to an embodiment of the present invention will be described. First, after producing a long PET tape, a preheating treatment for preventing thermal contraction of the PET tape is performed. The heating is performed at a temperature higher than the maximum temperature applied in all steps. Moreover, it carries out in the heating time according to heating temperature. For example, when the heating temperature is 150 ° C., the heating time is preferably 10 to 30 minutes, and when the heating temperature is 160 ° C., the heating time is preferably 5 to 10 minutes. At temperatures below 150 ° C., the PET tape does not change so much that heat shrinkage can be prevented. Further, at a temperature exceeding 160 ° C., it may approach the heat resistance limit of PET itself, and thus heat deformation may occur.

  Next, a thermosetting adhesive is applied to the PET tape, and holes such as a frame feed hole (sprocket hole), a device hole, and an outer lead hole are opened by punching. Next, the thermosetting adhesive and the copper foil are bonded together while applying heat (laminate). After applying a photoresist on this, exposure and development are performed to form a chemical-resistant resist film in a necessary pattern shape. This is sprayed with an etching solution such as ferric chloride or a cupric chloride aqueous solution to dissolve and remove unnecessary copper, thereby forming a fine copper foil pattern. After applying an insulating resist film as necessary, a plating process such as tin plating or gold plating necessary for package assembly is performed to complete a TAB tape.

  According to this embodiment, when the PET tape is pre-heated at a heating temperature of 150 ° C. for a heating time of 5 minutes, the shrinkage rate is reduced to 0.03%, so that the assembly temperature is up to about 150 ° C. The TAB tape using PET can withstand heating and does not affect the assembly of the package. Therefore, since the heating temperature can be lowered to 100 to 150 ° C. by using ultrasonic waves in combination with gold wire bonding, it is applied to a tape substrate for BGA that electrically connects ICs by gold wire bonding with ultrasonic bonding. can do.

  The copper foil may be formed by a plating method using a metal layer as a cathode after a thin metal layer is formed on a heat-resistant insulating material by a dry film forming method such as sputtering, vapor deposition or ion plating. . For example, in the case of COF in which an electronic component element is flip-chip bonded onto a tape carrier, a nickel-based alloy film having a thickness of several nanometers is currently formed on a polyimide tape by a sputtering method, and this is used as a cathode to count copper by plating. A tape base material by a metalizing method for forming a film to a thickness of μm is used, but in this material, a PET tape that has been heat-treated in advance can be used instead of polyimide.

  Further, the copper foil may be a film formed on a heat resistant insulating material by a dry film forming method such as a sputtering method, a vapor deposition method, or an ion plating method.

  FIG. 1 shows a manufacturing process of a BGA type LSI mounting TAB tape substrate according to Embodiment 1 of the present invention. This figure shows one LSI mounting part for convenience. First, a long PET tape 1 having a width of 70 mm, a thickness of 100 μm, and a length of about 40 m is produced (step a). Next, in a state where the PET tape 1 is wound in a reel shape, the PET tape 1 is placed in a thermostatic bath at 150 ° C. and heated for 30 minutes (process b). Next, a thermosetting adhesive (Yodogawa Paper Mill; X type) 2 is applied to one side of the PET tape 1 with a thickness of 12 μm (process c). Next, a sprocket hole and a solder ball mounting via hole 3 are opened in the PET tape 1 with the adhesive 2 using a mold (process d). Next, while heating the PET tape 1 to 140 ° C., the 18 μm thick copper foil (Mitsui Metal; FQ-VrLP) 4 is pressed and bonded using a roll laminator, and the copper foil 4 / adhesive 2 / PET tape is bonded. 1 to produce a composite material 5 having a three-layer structure (step e).

  After applying a liquid photoresist to the copper foil 4 of the composite material 5, the fine wiring pattern 4 a by the resist film is drawn through the exposure and development processes, and then the ferric chloride aqueous solution is sprayed to cover the resist film. A tape substrate having fine wiring patterns 4a on a plurality of LSI mounting portions along the longitudinal direction of the tape by performing surface treatment for removing the exposed copper foil by etching (step) and then removing the resist film with a solvent. (Process G). The minimum wiring pitch is 60 μm (wiring width 30 μm, wiring interval 30 μm). After that, a solder resist (Asahi Chemical Laboratory; CCR-232GF) is applied to a desired position on the tape substrate by screen printing so as to have a thickness of 35 μm, and then the exposed lead is electroplated. A nickel film is formed to a thickness of about 1 μm, and then gold is formed to a thickness of about 0.5 μm to perform bonding by a wire bonding method to complete a BGA type LSI mounting TAB tape.

  FIG. 2 shows a manufacturing process of an IC mounting COF tape substrate by flip-chip bonding according to Embodiment 2 of the present invention. This figure shows one IC mounting portion for convenience. First, a long PET tape 1 having a width of 70 mm, a thickness of 100 μm, and a length of about 40 m is produced (step a). Next, in a state where the PET tape 1 is wound in a reel shape, the PET tape 1 is placed in a thermostatic bath at 150 ° C. and heated for 30 minutes (process b). Next, the PET tape 1 is put into a vacuum chamber of a sputtering apparatus, and a nickel-20% chromium film is formed to a thickness of about 10 nm on one side, and a copper foil seed layer 6 is continuously formed thereon by a sputtering method. To 200 nm thick (step c). The sputter-treated PET tape 1 is placed in a copper plating apparatus, energized in the plating solution with the seed layer 6 as a cathode, and the copper plating 7 is applied on the seed layer 6 to a thickness of about 8 μm (step D).

  After opening sprocket holes at both ends in the width direction of the PET tape with a copper film by a punching method, a fine wiring pattern 4a is formed by a photoetching method (step e). Next, a surface treatment for peeling and removing the resist film with a solvent is performed, and a tape substrate having fine wiring patterns 4a on a plurality of IC mounting portions along the longitudinal direction of the tape is manufactured (step F). The device hole is not opened in the COF tape, and therefore the inner lead does not protrude from the device hole. Since the transparency of the PET tape is good, the alignment between the lead and the electrode pad of the IC chip can be recognized by the CCD camera from the PET tape side.

It is process drawing which shows the manufacturing method of the TAB tape substrate for BGA type LSI mounting which concerns on Example 1 of this invention. It is process drawing which shows the manufacturing method of the COF tape board | substrate for IC mounting by the flip chip joining which concerns on Example 2 of this invention.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 PET tape 2 Thermosetting adhesive 3 Solder ball mounting via hole 4 Copper foil 4a Fine wiring pattern 5 Composite material 6 Seed layer 7 Copper plating

Claims (7)

A heat-resistant insulating material composed of a pre-heated polyethylene terephthalate tape;
A tape carrier for a semiconductor device, comprising: a fine wiring formed on the heat resistant insulating material through an adhesive. In a method for manufacturing a tape carrier for a semiconductor device, after forming a copper layer on a heat-resistant insulating material, the copper layer is processed by a photoetching method to form a fine wiring.
A method of manufacturing a tape carrier for a semiconductor device, wherein a polyethylene terephthalate tape preheated is used as the heat-resistant insulating material.   3. The method of manufacturing a tape carrier for a semiconductor device according to claim 2, wherein the copper layer is bonded to the heat-resistant insulating material with an adhesive.   The copper layer is formed by forming a thin metal layer on the heat-resistant insulating material by a dry film forming method such as a sputtering method, a vapor deposition method, or an ion plating method, and then forming the film by a plating method using the metal layer as a cathode. The method of manufacturing a tape carrier for a semiconductor device according to claim 2, wherein:   3. The tape carrier for a semiconductor device according to claim 2, wherein the copper layer is formed on the heat-resistant insulating material by a dry film forming method such as a sputtering method, a vapor deposition method, or an ion plating method. Manufacturing method.   The said fine wiring is continuously formed in the mounting position of the some electronic component element provided along the longitudinal direction of the said long polyethylene terephthalate tape. Manufacturing method of tape carrier for semiconductor device. 3. The method of manufacturing a tape carrier for a semiconductor device according to claim 2, wherein the heat treatment is performed at a temperature higher than a maximum temperature applied in all steps.

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