JP2005040610A5 - - Google Patents

Download PDF

Info

Publication number
JP2005040610A5
JP2005040610A5 JP2004212468A JP2004212468A JP2005040610A5 JP 2005040610 A5 JP2005040610 A5 JP 2005040610A5 JP 2004212468 A JP2004212468 A JP 2004212468A JP 2004212468 A JP2004212468 A JP 2004212468A JP 2005040610 A5 JP2005040610 A5 JP 2005040610A5
Authority
JP
Japan
Prior art keywords
detector
electrically coupled
conductive layer
flexible circuit
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004212468A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005040610A (ja
JP4502736B2 (ja
Filing date
Publication date
Priority claimed from US10/604,449 external-priority patent/US7010088B2/en
Application filed filed Critical
Publication of JP2005040610A publication Critical patent/JP2005040610A/ja
Publication of JP2005040610A5 publication Critical patent/JP2005040610A5/ja
Application granted granted Critical
Publication of JP4502736B2 publication Critical patent/JP4502736B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2004212468A 2003-07-22 2004-07-21 マルチスライスｃｔ用多層可撓性信号伝送検出器回路 Expired - Fee Related JP4502736B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/604,449 US7010088B2 (en) 2003-07-22 2003-07-22 Multi-slice CT multi-layer flexible signal transmission detector circuit

Publications (3)

Publication Number Publication Date
JP2005040610A JP2005040610A (ja) 2005-02-17
JP2005040610A5 true JP2005040610A5 (https=) 2009-10-22
JP4502736B2 JP4502736B2 (ja) 2010-07-14

Family

ID=34062266

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004212468A Expired - Fee Related JP4502736B2 (ja) 2003-07-22 2004-07-21 マルチスライスｃｔ用多層可撓性信号伝送検出器回路

Country Status (4)

Country Link
US (1) US7010088B2 (https=)
JP (1) JP4502736B2 (https=)
DE (1) DE102004035405A1 (https=)
IL (1) IL162905A (https=)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1934633A2 (en) * 2005-10-05 2008-06-25 Koninklijke Philips Electronics N.V. Computed tomography detector using thin circuits
US7455454B2 (en) * 2006-10-03 2008-11-25 General Electric Company X-ray detector methods and apparatus
JP5503883B2 (ja) * 2009-03-06 2014-05-28 株式会社東芝 Ｘ線ｃｔ装置及びｘ線検出装置
EP2422220A2 (en) * 2009-04-22 2012-02-29 Koninklijke Philips Electronics N.V. Imaging measurement system with a printed organic photodiode array
JP5973913B2 (ja) * 2009-09-08 2016-08-23 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 印刷された光検出器アレイを備えた撮像測定システム
JP5436121B2 (ja) * 2009-09-28 2014-03-05 キヤノン株式会社 撮像装置および放射線撮像システム
US8610079B2 (en) * 2009-12-28 2013-12-17 General Electric Company Robust radiation detector and method of forming the same
JP2015507742A (ja) * 2011-12-27 2015-03-12 コーニンクレッカ フィリップス エヌ ヴェ Ｐｅｔ検出器用可撓性コネクタ
JP2015524056A (ja) * 2012-05-22 2015-08-20 アナロジック コーポレイション 感知システムとディテクタアレイ連結アセンブリ｛ｄｅｔｅｃｔｉｏｎｓｙｓｔｅｍａｎｄｄｅｔｅｃｔｏｒａｒｒａｙｉｎｔｅｒｃｏｎｎｅｃｔａｓｓｅｍｂｌｉｅｓ｝
US9788804B2 (en) * 2014-07-22 2017-10-17 Samsung Electronics Co., Ltd. Anatomical imaging system with improved detector block module
US9603574B2 (en) 2014-12-17 2017-03-28 General Electric Company Reconfigurable electronic substrate
DE102014226985B4 (de) * 2014-12-23 2024-02-08 Carl Zeiss Microscopy Gmbh Verfahren zum Analysieren eines Objekts, Computerprogrammprodukt sowie Teilchenstrahlgerät zur Durchführung des Verfahrens
US10764361B2 (en) * 2015-12-28 2020-09-01 Netsapiens, Inc. Distributed server architecture session count system and methods
JP7166833B2 (ja) * 2018-08-03 2022-11-08 キヤノンメディカルシステムズ株式会社 放射線検出器及び放射線検出器モジュール
CN114886453A (zh) * 2022-07-12 2022-08-12 芯晟捷创光电科技(常州)有限公司 基于前照式光电二极管阵列的ct探测模块及相应的ct机

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100278479B1 (ko) * 1998-10-07 2001-02-01 구본준, 론 위라하디락사 엑스레이 디텍터 및 그 제조방법_
US6343171B1 (en) 1998-10-09 2002-01-29 Fujitsu Limited Systems based on opto-electronic substrates with electrical and optical interconnections and methods for making
US6299713B1 (en) 1999-07-15 2001-10-09 L. M. Bejtlich And Associates, Llc Optical radiation conducting zones and associated bonding and alignment systems
JP2001318155A (ja) * 2000-02-28 2001-11-16 Toshiba Corp 放射線検出器、およびｘ線ｃｔ装置
JP4799746B2 (ja) * 2001-03-02 2011-10-26 浜松ホトニクス株式会社 放射線検出器モジュール
US6859514B2 (en) * 2003-03-14 2005-02-22 Ge Medical Systems Global Technology Company Llc CT detector array with uniform cross-talk

Similar Documents

Publication Publication Date Title
JP2005040610A5 (https=)
CN102193103B (zh) 用于辐射检测器的检测模块和辐射检测器
RU2408110C2 (ru) Матрица детекторов излучения
JP2009043826A5 (https=)
JP2012143564A5 (https=)
CN105765406B (zh) 具有加热设备的辐射探测器
EP2090901A3 (en) X-ray detector and manufacturing method thereof
JP7585306B2 (ja) 半導体装置
JP2008510130A5 (https=)
JP2007201246A5 (https=)
TWI780129B (zh) 放射線檢測器及放射線圖像攝影裝置
JP2002116261A (ja) 放射線撮像装置及びシステム
JP2001318155A (ja) 放射線検出器、およびｘ線ｃｔ装置
CN105759301A (zh) 基于SiPM的核医学成像平板探测器
US7439516B2 (en) Module assembly for multiple die back-illuminated diode
JP2007047174A (ja) 検出器モジュール、検出器およびコンピュータ断層撮影装置
TW201044598A (en) Semiconductor devices and methods for forming patterned radiation blocking on a semiconductor device
CN108780158A (zh) 模块化的x射线检测器
CN108604591A (zh) 摄像装置、摄像显示系统和显示装置
JP4502736B2 (ja) マルチスライスｃｔ用多層可撓性信号伝送検出器回路
CN100359698C (zh) 可平铺的传感器阵列
CN105051900B (zh) 集成的二极管das探测器
JP2011071862A5 (https=)
TWI362924B (en) Transducer assembly , method for forming a transducer assembly and ultrasound system
CN109073766A (zh) 柔性衬底覆晶薄膜修复