JP2005019545A - Lead frame with heat sinking plate and its manufacturing method - Google Patents

Lead frame with heat sinking plate and its manufacturing method Download PDF

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Publication number
JP2005019545A
JP2005019545A JP2003179975A JP2003179975A JP2005019545A JP 2005019545 A JP2005019545 A JP 2005019545A JP 2003179975 A JP2003179975 A JP 2003179975A JP 2003179975 A JP2003179975 A JP 2003179975A JP 2005019545 A JP2005019545 A JP 2005019545A
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Prior art keywords
lead frame
heat sink
manufacturing
overhang
radiating plate
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JP2003179975A
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JP4242213B2 (en
Inventor
Jiyunji Hisashiba
淳嗣 久柴
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Mitsui High Tec Inc
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Mitsui High Tec Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item

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  • Lead Frames For Integrated Circuits (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a lead frame with a heat sinking plate, which copes with a size reduction in a semiconductor device, restrains cracks from occurring in sealing resin, and is excellent in adhesion property to the sealing resin. <P>SOLUTION: The lead frame 10 is equipped with the heat sinking plate 11 provided with a protruding overhang 19 which is provided around its circumference or a part of its circumference at a middle point in the direction of thickness of the heat sinking plate 11. The method of manufacturing the lead frame 10 is also provided. The circumference of the heat sinking plate 11 is partially crushed with a crushing punch 30 provided with a back guide 30a to form the overhang 19. The bottom 20 of the overhang 19 is preferably roughened, and the tip of the overhang 19 is subjected to blunting processing. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

【0001】
【発明の属する技術分野】
本発明は、半導体装置に使用するリードフレームに係り、特に放熱板付きリードフレーム及びその製造方法に関する。
【0002】
【従来の技術】
半導体装置は高機能化、高集積化、動作高速化等により使用時に高温となり、半導体素子の機能が低下するのを防ぐために、発生する熱を周囲に逃がす放熱手段が講じられる。この放熱手段としては、例えばリードフレームに放熱板を取付け、更に半導体素子を搭載して樹脂封止を行うときに、この放熱板を半導体装置の底面から露出させて熱放散性を向上させたものが提案されている。
【0003】
また、近年では半導体装置は小型化が要請され、樹脂封止した半導体装置(半導体パッケージ)は出来るだけ半導体チップサイズに近づけて製造されている。このような事情から、放熱板を付けたリードフレームに半導体チップを搭載した半導体装置においても、樹脂封止は放熱板の平面より僅かに大きめに形成され、かつ、従来の半導体装置と同様、放熱板の底面は露出されている。
放熱板は伝熱性のすぐれた銅、銅合金等から製作されているが、封止樹脂との密着性が十分でないので、樹脂剥離等を防止するため、例えば特許文献1に記載されているように、樹脂で覆われる放熱板の周囲に張り出し部を形成しているものがある。
【0004】
【特許文献1】
特公昭55−23463号公報(第1図)
【0005】
【発明が解決しようとする課題】
この張り出し部の形成は、放熱板の外周端の一部を金型装置で潰し加工することによって行われるが、潰し加工した部分の幅が大きいと、張り出しの形状は安定するが、張り出し先端に尖りがあり、さらに放熱板は平面サイズが大となり半導体装置の小型化に適応できないという問題がある。
また、潰し加工した部分の幅が小さいと張り出しの形状が安定せず、反り上がりが発生し、この反り上がりの先端が鋭角に尖り、樹脂封止してなる樹脂パッケージにクラック(モールドクラック)が発生する一因となるという問題がある。
本発明はかかる事情に鑑みてなされたもので、前記した問題のない放熱板付きのリードフレームを製造すること、更に封止樹脂との密着性がすぐれた放熱板付きリードフレーム及びその製造方法を提供することを目的とする。
【0006】
【課題を解決するための手段】
前記目的に沿う第1の発明に係る放熱板付きリードフレームは、全周囲又は一部周囲の厚み方向中間位置に、突出する張り出し部が形成されている放熱板を備えた放熱板付きリードフレームであって、前記張り出し部の先端は鈍化処理が行われ、突出長さが規制されている。これによって、張り出し部の先端に起因するくさび作用によって封止樹脂内にクラックが入るのを防止できる。また張り出し部の突出長さの規制により半導体装置の小型化が図られる。
【0007】
また、第2の発明に係る放熱板付きリードフレームは、第1の発明に係る放熱板付きリードフレームにおいて、前記張り出し部の底面は粗面化されている。これによって、張り出し部が封止樹脂内に食い込むと共に、張り出し部の底面と封止樹脂の馴染み性が向上し、封止樹脂とリードフレームとの密着性がより高い半導体装置を提供できる。
【0008】
第3の発明に係る放熱板付きリードフレームの製造方法は、全周囲又は一部周囲の厚み方向中間位置に、突出する張り出し部を形成した放熱板を備えた放熱板付きリードフレームの製造方法であって、前記放熱板の製造にあっては、前記放熱板との間に前記張り出し部の突出長さ代(突出代)を有するバックガイドを設けた潰し加工用パンチで、前記放熱板の外周端部を潰し加工して、前記張り出し部を形成している。このバックガイドによって潰し加工時の張り出し部の突出長さが制限され、所定の長さの張り出し部を確保できると共に、張り出し先端はバックガイドに接して尖りが鈍化処理される。
【0009】
そして、第4の発明に係る放熱板付きリードフレームの製造方法は、第3の発明に係る製造方法において、前記潰し加工用パンチは、前記張り出し部の底面を形成する水平押圧面が粗面化されている。これによって、張り出し部の底面を粗面化して、封止樹脂との密着性を高めることができる。また、潰し加工用パンチの粗面化は、例えば放電加工によって簡単に行える。
【0010】
【発明の実施の形態】
続いて、添付した図面を参照しつつ、本発明を具体化した実施の形態につき説明し、本発明の理解に供する。
ここに、図1(A)は本発明の第1の実施の形態に係る放熱板付きリードフレームの平面図、(B)は同放熱板付きリードフレームの側断面図、図2は同放熱板付きリードフレームを用いた半導体装置の断面図、図3は同放熱板付きリードフレームの放熱板の製造方法を示す断面図、図4は同放熱板付きリードフレームの説明図、図5は本発明の第2の実施の形態に係る放熱板付きリードフレームの説明図である。
【0011】
まず、図1、図2、図4を参照しながら、本発明の第1の実施の形態に係る放熱板付きリードフレーム10について説明する。
図1(A)、(B)に示すように、本発明の第1の実施の形態に係る放熱板付きリードフレーム10は、中央に配置された銅又は銅合金製の放熱板11と、その周囲に放射状に配置された複数本のリード12と、中央の放熱板11の角部を周囲から支持するサポートバー13とを有している。
【0012】
複数本のリード12及びサポートバー13は、図4に示すように、一枚の薄い銅、銅合金製又は、鉄ーNi合金製(その他の金属、合金であってもよい)のシート材(又は条材)14をプレス加工又はエッチング加工によって形成され、中央部は空間となっている。なお、図4において、15はパイッロット孔を、16はリード12の周囲に設けられているスリットを、17は角孔を示す。
そして、リード12で囲まれる中央部には、その上に図2に示すように半導体素子18が搭載される放熱板11が配置され、その角部は周囲のサポートバー13の先端にかしめ接合(溶接接合でもよい)される。
【0013】
放熱板11は熱伝導性のよい材料(例えば、銅又は銅合金)からなって、比較的厚みが厚く、その全周囲の厚み方向中間位置に、突出する張り出し部19が設けられている。張り出し部19の突出長さp(図2参照)は、例えば、放熱板11の厚みの1/4〜2/3倍程度となって、底面20は平面状、底面20の端部から続く上面21は断面円弧状になっている。張り出し部19の先端は、鋭利な状態ではなく例えば先部を丸める鈍化処理が行われている。なお、この実施の形態においては、張り出し部19は放熱板11の全周囲に設けられているが、複数に区分されていてもよいし、部分的に形成されていてもよい。
【0014】
そして、張り出し部19の底面20は粗面化されて、微小の凹凸が一面に多数形成されているのが好ましい。粗面化処理の方法は、潰し加工用パンチによる押圧処理でもよいし、例えば、ブラスト処理であってもよく、その表面粗度(Ra)は、0.5〜20μm程度である。張り出し部19の上側に位置する放熱板11は、張り出し部19の下側に位置する放熱板11より周囲に突出しているが、この理由は、張り出し部19をプレス加工によって放熱板11の下部周囲を潰し加工して突出させる塑性変形を起こして形成したからである。
【0015】
図2は、この放熱板付きリードフレーム10を使用した半導体装置22を示すが、周囲に張り出し部19が設けられた放熱板11の上には、半導体素子18が搭載されている。半導体素子18の上部にある各パッド部23と対応するリード12の先部とはボンディングワイヤ24によって連結されている。
この半導体装置22の底部には、中央に放熱板11の底部が露出し、その周囲にリード12が露出した状態で封止樹脂25によって樹脂封止されている。放熱板11の周囲の高さ方向中間部分に張り出し部19が設けられ、張り出し部19の底面20は粗面化されていると、放熱板11と封止樹脂25との密着性が更に向上して、半導体装置22は結果として強固に樹脂封止される。
【0016】
続いて、この放熱板付きリードフレーム10の製造方法について、図3、図4を参照しながら説明する。
放熱板11以外のリードフレームは、図4に示すように、シート材14をプレス加工又はエッチング加工することによって形成する。この場合、シート材14の中央は空間部となって、各リード12及びサポートバー13の周囲は、シート枠26によって保持されている。
【0017】
放射状に配置されたリード12の中央に位置する放熱板11は、図3に示すように、プレス加工によって形成される。予め所定の大きさの銅板(又は銅合金板)27を用意し、金型装置の支持台28上に載せ、上から押さえ具29で押圧して保持する。この状態で、バックガイド30aを設けた潰し加工用パンチ30を図3の左側のように上昇させて銅板27の外周端部の下側を潰し加工し張り出し部19を形成する。該潰し加工時、張り出された先端はバックガイド30aに当接して、丸められ尖りが無くなる。即ち鈍化処理がなされる。また張り出し部19の突出長さpは潰し加工用パンチ30のバックガイド30aの設置位置によって規制され、所望の突出長さにできる。なお、図3において中心線mを基準にして、右側は潰し加工前を、左側は潰し加工過程中を示す。また、31はガイドである。
【0018】
潰し加工用パンチ30の内側にはバックガイド30aを形成する段部32が設けられている。段部32の潰し加工用パンチ30の内周面からの幅(突出長さ代)は、張り出し部19の所望突出長さpを得るように定められる。段部32を形成する水平押圧面33には粗面加工を施すのが好ましく、その表面は例えば表面粗度(Ra)が0.1〜20μmの範囲で粗くなっている。この粗面の形成は放電加工によって行われる。バックガイド30aを形成する垂直壁面34は水平押圧面33に対して実質的に垂直となっているが、その隅部には直角交差、又は円滑に水平押圧面33と垂直壁面34が繋がる微小の丸み処理(R処理)が行われている。
【0019】
従って、銅板27を支持台28と押さえ具29が保持して、バックガイド30aを設けた潰し加工用パンチ30を一定高さ(例えば、水平押圧面33が銅板27の厚みの1/5〜1/3程度の食い込む高さ)まで上昇させると、放熱板11の外周端部に潰し加工が行なわれて、銅板27の周囲に張り出し部19が形成される。張り出し部19の先部は鈍化処理が行われ、底面20には好ましくは粗面化処理が行われる。なお、放熱板11の角部にサポートバー13の先端部をかしめ接続する処理はこのプレス処理とは別に行う。
以上の工程によって、周囲に張り出し部19を備えた放熱板11を有する放熱板付きリードフレーム10が完成する。
【0020】
第1の実施の形態に係る放熱板付きリードフレーム及びその製造方法は、チップサイズパッケージ(CSP)の半導体装置に用いられるものについて説明したが、図5に示すようなタイプ(QFP)の半導体装置に用いられる放熱板付きリードフレームにも適用できる。即ち、図5に、本発明の第2の実施の形態に係る放熱板付きリードフレームを示すが、リードがインナーリード36とアウターリード37に区分されている点を除いては、実質的に第1の実施の形態に係る放熱板付きリードフレーム10と同じであるので、同一の構成要素は同一の番号を付してその詳しい説明を省略する。
更に、本発明に係る放熱板付きリードフレーム及びその製造方法は、前記の他、SOP、TO220タイプ等の各種半導体装置に用いられるものにも適用できる。
そして、前記実施の形態においては、放熱板11として銅板を使用したが、放熱板は熱伝導性の良い金属(例えば、アルミニウム、アルミ合金)であっても本発明は適用される。
【0021】
【発明の効果】
請求項1、2記載の放熱板付きリードフレームは、以上の説明からも明らかなように、放熱板の全周囲又は一部周囲の厚み方向中間位置に形成されている張り出し部の先端は鈍化処理が行われているので、張り出し部の先端に起因するくさび作用によって封止樹脂内にクラックが入るのを防止でき、半導体装置の長期寿命を確保できる。
特に、請求項2記載の放熱板付きリードフレームは、張り出し部の底面を粗面化しているので、張り出し部が封止樹脂内に食い込んで、張り出し部の底面と封止樹脂の馴染み性が向上し、封止樹脂とリードフレームとの密着性がより高い、従って、寿命の長い半導体装置を提供できる。
【0022】
そして、請求項3、4記載の放熱板付きリードフレームの製造方法においては、放熱板との間に張り出し部の突出長さ代を有するバックガイドを設けた潰し加工用パンチで、放熱板の外周端部を潰し加工して、張り出し部を形成しているので、張り出し部の突出寸法を規制して適正に形成でき、半導体装置の小型化を確保できる。
特に、請求項4記載の放熱板付きリードフレームの製造方法においては、潰し加工用パンチは、張り出し部の底面を形成する水平押圧面が粗面化されているので、張り出し部の底面を粗面化して、封止樹脂との密着性を高めることができ、より小型で長期の寿命を有する半導体装置を提供できる。
【図面の簡単な説明】
【図1】(A)は本発明の第1の実施の形態に係る放熱板付きリードフレームの平面図、(B)は同放熱板付きリードフレームの側断面図である。
【図2】同放熱板付きリードフレームを用いた半導体装置の断面図である。
【図3】同放熱板付きリードフレームの放熱板の製造方法を示す断面図である。
【図4】同放熱板付きリードフレームの説明図である。
【図5】本発明の第2の実施の形態に係る放熱板付きリードフレームの説明図である。
【符号の説明】
10:放熱板付きリードフレーム、11:放熱板、12:リード、13:サポートバー、14:シート材、15:パイロット孔、16:スリット、17:角孔、18:半導体素子、19:張り出し部、20:底面、21:上面、22:半導体装置、23:パッド部、24:ボンディングワイヤ、25:封止樹脂、26:シート枠、27:銅板、28:支持台、29:押さえ具、30:潰し加工用パンチ、30a:バックガイド、31:ガイド、32:段部、33:水平押圧面、34垂直壁面、36:インナーリード、37:アウターリード
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a lead frame used in a semiconductor device, and more particularly to a lead frame with a heat sink and a method for manufacturing the same.
[0002]
[Prior art]
In order to prevent the semiconductor device from becoming high temperature during use due to high functionality, high integration, high-speed operation, etc., and preventing the function of the semiconductor element from deteriorating, a heat radiating means for releasing generated heat to the surroundings is provided. As this heat dissipation means, for example, when a heat sink is attached to a lead frame and a semiconductor element is mounted and resin sealing is performed, this heat sink is exposed from the bottom surface of the semiconductor device to improve heat dissipation. Has been proposed.
[0003]
In recent years, semiconductor devices are required to be miniaturized, and resin-encapsulated semiconductor devices (semiconductor packages) are manufactured as close to the semiconductor chip size as possible. For this reason, even in a semiconductor device in which a semiconductor chip is mounted on a lead frame with a heat sink, the resin seal is formed slightly larger than the plane of the heat sink, and as with conventional semiconductor devices, heat dissipation is performed. The bottom of the plate is exposed.
Although the heat radiating plate is made of copper, copper alloy or the like having excellent heat conductivity, since the adhesiveness with the sealing resin is not sufficient, it is described in, for example, Patent Document 1 in order to prevent resin peeling and the like. In addition, there is one in which an overhang portion is formed around the heat sink covered with resin.
[0004]
[Patent Document 1]
Japanese Patent Publication No.55-23463 (Fig. 1)
[0005]
[Problems to be solved by the invention]
This overhang is formed by crushing a part of the outer peripheral edge of the heat sink with a mold device, but if the width of the crushed part is large, the shape of the overhang will be stable, but at the end of the overhang In addition, there is a problem that the heat sink has a large planar size and cannot be adapted to miniaturization of a semiconductor device.
In addition, if the width of the crushed part is small, the shape of the overhang is not stable and warping occurs, and the tip of the warping is sharp, sharply cracked (mold crack) in the resin package formed by resin sealing. There is a problem that contributes to the occurrence.
SUMMARY OF THE INVENTION The present invention has been made in view of such circumstances, and a lead frame with a heat sink having no problem as described above, and a lead frame with a heat sink having excellent adhesion to a sealing resin and a method for manufacturing the same. The purpose is to provide.
[0006]
[Means for Solving the Problems]
The lead frame with a heat sink according to the first invention that meets the above-mentioned object is a lead frame with a heat sink provided with a heat sink in which a protruding portion is formed at an intermediate position in the thickness direction of the entire circumference or a part of the circumference. And the blunting process is performed at the front-end | tip of the said overhang | projection part, and the protrusion length is controlled. As a result, it is possible to prevent cracks from entering the sealing resin due to the wedge action caused by the tip of the overhanging portion. Further, the semiconductor device can be downsized by restricting the protruding length of the overhanging portion.
[0007]
Moreover, the lead frame with a heat sink according to the second invention is the lead frame with a heat sink according to the first invention, wherein the bottom surface of the protruding portion is roughened. As a result, the overhanging portion bites into the sealing resin, the familiarity between the bottom surface of the overhanging portion and the sealing resin is improved, and a semiconductor device with higher adhesion between the sealing resin and the lead frame can be provided.
[0008]
A method for manufacturing a lead frame with a heat sink according to a third aspect of the present invention is a method for manufacturing a lead frame with a heat sink, comprising a heat sink having a protruding overhang formed at an intermediate position in the thickness direction around all or part of the circumference. In manufacturing the heat radiating plate, a crushing punch provided with a back guide having a protrusion length allowance (protruding allowance) of the overhanging portion between the heat radiating plate and the outer periphery of the heat radiating plate. The projecting portion is formed by crushing the end portion. This back guide limits the protruding length of the overhanging portion during crushing processing, can ensure a predetermined length of overhanging portion, and the tip of the overhang is in contact with the back guide and blunted.
[0009]
And the manufacturing method of the lead frame with a heat sink according to the fourth invention is the manufacturing method according to the third invention, wherein the crushing punch has a roughened horizontal pressing surface forming a bottom surface of the overhanging portion. Has been. As a result, the bottom surface of the overhang portion can be roughened to improve the adhesion with the sealing resin. Further, the roughening of the crushing punch can be easily performed by, for example, electric discharge machining.
[0010]
DETAILED DESCRIPTION OF THE INVENTION
Next, embodiments of the present invention will be described with reference to the accompanying drawings for understanding of the present invention.
1A is a plan view of a lead frame with a heat sink according to the first embodiment of the present invention, FIG. 1B is a side sectional view of the lead frame with the heat sink, and FIG. 2 is the heat sink. 3 is a cross-sectional view of a semiconductor device using a lead frame with a heat sink, FIG. 3 is a cross-sectional view showing a method of manufacturing a heat sink of the lead frame with the heat sink, FIG. 4 is an explanatory view of the lead frame with the heat sink, and FIG. It is explanatory drawing of the lead frame with a heat sink which concerns on 2nd Embodiment.
[0011]
First, a lead frame 10 with a heat sink according to a first embodiment of the present invention will be described with reference to FIG. 1, FIG. 2, and FIG.
As shown in FIGS. 1A and 1B, a heat sink-equipped lead frame 10 according to a first embodiment of the present invention includes a heat sink 11 made of copper or copper alloy disposed in the center, and It has a plurality of leads 12 arranged radially around the periphery, and a support bar 13 that supports the corners of the central heat sink 11 from the periphery.
[0012]
As shown in FIG. 4, the plurality of leads 12 and the support bar 13 are made of a single sheet of thin copper, copper alloy, or iron-Ni alloy (may be other metal or alloy). (Or strip material) 14 is formed by pressing or etching, and the central portion is a space. In FIG. 4, 15 is a pilot hole, 16 is a slit provided around the lead 12, and 17 is a square hole.
Then, the heat sink 11 on which the semiconductor element 18 is mounted is disposed on the center portion surrounded by the leads 12 as shown in FIG. 2, and the corner portion thereof is caulked and joined to the tip of the surrounding support bar 13 ( It may be welded).
[0013]
The heat radiating plate 11 is made of a material having good thermal conductivity (for example, copper or copper alloy), has a relatively large thickness, and a projecting protruding portion 19 is provided at an intermediate position in the thickness direction of the entire circumference. The protruding length p (see FIG. 2) of the overhanging portion 19 is, for example, about 1/4 to 2/3 times the thickness of the heat sink 11, and the bottom surface 20 is planar, and the top surface continues from the end of the bottom surface 20. 21 has an arcuate cross section. The tip of the overhanging portion 19 is not sharp, but for example, a blunting process for rounding the tip is performed. In addition, in this embodiment, although the overhang | projection part 19 is provided in the perimeter of the heat sink 11, it may be divided into plurality and may be formed partially.
[0014]
And it is preferable that the bottom face 20 of the overhang | projection part 19 is roughened and many fine unevenness | corrugations are formed in the whole surface. The surface roughening method may be a pressing process using a crushing punch or, for example, a blast process, and the surface roughness (Ra) is about 0.5 to 20 μm. The heat sink 11 located on the upper side of the overhang portion 19 protrudes from the heat sink 11 located on the lower side of the overhang portion 19 because the overhang portion 19 is pressed around the lower portion of the heat sink 11 by pressing. This is because it was formed by crushing and causing plastic deformation to project.
[0015]
FIG. 2 shows a semiconductor device 22 using the lead frame 10 with a heat sink, and a semiconductor element 18 is mounted on the heat sink 11 provided with a projecting portion 19 around it. Each pad portion 23 on the upper side of the semiconductor element 18 and the corresponding tip portion of the lead 12 are connected by a bonding wire 24.
The bottom of the semiconductor device 22 is resin-sealed with a sealing resin 25 with the bottom of the radiator plate 11 exposed at the center and the leads 12 exposed around it. When the projecting portion 19 is provided in the intermediate portion in the height direction around the heat sink 11 and the bottom surface 20 of the projecting portion 19 is roughened, the adhesion between the heat sink 11 and the sealing resin 25 is further improved. As a result, the semiconductor device 22 is firmly sealed with resin.
[0016]
Next, a method for manufacturing the lead frame 10 with a heat sink will be described with reference to FIGS.
Lead frames other than the heat sink 11 are formed by pressing or etching the sheet material 14 as shown in FIG. In this case, the center of the sheet material 14 is a space portion, and the periphery of each lead 12 and the support bar 13 is held by the sheet frame 26.
[0017]
As shown in FIG. 3, the heat radiating plate 11 located at the center of the radially arranged leads 12 is formed by pressing. A copper plate (or copper alloy plate) 27 having a predetermined size is prepared in advance, placed on a support base 28 of the mold apparatus, and pressed and held by a presser 29 from above. In this state, the crushing punch 30 provided with the back guide 30 a is raised as shown on the left side of FIG. 3 to crush the lower side of the outer peripheral end portion of the copper plate 27 to form the overhang portion 19. At the time of the crushing process, the protruding tip comes into contact with the back guide 30a and is rounded and has no sharpness. That is, the blunting process is performed. Further, the protruding length p of the overhanging portion 19 is regulated by the installation position of the back guide 30a of the crushing punch 30 and can be set to a desired protruding length. In FIG. 3, with the center line m as a reference, the right side shows before crushing and the left side shows during crushing. Reference numeral 31 denotes a guide.
[0018]
A step portion 32 for forming a back guide 30 a is provided inside the crushing punch 30. The width (projection length allowance) of the stepped portion 32 from the inner peripheral surface of the crushing punch 30 is determined so as to obtain the desired projecting length p of the overhanging portion 19. The horizontal pressing surface 33 that forms the stepped portion 32 is preferably roughened, and the surface thereof is roughened, for example, with a surface roughness (Ra) in the range of 0.1 to 20 μm. The rough surface is formed by electric discharge machining. The vertical wall surface 34 forming the back guide 30a is substantially perpendicular to the horizontal pressing surface 33, but the corners of the vertical wall surface 34 intersect at right angles, or the horizontal pressing surface 33 and the vertical wall surface 34 are smoothly connected to each other. Rounding processing (R processing) is performed.
[0019]
Accordingly, the copper plate 27 is held by the support base 28 and the presser 29, and the crushing punch 30 provided with the back guide 30a has a certain height (for example, the horizontal pressing surface 33 is 1/5 to 1 to the thickness of the copper plate 27). When the height is raised to about 3/3, the outer peripheral end portion of the heat radiating plate 11 is crushed, and the overhanging portion 19 is formed around the copper plate 27. The tip of the overhanging portion 19 is subjected to a blunting process, and the bottom surface 20 is preferably subjected to a roughening process. In addition, the process which crimps and connects the front-end | tip part of the support bar 13 to the corner | angular part of the heat sink 11 is performed separately from this press process.
Through the above process, the lead frame 10 with a heat sink having the heat sink 11 provided with the projecting portion 19 around the periphery is completed.
[0020]
Although the lead frame with a heat sink and the manufacturing method thereof according to the first embodiment have been described for use in a chip size package (CSP) semiconductor device, the type (QFP) semiconductor device as shown in FIG. It can also be applied to a lead frame with a heat sink used in the above. That is, FIG. 5 shows a lead frame with a heat sink according to the second embodiment of the present invention, except that the lead is substantially divided into an inner lead 36 and an outer lead 37. Since it is the same as the lead frame 10 with a heat sink according to the first embodiment, the same components are denoted by the same reference numerals and detailed description thereof is omitted.
Furthermore, the lead frame with a heat sink and the manufacturing method thereof according to the present invention can be applied to those used in various semiconductor devices such as SOP and TO220 type in addition to the above.
In the embodiment described above, a copper plate is used as the heat radiating plate 11, but the present invention is applied even if the heat radiating plate is a metal having good thermal conductivity (for example, aluminum or aluminum alloy).
[0021]
【The invention's effect】
As is apparent from the above description, the lead frame with a heat sink according to claims 1 and 2 is blunted at the tip of the overhang portion formed in the middle position in the thickness direction around the entire periphery or part of the heat sink. Therefore, cracks can be prevented from entering the sealing resin due to the wedge action caused by the tip of the overhanging portion, and the long-term life of the semiconductor device can be secured.
In particular, the lead frame with a heat sink according to claim 2 has a roughened bottom surface of the overhanging portion, so that the overhanging portion bites into the sealing resin and the conformability of the bottom surface of the overhanging portion and the sealing resin is improved. In addition, it is possible to provide a semiconductor device having higher adhesion between the sealing resin and the lead frame, and thus having a longer lifetime.
[0022]
And in the manufacturing method of the lead frame with a heat sink according to claims 3 and 4, the outer periphery of the heat sink is formed by a crushing punch provided with a back guide having a projection length allowance of an overhanging portion between the heat sink and the heat sink. Since the overhanging portion is formed by crushing the end portion, the protruding dimension of the overhanging portion can be regulated and appropriately formed, and the miniaturization of the semiconductor device can be ensured.
In particular, in the method of manufacturing a lead frame with a heat sink according to claim 4, the crushing punch has a roughened horizontal pressing surface that forms the bottom surface of the overhang portion, so that the bottom surface of the overhang portion is roughened. Thus, the adhesion with the sealing resin can be improved, and a semiconductor device having a smaller size and a longer life can be provided.
[Brief description of the drawings]
FIG. 1A is a plan view of a lead frame with a heat sink according to a first embodiment of the present invention, and FIG. 1B is a side sectional view of the lead frame with a heat sink.
FIG. 2 is a cross-sectional view of a semiconductor device using the lead frame with the heat sink.
FIG. 3 is a cross-sectional view showing a method of manufacturing the heat sink of the lead frame with the heat sink.
FIG. 4 is an explanatory diagram of the lead frame with the heat sink.
FIG. 5 is an explanatory diagram of a lead frame with a heat sink according to a second embodiment of the present invention.
[Explanation of symbols]
10: Lead frame with heat sink, 11: Heat sink, 12: Lead, 13: Support bar, 14: Sheet material, 15: Pilot hole, 16: Slit, 17: Square hole, 18: Semiconductor element, 19: Overhang , 20: bottom surface, 21: top surface, 22: semiconductor device, 23: pad portion, 24: bonding wire, 25: sealing resin, 26: sheet frame, 27: copper plate, 28: support base, 29: pressing tool, 30 : Punch for crushing, 30a: back guide, 31: guide, 32: stepped portion, 33: horizontal pressing surface, 34 vertical wall surface, 36: inner lead, 37: outer lead

Claims (4)

全周囲又は一部周囲の厚み方向中間位置に、突出する張り出し部が形成されている放熱板を備えた放熱板付きリードフレームであって、
前記張り出し部の先端は鈍化処理が行われ、突出長さが規制されていることを特徴とする放熱板付きリードフレーム。
It is a lead frame with a heat radiating plate provided with a heat radiating plate in which a projecting protruding portion is formed at an intermediate position in the thickness direction of the entire circumference or part of the circumference,
A lead frame with a heat radiating plate, characterized in that a blunting process is performed on the tip of the overhanging portion to regulate the protruding length.
請求項1記載の放熱板付きリードフレームにおいて、前記張り出し部の底面は粗面化されていることを特徴とする放熱板付きリードフレーム。The lead frame with a heat sink according to claim 1, wherein a bottom surface of the projecting portion is roughened. 全周囲又は一部周囲の厚み方向中間位置に、突出する張り出し部を形成した放熱板を備えた放熱板付きリードフレームの製造方法であって、
前記放熱板の製造にあっては、前記放熱板との間に前記張り出し部の突出長さ代を有するバックガイドを設けた潰し加工用パンチで、前記放熱板の外周端部を潰し加工して、前記張り出し部を形成したことを特徴とする放熱板付きリードフレームの製造方法。
A method for manufacturing a lead frame with a heat sink, comprising a heat sink with a protruding overhang formed at a middle position in the thickness direction around all or part of the circumference,
In manufacturing the heat radiating plate, the outer peripheral end of the heat radiating plate is crushed with a crushing punch provided with a back guide having a projection length allowance of the protruding portion between the heat radiating plate. A method of manufacturing a lead frame with a heat sink, wherein the projecting portion is formed.
請求項3記載の放熱板付きリードフレームの製造方法において、前記潰し加工用パンチは、前記張り出し部の底面を形成する水平押圧面が粗面化されていることを特徴とする放熱板付きリードフレームの製造方法。4. The method of manufacturing a lead frame with a heat sink according to claim 3, wherein the crushing punch has a roughened horizontal pressing surface forming a bottom surface of the overhang portion. Manufacturing method.
JP2003179975A 2003-06-24 2003-06-24 Manufacturing method of lead frame with heat sink Expired - Fee Related JP4242213B2 (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014120727A (en) * 2012-12-19 2014-06-30 Mitsubishi Electric Corp Power semiconductor device
JP2016225629A (en) * 2015-06-01 2016-12-28 日本精工株式会社 Heat dissipation substrate for mounting electronic component
JP2017157603A (en) * 2016-02-29 2017-09-07 株式会社東芝 Semiconductor device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014120727A (en) * 2012-12-19 2014-06-30 Mitsubishi Electric Corp Power semiconductor device
JP2016225629A (en) * 2015-06-01 2016-12-28 日本精工株式会社 Heat dissipation substrate for mounting electronic component
JP2017157603A (en) * 2016-02-29 2017-09-07 株式会社東芝 Semiconductor device
US10490485B2 (en) 2016-02-29 2019-11-26 Kabushiki Kaisha Toshiba Semiconductor device

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