JP2005007182A5 - - Google Patents

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Publication number
JP2005007182A5
JP2005007182A5 JP2004180418A JP2004180418A JP2005007182A5 JP 2005007182 A5 JP2005007182 A5 JP 2005007182A5 JP 2004180418 A JP2004180418 A JP 2004180418A JP 2004180418 A JP2004180418 A JP 2004180418A JP 2005007182 A5 JP2005007182 A5 JP 2005007182A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004180418A
Other languages
Japanese (ja)
Other versions
JP2005007182A (ja
Filing date
Publication date
Priority claimed from US10/250,274 external-priority patent/US7366280B2/en
Application filed filed Critical
Publication of JP2005007182A publication Critical patent/JP2005007182A/ja
Publication of JP2005007182A5 publication Critical patent/JP2005007182A5/ja
Pending legal-status Critical Current

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JP2004180418A 2003-06-19 2004-06-18 コンピュータ断層撮影システム用の一体形円弧状陽極x線源 Pending JP2005007182A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/250,274 US7366280B2 (en) 2003-06-19 2003-06-19 Integrated arc anode x-ray source for a computed tomography system

Publications (2)

Publication Number Publication Date
JP2005007182A JP2005007182A (ja) 2005-01-13
JP2005007182A5 true JP2005007182A5 (enExample) 2007-08-02

Family

ID=33510199

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004180418A Pending JP2005007182A (ja) 2003-06-19 2004-06-18 コンピュータ断層撮影システム用の一体形円弧状陽極x線源

Country Status (4)

Country Link
US (1) US7366280B2 (enExample)
JP (1) JP2005007182A (enExample)
CN (1) CN1572254A (enExample)
DE (1) DE102004028230A1 (enExample)

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US8223919B2 (en) 2003-04-25 2012-07-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items
US7333587B2 (en) * 2004-02-27 2008-02-19 General Electric Company Method and system for imaging using multiple offset X-ray emission points
US7885375B2 (en) * 2004-02-27 2011-02-08 General Electric Company Method and system for X-ray imaging
US20070009088A1 (en) * 2005-07-06 2007-01-11 Edic Peter M System and method for imaging using distributed X-ray sources
US7778386B2 (en) * 2006-08-28 2010-08-17 General Electric Company Methods for analytic reconstruction for mult-source inverse geometry CT
US7835488B2 (en) * 2006-10-31 2010-11-16 Koninklijke Philips Electronics N.V. Swept annode CT scanner
EP2115438A4 (en) 2007-02-13 2013-12-04 Sentinel Scanning Corp CT SCANNING AND DETECTION OF RUG
US7852979B2 (en) * 2007-04-05 2010-12-14 General Electric Company Dual-focus X-ray tube for resolution enhancement and energy sensitive CT
US7433443B1 (en) * 2007-08-29 2008-10-07 General Electric Company System and method of CT imaging with second tube/detector patching
WO2009044313A1 (en) * 2007-10-01 2009-04-09 Philips Intellectual Property & Standards Gmbh Computer tomography apparatus
US8076943B2 (en) * 2008-02-21 2011-12-13 Genesis Medical Imaging, Inc. Impedance-based arc detector for computed tomography scanner and method of use thereof
US8130904B2 (en) 2009-01-29 2012-03-06 The Invention Science Fund I, Llc Diagnostic delivery service
US8031838B2 (en) 2009-01-29 2011-10-04 The Invention Science Fund I, Llc Diagnostic delivery service
WO2010141101A1 (en) 2009-06-05 2010-12-09 Sentinel Scanning Corporation Transportation container inspection system and method
JP2011019802A (ja) * 2009-07-17 2011-02-03 Ge Medical Systems Global Technology Co Llc X線ct装置
US9271689B2 (en) * 2010-01-20 2016-03-01 General Electric Company Apparatus for wide coverage computed tomography and method of constructing same
US9935152B2 (en) 2012-12-27 2018-04-03 General Electric Company X-ray detector having improved noise performance
US9917133B2 (en) 2013-12-12 2018-03-13 General Electric Company Optoelectronic device with flexible substrate
WO2015138329A1 (en) 2014-03-13 2015-09-17 General Electric Company Curved digital x-ray detector for weld inspection
DE102016219694A1 (de) * 2016-10-11 2018-04-12 Siemens Healthcare Gmbh Verfahren zur Ermittlung eines dreidimensionalen Bilddatensatzes durch eine Röntgeneinrichtung
DE102017203830A1 (de) 2017-03-08 2018-09-13 Siemens Healthcare Gmbh Verfahren zur Erfassung von Hochspannungsüberschlägen in einer Röntgenvorrichtung sowie Röntgenvorrichtung
EP3933881A1 (en) 2020-06-30 2022-01-05 VEC Imaging GmbH & Co. KG X-ray source with multiple grids
US12230468B2 (en) 2022-06-30 2025-02-18 Varex Imaging Corporation X-ray system with field emitters and arc protection

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US5218624A (en) * 1975-02-21 1993-06-08 Emi Limited Radiography
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JPS5472993A (en) * 1977-11-22 1979-06-11 Jeol Ltd X-ray tomographic equipment
JPS5542640A (en) * 1978-09-21 1980-03-26 Nippon Electron Optics Lab Xxray tomogram camera device
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US5729583A (en) * 1995-09-29 1998-03-17 The United States Of America As Represented By The Secretary Of Commerce Miniature x-ray source
DE19618749A1 (de) * 1996-05-09 1997-11-13 Siemens Ag Röntgen-Computertomograph
JPH11311679A (ja) * 1998-04-28 1999-11-09 Japan Science & Technology Corp Ccdで検出するx線の入射場所の決定方法及びその装置
JP3413775B2 (ja) * 1998-08-25 2003-06-09 富士写真フイルム株式会社 放射線画像検出装置
US6198802B1 (en) * 1998-10-06 2001-03-06 Cardiac Mariners, Inc. Scanning beam x-ray source and assembly
US6385279B1 (en) * 1999-08-27 2002-05-07 General Electric Company Methods and apparatus for positioning a CT imaging x-ray beam
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US6876724B2 (en) * 2000-10-06 2005-04-05 The University Of North Carolina - Chapel Hill Large-area individually addressable multi-beam x-ray system and method of forming same
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US7280636B2 (en) * 2003-10-03 2007-10-09 Illinois Institute Of Technology Device and method for producing a spatially uniformly intense source of x-rays

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