JP2004317506A - テスト・システム校正を含む平衡デバイスの特性解明 - Google Patents

テスト・システム校正を含む平衡デバイスの特性解明 Download PDF

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Publication number
JP2004317506A
JP2004317506A JP2004109977A JP2004109977A JP2004317506A JP 2004317506 A JP2004317506 A JP 2004317506A JP 2004109977 A JP2004109977 A JP 2004109977A JP 2004109977 A JP2004109977 A JP 2004109977A JP 2004317506 A JP2004317506 A JP 2004317506A
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Japan
Prior art keywords
network analyzer
vector network
parameters
test
hybrid junction
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JP2004109977A
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Japanese (ja)
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JP2004317506A5 (enExample
Inventor
Keith F Anderson
キース・エフ・アンダーソン
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Agilent Technologies Inc
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Agilent Technologies Inc
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Publication of JP2004317506A publication Critical patent/JP2004317506A/ja
Publication of JP2004317506A5 publication Critical patent/JP2004317506A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP2004109977A 2003-04-11 2004-04-02 テスト・システム校正を含む平衡デバイスの特性解明 Pending JP2004317506A (ja)

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US10/411,806 US7034548B2 (en) 2003-04-11 2003-04-11 Balanced device characterization including test system calibration

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JP2004317506A true JP2004317506A (ja) 2004-11-11
JP2004317506A5 JP2004317506A5 (enExample) 2007-04-26

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JP2009540279A (ja) * 2006-07-05 2009-11-19 ローデ ウント シュワルツ ゲーエムベーハー ウント コー カーゲー ベクトルネットワークアナライザによる混合モード散乱行列の直接測定の方法
WO2010016200A1 (ja) * 2008-08-08 2010-02-11 日本電気株式会社 差動型トランスインピーダンスアンプの評価方法、光受信回路評価方法、そのプログラムが格納された記憶媒体および装置
WO2015133266A1 (ja) * 2014-03-04 2015-09-11 株式会社 村田製作所 電気回路網のｓパラメータ導出方法
JP2023517832A (ja) * 2020-03-11 2023-04-27 テラダイン、 インコーポレイテッド インタフェースボードの較正

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US20070273389A1 (en) * 2006-05-25 2007-11-29 Kan Tan Apparatus and method for processing a signal under test using a trigger signal synchronous with the signal under test for arbitrary impedance loads
US7460983B2 (en) * 2006-08-23 2008-12-02 Tektronix, Inc. Signal analysis system and calibration method
US20070276614A1 (en) * 2006-05-25 2007-11-29 Kan Tan De-embed method for multiple probes coupled to a device under test
US7518353B2 (en) * 2006-04-07 2009-04-14 Agilent Technologies, Inc. Vector network analysis system and method using offset stimulus signals
WO2007147511A2 (de) * 2006-06-21 2007-12-27 Rohde & Schwarz Gmbh & Co. Kg Verfahren und vorrichtung zur kalibrierung eines netzwerkanalysators für messungen an differentiellen anschlüssen
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US7414411B2 (en) * 2006-08-23 2008-08-19 Tektronix, Inc. Signal analysis system and calibration method for multiple signal probes
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US8154308B2 (en) * 2006-11-13 2012-04-10 The Boeing Company Method for characterizing integrated circuits for identification or security purposes
US7545151B2 (en) * 2007-04-20 2009-06-09 Anritsu Company Characterizing test fixtures
US7994801B2 (en) * 2007-05-08 2011-08-09 Tektronix, Inc. Calibrated S-parameter measurements of a high impedance probe
US8892414B1 (en) 2010-02-26 2014-11-18 Sas Ip, Inc. Transmission-line simulators and methods
US9063882B1 (en) 2010-09-09 2015-06-23 Sas Ip, Inc. Matrix preconditioners for simulations of physical fields
US8938372B1 (en) * 2010-09-09 2015-01-20 Sas Ip, Inc. Simulating signal integrity structures
US8924186B1 (en) 2010-09-09 2014-12-30 Sas Ip, Inc. Simulations of physical systems for multiple excitations
ITAN20100160A1 (it) 2010-09-29 2012-03-30 Marco Farina Kit di calibrazione multimodale in guida d'onda per la misura di matrici di scattering generalizzate oltre la banda di monomodalita'.
US9477792B1 (en) 2012-02-09 2016-10-25 Sas Ip, Inc. Enhancements to parameter fitting and passivity enforcement
US9581675B2 (en) * 2012-08-24 2017-02-28 Tektronix, Inc. Virtual model adapter removal and substitution technique for cascaded networks
TWI540322B (zh) * 2012-09-08 2016-07-01 西凱渥資訊處理科技公司 關於近場電磁探針及掃描器之系統，裝置及方法
CN103063999B (zh) * 2012-12-21 2016-03-16 上海华虹宏力半导体制造有限公司 去嵌入的方法
US9625508B2 (en) * 2014-01-27 2017-04-18 Vayyar Imaging Ltd. Vector network analyzer
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US10545107B2 (en) 2015-04-26 2020-01-28 Vayyar Imaging Ltd System, device and methods for measuring substances' dielectric properties using microwave sensors
WO2016174679A2 (en) 2015-04-27 2016-11-03 Vayyar Imaging Ltd System and methods for calibrating an antenna array using targets
WO2016174680A1 (en) 2015-04-29 2016-11-03 Vayyar Imaging Ltd System, device and methods for localization and orientation of a radio frequency antenna array
WO2016178235A1 (en) 2015-05-05 2016-11-10 Vayyar Imaging Ltd System and methods for three dimensional modeling of an object using a radio frequency device
US10809372B2 (en) 2015-05-11 2020-10-20 Vayyar Imaging Ltd. System, device and methods for imaging of objects using electromagnetic array
US9453723B1 (en) * 2015-06-30 2016-09-27 Stmicroelectronics (Crolles 2) Sas Method for testing a photonic integrated circuit including a device under test
US20170017558A1 (en) * 2015-07-17 2017-01-19 Qualcomm Incorporated Non-intrusive probe for double data rate interface
US10290948B2 (en) 2015-08-02 2019-05-14 Vayyar Imaging Ltd System and method for radio frequency penetration imaging of an object
US9876590B2 (en) 2015-08-02 2018-01-23 Vayyar Imaging Ltd. Real-time network analyzer and applications
US10436896B2 (en) 2015-11-29 2019-10-08 Vayyar Imaging Ltd. System, device and method for imaging of objects using signal clustering
US10571501B2 (en) * 2016-03-16 2020-02-25 Intel Corporation Technologies for verifying a de-embedder for interconnect measurement
CN113777547B (zh) * 2021-07-29 2024-02-23 中国电子科技集团公司第十三研究所 在片s参数测量系统校准判断方法、装置及终端
CN114035016B (zh) * 2021-11-23 2024-03-12 河北博威集成电路有限公司 功率器件传输参数确定方法、装置、终端及存储介质
US12130351B2 (en) 2022-06-09 2024-10-29 Rohde & Schwarz Gmbh & Co. Kg Calibration unit, calibration system and calibration method for a vector network analyzer
EP4382923A1 (en) 2022-12-08 2024-06-12 Rohde & Schwarz GmbH & Co. KG Calibration unit and calibration system
CN116381356B (zh) * 2023-05-26 2023-08-18 河北北芯半导体科技有限公司 平衡器件测试装置及测试方法
EP4542240A1 (en) * 2023-10-19 2025-04-23 Rohde & Schwarz GmbH & Co. KG Configurable radio frequency system
EP4542241A1 (en) * 2023-10-19 2025-04-23 Rohde & Schwarz GmbH & Co. KG Configurable radio frequency system

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US6826506B2 (en) * 2000-09-18 2004-11-30 Agilent Technologies, Inc. Method and apparatus for calibrating a multiport test system for measurement of a DUT
US6472885B1 (en) * 2000-10-16 2002-10-29 Christopher Charles Green Method and apparatus for measuring and characterizing the frequency dependent electrical properties of dielectric materials
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Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009540279A (ja) * 2006-07-05 2009-11-19 ローデ ウント シュワルツ ゲーエムベーハー ウント コー カーゲー ベクトルネットワークアナライザによる混合モード散乱行列の直接測定の方法
WO2010016200A1 (ja) * 2008-08-08 2010-02-11 日本電気株式会社 差動型トランスインピーダンスアンプの評価方法、光受信回路評価方法、そのプログラムが格納された記憶媒体および装置
WO2015133266A1 (ja) * 2014-03-04 2015-09-11 株式会社 村田製作所 電気回路網のｓパラメータ導出方法
CN106062572A (zh) * 2014-03-04 2016-10-26 株式会社村田制作所 电路网的s参数导出方法
JPWO2015133266A1 (ja) * 2014-03-04 2017-04-06 株式会社村田製作所 電気回路網のｓパラメータ導出方法
CN106062572B (zh) * 2014-03-04 2018-10-30 株式会社村田制作所 电路网的s参数导出方法
US10175279B2 (en) 2014-03-04 2019-01-08 Murata Manufacturing Co., Ltd. Method of deriving S parameter of electric circuit network
JP2023517832A (ja) * 2020-03-11 2023-04-27 テラダイン、 インコーポレイテッド インタフェースボードの較正
JP7660580B2 (ja) 2020-03-11 2025-04-11 テラダイン、 インコーポレイテッド 試験システム

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US7034548B2 (en) 2006-04-25
US20040201383A1 (en) 2004-10-14

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