JP2004226209A5 - - Google Patents

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Publication number
JP2004226209A5
JP2004226209A5 JP2003013679A JP2003013679A JP2004226209A5 JP 2004226209 A5 JP2004226209 A5 JP 2004226209A5 JP 2003013679 A JP2003013679 A JP 2003013679A JP 2003013679 A JP2003013679 A JP 2003013679A JP 2004226209 A5 JP2004226209 A5 JP 2004226209A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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JP2003013679A
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Japanese (ja)
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JP4637454B2 (ja
JP2004226209A (ja
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Priority to JP2003013679A priority Critical patent/JP4637454B2/ja
Priority claimed from JP2003013679A external-priority patent/JP4637454B2/ja
Publication of JP2004226209A publication Critical patent/JP2004226209A/ja
Publication of JP2004226209A5 publication Critical patent/JP2004226209A5/ja
Application granted granted Critical
Publication of JP4637454B2 publication Critical patent/JP4637454B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2003013679A 2003-01-22 2003-01-22 偏光消光比等測定装置ならびにその測定装置に用い得る偏光消光比等の測定方法 Expired - Fee Related JP4637454B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003013679A JP4637454B2 (ja) 2003-01-22 2003-01-22 偏光消光比等測定装置ならびにその測定装置に用い得る偏光消光比等の測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003013679A JP4637454B2 (ja) 2003-01-22 2003-01-22 偏光消光比等測定装置ならびにその測定装置に用い得る偏光消光比等の測定方法

Publications (3)

Publication Number Publication Date
JP2004226209A JP2004226209A (ja) 2004-08-12
JP2004226209A5 true JP2004226209A5 (fr) 2006-03-09
JP4637454B2 JP4637454B2 (ja) 2011-02-23

Family

ID=32901948

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003013679A Expired - Fee Related JP4637454B2 (ja) 2003-01-22 2003-01-22 偏光消光比等測定装置ならびにその測定装置に用い得る偏光消光比等の測定方法

Country Status (1)

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JP (1) JP4637454B2 (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI585387B (zh) 2012-07-18 2017-06-01 岩崎電氣股份有限公司 偏光測定方法,偏光測定裝置,偏光測定系統及光配向照射裝置
US20160231176A1 (en) 2015-02-05 2016-08-11 Polarization Solutions, Llc Light irradiation device having polarization measuring mechanism
CN108398242B (zh) * 2018-01-31 2019-11-26 北京交通大学 椭圆偏振态保持光纤消光比的测量装置和方法
CN109827758B (zh) * 2019-03-20 2020-11-03 北京大盟创业科技有限公司 保偏无源器件的偏振消光比测试系统
CN114112329A (zh) * 2021-12-28 2022-03-01 长飞光纤光缆股份有限公司 一种无损光纤的偏振消光比测量系统及方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02203236A (ja) * 1989-02-01 1990-08-13 Sumitomo Electric Ind Ltd 偏波保持光ファイバのクロストーク測定方法
JP2558344Y2 (ja) * 1991-06-13 1997-12-24 安藤電気株式会社 偏波面保存光ファイバの偏波クロストーク測定装置
JPH0875599A (ja) * 1994-09-02 1996-03-22 Fujikura Ltd 偏波保持光ファイバの偏波特性評価装置
JPH1073515A (ja) * 1996-08-29 1998-03-17 Shin Etsu Chem Co Ltd 1/2波長板の評価方法
JP2000097806A (ja) * 1998-09-24 2000-04-07 Japan Aviation Electronics Industry Ltd クロストーク測定方法およびこの方法を実施する装置
JP2002039916A (ja) * 2000-07-28 2002-02-06 Fujikura Ltd 光部品の偏波クロストーク測定方法および測定装置
JP2002181697A (ja) * 2000-12-19 2002-06-26 Atr Adaptive Communications Res Lab 光導波路の測定装置及び測定方法
JP2003083843A (ja) * 2001-09-10 2003-03-19 Ando Electric Co Ltd 消光比測定装置

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