JP2004226065A5 - - Google Patents
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- Publication number
- JP2004226065A5 JP2004226065A5 JP2003010334A JP2003010334A JP2004226065A5 JP 2004226065 A5 JP2004226065 A5 JP 2004226065A5 JP 2003010334 A JP2003010334 A JP 2003010334A JP 2003010334 A JP2003010334 A JP 2003010334A JP 2004226065 A5 JP2004226065 A5 JP 2004226065A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003010334A JP4071641B2 (en) | 2003-01-17 | 2003-01-17 | Sample inspection system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003010334A JP4071641B2 (en) | 2003-01-17 | 2003-01-17 | Sample inspection system |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2004226065A JP2004226065A (en) | 2004-08-12 |
| JP2004226065A5 true JP2004226065A5 (en) | 2006-03-02 |
| JP4071641B2 JP4071641B2 (en) | 2008-04-02 |
Family
ID=32899567
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003010334A Expired - Fee Related JP4071641B2 (en) | 2003-01-17 | 2003-01-17 | Sample inspection system |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4071641B2 (en) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5198096B2 (en) * | 2008-03-07 | 2013-05-15 | シスメックス株式会社 | Analysis equipment |
| EP2251697B1 (en) * | 2008-03-07 | 2020-07-29 | Sysmex Corporation | Analysis apparatus |
| JP5198095B2 (en) * | 2008-03-07 | 2013-05-15 | シスメックス株式会社 | Analysis apparatus and analysis method |
| JP5465850B2 (en) | 2008-08-01 | 2014-04-09 | シスメックス株式会社 | Sample analysis system |
| JP5315044B2 (en) * | 2008-12-26 | 2013-10-16 | シスメックス株式会社 | Sample testing equipment |
| JP5322737B2 (en) | 2009-03-31 | 2013-10-23 | シスメックス株式会社 | Sample processing equipment |
| WO2010122718A1 (en) * | 2009-04-20 | 2010-10-28 | 株式会社 日立ハイテクノロジーズ | Automatic analysis device |
| JP5496581B2 (en) * | 2009-08-31 | 2014-05-21 | シスメックス株式会社 | Sample processing equipment |
| JP2011185628A (en) | 2010-03-05 | 2011-09-22 | Sysmex Corp | Sample analyzer, method of obtaining sample identification information, and sample identification information obtaining apparatus |
| JP5651721B2 (en) * | 2013-02-06 | 2015-01-14 | シスメックス株式会社 | Analytical apparatus and sample measurement method |
| JP6488681B2 (en) * | 2013-12-26 | 2019-03-27 | 東洋紡株式会社 | Analysis method, analysis system, and program |
| JP5908553B2 (en) * | 2014-09-30 | 2016-04-26 | シスメックス株式会社 | Analytical apparatus and sample analysis method |
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2003
- 2003-01-17 JP JP2003010334A patent/JP4071641B2/en not_active Expired - Fee Related