JP2004222299A5 - - Google Patents

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Publication number
JP2004222299A5
JP2004222299A5 JP2004007272A JP2004007272A JP2004222299A5 JP 2004222299 A5 JP2004222299 A5 JP 2004222299A5 JP 2004007272 A JP2004007272 A JP 2004007272A JP 2004007272 A JP2004007272 A JP 2004007272A JP 2004222299 A5 JP2004222299 A5 JP 2004222299A5
Authority
JP
Japan
Prior art keywords
transceiver
controller
host
response
request
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2004007272A
Other languages
English (en)
Japanese (ja)
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JP2004222299A (ja
Filing date
Publication date
Priority claimed from US10/346,480 external-priority patent/US7668512B2/en
Application filed filed Critical
Publication of JP2004222299A publication Critical patent/JP2004222299A/ja
Publication of JP2004222299A5 publication Critical patent/JP2004222299A5/ja
Withdrawn legal-status Critical Current

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JP2004007272A 2003-01-15 2004-01-14 トランシーバシステム Withdrawn JP2004222299A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/346,480 US7668512B2 (en) 2003-01-15 2003-01-15 Transceiver with a test mode of operation

Publications (2)

Publication Number Publication Date
JP2004222299A JP2004222299A (ja) 2004-08-05
JP2004222299A5 true JP2004222299A5 (enExample) 2007-02-22

Family

ID=29735986

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004007272A Withdrawn JP2004222299A (ja) 2003-01-15 2004-01-14 トランシーバシステム

Country Status (3)

Country Link
US (1) US7668512B2 (enExample)
JP (1) JP2004222299A (enExample)
GB (1) GB2398466B (enExample)

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US7471897B1 (en) 2004-07-16 2008-12-30 Cisco Technology, Inc. Electrically looped back, fault emulating transceiver module
US7689213B2 (en) * 2006-04-14 2010-03-30 Litepoint Corp. Method for testing embedded wireless transceiver with minimal interaction between wireless transceiver and host processor during testing
US8131223B2 (en) * 2006-04-14 2012-03-06 Litepoint Corporation System for testing an embedded wireless transceiver
US8676188B2 (en) * 2006-04-14 2014-03-18 Litepoint Corporation Apparatus, system and method for calibrating and verifying a wireless communication device
US7865147B2 (en) * 2006-04-14 2011-01-04 Litepoint Corporation System for testing an embedded wireless transceiver
US8903374B2 (en) * 2008-05-28 2014-12-02 Apple Inc. System for calibrating wireless communications devices
JP2009290022A (ja) * 2008-05-29 2009-12-10 Fujitsu Ltd 光送受信装置
US7974537B2 (en) * 2008-06-05 2011-07-05 Finisar Corporation Intelligent pluggable transceiver stick capable of diagnostic monitoring and optical network management
US8437793B2 (en) * 2009-11-24 2013-05-07 Apple Inc. Wireless transmitter calibration using absolute power requests
US8837934B2 (en) * 2011-08-30 2014-09-16 Avago Technologies General Ip (Singapore) Pte. Ltd. Monitoring circuitry for optical transceivers
US9910819B2 (en) * 2013-03-11 2018-03-06 Microchip Technology Incorporated Two-wire serial interface and protocol
US9450854B2 (en) 2013-03-14 2016-09-20 Exfo Inc. Pass-through test device
US9838138B1 (en) * 2015-12-30 2017-12-05 Juniper Networks, Inc. Self-calibration of pluggable optical module

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