JP2004220068A5 - - Google Patents
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- Publication number
- JP2004220068A5 JP2004220068A5 JP2003003016A JP2003003016A JP2004220068A5 JP 2004220068 A5 JP2004220068 A5 JP 2004220068A5 JP 2003003016 A JP2003003016 A JP 2003003016A JP 2003003016 A JP2003003016 A JP 2003003016A JP 2004220068 A5 JP2004220068 A5 JP 2004220068A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003003016A JP4158526B2 (ja) | 2003-01-09 | 2003-01-09 | メモリカード及びメモリへのデータ書き込み方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003003016A JP4158526B2 (ja) | 2003-01-09 | 2003-01-09 | メモリカード及びメモリへのデータ書き込み方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2004220068A JP2004220068A (ja) | 2004-08-05 |
| JP2004220068A5 true JP2004220068A5 (un) | 2006-02-23 |
| JP4158526B2 JP4158526B2 (ja) | 2008-10-01 |
Family
ID=32894400
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003003016A Expired - Fee Related JP4158526B2 (ja) | 2003-01-09 | 2003-01-09 | メモリカード及びメモリへのデータ書き込み方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4158526B2 (un) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4585520B2 (ja) * | 2004-10-14 | 2010-11-24 | 株式会社アドバンテスト | 試験装置及び試験方法 |
| JP4843222B2 (ja) * | 2005-01-11 | 2011-12-21 | 株式会社東芝 | 半導体記憶装置の制御方法、メモリカード、及びホスト機器 |
| KR100648290B1 (ko) | 2005-07-26 | 2006-11-23 | 삼성전자주식회사 | 프로그램 속도를 향상시킬 수 있는 불 휘발성 메모리 장치및 그것의 프로그램 방법 |
| US7447955B2 (en) * | 2005-11-30 | 2008-11-04 | Advantest Corporation | Test apparatus and test method |
| EP2003653B1 (en) * | 2006-04-06 | 2010-08-04 | Advantest Corporation | Test device and test method |
| KR100894809B1 (ko) | 2006-09-22 | 2009-04-24 | 삼성전자주식회사 | 메모리 시스템 및 그것의 프로그램 방법 |
| KR100845526B1 (ko) | 2006-10-19 | 2008-07-10 | 삼성전자주식회사 | 플래시 메모리를 포함한 메모리 시스템 및 그것의 프로그램방법 |
| KR101095639B1 (ko) * | 2006-12-26 | 2011-12-19 | 가부시키가이샤 어드밴티스트 | 시험 장치 및 시험 방법 |
| JP5029883B2 (ja) * | 2007-05-17 | 2012-09-19 | 横河電機株式会社 | 半導体試験装置 |
| JP5131163B2 (ja) * | 2008-11-12 | 2013-01-30 | 横河電機株式会社 | リダンダンシ演算方法及び装置並びにメモリ試験装置 |
| US8291297B2 (en) * | 2008-12-18 | 2012-10-16 | Intel Corporation | Data error recovery in non-volatile memory |
| JP5867264B2 (ja) | 2012-04-24 | 2016-02-24 | ソニー株式会社 | 記憶制御装置、メモリシステム、情報処理システム、および、記憶制御方法 |
| US9110829B2 (en) * | 2012-11-30 | 2015-08-18 | Taiwan Semiconductor Manufacturing Co. Ltd. | MRAM smart bit write algorithm with error correction parity bits |
| KR102252379B1 (ko) | 2013-06-24 | 2021-05-14 | 삼성전자주식회사 | 메모리 시스템 및 이의 독출 방법 |
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2003
- 2003-01-09 JP JP2003003016A patent/JP4158526B2/ja not_active Expired - Fee Related