JP2004205478A5 - - Google Patents

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Publication number
JP2004205478A5
JP2004205478A5 JP2003061070A JP2003061070A JP2004205478A5 JP 2004205478 A5 JP2004205478 A5 JP 2004205478A5 JP 2003061070 A JP2003061070 A JP 2003061070A JP 2003061070 A JP2003061070 A JP 2003061070A JP 2004205478 A5 JP2004205478 A5 JP 2004205478A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2003061070A
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Japanese (ja)
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JP2004205478A (ja
JP4311952B2 (ja
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Priority to JP2003061070A priority Critical patent/JP4311952B2/ja
Priority claimed from JP2003061070A external-priority patent/JP4311952B2/ja
Publication of JP2004205478A publication Critical patent/JP2004205478A/ja
Publication of JP2004205478A5 publication Critical patent/JP2004205478A5/ja
Application granted granted Critical
Publication of JP4311952B2 publication Critical patent/JP4311952B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2003061070A 2002-03-08 2003-03-07 ３次元座標測定方法 Expired - Fee Related JP4311952B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003061070A JP4311952B2 (ja) 2002-03-08 2003-03-07 ３次元座標測定方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2002062993 2002-03-08
JP2002320810 2002-11-05
JP2003061070A JP4311952B2 (ja) 2002-03-08 2003-03-07 ３次元座標測定方法

Publications (3)

Publication Number Publication Date
JP2004205478A JP2004205478A (ja) 2004-07-22
JP2004205478A5 true JP2004205478A5 (cg-RX-API-DMAC7.html) 2006-04-13
JP4311952B2 JP4311952B2 (ja) 2009-08-12

Family

ID=32830496

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003061070A Expired - Fee Related JP4311952B2 (ja) 2002-03-08 2003-03-07 ３次元座標測定方法

Country Status (1)

Country Link
JP (1) JP4311952B2 (cg-RX-API-DMAC7.html)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5236962B2 (ja) * 2008-02-18 2013-07-17 株式会社ミツトヨ 被測定物の表裏面測定方法
JP2010237054A (ja) * 2009-03-31 2010-10-21 Toyota Motor Corp 組み付け精度測定方法および測定装置
WO2013135236A1 (de) * 2012-03-12 2013-09-19 Actech Gmbh Verfahren zur positionierung und fixierung von formteilen in giessformen
CN103341929B (zh) * 2013-06-27 2015-07-22 信义汽车玻璃(深圳)有限公司 一体注塑产品模型制作方法
DE112016001137B4 (de) * 2015-03-11 2024-01-18 Nalux Co., Ltd. Mit Abschnitt zur Positionsbestimmung versehenes Element und Messverfahren
CN110567425B (zh) * 2019-07-26 2024-04-19 赛诺威盛科技(北京)股份有限公司 用于精密对准装调探测器模块与后准直器的装置及方法

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