JP2004205478A5 - - Google Patents

Download PDF

Info

Publication number
JP2004205478A5
JP2004205478A5 JP2003061070A JP2003061070A JP2004205478A5 JP 2004205478 A5 JP2004205478 A5 JP 2004205478A5 JP 2003061070 A JP2003061070 A JP 2003061070A JP 2003061070 A JP2003061070 A JP 2003061070A JP 2004205478 A5 JP2004205478 A5 JP 2004205478A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2003061070A
Other versions
JP4311952B2 (ja
JP2004205478A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2003061070A priority Critical patent/JP4311952B2/ja
Priority claimed from JP2003061070A external-priority patent/JP4311952B2/ja
Publication of JP2004205478A publication Critical patent/JP2004205478A/ja
Publication of JP2004205478A5 publication Critical patent/JP2004205478A5/ja
Application granted granted Critical
Publication of JP4311952B2 publication Critical patent/JP4311952B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2003061070A 2002-03-08 2003-03-07 ３次元座標測定方法 Expired - Fee Related JP4311952B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003061070A JP4311952B2 (ja) 2002-03-08 2003-03-07 ３次元座標測定方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2002062993 2002-03-08
JP2002320810 2002-11-05
JP2003061070A JP4311952B2 (ja) 2002-03-08 2003-03-07 ３次元座標測定方法

Publications (3)

Publication Number Publication Date
JP2004205478A JP2004205478A (ja) 2004-07-22
JP2004205478A5 true JP2004205478A5 (ja) 2006-04-13
JP4311952B2 JP4311952B2 (ja) 2009-08-12

Family

ID=32830496

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003061070A Expired - Fee Related JP4311952B2 (ja) 2002-03-08 2003-03-07 ３次元座標測定方法

Country Status (1)

Country Link
JP (1) JP4311952B2 (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5236962B2 (ja) * 2008-02-18 2013-07-17 株式会社ミツトヨ 被測定物の表裏面測定方法
JP2010237054A (ja) * 2009-03-31 2010-10-21 Toyota Motor Corp 組み付け精度測定方法および測定装置
WO2013135236A1 (de) * 2012-03-12 2013-09-19 Actech Gmbh Verfahren zur positionierung und fixierung von formteilen in giessformen
CN103341929B (zh) * 2013-06-27 2015-07-22 信义汽车玻璃(深圳)有限公司 一体注塑产品模型制作方法
DE112016001137B4 (de) * 2015-03-11 2024-01-18 Nalux Co., Ltd. Mit Abschnitt zur Positionsbestimmung versehenes Element und Messverfahren
CN110567425B (zh) * 2019-07-26 2024-04-19 赛诺威盛科技(北京)股份有限公司 用于精密对准装调探测器模块与后准直器的装置及方法

Similar Documents

Publication Publication Date Title
BE2015C007I2 (ja)
BE2014C055I2 (ja)
BE2014C027I2 (ja)
BE2014C003I2 (ja)
BE2013C075I2 (ja)
BE2013C069I2 (ja)
BE2013C038I2 (ja)
BE2013C036I2 (ja)
BE2011C030I2 (ja)
BE2015C005I2 (ja)
BE2012C053I2 (ja)
JP2004224118A5 (ja)
BE2015C024I2 (ja)
AU2002318342A1 (ja)
AU2003207787A1 (ja)
AU2002329412A1 (ja)
AU2002331433A1 (ja)
AU2002332887A1 (ja)
AU2002333044A1 (ja)
AU2002337949A1 (ja)
AU2002339901A1 (ja)
AU2002340206A1 (ja)
AU2002348177A1 (ja)
AU2002327042A1 (ja)
AU2002353888A1 (ja)