JP2004186735A5 - - Google Patents

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Publication number
JP2004186735A5
JP2004186735A5 JP2002347827A JP2002347827A JP2004186735A5 JP 2004186735 A5 JP2004186735 A5 JP 2004186735A5 JP 2002347827 A JP2002347827 A JP 2002347827A JP 2002347827 A JP2002347827 A JP 2002347827A JP 2004186735 A5 JP2004186735 A5 JP 2004186735A5
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JP
Japan
Prior art keywords
circuit
bias
voltage
semiconductor device
terminal
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Pending
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JP2002347827A
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Japanese (ja)
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JP2004186735A (en
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Priority to JP2002347827A priority Critical patent/JP2004186735A/en
Priority claimed from JP2002347827A external-priority patent/JP2004186735A/en
Publication of JP2004186735A publication Critical patent/JP2004186735A/en
Publication of JP2004186735A5 publication Critical patent/JP2004186735A5/ja
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Claims (6)

複数の端子を有する半導体素子と、この半導体素子の1つの端子にバイアス電圧を供給するバイアス電源回路とを具備した半導体素子用バイアス回路において、前記1つの端子と前記バイアス電源回路との間の点の電圧が所定値を越えた場合に、前記点の電圧の上昇を停止させる保護回路を設けたことを特徴とする半導体素子用バイアス回路。A bias circuit for a semiconductor device comprising a semiconductor device having a plurality of terminals and a bias power supply circuit for supplying a bias voltage to one terminal of the semiconductor device, and a point between the one terminal and the bias power supply circuit If the voltage of exceeds a predetermined value, the bias circuit for the semiconductor element characterized in that a protection circuit for stopping the increase of the voltage of the point. 複数の端子を有する半導体素子と、この半導体素子の1つの端子にバイアス電圧を供給するバイアス電源回路とを具備した半導体素子用バイアス回路において、前記1つの端子と前記バイアス電源回路との間の点の電圧が所定値よりも低下した場合に、前記点の電圧の降下を停止させる保護回路を設けたことを特徴とする半導体素子用バイアス回路。A bias circuit for a semiconductor device comprising a semiconductor device having a plurality of terminals and a bias power supply circuit for supplying a bias voltage to one terminal of the semiconductor device, and a point between the one terminal and the bias power supply circuit A bias circuit for a semiconductor element, provided with a protection circuit that stops a drop in the voltage at the point when the voltage of the voltage drops below a predetermined value. 複数の端子を有する半導体素子と、この半導体素子の1つの端子にバイアス電圧を供給するバイアス電源回路とを具備した半導体素子用バイアス回路において、前記1つの端子と前記バイアス電源回路との間の点に接続し、前記点の電圧が所定値よりも大きい場合に導通状態となる回路素子を有する保護回路を設けたことを特徴とする半導体素子用バイアス回路。A bias circuit for a semiconductor device comprising a semiconductor device having a plurality of terminals and a bias power supply circuit for supplying a bias voltage to one terminal of the semiconductor device, and a point between the one terminal and the bias power supply circuit And a protective circuit having a circuit element that is conductive when the voltage at the point is higher than a predetermined value. 複数の端子を有する半導体素子と、この半導体素子の1つの端子にバイアス電圧を供給するバイアス電源回路とを具備した半導体素子用バイアス回路において、前記1つの端子と前記バイアス電源回路との間の点に接続し、前記点の電圧が所定値よりも小さい場合に導通状態となる回路素子を有する保護回路を設けたことを特徴とする半導体素子用バイアス回路。A bias circuit for a semiconductor device comprising a semiconductor device having a plurality of terminals and a bias power supply circuit for supplying a bias voltage to one terminal of the semiconductor device, and a point between the one terminal and the bias power supply circuit And a protection circuit having a circuit element that is conductive when the voltage at the point is smaller than a predetermined value. 複数の端子を有する半導体素子と、この半導体素子の1つの端子にバイアス電圧を供給するバイアス電源回路とを具備した半導体素子用バイアス回路において、前記1つの端子と前記負電圧供給回路との間の点に接続し、かつ、前記点の電圧が第1所定値よりも大きい場合に導通状態となる第1回路素子および前記点の電圧が第2所定値よりも小さい場合に導通状態となる第2回路素子を有する保護回路を設けたことを特徴とする半導体素子用バイアス回路。A semiconductor element having a plurality of terminals, in the semiconductor device bias circuits and a bias power supply circuit for supplying a bias voltage to one terminal of the semiconductor device, between the one terminal and the negative voltage supply circuit A first circuit element that is connected to a point and is conductive when the voltage at the point is greater than a first predetermined value and a second circuit element that is conductive when the voltage at the point is less than a second predetermined value. A bias circuit for a semiconductor element, comprising a protection circuit having a circuit element. 半導体素子が電界効果トランジスタで、1つの端子がゲート端子である請求項1ないし請求項5のいずれか1つに記載の半導体素子用バイアス回路。  6. The bias circuit for a semiconductor element according to claim 1, wherein the semiconductor element is a field effect transistor and one terminal is a gate terminal.
JP2002347827A 2002-11-29 2002-11-29 Bias circuit for semiconductor element Pending JP2004186735A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002347827A JP2004186735A (en) 2002-11-29 2002-11-29 Bias circuit for semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002347827A JP2004186735A (en) 2002-11-29 2002-11-29 Bias circuit for semiconductor element

Publications (2)

Publication Number Publication Date
JP2004186735A JP2004186735A (en) 2004-07-02
JP2004186735A5 true JP2004186735A5 (en) 2005-09-02

Family

ID=32750897

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002347827A Pending JP2004186735A (en) 2002-11-29 2002-11-29 Bias circuit for semiconductor element

Country Status (1)

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JP (1) JP2004186735A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4568033B2 (en) 2004-06-10 2010-10-27 株式会社東芝 Semiconductor amplifier circuit
JP6187078B2 (en) * 2013-09-19 2017-08-30 三菱電機株式会社 amplifier
CN110661496A (en) * 2018-06-29 2020-01-07 中兴通讯股份有限公司 Amplifier bias voltage protection circuit and electronic equipment

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