JP2004134792A - Resin wiring board with pins - Google Patents

Resin wiring board with pins Download PDF

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JP2004134792A
JP2004134792A JP2003328887A JP2003328887A JP2004134792A JP 2004134792 A JP2004134792 A JP 2004134792A JP 2003328887 A JP2003328887 A JP 2003328887A JP 2003328887 A JP2003328887 A JP 2003328887A JP 2004134792 A JP2004134792 A JP 2004134792A
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Prior art keywords
pin
diameter
pins
wiring board
rod
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Norimine Miyamoto
宮本 憲峰
Kazuhisa Sato
佐藤 和久
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Niterra Co Ltd
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NGK Spark Plug Co Ltd
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Abstract

【課題】 本発明は、樹脂製配線基板のピン接合部にフラットピンがハンダ付けされたピン付樹脂製配線基板を対象とし、そのフラットピンの小型化に適した形で、該フラットピンとピン接合部との接合信頼性を高かめることを可能とするピン付樹脂製配線基板を提供することにある。
【解決手段】 上記課題を解決するための本発明のピン付樹脂製配線基板は、
 径が0.35mm以下とされる棒状部と、該棒状部の一方の端部に形成されるとともに該棒状部よりも大径の同心板状の大径部と、からなるフラットピンが、
 基板の主面に設けられたピン接合部に、前記大径部においてハンダ付けされたピン付樹脂製配線基板であって、
 前記フラットピンの前記棒状部の径をSとし、前記大径部の径をWとした場合、
 前記棒状部の径と前記大径部の径との比(W/S)は、2.16以上2.67以下とされてなることを特徴とする。
【選択図】    図1
PROBLEM TO BE SOLVED: To provide a pin-attached resin wiring board in which flat pins are soldered to pin joining portions of a resin wiring board, and to connect the flat pins with the flat pins in a form suitable for miniaturization of the flat pins. An object of the present invention is to provide a resin wiring board with pins that can enhance the reliability of joining with a part.
SOLUTION: A resin wiring board with pins according to the present invention for solving the above-mentioned problems,
A flat pin composed of a rod-shaped part having a diameter of 0.35 mm or less and a concentric plate-shaped large-diameter part formed at one end of the rod-shaped part and having a diameter larger than the rod-shaped part,
A pin-attached resin wiring board soldered at the large-diameter portion to a pin joint provided on a main surface of the board,
When the diameter of the rod portion of the flat pin is S and the diameter of the large diameter portion is W,
The ratio (W / S) of the diameter of the rod-shaped portion to the diameter of the large-diameter portion is set to be 2.16 or more and 2.67 or less.
[Selection diagram] Fig. 1

Description

 本発明はピン付樹脂製配線基板に関し、詳しくは半導体集積回路素子(IC)等の電子部品を搭載して封止するPGA(ピングリッドアレイ)タイプのパッケージ配線基板のように、層間絶縁体層が樹脂材を用いて形成されるとともに、その配線基板の主面に形成された多数のピン接合部(電極)にピン(入出力端子)がハンダ付けされたピン付樹脂製配線基板に関する。 The present invention relates to a resin wiring board with pins, and more particularly, to an interlayer insulating layer such as a PGA (pin grid array) type package wiring board in which electronic components such as semiconductor integrated circuit elements (ICs) are mounted and sealed. The present invention relates to a resin wiring board with pins, in which pins (input / output terminals) are soldered to a large number of pin joints (electrodes) formed on the main surface of the wiring board.

 PGAタイプの樹脂製配線基板(以下、単に基板ともいう)は、その一主面にLSIやICチップなどの電子部品を搭載する際に用いる、多数のパット状のピン接合部(電極)を備えており、他方の主面にはマザーボードなどに設けられたソケットへ差し込むための多数のピンを備えたものとされている。このピンとしては、例えば、棒状部と、その一方の端部に形成される板状の大径部(棒状部よりも大径)とからなるネイル形状のフラットピンが一般的に用いられている。また、このフラットピンは、ハンダ付けにて形成されるハンダ層を介して、その大径部を基板のピン接合部に対向させるようにして接合形成されている。 A PGA-type resin wiring substrate (hereinafter, also simply referred to as a substrate) has a large number of pad-shaped pin joints (electrodes) used for mounting electronic components such as an LSI and an IC chip on one main surface thereof. The other main surface is provided with a number of pins for inserting into a socket provided on a motherboard or the like. As this pin, for example, a nail-shaped flat pin composed of a bar-shaped portion and a plate-shaped large-diameter portion (having a larger diameter than the bar-shaped portion) formed at one end thereof is generally used. . Further, the flat pin is joined and formed so that a large diameter portion thereof is opposed to a pin joining portion of a substrate via a solder layer formed by soldering.

 上記のようなタイプのピン付樹脂製配線基板においては、搭載するLSIやICチップあるいはチップコンデンサなどの電子部品の高集積化および高密度化を図るために、小型化や接続端子数(ピン数)の多ピン化が進められている。そのため、自身が有するフラットピンにおいても、その棒状部の径を縮径化させる形で、ピンの小型化が図られている。 In a resin wiring board with pins of the type described above, in order to achieve high integration and high density of electronic components such as an LSI, an IC chip or a chip capacitor to be mounted, the size and the number of connection terminals (number of pins) are reduced. The number of pins is increasing. For this reason, even in the flat pin of the device itself, the size of the pin is reduced by reducing the diameter of the rod portion.

特開2001−267451号公報JP 2001-267451 A 特開2001−217341号公報JP 2001-217341 A 特開2001−358277号公報JP 2001-358277 A

 上記ピン付樹脂製配線基板が備えるフラットピンの小型化に関して言えば、近年その棒状部の径を、例えば0.30mm程度、具体的には、0.35mm以下(例えば0.25mm以上0.35mm以下)と、その縮径化を図ることが数値的範囲として必要とされてきている。そこで、このようにフラットピンの棒状部に対して縮径化を図る場合、その縮径化された棒状部の径に応じる形で、フラットピンの大径部の大きさを適正化させる必要がある。この適正化がなされないと、ピン付樹脂製配線基板においてフラットピンの大径部と、ピン接合部との接合強度を十分に確保できず、例えばマザーボードのソケットに挿入する際などに、意図せずフラットピンの軸方向やその傾斜方向に過度の外力が発生した場合、フラットピンを接合させるハンダ層とピン接合部との界面近傍、または、フラットピンの大径部とハンダ層との界面近傍などに剥がれが発生してしまうことになる。このことは、当然、ピン付き樹脂配線基板に求められる電気的特性などの品質が保持されないことになる。 Regarding the miniaturization of the flat pin provided in the resin wiring board with pins, in recent years, the diameter of the bar portion has been reduced to, for example, about 0.30 mm, specifically, 0.35 mm or less (for example, 0.25 mm to 0.35 mm). The following) and reducing the diameter are required as a numerical range. Therefore, when reducing the diameter of the rod portion of the flat pin in this way, it is necessary to optimize the size of the large diameter portion of the flat pin in a form corresponding to the diameter of the reduced rod portion. is there. If this adjustment is not made, the joint strength between the large diameter portion of the flat pin and the pin joint in the resin wiring board with pins cannot be sufficiently ensured. If an excessive external force occurs in the axial direction of the flat pin or in the direction of its inclination, the vicinity of the interface between the solder layer to which the flat pin is joined and the pin joint or the interface between the large diameter portion of the flat pin and the solder layer Peeling will occur. This means that the quality such as the electrical characteristics required of the resin wiring board with pins cannot be maintained.

 本発明は、まさに上記問題を鑑みてなされたものである。樹脂製配線基板のピン接合部にフラットピンがハンダ付けされたピン付樹脂製配線基板を対象とし、そのフラットピンの小型化に適した形で、該フラットピンとピン接合部との接合信頼性を高かめることを可能とするピン付樹脂製配線基板を提供することにある。 The present invention has been made in view of the above problems. For a resin wiring board with pins with flat pins soldered to the pin joints of the resin wiring board, the joint reliability between the flat pins and the pin joints is improved in a form suitable for miniaturization of the flat pins. It is an object of the present invention to provide a resin wiring board with pins that can be raised.

 上記課題を解決するための本発明のピン付樹脂製配線基板は、
 径が0.35mm以下とされる棒状部と、該棒状部の一方の端部に形成されるとともに該棒状部よりも大径の同心板状の大径部と、からなるフラットピンが、
 基板の主面に設けられたピン接合部に、前記大径部においてハンダ付けされたピン付樹脂製配線基板であって、
 前記フラットピンの前記棒状部の径をSとし、前記大径部の径をWとした場合、
 前記棒状部の径と前記大径部の径との比(W/S)は、2.16以上2.67以下とされてなることを特徴とする。
The resin wiring board with pins of the present invention for solving the above-mentioned problems,
A flat pin composed of a rod-shaped part having a diameter of 0.35 mm or less and a concentric plate-shaped large-diameter part formed at one end of the rod-shaped part and having a diameter larger than the rod-shaped part,
A pin-attached resin wiring board soldered at the large-diameter portion to a pin joint provided on a main surface of the board,
When the diameter of the rod portion of the flat pin is S and the diameter of the large diameter portion is W,
The ratio (W / S) of the diameter of the rod-shaped portion to the diameter of the large-diameter portion is set to be 2.16 or more and 2.67 or less.

 上記本発明のピン付樹脂製配線基板において用いるピンは、棒状部と、該棒状部の一方の端部に形成されるとともに該棒状部よりも大径の同心板状の大径部とからなる、いわゆるフラットピンとされる。また、その棒状部の径は、ピン付樹脂製配線基板に搭載されるLSIやICチップなどの電子部品の高集積化、高密度化への対応を図る意味で、0.35mm以下(例えば0.25mm以上0.35mm以下:0.25mm未満ではピン強度が低下する惧れがある)に設定されてなる。このようにフラットピンの棒状部の縮径化をなす場合、基板の主面に設けられたピン接合部と、フラットピンの大径部との接合強度を十分に確保するために、該大径部の大きさを適正化させる必要がある。そこで、本発明において、フラットピンの棒状部の径をSとし、大径部の径をWとした場合、棒状部の径と大径部の径との比(W/S)は、2.16以上2.67以下とされる。比(W/S)が2.16未満となると、大径部の土台としての役割が損なわれ、フラットピンの軸方向を鉛直方向とした場合、水平方向の外力に対して十分な接合強度を保てなくなる。また、大径部におけるハンダ付けにて形成されるハンダ層との接着面積が減少するため、鉛直上方向の外力に対しても十分な接合強度を保てなくなる。一方、比(W/S)が2.67を超えると、棒状部の径に対して必要以上に過大なものとなり、過剰な接合強度を要求するのと等価となる。つまり、比(W/S)は、2.67を上限値として確保されていれば、接合強度を十分に確保することが可能である。また、比(W/S)が2.67を超えると、大径部の形成体積の増大によりコスト面においても不利益と言える。 The pins used in the resin wiring board with pins of the present invention include a rod-shaped portion and a large-diameter portion formed at one end of the rod-shaped portion and having a diameter larger than that of the rod-shaped portion. , So-called flat pins. The diameter of the rod portion is 0.35 mm or less (for example, 0 mm or less) in order to cope with high integration and high density of electronic components such as LSIs and IC chips mounted on a resin wiring board with pins. 0.25 mm or more and 0.35 mm or less: If it is less than 0.25 mm, the pin strength may be reduced). When the diameter of the rod portion of the flat pin is reduced in this way, in order to ensure sufficient bonding strength between the pin bonding portion provided on the main surface of the substrate and the large diameter portion of the flat pin, the diameter of the large diameter portion is reduced. It is necessary to optimize the size of the part. Therefore, in the present invention, when the diameter of the rod portion of the flat pin is S and the diameter of the large diameter portion is W, the ratio (W / S) between the diameter of the rod portion and the diameter of the large diameter portion is 2. It is 16 or more and 2.67 or less. When the ratio (W / S) is less than 2.16, the role of the large diameter portion as a base is impaired, and when the axial direction of the flat pin is set to the vertical direction, sufficient joint strength against horizontal external force is obtained. I can't keep it. Further, the bonding area of the large diameter portion with the solder layer formed by soldering is reduced, so that it is not possible to maintain sufficient bonding strength against external force in a vertically upward direction. On the other hand, when the ratio (W / S) exceeds 2.67, the ratio becomes excessively larger than necessary with respect to the diameter of the rod-shaped portion, which is equivalent to requesting excessive bonding strength. That is, if the ratio (W / S) is secured with 2.67 as the upper limit, it is possible to sufficiently secure the bonding strength. Further, when the ratio (W / S) exceeds 2.67, it can be said that there is a disadvantage in cost due to an increase in the formation volume of the large diameter portion.

 次に、本発明のピン付樹脂製配線基板において、前記大径部の厚さをTとした場合、前記棒状部の径と前記大径部の厚さとの比(T/S)は、0.40以上0.67以下とされてなることを特徴とする。上記のように、フラットピンの大径部の径を適正化することで、フラットピンの小型化に適した形で、フラットピンとピン接合部との接合強度を有為に確保することが可能とされるが、さらには、フラットピンの大径部の厚さも適正化することが望ましい。そこで、本発明において、棒状部の径と大径部の厚さとの比(T/S)は、0.40以上0.67以下とされる。比(T/S)が0.40未満となると、過度に厚さが薄いものとなり、大径部の土台としての役割が損なわれてしまう場合がある。つまり、ピンの大径部が棒状部を支えるための十分な強度を保てず、ピンが折れ易くなってしまうのである。このような大径部の厚さに係るピンの折れやすさを、土台強度と定義し、以下に詳細な説明を行う。ここで例えば、ピンの棒状部の先端に水平方向(ピンの軸方向を鉛直方向とする)の外力が加わったとした場合を考えてみると、該外力により発生するピンへの応力は、ピンの棒状部と大径部との境界近傍に集中的に生じる。その応力は、応力が生じた部分からピンの先端までの長さに応じた(比例した)大きさであるから、ピンの全長が同一である場合には、応力が生じた部分からピンの先端までの長さが大きければ大きいほど、つまり大径部の厚さが小さければ小さいほど、棒状部と大径部との境界近傍に、より大きな応力が加わる。また、水平方向の外力であることや、外力がピンの先端に加わることに限らず、ピンの棒状部に加わる外力は、全てピンの先端に加わる水平方向の外力として扱うことができるので、上記の説明はピンの棒状部に加わる全ての外力に対して成立つ。以上の理由により、大径部の厚さが小さくなればなる程、応力によりピンが折れやすくなる。 Next, in the resin-made wiring board with pins of the present invention, assuming that the thickness of the large-diameter portion is T, the ratio (T / S) between the diameter of the rod-shaped portion and the thickness of the large-diameter portion is 0. .40 or more and 0.67 or less. As described above, by optimizing the diameter of the large diameter portion of the flat pin, it is possible to significantly secure the joining strength between the flat pin and the pin joint in a form suitable for downsizing the flat pin. However, it is desirable that the thickness of the large-diameter portion of the flat pin is also optimized. Therefore, in the present invention, the ratio (T / S) between the diameter of the rod portion and the thickness of the large diameter portion is set to 0.40 or more and 0.67 or less. If the ratio (T / S) is less than 0.40, the thickness becomes excessively thin, and the role of the large diameter portion as a base may be impaired. That is, the large diameter portion of the pin cannot maintain sufficient strength to support the rod portion, and the pin is easily broken. The ease with which the pin is broken according to the thickness of the large diameter portion is defined as the base strength, and will be described in detail below. Here, for example, when it is assumed that an external force in the horizontal direction (the axial direction of the pin is a vertical direction) is applied to the tip of the rod portion of the pin, the stress on the pin generated by the external force is It occurs intensively near the boundary between the rod-shaped portion and the large diameter portion. The magnitude of the stress is (proportional) according to the length from the stressed portion to the tip of the pin. Therefore, when the entire length of the pin is the same, the stress starts from the stressed portion to the tip of the pin. The greater the length of the large diameter portion, that is, the smaller the thickness of the large diameter portion, the more stress is applied near the boundary between the rod portion and the large diameter portion. Also, not only the external force in the horizontal direction and the external force applied to the tip of the pin, but also the external force applied to the rod-shaped portion of the pin can be handled as the horizontal external force applied to the tip of the pin. Is valid for all external forces applied to the rod portion of the pin. For the above reasons, the smaller the thickness of the large diameter portion, the more easily the pin is broken by stress.

 一方、前記比(T/S)が0.67を超えると、必要以上に前記土台強度を要求することになり、比(T/S)としては、0.67を上限値とすれば十分であると言える。また、大径部の体積の増大によりコスト面においても不利益である。 On the other hand, if the ratio (T / S) exceeds 0.67, the base strength is required more than necessary, and it is sufficient to set the upper limit of the ratio (T / S) to 0.67. It can be said that there is. In addition, there is a disadvantage in cost due to an increase in the volume of the large diameter portion.

 さらには、前記棒状部の径と前記大径部の径との比(W/S)は、2.33以上2.67以下、前記棒状部の径と前記大径部の厚さとの比(T/S)は、0.40以上0.54以下とされてなることを特徴とする。上述したフラットピンにおける大径部の径や厚さを適正化することは、フラットピンとピン接合部との接合強度、及び土台強度を確保するためである。しかしながら、このように接合強度及び土台強度を確保した状態においても、意図しない外力が過度にフラットピンに印加された場合、ピン付樹脂製配線基板がフラットピンを起点として損傷することが想定される。この損傷する形態としては、3つに大別することができる。1つ目は図6(a)に示すようなピンのみが折損する形態、2つ目は図6(b)に示すようなピンの大径部とハンダ層との界面近傍が剥がれる形態、3つ目は図6(c)に示すようなピンを接合するためのハンダ層とピン接合部との界面近傍が剥がれる形態である。このうち、2及び3つ目の形態と比べて1つ目の形態は、ピンのみが損傷するため基板及びハンダ層が傷つくことはない。したがって、損傷が起こるならばピンのみが折れる形態が望ましい。 Further, the ratio (W / S) of the diameter of the rod portion to the diameter of the large diameter portion is 2.33 or more and 2.67 or less, and the ratio of the diameter of the rod portion to the thickness of the large diameter portion ( T / S) is not less than 0.40 and not more than 0.54. The reason for optimizing the diameter and thickness of the large diameter portion of the flat pin is to secure the joint strength between the flat pin and the pin joint and the base strength. However, even in the state where the bonding strength and the base strength are secured in this way, if an unintended external force is excessively applied to the flat pins, the resin wiring board with pins may be damaged starting from the flat pins. . This damage mode can be roughly classified into three. The first is a mode in which only the pin is broken as shown in FIG. 6A, and the second is a mode in which the vicinity of the interface between the large diameter portion of the pin and the solder layer is peeled off as shown in FIG. The third is a mode in which the vicinity of the interface between the solder layer for joining the pins and the pin joint as shown in FIG. 6C is peeled off. In the first mode, the substrate and the solder layer are not damaged because only the pins are damaged as compared with the second and third modes. Therefore, it is desirable that only the pin be broken if damage occurs.

 このようにピンに外力が印加された場合に、ピンのみが折れるためには、前述の棒状部の径と大径部の径との比(W/S=2.16〜2.67)、及び棒状部の径と大径部の厚さとの比(T/S=0.40〜0.67)の範囲の中で、棒状部の径と大径部の径との比が大きく(W/S=2.33〜2.67)、棒状部の径と大径部の厚さとの比が小さい(T/S=0.40〜0.54)範囲であることが望ましい。ここで、棒状部の径と大径部の径との比(W/S)が大きい範囲に限定要求されるのは、比(W/S)が前述の通り接合強度と関係するため、その比(W/S)が小さく接合強度が弱ければ、外力が印加された際にピンが損傷するよりも先に、接合強度の弱いピンとハンダ、又はハンダとピン接合部の界面近傍が剥がれてしまい、基板及びハンダ層が損傷する可能性が大きくなってしまうからである。また、棒状部の径と大径部の厚さとの比(T/S)が小さい範囲に限定要求されるのは、比(T/S)が前述の通り土台強度と関係するため、その比(T/S)が大きく土台強度が強ければ、外力が印加された際に、大径部の強度が強いためピンは折れにくく、外力はピンとハンダ、又はハンダとピン接合部の界面近傍に伝わるため、それらの界面が剥がれてしまい、基板及びハンダ層が損傷する可能性が大きくなってしまうからである。 In order to break only the pin when an external force is applied to the pin in this manner, the ratio of the diameter of the rod-shaped portion to the diameter of the large-diameter portion (W / S = 2.16 to 2.67) The ratio of the diameter of the rod portion to the diameter of the large diameter portion is large (W / W) within the range of the ratio of the diameter of the rod portion to the thickness of the large diameter portion (T / S = 0.40 to 0.67). /S=2.33 to 2.67), and the ratio of the diameter of the rod portion to the thickness of the large diameter portion is desirably small (T / S = 0.40 to 0.54). Here, the reason why the ratio (W / S) between the diameter of the rod-shaped portion and the diameter of the large diameter portion is required to be limited to a large range is that the ratio (W / S) is related to the bonding strength as described above. If the ratio (W / S) is small and the bonding strength is weak, the pin and solder having weak bonding strength, or the vicinity of the interface between the solder and the pin joint is peeled off before the pin is damaged when an external force is applied. This is because the possibility that the substrate and the solder layer are damaged is increased. Further, the ratio (T / S) between the diameter of the rod portion and the thickness of the large diameter portion is required to be limited to a small range because the ratio (T / S) is related to the base strength as described above. If (T / S) is large and the base strength is strong, the pin is hard to be broken due to the strength of the large diameter portion when an external force is applied, and the external force is transmitted to the vicinity of the interface between the pin and the solder or the solder-pin joint. As a result, the interface is peeled off, and the possibility of damaging the substrate and the solder layer increases.

 前記ハンダ付けに基づいて形成されるハンダ層の形成厚さは、前記ピン接合部の第一主表面から、前記フラットピン側への厚さ方向において、0.30mm以下となるように調整されてなる。0.30mmを超えると、基板上にICを搭載、封止して半導体装置とし、マザーボードのソケットにピンを差込んだ場合に、ハンダがソケットに当たってしまい半導体装置のセットに支障が生じる場合がある。また、下限値は0.10mmとする。0.10mm未満では、ピン保持面積が低下してハンダとピンとの接合強度が低くなるためである。 The thickness of the solder layer formed based on the soldering is adjusted to be 0.30 mm or less in the thickness direction from the first main surface of the pin joint to the flat pin side. Become. If it exceeds 0.30 mm, the IC may be mounted on a substrate and sealed to form a semiconductor device, and when a pin is inserted into a socket of a motherboard, solder may hit the socket and a problem may occur in the set of the semiconductor device. . The lower limit is set to 0.10 mm. If the thickness is less than 0.10 mm, the pin holding area decreases, and the bonding strength between the solder and the pin decreases.

 本発明のピン付樹脂製配線基板では、前記フラットピンは、少なくとも銅を含む金属よりなる。銅は導電性に優れるため、フラットピンの素材として適している。また、銅は軟らかいため、応力が生じた場合に変形するのでピンが折損し難い等の有利な点も備える。なお、銅単体からなるピンでは、ピンとして軟らか過ぎるので、強度が十分に確保できない場合がある。そこで、鉄等の金属を少量含む銅合金(例えば、アロイ194(CDA合金 C19400(ASTM B 465準拠))等)とするのがさらに望ましい。 で は In the resin wiring board with pins of the present invention, the flat pins are made of a metal containing at least copper. Copper is suitable as a material for flat pins because of its excellent conductivity. In addition, since copper is soft and deforms when stress is generated, it has an advantage that the pin is hardly broken. Note that a pin made of copper alone is too soft as a pin, so that sufficient strength may not be ensured in some cases. Therefore, it is more preferable to use a copper alloy containing a small amount of metal such as iron (for example, Alloy 194 (CDA alloy @ C19400 (based on ASTM B @ 465)) or the like).

 以上の説明から明らかなように本発明のピン付樹脂製配線基板は、ピンの大径部の径及び厚さを所定の条件を満たす大きさとしたため、ピンとピン接合部との十分な接合強度が得られるとともに、さらに、ピンに外力が作用した場合において、ピンのみが損傷し、ハンダ部分や基板が破壊されにくい。したがって本発明によれば、高い接合強度が得られ、損傷する場合においても修復が容易なピン付樹脂製配線基板となすことができる。また、本発明の配線基板は樹脂材質からなるが、樹脂製配線基板ではピンのハンダ付けに低融点のハンダを用いざるを得ないため、ピンの接合強度が低くなりがちである。しかし、本発明によれば、そのようなハンダを用いる場合でも、確実に接合強度のアップが図られる。 As is clear from the above description, the resin-made wiring board with pins of the present invention has a large diameter portion and a large thickness portion of the pin having a size that satisfies predetermined conditions. In addition, when an external force acts on the pin, only the pin is damaged, and the solder portion and the substrate are not easily broken. Therefore, according to the present invention, it is possible to obtain a resin wiring board with pins that can provide high bonding strength and can be easily repaired even when damaged. Further, the wiring board of the present invention is made of a resin material. However, in the case of a resin wiring board, low-melting-point solder must be used for soldering the pins, so that the bonding strength of the pins tends to be low. However, according to the present invention, even when such solder is used, the bonding strength can be reliably increased.

 本発明のピン付樹脂製配線基板の実施形態を、図面を参照しながら詳細に説明する。図1は、本発明に係るピン付樹脂製配線基板1の側面図である。図2は図1の拡大断面図であり、図3はさらなる拡大断面図である。このピン付樹脂製配線基板1は、平面視矩形(縦横各50mm、厚さ1mm)をなし、コア基板(0.8mm程度)に、エポキシ樹脂を主成分とする複数の樹脂絶縁層及び銅からなる内部配線層を多数積層した構造の樹脂製基板12を主体とする。上方の主面13には、搭載する半導体集積回路素子IC接続用の電極(図示せず)が多数形成されていると共に、内部には図示しないが各層の内部配線層、各内部配線層同士を接続するビアが形成されている。そして、下方の主面14にはビアに接続された平面視、例えば円形の導体層(銅)が多数形成され、その表面にニッケルメッキ及び金メッキがかけられてピン接合部15をなしている。このピン接合部15は、例えば、1.3mm程度の間隔で形成されている。 Embodiments of the resin wiring board with pins of the present invention will be described in detail with reference to the drawings. FIG. 1 is a side view of a resin wiring board with pins 1 according to the present invention. FIG. 2 is an enlarged sectional view of FIG. 1, and FIG. 3 is a further enlarged sectional view. The resin wiring board 1 with pins has a rectangular shape in plan view (each 50 mm in length and width, 1 mm in thickness), and a core board (about 0.8 mm) is made of a plurality of resin insulating layers mainly composed of epoxy resin and copper. A resin substrate 12 having a structure in which a number of internal wiring layers are laminated. On the upper main surface 13, a large number of electrodes (not shown) for connecting a semiconductor integrated circuit element IC to be mounted are formed, and an internal wiring layer of each layer (not shown) is formed. Vias to be connected are formed. A large number of conductive layers (copper) in plan view, for example, connected to vias, are formed on the lower main surface 14, and the surface thereof is plated with nickel and gold to form a pin joint 15. The pin joints 15 are formed at intervals of, for example, about 1.3 mm.

 なお、このような基板12の上下両主面13,14には、その略全面を覆うようにエポキシ樹脂からなるソルダーレジスト層17が被服形成されている。ソルダーレジスト層17の表面171の、ピン接合部15の第1主表面151からの高さH1は、20μm程度である。ただし、このソルダーレジスト層17は、本形態ではピン接合部15の第1主表面151周縁を所定の幅で覆って開口され、ピン接合部15の第一主表面151の中心より部位を同心状に露出させるように形成されている。因みに本例ではピン接合部(導体層)15の長さD1は1.13mm程度に設定され、その露出部位(ソルダーレジスト層17の開口、つまりピン接合部のうちソルダーレジスト層に覆われていない部分)の基板の主面と平行方向の長さD2、つまりハンダ付け面の径は1.03mm程度に設定されている。 The solder resist layer 17 made of epoxy resin is formed on the upper and lower main surfaces 13 and 14 of the substrate 12 so as to cover substantially the entire surface. The height H1 of the surface 171 of the solder resist layer 17 from the first main surface 151 of the pin joint 15 is about 20 μm. However, in the present embodiment, the solder resist layer 17 is opened so as to cover the periphery of the first main surface 151 of the pin joint 15 with a predetermined width, and concentrically extends from the center of the first main surface 151 of the pin joint 15. It is formed so as to be exposed to. Incidentally, in this example, the length D1 of the pin joint (conductor layer) 15 is set to about 1.13 mm, and the exposed portion thereof (the opening of the solder resist layer 17, that is, the pin joint is not covered by the solder resist layer). The length D2 in the direction parallel to the main surface of the substrate (part), that is, the diameter of the soldering surface is set to about 1.03 mm.

 一方、本実施形態において接合されているピン11は、例えばアロイ194(CDA合金 C19400(ASTM B 465準拠))等の銅合金からなり、断面円形の丸棒状の棒状部(直径0.30mm程度)111、及びその上端部に棒状部よりも大径で同心円板状の大径部112をもつネイル形状のフラットピンである。その大径部112のうち、上側のピン接合部15の第一主表面151と対向する面は、ピン接合部15の第一主表面151に同心状となるように配置され、適量のハンダでハンダ付けされている(ハンダ付けにより形成されるハンダの層をハンダ層16という)。なお、ハンダは、半導体集積回路素子ICのハンダ付け温度より融点が高い組成のハンダ(例えば、Pb82%/Sn10%/Sb8%、又はSn95%、Sb5%)とされている。 On the other hand, the pin 11 joined in the present embodiment is made of a copper alloy such as Alloy 194 (CDA alloy @ C19400 (based on ASTM B @ 465)) or the like, and is a round bar-shaped rod having a circular cross section (about 0.30 mm in diameter). 111, and a nail-shaped flat pin having a concentric disk-shaped large-diameter portion 112 with a diameter larger than that of the rod-shaped portion at the upper end thereof. The surface of the large-diameter portion 112 facing the first main surface 151 of the upper pin joint 15 is arranged so as to be concentric with the first main surface 151 of the pin joint 15 and is provided with an appropriate amount of solder. It is soldered (a solder layer formed by soldering is referred to as a solder layer 16). Note that the solder is a solder having a composition having a melting point higher than the soldering temperature of the semiconductor integrated circuit element IC (for example, Pb 82% / Sn 10% / Sb 8%, or Sn 95% and Sb 5%).

 Pb82%/Sn10%/Sb8%等のPb−Sn系ハンダを用いた場合、軟らかい鉛(Pb)を多く含むため、意図しない外力が過度にピン11に印加された場合に、ピン11に生じる応力を、ハンダ層16が変形することにより受け止めさせることができるので、外力に対するピン付樹脂製配線基板1の損傷(前述の3種類の形態の損傷)を起き難くすることが可能となる。 When a Pb-Sn-based solder such as Pb 82% / Sn 10% / Sb 8% is used, since a large amount of soft lead (Pb) is contained, when an unintended external force is excessively applied to the pin 11, the stress generated in the pin 11 Can be received when the solder layer 16 is deformed, so that it is possible to prevent the resin wiring board 1 with pins from being damaged by external force (the above three types of damage).

 本形態では、ピン11の棒状部111の径をSとし、大径部112の径(基板主面と平行方向の長さ)をWとした場合、棒状部の径と大径部の径との比(W/S)は2.33〜2.67の範囲(例えば、棒状部111の径Sが0.3mmである場合、大径部112の径Wは0.73mm又は0.75mm)であり、大径部112の厚さ(基板主面と垂直方向の長さ)をTとした場合、棒状部の径と大径部の厚さとの比(T/S)は0.40〜0.54の範囲内(例えば、棒状部111の径Sが0.3mmである場合、大径部112の厚さTは0.15mm)である。また、ソルダーレジスト層17の表面171からピン11の先端までの高さLは2.00mm程度(例えば、2.08mm)となっている。 In the present embodiment, when the diameter of the rod portion 111 of the pin 11 is S and the diameter of the large diameter portion 112 (length in a direction parallel to the main surface of the substrate) is W, the diameter of the rod portion and the diameter of the large diameter portion are equal to each other. (W / S) is in the range of 2.33 to 2.67 (for example, when the diameter S of the rod-shaped portion 111 is 0.3 mm, the diameter W of the large-diameter portion 112 is 0.73 mm or 0.75 mm) When the thickness of the large diameter portion 112 (length in the direction perpendicular to the main surface of the substrate) is T, the ratio (T / S) of the diameter of the rod portion to the thickness of the large diameter portion is 0.40 to 0.40. It is within a range of 0.54 (for example, when the diameter S of the rod-shaped portion 111 is 0.3 mm, the thickness T of the large-diameter portion 112 is 0.15 mm). The height L from the surface 171 of the solder resist layer 17 to the tip of the pin 11 is about 2.00 mm (for example, 2.08 mm).

 また、ピンの大径部112とピン接合部15は直接接触することなく、ピン接合部15の第一主表面151と対向する大径部112の上面113と、ピン接合部15の第一主表面151との間にハンダ層16が介在して、ピンの大径部112とピン接合部15とが接合されている。大径部の上面113とピン接合部の第一主表面151との間の距離は10〜30μm程度となっている。なお、ピンの大径部112とピン接合部15とが直接接触することがない方がハンダの付着面積の確保の点から好ましいが、これに限ることはなく、直接接していても良い。 Also, the large-diameter portion 112 of the pin and the pin joint 15 do not directly contact each other, and the upper surface 113 of the large-diameter portion 112 facing the first main surface 151 of the pin joint 15 and the first main surface of the pin joint 15 do not contact each other. The large diameter portion 112 of the pin and the pin joint 15 are joined with the solder layer 16 interposed between the pin 151 and the surface 151. The distance between the upper surface 113 of the large diameter portion and the first main surface 151 of the pin joint is about 10 to 30 μm. It is preferable that the large-diameter portion 112 of the pin does not directly contact the pin joint portion 15 from the viewpoint of securing the solder attachment area, but the present invention is not limited to this, and the pin may directly contact.

 ハンダ層16のピン接合部15の第1主表面151からの高さH2は0.3mm以下に設定されている。0.3mm以上になると、マザーボードのソケットにピンを差込んだ場合に、ソケットがハンダ層16に当たってしまい、マザーボードへのセットに支障が生じる。 (4) The height H2 of the pin joint 15 of the solder layer 16 from the first main surface 151 is set to 0.3 mm or less. When the thickness is 0.3 mm or more, when a pin is inserted into the socket of the motherboard, the socket hits the solder layer 16, which hinders setting on the motherboard.

 ハンダ層16の高さH2は、ピン大径部112の下面114の位置よりも高くなるよう設定される。本実施形態では、下面114の外周縁付近をハンダが覆っているが、ハンダ層16の高さH2が0.3mm以下の範囲であれば、下面114の全てをハンダが覆うような形態であっても構わない。なお、このようにハンダ層16の高さH2がピン大径部112の下面114の位置より高い方が、接合強度の点から望ましいが、これに限ることはなく、図4のようにハンダ層16の高さH2がピン大径部112の下面114の位置より低くてもよい。 高 The height H2 of the solder layer 16 is set to be higher than the position of the lower surface 114 of the pin large diameter portion 112. In the present embodiment, the solder covers the periphery of the lower surface 114 in the vicinity, but if the height H2 of the solder layer 16 is in the range of 0.3 mm or less, the entire lower surface 114 is covered with solder. It does not matter. It is desirable that the height H2 of the solder layer 16 is higher than the position of the lower surface 114 of the pin large-diameter portion 112 from the viewpoint of bonding strength. However, the present invention is not limited to this, and as shown in FIG. The height H2 of the pin 16 may be lower than the position of the lower surface 114 of the pin large diameter portion 112.

 なお、ハンダ層16はピン接合部15の第1主表面151表面に向かって濡れ広がっており、本実施形態では、そのハンダ濡れ広がりの径は、ピン接合部のうちソルダーレジスト層に覆われていない部分の基板の主面と平行方向の長さD2と同じになるよう形成されているが、これに限ることはなく、D2より小さくてもよいし、また、ソルダーレジスト17の開口部斜面172を一部覆うような形態であってもよい。 The solder layer 16 spreads wet toward the surface of the first main surface 151 of the pin joint 15, and in this embodiment, the diameter of the solder wetting spread is covered by the solder resist layer in the pin joint. It is formed so as to have the same length as the length D2 in the direction parallel to the main surface of the substrate where there is no portion, but is not limited to this, and may be smaller than D2, or the slope 172 of the opening of the solder resist 17. May be partially covered.

 ここで、本発明のピン付き配線基板の具体的な実施例を比較例とともに説明する。それぞれの試料におけるピンの棒状部の径と大径部の径との比(W/S)、及びピンの棒状部の径と大径部の厚さとの比(T/S)を図7に示す。ただし、ピンの棒状部の径Sは全て0.30mmである。以下、箇条書きにて記述すると、
(1)比(W/S)が2.00(大径部の径Wが0.60mm)であり、比(T/S)が0.83(厚さTが0.25mm)のピン(比較例:いずれの請求項にも属さない)を試料No.1のピンとした。
(2)比(W/S)が2.23(大径部の径Wが0.67mm)であり、比(T/S)が0.50(厚さTが0.15mm)のピン(実施例:請求項1及び2に属する。)を試料No.2のピンとした。
(3)比(W/S)が2.23(大径部の径Wが0.67mm)であり、比(T/S)が0.67(厚さTが0.20mm)のピン(実施例:請求項1及び2に属する。)を試料No.3のピンとした。
(4)比(W/S)が2.40(大径部の径Wが0.72mm)であり、比(T/S)が0.50(厚さTが0.15mm)のピン(実施例:請求項1及び2に、更に請求項3にも属する。)を試料No.4のピンとした。
(5)比(W/S)が2.50(大径部の径Wが0.75mm)であり、比(T/S)が0.50(厚さTが0.15mm)のピン(実施例:請求項1及び2に、更に請求項3にも属する。)を試料No.5のピンとした。
 試料No.1〜5のピンをそれぞれ、ソルダーレジスト層に覆われていない部分の基板の主面と平行方向の径が1.03mmであるピン接合部を有する樹脂製配線基板に、多数ハンダ付けして、ピン付樹脂製配線基板試料を作製し、それらを試料No.1〜5とした(前記ピンの番号に対応する)。そして、それぞれのピン付樹脂製配線基板試料No.1〜5の各々30本のピンの接合強度を確認した。
Here, specific examples of the wiring board with pins of the present invention will be described together with comparative examples. FIG. 7 shows the ratio (W / S) between the diameter of the rod-shaped portion of the pin and the diameter of the large-diameter portion and the ratio (T / S) between the diameter of the rod-shaped portion of the pin and the thickness of the large-diameter portion in each sample. Show. However, the diameters S of the rod-shaped portions of the pins are all 0.30 mm. Below, in the bullet point,
(1) A pin having a ratio (W / S) of 2.00 (diameter W of the large diameter portion is 0.60 mm) and a ratio (T / S) of 0.83 (thickness T is 0.25 mm) Comparative Example: not belonging to any claim) 1 pin.
(2) A pin having a ratio (W / S) of 2.23 (diameter W of the large diameter portion is 0.67 mm) and a ratio (T / S) of 0.50 (thickness T is 0.15 mm) Example: It belongs to claims 1 and 2). 2 pins.
(3) A pin having a ratio (W / S) of 2.23 (diameter W of the large diameter portion is 0.67 mm) and a ratio (T / S) of 0.67 (thickness T is 0.20 mm) ( Example: It belongs to claims 1 and 2). 3 pins.
(4) A pin having a ratio (W / S) of 2.40 (the diameter W of the large diameter portion is 0.72 mm) and a ratio (T / S) of 0.50 (thickness T is 0.15 mm) ( Example: Sample No. 1 belongs to claims 1 and 2 and further belongs to claim 3). 4 pins.
(5) A pin having a ratio (W / S) of 2.50 (the diameter W of the large diameter portion is 0.75 mm) and a ratio (T / S) of 0.50 (thickness T of 0.15 mm) ( Example: Sample No. 1 belongs to claims 1 and 2 and further belongs to claim 3). 5 pins.
Each of the pins of sample Nos. 1 to 5 was soldered to a resin wiring board having a pin joint having a diameter of 1.03 mm in a direction parallel to the main surface of the substrate not covered with the solder resist layer. Then, a resin-made wiring board sample with pins was prepared, and these were referred to as sample Nos. 1 to 5 (corresponding to the pin numbers). Then, each of the resin wiring board samples with pin No. The bonding strength of 30 pins each of 1 to 5 was confirmed.

 接合強度は、図5に示すようにピンの軸方向に対し20度傾斜する方向に引っ張った場合におけるピン付樹脂製配線基板の破壊荷重(kg)である。測定は試料1〜5において、それぞれ30回行った。図8に測定結果、測定結果の平均値及び標準偏差を、図10に測定結果の平均値及び標準偏差の値を示す。なお、本発明の実施例において、良否判定の基準は、前記破壊荷重が2.25kg以上であるものとする。 (5) The bonding strength is the breaking load (kg) of the resin wiring board with pins when the pin is pulled in a direction inclined by 20 degrees with respect to the axial direction of the pins as shown in FIG. The measurement was performed 30 times for each of Samples 1 to 5. FIG. 8 shows the measurement result, the average value and the standard deviation of the measurement result, and FIG. 10 shows the average value and the standard deviation value of the measurement result. In the embodiment of the present invention, the criterion for the quality judgment is that the breaking load is 2.25 kg or more.

 図8に示されるように、比較例である試料No.1のものでは、接合強度の平均値が良否判定の基準である2.25kgを下回っている。これに対し、実施例である試料No.2〜5までのものでは、接合強度の平均値が2.25kgを上回っている。よって、大径部の径及び厚さが本発明の範囲内であるピンを有するピン付樹脂製配線基板試料は、比較例と比べて、好ましい接合強度を有することがわかる。ただし、試料No.2及び3のものでは、測定値が2.25kgを下回るものが数点あり、また標準偏差が試料No.4及び5と比べて大きい傾向にある。 よ う As shown in FIG. 8, in the case of Sample No. 1 which is a comparative example, the average value of the bonding strength is lower than 2.25 kg which is a criterion for quality judgment. On the other hand, the sample No. In the cases of 2 to 5, the average value of the joining strength exceeds 2.25 kg. Therefore, it can be seen that the pin-attached resin-made wiring board sample having the pin whose diameter and thickness of the large-diameter portion are within the range of the present invention has preferable bonding strength as compared with the comparative example. However, the sample No. In some of the samples Nos. 2 and 3, the measured value was less than 2.25 kg, and the standard deviation was less than that of Sample No. 2. There is a tendency to be larger than 4 and 5.

 また、前述の通り、ピンに外力が加わった場合にピン付樹脂製配線基板が損傷する形態は、図6に示すよう3つに大別され、それらの損傷のうち、起こるならばピンのみが折損することが望ましい。そこで、上記測定において、ピン付樹脂製配線基板試料が損傷した際に、どのような形態で損傷したかの観察を行った。図9に示す結果によると、請求項3に属する試料No.4では8割以上、試料No.5では9割以上がピンのみが破壊したのに対し、比較例である試料No.1では全てがハンダ破壊であり、また、請求項3に属さない試料No.2でもハンダ破壊が大半を占め、試料No.3ではピン破壊も見られるが、5割以上をハンダ破壊が占めている。よって、大径部の径及び厚さが本発明の請求項3の範囲内にあるピンを有するピン付樹脂製配線基板試料は、その他の試料と比べて、破壊の際に、望ましい損傷形態である、ピンのみが折損する形態が多いことがわかる。さらに、図8及び10に示したように、試料No.4及び5は、試料No.1〜3と比べて、破壊荷重の測定結果の平均値が大きいのに加えて、標準偏差においても6〜8割程度小さい値であることから、ピンのみが損傷する形態では、他の損傷形態と比べて、破壊荷重のバラツキが少なく、安定した製品を供給することにも有利であることがわかる。 Further, as described above, the form in which the resin circuit board with pins is damaged when an external force is applied to the pins is roughly classified into three types as shown in FIG. It is desirable to break. Therefore, in the above-described measurement, when the resin-made wiring board sample with pins was damaged, an observation was made as to how the sample was damaged. According to the results shown in FIG. No. 4, 80% or more of the sample No. In the case of Sample No. 5 which is a comparative example, only the pins were broken in 90% or more of Sample No. 5. In Sample No. 1, all of the samples were broken by solder. In sample No. 2, solder breakage accounted for the majority, and sample No. In No. 3, pin destruction is also seen, but solder destruction accounts for more than 50%. Therefore, the pin-attached resin wiring board sample having the pin whose diameter and thickness of the large-diameter portion fall within the scope of claim 3 of the present invention has a more desirable form of damage when destroyed than the other samples. It can be seen that there are many cases where only the pin is broken. Further, as shown in FIGS. Sample Nos. 4 and 5 are sample Nos. Compared with 1 to 3, the average value of the measurement results of the breaking load is large and the standard deviation is also a small value of about 60 to 80%. It can be seen that there is less variation in the breaking load as compared with the above, and it is advantageous to supply a stable product.

 さてここでこのようなピン11の接合法について詳述すれば次のようである。ただし、ピン11の大径部112の径W及び厚さTが本発明における所定の関係にあるピンを接合する点などを除けば、従来のピン付き配線基板の製法と相違はない。 Now, the method of joining such pins 11 will be described in detail as follows. However, there is no difference from the conventional method for manufacturing a wiring board with pins, except that the pins W having a predetermined relation in the diameter W and the thickness T of the large diameter portion 112 of the pins 11 are joined.

 ピン接合前の基板(ピンの接合前)12の内部配線層は、銅メッキを用いたサブトラクティブ法、セミアディティブ法、フルアディティブ法などで形成する。樹脂絶縁層の形成には、予めフィルム化された樹脂をコア基板または下層の基板の表面にラミネートして形成するか、液状の樹脂をロールコータ等で塗布して形成しても良い。また、樹脂絶縁層のビア形成は、その材料が感光性を有しない樹脂の場合には、レーザ加工により穴明けしてもよいし、感光性を有する樹脂の場合には、フォトリソグラフィ技術により穴明けしても良い。 (4) The internal wiring layer of the substrate 12 (before pin bonding) 12 before pin bonding is formed by a subtractive method using copper plating, a semi-additive method, a full-additive method, or the like. The resin insulating layer may be formed by laminating a resin filmed in advance on the surface of a core substrate or a lower substrate, or by applying a liquid resin by a roll coater or the like. The via formation of the resin insulating layer may be performed by laser processing if the material is a non-photosensitive resin, or may be formed by photolithography if the material is a photosensitive resin. May be dawn.

 その後、例えば、フォトリソグラフィ技術を用い、感光性ソルダーレジスト層を塗布し、ピン接合部15の中央が開口するように形成されたマスクパターンを用いて露光し現像、硬化し、ソルダーレジスト層17を形成する。その後、ピン接合部15などの露出する金属部にニッケルメッキ、及び金メッキをかけ、ピン接合部15に前記した量のハンダペーストをスクリーン印刷により印刷する。 Thereafter, for example, a photosensitive solder resist layer is applied using a photolithography technique, and is exposed, developed, and cured using a mask pattern formed so that the center of the pin joint 15 is opened, and the solder resist layer 17 is formed. Form. After that, nickel plating and gold plating are applied to the exposed metal portion such as the pin joint 15, and the above-described amount of solder paste is printed on the pin joint 15 by screen printing.

 一方、基板12のピン接合部15の配置に対応し、ピン11が挿通可能の多数の小孔の設けられた所定の板状治具(図示せず)を用い、その小孔にニッケルメッキ、及び金メッキのかけられたピン11を大径部112を上にして挿入しておく。ピン11の表面の金メッキ層は、0.04μm以上(本実施形態では0.3μm)とすると、耐酸化性やソケット等との接続信頼性を高めることができる。次いでその上に、基板12を位置決めして載置し、各ピン接合部112にピン11の大径部の接合面113が当接するようにセットし、ハンダペーストを加熱溶融する。こうすることで、多数のピン11はピン接合部112に一挙にハンダ付けされる。このように本発明の配線基板が製造される。 On the other hand, a predetermined plate-like jig (not shown) provided with a number of small holes through which the pins 11 can be inserted, corresponding to the arrangement of the pin joint portions 15 of the substrate 12, is nickel-plated in the small holes. The gold-plated pin 11 is inserted with the large-diameter portion 112 facing upward. When the thickness of the gold plating layer on the surface of the pin 11 is 0.04 μm or more (0.3 μm in the present embodiment), the oxidation resistance and the reliability of connection with a socket or the like can be improved. Next, the substrate 12 is positioned and mounted thereon, and set so that the bonding surface 113 of the large-diameter portion of the pin 11 abuts on each of the pin bonding portions 112, and the solder paste is heated and melted. In this way, a large number of pins 11 are soldered at once to pin joints 112. Thus, the wiring board of the present invention is manufactured.

 なお、ピン11の大径部112は、ピン本体と同材質にて形成する必要は必ずしもなく、ピンのハンダ付け温度において溶融しない融点をもつハンダをリフローして形成(溶着)しておいてもよい。なお、本形態のピン11の大径部112は軸素材(線材)の一端部を、平面形状をもつ金型で、その軸線方向にプレスすることで形成できる。 The large-diameter portion 112 of the pin 11 does not necessarily need to be formed of the same material as the pin body, and may be formed by reflowing (welding) a solder having a melting point that does not melt at the soldering temperature of the pin. Good. The large-diameter portion 112 of the pin 11 according to the present embodiment can be formed by pressing one end of a shaft material (wire material) with a mold having a planar shape in the axial direction.

 また、ピン11をハンダ付けするハンダは、IC等の電子部品のハンダ付け温度で溶融しないものから、配線基板の材質などに応じて適宜のものを選択して用いればよい。例えば、樹脂製配線基板では、Pb−Sn系ハンダ(82Pb−10Sn−8Sbハンダ、27Pb−73Sn共晶ハンダ、50Pb−50Snハンダ等)、Sn−Sb系ハンダ(95Sn−5Sbハンダ等)、Sn−Ag系ハンダ(96.5Sn−3.5Ag系ハンダ等)等が挙げられる。このうち、Sn−Sb系ハンダは、金メッキ層を表面に有するピンとの濡れ性が良くないので、ピンを基板に固着する際のハンダ材のピンへのはい上がりが抑えられる点で好ましい。 The solder used for soldering the pins 11 may be selected from those that do not melt at the soldering temperature of electronic components such as ICs, depending on the material of the wiring board and the like. For example, in a resin wiring board, Pb-Sn solder (82Pb-10Sn-8Sb solder, 27Pb-73Sn eutectic solder, 50Pb-50Sn solder, etc.), Sn-Sb solder (95Sn-5Sb solder, etc.), Sn- Ag-based solder (96.5Sn-3.5Ag-based solder and the like) and the like. Among these, Sn-Sb-based solder is not preferable because it has poor wettability with a pin having a gold plating layer on its surface, and therefore prevents solder material from sticking to the pin when the pin is fixed to a substrate.

 なお、ピン接合部15の平面形状及びピン11の軸線方向から見た大径部112の形状は、通常は本形態のように円形であるが、その形状は円形に限定されるものではない。なおハンダ付け面をなす、大径部112の表面は、粗面化して接合面積が増えるようにしておくのがより好ましい。 The planar shape of the pin joint 15 and the shape of the large-diameter portion 112 as viewed from the axial direction of the pin 11 are usually circular as in the present embodiment, but the shape is not limited to a circle. It is more preferable that the surface of the large diameter portion 112 forming the soldering surface is roughened so as to increase the bonding area.

 上記においては、ピン付き配線基板としてPGAタイプのエポキシ樹脂製の配線基板において具体化したが、本発明の基板は、ポリイミド樹脂、BT樹脂、PPE樹脂など基板の材質にかかわらず具体化できることはいうまでもない。さらに、単層、多層構造にかかわらず適用できる。また本発明はPGAタイプに限られず、フラットピンがピン接合部にハンダ付けされる配線基板において広く具体化できるものであり、上記の実施形態に限定されるものではなく、その要旨を逸脱しない範囲において適宜に設計変更して具体化できる。 In the above description, the wiring board with pins is embodied as a wiring board made of a PGA type epoxy resin, but the board of the present invention can be embodied regardless of the material of the board such as a polyimide resin, a BT resin, and a PPE resin. Not even. Further, the present invention can be applied regardless of a single-layer or multilayer structure. Further, the present invention is not limited to the PGA type, but can be broadly embodied in a wiring board in which flat pins are soldered to pin joints. The present invention is not limited to the above-described embodiment, and does not depart from the gist of the present invention. Can be embodied by appropriately changing the design.

本発明に係るピン付樹脂製配線基板1の側面図Side view of resin wiring board 1 with pins according to the present invention 図1の拡大図Enlarged view of FIG. 図2の拡大図Enlarged view of FIG. ハンダ層の形態を表す図Diagram showing the form of the solder layer 荷重破壊測定の概要を示す図Diagram showing the outline of load fracture measurement ピン付樹脂製配線基板の損傷の形態Types of damage to resin wiring boards with pins 実施例及び比較例におけるピンの大径部の径と厚さを表す図The figure showing the diameter and thickness of the large diameter part of the pin in an Example and a comparative example. ピン強度(接合強度)の測定結果を示す図Diagram showing measurement results of pin strength (joining strength) 破壊モードの割合を示す図Diagram showing percentage of destruction mode ピン強度(接合強度)測定結果の平均値及び標準偏差値Average value and standard deviation value of pin strength (joining strength) measurement results

符号の説明Explanation of reference numerals

 1   ピン付樹脂製配線基板
 11  フラットピン
 12  樹脂製配線基板
 111 フラットピンの棒状部
 112 フラットピンの大径部
 15  ピン接合部
 16  ハンダ層
 17  ソルダーレジスト層
DESCRIPTION OF SYMBOLS 1 Resin wiring board with pin 11 Flat pin 12 Resin wiring board 111 Bar part of flat pin 112 Large diameter part of flat pin 15 Pin joint part 16 Solder layer 17 Solder resist layer

Claims (6)

 径が0.35mm以下とされる棒状部と、該棒状部の一方の端部に形成されるとともに該棒状部よりも大径の同心板状の大径部と、からなるフラットピンが、
 基板の主面に設けられたピン接合部に、前記大径部においてハンダ付けされたピン付樹脂製配線基板であって、
 前記フラットピンの前記棒状部の径をSとし、前記大径部の径をWとした場合、
 前記棒状部の径と前記大径部の径との比(W/S)は、2.16以上2.67以下とされてなることを特徴とするピン付樹脂製配線基板。
A flat pin composed of a rod-shaped part having a diameter of 0.35 mm or less and a concentric plate-shaped large-diameter part formed at one end of the rod-shaped part and having a diameter larger than the rod-shaped part,
A pin-attached resin wiring board soldered at the large-diameter portion to a pin joint provided on a main surface of the board,
When the diameter of the rod portion of the flat pin is S and the diameter of the large diameter portion is W,
A ratio of the diameter of the rod portion to the diameter of the large diameter portion (W / S) is not less than 2.16 and not more than 2.67.
 前記大径部の厚さをTとした場合、前記棒状部の径と前記大径部の厚さとの比(T/S)は、0.40以上0.67以下とされてなることを特徴とする請求項1記載のピン付樹脂製配線基板。 When the thickness of the large diameter portion is T, a ratio (T / S) between the diameter of the rod portion and the thickness of the large diameter portion is 0.40 or more and 0.67 or less. The resin wiring board with pins according to claim 1, wherein  前記棒状部の径と前記大径部の径との比(W/S)は、2.33以上2.67以下、前記棒状部の径と前記大径部の厚さとの比(T/S)は、0.40以上0.54以下とされてなることを特徴とする請求項2記載のピン付樹脂製配線基板。 The ratio (W / S) of the diameter of the rod portion to the diameter of the large diameter portion is 2.33 or more and 2.67 or less, and the ratio (T / S) of the diameter of the rod portion to the thickness of the large diameter portion. 3.) The resin wiring board with pins according to claim 2, wherein (b) is not less than 0.40 and not more than 0.54.  前記ハンダ付けに基づいて形成されるハンダ層の形成厚さは、前記ピン接合部の第一主表面から、前記フラットピン側への厚さ方向において、0.30mm以下となるように調整されてなることを特徴とする請求項1ないし3のいずれか1項に記載のピン付樹脂製配線基板。 The thickness of the solder layer formed based on the soldering is adjusted to be 0.30 mm or less in the thickness direction from the first main surface of the pin joint to the flat pin side. The resin wiring board with pins according to any one of claims 1 to 3, wherein the wiring board is made of resin.  前記フラットピンは、少なくとも銅を含む金属材料よりなることを特徴とする請求項1ないし4のいずれか1項に記載のピン付樹脂製配線基板。 5. The resin wiring board with pins according to claim 1, wherein the flat pins are made of a metal material containing at least copper.  前記棒状部の径が0.25mm以上であることを特徴とする請求項1ないし5のいずれか1項に記載のピン付樹脂製配線基板。 (6) The resin wiring board with pins according to any one of (1) to (5), wherein the diameter of the rod-shaped portion is 0.25 mm or more.
JP2003328887A 2002-09-20 2003-09-19 Resin wiring board with pins Pending JP2004134792A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019140420A (en) * 2019-06-04 2019-08-22 京セラ株式会社 Circuit board and electronic device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019140420A (en) * 2019-06-04 2019-08-22 京セラ株式会社 Circuit board and electronic device
JP7034121B2 (en) 2019-06-04 2022-03-11 京セラ株式会社 Circuit boards and electronic devices

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