JP2004061507A - 光ネットワーク・アナライザの較正技法及びシステム - Google Patents

光ネットワーク・アナライザの較正技法及びシステム Download PDF

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Publication number
JP2004061507A
JP2004061507A JP2003272795A JP2003272795A JP2004061507A JP 2004061507 A JP2004061507 A JP 2004061507A JP 2003272795 A JP2003272795 A JP 2003272795A JP 2003272795 A JP2003272795 A JP 2003272795A JP 2004061507 A JP2004061507 A JP 2004061507A
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Japan
Prior art keywords
network analyzer
optical network
calibration
amplitude
interference
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JP2003272795A
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English (en)
Japanese (ja)
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JP2004061507A5 (enExample
Inventor
Gregory D Vanwiggeren
グレゴリー・ディー・ヴァンウィッグゲレン
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Agilent Technologies Inc
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Agilent Technologies Inc
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Publication of JP2004061507A publication Critical patent/JP2004061507A/ja
Publication of JP2004061507A5 publication Critical patent/JP2004061507A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3181—Reflectometers dealing with polarisation

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP2003272795A 2002-07-25 2003-07-10 光ネットワーク・アナライザの較正技法及びシステム Pending JP2004061507A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/205,720 US6813028B2 (en) 2002-07-25 2002-07-25 Calibration methodology and system for optical network analyzer

Publications (2)

Publication Number Publication Date
JP2004061507A true JP2004061507A (ja) 2004-02-26
JP2004061507A5 JP2004061507A5 (enExample) 2006-07-27

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JP2003272795A Pending JP2004061507A (ja) 2002-07-25 2003-07-10 光ネットワーク・アナライザの較正技法及びシステム

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US (1) US6813028B2 (enExample)
JP (1) JP2004061507A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008045981A (ja) * 2006-08-15 2008-02-28 Yokogawa Electric Corp 光学特性測定方法及び光学特性測定装置

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7633607B2 (en) * 2004-09-01 2009-12-15 Luna Innovations Incorporated Method and apparatus for calibrating measurement equipment
US7426021B2 (en) * 2004-11-29 2008-09-16 Expo Electro- Optical Engineering Inc. Interferometric optical analyzer and method for measuring the linear response of an optical component
CN109342769B (zh) * 2018-12-10 2021-01-12 山东省科学院激光研究所 一种标定方法、流速测量方法及装置
CN110261070B (zh) * 2019-07-05 2020-07-03 北京航空航天大学 一种基于复合贝塞尔标定函数的光弹调制器标定装置及方法
CN111595558A (zh) * 2020-06-15 2020-08-28 江苏飞格光电有限公司 5g／6g用光器件全温自动测试系统和方法
CN113218517B (zh) * 2021-04-28 2022-07-22 南京理工大学 一种计算成像同轴全息光纤模式分解方法及装置
CN113252316B (zh) * 2021-05-25 2023-01-24 中国电子科技集团公司第四十一研究所 一种光波元件分析仪的校准方法及光波元件分析仪

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5619325A (en) * 1995-04-04 1997-04-08 Advantest Corporation Optical system for ellipsometry utilizing a circularly polarized probe beam
US6259529B1 (en) * 2000-02-17 2001-07-10 Agilent Technologies, Inc. Wavelength-selective polarization-diverse optical heterodyne receiver
DE60001353T2 (de) * 2000-11-17 2003-06-26 Agilent Technologies, Inc. (N.D.Ges.D.Staates Delaware) Polarisationsdispersionsmessverfahren für optische Geräte und Vorrichtung dazu

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008045981A (ja) * 2006-08-15 2008-02-28 Yokogawa Electric Corp 光学特性測定方法及び光学特性測定装置

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Publication number Publication date
US20040019445A1 (en) 2004-01-29
US6813028B2 (en) 2004-11-02

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