JP2004031765A - Method of manufacturing wiring board - Google Patents

Method of manufacturing wiring board Download PDF

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Publication number
JP2004031765A
JP2004031765A JP2002187732A JP2002187732A JP2004031765A JP 2004031765 A JP2004031765 A JP 2004031765A JP 2002187732 A JP2002187732 A JP 2002187732A JP 2002187732 A JP2002187732 A JP 2002187732A JP 2004031765 A JP2004031765 A JP 2004031765A
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Japan
Prior art keywords
resin
hole
metal plate
manufacturing
wiring board
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JP2002187732A
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Japanese (ja)
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JP3856733B2 (en
Inventor
Shinji Yuri
由利 伸治
Tomoe Suzuki
鈴木 友恵
Kazuhisa Sato
佐藤 和久
Kozo Yamazaki
山崎 耕三
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Niterra Co Ltd
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NGK Spark Plug Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a wiring board which comprises a process of manufacturing a core board whose front and rear surface can be kept flat even when through-holes bored in the core board are filled up with resin. <P>SOLUTION: The method of manufacturing the wiring board comprises a plugging process of separately depositing resin films 5 and 6 on the surfaces 2 and 3 of a metal plate (core material) 1, which is provided with the through-holes 4 penetrating through the surfaces 2 and 3 and pressing the resin films 5 and 6 against the metal plate 1 in the direction of thickness of the metal plate 1 to fill the through-holes 4 with resin 7a; a curing process of curing the resin 7a filling the through-holes 4 by heating; and a core board forming process of repeating the above processes two or more times to form the core board 14. <P>COPYRIGHT: (C)2004,JPO

Description

【0001】
【発明の属する技術分野】
本発明は、コア材を芯材とするコア基板の製造工程を含む配線基板の製造方法に関する。
【0002】
【従来の技術】
配線基板のベースとなるコア基板の芯材であるコア材に金属板が用いられる場合がある(特開2000−133913号公報参照)。かかる金属板の表面と裏面との間を貫通する貫通孔内には、追ってその中心部を同軸心状に貫通するスルーホール導体の周りを絶縁するため、樹脂が充填される。上記金属板の貫通孔に樹脂を充填する方法には、以下のものがある。
(1)ペースト状の樹脂を印刷法やディスペンス法で貫通孔に充填する方法。
(2)ドライタイプの樹脂フィルムを金属板の表面および裏面にラミネートし、それら厚み方向に沿ってプレスすることで、上記樹脂を貫通孔に圧入する方法。
(3)プリプレグのような半硬化状態の樹脂を、ホットプレスによって貫通孔に流入する方法。
【0003】
上記(1),(2)の方法では、金属板(コア材)の貫通孔に前記樹脂を充填した直後では、かかる金属板の表面および裏面が平坦であっても、その後において充填した樹脂を硬化するためのキュア処理を行うと、かかる樹脂の硬化収縮に伴って、貫通孔内の樹脂の真上および真下の位置には、それぞれ凹みが発生する。
例えば、上記(2)の方法は、図4(A)に示すように、表面42および裏面43を有し厚さ0.25mmの金属板40を用い、かかる金属板40には、内径が約0.3mmの貫通孔44が表面42と裏面43との間を複数貫通している。
次に、図4(B)に示すように、金属板40の表面42および裏面43に、厚さ60μmのドライタイプの樹脂フィルム45,46をラミネートする。
【0004】
次いで、図4(B)中の矢印で示すように、上記樹脂フィルム45,46を金属板40に向けて押し付けるように厚み方向に沿ってプレスする。
その結果、図4(C)に示すように、上記樹脂フィルム45,46は、圧縮された樹脂層47,48になると共に、その一部の樹脂49が複数の貫通孔44内に圧入し、かかる貫通孔44の内部に充満する。
そして、上記樹脂層47,48および樹脂49が形成された金属板40を加熱し、樹脂層47,48などを硬化させるキュア処理を施す。その結果、図4(D)に示すように、上記樹脂49の硬化収縮に伴って、貫通孔44の真上および真下の樹脂層47,48には、凹み50が生じる。
【0005】
【発明が解決すべき課題】
上記凹部50を含み金属板40をコア材とするコア基板kを用いると、その表面や裏面に形成する表面配線層および裏面配線層は、凹部50によって歪むと共に、これらの上に形成される絶縁層やビルドアップ配線層も平坦性が損なわれてしまう。このため、得られる配線基板の信頼性を損ねる、という問題があった。 本発明は、以上に説明した従来の技術における問題点を解決し、貫通孔に樹脂を充填しても、その表面および裏面の平坦性が確保できるコア基板の製造工程を含む配線基板の製造方法を提供する、ことを課題とする。
【0006】
【課題を解決するための手段】
本発明は、上記課題を解決するため、貫通孔を有するコア材の表面および裏面に樹脂フィルムをそれぞれ積層する工程および貫通孔に充填された樹脂を硬化する工程を、複数回にわたって行うことに着想して成されたものである。
即ち、本発明による配線基板の製造方法(請求項1)は、表面および裏面を有し且つかかる表面と裏面との間を貫通する貫通孔を有するコア材に対し、かかるコア材の表面および裏面にそれぞれ樹脂フィルムを個別に積層し、かかる一対の樹脂フィルムを上記コア材の厚み方向に沿って押圧して、上記貫通孔内に樹脂を充填する穴埋め工程と、上記貫通孔内に充填された樹脂を加熱して硬化させる硬化工程と、を複数回にわたって繰り返してコア基板を形成する工程を含む、ことを特徴とする。尚、上記穴埋め工程と硬化工程とは、かかる順序で行う形態の他に、穴埋め工程を行いつつ平行して硬化工程を行う形態も含まれる。
【0007】
これによれば、1回目の穴埋め工程および硬化工程の後では、コア材の貫通孔の真上および真下に位置する樹脂層の表面には、前記同様の凹みが形成されるが、2回目以降の穴埋め工程および硬化工程を行うことにより、上記凹部をなくすか極く微細な凹みに抑制することが可能となる。即ち、従来1回で行っていた穴埋め工程および硬化工程を複数回に分け、比較的厚みの薄い樹脂フィルムをそれぞれで積層して貫通孔に充填し且つ硬化することにより、1回目に生じる凹みを従来よりも浅くできる。引き続き、上記薄い樹脂フィルムを用いて、2回目以降の穴埋め工程および硬化工程を行うことで、凹部を解消するか、あるいは殆ど悪影響のない程度の微細な凹部に抑制することが可能となる。
【0008】
従って、上記工程により得られるコア基板の表面や裏面に形成する表面配線層および裏面配線層や、これらの上に形成される絶縁層やビルドアップ配線層を平坦に形成した信頼性の高い配線基板を確実に製造することが可能となる。
尚、上記コア材には、後述する金属板のほか、樹脂板や、表面および裏面の金属箔を貼り付けた樹脂板なども含まれる。また、上記樹脂フィルムには、絶縁性の樹脂からなるものほか、導電性樹脂からなるものも含まれる。
付言すれば、本発明には、表面および裏面を有し且つかかる表面と裏面との間を貫通する貫通孔を有するコア材に対し、かかるコア材の表面および裏面にそれぞれ樹脂フィルムを個別に積層し、かかる一対の樹脂フィルムを上記コア材の厚み方向に沿って押圧して、上記コア材の表面および裏面にそれぞれ樹脂層を形成し且つ上記貫通孔内に樹脂を充填する穴埋め工程と、その後において、上記コア材の表面および裏面にそれぞれ形成した樹脂層および上記貫通孔内に充填された樹脂を加熱して硬化させる硬化工程と、を交互に複数回にわたって繰り返してコア基板を形成する工程を含む、配線基板の製造方法を含むことも可能である。
【0009】
また、本発明には、前記穴埋め工程において、第1回目に用いる前記樹脂フィルムの厚みは、第2回目以降に用いる上記樹脂フィルムの厚み以上である、配線基板の製造方法(請求項2)も含まれる。
これによれば、1回目の穴埋め工程で、積層した樹脂フィルムをプレスなどにて押圧することにより、コア材の貫通孔内をかかるフイルムの樹脂により確実に充填できると共に、その後の硬化工程で生じる凹部を、2回目以降の穴埋め工程および硬化工程により、解消するか微細な凹みにすることが一層確実になる。
尚、1回目の穴埋め工程で積層する樹脂フィルムの厚みは、2回目以降の穴埋め工程で積層する樹脂フィルムの厚みの1〜4倍であり、特に2倍以上が上記効果を得る上で好ましい。
【0010】
更に、本発明には、前記コア材は、前記表面および裏面ならびに貫通孔を有する金属板である、配線基板の製造方法(請求項3)も含まれる。
これによれば、所要の強度を有し、貫通孔内が樹脂で充填され、且つ表面および裏面に平坦な樹脂層が形成された金属板をコア材とするコア基板を確実に製造できる。かかるコア基板の表面と裏面とに形成される平坦な表面配線層および裏面配線層や、これらの上に形成される平坦な絶縁層やビルドアップ配線層を含む強固な配線基板を製造することが可能となる。
尚、上記金属板には、Cu−2.3wt%Fe−0.03wt%P(194アロイ)などの銅合金、純銅、無酸素銅、Fe−42wt%Ni(42アロイ)やFe−36wt%Ni(インバー)などのFe−Ni系合金、その他の鋼種、チタンやその合金、およびアルミニウムやその合金などからなる板が含まれる。
【0011】
【発明の実施の形態】
以下において、本発明の実施に好適な形態を図面と共に説明する。
図1(A)は、本発明に用いるコア材である金属板1の断面を示す。かかる金属板1は、例えば厚みが0.25mmの前記銅合金(194アロイ)からなり、図1(A)に示すように、表面2および裏面3を有し、かかる表面2と裏面3との間には内径が約0.3mmの貫通孔4,4が複数貫通している。複数の貫通孔4は、金属板1をパンチングするか、あるいはエッチング加工によって形成される。
【0012】
図1(B),(C)は、本発明における第1回目の穴埋め工程を示す。図1(B)に示すように、金属板1の表面2および裏面3に、厚みTが40μmでエポキシ樹脂からなるドライタイプの樹脂フィルム5,6を積層(ラミネート)する。
次に、図1(B)中の矢印で示すように、上記樹脂フィルム5,6を金属板1の厚み方向に沿って、図示しないプレスなどよって押圧する。
その結果、図1(C)に示すように、上記樹脂フィルム5,6は、圧縮されて金属板1の表面2および裏面3に密着する樹脂層7,7となる共に、その一部は貫通孔4,4内に進入してこれを充填する樹脂7a,7aとなる(穴埋め工程)。
【0013】
次いで、図1(C)に示す樹脂層7,7および貫通孔4内の樹脂7aを有する金属板1を、図示しない加熱炉内に挿入し、大気中で約150℃に約60分間加熱する硬化(キュア)処理を行う(硬化工程)。
その結果、図1(D)に示すように、樹脂層7,7および樹脂7aは、硬化して収縮すると共に、貫通孔4,4の真上および真下に位置する樹脂層7,7の表面8および裏面9には、球面状の凹部10がそれぞれ生じる。
【0014】
次に、第2回目の穴埋め工程および硬化工程を行う。
図2(A)に示すように、樹脂層7,7の凹部10を含む表面8および裏面9に、厚みtが20μのエポキシ樹脂からなる樹脂フィルム11,12を積層する。 次いで、図2(A)中の矢印で示すように、上記樹脂フィルム11,12を金属板1の厚み方向に沿って、図示しないプレスなどにより押圧する。
その結果、図2(B)に示すように、上記樹脂フィルム11,12は、圧縮されて樹脂層7,7と一体となって金属板1の表面2および裏面3に密着する樹脂層15,16となる共に、それらの一部は貫通孔4,4内に進入してこれらを一層密に充填する樹脂17,17となる(第2回目の穴埋め工程)。
【0015】
そして、図2(B)に示す金属板1に密着する樹脂層15,16および貫通孔4内の樹脂17に対し、前記同様の硬化処理を行う(第2回目の硬化工程)。
その結果、図2(C)に示すように、樹脂層15,16および樹脂17は、硬化して収縮するが、貫通孔4,4の真上および真下に位置する樹脂層15,16の表面18および裏面19は、殆ど平坦となる。これは、上記硬化処理によって樹脂層15,16が収縮しつつ下層の樹脂層7,7に密着するため、両者の間に位置する前記凹部10が解消されたものである。
【0016】
この結果、図2(C)に示すように、複数の貫通孔4,4を有する金属板1、貫通孔4内に充填された樹脂17、金属板1の表面2に形成され平坦な表面18の樹脂層15、および金属板1の裏面3に形成され平坦な裏面19の樹脂層16を有するコア基板14が得られる。
尚、第2回目の穴埋め工程および硬化工程の後で、貫通孔4,4の真上および真下に位置する樹脂層15,16の表面18および裏面19に小さな凹部が残っている場合もある。この際、かかる凹部の深さが許容できる範囲内でなければ、更に第3回目の穴埋め工程および硬化工程を行う。かかる第3回目の穴埋め工程にて用いる樹脂フィルムの厚みは、第2回目で用いた樹脂フィルム11,12と同じかそれ以下とされる。
尚また、前記穴埋め工程および硬化工程は、前記樹脂フィルム11,12をプレスにより押圧しながら(穴埋め工程)、同時に加熱して、充填された樹脂17などを硬化する(硬化工程)ように行うことも可能である。
【0017】
以下において、コア基板14を用いた配線基板Kの製造工程を説明する。
図3(A)は、前記コア基板14に内蔵される金属板1の貫通孔4,4の中心部に、例えば炭酸ガスレーザを照射して、樹脂層15,16および樹脂17の中心部に沿って、コア基板14の表面18と裏面19との間を貫通するスルーホールh,hを形成する工程を示す。かかるスルーホールhの内径は、約100μmである。尚、上記レーザに替えて、細径のドリルを用いてスルーホールhを形成しても良い。次に、コア基板14の表面18、裏面19、およびスルーホールh,hの内壁に、Pdを含むメッキ触媒を被覆した後、無電解銅メッキおよび電解銅メッキを全面に施す。その結果、図3(B)に示すように、各スルーホールhの内壁に沿って円筒形のスルーホール導体20が形成される。かかるスルーホール導体20の中空部には、導電性または非導電性の充填樹脂21が形成される。その後、コア基板14の表面18と裏面19との上に銅メッキを施す。
【0018】
次いで、コア基板14の表面18および裏面19に形成された銅メッキ膜の上に、感光性樹脂からなり厚みが約10μmの図示しない樹脂フィルムを貼り付ける。かかるフイルムの上に、所定パターンを有するマスク(図示せず)を載置した後、当該フィルム19に対して露光および現像(フォトグラフィ技術)を施して、所定のパターンを有する図示しないエッチングレジストを形成する。更に、かかるレジストを介して上記銅メッキ膜に現像(エッチング)液を接触させ、上記レジストのパターン間から露出する銅メッキ膜をエッチングする。
その結果、図3(B)に示すように、コア基板14の表面18と裏面19とには、上記パターンに倣った表面配線層22と裏面配線層23とが形成され、これらはスルーホール導体20の上端または下端と接続すると共に、充填樹脂21を蓋メッキする。
【0019】
更に、図3(C)に示すように、表面配線層22の上に、シリカフィラなどの無機フィラを含むエポキシ樹脂フィルムからなり厚みが30μmの絶縁層24を形成する。かかる絶縁層24における所定の位置に対し、フォトリソグラフィ技術またはレーザ加工(炭酸ガスレーザなどを使用する)を施して、図示しないビアホールを複数形成する。このビアホールの底面には、表面配線層24が露出する。 次に、絶縁層24の表面および上記ビアホールの内壁面に前記同様のメッキ触媒を塗布した後、無電解銅メッキおよび電解銅メッキを施し、絶縁層24の表面に銅メッキ膜を形成することにより、図3(C)に示すように、上記ビアホール内にビア(フィルドビア)導体26を形成する。
【0020】
次いで、銅メッキ膜が形成された絶縁層24の上に、前記同様のエッチングレジストを形成し且つ現像を行う。その結果、図3(C)に示すように、絶縁層24の上には、所定パターンの配線層(ビルドアップ配線)28が形成される。この配線層28は、ビア導体26を介して表面配線層22と接続される。
以上と同様にして、図3(C)に示すように、絶縁層30、ビア導体32、および配線層34を形成する。かかるビア導体32は、配線層28,34間を接続し、絶縁層24,30および配線層28,34はビルドアップ層BUを形成する。
【0021】
更に、図3(C)に示すように、配線層34の上に厚みが20μmで最上層の絶縁層(ソルダーレジスト層)36を形成する。かかる絶縁層36には、配線層34上の適所から第1主面37よりも高く突出するハンダバンプ38が貫通する。かかるハンダバンプ38は、Sn−Ag系、Pb−Sn系、Sn−Ag−Cu系、Sn−Cu系、Sn−Zn系など(本実施形態ではSn−Ag系)の低融点合金からなり、第1主面37上に実装される図示しないICチップの接続端子と個別に接続される。また、複数のハンダバンプ38とICチップの接続端子とは、アンダーフィル材により埋設され且つ保護される。
【0022】
一方、図3(C)に示すように、コア基板14の裏面19にも、前記同様にして所定パターンの裏面配線層23を形成し、且つその下側に前記同様の絶縁層(ソルダーレジスト層)25を形成する。かかる絶縁層25において第2主面31側に開口する開口部29の底面には、裏面配線層23から延びた配線27が位置する。かかる配線27は、その表面にNiメッキおよびAuメッキが被覆され、図示しなマザーボードなどのプリント基板との接続端子として活用される。
【0023】
以上により、図3(C)に示すような配線基板Kが製造される。かかる配線基板Kは、前記平坦な表面18を有するコア基板14を用いているため、かかる表面18上に形成される表面配線層22や、その上方に形成されるビルドアップ層BUにおける配線層28,34が平坦に形成される。また、絶縁層24,30の厚みがバラつかず、平均化される。従って、本発明の製造方法によれば、表面18および裏面19が平坦なコア基板14を確実に製造できると共に、かかるコア基板14を用いた信頼性の高い配線基板Kを確実に製造することが可能となる。
【0024】
本発明は、以上において説明した形態に限定されるものではない。
前記コア基板に用いるコア材は、前記銅合金に限らず、Fe−Ni系合金、チタンやその合金、アルミニウムやその合金などからなる金属板としても良い。あるいは、合成樹脂またはこれにガラスフィラなどの無機フィラやガラスクロスなどを含む複合材からなるコア材を用いも良い。
また、前記樹脂フィルムには、絶縁性の樹脂のほか、導電性樹脂からなるものを用いても良い。かかる導電性の樹脂フイルムおよび上記合成樹脂などの絶縁材からなるコア材を併用することにより、かかるコア材の貫通孔にスルーホール導体などを形成することも可能である。
更に、第1回目に用いる樹脂フィルムと第2回目以降に用いる樹脂フィルムとの特性を変更することも可能である。例えば、第1回目には低い熱膨張率の樹脂フィルムを用い、第2回目以降はこれよりも高い熱膨張率の樹脂フィルムを用いることにより、コア材の貫通孔の軸方向に沿った樹脂の厚みとコア材の表面および裏面に形成される全樹脂層の厚みとを、一層小さくすることが可能となる。
【0025】
【発明の効果】
本発明の配線基板の製造方法(請求項1)によれば、前記穴埋め工程および硬化工程を2回以上繰り返して行うことで、表面・裏面に凹部がないか微細にしたコア基板が確実に得られる。このため、かかるコア基板の表面や裏面に形成する表面配線層・裏面配線層や、これらの上に形成される絶縁層やビルドアップ配線層を平坦に形成した信頼性の高い配線基板を確実に製造することが可能となる。
また、請求項2の配線基板の製造方法によれば、2回目以降の穴埋め工程に用いる樹脂フィルムを薄くし且つ硬化工程を行うことにより、コア基板の表面などの凹部を解消するか微細な凹みにすることが一層確実になる。
更に、請求項3の配線基板の製造方法によれば、所要の強度を有し、コア材の貫通孔内が樹脂で充填され且つ表面および裏面に平坦な樹脂層が形成された金属板をコア材とするコア基板を確実に製造できる。
【図面の簡単な説明】
【図1】(A)〜(D)は本発明の配線基板の製造方法における各工程を示す概略図。
【図2】(A)〜(C)は図1(D)に続く本発明の製造方法における各工程を示す概略図。
【図3】(A)〜(C)は図2(C)に続く本発明の製造方法における各工程を示す概略図。
【図4】(A)〜(D)は従来の配線基板の製造方法における各工程を示す概略図。
【符号の説明】
1……………………金属板(コア材)、  2……………………表面、
3……………………裏面、       4……………………貫通孔、
5,6,11,12…樹脂フィルム、   7a,17…………樹脂
14…………………コア基板、
K……………………配線基板
[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a method for manufacturing a wiring board including a step of manufacturing a core substrate using a core material as a core material.
[0002]
[Prior art]
In some cases, a metal plate is used as a core material which is a core material of a core substrate serving as a base of a wiring substrate (see Japanese Patent Application Laid-Open No. 2000-133913). A resin is filled into the through-hole penetrating between the front surface and the back surface of the metal plate in order to insulate the periphery of a through-hole conductor that penetrates the center portion coaxially. There are the following methods for filling the through hole of the metal plate with a resin.
(1) A method of filling a through-hole with a paste resin by a printing method or a dispensing method.
(2) A method in which a dry type resin film is laminated on the front and back surfaces of a metal plate and pressed along the thickness direction to press-fit the resin into the through holes.
(3) A method in which a semi-cured resin such as a prepreg flows into a through-hole by hot pressing.
[0003]
In the above methods (1) and (2), immediately after the through-hole of the metal plate (core material) is filled with the resin, even if the surface and the back surface of the metal plate are flat, the filled resin is thereafter used. When a curing process for curing is performed, dents are generated at positions just above and below the resin in the through holes, respectively, as the resin shrinks during curing.
For example, in the above method (2), as shown in FIG. 4A, a metal plate 40 having a front surface 42 and a back surface 43 and having a thickness of 0.25 mm is used. A plurality of 0.3 mm through holes 44 penetrate between the front surface 42 and the back surface 43.
Next, as shown in FIG. 4B, dry type resin films 45 and 46 having a thickness of 60 μm are laminated on the front surface 42 and the rear surface 43 of the metal plate 40.
[0004]
Next, as shown by arrows in FIG. 4B, the resin films 45 and 46 are pressed along the thickness direction so as to be pressed against the metal plate 40.
As a result, as shown in FIG. 4C, the resin films 45 and 46 become compressed resin layers 47 and 48, and a part of the resin 49 is pressed into the plurality of through holes 44, The inside of the through hole 44 is filled.
Then, the metal plate 40 on which the resin layers 47 and 48 and the resin 49 are formed is heated to cure the resin layers 47 and 48 and the like. As a result, as shown in FIG. 4D, a depression 50 is formed in the resin layers 47 and 48 immediately above and below the through-hole 44 as the resin 49 cures and contracts.
[0005]
[Problems to be solved by the invention]
When the core substrate k including the concave portion 50 and using the metal plate 40 as a core material is used, the front surface wiring layer and the rear surface wiring layer formed on the front surface and the rear surface are distorted by the concave portion 50, and the insulating layer formed thereon is distorted. The layer and the build-up wiring layer also lose flatness. For this reason, there has been a problem that the reliability of the obtained wiring board is impaired. SUMMARY OF THE INVENTION The present invention solves the above-described problems in the prior art, and a method of manufacturing a wiring substrate including a core substrate manufacturing process capable of ensuring flatness of the front and back surfaces even when a resin is filled in a through hole. To provide.
[0006]
[Means for Solving the Problems]
In order to solve the above problems, the present invention is conceived of performing a plurality of steps of laminating a resin film on the front and back surfaces of a core material having a through hole and curing a resin filled in the through hole, respectively. It was made.
That is, the method of manufacturing a wiring board according to the present invention (claim 1) is directed to a method of manufacturing a core material having a front surface and a back surface and having a through hole penetrating between the front surface and the back surface. Each resin film is individually laminated, the pair of resin films are pressed along the thickness direction of the core material, a hole filling step of filling the resin in the through hole, and filled in the through hole. A curing step of heating and curing the resin; and repeating a plurality of times to form a core substrate. The filling process and the curing process include a mode in which the curing process is performed in parallel while the filling process is performed, in addition to a mode in which the filling process and the curing process are performed in this order.
[0007]
According to this, after the first hole filling step and the curing step, the same depression is formed on the surface of the resin layer located directly above and below the through hole of the core material, but the second and subsequent steps By performing the hole filling step and the curing step described above, it is possible to eliminate the concave portion or to suppress it to an extremely fine concave portion. That is, the hole-filling step and the curing step, which were conventionally performed once, are divided into a plurality of times, and a relatively thin resin film is laminated on each, filled into the through-holes, and cured, whereby the first-time dent is formed. It can be shallower than before. Subsequently, by performing the hole filling step and the curing step after the second time using the thin resin film, it is possible to eliminate the concave portion or to suppress the concave portion to a fine concave portion having almost no adverse effect.
[0008]
Therefore, a highly reliable wiring board in which the front surface wiring layer and the back surface wiring layer formed on the front and back surfaces of the core substrate obtained by the above process, and the insulating layer and the build-up wiring layer formed thereon are formed flat. Can be reliably manufactured.
The core material includes a resin plate, a resin plate on which metal foils on the front and rear surfaces are adhered, in addition to a metal plate described later. Further, the resin film includes a film made of an electrically conductive resin in addition to a film made of an insulating resin.
In addition, according to the present invention, a resin film is individually laminated on the front surface and the back surface of the core material having a front surface and a back surface and having a through hole penetrating between the front surface and the back surface. Then, pressing the pair of resin films along the thickness direction of the core material, forming a resin layer on the front surface and the back surface of the core material, respectively, and filling the through-hole with a resin, A step of forming a core substrate by repeating a curing step of heating and curing the resin filled in the resin layer and the resin filled in the through-holes respectively formed on the front surface and the back surface of the core material, and alternately a plurality of times. It is also possible to include a method of manufacturing a wiring board.
[0009]
The present invention also provides a method for manufacturing a wiring board, wherein in the filling step, the thickness of the resin film used for the first time is equal to or greater than the thickness of the resin film used for the second time and thereafter (claim 2). included.
According to this, in the first hole filling step, by pressing the laminated resin film with a press or the like, the inside of the through-hole of the core material can be reliably filled with the resin of the film, and is generated in the subsequent curing step. It is more certain that the recesses are eliminated or made into fine recesses by the second and subsequent hole filling and curing steps.
The thickness of the resin film laminated in the first hole filling step is 1 to 4 times the thickness of the resin film laminated in the second and subsequent hole filling steps, and particularly preferably 2 times or more from the viewpoint of obtaining the above effects.
[0010]
Furthermore, the present invention also includes a method of manufacturing a wiring board, wherein the core material is a metal plate having the front and back surfaces and a through hole.
According to this, it is possible to reliably manufacture a core substrate having a required strength, a core material made of a metal plate in which the inside of the through hole is filled with a resin, and a flat resin layer formed on the front and back surfaces. It is possible to manufacture a solid wiring substrate including a flat front surface wiring layer and a rear surface wiring layer formed on the front surface and the rear surface of the core substrate, and a flat insulating layer and a build-up wiring layer formed thereon. It becomes possible.
In addition, a copper alloy such as Cu-2.3 wt% Fe-0.03 wt% P (194 alloy), pure copper, oxygen-free copper, Fe-42 wt% Ni (42 alloy), Fe-36 wt% Plates made of Fe—Ni alloys such as Ni (invar), other steel types, titanium and its alloys, and aluminum and its alloys are included.
[0011]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, a preferred embodiment of the present invention will be described with reference to the drawings.
FIG. 1A shows a cross section of a metal plate 1 which is a core material used in the present invention. The metal plate 1 is made of, for example, the copper alloy (194 alloy) having a thickness of 0.25 mm, and has a front surface 2 and a back surface 3 as shown in FIG. A plurality of through holes 4 having an inner diameter of about 0.3 mm penetrate between them. The plurality of through holes 4 are formed by punching the metal plate 1 or by etching.
[0012]
1B and 1C show a first hole filling step in the present invention. As shown in FIG. 1 (B), dry type resin films 5 and 6 each having a thickness T of 40 μm and made of an epoxy resin are laminated (laminated) on the front surface 2 and the rear surface 3 of the metal plate 1.
Next, as shown by arrows in FIG. 1B, the resin films 5 and 6 are pressed along the thickness direction of the metal plate 1 by a press (not shown) or the like.
As a result, as shown in FIG. 1 (C), the resin films 5 and 6 are compressed to become resin layers 7 and 7 which are in close contact with the front surface 2 and the back surface 3 of the metal plate 1, and a part of the resin films is penetrated. Resins 7a, 7a that enter and fill holes 4 and 4 are filled (hole filling step).
[0013]
Next, the metal plate 1 having the resin layers 7 and 7 and the resin 7a in the through holes 4 shown in FIG. 1C is inserted into a heating furnace (not shown), and is heated to about 150 ° C. for about 60 minutes in the atmosphere. A curing process is performed (curing process).
As a result, as shown in FIG. 1D, the resin layers 7, 7 and the resin 7a harden and shrink, and the surfaces of the resin layers 7, 7 located directly above and directly below the through holes 4, 4, respectively. 8 and the back surface 9 are each provided with a spherical concave portion 10.
[0014]
Next, a second hole filling step and a curing step are performed.
As shown in FIG. 2A, resin films 11 and 12 made of an epoxy resin having a thickness t of 20 μ are laminated on the front surface 8 and the back surface 9 including the concave portions 10 of the resin layers 7 and 7. Next, as shown by arrows in FIG. 2A, the resin films 11 and 12 are pressed along a thickness direction of the metal plate 1 by a press (not shown) or the like.
As a result, as shown in FIG. 2B, the resin films 11 and 12 are compressed and integrated with the resin layers 7 and 7 so that the resin layers 15 and 12 adhere to the front surface 2 and the back surface 3 of the metal plate 1. In addition, some of them become the resins 17, 17 which enter the through holes 4, 4 and fill them more densely (second hole filling step).
[0015]
Then, the resin layers 15 and 16 adhered to the metal plate 1 and the resin 17 in the through holes 4 shown in FIG. 2B are subjected to the same curing treatment as described above (second curing step).
As a result, as shown in FIG. 2 (C), the resin layers 15 and 16 and the resin 17 harden and shrink, but the surfaces of the resin layers 15 and 16 located immediately above and below the through holes 4 and 4 are formed. 18 and the back surface 19 are almost flat. This is because the resin layers 15 and 16 shrink and adhere to the lower resin layers 7 and 7 by the curing treatment, so that the concave portion 10 located between them is eliminated.
[0016]
As a result, as shown in FIG. 2C, the metal plate 1 having the plurality of through holes 4 and 4, the resin 17 filled in the through holes 4, and the flat surface 18 formed on the surface 2 of the metal plate 1 The core substrate 14 having the resin layer 15 of FIG. 1 and the resin layer 16 of the flat back surface 19 formed on the back surface 3 of the metal plate 1 is obtained.
After the second hole filling step and the curing step, small concave portions may remain on the front surface 18 and the rear surface 19 of the resin layers 15 and 16 located directly above and below the through holes 4 and 4, respectively. At this time, if the depth of the recess is not within the allowable range, the third hole filling step and the hardening step are further performed. The thickness of the resin film used in the third hole filling step is equal to or less than the resin films 11 and 12 used in the second time.
The filling step and the curing step are performed so that the resin films 11 and 12 are pressed by a press (hole filling step) and simultaneously heated to cure the filled resin 17 and the like (curing step). Is also possible.
[0017]
Hereinafter, a manufacturing process of the wiring board K using the core substrate 14 will be described.
FIG. 3A shows an example in which the center of the through holes 4 and 4 of the metal plate 1 built in the core substrate 14 is irradiated with, for example, a carbon dioxide gas laser, and the center of the resin layers 15 and 16 and the resin 17 is formed. Next, a step of forming through holes h, h penetrating between the front surface 18 and the back surface 19 of the core substrate 14 will be described. The inner diameter of the through hole h is about 100 μm. The through hole h may be formed by using a small diameter drill instead of the laser. Next, after coating a plating catalyst containing Pd on the front surface 18, the back surface 19, and the inner walls of the through holes h, h of the core substrate 14, electroless copper plating and electrolytic copper plating are applied to the entire surface. As a result, as shown in FIG. 3B, a cylindrical through-hole conductor 20 is formed along the inner wall of each through-hole h. A conductive or non-conductive filling resin 21 is formed in the hollow portion of the through-hole conductor 20. Thereafter, copper plating is performed on the front surface 18 and the back surface 19 of the core substrate 14.
[0018]
Next, a resin film (not shown) made of a photosensitive resin and having a thickness of about 10 μm is attached onto the copper plating films formed on the front surface 18 and the back surface 19 of the core substrate 14. After a mask (not shown) having a predetermined pattern is placed on the film, the film 19 is exposed and developed (photography technique) to remove an etching resist (not shown) having the predetermined pattern. Form. Further, a developing (etching) liquid is brought into contact with the copper plating film via the resist to etch the copper plating film exposed from between the resist patterns.
As a result, as shown in FIG. 3B, a front surface wiring layer 22 and a back surface wiring layer 23 are formed on the front surface 18 and the back surface 19 of the core substrate 14 according to the above-mentioned pattern, and these are formed by through-hole conductors. 20 is connected to the upper end or the lower end, and the filling resin 21 is plated with a lid.
[0019]
Further, as shown in FIG. 3C, an insulating layer 24 made of an epoxy resin film containing an inorganic filler such as a silica filler and having a thickness of 30 μm is formed on the surface wiring layer 22. Photolithography or laser processing (using a carbon dioxide laser or the like) is performed on a predetermined position of the insulating layer 24 to form a plurality of via holes (not shown). The surface wiring layer 24 is exposed at the bottom of the via hole. Next, after the same plating catalyst as described above is applied to the surface of the insulating layer 24 and the inner wall surface of the via hole, electroless copper plating and electrolytic copper plating are performed, and a copper plating film is formed on the surface of the insulating layer 24. As shown in FIG. 3C, a via (filled via) conductor 26 is formed in the via hole.
[0020]
Next, an etching resist similar to the above is formed on the insulating layer 24 on which the copper plating film is formed, and development is performed. As a result, as shown in FIG. 3C, a wiring layer (build-up wiring) 28 having a predetermined pattern is formed on the insulating layer 24. This wiring layer 28 is connected to surface wiring layer 22 via via conductor 26.
Similarly to the above, an insulating layer 30, a via conductor 32, and a wiring layer 34 are formed as shown in FIG. The via conductor 32 connects the wiring layers 28 and 34, and the insulating layers 24 and 30 and the wiring layers 28 and 34 form a build-up layer BU.
[0021]
Further, as shown in FIG. 3C, an uppermost insulating layer (solder resist layer) 36 having a thickness of 20 μm is formed on the wiring layer 34. A solder bump 38 projecting higher than the first main surface 37 from an appropriate position on the wiring layer 34 penetrates through the insulating layer 36. The solder bump 38 is made of a low melting point alloy such as Sn-Ag, Pb-Sn, Sn-Ag-Cu, Sn-Cu, or Sn-Zn (in this embodiment, Sn-Ag). It is individually connected to connection terminals of an IC chip (not shown) mounted on one main surface 37. The plurality of solder bumps 38 and the connection terminals of the IC chip are buried and protected by an underfill material.
[0022]
On the other hand, as shown in FIG. 3C, a back wiring layer 23 having a predetermined pattern is formed on the back surface 19 of the core substrate 14 in the same manner as described above, and an insulating layer (solder resist layer) similar to the above is formed thereunder. ) 25 is formed. The wiring 27 extending from the back wiring layer 23 is located on the bottom surface of the opening 29 that opens toward the second main surface 31 in the insulating layer 25. The surface of the wiring 27 is coated with Ni plating and Au plating, and is used as a connection terminal to a printed board such as a motherboard (not shown).
[0023]
Thus, the wiring board K as shown in FIG. 3C is manufactured. Since the wiring board K uses the core substrate 14 having the flat surface 18, the surface wiring layer 22 formed on the surface 18 and the wiring layer 28 in the build-up layer BU formed thereon are formed. , 34 are formed flat. Further, the thicknesses of the insulating layers 24 and 30 do not vary and are averaged. Therefore, according to the manufacturing method of the present invention, it is possible to reliably manufacture the core substrate 14 having the flat front surface 18 and the rear surface 19 and to reliably manufacture the highly reliable wiring board K using the core substrate 14. It becomes possible.
[0024]
The present invention is not limited to the embodiments described above.
The core material used for the core substrate is not limited to the copper alloy, and may be a metal plate made of an Fe—Ni-based alloy, titanium or its alloy, aluminum or its alloy, or the like. Alternatively, a core material made of a synthetic resin or a composite material including an inorganic filler such as a glass filler or a glass cloth may be used.
The resin film may be made of a conductive resin in addition to an insulating resin. By using together such a conductive resin film and a core material made of an insulating material such as the above synthetic resin, it is also possible to form a through-hole conductor or the like in a through hole of the core material.
Furthermore, it is also possible to change the characteristics of the resin film used for the first time and the resin film used for the second time and thereafter. For example, by using a resin film having a low coefficient of thermal expansion for the first time and using a resin film having a higher coefficient of thermal expansion for the second and subsequent times, the resin film along the axial direction of the through hole of the core material can be used. It is possible to further reduce the thickness and the thickness of all the resin layers formed on the front and back surfaces of the core material.
[0025]
【The invention's effect】
According to the method of manufacturing a wiring board of the present invention (claim 1), the core filling step or the hardening step is repeated twice or more, so that a core substrate having no recesses on the front and back surfaces or a fine one is reliably obtained. Can be For this reason, it is possible to reliably form a highly reliable wiring board in which the front surface wiring layer and the back surface wiring layer formed on the front and back surfaces of the core substrate, and the insulating layer and the build-up wiring layer formed thereon are formed flat. It can be manufactured.
According to the method of manufacturing a wiring board of the second aspect, the resin film used in the second and subsequent hole filling steps is thinned and the curing step is performed to eliminate a concave portion on the surface of the core substrate or to make a fine concave portion. Is more certain.
Further, according to the method for manufacturing a wiring board of the third aspect, the metal plate having the required strength, the inside of the through hole of the core material is filled with the resin, and the front and back surfaces of the metal plate are formed with a flat resin layer is formed. A core substrate as a material can be reliably manufactured.
[Brief description of the drawings]
FIGS. 1A to 1D are schematic views showing steps in a method for manufacturing a wiring board according to the present invention.
FIGS. 2A to 2C are schematic diagrams showing each step in the manufacturing method of the present invention following FIG. 1D.
3 (A) to 3 (C) are schematic diagrams showing each step in the manufacturing method of the present invention following FIG. 2 (C).
FIGS. 4A to 4D are schematic views showing respective steps in a conventional method for manufacturing a wiring board.
[Explanation of symbols]
1 ... Metal plate (core material), 2 ... Surface,
3 ……………… Back side, 4 ………………… Through-hole,
5, 6, 11, 12 ... resin film, 7a, 17 ... resin 14 ... core substrate,
K ………………… Wiring board

Claims (3)

表面および裏面を有し且つかかる表面と裏面との間を貫通する貫通孔を有するコア材に対し、
上記コア材の表面および裏面にそれぞれ樹脂フィルムを個別に積層し、かかる一対の樹脂フィルムを上記コア材の厚み方向に沿って押圧して、上記貫通孔内に樹脂を充填する穴埋め工程と、
上記貫通孔内に充填された樹脂を加熱して硬化させる硬化工程と、を複数回にわたって繰り返してコア基板を形成する工程を含む、
ことを特徴とする配線基板の製造方法。
For a core material having a front surface and a back surface and having a through hole penetrating between the front surface and the back surface,
Resin films are individually laminated on the front and back surfaces of the core material, respectively, and the pair of resin films are pressed along the thickness direction of the core material, and a hole filling step of filling the resin in the through holes,
A curing step of heating and curing the resin filled in the through-hole, and including a step of forming a core substrate by repeating a plurality of times,
A method for manufacturing a wiring board, comprising:
前記穴埋め工程において、第1回目に用いる前記樹脂フィルムの厚みは、第2回目以降に用いる上記樹脂フィルムの厚み以上である、
ことを特徴とする請求項1に記載の配線基板の製造方法。
In the filling step, the thickness of the resin film used for the first time is equal to or greater than the thickness of the resin film used for the second time or later.
2. The method for manufacturing a wiring board according to claim 1, wherein:
前記コア材は、前記表面および裏面ならびに貫通孔を有する金属板である、ことを特徴とする請求項1または2に記載の配線基板の製造方法。The method for manufacturing a wiring board according to claim 1, wherein the core material is a metal plate having the front and rear surfaces and a through hole.
JP2002187732A 2002-06-27 2002-06-27 Wiring board manufacturing method Expired - Fee Related JP3856733B2 (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
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WO2010137421A1 (en) * 2009-05-29 2010-12-02 イビデン株式会社 Wiring board and method for manufacturing same
US7875340B2 (en) 2007-06-18 2011-01-25 Samsung Electro-Mechanics Co., Ltd. Heat radiation substrate having metal core and method of manufacturing the same
DE102011101805A1 (en) * 2011-05-17 2012-11-22 Fela Holding Gmbh circuit support
JP2017505550A (en) * 2014-12-22 2017-02-16 インテル コーポレイション Multilayer substrate for semiconductor packaging

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US7875340B2 (en) 2007-06-18 2011-01-25 Samsung Electro-Mechanics Co., Ltd. Heat radiation substrate having metal core and method of manufacturing the same
US8061025B2 (en) 2007-06-18 2011-11-22 Samsung Electro-Mechanics Co., Ltd. Method of manufacturing heat radiation substrate having metal core
WO2010137421A1 (en) * 2009-05-29 2010-12-02 イビデン株式会社 Wiring board and method for manufacturing same
CN102293071A (en) * 2009-05-29 2011-12-21 揖斐电株式会社 Wiring board and method for manufacturing same
US8299366B2 (en) 2009-05-29 2012-10-30 Ibiden Co., Ltd. Wiring board and method for manufacturing the same
CN102293071B (en) * 2009-05-29 2014-04-23 揖斐电株式会社 Wiring board and method for manufacturing same
DE102011101805A1 (en) * 2011-05-17 2012-11-22 Fela Holding Gmbh circuit support
DE102011101805B4 (en) * 2011-05-17 2016-08-25 Fela Holding Gmbh circuit support
JP2017505550A (en) * 2014-12-22 2017-02-16 インテル コーポレイション Multilayer substrate for semiconductor packaging

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