JP2003518616A - 光ビームの空間平均強度を測定する方法および装置、ならびに光源を調整するための方法および装置 - Google Patents

光ビームの空間平均強度を測定する方法および装置、ならびに光源を調整するための方法および装置

Info

Publication number
JP2003518616A
JP2003518616A JP2001548914A JP2001548914A JP2003518616A JP 2003518616 A JP2003518616 A JP 2003518616A JP 2001548914 A JP2001548914 A JP 2001548914A JP 2001548914 A JP2001548914 A JP 2001548914A JP 2003518616 A JP2003518616 A JP 2003518616A
Authority
JP
Japan
Prior art keywords
light
light beam
optoelectronic
photoelectric
array
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001548914A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003518616A5 (https=
Inventor
ビラー、ルーカス
カラッシュ、トマス
エルゼンハンス、オリヴィア
サロフィム、エマト
シュネル、ウァバーン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
F Hoffmann La Roche AG
Original Assignee
F Hoffmann La Roche AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by F Hoffmann La Roche AG filed Critical F Hoffmann La Roche AG
Publication of JP2003518616A publication Critical patent/JP2003518616A/ja
Publication of JP2003518616A5 publication Critical patent/JP2003518616A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0429—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using polarisation elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/1626—Arrangements with two photodetectors, the signals of which are compared
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/28—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source
    • G01J1/30—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors
    • G01J1/32—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors adapted for automatic variation of the measured or reference value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP2001548914A 1999-12-24 2000-12-19 光ビームの空間平均強度を測定する方法および装置、ならびに光源を調整するための方法および装置 Pending JP2003518616A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP99811214.8 1999-12-24
EP99811214A EP1111355A1 (en) 1999-12-24 1999-12-24 A method and a device for measuring the intensity of a light beam and a method for regulating a light source
PCT/EP2000/012986 WO2001048450A1 (en) 1999-12-24 2000-12-19 A method and a device for measuring the spatially averaged intensity of a light beam and a method and a device for regulating a light source

Publications (2)

Publication Number Publication Date
JP2003518616A true JP2003518616A (ja) 2003-06-10
JP2003518616A5 JP2003518616A5 (https=) 2007-08-30

Family

ID=8243220

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001548914A Pending JP2003518616A (ja) 1999-12-24 2000-12-19 光ビームの空間平均強度を測定する方法および装置、ならびに光源を調整するための方法および装置

Country Status (7)

Country Link
US (1) US6649896B2 (https=)
EP (2) EP1111355A1 (https=)
JP (1) JP2003518616A (https=)
AT (1) ATE241801T1 (https=)
DE (1) DE60003084T2 (https=)
ES (1) ES2198373T3 (https=)
WO (1) WO2001048450A1 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7348530B2 (en) * 2004-10-05 2008-03-25 Avago Technologies Ecbu Ip Pte Ltd System, method and apparatus for regulating the light emitted by a light source
US8362436B1 (en) 2006-03-14 2013-01-29 Advanced Precision Inc. Electro-optic fluid quantity measurement system
US7671539B1 (en) 2006-11-16 2010-03-02 Advanced Precision Inc. Systems and methods for generating optical energy using a light-emitting diode
JP4645655B2 (ja) * 2008-02-04 2011-03-09 富士ゼロックス株式会社 光伝送モジュール
US8378661B1 (en) 2008-05-29 2013-02-19 Alpha-Omega Power Technologies, Ltd.Co. Solar simulator
US9526150B1 (en) * 2013-04-02 2016-12-20 Kla-Tencor Corporation LED calibration standard having fast stabilization and lasting stability

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0125390A1 (de) * 1983-03-15 1984-11-21 Hanno Prof. Dr.-Ing. Schaumburg Semitransparente Sensoren sowie deren Herstellung und Anwendung
JPH036529U (https=) * 1989-06-07 1991-01-22
JPH06260676A (ja) * 1993-03-09 1994-09-16 Nippon Telegr & Teleph Corp <Ntt> 光通信装置
JPH11312821A (ja) * 1998-04-30 1999-11-09 Kazuhiro Hane 透明な半導体受光素子およびその製造方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4049963A (en) * 1973-09-14 1977-09-20 Coulter Information Systems, Inc. Photoelectric measuring device
US4060426A (en) 1974-07-02 1977-11-29 Polaroid Corporation Tin indium oxide and polyvinylcarbazole layered polarized photovoltaic cell
FR2277436A1 (fr) * 1974-07-02 1976-01-30 Polaroid Corp Transducteur photosensible
US5408314A (en) * 1993-02-24 1995-04-18 Perry; Jeffrey Dark current subtraction with abbreviated reference cycles and recursive filtering
US5489771A (en) 1993-10-15 1996-02-06 University Of Virginia Patent Foundation LED light standard for photo- and videomicroscopy
GB9406605D0 (en) * 1994-04-05 1994-06-08 British Nuclear Fuels Plc Radiation beam position sensor
US5753903A (en) * 1996-11-05 1998-05-19 Medar, Inc. Method and system for controlling light intensity in a machine vision system
US6516013B1 (en) * 1999-12-20 2003-02-04 Lambda Physik Ag Laser beam monitoring apparatus and method
CA2280398C (en) * 1998-10-26 2009-01-20 Lothar Lilge A semiconductor based excitation illuminator for fluorescence and phosphorescence microscopy

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0125390A1 (de) * 1983-03-15 1984-11-21 Hanno Prof. Dr.-Ing. Schaumburg Semitransparente Sensoren sowie deren Herstellung und Anwendung
JPH036529U (https=) * 1989-06-07 1991-01-22
JPH06260676A (ja) * 1993-03-09 1994-09-16 Nippon Telegr & Teleph Corp <Ntt> 光通信装置
JPH11312821A (ja) * 1998-04-30 1999-11-09 Kazuhiro Hane 透明な半導体受光素子およびその製造方法

Also Published As

Publication number Publication date
DE60003084D1 (de) 2003-07-03
EP1240484B1 (en) 2003-05-28
US20020190194A1 (en) 2002-12-19
US6649896B2 (en) 2003-11-18
DE60003084T2 (de) 2004-04-08
ES2198373T3 (es) 2004-02-01
EP1240484A1 (en) 2002-09-18
ATE241801T1 (de) 2003-06-15
EP1111355A1 (en) 2001-06-27
WO2001048450A1 (en) 2001-07-05

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