JP2003329715A - Measuring method for electrode resistance of capacitor and loss of dielectric - Google Patents
Measuring method for electrode resistance of capacitor and loss of dielectricInfo
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- JP2003329715A JP2003329715A JP2002136606A JP2002136606A JP2003329715A JP 2003329715 A JP2003329715 A JP 2003329715A JP 2002136606 A JP2002136606 A JP 2002136606A JP 2002136606 A JP2002136606 A JP 2002136606A JP 2003329715 A JP2003329715 A JP 2003329715A
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- capacitor
- loss
- dielectric
- frequency
- electrode resistance
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Abstract
Description
【０００１】[0001]
【発明の属する技術分野】この発明は、コンデンサの電
極抵抗および誘電体の損失の測定方法に関し、特に、積
層セラミックコンデンサなどの電極抵抗および誘電体の
損失を個別に測定するための測定方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for measuring an electrode resistance of a capacitor and a loss of a dielectric material, and more particularly to a measuring method for individually measuring an electrode resistance and a dielectric material loss of a laminated ceramic capacitor or the like.
【０００２】[0002]
【従来の技術】従来から、コンデンサの選別方法とし
て、コンデンサの静電容量、等価直列抵抗、コンデンサ
損失、絶縁抵抗等の特性値を測定し、これらの測定値に
基づいて所定範囲の値から外れたコンデンサを不良品と
して良否を選別する方法がある。また、コンデンサの設
計においては、静電容量、等価直列抵抗、コンデンサ損
失、絶縁抵抗等の特性値について所望の特性値が得られ
るように、誘電体材料や電極材料、寸法や電極形状など
が設計されていた。2. Description of the Related Art Conventionally, as a method of selecting a capacitor, characteristic values such as capacitance, equivalent series resistance, capacitor loss, and insulation resistance of the capacitor are measured, and a value within a predetermined range is deviated based on these measured values. There is a method of selecting good or bad as a defective capacitor. When designing capacitors, design dielectric materials, electrode materials, dimensions, electrode shapes, etc. so that desired characteristic values such as capacitance, equivalent series resistance, capacitor loss, and insulation resistance can be obtained. It had been.
【０００３】[0003]
【発明が解決しようとする課題】しかしながら、上記特
性値はすべて、コンデンサ全体としての特性値であり、
コンデンサを構成する個々の部分の特性値ではなかっ
た。そのため、良否の選別において、電極部分に微小な
欠陥があったとしても、電極部分以外の部分、たとえ
ば、誘電体部分で補正されてしまってコンデンサ全体と
しては所望の特性値を満たしていることがあり、このよ
うなものが良品とされる可能性があった。また、コンデ
ンサの設計においては、所望の特性値が得られない場
合、どの部分に問題があるのかを明確にすることが難し
いという問題があった。また、個々の部分がコンデンサ
全体の特性にどのように関係しているか不明であった。
これに対して、コンデンサの部分的な特性を得るために
次のような方法が考えられる。まず、コンデンサに研磨
等の加工を施して電極を露出させ、電極抵抗を測定する
方法が考えられる。しかしながら、この方法では、コン
デンサを破壊しなければ、特性を測定することができな
いため、良否選別には用いることができない。また、研
磨等の加工についても、加工によって微小な欠陥部分を
無くしてしまう可能性があり、非常に困難なものであ
る。次に、たとえばアルミナ等の基板の上に、コンデン
サにおける電極部分と同じ体積となるように電極ペース
トを塗布して焼き付け、その抵抗を測定することにより
推定する方法が考えられる。しかしながら、コンデンサ
と同じ状態にはできないため、電極抵抗値が異なる可能
性が高いという問題があった。However, all the above characteristic values are characteristic values of the capacitor as a whole,
It was not the characteristic values of the individual parts that make up the capacitor. Therefore, even if there is a minute defect in the electrode portion in the quality selection, it may be corrected by a portion other than the electrode portion, for example, a dielectric portion, so that the capacitor as a whole satisfies a desired characteristic value. There was a possibility that such a product would be a good product. Further, in designing a capacitor, there is a problem that it is difficult to clarify which part has a problem when a desired characteristic value cannot be obtained. Also, it was unclear how the individual parts relate to the characteristics of the entire capacitor.
On the other hand, the following method can be considered in order to obtain partial characteristics of the capacitor. First, a method is conceivable in which the capacitor is subjected to processing such as polishing to expose the electrode and the electrode resistance is measured. However, with this method, the characteristics cannot be measured without destroying the capacitor, and therefore cannot be used for pass / fail selection. Further, with respect to processing such as polishing, there is a possibility that minute defects may be eliminated by the processing, which is extremely difficult. Next, a method is conceivable in which an electrode paste is applied on a substrate made of alumina or the like so as to have the same volume as the electrode portion of the capacitor, baked, and its resistance is measured. However, since it cannot be in the same state as the capacitor, there is a high possibility that the electrode resistance values are different.
【０００４】それゆえに、この発明の主たる目的は、非
破壊でコンデンサの電極部分における抵抗と誘電体部分
における損失とを分離して把握することができ、コンデ
ンサの設計や選別に応用することができる、コンデンサ
の電極抵抗および誘電体の損失の測定方法を提供するこ
とである。Therefore, the main object of the present invention is to nondestructively and separately grasp the resistance in the electrode part of the capacitor and the loss in the dielectric part, which can be applied to the design and selection of the capacitor. , A method for measuring the electrode resistance of a capacitor and the loss of a dielectric.
【０００５】[0005]
【課題を解決するための手段】この発明は、コンデンサ
に所定の周波数ｆ1 の交流信号を印加し、周波数ｆ1に
おける静電容量Ｃ1 および、等価直列抵抗ＥＳＲ1 また
はコンデンサ損失ＤＦ 1 を測定する工程と、コンデンサ
に周波数ｆ1 に近接する周波数ｆ2 の交流信号を印加
し、周波数ｆ2 における静電容量Ｃ2 および、等価直列
抵抗ＥＳＲ2 またはコンデンサ損失ＤＦ2 を測定する工
程と、および周波数ｆ1 における電極抵抗と周波数ｆ2
における電極抵抗が等しく、かつ周波数ｆ1 における誘
電体の損失と周波数ｆ2 における誘電体の損失が等しい
とすることにより、静電容量Ｃ1 、Ｃ2 およびコンデン
サ損失ＤＦ1 、ＤＦ2 から、コンデンサの電極抵抗およ
び誘電体の損失を算出する工程とを有することを特徴と
する、コンデンサの電極抵抗および誘電体の損失の測定
方法である。このようなコンデンサの電極抵抗および誘
電体の損失の測定方法において、周波数ｆ1 と周波数ｆ
2 は１ＭＨｚ以下であり、周波数ｆ1 に対する周波数ｆ
2 の比は１００以下とすることが好ましい。また、この
発明は、上述のコンデンサの電極抵抗および誘電体の損
失の測定方法により得られたコンデンサの電極抵抗およ
び誘電体の損失を用いてコンデンサを設計することを特
徴とする、コンデンサの設計方法である。さらに、この
発明は、上述のコンデンサの電極抵抗および誘電体の損
失の測定方法により得られたコンデンサの電極抵抗およ
び誘電体の損失の値によってコンデンサの良否を選別す
ることを特徴とする、コンデンサの選別方法である。SUMMARY OF THE INVENTION The present invention is a capacitor
A predetermined frequency f1 AC signal of frequency f1To
Capacitance C1 And equivalent series resistance ESR1 Also
Is the capacitor loss DF 1 And the process of measuring
At frequency f1 Frequency f close to2 Apply AC signal of
And frequency f2 Capacitance C at2 And equivalent series
Resistance ESR2 Or capacitor loss DF2 To measure
Distance and frequency f1 Electrode resistance and frequency f2
Have the same electrode resistance at frequency f1 Invitation in
Loss of electric body and frequency f2 Equal loss of dielectric in
And the capacitance C1 , C2 And conden
Service loss DF1 , DF2 From the electrode resistance of the capacitor and
And a step of calculating the loss of the dielectric material.
Measure the electrode resistance of a capacitor and the loss of a dielectric
Is the way. Electrode resistance and induction of such capacitors
In the method of measuring the loss of the electric body, the frequency f1 And frequency f
2 Is 1 MHz or less, and the frequency f1 Frequency f for
2 The ratio is preferably 100 or less. Also this
The invention is based on the above-mentioned capacitor electrode resistance and dielectric loss.
Loss and the electrode resistance of the capacitor obtained by the
And designing capacitors using dielectric loss
This is the characteristic of the capacitor design method. Furthermore, this
The invention is based on the above-mentioned capacitor electrode resistance and dielectric loss.
Loss and the electrode resistance of the capacitor obtained by the
The quality of capacitors by the value of the dielectric loss
It is a method of selecting capacitors, which is characterized in that
【０００６】ある周波数（ｆ）におけるコンデンサの等
価直列抵抗（ＥＳＲ）、電極抵抗（ｒ）、誘電体の損失
（ＤＬ）、静電容量（Ｃ）、コンデンサ損失（ＤＦ）の
関係は、一般に次式で示される。The relationship between the equivalent series resistance (ESR), electrode resistance (r), dielectric loss (DL), capacitance (C) and capacitor loss (DF) of a capacitor at a certain frequency (f) is generally as follows. It is shown by the formula.
【０００７】[0007]
【数１】 [Equation 1]
【０００８】[0008]
【数２】 [Equation 2]
【０００９】これらの式において、近接する複数の周波
数ｆ1 ，ｆ2 において測定したとき、電極抵抗（ｒ）や
誘電体の損失（ＤＬ）が等しいものとみなすと、複数の
周波数ｆ1 ，ｆ2 でコンデンサの静電容量Ｃ1 ，Ｃ2 と
等価直列抵抗ＥＳＲ1 ，ＥＳＲ2 とを測定したり、静電
容量Ｃ1 ，Ｃ2 とコンデンサ損失ＤＦ1 ，ＤＦ2 とを測
定して、これらの値から算出することにより、コンデン
サの電極抵抗および誘電体の損失を値で表すことができ
る。特に、測定を行う２点の周波数ｆ1 ，ｆ2が１ＭＨ
ｚ以下であり、ｆ1 に対するｆ2 の比が１００以下であ
る場合、これらの周波数における電極抵抗および誘電体
の損失が等しいと考えることができる。これは、コンデ
ンサに用いられる誘電体材料や電極材料が１ＭＨｚ以下
であれば、周波数による変動が少なく、たとえばｆ1 が
１０ｋＨｚに対してｆ2 が１ＭＨｚの場合、電極抵抗お
よび誘電体の損失がほぼ同じ値となるためである。した
がって、本願において、近接する複数の周波数とは、電
極抵抗および誘電体の損失が等しいと考えることができ
る複数の周波数のことである。In these equations, when it is considered that the electrode resistance (r) and the dielectric loss (DL) are equal when measured at a plurality of frequencies f 1 and f 2 that are close to each other, a plurality of frequencies f 1 and f 2 or measuring the capacitances C 1, C 2 of the capacitors and the equivalent series resistance ESR 1, ESR 2, with measuring the capacitances C 1, C 2 and the capacitor losses DF 1, DF 2, these By calculating from the value of, the electrode resistance of the capacitor and the loss of the dielectric can be expressed by values. In particular, the frequencies f 1 and f 2 at the two points for measurement are 1 MHz.
If it is less than or equal to z and the ratio of f 2 to f 1 is less than 100, it can be considered that the electrode resistance and the dielectric loss at these frequencies are equal. This is because if the dielectric material or electrode material used for the capacitor is 1 MHz or less, there is little fluctuation due to frequency. For example, if f 1 is 10 kHz and f 2 is 1 MHz, the electrode resistance and dielectric loss are almost the same. This is because they have the same value. Therefore, in the present application, a plurality of frequencies that are close to each other are a plurality of frequencies that can be considered to have the same electrode resistance and loss of the dielectric.
【００１０】コンデンサの電極抵抗および誘電体の損失
を分離して把握することができれば、これらのパラメー
タとコンデンサの特性との関係を分析することができ、
コンデンサの設計に応用することができる。また、電極
抵抗および誘電体の損失によって、より細かくコンデン
サを選別することができる。If the electrode resistance of the capacitor and the loss of the dielectric can be separately grasped, the relationship between these parameters and the characteristics of the capacitor can be analyzed,
It can be applied to the design of capacitors. Further, the capacitors can be more finely selected according to the electrode resistance and the loss of the dielectric.
【００１１】この発明の上述の目的，その他の目的，特
徴および利点は、以下の発明の実施の形態の詳細な説明
から一層明らかとなろう。The above-mentioned objects, other objects, features and advantages of the present invention will be more apparent from the following detailed description of the embodiments of the invention.
【００１２】[0012]
【発明の実施の形態】この発明の測定方法を用いて、た
とえば積層セラミックコンデンサなどのコンデンサの電
極抵抗および誘電体の損失が測定される。コンデンサの
等価直列抵抗（ＥＳＲ）は、一般に次の式で表される。BEST MODE FOR CARRYING OUT THE INVENTION Using the measuring method of the present invention, the electrode resistance and dielectric loss of a capacitor such as a laminated ceramic capacitor are measured. The equivalent series resistance (ESR) of a capacitor is generally expressed by the following equation.
【００１３】[0013]
【数３】 [Equation 3]
【００１４】上式において、ｒはコンデンサの電極抵抗
であり、ＤＬは誘電体の損失であり、ｆは測定周波数で
あり、Ｃは静電容量である。ここで、異なる周波数ｆ
1 ，ｆ 2 でコンデンサの特性を測定し、そのとき測定さ
れた静電容量をＣ1 ，Ｃ2 、等価直列抵抗をＥＳＲ1 ，
ＥＳＲ2 とする。そして、異なる周波数ｆ1 ，ｆ2 で測
定した電極抵抗（ｒ）および誘電体の損失（ＤＬ）が等
しいとみなすと、これらのパラメータは、次の２式で表
すことができる。In the above equation, r is the electrode resistance of the capacitor
Where DL is the dielectric loss and f is the measured frequency
Yes, C is the capacitance. Where different frequencies f
1 , F 2 Measure the characteristics of the capacitor with.
The electrostatic capacitance1 , C2 , ESR is equivalent series resistance1 ，
ESR2 And And different frequencies f1 , F2 Measured by
The determined electrode resistance (r) and dielectric loss (DL) are equal
Assuming that it is correct, these parameters are expressed by the following two equations.
You can
【００１５】[0015]
【数４】 [Equation 4]
【００１６】[0016]
【数５】 [Equation 5]
【００１７】特に、２つの周波数ｆ1 ，ｆ2 の比が１０
０以下であるような近接した周波数で測定した場合、こ
れらの周波数ｆ1 ，ｆ2 で測定した電極抵抗および誘電
体の損失は等しいものとみなすことができる。上の２式
より、電極抵抗（ｒ）と誘電体の損失（ＤＬ）は、次の
２式で表される。In particular, the ratio of the two frequencies f 1 and f 2 is 10
When measured at close frequencies such as 0 or less, the electrode resistance and dielectric loss measured at these frequencies f 1 and f 2 can be regarded as equal. From the above two equations, the electrode resistance (r) and the dielectric loss (DL) are expressed by the following two equations.
【００１８】[0018]
【数６】 [Equation 6]
【００１９】[0019]
【数７】 [Equation 7]
【００２０】これらの式を用いてコンデンサの電極抵抗
および誘電体の損失を得るために、ＬＣＲメータなどを
用いて、異なる周波数ｆ1 ，ｆ2 でコンデンサの静電容
量Ｃ 1 ，Ｃ2 と等価直列抵抗ＥＳＲ1 ，ＥＳＲ2 とが測
定される。そして、これらの値を上式に代入することに
より、コンデンサの電極抵抗および誘電体の損失を算出
することができる。Using these formulas, the electrode resistance of the capacitor
And to get the loss of the dielectric, such as LCR meter
Using different frequencies f1 , F2 The capacitance of the capacitor
Quantity C 1 , C2And equivalent series resistance ESR1, ESR2 To measure
Is determined. Then, by substituting these values into the above equation,
Calculates the electrode resistance of the capacitor and the loss of the dielectric
can do.
【００２１】このように、この測定方法を採用すれば、
コンデンサの電極抵抗と誘電体の損失とを分離して算出
することができる。そのため、コンデンサの特性を分析
する際に、電極部分と誘電体部分とに分けて分析するこ
とができる。したがって、コンデンサを設計する際に
も、電極部分と誘電体部分とに分けて設計することがで
き、所望の特性に近づけることが容易となる。Thus, if this measuring method is adopted,
The electrode resistance of the capacitor and the loss of the dielectric can be calculated separately. Therefore, when analyzing the characteristics of the capacitor, it is possible to separately analyze the electrode portion and the dielectric portion. Therefore, when designing the capacitor, the electrode part and the dielectric part can be designed separately, and it becomes easy to approach the desired characteristics.
【００２２】さらに、電極部分と誘電体部分の特性を分
けて測定することにより、これまでの静電容量、等価直
列抵抗、コンデンサ損失などに加えて、電極抵抗および
誘電体の損失にも管理幅を定めて選別を行うことができ
る。Further, by separately measuring the characteristics of the electrode portion and the dielectric portion, in addition to the conventional capacitance, equivalent series resistance, capacitor loss, etc., there is a control range for the electrode resistance and dielectric loss. It is possible to set and select.
【００２３】また、コンデンサの静電容量（Ｃ）、コン
デンサ損失（ＤＦ）および等価直列抵抗（ＥＳＲ）の間
には、次式のような関係があり、この式からも電極抵抗
および誘電体の損失を知ることができる。Further, there is the following relationship between the electrostatic capacity (C) of the capacitor, the capacitor loss (DF) and the equivalent series resistance (ESR), and from this expression, the electrode resistance and the dielectric You can know the loss.
【００２４】[0024]
【数８】 [Equation 8]
【００２５】上式において、ｆは測定周波数である。そ
して、ＬＣＲメータやＣメータなどを用いて、周波数ｆ
1 ，ｆ2で静電容量Ｃ1 ，Ｃ2 およびコンデンサ損失Ｄ
Ｆ1，ＤＦ2 を測定すると、上式より等価直列抵抗ＥＳ
Ｒ1 ，ＥＳＲ2 は、次の２式で表される。In the above equation, f is the measurement frequency. Then, using an LCR meter or a C meter, the frequency f
Capacitances C 1 and C 2 and capacitor loss D at 1 and f 2
When F 1 and DF 2 are measured, the equivalent series resistance ES
R 1 and ESR 2 are represented by the following two equations.
【００２６】[0026]
【数９】 [Equation 9]
【００２７】[0027]
【数１０】 [Equation 10]
【００２８】これらの式を数式６および数式７に代入す
ることにより、電極抵抗（ｒ）および誘電体の損失（Ｄ
Ｌ）は、次の２式で表すことができる。By substituting these equations into the equations 6 and 7, the electrode resistance (r) and the loss of the dielectric (D
L) can be expressed by the following two equations.
【００２９】[0029]
【数１１】 [Equation 11]
【００３０】[0030]
【数１２】 [Equation 12]
【００３１】このように、２つの周波数における静電容
量とコンデンサ損失からも、コンデンサの電極抵抗およ
び誘電体の損失を算出することができる。As described above, the electrode resistance of the capacitor and the loss of the dielectric can be calculated from the capacitance and the loss of the capacitor at the two frequencies.
【００３２】これらの測定方法において、より多くの周
波数で静電容量、等価直列抵抗およびコンデンサ損失を
測定し、数式６、数式７、数式１１、数式１２などを用
いて電極抵抗および誘電体の損失を算出し、それらの値
を平均することによって、算出精度を上げることができ
る。In these measuring methods, the capacitance, the equivalent series resistance and the capacitor loss are measured at more frequencies, and the electrode resistance and the dielectric loss are calculated by using the equations (6), (7), (11) and (12). By calculating and averaging those values, the calculation accuracy can be improved.
【００３３】[0033]
【実施例】この発明の方法を用いてコンデンサの電極抵
抗および誘電体の損失を測定するために、積層セラミッ
クコンデンサを準備した。準備した積層セラミックコン
デンサについて、ＬＣＲメータを用いて、異なる周波数
ｆ1 ，ｆ2 で等価直列抵抗ＥＳＲ1 ，ＥＳＲ2 、静電容
量Ｃ1 ，Ｃ2およびコンデンサ損失ＤＦ1 ，ＤＦ2を測定
し、その結果を表１に示した。これらの値から、数式
６，数式７，数式１１，数式１２を用いて、電極抵抗
（ｒ）および誘電体の損失（ＤＬ）を算出し、その結果
を表２に示した。EXAMPLE A multilayer ceramic capacitor was prepared for measuring the electrode resistance of the capacitor and the loss of the dielectric by using the method of the present invention. With respect to the prepared multilayer ceramic capacitor, equivalent series resistances ESR 1 and ESR 2 , capacitances C 1 and C 2 and capacitor losses DF 1 and DF 2 were measured at different frequencies f 1 and f 2 using an LCR meter. The results are shown in Table 1. From these values, the electrode resistance (r) and the loss (DL) of the dielectric material were calculated by using Expression 6, Expression 7, Expression 11, and Expression 12, and the results are shown in Table 2.
【００３４】また、同じ積層セラミックコンデンサにつ
いて、測定周波数ｆ1 ，ｆ2 の組み合わせを変えて、等
価直列抵抗ＥＳＲ1 ，ＥＳＲ2 、静電容量Ｃ1 ，Ｃ2 、
コンデンサ損失ＤＦ1 ，ＤＦ2 を測定し、その測定結果
を表１に示した。これらの測定結果から、数式６，数式
７，数式１１，数式１２を用いて、電極抵抗（ｒ）およ
び誘電体の損失（ＤＬ）を算出し、その結果を表２に示
した。Further, for the same multilayer ceramic capacitors, the measurement frequency f 1, by changing the combination of f 2, equivalent series resistance ESR 1, ESR 2, the capacitance C 1, C 2,
The capacitor losses DF 1 and DF 2 were measured, and the measurement results are shown in Table 1. From these measurement results, the electrode resistance (r) and the loss (DL) of the dielectric substance were calculated using Formula 6, Formula 7, Formula 11, and Formula 12, and the results are shown in Table 2.
【００３５】[0035]
【表１】 [Table 1]
【００３６】[0036]
【表２】 [Table 2]
【００３７】表１および表２から、同じ試料番号の積層
セラミックコンデンサについてみると、同じ測定周波数
の組み合わせにおいて、数式６，数式７，数式１１，数
式１２で算出した電極抵抗および誘電損失は、同じ値と
なっていることがわかる。また、同じ試料番号の積層セ
ラミックコンデンサについて、測定周波数の組み合わせ
を変えても、得られる電極抵抗および誘電体の損失は、
同じ値となった。このように、この発明の測定方法を用
いることにより、コンデンサの電極抵抗と誘電体の損失
とを分離して把握することができる。なお、上記実施の
形態においては、２つの周波数ｆ1 ，ｆ2 でコンデンサ
の特性を測定したが、これに限るものではなく、さらに
測定する周波数を増やしてもよく、要は近接する複数の
周波数で測定すればよい。From Tables 1 and 2, looking at the laminated ceramic capacitors having the same sample number, the electrode resistance and the dielectric loss calculated by the equations 6, 7, 7 and 12 are the same in the combination of the same measurement frequencies. You can see that it is a value. Also, regarding the multilayer ceramic capacitor of the same sample number, even if the combination of measurement frequencies is changed, the resulting electrode resistance and dielectric loss are
It became the same value. As described above, by using the measuring method of the present invention, the electrode resistance of the capacitor and the loss of the dielectric can be separately grasped. In the above embodiment, the characteristic of the capacitor is measured at two frequencies f 1 and f 2 , but the present invention is not limited to this, and the frequency to be measured may be increased. You can measure with.
【００３８】[0038]
【発明の効果】この発明によれば、近接する複数の周波
数ｆ1 ，ｆ2 で測定した、静電容量Ｃ 1 および等価直列
抵抗ＥＳＲ1 と静電容量Ｃ2 および等価直列抵抗ＥＳＲ
2 、または静電容量Ｃ1 およびコンデンサ損失ＤＦ1 と
静電容量Ｃ2 およびコンデンサ損失ＤＦ2 から電極抵抗
と誘電体の損失を算出しているので、コンデンサを破壊
することなく、コンデンサの電極抵抗と誘電体の損失と
を分離して把握することができる。また、これらの電極
抵抗と誘電体の損失を用いれば、コンデンサの設計にお
いて、所望の特性が得られない原因が、電極部分にある
のか誘電体にあるのかを明確にすることができる。さら
に、これらの電極抵抗と誘電体の損失を用いれば、コン
デンサの良否選別において、全体の特性からは判別でき
ない微小な欠陥を有する不良品を判別することが可能と
なる。そのため、電極抵抗値と誘電体の損失の値につい
て、それぞれ選別範囲を設定すれば、厳密な選別が可能
となる。According to the present invention, a plurality of adjacent frequencies can be used.
Number f1 , F2 Capacitance C measured by 1 And equivalent series
Resistance ESR1 And capacitance C2 And equivalent series resistance ESR
2 , Or capacitance C1 And capacitor loss DF1 When
Capacitance C2 And capacitor loss DF2 To electrode resistance
Since the loss of the dielectric is calculated, the capacitor is destroyed.
Without losing the electrode resistance of the capacitor and the loss of the dielectric
Can be separated and grasped. Also these electrodes
If you use the loss of resistance and dielectric, you can design capacitors.
The reason why the desired characteristics are not obtained is the electrode part.
It is possible to clarify whether it is in the dielectric or in the dielectric. Furthermore
Using these electrode resistance and dielectric loss,
In the pass / fail selection of Densa, it can be distinguished from the overall characteristics.
It is possible to identify defective products that do not have minute defects.
Become. Therefore, the electrode resistance value and the dielectric loss value
Strict sorting is possible by setting the sorting range for each
Becomes
Claims (4)
号を印加し、周波数ｆ1 における静電容量Ｃ1 および、
等価直列抵抗ＥＳＲ1 またはコンデンサ損失ＤＦ1 を測
定する工程と、 コンデンサに前記周波数ｆ1 に近接する周波数ｆ2 の交
流信号を印加し、周波数ｆ2 における静電容量Ｃ2 およ
び、等価直列抵抗ＥＳＲ2 またはコンデンサ損失ＤＦ2
を測定する工程と、 前記周波数ｆ1 における電極抵抗と前記周波数ｆ2 にお
ける電極抵抗が等しく、かつ前記周波数ｆ1 における誘
電体の損失と前記周波数ｆ2 における誘電体の損失が等
しいとすることにより、静電容量Ｃ1 、Ｃ2 およびコン
デンサ損失ＤＦ 1 、ＤＦ2 から、コンデンサの電極抵抗
および誘電体の損失を算出する工程とを有することを特
徴とする、コンデンサの電極抵抗および誘電体の損失の
測定方法。1. A capacitor having a predetermined frequency f1 Communication
Signal and frequency f1 Capacitance C at1 and,
Equivalent series resistance ESR1 Or capacitor loss DF1 Measure
Setting process, The frequency f in the capacitor1 Frequency f close to2 The exchange of
Flow signal and frequency f2 Capacitance C at2 And
And equivalent series resistance ESR2 Or capacitor loss DF2
And the step of measuring The frequency f1 Electrode resistance at the frequency f2 To
Electrode resistance is equal and the frequency f1 Invitation in
Loss of electric body and the frequency f2 The dielectric loss in
The capacitance C1 , C2 And con
Densa loss DF 1 , DF2 From the electrode resistance of the capacitor
And a step of calculating the loss of the dielectric.
Of the electrode resistance of the capacitor and the loss of the dielectric
Measuring method.
Ｈｚ以下であり、前記周波数ｆ1 に対する前記周波数ｆ
2 の比は１００以下としたことを特徴とする、請求項１
に記載のコンデンサの電極抵抗および誘電体の損失の測
定方法。2. The frequency f 1 and the frequency f 2 are 1M.
Hz or less, and the frequency f with respect to the frequency f 1
The ratio of 2 is 100 or less.
2. A method for measuring the electrode resistance of a capacitor and the loss of a dielectric according to.
ンサの電極抵抗および誘電体の損失の測定方法により得
られたコンデンサの電極抵抗および誘電体の損失を用い
てコンデンサを設計することを特徴とする、コンデンサ
の設計方法。3. A capacitor is designed by using the electrode resistance of the capacitor and the loss of the dielectric obtained by the method of measuring the electrode resistance of the capacitor and the loss of the dielectric according to claim 1. And how to design a capacitor.
ンサの電極抵抗および誘電体の損失の測定方法により得
られたコンデンサの電極抵抗および誘電体の損失の値に
よってコンデンサの良否を選別することを特徴とする、
コンデンサの選別方法。4. The quality of the capacitor is selected based on the values of the electrode resistance of the capacitor and the loss of the dielectric obtained by the method of measuring the electrode resistance of the capacitor and the loss of the dielectric according to claim 1 or 2. Characterized by,
Capacitor selection method.
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|---|---|---|---|
| JP2002136606A JP4158408B2 (en) | 2002-05-13 | 2002-05-13 | Measuring method of electrode resistance and dielectric loss in equivalent series resistance of ceramic capacitor |
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|---|---|---|---|
| JP2002136606A JP4158408B2 (en) | 2002-05-13 | 2002-05-13 | Measuring method of electrode resistance and dielectric loss in equivalent series resistance of ceramic capacitor |
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|---|---|---|---|---|
| KR100632864B1 (en) | 2004-09-02 | 2006-10-13 | 에이디반도체(주) | Method and IC for detecting variation of capacitance |
| KR100653403B1 (en) | 2004-11-23 | 2006-12-04 | 에이디반도체(주) | IC for detecting variation of capacitance |
| CN102478615A (en) * | 2010-11-30 | 2012-05-30 | 英业达股份有限公司 | Method for detecting capacitor deficiency |
| WO2012108123A1 (en) * | 2011-02-08 | 2012-08-16 | 株式会社村田製作所 | Capacitor array screening method |
| CN103412265A (en) * | 2013-08-09 | 2013-11-27 | 南京理工大学 | ESR and C monitoring device and method for CCM buck converter output capacitor |
| CN105223422A (en) * | 2015-10-10 | 2016-01-06 | 沈阳工业大学 | Digital dielectric loss measurement system device and method |
-
2002
- 2002-05-13 JP JP2002136606A patent/JP4158408B2/en not_active Expired - Lifetime
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100632864B1 (en) | 2004-09-02 | 2006-10-13 | 에이디반도체(주) | Method and IC for detecting variation of capacitance |
| KR100653403B1 (en) | 2004-11-23 | 2006-12-04 | 에이디반도체(주) | IC for detecting variation of capacitance |
| CN102478615A (en) * | 2010-11-30 | 2012-05-30 | 英业达股份有限公司 | Method for detecting capacitor deficiency |
| CN102478615B (en) * | 2010-11-30 | 2013-11-20 | 英业达股份有限公司 | Method for detecting capacitor deficiency |
| WO2012108123A1 (en) * | 2011-02-08 | 2012-08-16 | 株式会社村田製作所 | Capacitor array screening method |
| JP5464282B2 (en) * | 2011-02-08 | 2014-04-09 | 株式会社村田製作所 | Capacitor array selection method |
| CN103412265A (en) * | 2013-08-09 | 2013-11-27 | 南京理工大学 | ESR and C monitoring device and method for CCM buck converter output capacitor |
| CN105223422A (en) * | 2015-10-10 | 2016-01-06 | 沈阳工业大学 | Digital dielectric loss measurement system device and method |
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