JP2003323793A5 - - Google Patents

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Publication number
JP2003323793A5
JP2003323793A5 JP2003114392A JP2003114392A JP2003323793A5 JP 2003323793 A5 JP2003323793 A5 JP 2003323793A5 JP 2003114392 A JP2003114392 A JP 2003114392A JP 2003114392 A JP2003114392 A JP 2003114392A JP 2003323793 A5 JP2003323793 A5 JP 2003323793A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003114392A
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Japanese (ja)
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JP2003323793A (ja
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Publication date
Priority claimed from US10/136,033 external-priority patent/US6621742B1/en
Application filed filed Critical
Publication of JP2003323793A publication Critical patent/JP2003323793A/ja
Publication of JP2003323793A5 publication Critical patent/JP2003323793A5/ja
Pending legal-status Critical Current

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JP2003114392A 2002-04-29 2003-04-18 閾値電圧レベルのプログラミング方法及びシステムと半導体記憶装置 Pending JP2003323793A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/136,033 US6621742B1 (en) 2002-04-29 2002-04-29 System for programming a flash memory device
US10/136033 2002-04-29

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2007109895A Division JP2007193942A (ja) 2002-04-29 2007-04-18 半導体記憶装置及びその制御方法

Publications (2)

Publication Number Publication Date
JP2003323793A JP2003323793A (ja) 2003-11-14
JP2003323793A5 true JP2003323793A5 (US07576130-20090818-C00114.png) 2005-03-17

Family

ID=27804517

Family Applications (4)

Application Number Title Priority Date Filing Date
JP2003114392A Pending JP2003323793A (ja) 2002-04-29 2003-04-18 閾値電圧レベルのプログラミング方法及びシステムと半導体記憶装置
JP2007109895A Pending JP2007193942A (ja) 2002-04-29 2007-04-18 半導体記憶装置及びその制御方法
JP2010213936A Pending JP2011040158A (ja) 2002-04-29 2010-09-24 半導体記憶装置及びその制御方法
JP2010213935A Expired - Lifetime JP5285674B2 (ja) 2002-04-29 2010-09-24 半導体記憶装置及びその制御方法

Family Applications After (3)

Application Number Title Priority Date Filing Date
JP2007109895A Pending JP2007193942A (ja) 2002-04-29 2007-04-18 半導体記憶装置及びその制御方法
JP2010213936A Pending JP2011040158A (ja) 2002-04-29 2010-09-24 半導体記憶装置及びその制御方法
JP2010213935A Expired - Lifetime JP5285674B2 (ja) 2002-04-29 2010-09-24 半導体記憶装置及びその制御方法

Country Status (2)

Country Link
US (1) US6621742B1 (US07576130-20090818-C00114.png)
JP (4) JP2003323793A (US07576130-20090818-C00114.png)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6738289B2 (en) * 2001-02-26 2004-05-18 Sandisk Corporation Non-volatile memory with improved programming and method therefor
WO2006082619A1 (ja) * 2005-01-31 2006-08-10 Spansion Llc 記憶装置、および該記憶装置のリファレンスセル調整方法
ITMI20062211A1 (it) * 2006-11-17 2008-05-18 St Microelectronics Srl Circuito e metodo per generare una tensione di riferimento in dispositivi di memoria a matrice di celle non volatili
US7609559B2 (en) 2007-01-12 2009-10-27 Micron Technology, Inc. Word line drivers having a low pass filter circuit in non-volatile memory device
JP2010211883A (ja) * 2009-03-11 2010-09-24 Toshiba Corp 不揮発性半導体記憶装置
JP5316299B2 (ja) * 2009-08-07 2013-10-16 富士通セミコンダクター株式会社 半導体メモリ、システムおよび半導体メモリの動作方法
JPWO2011065276A1 (ja) * 2009-11-30 2013-04-11 コニカミノルタアドバンストレイヤー株式会社 光ピックアップ装置用の対物レンズ及び光ピックアップ装置
DE102011009689B4 (de) * 2010-02-25 2012-09-13 Sms Meer Gmbh Strangpresse zum Herstellen von Profilen aus Nichteisenmetall
US8369154B2 (en) * 2010-03-24 2013-02-05 Ememory Technology Inc. Channel hot electron injection programming method and related device
US8467245B2 (en) 2010-03-24 2013-06-18 Ememory Technology Inc. Non-volatile memory device with program current clamp and related method
JP5153895B2 (ja) * 2011-01-12 2013-02-27 ルネサスエレクトロニクス株式会社 不揮発性半導体記憶装置の書込方法
US11494254B2 (en) 2019-12-20 2022-11-08 Cnex Labs, Inc. Storage system with predictive adjustment mechanism and method of operation thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100223868B1 (ko) * 1996-07-12 1999-10-15 구본준 비휘발성 메모리를 프로그램하는 방법
JPH10188586A (ja) * 1996-12-19 1998-07-21 Sony Corp 半導体不揮発性記憶装置
JPH10228786A (ja) * 1997-02-17 1998-08-25 Mitsubishi Electric Corp 不揮発性半導体記憶装置及びその閾値制御方法
JP3906545B2 (ja) * 1998-02-03 2007-04-18 ソニー株式会社 不揮発性半導体記憶装置
JP2000030476A (ja) * 1998-07-14 2000-01-28 Mitsubishi Electric Corp 不揮発性半導体記憶装置および閾値電圧書込み方法

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