JP2003305035A5 - - Google Patents

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Publication number
JP2003305035A5
JP2003305035A5 JP2003045287A JP2003045287A JP2003305035A5 JP 2003305035 A5 JP2003305035 A5 JP 2003305035A5 JP 2003045287 A JP2003045287 A JP 2003045287A JP 2003045287 A JP2003045287 A JP 2003045287A JP 2003305035 A5 JP2003305035 A5 JP 2003305035A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2003045287A
Other versions
JP2003305035A (ja
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Publication date
Priority claimed from US10/065,700 external-priority patent/US7269243B2/en
Priority claimed from US10/065,699 external-priority patent/US7006594B2/en
Application filed filed Critical
Publication of JP2003305035A publication Critical patent/JP2003305035A/ja
Publication of JP2003305035A5 publication Critical patent/JP2003305035A5/ja
Withdrawn legal-status Critical Current

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JP2003045287A 2002-02-25 2003-02-24 検出器位置及び線源移動をマルチピン・ファントームに基づいて再構成較正するための方法及び装置 Withdrawn JP2003305035A (ja)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US35956202P 2002-02-25 2002-02-25
US60/359562 2002-02-25
US10/065,700 US7269243B2 (en) 2002-02-25 2002-11-11 Method and apparatus for controlling electron beam motion based on calibration information
US10/065700 2002-11-11
US10/065699 2002-11-11
US10/065,699 US7006594B2 (en) 2002-02-25 2002-11-11 Method and apparatus for reconstruction calibration of detector position and source motion based on a multi-pin phantom

Publications (2)

Publication Number Publication Date
JP2003305035A JP2003305035A (ja) 2003-10-28
JP2003305035A5 true JP2003305035A5 (ja) 2006-04-06

Family

ID=27792088

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2003045288A Withdrawn JP2003265458A (ja) 2002-02-25 2003-02-24 較正情報に基づき電子ビーム移動を制御するための方法及び装置
JP2003045287A Withdrawn JP2003305035A (ja) 2002-02-25 2003-02-24 検出器位置及び線源移動をマルチピン・ファントームに基づいて再構成較正するための方法及び装置

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP2003045288A Withdrawn JP2003265458A (ja) 2002-02-25 2003-02-24 較正情報に基づき電子ビーム移動を制御するための方法及び装置

Country Status (3)

Country Link
EP (2) EP1346688A3 (ja)
JP (2) JP2003265458A (ja)
CN (2) CN1326091C (ja)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100403988C (zh) * 2004-04-29 2008-07-23 Ge医疗系统环球技术有限公司 X射线几何结构测定方法及x射线ct装置
DE102005007938A1 (de) * 2005-02-23 2006-08-31 Siemens Ag Vorrichtung bzw. Verfahren zum Einstellen einer relativen Verschiebestellung zweier Bauteile einer medizinischen Einrichtung
CN100381103C (zh) * 2005-03-22 2008-04-16 东软飞利浦医疗设备系统有限责任公司 一种ct机几何参数校正方法
DE102006032607B4 (de) * 2006-07-11 2011-08-25 Carl Zeiss Industrielle Messtechnik GmbH, 73447 Anordnung zur Erzeugung elektromagnetischer Strahlung und Verfahren zum Betreiben der Anordnung
KR102121040B1 (ko) 2010-02-18 2020-06-09 마우이 이미징, 인코포레이티드 초음파 이미지를 구성하는 방법 및 이를 위한 다중-개구 초음파 이미징 시스템
US9131869B2 (en) * 2010-05-11 2015-09-15 Rhythmia Medical, Inc. Tracking using field mapping
TW201336478A (zh) 2011-12-01 2013-09-16 Maui Imaging Inc 使用以回音為基及多孔徑都卜勒超音波之移動偵測
EP2883079B1 (en) * 2012-08-10 2017-09-27 Maui Imaging, Inc. Calibration of multiple aperture ultrasound probes
WO2015028069A1 (de) * 2013-08-29 2015-03-05 Siemens Aktiengesellschaft Computertomographie mit bewegungskompensation
EP3353575B1 (en) * 2015-09-23 2020-07-01 Prismatic Sensors AB Determining the orientation of an edge-on x-ray detector with respect to the direction of incoming x-rays
CN111261313B (zh) * 2020-01-17 2021-01-05 桂林狮达技术股份有限公司 带电粒子束加工设备扫描系统校准标定方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4130759A (en) * 1977-03-17 1978-12-19 Haimson Research Corporation Method and apparatus incorporating no moving parts, for producing and selectively directing x-rays to different points on an object
US4344183A (en) * 1980-04-14 1982-08-10 Radiation Measurements, Inc. Measuring tool for computer assisted tomographic scanner
US4631741A (en) * 1984-04-05 1986-12-23 Imatron, Inc. Beam spot monitoring arrangement for use in a scanning electron beam computed tomography scanner and method
JPH01185246A (ja) * 1988-01-19 1989-07-24 Toshiba Corp X線撮影装置
EP0463187B1 (de) * 1990-06-19 1995-05-03 Siemens Aktiengesellschaft Medizinische Vorrichtung
DE19608497C2 (de) * 1996-03-05 2002-05-02 Siemens Ag Röntgendiagnostikgerät
US5712895A (en) * 1997-01-14 1998-01-27 Picker International, Inc. Rotational digital subtraction angiography phantom
DE19703556A1 (de) * 1997-01-31 1998-08-06 Philips Patentverwaltung Verfahren und Anordnung zur Positionsbestimmung bei der Röntgenbildgebung
US5841835A (en) * 1997-03-31 1998-11-24 General Electric Company Apparatus and method for automatic monitoring and assessment of image quality in x-ray systems
US5923727A (en) * 1997-09-30 1999-07-13 Siemens Corporate Research, Inc. Method and apparatus for calibrating an intra-operative X-ray system
US6148057A (en) * 1998-11-02 2000-11-14 Analogic Corporation Apparatus and method for calibrating detectors in a computed tomography scanner
US6325539B1 (en) * 1998-12-31 2001-12-04 General Electric Company Calibration simplification for a computed tomograph system
US6292171B1 (en) * 1999-03-31 2001-09-18 Seiko Epson Corporation Method and apparatus for calibrating a computer-generated projected image
DE19926098C2 (de) * 1999-06-08 2003-05-15 Siemens Ag Röntgenaufnahmeeinrichtung

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