JP2003248033A - Contact head for inspecting electronic component - Google Patents

Contact head for inspecting electronic component

Info

Publication number
JP2003248033A
JP2003248033A JP2002045380A JP2002045380A JP2003248033A JP 2003248033 A JP2003248033 A JP 2003248033A JP 2002045380 A JP2002045380 A JP 2002045380A JP 2002045380 A JP2002045380 A JP 2002045380A JP 2003248033 A JP2003248033 A JP 2003248033A
Authority
JP
Japan
Prior art keywords
support block
spring hinge
pressure contact
supporting block
contact head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002045380A
Other languages
Japanese (ja)
Inventor
Toshio Okuno
敏雄 奥野
Masatomo Nagashima
正智 長島
Toshio Kokuzo
俊男 國増
Takeji Shiokawa
武次 塩川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SOUSHIYOU TEC KK
Original Assignee
SOUSHIYOU TEC KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SOUSHIYOU TEC KK filed Critical SOUSHIYOU TEC KK
Priority to JP2002045380A priority Critical patent/JP2003248033A/en
Publication of JP2003248033A publication Critical patent/JP2003248033A/en
Pending legal-status Critical Current

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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To achieve highly reliable pressure contact with electrode pads of an electronic component, by machining a contact head for inspecting the electronic component into a single part structure, highly accurately setting the relative location of a second support block to a first support block in the contact head, i.e., the relative locations of pressure contact ends, and soundly and elastically inclining the support blocks for carrying the pressure contact ends. <P>SOLUTION: The contact head for inspecting the electronic components is provided with the first support block 1 arranged above, the second support block 2 arranged below, and a large number of the pressure contact ends 4 arranged at the front end of the second support block 2. The lower surface of the first support block 1 and the upper surface of the second support block 2 are connected to each other by a sprung hinge 12 metal-worked, integrally with both blocks 1 and 2. The second support block 2 is elastically and vertically inclined with the pressure contact ends 4 in side-to-side directions or forward and backward directions via the sprung hinge 12, to obtain appropriate parallel pressure contact with an electrode pad 6 of the electronic component 5. <P>COPYRIGHT: (C)2003,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は液晶ディスプレイパ
ネル、プラズマディスプレイパネル、有機ELディスプ
レイパネル等のディスプレイパネルの検査に用いる接触
ヘッド、又はICパッケージ、ICウエハ、IC搭載基
板等の検査に用いる接触ヘッドに係り、殊にこれら電子
部品検査用接触ヘッドにおける傾き調整機構に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a contact head used for inspecting a display panel such as a liquid crystal display panel, a plasma display panel and an organic EL display panel, or a contact head used for inspecting an IC package, an IC wafer, an IC mounting substrate and the like. In particular, the present invention relates to a tilt adjusting mechanism in these contact heads for inspecting electronic parts.

【0002】[0002]

【従来の技術】図1,図2A,Bに示すように、従来の
電子部品検査用接触ヘッドは上位に配した第1支持ブロ
ック1と下位に配した第2支持ブロック2間にゴム等か
ら成る弾性シート材3を介在し、該弾性シート材3を圧
縮弾性変形させながら第2支持ブロック2を左右方向又
は前後方向において上下に弾性傾動させ、よって第2支
持ブロック2の前端に配した多数の加圧接触端4を弾性
傾動せしめる構成等を採っている。
2. Description of the Related Art As shown in FIGS. 1, 2A and 2B, a conventional contact head for inspecting electronic parts is made of rubber or the like between a first supporting block 1 arranged at a higher position and a second supporting block 2 arranged at a lower position. A plurality of elastic sheet members 3 arranged at the front end of the second supporting block 2 by elastically tilting the second supporting block 2 vertically in the left-right direction or the front-back direction while interposing an elastic sheet member The pressure contact end 4 is elastically tilted.

【0003】上記弾性シート材3は図1に破線で示すよ
うに、第2支持ブロック2の下面に埋め込んで加圧接触
端4をバックアップする例も既知である。
An example in which the elastic sheet material 3 is embedded in the lower surface of the second support block 2 to back up the pressure contact end 4 is also known, as shown by the broken line in FIG.

【0004】図2A,Bに示すように、上記電子部品検
査用接触ヘッドはディスプレイパネル等の電子部品5の
端部に左右方向へ単列に列設された多数の電極パッド6
に対する左右方向の傾きα1を、上記弾性傾動により自
己調動しつつ是正し、平行に加圧接触するようにしてい
る。
As shown in FIGS. 2A and 2B, the contact head for inspecting electronic parts has a large number of electrode pads 6 arranged in a single row in the left-right direction at the end of an electronic part 5 such as a display panel.
The inclination α1 in the left-right direction with respect to is corrected while being self-adjusted by the elastic tilt, and pressure contact is made in parallel.

【0005】又は図3に示すように、上記左右方向に列
設した電極パッド6を前後方向に複列に並列した場合に
おける上記電極パッド6に対する前後方向の傾きα2
を、上記弾性傾動により自己調動しつつ是正し、平行に
加圧接触するようにしている。上記接触端にはバンプ7
を設け、該バンプ7によって上記加圧接触を得ている。
Alternatively, as shown in FIG. 3, when the electrode pads 6 arranged in the left-right direction are arranged in a plurality of rows in the front-rear direction, the inclination α2 in the front-rear direction with respect to the electrode pads 6
Is corrected by self-adjusting by the elastic tilting, and pressure contact is made in parallel. Bump 7 on the contact edge
And the bump 7 obtains the above-mentioned pressure contact.

【0006】[0006]

【発明が解決しようとする課題】然しながら上記ゴム等
から成る弾性シート材は繰り返し使用により弾性劣化を
生じ易く、又同シート材は加圧接触時の圧力に対し端部
では弾性圧縮変形し易いが、中央部に向かう部分では弾
性圧縮変形し難い欠点を有し、電子部品の電極パッドに
追随した加圧接触端の均一な弾性傾動が得られない問題
点を有している。
However, the elastic sheet material made of rubber or the like is liable to be elastically deteriorated by repeated use, and the sheet material is easily elastically compressed and deformed at the end portion against the pressure at the time of pressure contact. In addition, there is a drawback that elastic compression deformation is less likely to occur in the portion toward the central portion, and there is a problem that uniform elastic tilting of the pressure contact end following the electrode pad of the electronic component cannot be obtained.

【0007】[0007]

【課題を解決するための手段】本発明は上記第1支持ブ
ロックの下面と第2支持ブロックの上面間を両ブロック
と一体金属加工したバネヒンジにて連結し、該第2支持
ブロックが上記バネヒンジを介して左右方向又は前後方
向において上下に弾性傾動し、これに追随し第2支持ブ
ロックの前端に配した加圧接触端が同方向において弾性
傾動する構成としたものである。
According to the present invention, the lower surface of the first support block and the upper surface of the second support block are connected by a spring hinge integrally machined to both blocks, and the second support block connects the spring hinge. It is configured so that it elastically tilts up and down in the left-right direction or the front-back direction, and the pressure contact end arranged at the front end of the second support block elastically tilts in the same direction.

【0008】よって上記第1,第2支持ブロックとバネ
ヒンジの三者を単部品構造に加工し、第1支持ブロック
に対する第2支持ブロックの相対位置、即ち加圧接触端
の同相対位置を高精度に設定する。
Therefore, the three parts of the first and second support blocks and the spring hinge are processed into a single-piece structure, and the relative position of the second support block with respect to the first support block, that is, the same relative position of the pressure contact end is highly accurate. Set to.

【0009】そしてこのバネヒンジは上記弾性シート材
における弾性瑕疵の問題を解消し、加圧接触端を担持す
る第2支持ブロックを健全に弾性傾動せしめ、上記電子
部品の電極パッドとの高信頼の加圧接触が得られるよう
にしたものである。
The spring hinge solves the problem of elastic flaws in the elastic sheet material and causes the second support block carrying the pressure contact end to elastically tilt, thereby providing a highly reliable connection with the electrode pad of the electronic component. A pressure contact is obtained.

【0010】上記バネヒンジはC形板バネヒンジにして
上記第1,第2支持ブロックと一体金属加工する。
The spring hinge is a C-shaped leaf spring hinge and is integrally metal-worked with the first and second support blocks.

【0011】又は上記バネヒンジはI形板バネヒンジに
して上記第1,第2支持ブロックと一体金属加工する。
Alternatively, the spring hinge is an I-shaped plate spring hinge and is integrally metal worked with the first and second support blocks.

【0012】又上記第1支持ブロックの下面と第2支持
ブロックの上面間を上記の通り一体金属加工したC形の
板バネヒンジにて連結するか、又は別部品にて構成した
C形板バネヒンジ、又は別部品にて構成したC形線材バ
ネヒンジにて連結し、該第2支持ブロックが上記C形バ
ネヒンジを介して左右方向又は前後方向において同第2
支持ブロックの前端に配した加圧接触端と共に上下に弾
性傾動する構成にする。
Further, the lower surface of the first support block and the upper surface of the second support block are connected by a C-shaped leaf spring hinge integrally machined as described above, or a C-shaped leaf spring hinge formed as a separate component, Alternatively, the second support block is connected by a C-shaped wire spring hinge formed of a separate component, and the second support block is connected to the second side in the left-right direction or the front-back direction via the C-shaped spring hinge.
The support block is configured to elastically tilt up and down together with the pressure contact end arranged at the front end.

【0013】又は上記第1支持ブロックの下面と第2支
持ブロックの上面間を上記の通り一体金属加工したI形
の板バネヒンジにて連結するか、又は別部品にて構成し
たI形板バネヒンジ、又は別部品にて構成したI形線材
バネヒンジにて連結し、該第2支持ブロックが上記I形
バネヒンジを介して左右方向又は前後方向において同第
2支持ブロックの前端に配した加圧接触端と共に上下に
弾性傾動する構成にする。
Alternatively, the lower surface of the first support block and the upper surface of the second support block are connected by an I-shaped leaf spring hinge integrally machined as described above, or an I-shaped leaf spring hinge formed by a separate component. Alternatively, the second support block is connected by an I-shaped wire spring hinge formed of a separate component, and the second support block is provided with a pressure contact end arranged at the front end of the second support block in the left-right direction or the front-back direction via the I-shaped spring hinge. It is configured to elastically tilt up and down.

【0014】よって上記第1,第2支持ブロックと板バ
ネヒンジの三者を別部品構造にしつつ、上記弾性シート
材における弾性瑕疵の問題を解消し、加圧接触端を担持
する第2支持ブロックを健全に弾性傾動せしめ、上記電
子部品の電極パッドとの高信頼の接触が得られるように
したものである。
Therefore, while the three components of the first and second support blocks and the leaf spring hinge are formed as separate parts, the problem of elastic defects in the elastic sheet material is solved and a second support block carrying a pressure contact end is provided. The elastic tilting is carried out soundly so that reliable contact with the electrode pad of the electronic component can be obtained.

【0015】[0015]

【発明の実施の形態】以下本発明の複数の実施形態を図
4乃至図17に基づいて説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A plurality of embodiments of the present invention will be described below with reference to FIGS.

【0016】電子部品検査用接触ヘッドは上位に配した
金属製方形基板から成る第1支持ブロック1と、下位に
配した金属製方形基板から成る第2支持ブロック2を備
える。
The contact head for inspecting electronic parts comprises a first supporting block 1 made of a metallic rectangular substrate arranged in an upper layer and a second supporting block 2 made of a metallic rectangular substrate arranged in a lower layer.

【0017】上記第1支持ブロック1は電子部品検査用
接触ヘッド全体をステージと呼ばれる取り付けフレーム
8に取り付け支持する手段であり、又第2支持ブロック
2は図17に示すプローブ基板9を支持する手段であ
る。
The first support block 1 is means for mounting and supporting the entire contact head for inspecting electronic parts on a mounting frame 8 called a stage, and the second support block 2 is means for supporting the probe substrate 9 shown in FIG. Is.

【0018】上記プローブ基板9は絶縁フィルム又は絶
縁プレートから成る絶縁基板10の表面に密着し並列し
て延在する多数のリード11を有し、該絶縁基板10の
一辺に沿い配置された該リード11の一端を加圧接触端
4としている。この加圧接触端4には加圧接触用バンプ
7を設ける。
The probe substrate 9 has a large number of leads 11 which are in close contact with the surface of an insulating substrate 10 made of an insulating film or an insulating plate and extend in parallel. The leads 11 are arranged along one side of the insulating substrate 10. One end of 11 is the pressure contact end 4. A bump 7 for pressure contact is provided on the pressure contact end 4.

【0019】上記プローブ基板9を第2支持ブロック2
の下面に貼り付け、上記加圧接触端4をこの第2支持ブ
ロック2の前端に配置し、電子部品5の電極パッド6と
の加圧接触に供する。
The probe substrate 9 is attached to the second support block 2
The pressure contact end 4 is placed on the front end of the second support block 2 for pressure contact with the electrode pad 6 of the electronic component 5.

【0020】上記電子部品5は液晶ディスプレイパネ
ル、プラズマディスプレイパネル、有機ELディスプレ
イパネル等のディスプレイパネルであり、又はICパッ
ケージ、ICウエハ、IC搭載基板等である。
The electronic component 5 is a display panel such as a liquid crystal display panel, a plasma display panel, an organic EL display panel, or an IC package, an IC wafer, an IC mounting substrate or the like.

【0021】図4乃至図9に示すように、上記第1支持
ブロック1の下面と第2支持ブロック2の上面間を両ブ
ロック1,2と一体金属加工したC形の板バネ構造を有
するバネヒンジ12にて連結する。図7に示すように、
該C形板バネヒンジ12の上端は第1支持ブロック1と
母材連結し、同下端は第2支持ブロック2と母材連結し
ている。
As shown in FIGS. 4 to 9, a spring hinge having a C-shaped leaf spring structure in which the blocks 1 and 2 are integrally metal-worked between the lower surface of the first support block 1 and the upper surface of the second support block 2. Connect at 12. As shown in FIG.
The upper end of the C-shaped leaf spring hinge 12 is connected to the first support block 1 as a base material, and the lower end thereof is connected to the second support block 2 as a base material.

【0022】例えば図7に示すように、一個の金属ブロ
ックAにワイヤーカット放電加工等の放電加工、又は電
子ビーム加工を施して不要金属部A′を溶去し、上記第
1,第2支持ブロック1,2とC形板バネヒンジ12を
一体金属加工する。従ってこの電子部品検査用接触ヘッ
ドは単部品構造であり、溶接や圧入等の継手構造を伴わ
ない。
For example, as shown in FIG. 7, one metal block A is subjected to electric discharge machining such as wire cut electric discharge machining or electron beam machining to dissolve away the unnecessary metal portion A ', and the first and second supports are formed. The blocks 1 and 2 and the C-shaped leaf spring hinge 12 are integrally metal-worked. Therefore, the contact head for inspecting electronic components has a single component structure and does not involve a joint structure such as welding or press fitting.

【0023】上記三者1,2,12を一体金属加工した
電子部品検査用接触ヘッドは第1支持ブロック1に対す
る第2支持ブロック2の相対位置、即ち加圧接触端4の
同相対位置が高精度に定まる。
In the contact head for inspecting electronic parts in which the three members 1, 2 and 12 are integrally metal-worked, the relative position of the second support block 2 to the first support block 1, that is, the same relative position of the pressure contact end 4 is high. Determined by accuracy.

【0024】上記C形板バネヒンジ12は図4,図5や
図6に示すように、左右対称に配置し、同C形板バネヒ
ンジ12の凸曲面が左右外側方向へ向くように配向す
る。具体例として両ブロック1,2間の前端側に一対の
C形板バネヒンジ12を左右対称に配置すると共に、両
ブロック1,2間の後端側に一対のC形板バネヒンジ1
2を左右対称に配置する。
As shown in FIGS. 4, 5 and 6, the C-shaped leaf spring hinges 12 are symmetrically arranged, and the convex curved surfaces of the C-shaped leaf spring hinges 12 are oriented so as to face outward in the left and right directions. As a specific example, a pair of C-shaped leaf spring hinges 12 are symmetrically arranged on the front end side between both blocks 1 and 2, and a pair of C-shaped leaf spring hinges 1 are arranged on the rear end side between both blocks 1 and 2.
2 are arranged symmetrically.

【0025】上記第2支持ブロック2は上記C形板バネ
ヒンジ12を撓ませつつ左右方向又は/及び前後方向に
おいて健全に上下に弾性傾動し、これに追随し第2支持
ブロック2の前端に配した加圧接触端4が同方向におい
て上下に弾性傾動する。
The second support block 2 is elastically tilted vertically in the left-right direction and / or the front-back direction while flexing the C-shaped leaf spring hinge 12, and is arranged at the front end of the second support block 2 following this. The pressure contact end 4 elastically tilts vertically in the same direction.

【0026】よって図8Aの加圧接触前の状態と、図8
Bの加圧接触後の状態に示すように、上記電子部品検査
用接触ヘッドはディスプレイパネル等の電子部品5の端
部に左右方向へ単列に列設された多数の電極パッド6に
対する左右方向の傾きα1や間隙を上記弾性傾動により
自己調動しつつ是正し、同電極パッド6に平行に加圧接
触する。
Therefore, the state before the pressure contact of FIG. 8A and the state of FIG.
As shown in the state B after the pressure contact, the contact head for inspecting electronic parts is arranged in the left-right direction with respect to a large number of electrode pads 6 arranged in a single row in the left-right direction at the end of the electronic part 5 such as a display panel. The inclination .alpha.1 and the gap are corrected by self-adjusting by the elastic tilt, and pressure contact is made in parallel with the electrode pad 6.

【0027】又は図3に示すような上記左右方向に列設
した電極パッド6を前後方向に複列に並列した場合に
は、上記電極パッド6に対する前後方向の傾きα2や間
隙を上記第2支持ブロック2が上記一体金属加工したC
形板バネヒンジ12を撓ませつつ前後方向において上下
に弾性傾動し、即ち自己調動しつつ上記傾きや間隙を是
正し、平行に加圧接触する。
Alternatively, when the electrode pads 6 arranged in the left-right direction as shown in FIG. 3 are juxtaposed in a plurality of rows in the front-rear direction, the inclination α2 in the front-rear direction with respect to the electrode pad 6 and the gap are supported by the second support. Block 2 is the above-mentioned integrated metal processed C
While flexing the leaf spring hinge 12, the plate spring hinge 12 is elastically tilted up and down in the front-rear direction, that is, the tilt and gap are corrected while self-adjusting, and pressure contact is made in parallel.

【0028】図4,図5,図9に示すように、上記電子
部品検査用接触ヘッドは第1支持ブロック1の後端側に
設けた取り付け孔13を以って取り付けフレーム8に取
り付けボルト14等により取り付け固装する。図8に示
すように、電子部品検査用接触ヘッドは取り付けフレー
ム8に複数並設する。
As shown in FIGS. 4, 5 and 9, the contact head for inspecting electronic parts has mounting bolts 14 mounted on the mounting frame 8 with mounting holes 13 provided on the rear end side of the first support block 1. Etc. and fix it. As shown in FIG. 8, a plurality of contact heads for inspecting electronic parts are arranged side by side on the mounting frame 8.

【0029】又第1支持ブロック1の後端中央部に先当
てボルト15を上面から下面へ向け螺合貫挿し、該先当
てボルト15の先端を該先端に設けたボール16を以っ
て第2支持ブロック2の後端中央部上面に当接する。
The front support bolt 15 is screwed and inserted from the upper surface to the lower surface at the center of the rear end of the first support block 1, and the tip of the front support bolt 15 is provided with a ball 16 provided at the front end. 2 Abut on the upper surface of the central portion of the rear end of the support block 2.

【0030】又第1支持ブロック1の後端中央部の上面
側から下面側へ有頭ボルト17を緩貫挿すると共に、該
有頭ボルト17の螺軸先端を第2支持ブロック2の上面
側から下面側へ螺合し、該有頭ボルト17の頭部18を
第1支持ブロック1の上面側に開口せる凹所内底面に座
着せしめる。
Further, the headed bolt 17 is slowly inserted from the upper surface side to the lower surface side of the central portion of the rear end of the first support block 1, and the screw shaft tip of the headed bolt 17 is placed on the upper surface side of the second support block 2. To the lower surface side, and the head portion 18 of the headed bolt 17 is seated on the inner bottom surface of the recess opening to the upper surface side of the first support block 1.

【0031】よって図9Aに示すように、先当てボルト
15を一方向に回動することにより螺進して上記C形板
バネヒンジ12を左右方向において圧縮弾性変形させつ
つ第2支持ブロック2の後端を下方へ変位すると共に、
同ブロック2の前端を上方へ変位せしめる。即ち前上が
り傾斜状態を形成する。この時有頭ボルト17は螺退状
態にして先当てボルト15による傾き調整と干渉しない
ようにしておき、傾き調整後、螺進して頭部18を座着
せしめる。
Therefore, as shown in FIG. 9A, the front support bolt 15 is rotated in one direction to be screwed to cause the C-shaped leaf spring hinge 12 to compress and elastically deform in the left-right direction, and the rear of the second support block 2 While displacing the end downward,
The front end of the block 2 is displaced upward. That is, the front rising slope state is formed. At this time, the headed bolt 17 is set in a retracted state so as not to interfere with the tilt adjustment by the front contact bolt 15, and after the tilt adjustment, the head 18 is seated by being screwed.

【0032】又図9Bに示すように、有頭ボルト17を
一方向に回動することにより螺進して上記C形板バネヒ
ンジ12を前後方向において圧縮弾性変形させつつ第2
支持ブロック2の後端を上方へ変位すると共に、同ブロ
ック2の前端を下方へ変位せしめる。即ち前下がり傾斜
状態を形成する。この時先当てボルト15は螺退状態に
して有頭ボルト17による傾き調整と干渉しないように
しておき、傾き調整後、螺進して先端を突き当て状態に
する。
Further, as shown in FIG. 9B, the headed bolt 17 is rotated in one direction to be screwed to cause the C-shaped leaf spring hinge 12 to compress and elastically deform in the front-rear direction.
The rear end of the support block 2 is displaced upward, and the front end of the block 2 is displaced downward. That is, the front downward slope state is formed. At this time, the abutment bolt 15 is screwed back so as not to interfere with the inclination adjustment by the headed bolt 17, and after the inclination adjustment, the tip is abutted by screwing.

【0033】上記取り付けフレーム8には有頭ボルト1
7と先当てボルト15の上端と対向する位置に操作孔1
9を設けておき、電子部品検査用接触ヘッドを取り付け
フレーム8に取り付けた状態で、該操作孔19を通して
工具による両ボルト15,17の回動操作を行う。
A headed bolt 1 is attached to the mounting frame 8.
7 and the operating hole 1 at a position facing the upper end of the head bolt 15
9 is provided, and while the electronic component inspection contact head is attached to the attachment frame 8, both bolts 15 and 17 are rotated by a tool through the operation hole 19.

【0034】上記傾き調整は上記例示の他、単一のボル
トの螺進又は螺退にて前後方向における傾き調整を行う
ことができ、この傾き調整ボルトによる傾き調整は主と
して隣接する電子部品検査用接触ヘッド間におけるプリ
アライメントに用いる。
In addition to the above example, the tilt adjustment can be performed in the front-rear direction by screwing or retreating a single bolt. The tilt adjustment by the tilt adjusting bolt is mainly for the inspection of adjacent electronic parts. Used for pre-alignment between contact heads.

【0035】次に図10乃至図13に基づき上記バネヒ
ンジ12をI形板バネヒンジ12とした実施形態につい
て説明する。
Next, an embodiment in which the spring hinge 12 is an I-shaped leaf spring hinge 12 will be described with reference to FIGS. 10 to 13.

【0036】図10乃至図13に示すように、上記第1
支持ブロック1の下面と第2支持ブロック2の上面間を
両ブロック1,2と一体金属加工したI形の板バネ構造
を有するバネヒンジ12にて連結する。図11Bに示す
ように、該I形板バネヒンジ12の上端は第1支持ブロ
ック1と母材連結し、同下端は第2支持ブロック2と母
材連結している。
As shown in FIGS. 10 to 13, the first
The lower surface of the support block 1 and the upper surface of the second support block 2 are connected to the blocks 1 and 2 by a spring hinge 12 having an I-shaped leaf spring structure integrally machined. As shown in FIG. 11B, the upper end of the I-shaped leaf spring hinge 12 is connected to the first support block 1 as a base material, and the lower end thereof is connected to the second support block 2 as a base material.

【0037】例えば図11Bに示すように前記図7にお
いて説明したと同様、一個の金属ブロックAにワイヤー
カット放電加工等の放電加工、又は電子ビーム加工を施
して不要金属部A′を溶去し、上記第1,第2支持ブロ
ック1,2とI形板バネヒンジ12を一体金属加工す
る。従ってこの電子部品検査用接触ヘッドは単部品構造
であり、溶接や圧入等の継手構造を伴わない。
For example, as shown in FIG. 11B, in the same manner as described with reference to FIG. 7, one metal block A is subjected to electric discharge machining such as wire cut electric discharge machining or electron beam machining to remove the unnecessary metal portion A '. The first and second support blocks 1 and 2 and the I-shaped leaf spring hinge 12 are integrally metal-worked. Therefore, the contact head for inspecting electronic components has a single component structure and does not involve a joint structure such as welding or press fitting.

【0038】上記三者1,2,12を一体金属加工した
電子部品検査用接触ヘッドは第1支持ブロック1に対す
る第2支持ブロック2の相対位置、即ち加圧接触端4の
同相対位置が高精度に定まる。
In the contact head for inspecting electronic parts in which the above three members 1, 2 and 12 are integrally metal-worked, the relative position of the second support block 2 to the first support block 1, that is, the relative position of the pressure contact end 4 is high. Determined by accuracy.

【0039】上記I形板バネヒンジ12は具体例として
図10や図11に示すように、第1,第2支持ブロック
1,2の前後方向の中心線上に配置し、同I形板バネヒ
ンジ12の板面が左右方向へ向くように配向する。更に
具体例として図11A,Cに示すように、上記両ブロッ
ク1,2間の前端側と後端側の上記中心線上に一対のI
形板バネヒンジ12を配置する。
As a concrete example, the I-shaped leaf spring hinge 12 is arranged on the center line in the front-rear direction of the first and second support blocks 1 and 2 as shown in FIGS. Orient the board so that it faces in the left-right direction. As a more specific example, as shown in FIGS. 11A and 11C, a pair of I's are provided on the center line on the front end side and the rear end side between the blocks 1 and 2.
A leaf spring hinge 12 is arranged.

【0040】上記第2支持ブロック2は上記I形板バネ
ヒンジ12を撓ませつつ左右方向において健全に上下に
弾性傾動し、これに追随し第2支持ブロック2の前端に
配した加圧接触端4が同方向において上下に弾性傾動す
る。
The second support block 2 flexibly bends the I-shaped leaf spring hinge 12 and elastically tilts vertically in the left-right direction, and following this, the pressure contact end 4 arranged at the front end of the second support block 2. Elastically tilts up and down in the same direction.

【0041】よって図8Aの加圧接触前の状態と、図8
Bの加圧接触後の状態に示すように、上記電子部品検査
用接触ヘッドはディスプレイパネル等の電子部品5の端
部に左右方向へ単列に列設された多数の電極パッド6に
対する左右方向の傾きα1や間隙を上記弾性傾動により
自己調動しつつ是正し、同電極パッド6に平行に加圧接
触する。
Therefore, the state before pressure contact of FIG. 8A and the state of FIG.
As shown in the state B after the pressure contact, the contact head for inspecting electronic parts is arranged in the left-right direction with respect to a large number of electrode pads 6 arranged in a single row in the left-right direction at the end of the electronic part 5 such as a display panel. The inclination .alpha.1 and the gap are corrected by self-adjusting by the elastic tilt, and pressure contact is made in parallel with the electrode pad 6.

【0042】又は図12に示すように、第1,第2支持
ブロック1,2間の前端側中心線上に単一のI形板バネ
ヒンジ12を設けて第2支持ブロック2の前後方向にお
ける上下の弾性傾動が可能な構造にする。
Alternatively, as shown in FIG. 12, a single I-shaped leaf spring hinge 12 is provided on the center line of the front end side between the first and second support blocks 1 and 2 so that the second support block 2 can be moved vertically. Make the structure capable of elastic tilting.

【0043】即ち図3に示すような上記左右方向に列設
した電極パッド6を前後方向に複列に並列した場合に
は、上記電極パッド6に対する前後方向の傾きα2や間
隙を上記第2支持ブロック2が上記一体金属加工したI
形板バネヒンジ12を撓ませつつ前後方向において上下
に弾性傾動し、即ち自己調動しつつ上記傾きや間隙を是
正し、平行に加圧接触する。
That is, when the electrode pads 6 arranged in the left-right direction as shown in FIG. 3 are arranged in a plurality of rows in the front-rear direction, the inclination α2 in the front-rear direction with respect to the electrode pad 6 and the gap are supported by the second support. Block 2 is the above-mentioned integrated metal processing I
While flexing the leaf spring hinge 12, the plate spring hinge 12 is elastically tilted up and down in the front-rear direction, that is, the tilt and gap are corrected while self-adjusting, and pressure contact is made in parallel.

【0044】又図13A,Bに示すように、第1支持ブ
ロック1の後端中央部に先当てボルト15を上面から下
面へ向け螺合貫挿し、該先当てボルト15の先端を該先
端に設けたボール16を以って第2支持ブロック2の後
端中央部上面に当接する。
Further, as shown in FIGS. 13A and 13B, a leading bolt 15 is screwed through the central portion of the rear end of the first support block 1 from the upper surface to the lower surface, and the tip of the leading bolt 15 is fitted to the tip. The balls 16 provided are brought into contact with the upper surface of the central portion of the rear end of the second support block 2.

【0045】又第1支持ブロック1の後端中央部の上面
側から下面側へ有頭ボルト17を緩貫挿すると共に、該
有頭ボルト17の螺軸先端を第2支持ブロック2の上面
側から下面側へ螺合し、該有頭ボルト17の頭部18を
第1支持ブロック1の上面側に開口せる凹所内底面に座
着せしめる。
Further, the headed bolt 17 is slowly inserted from the upper surface side to the lower surface side of the central portion of the rear end of the first support block 1, and the screw shaft tip of the headed bolt 17 is placed on the upper surface side of the second support block 2. To the lower surface side, and the head portion 18 of the headed bolt 17 is seated on the inner bottom surface of the recess opening to the upper surface side of the first support block 1.

【0046】よって図13Aに示すように、先当てボル
ト15を一方向に回動することにより螺進して上記I形
板バネヒンジ12を左右方向へ圧縮弾性変形させつつ第
2支持ブロック2の後端を下方へ変位すると共に、同ブ
ロック2の前端を上方へ変位せしめる。即ち前上がり傾
斜状態を形成する。この時有頭ボルト17は螺退状態に
して先当てボルト15による傾き調整と干渉しないよう
にしておき、傾き調整後、螺進して頭部18を座着せし
める。
Therefore, as shown in FIG. 13A, the front support bolt 15 is rotated in one direction so as to be screwed to cause the I-shaped leaf spring hinge 12 to compress and elastically deform in the left-right direction, and the rear of the second support block 2 The end is displaced downward and the front end of the block 2 is displaced upward. That is, the front rising slope state is formed. At this time, the headed bolt 17 is set in a retracted state so as not to interfere with the tilt adjustment by the front contact bolt 15, and after the tilt adjustment, the head 18 is seated by being screwed.

【0047】又図13Bに示すように、有頭ボルト17
を一方向に回動することにより螺進して上記I形板バネ
ヒンジ12を前後方向へ圧縮弾性変形させつつ第2支持
ブロック2の後端を上方へ変位すると共に、同ブロック
2の前端を下方へ変位せしめる。即ち前下がり傾斜状態
を形成する。この時先当てボルト15は螺退状態にして
有頭ボルト17による傾き調整と干渉しないようにして
おき、傾き調整後、螺進して先端を突き当て状態にす
る。
As shown in FIG. 13B, the headed bolt 17
Is rotated in one direction to move the rear end of the second support block 2 upward while compressing and elastically deforming the I-shaped leaf spring hinge 12 in the front-back direction, and lowering the front end of the block 2 downward. Shift to. That is, the front downward slope state is formed. At this time, the abutment bolt 15 is screwed back so as not to interfere with the inclination adjustment by the headed bolt 17, and after the inclination adjustment, the tip is abutted by screwing.

【0048】第2支持ブロック2を図13に示すように
前後方向において傾動させる場合、第1,第2支持ブロ
ック1,2間の前端側中心線上に単一のI形板バネヒン
ジ12を設けて第2支持ブロック2の前後方向における
弾性傾動が可能な構造にすると共に、第1,第2支持ブ
ロック1,2間の後端側に前記C形板バネヒンジ12を
左右対称に設けてその凸曲面を左右外側方向又は左右内
側方向へ向けて配向し、該C形板バネヒンジ12が上記
I形板バネヒンジ12と協働して第2支持ブロック2の
前後方向における弾性傾動が可能な構造にすることがで
きる。
When the second support block 2 is tilted in the front-back direction as shown in FIG. 13, a single I-shaped leaf spring hinge 12 is provided on the center line of the front end side between the first and second support blocks 1 and 2. The second support block 2 has a structure capable of elastic tilting in the front-rear direction, and the C-shaped leaf spring hinge 12 is symmetrically provided on the rear end side between the first and second support blocks 1 and 2 to form a convex curved surface thereof. Are orientated in the left-right outward direction or the left-right inward direction, and the C-shaped leaf spring hinge 12 cooperates with the I-shaped leaf spring hinge 12 so that the second support block 2 can be elastically tilted in the front-rear direction. You can

【0049】次に上記バネヒンジ12を別部品にて形成
したI形板バネヒンジ12にて第1,第2支持ブロック
1,2を連結した実施形態を図14に基づいて説明す
る。
Next, an embodiment in which the first and second support blocks 1 and 2 are connected by the I-shaped plate spring hinge 12 in which the spring hinge 12 is formed as a separate component will be described with reference to FIG.

【0050】図14A,Bに示すように、上記第1支持
ブロック1の下面と第2支持ブロック2の上面間を、別
部品にて構成した金属製のI形板バネヒンジ12にて連
結する。
As shown in FIGS. 14A and 14B, the lower surface of the first support block 1 and the upper surface of the second support block 2 are connected by a metal I-shaped leaf spring hinge 12 which is a separate component.

【0051】上記I形板バネヒンジ12はバネ鋼等にて
形成した平板バネであり、その上端を第1支持ブロック
1に圧入又は溶接又は接着材等にて結合し、その下端を
第2支持ブロック2に圧入又は溶接又は接着材を単独又
は併用して結合し、その板面を左右方向に向けて配向す
る。よって第2支持ブロック2の左右方向における上下
の弾性傾動を上記I形板バネヒンジ12を介して惹起せ
しめる。
The I-shaped leaf spring hinge 12 is a flat spring formed of spring steel or the like, and the upper end thereof is press-fitted or welded to the first support block 1 or joined by an adhesive or the like, and the lower end thereof is the second support block. Press-fitting, welding, or an adhesive material is used alone or in combination with 2, and the plate surface is oriented in the left-right direction. Therefore, vertical elastic tilting of the second support block 2 in the left-right direction is induced via the I-shaped leaf spring hinge 12.

【0052】図14に示す実施形態は、図10乃至図1
3に示した一体金属加工せるI形板バネヒンジ12を上
記別部品にて構成したものであり、一体金属加工した構
成を除けばその配置等に関する説明は、この図14に示
す実施形態についても同様である。
The embodiment shown in FIG. 14 is shown in FIGS.
The I-shaped leaf spring hinge 12 for integral metal working shown in FIG. 3 is constituted by the above-mentioned separate parts, and the description regarding the arrangement and the like is the same for the embodiment shown in FIG. 14 except for the configuration for integral metal working. Is.

【0053】又図14Aに示すように、上記別部品にて
構成したI形板バネヒンジ12を第1,第2支持ブロッ
ク1,2間の前端側の中心線上に配し、同後端側の中心
線上に前記図13に基づいて説明した先当てボルト15
と有頭ボルト17を設け、同図13に基づいて説明した
通りの操作を行って前後方向の傾き調整を行う。
Further, as shown in FIG. 14A, the I-shaped leaf spring hinge 12 constituted by the above-mentioned separate parts is arranged on the center line of the front end side between the first and second support blocks 1 and 2, and the rear end side of the same is arranged. The tip bolt 15 described based on FIG. 13 on the center line
And a headed bolt 17 are provided, and an operation as described with reference to FIG. 13 is performed to adjust the tilt in the front-rear direction.

【0054】上記先当てボルト15と有頭ボルト17は
傾き調整ボルトを構成しており、例えば両ボルト15,
17を併用せずに図14Aに示すように、第1,第2支
持ブロック1,2の後端側の中心線上に傾き調整ボルト
17′を設けてその螺進又は螺退により前記前後方向の
傾き調整を行う。これは図9と図13においても同様で
ある。
The tip bolt 15 and the headed bolt 17 constitute a tilt adjusting bolt. For example, both bolts 15,
As shown in FIG. 14A without using 17 together, an inclination adjusting bolt 17 ′ is provided on the center line on the rear end side of the first and second support blocks 1 and 2, and the forward or backward direction of the tilt adjusting bolt 17 ′ is set by the screwing or screwing. Adjust the tilt. This is the same in FIGS. 9 and 13.

【0055】次に上記バネヒンジ12を別部品にて形成
したC形板バネヒンジ12又はC形線材バネヒンジ12
にて第1,第2支持ブロック1,2を連結した実施形態
を図15A,B,Cに基づいて説明する。
Next, a C-shaped plate spring hinge 12 or a C-shaped wire spring hinge 12 in which the spring hinge 12 is formed as a separate component.
An embodiment in which the first and second support blocks 1 and 2 are connected will be described with reference to FIGS. 15A, 15B and 15C.

【0056】図15A,B,Cに示すように、バネ鋼か
ら成る金属製の線材をC形に曲げ加工したC形線材バネ
ヒンジ12を別部品にて構成し、上記第1支持ブロック
1の下面と第2支持ブロック2の上面間を該C形線材バ
ネヒンジ12にて連結する。
As shown in FIGS. 15A, 15B and 15C, a C-shaped wire spring hinge 12 formed by bending a metal wire made of spring steel into a C shape is formed as a separate component, and the lower surface of the first support block 1 is formed. And the upper surface of the second support block 2 are connected by the C-shaped wire spring hinge 12.

【0057】上記C形線材バネヒンジ12は図15Cに
示すように、その上端を第1支持ブロック1に圧入又は
溶接又は接着材等を単独又は併用して結合し、その下端
を第2支持ブロック2に圧入又は溶接又は接着材等を単
独又は併用して結合し、その凸曲面を左右外側方向又は
左右内側方向に向けて配向する。よって第2支持ブロッ
ク2の左右方向における弾性傾動を上記C形線材バネヒ
ンジ12を介して惹起せしめる。
As shown in FIG. 15C, the upper end of the C-shaped wire spring hinge 12 is press-fitted or welded to or bonded to the first support block 1 alone or in combination, and the lower end thereof is connected to the second support block 2. Press-fitting, welding, or an adhesive or the like is used alone or in combination, and the convex curved surfaces thereof are oriented in the left-right outer direction or the left-right inner direction. Therefore, the elastic tilting of the second support block 2 in the left-right direction is caused via the C-shaped wire spring hinge 12.

【0058】図15に示す実施形態は、図4乃至図9に
示した一体金属加工せるC形板バネヒンジ12を上記別
部品にて構成したものであり、一体金属加工した構成を
除けばその配置等に関する説明は、この図15に示す実
施形態についても援用できる。
In the embodiment shown in FIG. 15, the C-shaped leaf spring hinge 12 for integral metal working shown in FIGS. 4 to 9 is constituted by the above-mentioned separate parts. The description regarding the above can be applied to the embodiment shown in FIG.

【0059】即ち上記C形線材バネヒンジ12は図15
Bに示すように、左右対称に配置し、同C形線材バネヒ
ンジ12の凸曲面が左右外側方向又は左右内側方向へ向
くように配向する。具体例として上記両ブロック1,2
間の前端側に一対のC形線材バネヒンジ12を左右対称
に配置すると共に、両ブロック1,2間の後端側に一対
のC形線材バネヒンジ12を左右対称に配置する。
That is, the C-shaped wire spring hinge 12 is shown in FIG.
As shown in B, they are arranged symmetrically, and are oriented so that the convex curved surfaces of the C-shaped wire spring hinge 12 are directed to the left and right outside direction or the left and right inside direction. As a specific example, both the blocks 1 and 2
The pair of C-shaped wire spring hinges 12 are symmetrically arranged on the front end side between them, and the pair of C-shaped wire spring hinges 12 are symmetrically arranged on the rear end side between the blocks 1 and 2.

【0060】上記第2支持ブロック2は上記C形線材バ
ネヒンジ12を撓ませつつ左右方向又は/及び前後方向
において健全に上下に弾性傾動し、これに追随し第2支
持ブロック2の前端に配した加圧接触端4が同方向にお
いて弾性傾動する。
The second support block 2 is elastically tilted vertically in the left-right direction and / or the front-back direction while flexing the C-shaped wire spring hinge 12, and is arranged at the front end of the second support block 2 following this. The pressure contact end 4 elastically tilts in the same direction.

【0061】よって図8Aの加圧接触前の状態と、図8
Bの加圧接触後の状態に示すように、上記電子部品検査
用接触ヘッドはディスプレイパネル等の電子部品5の端
部に左右方向へ単列に列設された多数の電極パッド6に
対する左右方向の傾きα1や間隙を上記C形線材バネヒ
ンジ12を介しての弾性傾動により自己調動しつつ是正
し、同電極パッド6に平行に加圧接触する。
Therefore, the state before pressure contact of FIG. 8A and the state of FIG.
As shown in the state B after the pressure contact, the contact head for inspecting electronic parts is arranged in the left-right direction with respect to a large number of electrode pads 6 arranged in a single row in the left-right direction at the end of the electronic part 5 such as a display panel. The inclination α1 and the gap are corrected by the elastic tilting through the C-shaped wire spring hinge 12 while self-adjusting, and pressure contact is made in parallel with the electrode pad 6.

【0062】又は図3に示すような上記左右方向に列設
した電極パッド6を前後方向に複列に並列した場合に
は、上記電極パッド6に対する前後方向の傾きα2や間
隙を上記第2支持ブロック2が上記別部品から成るC形
線材バネヒンジ12を撓ませつつ前後方向に弾性傾動
し、即ち自己調動しつつ上記傾きや間隙を是正し、平行
に加圧接触する。
Alternatively, when the electrode pads 6 arranged in the left-right direction as shown in FIG. 3 are juxtaposed in a plurality of rows in the front-rear direction, the inclination α2 in the front-rear direction with respect to the electrode pad 6 and the gap are used to support the second support. The block 2 elastically tilts in the front-rear direction while bending the C-shaped wire spring hinge 12 which is a separate component, that is, corrects the tilt and the gap while self-adjusting, and makes parallel pressure contact.

【0063】又図9に示すように、第1,第2支持ブロ
ック1,2間を上記別部品にて構成したC形線材バネヒ
ンジ12を介して連結しつつ、同後端側の中心線上に先
当てボルト15と有頭ボルト17を設け、同図9に基づ
いて説明した通りの操作を行って前後方向の傾き調整を
行うことができる。
As shown in FIG. 9, the first and second support blocks 1 and 2 are connected to each other through the C-shaped wire spring hinge 12 formed of the above-mentioned separate parts, and on the center line on the rear end side thereof. It is possible to adjust the inclination in the front-rear direction by providing the head bolt 15 and the headed bolt 17 and performing the operation as described with reference to FIG.

【0064】よって上記第1,第2支持ブロック1,2
と板バネヒンジ12又は線材バネヒンジ12の三者を別
部品構造にしつつ、従来例における弾性シート材3の弾
性瑕疵の問題を解消し、加圧接触端4を担持する第2支
持ブロック2を健全に弾性傾動せしめ、上記電子部品の
電極パッドとの高信頼の接触が得られるようにしたもの
である。
Therefore, the first and second support blocks 1 and 2 are
And the leaf spring hinge 12 or the wire spring hinge 12 are formed as separate parts, the problem of elastic defects of the elastic sheet material 3 in the conventional example is solved, and the second support block 2 carrying the pressure contact end 4 is sounded. By elastically tilting, highly reliable contact with the electrode pad of the electronic component can be obtained.

【0065】次に図16に示すように、上記第2支持ブ
ロック2の前端に先方へ向け接触端支持ブロック20を
一体に延出し、該接触端支持ブロック20と第1支持ブ
ロック1の本体部間を一体金属加工した薄肉の板バネヒ
ンジ21にて連結する。三者20,1,21は溶接やネ
ジ止め等を伴わない一体継手構造である。
Next, as shown in FIG. 16, a contact end support block 20 is integrally extended forward from the front end of the second support block 2, and the contact end support block 20 and the main body of the first support block 1 are integrated. The spaces are connected by a thin leaf spring hinge 21 which is integrally metal-processed. The three members 20, 1 and 21 have an integral joint structure without welding or screwing.

【0066】上記接触端支持ブロック20は上記板バネ
ヒンジ21を撓ませつつ前後方向において上下に傾動
し、又接触端支持ブロック20と第2支持ブロック2の
本体部とが前記C形板バネヒンジ12又はI形板バネヒ
ンジ12を介して左右方向又は前後方向において上下に
傾動する。
The contact end support block 20 tilts up and down in the front-rear direction while bending the leaf spring hinge 21, and the contact end support block 20 and the main body of the second support block 2 are the C-shaped leaf spring hinges 12 or. It tilts vertically in the left-right direction or the front-back direction via the I-shaped leaf spring hinge 12.

【0067】上記図4乃至図16に示す、各実施形態に
おける第2支持ブロック2は単一の金属製基板にて構成
し、該金属製基板の下面に図17に示すプローブ基板9
を添着するか、又は第2支持ブロック2を図示のように
複数枚の金属製基板2a,2bを一体に重合した構造に
し、上部金属製基板2aと第1支持ブロック1間を前記
バネヒンジ12にて連結し、下部金属製基板2bの下面
に図17に示すプローブ基板9を添着する。
The second support block 2 in each of the embodiments shown in FIGS. 4 to 16 is composed of a single metallic substrate, and the probe substrate 9 shown in FIG. 17 is provided on the lower surface of the metallic substrate.
Or the second support block 2 is formed by integrally superposing a plurality of metal substrates 2a and 2b as shown in the figure, and the spring hinge 12 is provided between the upper metal substrate 2a and the first support block 1. Then, the probe substrate 9 shown in FIG. 17 is attached to the lower surface of the lower metal substrate 2b.

【図面の簡単な説明】[Brief description of drawings]

【図1】従来の電子部品検査用接触ヘッドの側面図。FIG. 1 is a side view of a conventional contact head for electronic component inspection.

【図2】Aは上記電子部品検査用接触ヘッドの電子部品
に対する加圧接触前の状態を示す正面図、Bは同加圧接
触後の状態を示す正面図。
FIG. 2A is a front view showing a state of the contact head for inspecting an electronic component before pressure contact with an electronic component, and B is a front view showing a state after the pressure contact.

【図3】電極パッドを前後方向に並列した電子部品に対
する電子部品検査用接触ヘッドの接触状態を説明する断
面図。
FIG. 3 is a cross-sectional view illustrating a contact state of an electronic component inspection contact head with an electronic component in which electrode pads are arranged in the front-rear direction.

【図4】本発明の第1実施形態に係る電子部品検査用接
触ヘッドを取り付けフレームに取り付けて電子部品に対
し加圧接触した状態を以って示す斜視図。
FIG. 4 is a perspective view showing a state in which the electronic component inspection contact head according to the first embodiment of the present invention is attached to an attachment frame and is in pressure contact with an electronic component.

【図5】上記電子部品検査用接触ヘッドの斜視図。FIG. 5 is a perspective view of the electronic component inspection contact head.

【図6】Aは上記電子部品検査用接触ヘッドの正面図、
Bは同側面図、CはA図におけるA−A線断面図。
FIG. 6A is a front view of the contact head for electronic component inspection,
B is the same side view, C is the sectional view on the AA line in FIG.

【図7】上記第1実施形態におけるC形板バネヒンジの
一体金属加工構造を拡大して示す断面図。
FIG. 7 is an enlarged sectional view showing an integrated metal working structure of the C-shaped leaf spring hinge in the first embodiment.

【図8】Aは電子部品検査用接触ヘッドを取り付けフレ
ームに並設した加圧接触前の状態を示す正面図、Bは同
加圧接触後の状態を示す正面図。
FIG. 8A is a front view showing a state before pressure contact in which the contact heads for inspecting electronic parts are arranged side by side on a mounting frame, and B is a front view showing a state after the pressure contact.

【図9】A,Bは上記第1実施形態に係る電子部品検査
用接触ヘッドに傾き調整ボルトを設けた例を示す断面図
であり、Aは前上がり調整状態を、Bは前下がり調整状
態を示す図。
9A and 9B are cross-sectional views showing an example in which a tilt adjusting bolt is provided on the contact head for inspecting electronic parts according to the first embodiment, where A is a front rising adjustment state and B is a front falling adjustment state. FIG.

【図10】本発明の第2実施形態例に係る電子部品検査
用接触ヘッドを取り付けフレームに取り付けて電子部品
に対し加圧接触した状態を以って示す斜視図。
FIG. 10 is a perspective view showing a state in which a contact head for inspecting an electronic component according to a second embodiment of the present invention is mounted on a mounting frame and is in pressure contact with an electronic component.

【図11】Aは上記電子部品検査用接触ヘッドの正面
図、Bは同側面図、CはA図におけるB−B線断面図。
11A is a front view of the contact head for inspecting electronic components, B is a side view of the same, and C is a sectional view taken along line BB in FIG.

【図12】上記第2実施形態に係るバネヒンジの配置例
を示す側面図。
FIG. 12 is a side view showing an arrangement example of spring hinges according to the second embodiment.

【図13】A,Bは上記第2実施形態に係る電子部品検
査用接触ヘッドに傾き調整ボルトを設けた例を示す断面
図であり、Aは前上がり調整状態を、Bは前下がり調整
状態を示す図。
13A and 13B are cross-sectional views showing an example in which a tilt adjusting bolt is provided in the contact head for inspecting electronic parts according to the second embodiment, where A is a front rising adjustment state and B is a front falling adjustment state. FIG.

【図14】Aは本発明の第3実施形態に係る電子部品検
査用接触ヘッドの前後方向断面図、Bは同左右方向断面
図。
FIG. 14A is a cross-sectional view in the front-rear direction of a contact head for inspecting electronic components according to a third embodiment of the present invention, and B is a cross-sectional view in the left-right direction.

【図15】Aは本発明の第4実施形態に係る電子部品検
査用接触ヘッドの斜視図、Bは同横断面図、Cは線材バ
ネヒンジの結合構造を示す拡大断面図。
FIG. 15A is a perspective view of a contact head for inspecting electronic parts according to a fourth embodiment of the present invention, B is a transverse cross-sectional view of the same, and C is an enlarged cross-sectional view showing a connecting structure of a wire spring hinge.

【図16】上記第1乃至第4実施形態において第2支持
ブロックに上下方向の傾きを自己調整するバネヒンジを
設けた例を示す側面図。
FIG. 16 is a side view showing an example in which the second support block is provided with a spring hinge for self-adjusting the vertical inclination in the first to fourth embodiments.

【図17】上記各実施形態に用いるプローブ基板の下面
図。
FIG. 17 is a bottom view of the probe substrate used in each of the above embodiments.

【符号の説明】[Explanation of symbols]

1…第1支持ブロック、2…第2支持ブロック、2a…
上部金属基板、2b…下部金属基板、4…加圧接触端、
5…電子部品、6…電極パッド、7…バンプ、8…取り
付けフレーム、9…プローブ基板、10…絶縁基板、1
1…リード、12…バネヒンジ、13…取り付け孔、1
4…取り付けボルト、15…先当てボルト、16…ボー
ル、17…有頭ボルト、17′…傾き調整ボルト、18
…有頭ボルトの頭部、19…操作孔、20…接触端支持
ブロック、21…板バネヒンジ、A…一個の金属ブロッ
ク、A′…不要金属部
1 ... 1st support block, 2 ... 2nd support block, 2a ...
Upper metal substrate, 2b ... Lower metal substrate, 4 ... Pressure contact end,
5 ... Electronic component, 6 ... Electrode pad, 7 ... Bump, 8 ... Mounting frame, 9 ... Probe substrate, 10 ... Insulating substrate, 1
1 ... Lead, 12 ... Spring hinge, 13 ... Mounting hole, 1
4 ... Mounting bolt, 15 ... Tip bolt, 16 ... Ball, 17 ... Headed bolt, 17 '... Tilt adjusting bolt, 18
... Head of headed bolt, 19 ... Operation hole, 20 ... Contact end support block, 21 ... Leaf spring hinge, A ... One metal block, A '... Unnecessary metal part

フロントページの続き (72)発明者 國増 俊男 神奈川県海老名市下今泉810番地 A棟4 階 株式会社双晶テック内 (72)発明者 塩川 武次 神奈川県海老名市下今泉810番地 A棟4 階 株式会社双晶テック内 Fターム(参考) 2G011 AA15 AA21 AB08 AC14 AD00 AE01 AF06 AF07 2G036 BA33 BB12 CA00 2G132 AA00 AF00 AF06 AL00 4M106 AA01 AA02 BA01 DD01 Continued front page    (72) Inventor Toshio Kunimasu             Kanagawa Prefecture Ebina City Shimoimazumi 810 A Building 4             Floor Twin Co., Ltd. Tech (72) Inventor Takeji Shiokawa             Kanagawa Prefecture Ebina City Shimoimazumi 810 A Building 4             Floor Twin Co., Ltd. Tech F term (reference) 2G011 AA15 AA21 AB08 AC14 AD00                       AE01 AF06 AF07                 2G036 BA33 BB12 CA00                 2G132 AA00 AF00 AF06 AL00                 4M106 AA01 AA02 BA01 DD01

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】上位に配した第1支持ブロックと下位に配
した第2支持ブロックを備え、該第2支持ブロックの前
端に配した加圧接触端を備え、第1支持ブロックの下面
と第2支持ブロックの上面間を両ブロックと一体金属加
工したバネヒンジにて連結し、該第2支持ブロックが該
バネヒンジを介して左右方向又は前後方向において上記
加圧接触端と共に上下に弾性傾動する構成としたことを
特徴とする電子部品検査用接触ヘッド。
1. A first supporting block arranged at a higher level and a second supporting block arranged at a lower level, a pressure contact end arranged at a front end of the second supporting block, and a lower surface of the first supporting block and a first supporting block. A structure in which the upper surfaces of the two support blocks are connected to the blocks by a spring hinge integrally machined, and the second support block elastically tilts up and down together with the pressure contact end in the left-right direction or the front-rear direction via the spring hinge. A contact head for inspecting electronic parts, which is characterized in that
【請求項2】上記バネヒンジがC形板バネヒンジである
ことを特徴とする請求項1記載の電子部品検査用接触ヘ
ッド。
2. The contact head for inspecting electronic components according to claim 1, wherein the spring hinge is a C-shaped leaf spring hinge.
【請求項3】上記バネヒンジがI形板バネヒンジである
ことを特徴とする請求項1記載の電子部品検査用接触ヘ
ッド。
3. The contact head for inspecting electronic components according to claim 1, wherein the spring hinge is an I-shaped leaf spring hinge.
【請求項4】上位に配した第1支持ブロックと下位に配
した第2支持ブロックを備え、該第2支持ブロックの前
端に配した加圧接触端を備え、第1支持ブロックの下面
と第2支持ブロックの上面間をC形のバネヒンジにて連
結し、該第2支持ブロックが上記C形バネヒンジを介し
て左右方向又は前後方向において上記加圧接触端と共に
上下に弾性傾動する構成としたことを特徴とする電子部
品検査用接触ヘッド。
4. A first supporting block arranged at a higher level and a second supporting block arranged at a lower level, a pressure contact end arranged at a front end of the second supporting block, and a lower surface of the first supporting block and a first supporting block. The upper surfaces of the two support blocks are connected by a C-shaped spring hinge, and the second support block is elastically tilted up and down together with the pressure contact end in the left-right direction or the front-rear direction via the C-shaped spring hinge. A contact head for inspecting electronic parts.
【請求項5】上記C形バネヒンジが線材から成ること特
徴とする請求項4記載の電子部品検査用接触ヘッド。
5. The contact head for inspecting electronic parts according to claim 4, wherein the C-shaped spring hinge is made of a wire material.
【請求項6】上位に配した第1支持ブロックと下位に配
した第2支持ブロックを備え、該第2支持ブロックの前
端に配した加圧接触端を備え、第1支持ブロックの下面
と第2支持ブロックの上面間をI形のバネヒンジにて連
結し、該第2支持ブロックが上記I形バネヒンジを介し
て左右方向又は前後方向において上記加圧接触端と共に
上下に弾性傾動する構成としたことを特徴とする電子部
品検査用接触ヘッド。
6. A first supporting block arranged at a higher level and a second supporting block arranged at a lower level, a pressure contact end arranged at a front end of the second supporting block, and a lower surface of the first supporting block and a first supporting block. The upper surfaces of the two support blocks are connected by an I-shaped spring hinge, and the second support block is elastically tilted up and down together with the pressure contact end in the left-right direction or the front-rear direction via the I-shaped spring hinge. A contact head for inspecting electronic parts.
JP2002045380A 2002-02-21 2002-02-21 Contact head for inspecting electronic component Pending JP2003248033A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002045380A JP2003248033A (en) 2002-02-21 2002-02-21 Contact head for inspecting electronic component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002045380A JP2003248033A (en) 2002-02-21 2002-02-21 Contact head for inspecting electronic component

Publications (1)

Publication Number Publication Date
JP2003248033A true JP2003248033A (en) 2003-09-05

Family

ID=28659284

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002045380A Pending JP2003248033A (en) 2002-02-21 2002-02-21 Contact head for inspecting electronic component

Country Status (1)

Country Link
JP (1) JP2003248033A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007060940A1 (en) * 2005-11-22 2007-05-31 Nhk Spring Co., Ltd. Probe holder and probe unit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007060940A1 (en) * 2005-11-22 2007-05-31 Nhk Spring Co., Ltd. Probe holder and probe unit
JP2007139712A (en) * 2005-11-22 2007-06-07 Nhk Spring Co Ltd Probe holder and probe unit

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