JP2003229432A5 - - Google Patents

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Publication number
JP2003229432A5
JP2003229432A5 JP2002344069A JP2002344069A JP2003229432A5 JP 2003229432 A5 JP2003229432 A5 JP 2003229432A5 JP 2002344069 A JP2002344069 A JP 2002344069A JP 2002344069 A JP2002344069 A JP 2002344069A JP 2003229432 A5 JP2003229432 A5 JP 2003229432A5
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JP
Japan
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JP2002344069A
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Japanese (ja)
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JP4401647B2 (ja
JP2003229432A (ja
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Publication of JP2003229432A5 publication Critical patent/JP2003229432A5/ja
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Publication of JP4401647B2 publication Critical patent/JP4401647B2/ja
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JP2002344069A 2001-11-30 2002-11-27 半導体装置の作製方法 Expired - Fee Related JP4401647B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002344069A JP4401647B2 (ja) 2001-11-30 2002-11-27 半導体装置の作製方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2001-367612 2001-11-30
JP2001367612 2001-11-30
JP2002344069A JP4401647B2 (ja) 2001-11-30 2002-11-27 半導体装置の作製方法

Publications (3)

Publication Number Publication Date
JP2003229432A JP2003229432A (ja) 2003-08-15
JP2003229432A5 true JP2003229432A5 (de) 2006-01-12
JP4401647B2 JP4401647B2 (ja) 2010-01-20

Family

ID=27759597

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002344069A Expired - Fee Related JP4401647B2 (ja) 2001-11-30 2002-11-27 半導体装置の作製方法

Country Status (1)

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JP (1) JP4401647B2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7133737B2 (en) 2001-11-30 2006-11-07 Semiconductor Energy Laboratory Co., Ltd. Program for controlling laser apparatus and recording medium for recording program for controlling laser apparatus and capable of being read out by computer
EP1329946A3 (de) 2001-12-11 2005-04-06 Sel Semiconductor Energy Laboratory Co., Ltd. Herstellungsverfahren von Halbleitervorrichtungen mit Laserkristallisationsschritt
JP2004103628A (ja) * 2002-09-05 2004-04-02 Hitachi Ltd レーザアニール装置及びtft基板のレーザアニール方法
JP5159021B2 (ja) * 2003-12-02 2013-03-06 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP2005210103A (ja) * 2003-12-26 2005-08-04 Semiconductor Energy Lab Co Ltd レーザ照射装置、レーザ照射方法及び結晶質半導体膜の作製方法
JP2006066908A (ja) 2004-07-30 2006-03-09 Semiconductor Energy Lab Co Ltd 半導体装置およびその作製方法
JP5030130B2 (ja) * 2005-10-19 2012-09-19 株式会社日本製鋼所 薄膜材料の結晶化装置
CN102097368A (zh) * 2010-11-08 2011-06-15 昆山工研院新型平板显示技术中心有限公司 一种低温多晶硅薄膜晶体管阵列基板的制造方法
JP2012099834A (ja) * 2011-12-19 2012-05-24 Fuji Electric Co Ltd Mosゲート型炭化珪素半導体装置の製造方法
US8501638B1 (en) * 2012-04-27 2013-08-06 Ultratech, Inc. Laser annealing scanning methods with reduced annealing non-uniformities
KR20140114542A (ko) 2013-03-18 2014-09-29 삼성디스플레이 주식회사 레이저빔 어닐링 장치 및 그 제어방법

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000243970A (ja) * 1999-02-24 2000-09-08 Matsushita Electric Ind Co Ltd 薄膜トランジスタとその製造方法及びそれを用いた液晶表示装置とその製造方法
JP2000277450A (ja) * 1999-03-24 2000-10-06 Matsushita Electric Ind Co Ltd レーザアニール装置及びこの装置を用いた薄膜トランジスタの製造方法
JP3897965B2 (ja) * 1999-08-13 2007-03-28 株式会社半導体エネルギー研究所 レーザー装置及びレーザーアニール方法

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