JP2003218072A - Waste water treatment apparatus - Google Patents

Waste water treatment apparatus

Info

Publication number
JP2003218072A
JP2003218072A JP2002018475A JP2002018475A JP2003218072A JP 2003218072 A JP2003218072 A JP 2003218072A JP 2002018475 A JP2002018475 A JP 2002018475A JP 2002018475 A JP2002018475 A JP 2002018475A JP 2003218072 A JP2003218072 A JP 2003218072A
Authority
JP
Japan
Prior art keywords
polishing
water
circulation tank
filter
wastewater
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002018475A
Other languages
Japanese (ja)
Inventor
Takayuki Jizaimaru
隆行 自在丸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nomura Micro Science Co Ltd
Original Assignee
Nomura Micro Science Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nomura Micro Science Co Ltd filed Critical Nomura Micro Science Co Ltd
Priority to JP2002018475A priority Critical patent/JP2003218072A/en
Publication of JP2003218072A publication Critical patent/JP2003218072A/en
Pending legal-status Critical Current

Links

Landscapes

  • Treatment Of Water By Ion Exchange (AREA)
  • Filtration Of Liquid (AREA)
  • Dicing (AREA)
  • Separation Using Semi-Permeable Membranes (AREA)
  • Heat Treatment Of Water, Waste Water Or Sewage (AREA)
  • Physical Water Treatments (AREA)
  • Treatment Of Water By Oxidation Or Reduction (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a waste water treatment apparatus that extends the replacement period by a large amount for a filter used for treating discharged drain in a process for manufacturing semiconductors, and can substantially reduce the maintenance work. <P>SOLUTION: The waste water treating apparatus has a polishing means for supplying demineralized water to a polishing section and at the same time, for polishing a semiconductor, a filtering means having a circulation tank for storing and circulating drain discharged from the polishing section, a filter for filtering grinding fine particles from the drain to obtain permeated water, and a circulating apparatus that transports the drain in the circulation tank to the filter and makes concentrated water to flow back to the circulation tank, and a reflux means for making the permeated water flow back to the polishing means. In this case, a disinfection or strerilization means is provided between the polishing section and the circulation tank. <P>COPYRIGHT: (C)2003,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は半導体研磨装置から
排出される排水の処理装置に関し、特に排水中に含まれ
る菌類の作用によるフィルタの目詰まり等の不具合を抑
制することを目的とした排水処理装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for treating wastewater discharged from a semiconductor polishing apparatus, and in particular to treating wastewater for the purpose of suppressing problems such as filter clogging due to the action of fungi contained in the wastewater. Regarding the device.

【0002】[0002]

【従来の技術】半導体の組立工程、例えば半導体の組立
工程におけるダイシング(ウェハのチップ分割)、バッ
クグラインド(裏面研磨)工程等からは、ウェハの研削
・研磨粉が含有された排水が多量に排出されている。
2. Description of the Related Art A large amount of waste water containing wafer grinding / polishing powder is discharged from a semiconductor assembling process such as a semiconductor assembling process such as dicing (wafer chip division) and back grinding (back surface polishing). Has been done.

【0003】このようなダイシング、バックグラインド
工程に用いられる超純水は非常に高価であるため、排水
から分離し再利用することが望ましい。また、排水を産
業廃棄物として処理する場合にも、排水処理時間の短縮
や廃棄量の低減等の観点から、分離回収し再利用するこ
とが好ましい。
Since ultrapure water used in such dicing and back grinding processes is very expensive, it is desirable to separate it from waste water and reuse it. Also, when treating wastewater as industrial waste, it is preferable to separate and collect and reuse the wastewater from the viewpoint of shortening the wastewater treatment time and reducing the amount of waste.

【0004】このため、近年では上記排水をフィルタ等
により濾過水と研削微粒子を含む濃縮水とに分離し、分
離された濾過水を超純水に再生して再びダイシングやバ
ックグラインド工程で利用している。
Therefore, in recent years, the above waste water is separated into filtered water and concentrated water containing grinding fine particles by a filter or the like, and the separated filtered water is regenerated into ultrapure water to be reused in the dicing or back grinding process. ing.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、ウェハ
の研磨、切削に使用されるバックグラインダーやダイシ
ングソー等の半導体製造工程から排出される研磨排水に
は10〜10個/ml程度の菌が存在しており、場
合によっては、これらの菌が処理装置内で増殖して10
個/ml程度となり、SS濃度(Suspended Solid 浮
遊物質)の1割以上となることがある。
However, about 10 2 to 10 3 bacteria / ml of bacteria are contained in polishing waste water discharged from the semiconductor manufacturing process such as back grinder and dicing saw used for polishing and cutting wafers. Are present, and in some cases, these fungi grow in the processor and
It becomes about 5 pieces / ml, which may be 10% or more of the SS concentration (Suspended Solid suspended solids).

【0006】このような菌体または菌がフィルタに付着
してしまうと、逆洗等の操作を行ってもこれらを容易に
除去することはできず、2〜3日に一度の割合でフィル
タを交換しなければならず、多大な労力と時間および費
用がかかっていた。
If such bacteria or bacteria adhere to the filter, they cannot be easily removed even by an operation such as backwashing, and the filter should be removed once every 2-3 days. It had to be replaced, which took a lot of effort, time and money.

【0007】本発明はこのような課題を解決するために
なされたものであって、半導体の製造過程において排出
される排水の処理に用いられるフィルタの交換周期を大
幅に延ばし、維持管理作業を大幅に減らすことを可能と
する排水処理装置を提供することを目的とする。
The present invention has been made in order to solve the above problems, and it prolongs the replacement period of the filter used for the treatment of the wastewater discharged in the semiconductor manufacturing process, and greatly increases the maintenance work. It is an object of the present invention to provide a wastewater treatment device that can reduce the amount of wastewater.

【0008】[0008]

【課題を解決するための手段】本発明の排水処理装置
は、研磨部に純水を供給しながら半導体を研磨する研磨
手段と、前記研磨部から排出された排水を貯留し循環さ
せるための循環タンクと、前記排水から研削微粒子を濾
過して透過水を得るためのフィルタと、このフィルタに
前記タンク中の排水を輸送し濃縮水を再び前記タンクへ
還流させる循環装置とを有する濾過手段と、前記透過水
を前記研磨手段に還流させる還流手段とを備えた排水処
理装置において、前記研磨部と前記タンクとの間に殺菌
または滅菌手段を配設したことを特徴とする。
A waste water treatment apparatus of the present invention comprises a polishing means for polishing a semiconductor while supplying pure water to the polishing portion, and a circulation for storing and circulating the waste water discharged from the polishing portion. A tank, a filter for filtering ground fine particles from the waste water to obtain permeated water, and a filtering means having a circulating device for transporting the waste water in the tank to the filter and returning concentrated water to the tank again, In a wastewater treatment device comprising a reflux means for refluxing the permeated water to the polishing means, a sterilizing or sterilizing means is arranged between the polishing section and the tank.

【0009】また、本発明の他の排水処理装置は、研磨
部に純水を供給しながら半導体を研磨する研磨手段と、
前記研磨部から排出された排水を貯留し循環させるため
の循環タンクと、前記排水から研削微粒子を濾過して透
過水を得るためのフィルタと、このフィルタに前記タン
ク中の排水を輸送し濃縮水を再び前記タンクへ還流させ
る循環装置とを有する濾過手段と、前記透過水を前記研
磨手段に還流させる還流手段とを備えた排水処理装置に
おいて、前記濾過手段の一部に殺菌または滅菌手段を配
設したことを特徴とする。
Further, another waste water treatment apparatus of the present invention comprises a polishing means for polishing the semiconductor while supplying pure water to the polishing section,
A circulation tank for storing and circulating the wastewater discharged from the polishing section, a filter for filtering permeated particles from the wastewater to obtain permeate, and a concentrated water for transporting the wastewater in the tank to this filter. In a wastewater treatment device comprising a filtering means having a circulation device for returning the water to the tank again and a reflux means for returning the permeated water to the polishing means, a sterilizing or sterilizing means is provided in a part of the filtering means. It is characterized by being set up.

【0010】上記排水処理装置においては、さらに濾過
手段とこの濾過手段からの透過水を研磨部に還流させる
還流手段との間に、透過水からイオン成分を除去するた
めのイオン交換手段を配設することが好ましい。
In the above wastewater treatment equipment, further, an ion exchange means for removing an ionic component from the permeated water is provided between the filtration means and the reflux means for refluxing the permeated water from the filtration means to the polishing section. Preferably.

【0011】殺菌または滅菌手段は、例えば殺菌剤を添
加するものであってもよいし、あるいは加熱、紫外線照
射または超音波照射等の物理的な方法によるものであっ
てもよい。
The sterilization or sterilization means may be, for example, a method in which a bactericidal agent is added, or a physical method such as heating, ultraviolet irradiation or ultrasonic irradiation.

【0012】このような本発明の排水処理装置は、特に
GaAs半導体を研磨する際に排出される研磨排水の処
理に用いられることが好ましい。
Such a wastewater treatment apparatus of the present invention is preferably used for treating polishing wastewater discharged when polishing a GaAs semiconductor.

【0013】[0013]

【発明の実施の形態】本発明の実施の形態について、図
面を参照して説明する。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described with reference to the drawings.

【0014】図1は、本発明の排水処理装置の一例を示
した概略図である。新規な純水はバックグラインド装置
等の研磨手段1の研磨部2に送られ、研削微粒子が混入
した排水となる。この研磨部2から排出された排水は、
濾過を行う前に殺菌・滅菌手段により排水の殺菌・滅菌
処理が行われる。この殺菌・滅菌は、例えば殺菌・滅菌
用タンク3、殺菌・滅菌手段等により行われる。
FIG. 1 is a schematic view showing an example of the wastewater treatment equipment of the present invention. The new pure water is sent to the polishing section 2 of the polishing means 1 such as a back-grinding device, and becomes waste water in which grinding fine particles are mixed. The wastewater discharged from the polishing section 2 is
Before filtering, wastewater is sterilized / sterilized by a sterilization / sterilization means. This sterilization / sterilization is performed by, for example, the sterilization / sterilization tank 3, the sterilization / sterilization means, and the like.

【0015】殺菌・滅菌手段としては、化学的殺菌装置
4aおよび物理的殺菌装置4bが挙げられる。化学的殺
菌装置4aとしては、例えば次亜塩素酸ソーダ、過酸化
水素水、オゾン等を単独もしくは複合添加するものが挙
げられる。物理的殺菌装置4bとしては、例えば加熱、
紫外線照射、超音波照射するようなものが挙げられる。
Examples of the sterilization / sterilization means include a chemical sterilizer 4a and a physical sterilizer 4b. Examples of the chemical sterilizer 4a include a device to which sodium hypochlorite, hydrogen peroxide solution, ozone, etc. are added individually or in combination. Examples of the physical sterilization device 4b include heating,
Examples thereof include ultraviolet irradiation and ultrasonic irradiation.

【0016】次亜塩素酸ソーダを用いて殺菌処理を行う
場合には、例えば所定量の排水を殺菌・滅菌用タンク3
に溜めた後、次亜塩素濃度として5〜20mg/lとな
るように添加して殺菌する。
When performing sterilization treatment using sodium hypochlorite, for example, a predetermined amount of waste water is sterilized / sterilized in the tank 3
Then, it is sterilized by adding it to a hypochlorous concentration of 5 to 20 mg / l.

【0017】これらの化学的殺菌装置4aおよび物理的
殺菌装置4bは、併用して用いてもよいし、一方のみを
用いてもよい。また、殺菌・滅菌は連続的に行ってもよ
いし、断続的に行ってもよい。
The chemical sterilizer 4a and the physical sterilizer 4b may be used in combination, or only one of them may be used. The sterilization / sterilization may be performed continuously or intermittently.

【0018】このようにして排水を濾過手段へ流入させ
る前に予め排水の殺菌・滅菌処理を行うことで、濾過手
段への生菌の混入を抑制し、濾過に用いられるフィルタ
がこれらの菌の増作用により目詰まりを起こすことを抑
制することが可能となる。
By thus sterilizing and sterilizing the wastewater in advance before flowing the wastewater into the filtering means, contamination of live bacteria with the filtering means is suppressed, and the filter used for the filtration is the It is possible to suppress clogging due to the increasing action.

【0019】次に、殺菌・滅菌処理が行われた排水は濾
過を行うために濾過手段5へと送られる。この濾過手段
5は排水を貯留し循環させるための循環タンク6と、排
水を透過水と濃縮水とに分離するフィルタ7と、この循
環タンク6とフィルタ7との間に排水を循環させるポン
プ8等の循環装置とからなる。排水の濾過に用いられる
フィルタ7は、例えば精密濾過膜や限外濾過膜を用いた
ものであり、その孔径は0.05〜0.2μm程度であ
ることが好ましい。
Next, the sterilized and sterilized wastewater is sent to the filtration means 5 for filtration. The filtering means 5 includes a circulation tank 6 for storing and circulating waste water, a filter 7 for separating the waste water into permeated water and concentrated water, and a pump 8 for circulating the waste water between the circulation tank 6 and the filter 7. And a circulation device. The filter 7 used for filtering the waste water is, for example, a microfiltration membrane or an ultrafiltration membrane, and its pore size is preferably about 0.05 to 0.2 μm.

【0020】濾過手段5の一部には殺菌・滅菌手段が配
設されており、排水を循環させて透過水と濃縮水とに分
離するのと同時に殺菌・滅菌処理を行う。
A sterilizing / sterilizing means is provided in a part of the filtering means 5, and the wastewater is circulated to separate permeated water and concentrated water, and at the same time, sterilizing / sterilizing treatment is performed.

【0021】殺菌・滅菌手段としては、化学的殺菌装置
4aおよび物理的殺菌装置4bが挙げられ、例えば図1
に示されるように、化学的殺菌装置4aを循環タンク6
に隣接させて、循環タンク6へ殺菌剤を添加させてもよ
いし、あるいは濃縮水の循環路の一部を分岐させて、こ
の分岐した部分に物理的殺菌装置4bを設けて、ここを
通過する濃縮水に加熱処理、紫外線照射、超音波照射等
の殺菌処理を行ってもよい。
Examples of the sterilizing / sterilizing means include a chemical sterilizing device 4a and a physical sterilizing device 4b. For example, FIG.
As shown in FIG.
The sterilizing agent may be added to the circulation tank 6 adjacent to, or a part of the circulation path of the concentrated water may be branched, and a physical sterilization device 4b may be provided at this branched portion to pass therethrough. The concentrated water may be subjected to sterilization treatment such as heat treatment, ultraviolet ray irradiation, or ultrasonic wave irradiation.

【0022】このような殺菌装置の配置場所は特に限定
されるものではなく、例えばフィルタ7部分や、循環タ
ンク6とフィルタ7を繋ぐ配管の途中に、これらの殺菌
装置を配置してもよく、少なくともいずれかの場所にお
いて化学的または物理的殺菌が行われるものであれば構
わない。
The location for disposing such a sterilizer is not particularly limited. For example, these sterilizers may be arranged in the filter 7 portion or in the pipe connecting the circulation tank 6 and the filter 7, Any chemical or physical sterilization may be performed at least at any place.

【0023】化学的殺菌装置4aとしては、例えば次亜
塩素酸ソーダ、過酸化水素水、オゾン等を添加するもの
が挙げられる。物理的殺菌装置4bとしては、例えば加
熱、紫外線照射、超音波照射するようなものが挙げられ
る。
Examples of the chemical sterilization device 4a include a device to which sodium hypochlorite, hydrogen peroxide solution, ozone, etc. are added. Examples of the physical sterilization device 4b include devices that perform heating, ultraviolet irradiation, and ultrasonic irradiation.

【0024】これらの化学的殺菌装置4aおよび物理的
殺菌装置4bは、併用して用いてもよいし、一方のみを
用いてもよい。また、殺菌・滅菌は濃縮水の循環中に連
続的に行ってもよいし、断続的に行ってもよい。
The chemical sterilizer 4a and the physical sterilizer 4b may be used in combination, or only one of them may be used. The sterilization / sterilization may be performed continuously or intermittently in the concentrated water circulation.

【0025】濾過手段5の一部に殺菌・滅菌手段を配設
することにより、濾過中の微生物増殖を抑制し、フィル
タ7の目詰まりを抑制することが可能となる。
By disposing the sterilization / sterilization means in a part of the filtration means 5, it becomes possible to suppress the growth of microorganisms during the filtration and the clogging of the filter 7.

【0026】濾過手段5のフィルタ7には、目詰まりを
解消するために、逆洗チャンバ9やこれに空気を送るエ
ア注入部10等からなる逆洗手段を設けておくことが好
ましい。
The filter 7 of the filtering means 5 is preferably provided with a backwashing means including a backwashing chamber 9 and an air injection section 10 for sending air to the backwashing chamber 9 in order to eliminate clogging.

【0027】濾過手段5より得られた透過水はいったん
濾過水タンク11へ送られて貯留され、こののちイオン
交換手段12により各種イオンが除去される。イオン交
換手段12としては、例えばアニオン・カチオン交換樹
脂単独及び混床式のものやROやEDIといった脱イオ
ン装置が挙げられる。このようにして得られた透過水
は、再び研磨手段1へ還流することにより使用すること
ができる。一方、濾過手段5内に残った濃縮水は、いっ
たん貯蔵された後、廃棄処分される。
The permeated water obtained by the filtering means 5 is once sent to and stored in the filtered water tank 11, and thereafter, various ions are removed by the ion exchange means 12. Examples of the ion exchange means 12 include a single anion / cation exchange resin and a mixed bed type, and a deionization device such as RO or EDI. The permeated water thus obtained can be used by being returned to the polishing means 1 again. On the other hand, the concentrated water remaining in the filtering means 5 is once stored and then discarded.

【0028】上記した本発明においては、排水を濾過手
段へ送る前にいったん殺菌処理を行い、さらに濾過中に
殺菌処理を行う例を示したが、必ずしも両方の殺菌処理
を行う必要はなく、いずれか一方のみの殺菌処理でも効
果を奏するものである。
In the above-mentioned present invention, an example is shown in which the wastewater is sterilized once before being sent to the filtering means, and further sterilized during the filtration. However, both sterilization treatments are not necessarily required. Even if only one of them is sterilized, the effect is obtained.

【0029】[0029]

【発明の効果】本発明の排水処理装置によれば、半導体
を研磨する際に排出される排水の濾過処理前あるいは処
理中に排水の殺菌処理を行うことで、濾過装置内部での
菌の増殖を抑制し、フィルタの交換周期を大幅に延ば
し、維持管理を容易にすることが可能となる。
EFFECTS OF THE INVENTION According to the wastewater treatment equipment of the present invention, by sterilizing the wastewater before or during the filtration treatment of the wastewater discharged when polishing the semiconductor, the growth of bacteria inside the filtration equipment is carried out. It is possible to suppress the above, to significantly extend the filter replacement period, and to facilitate maintenance.

【0030】特に、菌が増殖しやすいGaAs半導体の
研磨の際の排水処理に用いることで、菌の増殖を抑制
し、フィルタの交換周期を大幅に延ばし、維持管理を容
易にすることが可能となる。
In particular, by using it for wastewater treatment when polishing a GaAs semiconductor in which bacteria easily grow, it is possible to suppress the growth of bacteria, significantly extend the filter replacement cycle, and facilitate maintenance. Become.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の排水処理装置の一例を示した概略図FIG. 1 is a schematic diagram showing an example of a wastewater treatment device of the present invention.

【符号の説明】[Explanation of symbols]

1…研磨手段 2…研磨部 4a…化学的物理的殺菌装置 4b…物理的殺菌装置 5…濾過手段 6…循環タンク 7…フィルタ 12…イオン交換手段 1 ... Polishing means 2 ... Polishing part 4a ... Chemical and physical disinfection device 4b ... Physical sterilizer 5 ... Filtering means 6 ... Circulation tank 7 ... Filter 12 ... Ion exchange means

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) C02F 1/36 C02F 1/42 A 4D064 1/42 1/44 E 1/44 1/50 510A 1/50 510 520J 520 531M 531 531Q 531R 540B 540 550C 550 550H 560A 560 560C 560E 1/72 Z 1/72 1/76 A 1/76 1/78 1/78 9/00 502A 9/00 502 502E 502J 502N 502Q 502R 503G 503 504B 504 504E B01D 35/02 A H01L 21/301 H01L 21/78 Z Fターム(参考) 4D006 GA06 GA07 KA31 KA33 KB03 KB04 KD06 MA22 MB02 PA01 PB07 PB22 PB23 PC01 4D025 AA06 BA08 BA13 BB04 DA04 DA05 DA08 DA10 4D034 CA06 4D037 AA08 AB03 BA18 BA26 CA03 CA11 CA12 CA16 4D050 AA08 AB06 BB02 BB06 BB09 BD03 BD06 CA01 CA07 CA09 CA12 4D064 AA31 BA21 BA34 ─────────────────────────────────────────────────── ─── Continuation of front page (51) Int.Cl. 7 Identification code FI theme code (reference) C02F 1/36 C02F 1/42 A 4D064 1/42 1/44 E 1/44 1/50 510A 1/50 510 520J 520 531M 531 531Q 531R 540B 540 550C 550 550H 560A 560 560C 560E 1/72 Z 1/72 1/76 A 1/76 1/78 1/78 9 502 502E 502E 502E 503 504B 504 504E B01D 35/02 A H01L 21/301 H01L 21/78 Z F Term (Reference) 4D006 GA06 GA07 KA31 KA33 KB03 KB04 KD06 MA22 MB02 PA01 PB07 PB22 PB23 PC06 4D025 AA06 BA08 BA13 DA08 DA06 4A06 DA06 4 AA08 AB03 BA18 BA26 CA03 CA11 CA1 2 CA16 4D050 AA08 AB06 BB02 BB06 BB09 BD03 BD06 CA01 CA07 CA09 CA12 4D064 AA31 BA21 BA34

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 研磨部に純水を供給しながら半導体を研
磨する研磨手段と、前記研磨部から排出された排水を貯
留し循環させるための循環タンクと、前記排水から研削
微粒子を濾過して透過水を得るためのフィルタと、この
フィルタに前記循環タンク中の排水を輸送し濃縮水を再
び前記循環タンクへ還流させる循環装置とを有する濾過
手段と、 前記透過水を前記研磨手段に還流させる還流手段とを備
えた排水処理装置において、 前記研磨部と前記循環タンクとの間に殺菌または滅菌手
段を配設したことを特徴とする排水処理装置。
1. A polishing unit for polishing a semiconductor while supplying pure water to the polishing unit, a circulation tank for storing and circulating the wastewater discharged from the polishing unit, and filtering fine grinding particles from the wastewater. A filter for obtaining permeated water, a filtering means having a circulator for transporting waste water in the circulation tank to the filter and returning concentrated water to the circulation tank again, and the permeated water is returned to the polishing means. A wastewater treatment device provided with a reflux means, wherein a sterilization or sterilization means is provided between the polishing section and the circulation tank.
【請求項2】 研磨部に純水を供給しながら半導体を研
磨する研磨手段と、前記研磨部から排出された排水を貯
留し循環させるための循環タンクと、前記排水から研削
微粒子を濾過して透過水を得るためのフィルタと、この
フィルタに前記循環タンク中の排水を輸送し濃縮水を再
び前記循環タンクへ還流させる循環装置とを有する濾過
手段と、 前記透過水を前記研磨手段に還流させる還流手段とを備
えた排水処理装置において、 前記濾過手段の一部に殺菌または滅菌手段を配設したこ
とを特徴とする排水処理装置。
2. A polishing means for polishing a semiconductor while supplying pure water to the polishing section, a circulation tank for storing and circulating the wastewater discharged from the polishing section, and filtering grinding fine particles from the wastewater. A filter for obtaining permeated water, a filtering means having a circulator for transporting waste water in the circulation tank to the filter and returning concentrated water to the circulation tank again, and the permeated water is returned to the polishing means. A wastewater treatment device provided with a reflux means, wherein a sterilizing or sterilizing means is provided in a part of the filtering means.
【請求項3】 前記濾過手段と前記濾過手段からの透過
水を前記研磨部に還流させる還流手段との間に、前記透
過水からイオン成分を除去するためのイオン交換手段を
配設したことを特徴とする請求項1または2記載の排水
処理装置。
3. An ion exchange means for removing an ionic component from the permeated water is provided between the filtration means and a reflux means for returning permeated water from the filtration means to the polishing section. The wastewater treatment device according to claim 1 or 2, which is characterized.
【請求項4】 前記殺菌または滅菌手段は、殺菌剤を添
加するものであることを特徴とする請求項1乃至3のい
ずれか1項記載の排水処理装置。
4. The waste water treatment apparatus according to claim 1, wherein the sterilizing or sterilizing means is one that adds a sterilizing agent.
【請求項5】 前記殺菌または滅菌手段は、加熱、紫外
線照射および超音波照射の中から選ばれる少なくとも1
つを用いるものであることを特徴とする請求項1乃至3
のいずれか1項記載の排水処理装置。
5. The sterilization or sterilization means is at least one selected from heating, ultraviolet irradiation and ultrasonic irradiation.
4. The method according to claim 1, wherein
The wastewater treatment device according to any one of 1.
【請求項6】 前記半導体はGaAs半導体であること
を特徴とする請求項1乃至5のいずれか1項記載の排水
処理装置。
6. The wastewater treatment equipment according to claim 1, wherein the semiconductor is a GaAs semiconductor.
JP2002018475A 2002-01-28 2002-01-28 Waste water treatment apparatus Pending JP2003218072A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002018475A JP2003218072A (en) 2002-01-28 2002-01-28 Waste water treatment apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002018475A JP2003218072A (en) 2002-01-28 2002-01-28 Waste water treatment apparatus

Publications (1)

Publication Number Publication Date
JP2003218072A true JP2003218072A (en) 2003-07-31

Family

ID=27653810

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002018475A Pending JP2003218072A (en) 2002-01-28 2002-01-28 Waste water treatment apparatus

Country Status (1)

Country Link
JP (1) JP2003218072A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006281174A (en) * 2005-04-05 2006-10-19 Matsushita Electric Ind Co Ltd Method, apparatus and system for recycling wastewater
CN107739070A (en) * 2017-11-15 2018-02-27 珠海格力电器股份有限公司 A kind of control method of water cleaning systems and water cleaning systems
WO2019088304A1 (en) * 2017-11-06 2019-05-09 Wota株式会社 Water purification system

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006281174A (en) * 2005-04-05 2006-10-19 Matsushita Electric Ind Co Ltd Method, apparatus and system for recycling wastewater
WO2019088304A1 (en) * 2017-11-06 2019-05-09 Wota株式会社 Water purification system
JPWO2019088304A1 (en) * 2017-11-06 2020-11-26 Wota株式会社 Water purification system
JP7122761B2 (en) 2017-11-06 2022-08-22 Wota株式会社 water purification system
CN107739070A (en) * 2017-11-15 2018-02-27 珠海格力电器股份有限公司 A kind of control method of water cleaning systems and water cleaning systems

Similar Documents

Publication Publication Date Title
JP3570304B2 (en) Sterilization method of deionized water production apparatus and method of producing deionized water
WO2019088015A1 (en) Washing water treatment device and washing water treatment method
JP2007237062A (en) Artificial dialysis water manufacturing method and its manufacturing apparatus
TWI461370B (en) Production method and apparatus for pure water, method and apparatus for manufacturing ozone water, and method and apparatus for cleaning the same
JP5670383B2 (en) Dialysis water supply device and dialysis water supply method
JP2003218072A (en) Waste water treatment apparatus
JP2002282860A (en) Method and equipment for purifying swimming pool water
JP2001029752A (en) Manufacture of high-purity water and device therefor
JP2018089598A (en) Water treating device
JP3965001B2 (en) Deionized water production equipment
JP3771684B2 (en) Ultrapure water production method
JP4475568B2 (en) Bacteria generation suppression method in electric demineralized water production equipment
JP7280790B2 (en) Processing waste liquid treatment method
JP3998997B2 (en) Disinfection method of ultrapure water supply pipe
JPH0815596B2 (en) Ultrapure water production method
JPH0521038B2 (en)
JP4428633B2 (en) Method of virus inactivation of treated water
JP2013220406A (en) Apparatus for treating cleaning wastewater, and method for treating cleaning wastewater
JPH0630792B2 (en) Treatment method of water supply treatment device
KR100626373B1 (en) System making di water
JPH074592B2 (en) Ultrapure water production method
JPS6397284A (en) Method for removing trace organic matter in ultrapure water
JPH0630795B2 (en) Treatment method of water supply treatment device
JP4016873B2 (en) Deionized water production method
JP2002001338A (en) Equipment for cleaning pool water

Legal Events

Date Code Title Description
A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20040601

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20040802

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20041130