JP2003194632A5 - - Google Patents

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Publication number
JP2003194632A5
JP2003194632A5 JP2002241717A JP2002241717A JP2003194632A5 JP 2003194632 A5 JP2003194632 A5 JP 2003194632A5 JP 2002241717 A JP2002241717 A JP 2002241717A JP 2002241717 A JP2002241717 A JP 2002241717A JP 2003194632 A5 JP2003194632 A5 JP 2003194632A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002241717A
Other languages
Japanese (ja)
Other versions
JP2003194632A (ja
Filing date
Publication date
Priority claimed from US09/935,824 external-priority patent/US6898000B2/en
Application filed filed Critical
Publication of JP2003194632A publication Critical patent/JP2003194632A/ja
Publication of JP2003194632A5 publication Critical patent/JP2003194632A5/ja
Pending legal-status Critical Current

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JP2002241717A 2001-08-22 2002-08-22 波長範囲が拡大された偏光無依存の光サンプリング方法及びそれに使用される装置 Pending JP2003194632A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/935,824 US6898000B2 (en) 2001-08-22 2001-08-22 Polarization-independent optical sampling with extended wavelength range
US935824 2001-08-22

Publications (2)

Publication Number Publication Date
JP2003194632A JP2003194632A (ja) 2003-07-09
JP2003194632A5 true JP2003194632A5 (enExample) 2005-11-10

Family

ID=25467731

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002241717A Pending JP2003194632A (ja) 2001-08-22 2002-08-22 波長範囲が拡大された偏光無依存の光サンプリング方法及びそれに使用される装置

Country Status (2)

Country Link
US (1) US6898000B2 (enExample)
JP (1) JP2003194632A (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005091130A (ja) * 2003-09-17 2005-04-07 Agilent Technol Inc 光計測機器における偏光依存性を解消した測定方法、及びそのために使用される装置、測定用補償モジュール
FR2881299B1 (fr) * 2005-01-21 2009-06-12 Femlight Sa Analyseur de signal optique rapide
US7327302B2 (en) * 2006-02-10 2008-02-05 Picosolve Inc. Equivalent time asynchronous sampling arrangement
CN102175334B (zh) * 2011-03-01 2014-01-08 复旦大学 基于非谐波长波长取样光的脉冲信噪比单次测量装置
CN102426062B (zh) * 2011-09-26 2013-06-12 复旦大学 基于准位相匹配的激光脉冲高保真度信噪比单次测量装置
EP2899816B1 (en) * 2014-01-27 2019-05-15 Fyzikální ústav AV CR, v.v.i. Method and device for time synchronization of picosecond and subpicosecond laser pulses
EP4388290A1 (en) * 2021-08-18 2024-06-26 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Method and device for photonic sampling of a test wave-form

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6744508B2 (en) * 2001-10-24 2004-06-01 Agilent Technologies, Inc. Simplified polarization independent optical sampling using a spatially split waveplate
US6661577B1 (en) * 2002-09-17 2003-12-09 Jds Uniphase Corporation Wavelength-selective laser beam splitter

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