JP2003194632A - 波長範囲が拡大された偏光無依存の光サンプリング方法及びそれに使用される装置 - Google Patents
波長範囲が拡大された偏光無依存の光サンプリング方法及びそれに使用される装置Info
- Publication number
- JP2003194632A JP2003194632A JP2002241717A JP2002241717A JP2003194632A JP 2003194632 A JP2003194632 A JP 2003194632A JP 2002241717 A JP2002241717 A JP 2002241717A JP 2002241717 A JP2002241717 A JP 2002241717A JP 2003194632 A JP2003194632 A JP 2003194632A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- harmonic
- optical
- input signal
- frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Optical Communication System (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/935,824 US6898000B2 (en) | 2001-08-22 | 2001-08-22 | Polarization-independent optical sampling with extended wavelength range |
| US935824 | 2001-08-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2003194632A true JP2003194632A (ja) | 2003-07-09 |
| JP2003194632A5 JP2003194632A5 (enExample) | 2005-11-10 |
Family
ID=25467731
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002241717A Pending JP2003194632A (ja) | 2001-08-22 | 2002-08-22 | 波長範囲が拡大された偏光無依存の光サンプリング方法及びそれに使用される装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US6898000B2 (enExample) |
| JP (1) | JP2003194632A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005091130A (ja) * | 2003-09-17 | 2005-04-07 | Agilent Technol Inc | 光計測機器における偏光依存性を解消した測定方法、及びそのために使用される装置、測定用補償モジュール |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2881299B1 (fr) * | 2005-01-21 | 2009-06-12 | Femlight Sa | Analyseur de signal optique rapide |
| US7327302B2 (en) * | 2006-02-10 | 2008-02-05 | Picosolve Inc. | Equivalent time asynchronous sampling arrangement |
| CN102175334B (zh) * | 2011-03-01 | 2014-01-08 | 复旦大学 | 基于非谐波长波长取样光的脉冲信噪比单次测量装置 |
| CN102426062B (zh) * | 2011-09-26 | 2013-06-12 | 复旦大学 | 基于准位相匹配的激光脉冲高保真度信噪比单次测量装置 |
| EP2899816B1 (en) * | 2014-01-27 | 2019-05-15 | Fyzikální ústav AV CR, v.v.i. | Method and device for time synchronization of picosecond and subpicosecond laser pulses |
| WO2023020706A1 (en) * | 2021-08-18 | 2023-02-23 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Method and device for photonic sampling of a test wave-form |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6744508B2 (en) * | 2001-10-24 | 2004-06-01 | Agilent Technologies, Inc. | Simplified polarization independent optical sampling using a spatially split waveplate |
| US6661577B1 (en) * | 2002-09-17 | 2003-12-09 | Jds Uniphase Corporation | Wavelength-selective laser beam splitter |
-
2001
- 2001-08-22 US US09/935,824 patent/US6898000B2/en not_active Expired - Fee Related
-
2002
- 2002-08-22 JP JP2002241717A patent/JP2003194632A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005091130A (ja) * | 2003-09-17 | 2005-04-07 | Agilent Technol Inc | 光計測機器における偏光依存性を解消した測定方法、及びそのために使用される装置、測定用補償モジュール |
Also Published As
| Publication number | Publication date |
|---|---|
| US20030038936A1 (en) | 2003-02-27 |
| US6898000B2 (en) | 2005-05-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20050817 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050817 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20080723 |
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| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20080807 |
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| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20090402 |