JP2003174239A - Fraction lifetime improving scope of solder junction by regulating thermal expansion amount difference between printed board and component - Google Patents

Fraction lifetime improving scope of solder junction by regulating thermal expansion amount difference between printed board and component

Info

Publication number
JP2003174239A
JP2003174239A JP2001372796A JP2001372796A JP2003174239A JP 2003174239 A JP2003174239 A JP 2003174239A JP 2001372796 A JP2001372796 A JP 2001372796A JP 2001372796 A JP2001372796 A JP 2001372796A JP 2003174239 A JP2003174239 A JP 2003174239A
Authority
JP
Japan
Prior art keywords
thermal expansion
component
printed circuit
circuit board
expansion amount
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2001372796A
Other languages
Japanese (ja)
Inventor
Yasuhei Sanada
泰平 真田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2001372796A priority Critical patent/JP2003174239A/en
Publication of JP2003174239A publication Critical patent/JP2003174239A/en
Withdrawn legal-status Critical Current

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  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To improve the fraction lifetime of a solder junction by reducing the thermal expansion amount difference generated between a printed board and an electronic component when an electric product generates heat. <P>SOLUTION: In order to set the thermal expansion amount difference between the component and the printed board 2 to the same degree with respect to the peripheral part in which a component having a short fracture lifetime of the solder junction is mounted, an instrument 1 for regulating the thermal expansion of the board 1 is mounted on the board. <P>COPYRIGHT: (C)2003,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、プリント基板上の
部品の周りに穴あるいは溝を設け、その穴や溝に熱膨張
を調節するための器具を設置する事によって、プリント
基板と部品の間におこる熱膨張差の発生を低減し、はん
だ接合部の破断寿命を改善するという主旨のものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention provides a hole or groove around a component on a printed circuit board, and a device for controlling thermal expansion is installed in the hole or groove to provide a space between the printed circuit board and the component. The purpose is to reduce the occurrence of a difference in thermal expansion that occurs in 1) and improve the fracture life of the solder joint.

【0002】[0002]

【従来の技術】プリント基板に実装された電子部品のは
んだ接合部について、従来技術では部品のリード部分の
形態やはんだ形状を工夫することなどによりはんだ接合
部の破断寿命を伸ばそうという対策がなされてきた。
2. Description of the Related Art Regarding solder joints of electronic components mounted on a printed circuit board, conventional techniques have taken measures to extend the fracture life of the solder joints by devising the form and solder shape of the lead portions of the components. Came.

【0003】しかし近年、実装の高密度化やワンチップ
化に伴うパッケージサイズの大型化、接合形態の多様化
が原因となり、従来どおりの対策を施すことは徐々に困
難になりつつある。
However, in recent years, it has become gradually difficult to take the conventional measures due to the increase in package density and the increase in package size accompanying one-chip packaging and the diversification of bonding forms.

【0004】[0004]

【発明が解決しようとする課題】多くの電子部品はプリ
ント基板とは異なった熱膨張係数を持っており、一般的
にはプリント基板に比べて熱膨張係数の低い部品が多
い。例を挙げると、プリント基板の熱膨張係数が15e
-6前後であるのに対し、Siは約2.0e-6、セラミ
ックスは約6.0e-6、プラスチックモールドは20
e-6の熱膨張係数を持つ。そのため製品使用時におい
て、部品が熱を発して部品とプリント基板が熱膨張を起
こし、はんだ接合部にせん断・引張り・圧縮の力がかか
る。
Many electronic components have a coefficient of thermal expansion different from that of a printed circuit board, and in general, there are many components having a thermal expansion coefficient lower than that of the printed circuit board. For example, the thermal expansion coefficient of the printed circuit board is 15e.
It is around -6, but about 2.0e-6 for Si, about 6.0e-6 for ceramics, 20 for plastic mold.
It has a coefficient of thermal expansion of e-6. Therefore, when the product is used, heat is generated by the components and thermal expansion occurs between the components and the printed board, and shearing, pulling and compressing forces are applied to the solder joints.

【0005】これらが原因で部品のはんだ接合部の寿命
が短くなってしまう事が本発明の解決しようとする課題
である。
It is a problem to be solved by the present invention that the life of the solder joint portion of the component is shortened due to these reasons.

【0006】[0006]

【課題を解決するための手段】本発明では、はんだ接合
部の破断寿命の短い部品が実装された周囲部分に対し、
部品とプリント基板の熱膨張量を同程度にするため、プ
リント基板の熱膨張を調節するための加工を施す。
SUMMARY OF THE INVENTION In the present invention, the solder joint has a peripheral portion on which parts having a short breaking life are mounted,
In order to make the thermal expansion amounts of the component and the printed circuit board similar, a process for adjusting the thermal expansion of the printed circuit board is performed.

【0007】プリント基板の熱膨張量が部品の熱膨張量
よりも大きい場合は、図1で示すように、2の製品基
板において、部品の周囲に穴を開け、そこに1で示す高
剛性の棒を通し、製品の筐体内部などに固定する。また
は図2で示すように、部品の周りに4で示すような溝
又は穴をあけ、その溝又は穴に部品を覆う又は囲むよう
にして3で示すような高剛性・低膨張材料からなる枠を
差し込む。
When the thermal expansion amount of the printed circuit board is larger than the thermal expansion amount of the component, as shown in FIG. 1, in the product substrate of No. 2, a hole is made around the component, and a high rigidity indicated by 1 is formed there. Insert the rod and fix it inside the product housing. Alternatively, as shown in FIG. 2, a groove or hole as shown by 4 is formed around the component, and a frame made of a high rigidity and low expansion material as shown by 3 is inserted so as to cover or surround the component in the groove or hole. .

【0008】プリント基板の熱膨張量が部品の熱膨張量
よりも小さい場合も同様に、図2で示すように部品の周
りに穴をあけ、その穴に部品を覆う又は囲むようにして
高剛性・高膨張材料からなる枠を差し込む。この手段に
よって、はんだ接合部の破断寿命改善の効果を得ること
が本発明の主旨である。
Similarly, when the thermal expansion amount of the printed circuit board is smaller than the thermal expansion amount of the component, a hole is formed around the component as shown in FIG. Insert a frame made of expansive material. It is the gist of the present invention to obtain the effect of improving the fracture life of the solder joint by this means.

【0009】[0009]

【発明の実施の形態】DETAILED DESCRIPTION OF THE INVENTION

【第一の実施形態】図3の6に示すような2.5cm角
のFR4プリント基板に5で示す7mm角のフリップチ
ップ(以下FC)を図3に示すように1個実装したもの
について、熱サイクル試験を行った。履歴条件は20℃
→125℃→−55℃→20℃で1200サイクル、昇
温・降温レートは共に30(deg./min.)とし
た。基板サンプル数は30枚とした。
[First Embodiment] As shown in FIG. 3B, a 2.5 mm square FR4 printed board on which one 7 mm square flip chip (hereinafter FC) is mounted as shown in FIG. A heat cycle test was conducted. History condition is 20 ℃
→ 125 ° C. → −55 ° C. → 20 ° C., 1200 cycles, and temperature raising / cooling rate were both 30 (deg./min.). The number of substrate samples was 30.

【0010】基板上のFCのはんだ接合部に対し、図3
の7で示すようにチェックパッドを8箇所設け、導通状
況を常時モニタした。この8箇所は図6の9であらわす
接点に対応している。このFCはそれぞれのコーナー部
において、電流が片方の接点から入り他方の接点から出
るように回路設計されており、2つのいずれかが破断し
たときにその2つの接点が寿命であるとみなした。この
試験においては、導通がなくなった時点・電流値が極端
に不安定になった時点においてそのはんだ接合部の破断
とみなすこととした。この試験において、FCに対し通
常頻繁に行われるアンダーフィルは行われていない。
For the FC solder joint on the substrate, see FIG.
As shown in No. 7, eight check pads were provided and the conduction state was constantly monitored. These eight locations correspond to the contacts represented by 9 in FIG. The FC was designed in such a way that at each corner, the current entered at one contact and exited at the other, and the two contacts were considered to be life when either of them broke. In this test, it was decided that the solder joint was broken at the time when the electrical connection was lost and the current value became extremely unstable. In this test, the FC is not underfilled as often as it normally is.

【0011】次に、先の試験と同様のプリント基板に対
し、図4(a)、図4(b)に示すようにチップ部品の
両側をFCの端部分直下から3mmの場所で前項の手
段を用いて変形拘束したプリント基板を30枚、同じ場
所で図5(a)、5(b)で示すように前項の手段を
用いて変形拘束したプリント基板を30枚について、先
の試験と同じ条件で熱サイクル試験を行った。の手段
を用いた場合においては、図4(a)、図4(b)で示
すとおり、温度変化の少ない製品筐体に固定されている
ことを想定するため、高剛性・低膨張材料であるインバ
ー(高剛性・低膨張材料)の板材2枚に、変形拘束をす
る平板を固定した。の手段を用いた場合にも、枠の材
料として高剛性・低膨張な性質を持つインバーを使っ
た。以上の条件で熱サイクル試験を行った。
Next, as shown in FIGS. 4 (a) and 4 (b), a printed circuit board similar to the one used in the previous test was placed on both sides of the chip component at a position 3 mm from directly below the end portion of the FC, and the means of the preceding paragraph was used. Same as the previous test for 30 printed circuit boards constrained by deformation using the same method and 30 printed circuit boards constrained by deformation using the means of the previous section as shown in FIGS. 5 (a) and 5 (b) at the same place. A thermal cycle test was conducted under the conditions. 4A and 4B, it is assumed that it is fixed to the product housing with a small temperature change, so that it is a high-rigidity / low-expansion material. A flat plate for restraining deformation was fixed to two invar (high rigidity / low expansion material) plates. Even when the above method is used, Invar having high rigidity and low expansion is used as the material of the frame. The heat cycle test was performed under the above conditions.

【0012】試験結果について確率紙プロットをとり、
累積故障率60%においてその破断サイクル数を比較す
ると、膨張変形拘束をしなかった場合は200サイク
ル、の手段で膨張変形をしたものは600サイクル、
の手段で膨張変形をしたものは700サイクルとなっ
た。
Taking a probability paper plot for the test results,
Comparing the number of fracture cycles at a cumulative failure rate of 60%, 200 cycles without expansion and deformation constraint, 600 cycles with expansion deformation by means of
It was 700 cycles when expanded and deformed by the means.

【0013】また、拘束をしていない基板について、2
0℃→125℃でのFC端部直下間の熱膨張量を計測し
たところ、その平均値は8.0μmであった。それに対
しての手段で拘束した場合の熱膨張量は4.2μm、
の手段で拘束した場合の熱膨張量の平均値は3.2μ
mとなった。実装していないFC部品単体での熱膨張量
も同じ熱負荷をかけて計測した。20℃→125℃の温
度変化での熱膨張量の平均値は1.5μmであった。よ
って、本提案による操作によりプリント基板のFCの周
囲部分について、プリント基板の熱膨張量をFCの熱膨
張量に近づける効果のあることが判明した。
Further, regarding the unconstrained substrate, 2
When the amount of thermal expansion immediately below the FC end portion was measured at 0 ° C. → 125 ° C., the average value was 8.0 μm. The amount of thermal expansion when restrained by the means for it is 4.2 μm,
The average value of the amount of thermal expansion when restrained by the means of 3.2μ
It became m. The thermal expansion amount of the FC component alone not mounted was also measured by applying the same heat load. The average value of the amount of thermal expansion in the temperature change of 20 ° C. → 125 ° C. was 1.5 μm. Therefore, it was found that the operation according to the present proposal has an effect of making the thermal expansion amount of the printed circuit board near the FC of the printed circuit board close to the thermal expansion amount of the FC.

【0014】この結果から、プリント基板の熱膨張量が
部品の熱膨張量よりも大きい場合において、局所的にプ
リント基板の熱膨張量を先の方法で拘束し、チップ部品
などの熱膨張量に合わせる操作を行う事によって、はん
だ接合部の破断寿命を改善する効果のある事が実証され
た。
From this result, when the thermal expansion amount of the printed circuit board is larger than the thermal expansion amount of the component, the thermal expansion amount of the printed circuit board is locally restricted by the above method, and the thermal expansion amount of the chip component or the like is restrained. It was proved that by performing the matching operation, it has an effect of improving the fracture life of the solder joint.

【0015】[0015]

【第ニの実施形態】図5(a)・5(b)で示すよう
に、70mm角のFR4プリント基板の中央部に16m
m角のCSPを1個実装し、CSPの周囲2mmの場所
に、高剛性・高膨張材料としてジュラルミン(Al-
4.0Cu-0.5Mg-0.5Mn)の枠を差し込んで
固定した。これにより基板が固定位置で固定された場合
を想定した。このサンプルに対し熱サイクル試験を行っ
た。履歴条件は20℃→125℃→−55℃→20℃の
2000サイクル、昇温・降温レートは共に30(de
g./min.)とした。基板サンプル数は10枚とし
た。
[Second Embodiment] As shown in FIGS. 5 (a) and 5 (b), the distance from the center of a FR4 printed circuit board of 70 mm square is 16 m.
One m-square CSP is mounted, and a duralumin (Al-
A frame of 4.0Cu-0.5Mg-0.5Mn) was inserted and fixed. This assumes that the substrate is fixed at the fixed position. A thermal cycle test was performed on this sample. The history condition is 20 ° C. → 125 ° C. → −55 ° C. → 20 ° C. for 2000 cycles, and the heating / cooling rate is 30 (de
g. / Min. ). The number of substrate samples was 10.

【0016】図3で示すとおり、CSPのはんだ接合部
に対しチェックパッドを8箇所設け、導通状況を常時モ
ニタした。この8箇所は図6の9であらわす接点に対応
している。このCSPはそれぞれのコーナー部におい
て、電流が片方の接点から入り他方の接点から出るよう
に回路設計されており、2つのいずれかが破断したとき
にその2つの接点が寿命であるとみなした。この試験に
おいては、導通がなくなった時点・電流値が極端に不安
定になった時点においてそのはんだ接合部の破断とみな
すこととした。
As shown in FIG. 3, eight check pads were provided on the solder joint portion of the CSP to constantly monitor the conduction state. These eight locations correspond to the contacts represented by 9 in FIG. The CSP was designed so that at each corner, the current entered at one contact and exited at the other, and when either of the two broke, the two contacts were considered to be life. In this test, it was decided that the solder joint was broken at the time when the electrical connection was lost and the current value became extremely unstable.

【0017】次に、先の試験と同様のプリント基板に対
し、CSP端部のランドから長手方向へ5mmの場所に
前項で説明した方法で強制的にCSP周辺の基板部分を
膨張させるような加工を施したプリント基板を30枚、
先の試験と同じ条件で熱サイクル試験を行った。
Next, for a printed circuit board similar to the one used in the previous test, a process for forcibly expanding the board portion around the CSP at a position 5 mm in the longitudinal direction from the land at the end of the CSP by the method described in the preceding paragraph. 30 printed circuit boards with
A thermal cycle test was conducted under the same conditions as the previous test.

【0018】試験結果について確率紙プロットをとり、
累積故障率60%においてその破断サイクル数を比較す
ると、ジュラルミンの枠をしなかった場合は800サイ
クル、ジュラルミンの枠を差込んで膨張変形をしたもの
は1200サイクルとなった。
Taking a probability paper plot for the test results,
Comparing the number of fracture cycles at a cumulative failure rate of 60%, it was 800 cycles when the frame of duralumin was not used and 1200 cycles when the frame was expanded and deformed by inserting the frame of duralumin.

【0019】また、拘束をしていないプリント基板につ
いて、20℃→125℃でのCSP両端間の熱膨張量を
計測したところ、その平均値は10μmであった。それ
に対して高膨張金属の枠をはめ込んで強制膨張させた場
合の熱膨張量の平均値は18μmであった。また、16
mm角CSP部品単体での熱膨張量の平均値は22μm
であった。よって、本提案による操作によりプリント基
板のCSPの周囲部分について、プリント基板の熱膨張
量をCSPの熱膨張量に近づける効果のあることが判明
した。
The amount of thermal expansion between both ends of the CSP at 20 ° C. → 125 ° C. was measured for the unconstrained printed circuit board, and the average value was 10 μm. On the other hand, the average value of the amount of thermal expansion when the frame of the high expansion metal was fitted and forcedly expanded was 18 μm. Also, 16
The average value of the amount of thermal expansion of a mm square CSP component is 22 μm
Met. Therefore, it was found that the operation according to the present proposal has an effect of bringing the thermal expansion amount of the printed circuit board near the CSP of the printed circuit board close to the thermal expansion amount of the CSP.

【0020】この結果から、プリント基板の熱膨張量が
部品の熱膨張量よりも小さい場合において、先の方法を
用いて局所的にプリント基板の熱膨張量を電子部品など
の熱膨張量に合わせる操作を行う事によって、はんだ接
合部の破断寿命を改善する効果のある事が実証された。
From this result, when the thermal expansion amount of the printed circuit board is smaller than the thermal expansion amount of the component, the thermal expansion amount of the printed circuit board is locally adjusted to the thermal expansion amount of the electronic component by using the above method. It was proved that the operation has the effect of improving the fracture life of the solder joint.

【0021】[0021]

【発明の効果】多くの電子部品はプリント基板とは異な
った熱膨張係数を持っている。部品が熱を発して部品と
プリント基板が熱膨張を起こした際、それぞれの熱膨張
量の違いによってはんだ接合部にせん断・引張り・圧縮
の力がかかる。これらが原因で部品のはんだ接合部の破
断寿命が短くなるが、本発明で示す方法によって熱膨張
量の差を小さくすることができ、はんだ接合部の破断寿
命を伸ばすことができる。
Many electronic components have a coefficient of thermal expansion different from that of printed circuit boards. When a component emits heat and causes thermal expansion between the component and the printed circuit board, shearing, pulling, and compressing forces are applied to the solder joint due to the difference in thermal expansion between the components. Due to these factors, the rupture life of the solder joint of the component is shortened, but the difference in thermal expansion amount can be reduced by the method shown in the present invention, and the rupture life of the solder joint can be extended.

【図面の簡単な説明】[Brief description of drawings]

【図1】熱膨張の少ない部品と同程度の熱膨張量にする
ために、プリント基板の熱膨張を低減する事を目的と
し、部品の周りに高剛性な板材(棒)をはめ込んだ製品
基板を表す。
[Fig. 1] Product board in which high-rigidity plate materials (bars) are fitted around the parts in order to reduce the thermal expansion of the printed circuit board in order to achieve the same amount of thermal expansion as the parts with less thermal expansion. Represents

【図2】熱膨張の少ない部品と同程度の熱膨張量にする
ために、プリント基板の熱膨張を低減する事を目的と
し、部品の周りに高剛性・低膨張の枠材をはめ込んだ製
品基板、あるいは、熱膨張の大きい部品と同程度の熱膨
張量にするために、プリント基板の膨張量を増大させる
事を目的とし、部品の周りに高剛性・高膨張の枠材をは
め込んだ製品基板を表す。
[Fig. 2] A product in which a high-rigidity / low-expansion frame material is fitted around the components in order to reduce the thermal expansion of the printed circuit board in order to achieve the same amount of thermal expansion as the components with less thermal expansion. A product in which a high-rigidity / high-expansion frame material is fitted around the component in order to increase the expansion amount of the printed circuit board in order to achieve the same amount of thermal expansion as the substrate or the component with large thermal expansion. Represents a substrate.

【図3】熱膨張量の調整を行わない、部品が実装された
プリント基板を表す図である。
FIG. 3 is a diagram showing a printed circuit board on which components are mounted without adjusting a thermal expansion amount.

【図4】(a)部品の周りにおいて高剛性の棒材または
板材を基板に組み込む仕組みを表す図である。 (b)部品の周りにおいて高剛性の棒材または板材によ
る変形拘束をうけた状態の熱サイクル試験用の基板を表
す。
FIG. 4A is a view showing a mechanism of incorporating a highly rigid rod or plate around a component into a substrate. (B) A substrate for a heat cycle test in a state of being deformed and restrained by a highly rigid rod or plate around the component.

【図5】(a)部品の周りにおいて高剛性の枠材を基板
に組み込む仕組みを表す図である。 (b)部品の周りにおいて高剛性低膨張の枠材による変
形拘束をうけた状態、または、高剛性高膨張の枠材によ
り部品の周りの部分が膨張をうながされる状態の熱サイ
クル試験用の基板を表す。
FIG. 5A is a diagram showing a mechanism of incorporating a highly rigid frame material around a component into a substrate. (B) Substrate for heat cycle test in a state where deformation is restricted by a frame material having high rigidity and low expansion around the component, or a portion around the component is expanded by the frame material having high rigidity and high expansion Represents

【図6】モニターする部品側接点を示す図である。FIG. 6 is a diagram showing component-side contacts to be monitored.

【符号の説明】[Explanation of symbols]

1 部品の周りの部分において、プリント基板の熱膨張
量を抑制するための高剛性の板材を示す。 2 製品の基板を示す。 3 熱膨張の少ない部品と同程度の熱膨張量にするため
に、プリント基板の熱膨張を低減する事を目的とした高
剛性・低膨張の枠材、あるいは、熱膨張の大きい部品と
同程度の熱膨張量にするために、プリント基板の膨張量
を増大させる事を目的とした高剛性・高膨張の枠材を示
す。 4 枠材・板材・棒材などを設置するための穴または溝
を示す。 5 FC部品またはCSP部品を示す。 6 熱サイクル試験用の基板を示す。 7 熱サイクル試験中の常時導通モニター用のチェック
パッドを示す。 8 プリント基板の、部品の周りの部分の熱膨張量を抑
制するための高剛性の板材(棒材)を固定する高剛性・
低膨張の板材を示す。 9 導通チェックを行うはんだボールを示す
1 shows a highly rigid plate material for suppressing the amount of thermal expansion of the printed circuit board in the portion around the component. 2 Shows the board of the product. 3 High-rigidity / low-expansion frame material that aims to reduce the thermal expansion of the printed circuit board to achieve the same level of thermal expansion as parts with low thermal expansion, or parts with high thermal expansion The frame material has high rigidity and high expansion for the purpose of increasing the expansion amount of the printed circuit board in order to increase the thermal expansion amount. 4 Indicates holes or grooves for installing frame materials, plate materials, bar materials, etc. 5 Indicates FC parts or CSP parts. 6 shows a substrate for a heat cycle test. 7 shows a check pad for constant continuity monitoring during a heat cycle test. 8 High rigidity to fix high rigidity plate material (bar material) to suppress the amount of thermal expansion around the parts of the printed circuit board
A low expansion plate material is shown. 9 Shows a solder ball for continuity check

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 プリント基板上の電子部品実装部の周り
に熱膨張を調節するための器具を挿入する穴または溝が
開けられているプリント基板。
1. A printed circuit board having a hole or groove for inserting a device for adjusting thermal expansion around an electronic component mounting portion on the printed circuit board.
【請求項2】 請求項1のプリント基板に対し、筐体と
プリント基板が部品の周りの穴を通る支持棒又は支持板
によって固定されているような熱膨張抑制の形態。
2. A form of suppressing thermal expansion in which the housing and the printed circuit board are fixed to the printed circuit board according to claim 1 by a support rod or a support plate passing through holes around components.
【請求項3】 請求項1のプリント基板に対し、電子部
品の周りの穴を固定部として部品の上側を覆うように、
または横側を囲むように高剛性・低膨張材料でできた枠
状の部品を装着することにより、電子部品の周りにおけ
るプリント基板の熱膨張を抑制する形態。
3. The printed circuit board according to claim 1, wherein the holes around the electronic component are used as fixing portions to cover the upper side of the component.
Alternatively, by mounting a frame-shaped component made of a high-rigidity / low-expansion material so as to surround the lateral side, thermal expansion of the printed circuit board around the electronic component is suppressed.
【請求項4】 請求項1のプリント基板に対し、電子部
品の周りの穴を固定部として部品の上側を覆うように、
または横側を囲むように高剛性・高膨張材料でできた枠
状の部品を装着することにより、電子部品の周りにおけ
るプリント基板の熱膨張を助長する形態。
4. The printed circuit board according to claim 1, wherein the holes around the electronic component are used as fixing portions to cover the upper side of the component.
Alternatively, by mounting a frame-shaped component made of a high-rigidity / high-expansion material so as to surround the lateral side, thermal expansion of the printed circuit board around the electronic component is promoted.
JP2001372796A 2001-12-06 2001-12-06 Fraction lifetime improving scope of solder junction by regulating thermal expansion amount difference between printed board and component Withdrawn JP2003174239A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001372796A JP2003174239A (en) 2001-12-06 2001-12-06 Fraction lifetime improving scope of solder junction by regulating thermal expansion amount difference between printed board and component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001372796A JP2003174239A (en) 2001-12-06 2001-12-06 Fraction lifetime improving scope of solder junction by regulating thermal expansion amount difference between printed board and component

Publications (1)

Publication Number Publication Date
JP2003174239A true JP2003174239A (en) 2003-06-20

Family

ID=19181623

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001372796A Withdrawn JP2003174239A (en) 2001-12-06 2001-12-06 Fraction lifetime improving scope of solder junction by regulating thermal expansion amount difference between printed board and component

Country Status (1)

Country Link
JP (1) JP2003174239A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012023151A (en) * 2010-07-13 2012-02-02 Nichicon Corp Reinforcement structure of substrate

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012023151A (en) * 2010-07-13 2012-02-02 Nichicon Corp Reinforcement structure of substrate

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