JP2003140122A - Manufacturing method and washing device for liquid crystal display element - Google Patents

Manufacturing method and washing device for liquid crystal display element

Info

Publication number
JP2003140122A
JP2003140122A JP2001337662A JP2001337662A JP2003140122A JP 2003140122 A JP2003140122 A JP 2003140122A JP 2001337662 A JP2001337662 A JP 2001337662A JP 2001337662 A JP2001337662 A JP 2001337662A JP 2003140122 A JP2003140122 A JP 2003140122A
Authority
JP
Japan
Prior art keywords
substrate
cleaning
cleaning liquid
dirt
crystal display
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001337662A
Other languages
Japanese (ja)
Inventor
Hideo Uchida
日出夫 内田
Masatoshi Sakai
政俊 坂井
Masaaki Tanaka
正明 田中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP2001337662A priority Critical patent/JP2003140122A/en
Publication of JP2003140122A publication Critical patent/JP2003140122A/en
Pending legal-status Critical Current

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  • Liquid Crystal (AREA)
  • Cleaning By Liquid Or Steam (AREA)

Abstract

PROBLEM TO BE SOLVED: To make it possible to uniformly remove alignment layer dregs and to prevent re-adhesion of the alignment layer dregs after removal. SOLUTION: A mechanism producing air pressure of air jetted from an air knife by a guide parallel to a substrate for preventing water infiltration into a non-washed area is provided in the stage prior to a shower washing mechanism to make it possible to rapidly discharge the polluted washing water generated simultaneously with washing by shower jetting to the both ends of the substrate without infiltration of the polluted washing water into the non-washed area. Thereby, the alignment layer dregs can be satisfactorily removed and re-adhesion thereof can be prevented and the problem of display unevenness occurring when a panel is lighted and due to washing unevenness in the washing after rubbing is solved.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、液晶表示素子の製
造過程に用いられる洗浄装置、および、この洗浄装置を
用いた液晶表示素子の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a cleaning device used in a manufacturing process of a liquid crystal display element, and a method of manufacturing a liquid crystal display element using the cleaning device.

【0002】[0002]

【従来の技術】液晶表示素子の製造工程は、液晶を配向
させるために基板上に配向膜を形成し、この配向膜の表
面を布にて擦る工程であるラビング処理工程を有してお
り、また、その際のラビング処理を施した基板表面の配
向膜カスを除去するための洗浄工程を有している。この
洗浄装置はロ−ラ−搬送等により基板を搬送しながら各
洗浄機構にて洗浄し、最終的に乾燥する枚葉処理装置を
使用している。しかしながら、配向膜カスは洗浄液に置
換し再度配向膜に再付着しやすく、また、再付着した配
向膜カスはその後の洗浄では除去できない特性を有して
おり、いかに洗浄前段の洗浄機構にて配向膜カスを除去
し、再付着を防止しつつ基板全面を均一に洗浄するかは
重要である。
2. Description of the Related Art A manufacturing process of a liquid crystal display device has a rubbing treatment process in which an alignment film is formed on a substrate in order to align liquid crystals, and the surface of the alignment film is rubbed with a cloth. Further, it has a cleaning step for removing the alignment film dust on the surface of the substrate that has been subjected to the rubbing treatment at that time. This cleaning apparatus uses a single-wafer processing apparatus that performs cleaning by each cleaning mechanism while finally transporting the substrate by roller transportation or the like and finally drying. However, the alignment film residue is easily replaced by a cleaning liquid and reattached to the alignment film again, and the reattached alignment film residue has a characteristic that it cannot be removed by subsequent cleaning. It is important to remove the film dust and uniformly wash the entire surface of the substrate while preventing reattachment.

【0003】図5で示す様なシャワ−洗浄の場合、搬送
ロ−ラ−1にて一方向の基板搬送方向3に搬送された基
板2をシャワ−機構9により噴射された洗浄液4にて基
板表面を洗浄する。その際、図6に示す様に、洗浄液1
0が基板表面の未洗浄領域5に浸水11し、洗浄ムラが
発生するため、初期洗浄としては不向きであるため、洗
浄工程では配向膜カスの除去及び再付着防止と面内洗浄
の均一化を目的として洗浄前段にアクアナイフ等の機構
が設置されている。
In the case of the shower cleaning as shown in FIG. 5, the substrate 2 transferred in one direction of the substrate transfer direction 3 by the transfer roller-1 is transferred to the substrate by the cleaning liquid 4 sprayed by the shower mechanism 9. Clean the surface. At that time, as shown in FIG.
Since 0 enters the uncleaned area 5 on the substrate surface 11 and causes uneven cleaning, it is not suitable for initial cleaning. Therefore, in the cleaning step, removal of alignment film residue and prevention of redeposition and uniform in-plane cleaning are performed. For the purpose, a mechanism such as an aqua knife is installed before the cleaning.

【0004】図4に示す様にアクアナイフ機構6は大量
の洗浄液7を噴きだし、基板先頭から終端まで一気に洗
浄する水流8により基板表面を洗浄する機構である。
As shown in FIG. 4, the aqua knife mechanism 6 is a mechanism for ejecting a large amount of cleaning liquid 7 and cleaning the surface of the substrate with a water flow 8 that cleans the substrate from the beginning to the end all at once.

【0005】[0005]

【発明が解決しようとする課題】液晶表示素子は、アレ
イ基板とカラ−フィルタ−基板との間に適正なギャップ
を形成し、その間に液晶を充填し、液晶を配向膜がラビ
ング処理された方向に配向させ、電界制御による液晶の
配列制御によって光学特性を利用した表示素子であるた
め、配向膜表面は表示光学特性を決定する重要な要素の
一つである。
In a liquid crystal display device, an appropriate gap is formed between an array substrate and a color filter substrate, liquid crystal is filled between them, and the liquid crystal is oriented in a direction in which an alignment film is rubbed. The surface of the alignment film is one of the important factors that determine the display optical characteristics because it is a display element that is aligned in the vertical direction and uses the optical characteristics by controlling the alignment of liquid crystals by controlling the electric field.

【0006】この表面状態は、ラビング処理後の洗浄に
依存し、洗浄が異常であれば、液晶表示素子にて表示ム
ラが発生し、表示品位を悪化させる。ラビング処理にて
発生する配向膜カスは、洗浄液に置換し再度配向膜に再
付着しやすく、また再付着した配向膜カスはその後の洗
浄では除去できない特性を有しており、いかに洗浄機構
にて配向膜カスを除去し、再付着を防止しつつ基板全面
を均一に洗浄するかが重要となる。これを解決するため
に、図4に示す様に基板に対して低角度に設置されたア
クアナイフ機構6を有し、基板表面を大量の洗浄水7に
よる水流8によって配向膜の除去及び再付着を防止して
いる。
This surface condition depends on the cleaning after the rubbing treatment, and if the cleaning is abnormal, display unevenness occurs in the liquid crystal display element and the display quality is deteriorated. The alignment film residue generated by the rubbing process is easily replaced by the cleaning liquid and reattached to the alignment film again, and the alignment film residue reattached has a characteristic that it cannot be removed by the subsequent cleaning. It is important to remove the alignment film dust and uniformly wash the entire surface of the substrate while preventing redeposition. In order to solve this, as shown in FIG. 4, an aqua knife mechanism 6 installed at a low angle with respect to the substrate is provided, and the surface of the substrate is removed and redeposited by a large amount of washing water 7 to remove the alignment film. Is being prevented.

【0007】しかし、この機構において基板表面を流れ
る水流8は、基板2の先頭と終端とでは水流速度に差が
どうしても発生するため、基板の均一洗浄に対して問題
があり、基板表面を流れる水流により洗浄能力不足の課
題があるため、今後の技術動向である生産基板の大型化
およびパネルの表示品位向上に対して、基板均一洗浄と
洗浄能力向上に関し問題を有している。
However, in this mechanism, the water flow 8 flowing on the surface of the substrate has a problem in terms of uniform cleaning of the substrate because a difference in water flow velocity between the head and the end of the substrate 2 is inevitable. As a result, there is a problem of insufficient cleaning capacity. Therefore, in order to increase the size of production substrates and improve the display quality of panels, which is a technological trend in the future, there are problems with uniform cleaning of substrates and improvement of cleaning capacity.

【0008】[0008]

【課題を解決するための手段】基板の洗浄にシャワ−機
構を採用し、シャワ−噴射された洗浄液の水圧により基
板表面を洗浄する事で洗浄能力を向上する。しかし、図
5にて示すように、噴射された洗浄水4は洗浄部分にて
水圧が減衰し、勢いを無くした汚染された洗浄液10が
未洗浄領域5に浸水11しながら広がり、汚染された洗
浄液10にて浸水された領域は配向膜カスの置換と再付
着を誘発させ、基板2の均一洗浄を妨げ洗浄ムラを発生
させる。
A cleaning mechanism is adopted for cleaning a substrate, and the surface of the substrate is cleaned by the water pressure of the cleaning liquid sprayed by the shower to improve the cleaning performance. However, as shown in FIG. 5, the water pressure of the sprayed cleaning water 4 is attenuated in the cleaning portion, and the contaminated cleaning liquid 10 that has lost its momentum spreads into the uncleaned area 5 while being flooded 11 and contaminated. The region flooded with the cleaning liquid 10 induces replacement and reattachment of the alignment film residue, which hinders uniform cleaning of the substrate 2 and causes uneven cleaning.

【0009】これを防止するために、図1に示すように
基板表面に対して水平方向の風圧14により、洗浄液の
浸水を妨げる機構をシャワ−機構9の前段に設置する。
汚染された洗浄液10を未洗浄領域に流れ込むことを防
止し、さらに図2に示すように汚染された洗浄液10の
水流を止めることなく基板両端に最短距離にて排水15
することでシャワ−機構の採用による問題点を解決し、
洗浄能力の向上と基板の均一洗浄の両立を実現する。
In order to prevent this, as shown in FIG. 1, a mechanism for preventing the infiltration of the cleaning liquid by the wind pressure 14 in the horizontal direction with respect to the substrate surface is installed in front of the shower mechanism 9.
The contaminated cleaning liquid 10 is prevented from flowing into the uncleaned area, and as shown in FIG. 2, the drainage 15 is drained at the shortest distance to both ends of the substrate without stopping the water flow of the contaminated cleaning liquid 10.
By solving the problems caused by the adoption of the shower mechanism,
Achieving both improved cleaning ability and uniform cleaning of substrates.

【0010】[0010]

【発明の実施の形態】本発明の請求項1記載の発明は、
液晶を配向させるための配向膜を基板上に形成し、前記
配向膜にラビング処理を施した後、前記基板をローラー
搬送により搬送しながら前記基板表面の汚れを除去する
洗浄液を噴射して逐次洗浄する液晶表示素子の製造方法
であって、前記噴射された洗浄液の流れ方向を制御する
ことを特徴とする液晶表示素子の製造方法である。
BEST MODE FOR CARRYING OUT THE INVENTION The invention according to claim 1 of the present invention is
An alignment film for aligning liquid crystals is formed on a substrate, and after the alignment film is subjected to a rubbing treatment, a cleaning liquid for removing dirt on the surface of the substrate is sprayed while the substrate is conveyed by roller conveyance to sequentially wash the substrate. A method of manufacturing a liquid crystal display element, wherein the flow direction of the sprayed cleaning liquid is controlled.

【0011】また、本発明の請求項2に記載の発明は、
圧送した洗浄液を基板表面噴射し前記噴射された洗浄液
の水圧により前記基板表面の汚れを除去する際に発生す
る汚れを含む洗浄液の流れ方向を、圧送した高圧空気ま
たは窒素ガスのエア−にて制御することを特徴とする。
The invention according to claim 2 of the present invention is
Controlling the flow direction of the cleaning liquid containing contaminants generated when the cleaning liquid pumped is sprayed on the substrate surface and the contaminants on the substrate surface are removed by the water pressure of the sprayed cleaning liquid, by the pressurized high pressure air or nitrogen gas air. It is characterized by doing.

【0012】また、本発明の請求項3記載の発明は、圧
送した高圧空気または窒素ガスの風圧および前記汚れを
含む洗浄液の水圧により、前記汚れを含む洗浄液を基板
の両端に排水し、前記汚れを含む洗浄液が前記基板の表
面を移動し、前記基板後方の未洗浄領域に浸水すること
を防止することを特徴とする。
According to a third aspect of the present invention, the cleaning liquid containing the dirt is drained to both ends of the substrate by the wind pressure of the pressurized high-pressure air or nitrogen gas and the water pressure of the cleaning liquid containing the dirt, and the dirt is removed. The cleaning liquid containing is prevented from moving on the surface of the substrate and flooding the uncleaned region behind the substrate.

【0013】また、本発明の請求項4記載の発明は、圧
送した洗浄液を基板表面に噴射する洗浄機構を備え、前
記噴射された洗浄液の水圧により基板表面の汚れを除去
する洗浄装置であって、前記噴射された洗浄液の水圧に
より基板表面の汚れを除去する際に発生する汚れを含む
洗浄液の流れ方向を制御し、前記汚れを含む洗浄液が前
記基板表面を移動し未洗浄領域に浸水することを防止す
る浸水防止機構を備えることを特徴とする洗浄装置であ
る。
According to a fourth aspect of the present invention, there is provided a cleaning device which comprises a cleaning mechanism for spraying the cleaning liquid pumped onto the surface of the substrate, and which removes dirt on the surface of the substrate by the water pressure of the sprayed cleaning liquid. Controlling the flow direction of the cleaning liquid containing dirt generated when removing the dirt on the substrate surface by the water pressure of the sprayed cleaning liquid so that the cleaning liquid containing the dirt moves on the surface of the substrate and floods the uncleaned area. The cleaning device is provided with a water infiltration prevention mechanism for preventing the above.

【0014】また、本発明の請求項5記載の発明は、浸
水防止機構が、圧縮流体を噴射するためのエアーナイフ
と、前記エアーナイフ機構から噴出された前記圧縮流体
の流れ方向を基板表面に対してほぼ水平にするためのガ
イドとから構成されることを特徴とする。
According to a fifth aspect of the present invention, in the water immersion prevention mechanism, an air knife for injecting a compressed fluid, and a flow direction of the compressed fluid ejected from the air knife mechanism are directed to the substrate surface. It is characterized by being configured with a guide for making it substantially horizontal.

【0015】また、本発明の請求項6記載の発明は、エ
アーナイフを洗浄機構に対して50〜300mmの距離
に設置し、洗浄される基板に対してガイドを、0.5〜
5.0mmの低ギャップにて固定したことを特徴とす
る。
According to a sixth aspect of the present invention, an air knife is installed at a distance of 50 to 300 mm with respect to the cleaning mechanism, and a guide for the substrate to be cleaned is 0.5 to 0.5 mm.
It is characterized by being fixed at a low gap of 5.0 mm.

【0016】以下、本発明の実施の形態を図面を用いて
説明する。
Embodiments of the present invention will be described below with reference to the drawings.

【0017】図3に示すように、洗浄液を噴射するシャ
ワ−洗浄機構9による基板上の汚染された洗浄液10の
浸水11を風圧14にて妨げる浸水防止機構を前段の5
0〜300mmの距離にて設置する。この浸水防止機構
は、基板表面を流れる水流を防止するために基板面に対
して水平な風圧14が必要とされ、これを実現するため
の圧送した窒素ガスのエア−を噴射するエア−ナイフ1
2と、噴射されたエア−19を基板表面に対して水平方
向に風圧14を構成するためのガイド13とにより構成
される。このガイド13の形状は、エア−ナイフ側面に
接地する面17と、基板に対して平行になる面18とで
構成され、エア−ナイフ12から噴出され基板に対して
散乱されるエアーを、基板に対して平行となる面18に
て水平方向の風圧14として抑制する機能を有する。こ
れにより、シャワ−洗浄にて発生する汚染された洗浄液
10を風圧14にて未洗浄領域5に浸水することを防止
し、図2に示すように汚染された洗浄液を基板両端に最
短距離にて排水15する。なお、エアーとして窒素ガス
を用いたが、高圧空気を用いることもできる。
As shown in FIG. 3, the shower cleaning mechanism 9 for injecting the cleaning liquid prevents the infiltration 11 of the contaminated cleaning liquid 10 on the substrate by the wind pressure 14.
Install at a distance of 0-300 mm. This water infiltration prevention mechanism requires a horizontal wind pressure 14 with respect to the substrate surface in order to prevent water flow on the substrate surface, and an air knife 1 for injecting compressed nitrogen gas air to achieve this.
2 and a guide 13 for forming the wind pressure 14 in the horizontal direction with respect to the surface of the substrate. The shape of this guide 13 is composed of a surface 17 that comes into contact with the air-knife side surface and a surface 18 that is parallel to the substrate. Air that is jetted from the air-knife 12 and scattered on the substrate is It has a function of suppressing the wind pressure 14 in the horizontal direction on the surface 18 that is parallel to. This prevents the contaminated cleaning liquid 10 generated by the shower cleaning from being flooded into the uncleaned region 5 by the wind pressure 14, and the contaminated cleaning liquid 10 can be applied to both ends of the substrate at the shortest distance as shown in FIG. Drain 15 Although nitrogen gas was used as the air, high pressure air can also be used.

【0018】[0018]

【発明の効果】以上のとおり本発明によれば、シャワ−
洗浄により洗浄能力のを向上させるとともに、汚染され
た洗浄液の未洗浄領域への浸水を防止し最短距離にて排
水するため、基板の汚染を最低限にできる。
As described above, according to the present invention, the shower
Since the cleaning performance is improved by cleaning and the contaminated cleaning liquid is prevented from entering the uncleaned area and drained in the shortest distance, the contamination of the substrate can be minimized.

【0019】特にラビング後の洗浄においては有効であ
り、この機構を使用することで均一な配向膜カスの除去
を可能とし、また、除去後の配向膜カスの再付着を防止
できるため、高品質なパネル表示が実現できる。また、
基板サイズに左右されない洗浄機構を提供できる。
Particularly, it is effective in cleaning after rubbing, and by using this mechanism, it is possible to uniformly remove the alignment film dust, and it is possible to prevent re-adhesion of the alignment film dust after the removal, which results in high quality. It can realize various panel displays. Also,
It is possible to provide a cleaning mechanism that does not depend on the substrate size.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施形態であるシャワ−機構と水流制
御機構の簡単な構造図
FIG. 1 is a simple structural diagram of a shower mechanism and a water flow control mechanism according to an embodiment of the present invention.

【図2】図1の構造を上部から見た簡略図FIG. 2 is a simplified view of the structure of FIG. 1 seen from above.

【図3】図1における水流制御機構の構造を詳細に示す
構造図
FIG. 3 is a structural diagram showing the structure of the water flow control mechanism in FIG. 1 in detail.

【図4】従来のアクアナイフの構造図FIG. 4 is a structural diagram of a conventional aqua knife.

【図5】シャワ−機構の簡単な構造図FIG. 5 is a simple structural diagram of a shower mechanism.

【図6】図5における上部から見た簡略図FIG. 6 is a simplified diagram as viewed from above in FIG.

【符号の説明】[Explanation of symbols]

1 搬送ロ−ラ− 2 基板 3 基板搬送方向 4 シャワ−噴射洗浄液 5 未洗浄領域 6 アクアナイフ機構 7 アクアナイフ噴出洗浄液 8 アクアナイフの水流 9 シャワ−機構 10 汚染した洗浄液 11 汚染洗浄液の浸水水流 12 エア−ナイフ機構 13 ガイド 14 浸水防止の風圧 15 汚染洗浄液の排水 16 水流制御機構の設置距離 17 ガイド設置面 18 風圧構成面 19 噴射エア−(N21 Conveyor Roller 2 Substrate 3 Substrate Conveying Direction 4 Shower Spray Cleaning Liquid 5 Uncleaned Area 6 Aqua Knife Mechanism 7 Aqua Knife Spray Cleaning Liquid 8 Aqua Knife Water Flow 9 Shower Mechanism 10 Contaminated Cleaning Liquid 11 Contaminated Cleaning Liquid Immersion Water Flow 12 Air-knife mechanism 13 Guide 14 Wind pressure for preventing water infiltration 15 Drainage of contaminated cleaning liquid 16 Installation distance of water flow control mechanism 17 Guide installation surface 18 Wind pressure constituent surface 19 Jet air- (N 2 )

フロントページの続き (72)発明者 田中 正明 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 Fターム(参考) 2H088 FA21 FA30 HA01 HA03 MA04 MA18 2H090 JC19 LA04 LA15 MB01 3B201 AA01 AB14 BB22 BB90 BB92 BB98 CC12 CD31 CD41 Continued front page    (72) Inventor Masaaki Tanaka             1006 Kadoma, Kadoma-shi, Osaka Matsushita Electric             Sangyo Co., Ltd. F term (reference) 2H088 FA21 FA30 HA01 HA03 MA04                       MA18                 2H090 JC19 LA04 LA15 MB01                 3B201 AA01 AB14 BB22 BB90 BB92                       BB98 CC12 CD31 CD41

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】液晶を配向させるための配向膜を基板上に
形成し、前記配向膜にラビング処理を施した後、前記基
板をローラー搬送により搬送しながら前記基板表面の汚
れを除去する洗浄液を噴射して逐次洗浄する液晶表示素
子の製造方法であって、 前記噴射された洗浄液の流れ方向を制御することを特徴
とする液晶表示素子の製造方法。
1. A cleaning liquid for removing dirt on the surface of a substrate while forming an alignment film for aligning liquid crystals on a substrate, rubbing the alignment film, and transporting the substrate by roller transport. A method for manufacturing a liquid crystal display element, which comprises spraying and sequentially cleaning the liquid crystal display element, wherein the flow direction of the sprayed cleaning liquid is controlled.
【請求項2】圧送した洗浄液を基板表面に噴射し前記噴
射された洗浄液の水圧により前記基板表面の汚れを除去
する際に発生する汚れを含む洗浄液の流れ方向を、圧送
した高圧空気または窒素ガスのエア−にて制御すること
を特徴とする請求事項1記載の液晶表示素子の製造方
法。
2. A high-pressure air or nitrogen gas pressure-fed in which a cleaning liquid containing a stain is generated when the cleaning liquid pumped is sprayed onto the substrate surface and the contaminants on the substrate surface are removed by the water pressure of the sprayed cleaning liquid. 2. The method for producing a liquid crystal display element according to claim 1, wherein the liquid crystal display element is controlled by air.
【請求項3】圧送した高圧空気または窒素ガスの風圧お
よび前記汚れを含む洗浄液の水圧により、前記汚れを含
む洗浄液を基板の両端に排水し、前記汚れを含む洗浄液
が前記基板の表面を移動し、前記基板後方の未洗浄領域
に浸水することを防止する請求項2に記載の液晶表示素
子の製造方法。
3. The cleaning liquid containing the dirt is drained to both ends of the substrate by the pressure of the pressurized high-pressure air or the wind pressure of nitrogen gas and the water pressure of the cleaning liquid containing the dirt, and the cleaning liquid containing the dirt moves on the surface of the substrate. The method for manufacturing a liquid crystal display element according to claim 2, wherein the unwashed area behind the substrate is prevented from being flooded.
【請求項4】圧送した洗浄液を基板表面に噴射する洗浄
機構を備え、前記噴射された洗浄液の水圧により基板表
面の汚れを除去する洗浄装置であって、 前記噴射された洗浄液の水圧により基板表面の汚れを除
去する際に発生する汚れを含む洗浄液の流れ方向を制御
し、前記汚れを含む洗浄液が前記基板表面を移動し未洗
浄領域に浸水することを防止する浸水防止機構を備える
ことを特徴とする洗浄装置。
4. A cleaning device, comprising a cleaning mechanism for spraying a cleaning liquid pumped onto a substrate surface, for removing dirt on a substrate surface by the water pressure of the sprayed cleaning liquid, wherein the substrate surface is driven by the water pressure of the sprayed cleaning liquid. Is provided with a water immersion prevention mechanism that controls the flow direction of the cleaning liquid containing dirt generated when removing the dirt, and prevents the cleaning liquid containing the dirt from moving on the surface of the substrate and entering the uncleaned area. And cleaning equipment.
【請求項5】浸水防止機構が、圧縮流体を噴射するため
のエアーナイフと、前記エアーナイフ機構から噴出され
た前記圧縮流体の流れ方向を基板表面に対してほぼ水平
にするためのガイドとから構成されることを特徴とする
請求項4に記載の洗浄装置。
5. A water immersion prevention mechanism comprises an air knife for ejecting a compressed fluid and a guide for making the flow direction of the compressed fluid ejected from the air knife mechanism substantially horizontal to the substrate surface. The cleaning device according to claim 4, wherein the cleaning device is configured.
【請求項6】エアーナイフを洗浄機構に対して50〜3
00mmの距離に設置し、洗浄される基板に対してガイ
ドを、0.5〜5.0mmの低ギャップにて固定したこ
とを特徴とする請求項5記載に洗浄装置。
6. An air knife for the cleaning mechanism is 50 to 3
The cleaning device according to claim 5, wherein the cleaning device is installed at a distance of 00 mm, and the guide is fixed to the substrate to be cleaned with a low gap of 0.5 to 5.0 mm.
JP2001337662A 2001-11-02 2001-11-02 Manufacturing method and washing device for liquid crystal display element Pending JP2003140122A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001337662A JP2003140122A (en) 2001-11-02 2001-11-02 Manufacturing method and washing device for liquid crystal display element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001337662A JP2003140122A (en) 2001-11-02 2001-11-02 Manufacturing method and washing device for liquid crystal display element

Publications (1)

Publication Number Publication Date
JP2003140122A true JP2003140122A (en) 2003-05-14

Family

ID=19152262

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2003140122A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190019328A (en) * 2017-08-17 2019-02-27 주식회사 포스코 Scale discharge device
JP2019215536A (en) * 2018-06-13 2019-12-19 シャープ株式会社 Method for manufacturing substrate for liquid crystal and processing apparatus for substrate for liquid crystal
CN111007677A (en) * 2019-12-05 2020-04-14 Tcl华星光电技术有限公司 Color film substrate, preparation method thereof and display panel

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190019328A (en) * 2017-08-17 2019-02-27 주식회사 포스코 Scale discharge device
KR102094346B1 (en) * 2017-08-17 2020-03-30 주식회사 포스코 Scale discharge device
JP2019215536A (en) * 2018-06-13 2019-12-19 シャープ株式会社 Method for manufacturing substrate for liquid crystal and processing apparatus for substrate for liquid crystal
CN111007677A (en) * 2019-12-05 2020-04-14 Tcl华星光电技术有限公司 Color film substrate, preparation method thereof and display panel

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