JP2003133189A - Method of inspecting leakage current and inspection system - Google Patents
Method of inspecting leakage current and inspection systemInfo
- Publication number
- JP2003133189A JP2003133189A JP2001323083A JP2001323083A JP2003133189A JP 2003133189 A JP2003133189 A JP 2003133189A JP 2001323083 A JP2001323083 A JP 2001323083A JP 2001323083 A JP2001323083 A JP 2001323083A JP 2003133189 A JP2003133189 A JP 2003133189A
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- Japan
- Prior art keywords
- capacitor
- current
- charging
- voltage
- leakage current
- Prior art date
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Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、キャパシタの漏れ
電流の検査方法及び検査システムに関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and a system for inspecting a leakage current of a capacitor.
【０００２】[0002]
【従来の技術】近年、ハイブリッド自動車などの電動車
両等に使用される蓄電装置として、急速に充放電でき、
長寿命である電気二重層キャパシタを蓄電池として利用
されつつある。2. Description of the Related Art In recent years, as a power storage device used in electric vehicles such as hybrid vehicles, it can be rapidly charged and discharged.
Electric double layer capacitors, which have a long life, are being used as storage batteries.
【０００３】電気二重層キャパシタに対して、完成時の
性能検査として漏れ電流の検査を行うのが一般的であ
る。この漏れ電流の検査として、自己放電特性を調べる
ための放置試験が行われる。これは、セルを一定電圧ま
で充電し、そのまま一定時間放置した後の電圧を充電完
了直後の電圧と比較して漏れ電流の程度を間接的に把握
する試験である。図３に放置試験における電圧の経時変
化を示す。満充電時の電圧V0から一定時間経過後の電圧
がVdだけ低下する。この電圧低下に相当する減少比率を
用いてキャパシタの性能を評価することができる。例え
ば、１０時間放置し、電圧減少比率が規定値以下なら製
品として使用してよいというような判断基準を設けるこ
とができる。It is common to inspect the electric double layer capacitor for leakage current as a performance inspection at the time of completion. As an inspection of this leakage current, a standing test for examining self-discharge characteristics is performed. This is a test in which the cell is charged to a constant voltage, and the voltage after leaving it for a certain period of time is compared with the voltage immediately after completion of charging to indirectly grasp the degree of the leakage current. FIG. 3 shows the change with time in voltage in the standing test. The voltage after a certain time elapses from the fully charged voltage V0 by Vd. The performance of the capacitor can be evaluated using the reduction ratio corresponding to this voltage reduction. For example, it is possible to set a criterion such that the product may be left for 10 hours and used as a product if the voltage reduction ratio is equal to or less than a specified value.
【０００４】[0004]
【発明が解決しようとする課題】しかしながら、放置す
る時間として数日間を要さなければ、正確な漏れ電流の
評価をすることができないことが問題となっていた。当
然、品質を保証するためには、完成された全ての電気二
重層キャパシタセルの漏れ電流を検査する必要がある
が、充電から放置終了後の電圧を測るまでに多大な時間
を要してしまう。さらに、放置試験待ちのセルが溜まっ
てしまい、完成から検査までの時間が実質的に数日、数
十日となることもある。However, it has been a problem that the leakage current cannot be accurately evaluated unless it is left for several days. Of course, in order to guarantee the quality, it is necessary to inspect the leakage current of all the completed electric double layer capacitor cells, but it takes a lot of time from charging to measuring the voltage after leaving the battery. . Further, cells waiting for the leaving test may be accumulated, and the time from completion to inspection may be substantially several days or tens of days.
【０００５】本発明の目的は、短時間で漏れ電流を検査
し生産性を上げるための電気二重層キャパシタセルの検
査方法及び検査システムを提供することである。さら
に、電気二重層キャパシタセルの品質を判断しやすくす
るとともに、品質保証の精度を高めることを目的とす
る。An object of the present invention is to provide an inspection method and an inspection system for an electric double layer capacitor cell for inspecting leakage current in a short time to improve productivity. Further, it is intended to make it easier to judge the quality of the electric double layer capacitor cell and to improve the accuracy of quality assurance.
【０００６】[0006]
【課題を解決するための手段】このため、第１の発明
は、キャパシタの漏れ電流の検査方法において、前記キ
ャパシタを設定電圧まで充電した後、前記設定電圧を保
つよう前記キャパシタに充電し、前記キャパシタにおい
て前記設定電圧を保つ間に流れる定常電流Idを計測し、
前記定常電流に基づいて漏れ電流を評価することを特徴
とする。Therefore, the first invention is, in a method for inspecting leakage current of a capacitor, after charging the capacitor to a set voltage, charging the capacitor so as to maintain the set voltage, Measuring the steady-state current Id flowing while maintaining the set voltage in the capacitor,
The leakage current is evaluated based on the steady current.
【０００７】第２の発明は、第１の発明に係わるキャパ
シタの漏れ電流の検査方法において、前記キャパシタを
ゼロ電圧から前記設定電圧まで一定の電流値で充電し、
前記設定電圧を設定時間の間保った後、前記キャパシタ
を前記設定電圧からゼロ電圧まで一定の電流値で放電す
ることを特徴とする。A second invention is the method for inspecting leakage current of a capacitor according to the first invention, wherein the capacitor is charged with a constant current value from zero voltage to the set voltage,
After the set voltage is maintained for a set time, the capacitor is discharged at a constant current value from the set voltage to zero voltage.
【０００８】第３の発明は、キャパシタを充放電する充
放電装置と、前記充放電装置にデータ通信回線を通じて
接続し前記充放電装置を制御する制御装置とを備えたキ
ャパシタの漏れ電流の検査システムにおいて、前記充放
電装置は、設定時間の間、設定電圧を保ちながらキャパ
シタに流れる電流を測定し、前記制御装置は、前記充放
電装置から前記電流のデータを取得し、前記キャパシタ
において設定時間の間に流れる定常電流Idを演算するこ
とを特徴とする。A third aspect of the invention is a system for inspecting a leakage current of a capacitor, which comprises a charging / discharging device for charging / discharging a capacitor, and a control device connected to the charging / discharging device through a data communication line to control the charging / discharging device. In the charging / discharging device, the charging / discharging device measures a current flowing through a capacitor while maintaining a set voltage for a set time, the control device obtains data of the current from the charging / discharging device, and sets the setting time in the capacitor. The feature is that the steady current Id flowing between them is calculated.
【０００９】第４の発明は、第３の発明に係わるキャパ
シタの漏れ電流の検査システムにおいて、前記充放電装
置が、前記キャパシタをゼロ電圧から前記設定電圧まで
一定の電流で充電し、前記設定電圧を設定時間の間保っ
た後、前記キャパシタを前記設定電圧からゼロ電圧まで
一定の電流値で放電することを特徴とする。A fourth aspect of the present invention is the capacitor leakage current inspection system according to the third aspect, wherein the charging / discharging device charges the capacitor with a constant current from zero voltage to the set voltage, Is maintained for a set time, the capacitor is discharged at a constant current value from the set voltage to zero voltage.
【００１０】[0010]
【発明の効果】第１の発明においては、キャパシタの電
圧を設定電圧に保つように充電する間（緩和充電時）に
流れる定常電流を測定することにより、この定常電流を
用いて容易に漏れ電流を評価することができる。さら
に、製造後のキャパシタの性能検査時間が、大幅に短縮
できる。According to the first aspect of the present invention, by measuring the steady current flowing during charging (while relaxing charging) so that the voltage of the capacitor is kept at the set voltage, the leak current can be easily used by using this steady current. Can be evaluated. Furthermore, the performance inspection time of the capacitor after manufacturing can be greatly shortened.
【００１１】第２の発明においては、前記キャパシタを
ゼロ電圧から設定電圧まで一定の電流で充電し、設定電
圧からゼロ電圧まで一定の電流で放電することにより、
キャパシタの漏れ電流の検査に要する時間の把握が容易
になる。In the second invention, the capacitor is charged with a constant current from zero voltage to a set voltage and discharged from the set voltage to zero voltage with a constant current.
It becomes easy to understand the time required to inspect the leakage current of the capacitor.
【００１２】第３の発明においては、キャパシタの漏れ
電流の検査システムが、設定時間の間、設定電圧を保ち
ながらキャパシタに流れる電流を測定し、前記充放電装
置から前記電流のデータを取得し、前記キャパシタにお
いて設定時間の間に流れる定常電流Idを演算することに
より、定常電流Idに基づいて短時間で漏れ電流の検査が
可能な検査システムが提供される。In a third aspect of the present invention, a capacitor leakage current inspection system measures a current flowing through the capacitor while maintaining a set voltage for a set time, and obtains the current data from the charge / discharge device. By calculating the steady-state current Id flowing in the capacitor during the set time, it is possible to provide the inspection system capable of inspecting the leakage current in a short time based on the steady-state current Id.
【００１３】第４の発明は、前記キャパシタをゼロ電圧
から設定電圧まで一定の電流で充電し、設定電圧からゼ
ロ電圧まで一定の電流で放電することにより、検査時間
の把握が簡便である漏れ電流の検査システムを提供す
る。In a fourth aspect of the present invention, the capacitor is charged with a constant current from zero voltage to a set voltage and discharged with a constant current from the set voltage to the zero voltage, so that the inspection time can be easily grasped. Provide the inspection system.
【００１４】[0014]
【発明の実施の形態】図１を参照して、本発明の漏れ電
流の検査方法について説明する。本発明の漏れ電流の検
査は、電気二重層キャパシタセルを定格電圧付近の一定
の設定電圧Vaに設定時間Tdの間保持することにより行わ
れる。このとき、設定電圧Vaまで、一定電流Iaで充電す
る。その後、設定時間Tdの間、設定電圧Vaを保つように
充電（緩和充電）を行うが、この時充電電流は一定電流
Iaから急激に減少した後、実質的に一定とみなせる定常
電流値Idに収束する。BEST MODE FOR CARRYING OUT THE INVENTION With reference to FIG. 1, a leakage current inspection method of the present invention will be described. The leakage current test of the present invention is performed by holding the electric double layer capacitor cell at a constant set voltage Va near the rated voltage for a set time Td. At this time, the battery is charged with the constant current Ia up to the set voltage Va. After that, during the set time Td, charging (relaxation charging) is performed so as to maintain the set voltage Va. At this time, the charging current is a constant current.
After abruptly decreasing from Ia, it converges to a steady current value Id that can be considered substantially constant.
【００１５】発明者らの研究によると、この緩和充電時
に流れる定常電流Idは、漏れ電流と密接な関係をもつ。
実際に、上記の定常電流Idが、従来の放置試験において
漏れ電流の評価に用いられてきた自己放電時のセル電圧
の減少比率にほぼ比例することが確認されている。従っ
て、緩和充電時に流れている定常電流Idを測定すること
で、漏れ電流を直接的に評価することが可能となる。According to the research conducted by the inventors, the steady current Id flowing during the relaxation charge has a close relationship with the leakage current.
In fact, it has been confirmed that the above-mentioned steady current Id is almost proportional to the reduction ratio of the cell voltage during self-discharge, which has been used for the evaluation of leakage current in the conventional leaving test. Therefore, it is possible to directly evaluate the leakage current by measuring the steady-state current Id flowing during the relaxation charge.
【００１６】上記のように、本発明の漏れ電流の検査方
法は、直接的に漏れ電流を評価するものであり、従来の
ように電気二重層キャパシタの電圧の低下から漏れ電流
を測定するものではなく、また、充電の段階で漏れ電流
の度合いを判断し、試験時間を短縮することができる。As described above, the leakage current inspection method of the present invention directly evaluates the leakage current, and does not measure the leakage current from the decrease in the voltage of the electric double layer capacitor as in the prior art. In addition, the degree of leakage current can be judged at the charging stage, and the test time can be shortened.
【００１７】次に、図２を参照して、漏れ電流を検査す
るための充放電試験システムについて説明する。Next, a charge / discharge test system for inspecting leakage current will be described with reference to FIG.
【００１８】充放電試験システムは、電気二重層キャパ
シタセル１に対して充放電を行うものであり、充放電装
置２、パーソナルコンピュータ（PC)３、モニタ４、制
御装置５を備える。充放電装置２とパーソナルコンピュ
ータ（PC)３の相互間、及び、パーソナルコンピュータ
３と制御装置５の相互間は、ローカルエリアネットワー
ク（LAN)、RS-232C、GP-IB等のデータ通信回線で接続さ
れており、充放電装置２で取得されるキャパシタセル１
の充放電の情報、例えば、充放電電圧と充放電電流など
を互いに授受できるようになっている。The charging / discharging test system charges / discharges the electric double layer capacitor cell 1, and includes a charging / discharging device 2, a personal computer (PC) 3, a monitor 4, and a control device 5. The charging / discharging device 2 and the personal computer (PC) 3 and the personal computer 3 and the control device 5 are connected to each other by a data communication line such as a local area network (LAN), RS-232C, GP-IB. And the capacitor cell 1 that is acquired by the charging / discharging device 2
The charging / discharging information, such as charging / discharging voltage and charging / discharging current, can be exchanged with each other.
【００１９】充放電装置２は、キャパシタセル１のセル
電圧及びキャパシタセル１に流れる電流を測定でき、キ
ャパシタセル１の正極及び負極にケーブル等により結合
され、キャパシタセル１を充放電する。充放電装置２
は、予め設定可能なプログラムにより各種充放電特性を
自動的に測定することができ、定電圧モード、定電流モ
ードで充放電する機能等を具備している。充放電装置２
は、この機能を実現するためのマイクロプロセッサ等の
コントローラを備えている。また、充放電装置２は、A/
Dコンバータを備え、充電電圧と充放電電流のアナログ
データをそれぞれデジタルデータに変換し、データ通信
回線に送出する機能を備える。さらに、充放電装置２
は、制御装置５からのコマンドをパーソナルコンピュー
タ３を介して取得し、このコマンドに応じて充放電の開
始及び停止や、一定電圧又は一定電流モード等の充放電
モードの切換などを行う。The charging / discharging device 2 can measure the cell voltage of the capacitor cell 1 and the current flowing in the capacitor cell 1, and is connected to the positive electrode and the negative electrode of the capacitor cell 1 with a cable or the like to charge / discharge the capacitor cell 1. Charge / discharge device 2
Can automatically measure various charging / discharging characteristics by a presettable program and has a function of charging / discharging in a constant voltage mode or a constant current mode. Charge / discharge device 2
Has a controller such as a microprocessor for realizing this function. In addition, the charging / discharging device 2 is A /
It is equipped with a D converter, and has the function of converting the analog data of the charging voltage and charging / discharging current into digital data and sending it to the data communication line. Furthermore, the charging / discharging device 2
Acquires a command from the control device 5 via the personal computer 3, and starts and stops charging / discharging or switches charging / discharging modes such as a constant voltage or constant current mode in response to the command.
【００２０】なお、充放電装置２は、上記の機能を備え
るものであれば、市販のもの或いは公知のもので構わな
い。The charging / discharging device 2 may be a commercially available device or a known device as long as it has the above-mentioned functions.
【００２１】パーソナルコンピュータ３は、充放電装置
２から取得したデータをモニタ４に表示するために使用
される。さらに、充放電装置２から取得したデータをそ
のまま制御装置５へ送出する。モニタ４は、ＣＲＴや液
晶画面などにより構成されている。The personal computer 3 is used to display the data acquired from the charging / discharging device 2 on the monitor 4. Further, the data acquired from the charging / discharging device 2 is sent to the control device 5 as it is. The monitor 4 is composed of a CRT, a liquid crystal screen, or the like.
【００２２】制御装置５は、パーソナルコンピュータ３
とのデータの授受に使用する入出力（Ｉ/Ｏ）インター
フェース11、 各種データや各種プログラム等が記憶さ
れているＲＯＭ12、各種プログラムを実行するＣＰＵ1
3、各種データや各種プログラムが一時的に記憶されて
いるＲＡＭ14、バス15を備えている。ＲＡＭ14は、パー
ソナルコンピュータ３を介して受け取る充放電装置２か
らのデータを一時的に保存する。バス15は、（Ｉ/Ｏ）
インターフェース11、ＲＯＭ12、ＣＰＵ13、ＲＡＭ14を
結合する。The control device 5 is a personal computer 3
Input / output (I / O) interface 11 used for exchanging data with, ROM 12 in which various data and various programs are stored, CPU 1 for executing various programs
3. A RAM 14 and a bus 15 in which various data and various programs are temporarily stored are provided. The RAM 14 temporarily stores data received from the charging / discharging device 2 via the personal computer 3. Bus 15 is (I / O)
The interface 11, ROM 12, CPU 13, and RAM 14 are combined.
【００２３】次に、再び図１を参照して、上記充放電試
験システムを用いた本発明の漏れ電流の検査についての
具体例を説明する。Next, with reference to FIG. 1 again, a specific example of the leakage current inspection of the present invention using the charge / discharge test system will be described.
【００２４】検査開始時に、制御装置５は、充放電装置
２に検査を開始させるための開始指令信号をデータ通信
回線に送出する。充放電装置２は、この指令信号を受け
取ると同時に予め設定されたプログラムに基づいた充放
電を開始し、さらにプログラムに従って開始と同時にセ
ル電圧Ｖ、セル電流Ｉなどのデータを一定の時間間隔で
データ通信回線に送出する。パーソナルコンピュータ３
は、充放電装置２から受け取ったセル電圧Ｖとセル電流
Ｉのデータを経過時間に対してグラフ化してモニタ４に
表示する。さらにパーソナルコンピュータ３は、充放電
装置２から受け取ったセル電圧Ｖ、セル電流Ｉなどのデ
ータを制御装置５に送出する。At the start of the inspection, the control device 5 sends a start command signal for starting the inspection of the charging / discharging device 2 to the data communication line. The charging / discharging device 2 starts charging / discharging based on a preset program at the same time when it receives the command signal, and at the same time when starting according to the program, data such as the cell voltage V and the cell current I is data at regular time intervals. Send to communication line. Personal computer 3
Displays the data of the cell voltage V and the cell current I received from the charging / discharging device 2 as a graph with respect to the elapsed time and displays them on the monitor 4. Further, the personal computer 3 sends the data such as the cell voltage V and the cell current I received from the charging / discharging device 2 to the control device 5.
【００２５】充放電装置２は、キャパシタセル１を設定
電圧Vaまで、一定の電流Iaで充電する。その後、この設
定電圧Vaを保つようキャパシタセルに電流を流し充電を
行う。The charging / discharging device 2 charges the capacitor cell 1 up to a set voltage Va with a constant current Ia. After that, a current is passed through the capacitor cell to maintain this set voltage Va and charging is performed.
【００２６】制御装置５は、受け取ったセル電圧Ｖとセ
ル電流ＩのデータをＲＡＭ14に保存し、かつ、緩和充電
が完了したかどうかを判断し、緩和充電が完了している
場合には検査終了信号を充放電装置２に向けて送出す
る。緩和充電が完了しているかどうかの判断は、セル電
圧Ｖが設定電圧Vaに達してからの時間が設定時間Td以上
かどうか判断することで行われる。The control device 5 saves the received data of the cell voltage V and the cell current I in the RAM 14 and judges whether the relaxation charge is completed. If the relaxation charge is completed, the inspection is finished. The signal is sent to the charging / discharging device 2. The determination as to whether or not the relaxation charge is completed is made by determining whether the time after the cell voltage V reaches the set voltage Va is the set time Td or more.
【００２７】制御装置５は、緩和充電が完了している場
合には、検査終了指令信号を充放電装置２とパーソナル
コンピュータ３へ送出する。さらに、設定時間Tdの間、
つまり緩和充電時のキャパシタセルに流れる定常電流Id
を算出し、パーソナルコンピュータ３へ送出する。例え
ば、図４のように、緩和充電時に急激に充電電流が低下
した後、時間経過に対し電流値の変動が所定の範囲（図
４中の矢印で示す範囲）に収まるようになる場合の電流
の平均値を定常電流Idとして算出する。パーソナルコン
ピュータ３は、モニタ４に緩和充電時の定常電流Idの値
を表示する。定常電流Idにより、キャパシタセル１の漏
れ電流が評価され、キャパシタセル１が性能基準を満た
すかどうか判断することができる。定常電流Idが大きい
場合、漏れ電流が大きいということになる。When the relaxation charge is completed, the controller 5 sends an inspection end command signal to the charging / discharging device 2 and the personal computer 3. Furthermore, during the set time Td,
That is, the steady-state current Id flowing through the capacitor cell during relaxation charging
Is calculated and sent to the personal computer 3. For example, as shown in FIG. 4, the current in the case where the variation of the current value falls within a predetermined range (the range indicated by the arrow in FIG. 4) over time after the charging current sharply decreases during relaxation charging. The average value of is calculated as the steady current Id. The personal computer 3 displays on the monitor 4 the value of the steady-state current Id during the relaxation charge. From the steady-state current Id, the leakage current of the capacitor cell 1 can be evaluated, and it can be determined whether the capacitor cell 1 satisfies the performance standard. If the steady-state current Id is large, it means that the leakage current is large.
【００２８】さらに、この定常電流Idを、従来の放置試
験において漏れ電流の評価に用いられてきたセル電圧の
減少比率に換算するようにしてもよい。このようにすれ
ば、従来の放置試験に慣れた試験者にも違和感を与えな
い。Further, the steady current Id may be converted into a reduction rate of the cell voltage which has been used for evaluating the leakage current in the conventional leaving test. In this way, the tester who is accustomed to the conventional leaving test does not feel uncomfortable.
【００２９】その後、検査終了指令信号を受け取った充
放電装置２は、設定電圧V0からゼロ電圧まで一定電流で
キャパシタセルを放電させ、検査を終了する。After that, the charging / discharging device 2 that has received the inspection end command signal discharges the capacitor cells with a constant current from the set voltage V0 to zero voltage, and ends the inspection.
【００３０】このように、本発明による漏れ電流の検査
方法は、直接的に漏れ電流を測定するものであるため、
従来の放置試験による間接的な漏れ電流の検査方法に比
べて、短時間で検査を行うことができる。従って、従来
漏れ電流の検査（放置試験）に多大な時間をかけてきた
が、緩和充電時の電流を測定することによって、大幅に
検査時間を短縮でき早期に製品の品質を判断することを
可能となる。As described above, since the leakage current inspection method according to the present invention directly measures the leakage current,
The inspection can be performed in a short time as compared with the conventional indirect leakage current inspection method based on the leaving test. Therefore, it took a lot of time to inspect leakage current (leaving test), but by measuring the current during relaxation charging, the inspection time can be greatly shortened and the product quality can be judged early. Becomes
【００３１】なお、本発明は上記実施の形態に限定され
ない。例えば、セル電圧Ｖとセル電流Ｉのデータ等をモ
ニタ４に表示しない場合は、パーソナルコンピュータ３
とモニタ４を省略し、制御装置５を直接充放電装置２に
データ通信回線で接続してよい。ただし、この場合に
は、メモリーカード等の外部記憶手段に制御装置５が取
得したデータを保存する構成とする。また、本発明はキ
ャパシタセルだけでなく二次電池等の各種蓄電体に適用
可能である。さらに、本発明は、その技術的な思想の範
囲においてその他の種々の変更がなしうることは明白で
ある。The present invention is not limited to the above embodiment. For example, when the data such as the cell voltage V and the cell current I is not displayed on the monitor 4, the personal computer 3
The monitor 4 may be omitted, and the control device 5 may be directly connected to the charging / discharging device 2 via a data communication line. However, in this case, the data acquired by the control device 5 is stored in an external storage means such as a memory card. Further, the present invention can be applied not only to capacitor cells but also to various power storage bodies such as secondary batteries. Further, it is obvious that the present invention can be variously modified within the scope of the technical idea thereof.
【図１】本発明の漏れ電流の検査時におけるキャパシタ
の電圧及び電流の時間依存性を示す図。FIG. 1 is a diagram showing the time dependence of the voltage and current of a capacitor during a leakage current test of the present invention.
【図２】本発明の一実施形態に係る充放電試験システム
の概略構成図。FIG. 2 is a schematic configuration diagram of a charge / discharge test system according to an embodiment of the present invention.
【図３】従来の放置試験における電圧の経時変化を示す
図。FIG. 3 is a diagram showing a change with time in voltage in a conventional leaving test.
【図４】緩和充電時の電流の時間依存性を示し、かつ定
常電流の演算方法を説明する図。FIG. 4 is a diagram showing a time dependence of a current at the time of relaxation charge and explaining a method of calculating a steady current.
１ 電気二重層キャパシタセル ２ 充放電装置 ３ パーソナルコンピュータ ４ モニタ ５ 制御装置 1 Electric double layer capacitor cell 2 Charge / discharge device 3 personal computer 4 monitors 5 control device
───────────────────────────────────────────────────── フロントページの続き (72)発明者 吉野 誠 埼玉県上尾市大字壱丁目１番地 日産ディ ーゼル工業株式会社内 Ｆターム(参考） 5E082 AB09 MM31 MM32 ─────────────────────────────────────────────────── ─── Continued front page (72) Inventor Makoto Yoshino 1-chome Ichichome, Ageo City, Saitama NISSAN DI Within Hazel Industry Co., Ltd. F-term (reference) 5E082 AB09 MM31 MM32
Claims (4)
て、 前記キャパシタを設定電圧まで充電した後、前記設定電
圧を保つよう前記キャパシタに充電し、 前記キャパシタにおいて前記設定電圧を保つ間に流れる
定常電流Idを計測し、 前記定常電流に基づいて漏れ電流を評価することを特徴
とする漏れ電流の検査方法。1. A method for inspecting a leakage current of a capacitor, comprising: charging the capacitor to a set voltage, then charging the capacitor so as to maintain the set voltage; A method for inspecting leakage current, which comprises measuring the current Id and evaluating the leakage current based on the steady current.
圧まで一定の電流値で充電し、前記設定電圧を設定時間
の間保った後、前記キャパシタを前記設定電圧からゼロ
電圧まで一定の電流値で放電することを特徴とする請求
項１記載の漏れ電流の検査方法。2. The capacitor is charged with a constant current value from zero voltage to the set voltage, the set voltage is maintained for a set time, and then the capacitor is charged with a constant current value from the set voltage to zero voltage. The method for inspecting leakage current according to claim 1, wherein discharging is performed.
記充放電装置にデータ通信回線を通じて接続し前記充放
電装置を制御する制御装置とを備えたキャパシタの漏れ
電流の検査システムであって、 前記充放電装置は、設定時間の間、設定電圧を保ちなが
らキャパシタに流れる電流を測定し、 前記制御装置は、前記充放電装置から前記電流のデータ
を取得し、前記キャパシタにおいて設定時間の間に流れ
る定常電流Idを演算することを特徴とする漏れ電流の検
査システム。3. A leakage current inspection system for a capacitor, comprising: a charging / discharging device for charging / discharging a capacitor; and a control device connected to the charging / discharging device through a data communication line to control the charging / discharging device. The charging / discharging device measures a current flowing through a capacitor while maintaining a set voltage for a set time, the control device obtains the current data from the charge / discharge device, and the capacitor acquires a set time during the set time. A leak current inspection system characterized by calculating a flowing steady current Id.
電圧から前記設定電圧まで一定の電流で充電し、前記設
定電圧を設定時間の間保った後、前記キャパシタを前記
設定電圧からゼロ電圧まで一定の電流値で放電すること
を特徴とする請求項３記載の検査システム。4. The charging / discharging device charges the capacitor with a constant current from zero voltage to the set voltage, maintains the set voltage for a set time, and then charges the capacitor from the set voltage to zero voltage. The inspection system according to claim 3, wherein the discharge is performed at a constant current value.
Priority Applications (1)
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|---|---|---|---|
| JP2001323083A JP2003133189A (en) | 2001-10-22 | 2001-10-22 | Method of inspecting leakage current and inspection system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001323083A JP2003133189A (en) | 2001-10-22 | 2001-10-22 | Method of inspecting leakage current and inspection system |
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| Publication Number | Publication Date |
|---|---|
| JP2003133189A true JP2003133189A (en) | 2003-05-09 |
Family
ID=19140026
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001323083A Pending JP2003133189A (en) | 2001-10-22 | 2001-10-22 | Method of inspecting leakage current and inspection system |
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