JP2003121506A - 電子機器テスト回路 - Google Patents

電子機器テスト回路

Info

Publication number
JP2003121506A
JP2003121506A JP2001320772A JP2001320772A JP2003121506A JP 2003121506 A JP2003121506 A JP 2003121506A JP 2001320772 A JP2001320772 A JP 2001320772A JP 2001320772 A JP2001320772 A JP 2001320772A JP 2003121506 A JP2003121506 A JP 2003121506A
Authority
JP
Japan
Prior art keywords
circuit
clock signal
mhz
signal
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2001320772A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003121506A5 (enExample
Inventor
Takahisa Ogawa
隆央 小川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2001320772A priority Critical patent/JP2003121506A/ja
Priority to US10/273,170 priority patent/US6741094B2/en
Publication of JP2003121506A publication Critical patent/JP2003121506A/ja
Publication of JP2003121506A5 publication Critical patent/JP2003121506A5/ja
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2001320772A 2001-10-18 2001-10-18 電子機器テスト回路 Withdrawn JP2003121506A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2001320772A JP2003121506A (ja) 2001-10-18 2001-10-18 電子機器テスト回路
US10/273,170 US6741094B2 (en) 2001-10-18 2002-10-18 Electronic apparatus test circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001320772A JP2003121506A (ja) 2001-10-18 2001-10-18 電子機器テスト回路

Publications (2)

Publication Number Publication Date
JP2003121506A true JP2003121506A (ja) 2003-04-23
JP2003121506A5 JP2003121506A5 (enExample) 2005-06-23

Family

ID=19138110

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001320772A Withdrawn JP2003121506A (ja) 2001-10-18 2001-10-18 電子機器テスト回路

Country Status (2)

Country Link
US (1) US6741094B2 (enExample)
JP (1) JP2003121506A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118826956A (zh) * 2023-11-07 2024-10-22 中国移动通信有限公司研究院 信息传输方法、装置、设备和存储介质

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7161992B2 (en) * 2001-10-18 2007-01-09 Intel Corporation Transition encoded dynamic bus circuit
US7005885B1 (en) * 2003-02-21 2006-02-28 Aeluros, Inc. Methods and apparatus for injecting an external clock into a circuit
US7154300B2 (en) * 2003-12-24 2006-12-26 Intel Corporation Encoder and decoder circuits for dynamic bus
US7272029B2 (en) * 2004-12-29 2007-09-18 Intel Corporation Transition-encoder sense amplifier

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6202103B1 (en) * 1998-11-23 2001-03-13 3A International, Inc. Bus data analyzer including a modular bus interface
JP4106851B2 (ja) 2000-04-05 2008-06-25 セイコーエプソン株式会社 テスト回路付きリンク層デバイス及びテスト回路付き物理層デバイス
JP4032660B2 (ja) * 2001-04-06 2008-01-16 セイコーエプソン株式会社 半導体チップのテスト方法、半導体チップのテスト実施装置、及び半導体チップ

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118826956A (zh) * 2023-11-07 2024-10-22 中国移动通信有限公司研究院 信息传输方法、装置、设备和存储介质

Also Published As

Publication number Publication date
US6741094B2 (en) 2004-05-25
US20030093724A1 (en) 2003-05-15

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