JP2003057114A - Spectral sensitivity measuring device for pigment- sensitized solar battery - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a spectral sensitivity measuring device for pigment- sensitized solar battery capable of exact measurement of spectral sensitivity for monochromatic light. SOLUTION: The device comprises a monochromatic light irradiator 11 for condensing monochromatic light SB produced by a monochromatic light source 111 with a condensing mirror 112 and irradiating a pigment-sensitized solar battery cell (CUT) to be measured by way of an incidence optical system 113, an incidence slit 114 and an emission optical system 115, a bias irradiator 12 for irradiating with white bias light BB generated by a bias light source 121 overlapping the monochromatic light SB, and a spectral sensitivity measuring device 13 for measuring the output signal of the pigment-sensitized solar battery cell to be measured. The intensity of the monochromatic light SB produced by the monochromatic light source 111 is let 0.5 to 5 mW/c.

Description

Detailed Description of the Invention

[0001]

TECHNICAL FIELD The present invention relates to a spectral sensitivity measuring device for a dye-sensitized solar cell capable of accurately measuring the spectral sensitivity of monochromatic light.

[0002]

BACKGROUND OF THE INVENTION Dye-sensitized solar cells are attracting attention as low-cost solar cells because they are inexpensive materials and do not require large-scale equipment for manufacturing. Generally, a dye-sensitized solar cell has an electrochemical cell structure through an iodine solution, and specifically, a transparent conductive glass plate has a T-shaped structure.
It is composed of an electrode on which an io ₂ powder is baked and a dye (DYE) is adsorbed, and a counter electrode of a conductive glass plate coated with graphite or platinum.

Spectral sensitivity measuring device 9 for dye-sensitized solar cell
17, includes a monochromatic light irradiation device 91, a bias light irradiation device 92, and a spectral sensitivity measurement device 93. Light emitted from the monochromatic light irradiation device 91 and the bias light irradiation device 92. To a dye-sensitized solar cell to be measured (hereinafter, referred to as “cell to be measured”) CUT,
In this state, the spectral sensitivity measuring device 93 measures.

The monochromatic light irradiator 91 is a cell to be measured CUT.
Is irradiated with monochromatic light (for example, an intensity of 50 μmW / cm ² ) SB, and a monochromatic light source 911, a condenser mirror 912,
Incident optical system (condensing lens) 913 and incident slit 91
4, the monochromator 915, and the exit slit 916.
And an emission optical system (condensing lens) 917.

That is, along the optical axis, a condenser mirror 912, a monochromatic light source 911, an incident optical system 913, an incident slit 914, and the like.
The monochromator 915, the exit slit 916, and the exit optical system 917 are arranged in this order. Part of the light emitted from the monochromatic light source 911 is directly given to the entrance optical system 913, and the other part is reflected by the condenser mirror 912. The incident optical system 9
Given to 13. Then, the converged light converged by the incident optical system 913 is given to the monochromator 915 through the incident slit 914, and a desired light component obtained by being separated by the monochromator 915 is emitted from the exit slit 916.
Exit from. The emitted light is condensed by the emission optical system 917 and applied to the measured cell CUT.

The bias light irradiation device 92 generates white bias light (for example, intensity 100 mW / cm ² : also referred to as pseudo sunlight) BB. That is, the bias light source 9
The white bias light BB generated by 21 is superimposed on the monochromatic light SB and is irradiated on the measured cell CUT.

The spectral sensitivity measuring device 93 is a cell to be measured CU.
The output signal of T is measured, and the current component of the monochromatic light SB can be obtained by subtracting the current component of the white bias light BB from the measured value (current value). In addition,
The spectral sensitivity measurement device 93 incorporates a lock-in amplifier (not shown) used in the AC measurement mode.

At the time of measuring the spectral sensitivity, the bias light irradiation device 92 applies the white bias light BB to the measured cell CU.
Irradiate T to excite the cell, to irradiate the cell to be measured CUT with the monochromatic light SB superimposed thereon, in the DC measurement mode and A
Only the monochromatic light SB component of the photocurrent in the C measurement mode is extracted.

However, as shown in FIG. 3, the S / N ratio of the spectral sensitivity (A / W) depends on the intensity of the monochromatic light SB. In FIG. 3, the spectral sensitivity of monochromatic light having high intensity is indicated by (solid line), and the spectral sensitivity of monochromatic light having low intensity is indicated by broken line.
It is indicated by.

However, in the spectral sensitivity measuring device 9 of FIG. 17, since the monochromatic light intensity is weak, a good S / N ratio cannot be obtained and accurate measurement cannot be performed. Further, since the uniformity of the illuminance distribution is important in the spectral sensitivity measurement, in the spectral sensitivity measuring device 9 shown in FIG. 17, the monochromatic light SB condensed by the condenser mirror 912 is incident on the incident optical using a convex lens. There is no choice but to adopt a configuration in which the light is emitted from the entrance slit 914 via the system 913. Therefore, the solid angle that can be used by the monochromatic light source 911 is small (only a part of the light generated by the monochromatic light source can be used), and it is difficult to obtain strong illuminance.

In the spectral sensitivity measuring device 9 of FIG. 17, the intensity of the monochromatic light SB (50 μmW / cm ² ) is 1/2000 with respect to the intensity of the white bias light BB (100 mW / cm ² ).
There is nothing. FIG. 18 shows the level relationship between the photocurrent i _{SB of the} monochromatic light SB and the photocurrent i _BB of the white bias light BB measured by the spectral sensitivity measurement device 93 in the AC measurement mode.

In particular, the dye-sensitized solar cell under research and development has poor sensitivity and a low S / N ratio, so that the monochromatic light SB
Is buried in the noise of the white bias light BB, for example, it is impossible to extract only the monochromatic light SB in the DC measurement mode, and accurate measurement cannot be performed in the AC measurement mode.

Further, in the spectral sensitivity measuring device 9 of FIG. 17, a short-focus objective lens is used for the emission optical system (condensing lens) 917 to obtain a reduced image. The operating distance is extremely short and the operability is poor.

The present invention has been made in view of the above background, and an object thereof is to solve the above problems and to accurately measure the spectral sensitivity of monochromatic light. Another object of the present invention is to provide a spectral sensitivity measuring device.

[0015]

A spectral sensitivity measuring device for a dye-sensitized solar cell of the present invention (hereinafter, referred to as "spectral sensitivity measuring device") uses a condensing mirror to convert monochromatic light generated by a monochromatic light source. Focusing, incident optical system, incident slit, monochromator,
Through the emission slit and the emission optical system, a monochromatic light irradiating means for irradiating the measured cell, a bias light irradiating means for irradiating the white bias light generated by the bias light source by superimposing it on the monochromatic light, and a measured cell of the measured cell. A spectral sensitivity measuring unit for measuring an output signal is included, and the intensity of monochromatic light generated by the monochromatic light source is 0.5 to ⁵ mW / cm ² .

The monochromatic light intensity in the usual spectral sensitivity measurement is about 50 μW / cm ² as described in FIG. Therefore, the monochromatic light intensity in the present invention is
It is about 100 times the monochromatic light intensity in the spectral sensitivity measurement of FIG. If the monochromatic light intensity is high, the S / N ratio of the spectral sensitivity curve in FIG. 17 is large, and accurate measurement can be performed even in the DC measurement mode of monochromatic light.

In the spectral sensitivity measuring device of the present invention, a xenon lamp, a halogen lamp or the like can be used as a monochromatic light source, and the intensity of monochromatic light emitted by the xenon light source is 0.5 to ⁵ mW / cm ² . be able to. As a light source for the white bias light, a xenon lamp, a halogen lamp, or the like (for example, an intensity of 50 to 500 mW /
cm ² ) can be used.

In the spectral sensitivity measuring apparatus of the present invention, the entrance optical system can include a donut prevention lens system for preventing the donut from changing in the illuminance distribution just before the entrance slit.
Specifically, a concave lens can be used as the donut prevention lens system. By providing this lens, even if the monochromatic light source is in the shadow of the reflecting mirror (condensing mirror), good uniformity of irradiation distribution of monochromatic light is realized.

In the spectral sensitivity measuring device of the present invention, a retrofocus lens can be incorporated in the emission optical system. This makes it possible to obtain an emission optical system having a short focal length and a long working distance (distance between the emission optical system and the cell to be measured), which is excellent in operability. It becomes possible to provide.

Further, in the spectral sensitivity measuring device of the present invention,
A fly-eye lens can be incorporated in the emission optical system to be used as a monochromatic light secondary light source. This also makes it possible to make the illuminance distribution of the monochromatic irradiation light uniform. By combining this fly-eye lens with the retrofocus lens described above, it is possible to simultaneously improve operability and make the illuminance distribution uniform.

Further, in the spectral sensitivity measuring device of the present invention, the spectral sensitivity measuring means may include a correcting means for removing dark current from the detection signal generated in the cell to be measured.
Dark current results from the chemical current flowing through the electrolyte of a dye-sensitized solar cell. By removing this, an accurate spectral sensitivity spectrum can be obtained.

The spectral sensitivity measuring apparatus of the present invention can be provided with an optical chopper having an extremely low frequency operation function. It is preferable that this optical chopper uses a servo motor as a motor, and that the optical blade is directly connected to the servo motor rotating shaft. By doing so, the optical chopper can realize stable chopping of monochromatic light at an extremely low frequency.

In the spectral sensitivity measuring device of the present invention, two photo interrupters are provided at positions where the optical blades have different phases, and the spectral sensitivity measuring means latches one detection signal of the photo interrupter with the other detection signal. A latch circuit can be provided. With this configuration,
Chattering does not occur even when the servomotor is driven at an extremely low speed.

When the spectral sensitivity measuring device of the present invention has a function of displaying the chopping frequency, the frequency of the optical chopper can be displayed based on the frequency of the output signal of the encoder mounted on the shaft of the servo motor. it can.

For example, when frequency display is performed based on the detection signal of the photo interrupter provided in the optical chopper,
It takes a long time to display the servo motor when it is driven at an extremely low speed. On the other hand, when the frequency is displayed based on the output signal of the encoder attached to the shaft of the servo motor, the frequency of the optical chopper can be displayed in a short time (that is, in real time).

[0026]

1 shows a preferred embodiment of a spectral sensitivity measuring apparatus according to the present invention. As shown in the figure, the basic configuration is the same as the conventional one, and the spectral sensitivity measurement device 1 includes a monochromatic light irradiation device 11, a bias light irradiation device 12, and a spectral sensitivity measurement device 13. That is, the monochromatic light emitted from the monochromatic light irradiation device 11 in the state where the bias light emitted from the bias light irradiation device 12 is applied to the measured cell CUT is the measured cell CUT.
The measurement is performed by the spectral sensitivity measurement device 13 based on the output signal of the measured cell CUT at that time.

Then, the spectral sensitivity measuring apparatus 1 in this embodiment is driven by driving an optical chopper 116 described later.
Spectral sensitivity can be measured in the C measurement mode, and when stopped, spectral sensitivity can be measured in the DC measurement mode.

The monochromatic light irradiating device 11 is a cell to be measured CUT.
The monochromatic light source 111, the condenser mirror 112, the incident optical system (condenser lens group) 113,
It includes an entrance slit 114, a monochromator, an exit slit, and an exit optical system 115. That is, along the optical axis, the condenser mirror 112, the monochromatic light source 111, the incident optical system 113,
The entrance slit 114, the monochromator 117, the exit slit 118, and the exit optical system 115 are arranged in this order, and a part of the light emitted from the monochromatic light source 111 is directly incident on the entrance optical system 1.
13 and the other part is reflected by the condenser mirror 112 and given to the incident optical system 113. Then, the converged light converged by the incident optical system 113 is incident slit 1
After passing through 14, it becomes a monochromator 117, in which the desired spectrum is emitted and emitted from the emission slit 118. The emitted light is applied to the cell to be measured CUT via the emission optical system 115.

In this embodiment, a high intensity (for example, several hundred W to several thousand W) xenon lamp is used as the monochromatic light source 111, and an elliptical condensing mirror having high light utilization efficiency is used as the condensing mirror 112. Has been.

Further, the exit slit 118 and the exit optical system 1
An optical chopper 116 is interposed between the 15 parts. The optical chopper 116 includes a servo motor 1161 and an optical blade 1162. Here, servo motor 1
As the device 161, a device that can be stably driven at an ultra-low speed is adopted. The optical chopper 116 is driven in the AC measurement mode, but is not driven in the DC measurement mode. By directly connecting the optical blade 1162 to the shaft of the servo motor 1161, it is possible to realize the optical chopper 116 having a wide variable range from high frequency to ultra low frequency.

FIG. 2 is a front view of the optical chopper 116. The optical blade 1162 has a phase (signal phase) of 1 / π.
It consists of a disk with two fan-shaped openings O ₁ and O ₂ having different central angles of 90 °. In addition, as shown in FIG. 1, the photo interrupter 1 is connected to the optical blade 1162.
121 is provided.

The bias light irradiation device 12 generates white bias light BB. The white bias light BB is superimposed on the monochromatic light SB and is applied to the measured cell CUT. The bias light irradiation device 12 is a device generally used in the technical field of spectral sensitivity measurement. Therefore, in the figure, only the bias light source 121 is shown, and the illustration of other configurations is omitted. In this embodiment, a xenon lamp having an intensity of 100 mW / cm ² is used as the bias light source 121.

The spectral sensitivity measuring device 13 has a lock-in amplifier (not shown) built therein, and the lock-in amplifier can extract the photocurrent in the AC measurement mode of the cell CUT to be measured.

In the DC measurement mode, the optical chopper 116 is used.
Adjusts the rotation position of the optical blade 1162 so that the monochromatic light SB passes through the fan-shaped opening O ₁ or O ₂ , and stops the operation of the servo motor 1161. Then, the measured cell CUT is irradiated with the white bias light BB by the bias light irradiation device 12 to excite the measured cell CUT, and the monochromatic light SB is irradiated by superposing the monochromatic light SB on the measured cell CUT. . After that, the photosensitivity of the cell to be measured CUT is detected by the spectral sensitivity measuring device 13, and the monochromatic light SB component is extracted from this photocurrent.

In the spectral sensitivity measuring device 1 shown in FIG. 1, since the intensity of the monochromatic light SB is high, a good spectral sensitivity (that is, a good S / N ratio) is obtained as shown by the solid line in FIG. be able to. The noise of normal white bias light BB is 1
% Or less. Therefore, in the DC measurement mode,
The monochromatic light SB is not buried in the noise of the white bias light BB.

In the AC measurement mode, the optical chopper 116 operates the servo motor 1161 at an extremely low speed. Then, the bias light irradiation device 12 irradiates the measured cell CUT with the white bias light BB, and the monochromatic light irradiation device 11 causes the monochromatic light S having a predetermined frequency according to the rotation speed of the servo motor 1161.
B is superimposed on the measured cell CUT and irradiated.

FIG. 4 is a diagram showing the level relationship between the photocurrent i _SB due to the monochromatic light SB and the photocurrent i _BB due to the white bias light BB in the AC measurement mode. As shown in FIG. 4, in the present embodiment, since the monochromatic light SB is 1/20 of the white bias light BB, as described above, the monochromatic light S
B is not buried in the noise of the white bias light BB.

In the synchronous detection system using the lock-in amplifier, when the fluctuation of the rotation speed of the optical blade 1162 becomes large, the monochromatic light SB passing through the optical blade 1162 and the detection signal (photocurrent i _SB ) cannot be synchronized. , Will result in an error.
In the present embodiment, since the servo motor 1161 whose speed fluctuation is small even at the ultra-low speed rotation is used, the above error does not occur.

The optical chopper 11 shown in FIGS. 1 and 2.
In the present invention, instead of 6, the optical chopper 1 shown in FIG.
16 'can also be adopted. In this optical chopper, an optical blade 1162 is rotated by a motor 1164 to which a speed reducer (belt in the figure) 1165 is connected.

However, in the AC measurement mode, the monochromatic light SB
In many cases, the photocurrent i _SB is measured by increasing the irradiation frequency of. Therefore, in the present embodiment, as shown in FIGS. 1 and 2, the servo motor 1161 is used as the motor of the optical chopper 116.

In the spectral sensitivity measuring apparatus 1 of FIG. 1, the servo motor 1161 can rotate the optical blade 1162 at an extremely low speed, so that the dye-sensitized solar cell (measurement target) to be measured has a slow response to light irradiation. The spectral sensitivity of the cell CUT) can be accurately measured.

The optical chopper 11 shown in FIGS. 1 and 2.
In 6, when the servo motor 1161 is driven at an extremely low speed,
The photo interrupter 1121 has fan-shaped openings O ₁ and O _2.
The optical blade 1162 may vibrate due to inertia when detecting the edge of the. This vibration causes chattering, and jitter occurs in the detection signal of the photo interrupter 1121 as shown in FIG.

In order to prevent the occurrence of chattering, as shown in FIG. 7, the optical blade 1162 of the optical chopper 116 has a different phase (in FIG. 7, the phase difference between the signals is 9).
(0 °) Two photo interrupters 1121 and 1122 can be provided.

Further, in FIG. 7, the spectral sensitivity measuring device 13
In addition, a latch circuit 131 is provided. The latch circuit 131 uses the detection signal of the photo interrupter 1121 as a latch signal and the detection signal of the photo interrupter 1121 as an input signal of the latch circuit 131.

FIG. 8A shows an input signal of the latch circuit 131 (detection signal of the photo interrupter 1122) as shown in FIG.
(B) shows a latch signal of the latch circuit 131 (a detection signal of the photo interrupter 1121). Even if jitter occurs in the input signal or the latch signal of the latch circuit 131, no jitter occurs in the output signal of the latch circuit 131 as shown in FIG. 8C.

By the way, the condenser mirror 1 of the monochromatic light irradiation device 11
The light reflected from 12 is blocked by the monochromatic light source 111, and
In some cases, a toroidal illuminance distribution is formed in the measured cell CUT as shown in FIG. In the monochromatic light irradiation device 11 of FIG. 9, the illustration of the entrance optical system 113 and the exit optical system 115 is omitted for convenience of description.

In this case, as shown in FIG. 10, a lens system in which a concave lens 1131 is arranged immediately before the entrance slit 114 can be adopted as the entrance optical system 113 of the monochromatic light irradiation device 11. The concave lens 1131 acts as a donut prevention lens system that prevents the illuminance distribution from becoming a donut shape. In FIG. 10, for convenience of explanation, the incident optical system 113 is shown by a concave lens 1131 and the output optical system 115 is not shown. By using a cone lens, it is possible to eliminate the donut from the illuminance distribution, but there is a problem that the price is high. Therefore, in this embodiment, the concave lens 1131 is used as the donut prevention lens system.

Not only when the concave lens 1131 is not used in the incident optical system 113 but also when the concave lens 1131 is adopted, the illuminance distribution of the monochromatic light SB irradiated on the cell to be measured CUT may become nonuniform. . In such a case, a fly-eye lens (see reference numeral 1152 in FIG. 12) can be incorporated in the emission optical system 115 as described later. With this fly-eye lens, it is possible to realize high intensity and good illuminance uniformity in monochromatic light.

The emission optical system 1 of the monochromatic light irradiation device 11 of FIG.
A plurality of convex lenses 1151 as shown in FIG. 11 can be used for 15 as a condenser lens. In the short-focus objective lens of the emission optical system 115 shown in FIG.
Since only a short working distance can be provided between the UT and the UT, the operability of setting the cell to be measured CUT may be deteriorated.

When it is desired to have a long working distance with the cell to be measured CUT, as shown in FIG.
A retro focus lens 1153 can be adopted as 15. In FIG. 12, as the emission optical system 115,
Collimator lens 1154, fly-eye lens 115
2, the retrofocus lens 1153 is arranged in this order. As a result, the light collimated by the collimator lens 1154 is converted into parallel rays, and
52, the fly-eye lens 1152 is used as a monochromatic light secondary light source to irradiate the cell CUT to be measured with monochromatic light SB via the retrofocus lens 1153.

As a result, the measured cell CU of monochromatic irradiation light is measured.
The distribution on the T surface is made uniform and the measured cell C
It is possible to improve the operability of the spectral sensitivity measurement device 1 such as securing a space for setting the UT.

In the dye-sensitized solar cell, the chemical current flowing through the electrolytic solution is large and fluctuates, so that this becomes a dark current that does not depend on light irradiation, and an error occurs in the measurement current of the spectral sensitivity of the monochromatic light SB.

Furthermore, a correction device (not shown) for removing the dark current component from the spectral sensitivity measurement value of the cell to be measured CUT can be provided. With this correction device, the dark current component can be subtracted from the measured value of the spectral sensitivity for each measurement wavelength to obtain the spectral sensitivity.

The dark current can be obtained by inserting a shutter in the optical path of the monochromatic light SB and subtracting the spectral sensitivity measurement value after the shutter insertion from the spectral sensitivity measurement value before the shutter insertion.

FIG. 13 shows a spectrum when the dark current is measured only once immediately before the measurement of the spectral sensitivity and the spectral sensitivity is corrected by the measured value. Here, the measured current i
_The dark current component i _D is subtracted from _R to obtain the measured current i _S , and the actual dark current fluctuation component i _DD is indicated by a broken line. In this correction, the dark current is measured only once at the start of measurement, and therefore, when the dark current varies with time, an accurate spectrum may not be obtained.

FIG. 14 shows immediately before measurement, immediately after measurement, and optical measurement.
The dark current is measured when switching elements and based on these values.
Shows a spectrum when dark current is complemented.
In this correction, the measured current i at each measurement wavelength is_RComplement from
Dark current i_DSince we have subtracted
You can get In FIG. 14, the actual dark current i
_DDIs indicated by a broken line, and the complementary value i_DIs indicated by a double-headed arrow. Na
In FIGS. 13 and 14, the Ti of the measured cell CUT is
O_TwoPeak due to and dye (DYE) peak
Is indicated by an outline arrow.

In the present embodiment, the spectral sensitivity measuring device 1 can be provided with the frequency display function of the optical chopper.
In FIG. 15, the optical blade 1162 of the optical chopper 116 is shown.
Although the frequency is displayed on the display 14 by the output signal of the photo interrupter 1121 provided in the above, if the rotation of the optical blade 1162 becomes an extremely low frequency, it takes a long time until the frequency display is updated.

In order to eliminate this inconvenience, as shown in FIG. 16 (a view of the optical chopper 116 viewed from the servo motor 1161 side), a frequency is displayed on the display 14 by using the output pulse of the encoder 1166 of the servo motor 1161. You can The encoder 1166 of the servo motor 1161 can count several thousand counts per rotation. Therefore, the frequency display of the optical chopper is performed based on this output signal, the update time of the rotation frequency display of the optical blade 1162 can be shortened, and the frequency can be changed / set in a short time.

[0059]

EFFECT OF THE INVENTION Regardless of the spectral sensitivity measuring device of the dye-sensitized solar cell of the present invention, the DC measuring mode and the AC measuring mode,
It is possible to accurately measure the spectral sensitivity of monochromatic light.

[Brief description of drawings]

FIG. 1 is a diagram showing an embodiment of a spectral sensitivity measuring apparatus for a dye-sensitized solar cell according to the present invention.

FIG. 2 is a front view of an optical chopper and is a diagram showing a spectral sensitivity measuring device.

FIG. 3 is a diagram showing spectral sensitivities when monochromatic light intensity is strong and weak.

FIG. 4 is a diagram showing a level relationship between a photocurrent caused by monochromatic light and a photocurrent caused by white bias light in an AC measurement mode.

FIG. 5 is a diagram showing an optical chopper that rotates an optical blade by a motor to which a speed reducer is connected.

FIG. 6 is a diagram showing a detection signal of a photo interrupter in which jitter caused by chattering has occurred.

FIG. 7 is a diagram showing an optical chopper in which the occurrence of jitter is prevented by two photo interrupters and a latch circuit provided in the spectral sensitivity measurement apparatus.

8A to 8C are diagrams showing a latch signal, an input signal, and an output signal of a latch circuit, respectively.

FIG. 9 is a diagram showing a state in which the light reflected from the condenser mirror of the monochromatic light irradiation device is blocked by the monochromatic light source, and a donut-shaped illuminance distribution is formed in the measured cell.

FIG. 10 is a diagram showing a state in which a donut-shaped illuminance distribution is not generated in a cell to be measured by disposing a concave lens immediately before an entrance slit as an incident optical system of a monochromatic light irradiation device.

FIG. 11 is a diagram showing a case where a plurality of convex lenses are used in the emission optical system of the monochromatic light irradiation device.

FIG. 12 is a diagram showing a case where a retrofocus lens is adopted as an emission optical system in order to maintain a long working distance between the emission optical system of the monochromatic light irradiation device and the cell to be measured.

FIG. 13 is a spectrum diagram showing an actual measurement value obtained when the dark current is obtained only once immediately before the spectral sensitivity measurement, and a corrected photocurrent obtained by subtracting the dark current from the actual measurement value.

FIG. 14 is a diagram showing spectra when dark currents are obtained immediately before measurement, immediately after measurement, and at the time of switching optical elements, and dark currents at respective measurement wavelengths are complemented based on these values.

FIG. 15 is an explanatory diagram of a frequency display function of the optical chopper of the spectral sensitivity measurement device, and is a diagram showing a case where frequency display is performed by a photo interrupter.

FIG. 16 is an explanatory diagram of a frequency display function of the optical chopper of the spectral sensitivity measurement device, and is a diagram showing a case where frequency display is performed by an encoder provided in the servo motor.

FIG. 17 is a diagram showing a spectral sensitivity measuring device for a dye-sensitized solar cell.

18 is a diagram showing the level relationship between the photocurrent of monochromatic light and the photocurrent of white bias light in the AC measurement mode of the apparatus shown in FIG.

[Explanation of symbols]

1 Spectral Sensitivity Measuring Device 9 Spectral Sensitivity Measuring Device 11 Monochromatic Light Irradiating Device 12 Bias Light Irradiating Device 13 Spectral Sensitivity Measuring Device 14 Display 91 Monochromatic Light Irradiating Device 92 Bias Light Irradiating Device 93 Spectral Sensitivity Measuring Device 111 Monochromatic Light Source 112 Condenser Mirror 113 Incident optical system 114 Incident slit 115 Ejection optical systems 116 and 116 'Optical chopper 117 Monochromator 118 Emission slit 121 Bias light source 131 Latch circuit 911 Monochromatic light source 912 Condensing mirror, spherical mirror 913 Incident optical system (condensing lens) 914 Incident slit 921 Bias light sources 1121 and 1122 Photo interrupter 1131 Concave lens 1151 Convex lens 1152 Fly eye lens 1153 Retrofocus lens 1154 Collimator lens 1161 Servo motor 1162 Optical blade 1164 Mo 1165 Reducer 1166 Encoder O ₁ , O ₂ Fan-shaped opening BB White bias light SB Monochromatic light

─────────────────────────────────────────────────── ─── Continuation of front page (51) Int.Cl. ⁷ Identification code FI theme code (reference) H01L 31/04 K (72) Inventor Kazuhiro Sayama 1-1-1 Higashi, Tsukuba City, Ibaraki Prefecture Research Institute, Tsukuba Center (72) Inventor Hironori Arakawa 1-1-1 East, Tsukuba City, Ibaraki Prefecture Independent Administrative Law Institute of Industrial Science and Technology Tsukuba Center (72) Inventor Seiichi Kusano 4 Takakura-cho, Hachioji-shi, Tokyo No. 8 Spectrometer Co., Ltd. (72) Inventor Tsuneo Asano No. 4 Takakuracho, Hachioji-shi, Tokyo F-Term (Spec.) In Spectrometer Co., Ltd. (reference) 2G020 AA04 BA20 CB26 CB32 CB43 CC01 CD24 CD51 2G059 AA03 BB16 EE12 EE17 GG03 GG07 HH02 JJ01 JJ11 JJ13 JJ24 NN01 PP04 5F051 AA14 BA00 FA01 GA03 5H032 AA06 AS16 CC16 EE02 EE07 EE16

Claims (11)

[Claims] 1. A dye-sensitized solar cell to be measured, which collects monochromatic light generated by a monochromatic light source with a condensing mirror, and through an incident optical system, an entrance slit, a monochromator, an exit slit, and an exit optical system. A monochromatic light irradiating means for irradiating the cell, a bias light irradiating means for irradiating a white bias light generated by a bias light source on the monochromatic light, and measuring the output signal of the dye-sensitized solar cell to be measured. In the spectral sensitivity measurement device for a dye-sensitized solar cell, the intensity of monochromatic light generated by the monochromatic light source is 0.5 to 5 m.
A spectral sensitivity measuring device for a dye-sensitized solar cell, which is W / cm ² . 2. The monochromatic light source is a xenon lamp,
The intensity of monochromatic light emitted from the xenon light source is 0.5 to 5
A spectral sensitivity measuring device for a dye-sensitized solar cell, wherein the spectral sensitivity measuring device is mW / cm ² . 3. The dye-sensitized sun according to claim 1, wherein the incident optical system includes a donut preventing lens system for preventing the donut from changing in illuminance distribution just before the entrance slit. Battery spectral sensitivity measurement device. 4. The spectral sensitivity measuring device for a dye-sensitized solar cell according to claim 3, wherein the donut preventing lens system is a concave lens. 5. The spectral sensitivity measuring device for a dye-sensitized solar cell according to claim 1, wherein the emission optical system is a retrofocus lens type. 6. The spectral sensitivity device for a dye-sensitized solar cell according to claim 1, wherein a fly's eye lens is incorporated in the emission optical system. 7. The spectral sensitivity measuring means includes a correcting means for removing a dark current component from a detection signal of the dye-sensitized solar cell to be measured, according to any one of claims 1 to 6.
Item 7. A spectral sensitivity measuring device for a dye-sensitized solar cell according to item. 8. The monochromatic light irradiation means includes an optical chopper having an ultra-low frequency operation function for chopping the monochromatic light with which the dye-sensitized solar cell to be measured is irradiated. Item 7. A spectral sensitivity measurement device for a dye-sensitized solar cell according to any one of items 7. 9. The spectral sensitivity measuring device of a dye-sensitized solar cell according to claim 8, wherein the optical chopper includes a motor and an optical blade directly connected to the motor rotation shaft. 10. The optical chopper is provided with two photo interrupters at positions where optical blades have different phases, and the spectral sensitivity measuring means receives one detection signal of the photo interrupter and the other detection signal of the photo interrupter. 10. The spectral sensitivity measuring device for a dye-sensitized solar cell according to claim 9, wherein a circuit for latching is provided. 11. The spectral sensitivity measurement device for a dye-sensitized solar cell according to claim 9, which has a frequency display function of the optical chopper, wherein the spectral sensitivity measurement device is based on a frequency of an output signal of an encoder provided in the motor. A spectral sensitivity measuring device for a dye-sensitized solar cell, which displays the frequency of the optical chopper.