JP2003051105A - Magnetic head tester - Google Patents

Abstract

PROBLEM TO BE SOLVED: To reduce the wiring length between a 1st probe and a relaying contact point in a magnetic head tester provided with the 1st probe electrically connected to a recording/reproducing terminal of the magnetic head to be inspected fixed on a magnetic head fixing jig and the relaying contact point electrically connected to the 1st probe to connect to a holder contact point of an IC holder, while having the magnetic head fixing jig to make the magnetic head access to a rotating recording disk, the IC holder mounting a recording/ reproducing IC thereon executing the process for inspecting the recording/ reproducing characteristic of the magnetic head and a head tester connected to the IC holder. SOLUTION: The 1st probe and the relaying contact point are arranged on the front and rear of the magnetic head fixing jig.

Description

Detailed Description of the Invention

[0001]

TECHNICAL FIELD The present invention relates to a magnetic head tester for inspecting a recording / reproducing characteristic (recording / reproducing characteristic) of a magnetic head.

[0002]

2. Description of the Related Art The recording / reproducing characteristics of a magnetic head are
All are inspected using a magnetic head tester. This magnetic head tester executes, as basic components, a magnetic head fixing jig for fixing the magnetic head and accessing the rotating recording disk, and a process for inspecting the recording / reproducing characteristics of the magnetic head. The recording / reproducing IC has an IC holder and a head tester connected to the IC holder. The IC holder has a recording / playback IC.
Is provided with a holder contact that conducts to the magnetic head fixing jig, and the magnetic head fixing jig has a first probe that conducts to a recording / reproducing terminal of the magnetic head fixed to the jig and an IC contact on the side of the IC holder that conducts electricity. And a relay contact that is electrically connected to one probe.

In the inspection, the recording / reproducing terminal of the magnetic head is connected to the first probe of the magnetic head fixing jig, and the holder contact of the IC holder is electrically connected to the relay contact. Then, the magnetic head mounted on the magnetic head fixing jig is accessed to the recording disk to create the same state as the actual recording / reproducing, and the recording / reproducing IC and the head tester inspect the recording / reproducing characteristics.

In this conventional magnetic head tester, when the magnetic head fixing jig is moved to the access position to the recording disk, the relay contact of the jig and the holder contact of the IC holder are made conductive at the same time. Therefore, the first probe and the relay contact are provided in parallel with the lower surface (the surface holding the magnetic head) of the magnetic head fixing jig. One of the advantages of this configuration is that it is not necessary to move the IC holder with respect to the magnetic head fixing jig.

Incidentally, the recording frequency tends to increase as the performance of magnetic heads has recently increased. When the recording frequency is high, the long wiring causes noise, and the impedance (inductance component L) of the electric circuit is reduced to increase the electric resonance frequency, that is, the overshoot of the rising and falling edges of the data recording waveform, It is necessary to shorten the wiring length in order to quickly converge the undershoot. However, in the conventional device, as described above, on the lower surface (one surface on the recording disk side) of the magnetic head fixing jig, the first probe that conducts to the recording / reproducing terminal of the magnetic head fixed to the jig, Conducted to probe 1 and I
Since the relay contact that conducts to the holder contact on the C holder side is provided side by side, there is a limit to the reduction of the wiring length that connects the first probe and the relay contact.

The same applies to the IC holder. That is, since the holder contact and the recording / reproducing IC are provided on the same surface of the holder, the wiring length between the holder contact and the recording / reproducing IC becomes long. In the end, it was difficult to shorten the wiring length from the first probe to the recording / reproducing IC.

As a countermeasure against this, a recording / reproducing IC may be mounted on the magnetic head fixing jig (that is, the separate IC holder may be eliminated) to shorten the wiring length. (AMP ON CASETTE (JIG))

However, the IC holder (recording / reproducing IC)
Is commonly used for a plurality of magnetic head fixing jigs, and the characteristics of all recording / reproducing ICs cannot be made exactly the same. Therefore, the measurement result is different for each recording / reproducing IC (IC holder) used. The difference is subtly different, and it becomes necessary to correct between the recording and reproducing ICs after the measurement, the correction coefficient becomes complicated, and the inspection work becomes more complicated. Furthermore, the use of a plurality of recording / reproducing ICs increases the amount of equipment investment, resulting in a large financial burden.

[0009]

SUMMARY OF THE INVENTION It is an object of the present invention to obtain a magnetic head tester which can shorten the wiring length without significantly changing the structure of the current magnetic head tester.

[0010]

SUMMARY OF THE INVENTION The present invention secures a magnetic head to be inspected,
An IC equipped with a magnetic head fixing jig for accessing the rotating recording disk of the magnetic head and a recording / reproducing IC for executing processing for inspecting the recording / reproducing characteristics of the magnetic head.
A holder and a head tester connected to the IC holder are provided, the IC holder has a holder contact that conducts to the recording / reproducing IC, and the magnetic head fixing jig is a magnetic head to be inspected that is fixed to the jig. In a magnetic head tester having a first probe that conducts to a recording / reproducing terminal and a relay contact that conducts to a holder contact of an IC holder, a magnetic head fixing and fixing device for the first probe and the relay contact. It is characterized by being placed on the front and back of the ingredient.

By thus arranging the first probe and the relay contact on the front and back of the magnetic head fixing jig, the wiring length can be shortened as compared with the case where both are arranged on the same surface. In order to shorten the wiring length, the magnetic head fixing jig should be
It is desirable to form a linear through hole through which a wiring that connects the first probe and the relay contact is inserted.

One of the holder contact of the IC holder and the relay contact on the magnetic head fixing jig side is the second probe,
The other can be a fixed contact.

In the magnetic head tester of the present invention,
The holder contact on the IC holder side and the recording / reproducing IC are also preferably arranged on the front and back of the IC holder. By arranging on the front and back, compared to when arranging at different positions on the same surface,
The wiring length can be shortened, and recording / playback from the first probe I
The total wiring length up to C can be shortened.

In the magnetic head tester of the present invention, the IC holder is moved in the direction in which the holder contact of the IC holder and the relay contact of the magnetic head fixing jig side are brought into contact with and separated from each other, and the magnetic head fixing jig is the recording disk. It is preferable that the magnetic head fixing jig is moved away from the moving space when accessing the.

[0015]

1 to 4 show an embodiment of a magnetic head tester according to the present invention. The magnetic head tester includes a magnetic head fixing jig 20 for holding and fixing the magnetic head 10, an IC holder 30 for executing processing for inspecting the recording / reproducing characteristics of the magnetic head 10,
And a head tester 40. FIG. 2 is a perspective view seen from below in FIG.

The magnetic head 10 is a slider (MR head) 11 that magnetically records and reproduces data on and from a recording disk M that is rotationally driven, and the slider 1.
It has a gimbal 12 having a tip portion 1 and an FPC board 13 connected to the slider 11. FPC board 13
An FPC contact 14 that is electrically connected to the recording / reproducing terminal of the slider 11 faces the end of the.

The magnetic head fixing jig 20 has a lower surface (a recording disk facing surface) 21 on which a fixing base 22 for fixing the base of the gimbal 12 of the magnetic head 10 and an FPC contact 14 of the FPC board 13 are electrically connected. And a first probe 23 connected to the. The base of the gimbal 12 of the magnetic head 10 can be attached to and detached from the fixed base 22 via a fixing screw 22a. As is well known, the (first) probe 23 is composed of a conductive pin that is biased in the protruding direction, and as shown in FIG. 2, the FPC board 13 is provided between the clip 24 and the first probe 23. When the ends are sandwiched, the first
Electrical connection is established between the probe 23 and the FPC contact 14. The clip 24 is biased in the closing direction by a biasing spring 24a.

The relay contact 26 is fixed to the magnetic head fixing jig 20 by exposing it to the upper surface 25 (the surface parallel to the lower surface 21 and the surface facing the IC holder 30). The relay fixed contact 26 and the first probe 23 are electrically connected by an insulated electric wiring (harness) 28 inserted into a through hole 27 (FIGS. 2 and 3) formed in the magnetic head fixing jig 20. The through hole 27 is a straight through hole that is substantially orthogonal to the plate thickness plane of the jig 20, and the length of the insulated electrical wiring 28 inserted into the through hole 27 is determined by the magnetic head fixing jig 20.
The shortest length corresponding to the thickness of. In other words, the first probe 23 and the relay contact 26 are fixed to the front and back of the magnetic head fixing jig 20 so that the wiring length of the wiring 28 is as short as possible.

The magnetic head fixing jig 20 has a fixing base 2
When the magnetic head 10 is properly fixed to the magnetic head 2, the slider 11 can be moved in the direction (arrow 29) for moving the slider 11 toward and away from the recording disk M. Illustration of the moving mechanism is omitted.

The IC holder 30 has a second probe (holder contact) 31 that comes in contact with and separates from the relay fixed contact 26 of the magnetic head fixing jig 20, and a process for inspecting the recording / reproducing characteristics of the magnetic head 10. And a recording / reproducing IC 32 for executing. The second probe 31 and the recording / reproducing IC 32 are located on the front and back of the holder 30, and are connected by the internal wiring 33. The wiring length of the internal wiring 33 is also the holder 30.
The shortest length corresponding to the thickness of. Like the wiring 28 of the magnetic head fixing jig 20, the internal wiring 33 can be inserted into the through hole orthogonal to the plate thickness plane of the holder 30.
In other words, the second probe 31 and the recording / reproducing IC 32 are fixed to the front and back of the IC holder 30 so that the wiring length of the wiring 33 is as short as possible.

The IC holder 30 moves on the recording disk M when the second probe 31 is moved toward and away from the relay fixed contact 26 (arrow 34) (that is, moved in the same direction as the magnetic head fixing jig 20). It is possible to move the magnetic head fixing jig 20 in the direction of retreating from the moving space of the magnetic head fixing jig 20 (arrow 35). Illustration of the moving mechanism is also omitted.

The head tester 40 includes a flexible cable 41.
Is connected to the IC holder 30 (recording / reproducing IC 32) and does not prevent the above movement of the IC holder 30.

The magnetic head tester of this embodiment is used as follows. Before the operation starts, the IC holder 30 is retracted by the moving mechanism from the moving space of the magnetic head fixing jig 20 in the direction indicated by the arrow 35, and the magnetic head fixing jig 2 is moved.
It is assumed that 0 is in a non-access position to the recording disk M.
In this state, the fixing base 2 of the magnetic head fixing jig 20
2, the gimbal 12 of the magnetic head 10 to be inspected is fixed using the fixing screw 22a, the clip 24 is opened to align the position of the first probe 23 and the FPC contact 14 of the FPC board 13, and the clip 24 is separated. The FPC contact 14 and the first probe 23 are electrically connected by the spring force of the biasing spring 24a. Next, the magnetic head fixing jig 20 is moved in the access direction to the recording disk M (direction shown by arrow 29), and the magnetic head 10 (slider 11) is moved to the access position to the recording disk M (recording / reproducing position). Let

After the above-described setting of the magnetic head fixing jig 20 is completed, the IC holder 30 is moved to the magnetic head fixing jig 20.
The magnetic head fixing jig 20 is moved upward and further in a direction of approaching the magnetic head fixing jig 20. Then, the second probe 31 contacts the relay fixed contact 26 with an appropriate contact pressure, and the slider 1
The inspection circuit from 1 to the recording / reproducing IC 32 and further to the head tester 40 is completed.

In this state, the recording disk M is rotated to
Recording / reproducing IC3 based on the operation signal from the head tester 40
The data from 2 is recorded on the recording disk M by the magnetic head 10.
To record. Also, the data recorded on the recording disk M is reproduced by the magnetic head 10, and the electric signal of the measurement result is sent from the recording / reproducing IC 32 to the head tester 40. The head tester 40 determines the quality of the magnetic head 10 based on the result of the electric signal transmitted from the recording / reproducing IC 32.
The pass / fail judgment is displayed on the head tester 40 and is further stored in a memory (not shown).

When the inspection of one magnetic head 10 is completed, the IC holder 30 is moved in the direction away from the magnetic head fixing jig 20 (the direction of arrow 34) to move the second probe 31.
After the contact between the relay fixed contact 26 and the relay fixed contact 26 is released, the relay fixed contact 26 is further moved in the direction of retracting from the magnetic head fixing jig 20 (direction of arrow 35). Next, the magnetic head fixing jig 20 is moved in the direction of retracting from the recording disk M, and then the magnetic head 10 is removed from the fixing base 22 by the fixing screw 22a, and the next magnetic head 10 to be inspected is fixed to the fixing base 22. To do. Hereinafter, the same operation is repeated.

As described above, in this embodiment, the first probe 23 and the relay fixed contact 26 of the magnetic head fixing jig 20 are used.
Since and are arranged on the front and back of the magnetic head fixing jig 20,
The wiring length of the insulated electric wiring 28 can be shortened as much as possible according to the thickness of the jig 20. That is, if the thickness of the jig 20 (the distance between the lower surface 21 and the upper surface 25) is shortened, the wiring length can be shortened accordingly. Similarly, the second
Since the probe 31 and the recording / reproducing IC 32 are located on the front and back of the holder 30 and are connected by the shortest internal wiring 33, the length can be shortened according to the thickness of the holder 30. Therefore, even if the recording frequency of the magnetic head 10 is increased, the wiring length from the first probe 23 to the recording / reproducing IC 32 (insulating electric wiring 28, wiring length of the internal wiring 33) rarely causes noise, and The impedance of the electric circuit can be reduced and the electrical resonance frequency can be increased.

The IC holder 30 having the recording / reproducing IC 32 is
It can be commonly used for a plurality of magnetic head fixing jigs 20. For this reason, a large number of magnetic heads are used for the same recording / reproducing IC3.
2 can be inspected, and there is little need to correct the measurement result.

FIGS. 4 and 5 show a conventional magnetic head tester drawn corresponding to FIGS. 1 and 2, and common elements to the tester of this embodiment shown in FIGS. 1 and 2 are common. The code is attached. In this conventional example, the IC holder 30 is fixed below the magnetic head fixing jig 20, and the second probe 31 is arranged on the upper surface thereof. The magnetic head fixing jig 20 has a second probe 31 on its lower surface.
The fixed relay contact 26 corresponding to the first probe 23 and the first probe 23 are arranged side by side. The second probe 31 and the recording / reproducing IC 32 are arranged side by side on the upper surface of the holder 30. In this conventional example, there is an advantage that the IC holder 30 can be fixedly arranged (it need not be movable).
The wiring length of the insulated electric wiring 28 connecting the probe 23 and the relay fixed contact 26 and the wiring length of the wiring 33 connecting the second probe 31 and the recording / reproducing IC 32 become long, which causes noise.

In the above embodiment, the magnetic head fixing jig 2 is used.
The relay fixed contact 26 of 0 was used as the relay fixed contact 26.
The probe 31 may be a fixed contact.

[0031]

According to the magnetic head tester of the present invention,
Since the magnetic head to be inspected and the recording / reproducing IC are electrically connected to each other at the shortest distance, the wiring can be shortened and the generation of noise can be suppressed. Furthermore, since the wiring is shortened as much as possible, the impedance of the electric circuit can be reduced to increase the electrical resonance frequency, that is, the overshoot and undershoot of the rising and falling edges of the data recording waveform can be quickly converged. it can.

[Brief description of drawings]

FIG. 1 is a configuration diagram showing a magnetic head tester according to an embodiment of the present invention.

FIG. 2 is a perspective view of a magnetic head fixing jig and an IC holder of the magnetic head tester of FIG. 1 viewed from below.

FIG. 3 is a sectional view taken along line III-III in FIG.

FIG. 4 is a configuration diagram corresponding to FIG. 1, showing a conventional magnetic head tester.

FIG. 5 is a perspective view of a magnetic head fixing jig corresponding to FIG. 2 showing the conventional magnetic head tester.

[Explanation of symbols]

10 magnetic head 11 slider 12 gimbal 13 FPC board 14 FPC contacts 20 Magnetic head fixing jig 21 Lower surface 22 Fixed base 23 First probe 24 clips 25 upper surface 26 Relay fixed contact 27 through holes 28 Insulated electrical wiring (harness) 29 34 35 arrow 30 IC holder 31 2nd probe (holder contact) 32 Recording / playback IC 40 head tester 41 Flexible cable M recording disc

Claims (6)

[Claims] 1. A magnetic head fixing jig for fixing a magnetic head to be inspected and for accessing the rotating recording disk, and a recording / reproducing device for executing processing for inspecting the recording / reproducing characteristics of the magnetic head. An IC holder having an IC mounted thereon and a head tester connected to the IC holder are provided, the IC holder has a holder contact that conducts to the recording / reproducing IC, and the magnetic head fixing jig is the jig. A first probe that conducts to the recording / reproducing terminal of the magnetic head to be inspected fixed to the
In a magnetic head tester having a relay contact that conducts to the holder contact of a holder and that conducts to the first probe, the first probe and the relay contact are arranged on the front and back sides of a magnetic head fixing jig. Magnetic head tester. 2. The magnetic head tester according to claim 1, wherein the jig for fixing the magnetic head is formed with a through hole through which a wire connecting the first probe and the relay contact is inserted. 3. The magnetic head tester according to claim 1, wherein the holder contact of the IC holder is the second probe and the relay contact of the magnetic head fixing jig is the fixed contact. 4. The magnetic head tester according to claim 1 or 2, wherein the holder contact of the IC holder is a fixed contact, and the relay contact of the magnetic head fixing jig is a second probe. 5. The magnetic head tester according to claim 1, wherein the holder contact and the recording / reproducing I
C is a magnetic head tester arranged on the front and back of the IC holder. 6. The magnetic head tester according to claim 1, wherein the IC holder has a direction in which a holder contact of the IC holder and a relay contact on the magnetic head fixing jig side are brought into contact with and separated from each other. A magnetic head tester that performs movement and retreats from the movement space of the magnetic head fixing jig when the magnetic head fixing jig accesses the recording disk.