JP2003042958A - Inspection device for conveyance of object to be inspected - Google Patents

Inspection device for conveyance of object to be inspected

Info

Publication number
JP2003042958A
JP2003042958A JP2001229124A JP2001229124A JP2003042958A JP 2003042958 A JP2003042958 A JP 2003042958A JP 2001229124 A JP2001229124 A JP 2001229124A JP 2001229124 A JP2001229124 A JP 2001229124A JP 2003042958 A JP2003042958 A JP 2003042958A
Authority
JP
Japan
Prior art keywords
inspected
inspection
conveyance
gripping
upper chuck
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001229124A
Other languages
Japanese (ja)
Inventor
Koichi Kajiyama
康一 梶山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
V Technology Co Ltd
Original Assignee
V Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by V Technology Co Ltd filed Critical V Technology Co Ltd
Priority to JP2001229124A priority Critical patent/JP2003042958A/en
Publication of JP2003042958A publication Critical patent/JP2003042958A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To prevent torsion of piping or wiring during conveyance of an inspec tion object, to reduce a cost or refuse by dispensing with conventional wiring, piping or the like, to convey smoothly and inspect the object of inspection, without limiting the shape thereof oblong, to position and hold the object quickly and accurately at the conveyance time during an inspection process of the inspection objects, such as liquid crystal substrates having various different sizes or the like, and to realize shortening of inspection time and prevention of damages to the object of inspection, in a circulating type conveyance inspec tion device for the inspection object. SOLUTION: In this inspection device 1 for conveyance of the object of inspection 10, inspection for detecting defect of a liquid crystal part is conducted by scanning the object of inspection 10, using an inspection optical system having a light source 3 and a line CCD 4, while conveying the object of inspection 10 for forming the liquid crystal board by a conveyance conveyer 2. In the device, a holder 5 for holding the object of inspection 10 at a carry-in position thereof and releasing the holding at a carry-out position is provided on the center position in the conveyance direction of the object of inspection 10 by the conveyance conveyor 2.

Description

【発明の詳細な説明】Detailed Description of the Invention

【発明の属する技術分野】本発明は、例えば液晶板等の
ような被検査体の位置決め搬送装置に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a positioning and conveying device for an object to be inspected such as a liquid crystal plate.

【従来の技術】従来、各種デイスプレイ装置等に使用さ
れる液晶基板の製作は、例えば700mm×900mm
のガラス基板上に6個の14インチ又は16インチのT
FT(Thin Film Transistor)を
張り合わせて、更にCF(Color Filter)
を張り合わせ、これを切り取って製作される。上記TF
Tは50万×3個(R,G,B三色)のトランジスター
群によって構成される。そして、上記TFTの欠陥検査
は、一つの大きさがほぼ20μm位で、700mmの寸
法の中で36,000点を検査することになる。このよ
うな検査は、従来における被検査体の搬送検査装置を示
す図13に示すように、通常搬送コンベア101により
30cm/sec程度の速度で矢印方向に搬送される途
中のガラス基板(ワーク)100に対する光源111と
リニアCCD(例えば8個使用)112を用いた検査手
段により40MB/sec程度の取り込み速度による画
像取り込み処理によって行われる。ガラス基板100
は、搬送コンベア101により搬送される際に、搬送コ
ンベア101に連動するように設けた把持体(チャッ
ク)102により搬送方向に沿う両端縁部を把持されて
位置決めされつつ搬送される。搬送コンベア101によ
り被検査体である例えばガラス基板100等を搬送する
ようにしたいわゆる循環型の搬送機構(図1参照)の先
行技術としては、本発明の出願人と同出願人の特願20
00−122527が参考となる。
2. Description of the Related Art Conventionally, a liquid crystal substrate used for various display devices is manufactured, for example, by 700 mm × 900 mm.
6 14 inch or 16 inch T on glass substrate
FT (Thin Film Transistor) is pasted together and CF (Color Filter) is further attached.
It is made by pasting together and cutting out. Above TF
T is composed of a group of 500,000 × 3 (R, G, B three colors) transistors. In the defect inspection of the TFT, one size is about 20 μm, and 36,000 points are inspected in a dimension of 700 mm. Such an inspection is performed on a glass substrate (work) 100 which is in the middle of being conveyed in the arrow direction at a speed of about 30 cm / sec by a normal conveyor 101, as shown in FIG. The image capturing process is performed by the inspection means using the light source 111 and the linear CCD (for example, eight are used) 112 for the image capturing speed of about 40 MB / sec. Glass substrate 100
When being transported by the transport conveyor 101, the gripping body (chuck) 102 provided so as to interlock with the transport conveyor 101 grips and positions both edge portions along the transport direction and is transported. As a prior art of a so-called circulation type transfer mechanism (see FIG. 1) in which an object to be inspected, such as a glass substrate 100, is transferred by a transfer conveyor 101, the applicant of the present invention and a patent application 20 of the same applicant are known.
00-122527 is helpful.

【発明が解決しようとする課題】しなしながら、搬送コ
ンベア101により被検査体である例えばガラス基板1
00等を搬送するようにしたいわゆる循環型の搬送機構
にガラス基板100を把持するための後記するような把
持体を取り付けた場合、その駆動力を空気圧や電気など
で供給することが困難なことであり、この点が大きな問
題となる。すなわち、従来のこの種の搬送方法では、そ
の動力をはじめとする各種の電線や空気配管を必要とす
る関係上、図1に示すような循環型の搬送機構を使用す
る場合、その動力として電線や空気配管の配管や配線を
使用すると、ガラス基板100を搬送している間に配管
や配線の捩れが生じてしまい使用不可となってしまう。
一方、上述した従釆の被検査体の位置決め搬送装置は、
被検査体であるガラス基板100の大きさが、図5中に
示すように、例えばガラス基板100よりも小さいガラ
ス基板100aを検査する場合も存在し、逆にガラス基
板100よりも大きいガラス基板を検査する場合等、被
検査体であるガラス基板100のすべてが同じ大きさで
はないことから、このような被検査体であるガラス基板
の大小に応じてその都度、被検査体であるガラス基板を
各々把持する把持体102による掴み位置を個別に調整
し変更する必要がある。また、被検査体であるガラス基
板100における把持体用の掴み代は、例えば3.5m
m程度しか設けられておらず、把持体102の掴み位置
を変更しながら3.5mm程度の掴み代を正確に掴むこ
とは容易ではなく、把持体102とガラス基板100と
の位置合わせのために、例えばガラス基板100の後戻
り搬送を要する等、10sec程度の位置合わせ時間を
要し、1個の被検査体であるガラス基板100に対する
検査時間(検査タクト)が30sec程度以内であるこ
とを考慮すると、10sec程度の位置合わせ時間を要
することは検査能率を低下させるという問題があり、上
述した位置合わせ時間の短縮化が要請されているところ
である。また、上述したような10sec程度の時間を
要する把持体102と被検査体であるガラス基板100
との位置合わせを行った場合、ガラス基板100を傷付
ける虞があり、ガラス基板100の単体価格が数万円程
度と非常に高価格であることを考慮すると、上述した把
持体102とガラス基板100との位置合わせ工程の改
善が格別要請されているところである。本発明は、上述
した従来の諸事情に鑑み開発されたものであり、いわゆ
る循環型の搬送機構において被検査体を把持するための
動力を搬送駆動機構の外部に設けることにより、前記従
来のような被検査体(例えばガラス基板等)を搬送して
いる間に配管や配線の捩れが生じてしまい搬送不可とな
ってしまうような事態を解消するとともに、従来のよう
な配線、配管類が不要となることにより、コストやゴミ
の発生が大きく削減でき、また、被検査体の形状を矩形
に制限することなく搬送し検査でき、更に、大きさが種
々に異なる例えば液晶板等の被検査体の検査工程中の搬
送時における位置決め把持を迅速、且つ、正確に実行で
き、検査時間の短縮化と被検査体の損傷防止とを図るこ
とが可能な被検査体の搬送検査装置を提供するものであ
る。
However, the glass substrate 1 which is the object to be inspected is conveyed by the conveyor 101.
When a gripping body for gripping the glass substrate 100, which will be described later, is attached to a so-called circulation type transporting mechanism that transports 00 or the like, it is difficult to supply the driving force by air pressure or electricity. This is a big problem. That is, in the conventional transfer method of this type, since various electric wires including the power thereof and air piping are required, when the circulation type transfer mechanism as shown in FIG. 1 is used, the electric wire is used as the power. If the piping or wiring of the air piping is used, the piping or wiring will be twisted while the glass substrate 100 is being conveyed, and it will be unusable.
On the other hand, the above-described positioning and conveying device for the object to be inspected,
As shown in FIG. 5, there is a case where a glass substrate 100a that is an object to be inspected is inspected, for example, a glass substrate 100a smaller than the glass substrate 100, and conversely, a glass substrate larger than the glass substrate 100 is used. When inspecting, the glass substrates 100 to be inspected are not all the same in size, so that the glass substrate to be inspected is changed in accordance with the size of the glass substrate to be inspected. It is necessary to individually adjust and change the gripping position by the gripping body 102 to be gripped. Further, the grip allowance for the gripping body on the glass substrate 100 which is the object to be inspected is, for example, 3.5 m.
Since only about m is provided, it is not easy to accurately grasp the grip margin of about 3.5 mm while changing the grip position of the grip body 102, and it is necessary to align the grip body 102 and the glass substrate 100. Considering that it takes about 10 seconds for alignment such as the backward transportation of the glass substrate 100, and that the inspection time (inspection tact) for one glass substrate 100 to be inspected is within about 30 seconds. The need for the alignment time of about 10 sec has a problem of reducing the inspection efficiency, and there is a demand for shortening the alignment time described above. Further, the gripping body 102 and the glass substrate 100 which is the object to be inspected, which require about 10 seconds as described above.
When the alignment is performed, the glass substrate 100 may be damaged, and considering that the unit price of the glass substrate 100 is very high at about tens of thousands of yen, the above-mentioned grip body 102 and the glass substrate 100 are considered. A special request is made to improve the alignment process with The present invention has been developed in view of the above-mentioned conventional circumstances, and by providing power for gripping an object to be inspected in a so-called circulation type transfer mechanism outside the transfer drive mechanism, Eliminates the situation where pipes and wiring become twisted during transportation of various inspection objects (such as glass substrates) and transportation becomes impossible, and the conventional wiring and piping are unnecessary. As a result, the cost and the generation of dust can be greatly reduced, the object to be inspected can be transported and inspected without being limited to a rectangular shape, and the object to be inspected such as a liquid crystal plate having various sizes can be further inspected. To provide a conveyance inspection apparatus for an object to be inspected, which can quickly and accurately perform positioning and grasping during conveyance during the inspection step, and can shorten the inspection time and prevent damage to the object to be inspected. Is

【課題を解決するための手段】請求項1記載の発明は、
被検査体を搬送手段により搬送しつつ検査光学系を用い
て前記被検査体を走査することにより被検査体の欠陥検
査を行う被検査体の搬送検査装置であって、前記搬送手
段による被検査体の搬送方向中央部位置に、前記被検査
体の搬入位置から搬出位置に至るまで前記被検査体を位
置決め把持し、搬出位置にて把持解除を行うとともに、
搬送手段の外方に具備した駆動機構により駆動する把持
及び解除機構部を設けたことを特徴とするものである。
請求項2記載の発明は、請求項1記載の被検査体の搬送
検査装置において、前記把持及び解除機構部は、被検査
体の搬送方向中央部位置に臨ませる上チャック片、下チ
ャック片を備えた本体部と、本体部の外方に突出配置さ
れ、前記被検査体の搬入位置、搬出位置にて押圧力が作
用する作動体と、前記本体部内に上下対向配置に、且
つ、各々上下方向にスライド可能に配置されるととも
に、前記上チャック片、下チャック片に各々連結した上
チャック板、下チャック板と、前記作動体に作用する押
圧力を上チャック板に伝達する操作シャフトと、前記上
チャック板、下チャック板間に亙って設けられ、前記上
チャック板に伝達される押圧力に連動して、前記上チャ
ック片、下チャック片間を被検査体の把持及び把持解除
可能な開状態とするリンク部と、前記上チャック片に対
して常時前記上チャック片、下チャック片間の閉方向の
ばね力を付与する弾性体とを有することを特徴とするも
のである。請求項1、2記載の各発明によれば、この種
のいわゆる循環型の被検査体の搬送検査装置において被
検査体を把持するための動力を搬送駆動機構の外部に設
ける(動力を含む全ての配線類を駆動機構内部に具備し
ない)ことにより、前記従来のような被検査体である例
えばガラス基板等を搬送している間に配管や配線の捩れ
が生じてしまい搬送不可となってしまうような事態を解
消できるとともに、従来のような配線、配管類が不要と
なることにより、コストやゴミの発生が大きく削減で
き、また、被検査体の形状を矩形に制限することなく搬
送し検査でき、更に、搬送手段上に受け入れた例えば液
晶板のような被検査体の位置決め搬送を迅速、且つ、円
滑に行ない、被検査体の後戻し等も不要であり、欠陥検
査工程終了後自動的に次工程へ搬出できるので、検査時
間をの短縮化が図ることができる。また、搬入されてく
る被検査体に対して、被検査体の搬入位置にて前記把持
及び解除機構部を構成する前記作動体の動作に連動する
把持体の上チャック板、下チャック板に設けた上チャッ
ク片、下チャック片により、その搬送方向中央部位置の
掴み代の部分を速やか把持し、また、被検査体の搬出位
置にて上チャック片、下チャック片により把持解除を行
うようにしているので、被検査体であるガラス基板の大
小に応じてその都度ガラス基板を各々把持する把持体に
よる掴み位置を個別に調整し変更する必要がなく、如何
なるサイズの被検査体であるガラス基板にも即時に対応
でき、掴みクラック(微少な破損で広がるのでダメージ
が大きい)等の損傷を防止することもできる。
The invention according to claim 1 is
A conveyance inspection device for a body to be inspected, which carries out a defect inspection of the body to be inspected by scanning the body to be inspected by using an inspection optical system while conveying the body to be inspected by the conveying means. At the central portion position in the transport direction of the body, while positioning the object to be inspected from the carry-in position to the carry-out position of the object to be inspected, and releasing the grip at the carry-out position,
The present invention is characterized in that a gripping and releasing mechanism portion driven by a drive mechanism provided outside the conveying means is provided.
According to a second aspect of the present invention, in the apparatus for inspecting an object to be inspected according to the first aspect, the gripping and releasing mechanism portion includes an upper chuck piece and a lower chuck piece that are located at a central position in an object to be inspected in the conveyance direction. A body part provided with the actuating body, which is arranged so as to project outward from the body part and exerts a pressing force at the loading position and the unloading position of the object to be inspected. And an upper chuck plate and a lower chuck plate respectively connected to the upper chuck piece and the lower chuck piece, and an operation shaft for transmitting a pressing force acting on the actuating body to the upper chuck plate. It is provided between the upper chuck plate and the lower chuck plate, and can interlock with the pressing force transmitted to the upper chuck plate to hold and release the object to be inspected between the upper chuck piece and the lower chuck piece. To open A click portion, wherein on at all times the upper chuck pieces relative to the chuck pieces, is characterized in that it has an elastic body that imparts a closing direction of the spring force of the lower chuck pieces. According to each of the first and second aspects of the present invention, in this type of so-called circulating type inspecting device for inspecting an object, power for gripping the object is provided outside the transportation drive mechanism (all including power). No wiring is provided inside the drive mechanism), the pipe or the wiring is twisted while the object to be inspected, such as the conventional glass substrate, is conveyed, which makes the conveyance impossible. In addition to eliminating such situations, the conventional wiring and piping are not required, which can greatly reduce the cost and the generation of dust. Also, the object to be inspected can be transported and inspected without being limited to a rectangular shape. In addition, positioning and transportation of the object to be inspected such as a liquid crystal plate received on the transportation means can be carried out quickly and smoothly, and there is no need to return the object to be inspected. To the next step Since Dekiru out, it is possible to achieve the shortening of the inspection time. Further, with respect to the object to be inspected that is carried in, it is provided on the upper chuck plate and the lower chuck plate of the gripping body that interlocks with the operation of the actuating body that constitutes the gripping and releasing mechanism at the loading position of the object to be inspected. The upper chuck piece and the lower chuck piece quickly grip the gripping margin at the central position in the transport direction, and the upper chuck piece and the lower chuck piece release the grip at the unloading position of the object to be inspected. Therefore, it is not necessary to individually adjust and change the gripping position by the gripping body that grips each glass substrate according to the size of the glass substrate that is the test object, and the size of the glass substrate that is the test object It is also possible to immediately deal with, and it is possible to prevent damage such as a grip crack (damage is large because it spreads even with a slight damage).

【発明の実施の形態】以下に、本発明に係るいわゆる循
環型の被検査体(例えばガラス基板等)の搬送検査装置
の実施の形態を図1乃至図12を参照して詳細に説明す
る。図1は、本発明に係る実施の形態の被検査体10の
搬送検査装置1の概略構成を示すものであり、この被検
査体の搬送検査装置1は、例えば矩形状等々液晶板形成
用の被検査体10を、搬送手段である一対の無端の回転
フレーム2a、2bを用いた搬送コンベア2により搬送
し、光源3及びラインCCD(ラインセンサ)4を有す
る検査光学系を用いて前記被検査体10の被検査体面
(以下「検査面」という)を走査することにより、この
検査面に設けられているTFT等の液晶部の欠陥検査を
行うようになっている。前記搬送コンベア2による被検
査体10の搬送方向中央部位置(搬送コンベア2の幅寸
法をLとすると、L/2となる位置)には、前記被検査
体10の搬入位置から搬出位置に至るまでこの被検査体
10の搬送方向先端縁に設けられている掴み代を位置決
め把持する把持及び解除機構部を構成する把持体5を設
けている。本実施の形態ではこの把持体5は、例えば搬
送コンベア2の全周長を2分割する位置に合計2箇所設
けている。すなわち、一方の把持及び解除機構部の把持
体5は、搬送コンベア2の回転フレーム2a、2bに対
して、金属板に4個の小さいローラー22を上部に比べ
下部の間隔を小さくして、上下に2個取り付けて構成し
た2個のラック23、23を各々移動可能に配置し、2
個の各ラック23、23間に連結板24を掛け渡し、連
結板24の搬送方向中央部位置に前記把持体5を取り付
けている。そして、連結板24を図示しないワイヤー駆
動機構により搬送コンベア2の回転フレーム2a、2b
に沿って移動させるようにしている。他方の把持及び解
除機構部の把持体5も同様な構成からなり、光源3から
ラインCCD4への検査光路を妨げない配置で取り付け
ている。前記搬送コンベア2の前段には、被検査体10
用の搬入ローラコンベア26が設けられ、前記搬送コン
ベア2の後段には、被検査体10用の搬出ローラコンベ
ア27が設けられている。ここで、前記把持及び解除機
構部を構成する把持体5について、図5乃至図11を参
照して詳述する。この把持体5は、図5乃至図7に示す
ように、連結板24に取り付けた全体として略直方体状
の本体部30と、この本体部30の外方、例えば、図示
すように、本体部30の底面下方に突出させた把持動
作、把持解除動作を行うための作動体31とを有してい
る。すなわち、本実施の形態では、搬送手段の外方に具
備した駆動機構により駆動する把持及び解除機構部を設
けている。本体部30は、夫々矩形状の上プレート3
2、一対の側プレート33a及び33b、下プレート3
4を備え、これらの所要箇所をボルト40を用いて各々
接合連結し、内部に直方体状の空間を形成している。そ
して、本体部30には、各々側プレート33a、33b
の近傍に位置して上プレート32、下プレート34間に
両端を嵌着した一対のリニアガイド35及び35を垂直
配置に取り付けている。一対のリニアガイド35、35
には、上下対向配置の上チャック板36、下チャック板
37を、平行配置に、且つ、各々リニアガイド35、3
5に対して各々環状ブッシュ38を用いて垂直上下方向
にスライド可能に嵌装している。また、前記一対のリニ
アガイド35、35の間の領域において、上チャック板
36の下面側に対して上端を嵌着しボルト40により締
め付け固定するとともに、中間部を前記下チャック板3
7に対して環状ブッシュ38を介してスライド可能な貫
通状態とし、更に下端側を前記下プレート34を遊嵌状
態で貫通して下方に突出させた一対の操作シャフト3
9、39を有している。この一対の操作シャフト39、
39の下端には、前記作動体31を構成するブラケット
31aの上面両端部をボルト40を用いて連結してい
る。前記作動体31は、ブラケット31aに対して軸体
31bを介してローラ31cを回転可能に支持すること
により構成している。一方、前記上チャック板36の上
面中央部に設けた凹部と、前記上プレート32との間に
は、上チャック板36に対して下方にばね力を付与する
コイルバネ51が抑え板52及びボルト40を用いて配
置している。更に、前記上チャック板36の図5、図6
において左側には、上チャック片36が、前記下チャッ
ク板37の図5、図6において左側には、上チャック片
36aと対向配置の下チャック片37aが各々ボルト4
0を用いて取り付けられ、上チャック片36a、下チャ
ック片37a間で、図10に示すように、前記被検査体
10の掴み代の部分を挟み込むように構成している。前
記上チャック板36、下チャック板37の図5、図6に
おいて左側(一対のリニアガイド35、35を挟んで反
対側)には、図5、図10に示すように、前記作動体3
1の変位に連動して、前記上チャック板36、下チャッ
ク板37を接近、離脱させる、すなわち、上チャック板
36と一体の環状ブッシュ38と、下チャック板37と
一体の環状ブッシュ38とを接合状態から離隔状態とす
るリンク部41が設けられている。このリンク部41に
ついて、図11、図12をも参照して説明する。このリ
ンク部41は、前記側プレート33a、33b間に軸受
43を用いて回動可能に架設したセンター軸42と、こ
のセンター軸42に嵌着した回動体44と、前記上チャ
ック板36、下チャック板37に各々ボルト40を用い
て取り付けた一対のヒンジブラケット45、46と、上
チャック板36側のヒンジブラケット45の突出端と、
回動体44の外周部との間に両端をそれぞれ回動可能に
取り付けた上アーム47と、下チャック板37側のヒン
ジブラケット46の突出端と、回動体44の外周部にお
ける前記上アーム47の取り付け位置とはセンター軸4
2を挟んで対称となる位置との間に、両端を各々回動可
能に取り付けた下アーム48とを具備している。上述し
た搬送検査装置1の作用を以下に説明する。搬入ローラ
コンベア26により次々とタイミング良く運び込こまれ
る被検査体10は、搬送コンベア2に受け渡され(図
2)、このとき、所定のタイミングで前記前記把持及び
解除機構部の把持体5により搬送方向中央部位置の掴み
代の部分を把持されて位置決めされる。すなわち、搬入
ローラコンベア26から押し出される力で、液晶板形成
用の被検査体10の搬送方向中央部位置の掴み代の部分
が把持体5に挟まれるような形態となる。更に具体的に
説明すると、把持体5は、被検査体10が搬送コンベア
2に受け渡されまでは、図10に示すように前記上チャ
ック片36a、下チャック片37aが閉じた状態で掴み
位置に至り、掴み位置にて図示しない押圧部が前記作動
体31のローラ31cを上方に押す。すると、前記ロー
ラ31cの上方への変位に連動して前記一対の操作シャ
フト39、39及び上チャック板36もコイルバネ51
のバネ力に抗して上方へ変位し、これにより、前記リン
ク部41の上アーム47が図10において回動体44を
時計方向に回動させ、下アーム48を変位させて下チャ
ック板37を下降させる。この結果、上チャック片36
a、下チャック片37aは相互の間隔が開いた図6に示
す状態となり、上チャック片36a、下チャック片37
a間に、被検査体10の搬送方向中央部位置の掴み代の
部分が挟まれる。このとき、前記コイルバネ51のバネ
力が上チャック板36に作用しているので、被検査体1
0の挟み状態は維持される。そして、搬送コンベア2の
矢印方向への移動とともに把持体5も被検査体10を把
持しつつ移動し、光源3からラインCCD4への検査光
路を通過し(図3)、欠焔検査工程が終了した後、図4
に示す位置よりも少し先の位置である搬出端において、
把持体5は被検査体10の把持状態を自動的に解除し、
これにより、被検査体10は前記搬出ローラコンベア2
7へ搬出され、次工程へと運ばれる。具体的には、把持
体5により被検査体10の搬送方向中央部位置の掴み代
の部分が把持された状態で搬出端に至った段階で図示し
ない押圧部が前記作動体31のローラ31cを上方に押
す。すると、ローラ31cの上方への変位に連動して前
記一対の操作シャフト39、39及び上チャック板36
も上方へ変位し、これにより、リンク部41の上アーム
47が図6において回動体44を時計方向に回動させ、
下アーム48を変位させて下チャック板37を下降させ
る。この結果、上チャック片36a、下チャック片37
aは相互の間隔が離隔する状態となり、上チャック片3
6a、下チャック片37a間に挟まれていた被検査体1
0は解放状態になる。被検査体10が解放された後は、
前記コイルバネ51のバネ力により上チャック片36
a、下チャック片37aは図10に示す元の状態に復帰
する。このようにして、本実施の形態の搬送検査装置1
によれば、いわゆる循環型の被検査体10の搬送検査装
置1において被検査体10を把持する把持体5の動力を
含む全ての配線類を搬送検査装置1の外部に設ける(動
力を含む全ての配線類を駆動機構内部に具備しない)こ
とにより、前記従来のような被検査体である例えばガラ
ス基板等を搬送している間に配管や配線の捩れが生じて
しまい搬送不可となってしまうような事態を解消できる
とともに、従来のような配線、配管類が不要となること
により、コストやゴミの発生が大きく削減でき、また、
被検査体の形状を矩形に制限することなく円滑に搬送し
検査することができる。更に、本実施の形態の搬送検査
装置1によれば、被検査体10の位置決め搬送を迅速、
且つ、円滑に行ない、前記従来例のような被検査体10
の後戻し処理等が不要となり、欠陥検査工程終了後自動
的に次工程へ搬出でき、この結果、検査時間を大幅に短
縮できる。また、搬入されてくる被検査体10に対し
て、前記肥持体5によりその搬送方向中央部位置の掴み
代の部分を速やか把持するようにしているので、前述し
た従来例の如く被検査体であるガラス基板の大小に応じ
てその都度、被検査体であるガラス基板を各々把持する
把持体102による掴み位置を個別に調整し変更する必
要がなく、更に、掴みクラック(微少な破損で広がるの
でダメージが大きい)等の損傷を防止することができ、
被検査体10の品質を維持したまま次工程へと搬出でき
る。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of a so-called circulation type inspecting apparatus (for example, a glass substrate) for carrying and inspecting apparatus according to the present invention will be described in detail below with reference to FIGS. FIG. 1 shows a schematic configuration of a transportation inspection apparatus 1 for an object to be inspected 10 according to an embodiment of the present invention. The transportation inspection apparatus 1 for the object to be inspected is, for example, a rectangular shape or the like for forming a liquid crystal plate. The object to be inspected 10 is conveyed by a conveyor 2 using a pair of endless rotary frames 2a and 2b, which are conveying means, and the inspected optical system having a light source 3 and a line CCD (line sensor) 4 is used for the inspection. By scanning the surface of the body 10 to be inspected (hereinafter referred to as "inspection surface"), a defect inspection of a liquid crystal portion such as a TFT provided on the inspection surface is performed. At a central position in the transport direction of the DUT 10 by the transport conveyor 2 (a position where the width dimension of the transport conveyor 2 is L / 2, L / 2), from the loading position of the DUT 10 to the unloading position. Up to this point, the gripping body 5 that constitutes a gripping and releasing mechanism portion that positions and grips the gripping margin provided on the leading edge of the inspected body 10 in the transport direction is provided. In the present embodiment, the gripping bodies 5 are provided at a total of two positions, for example, at positions where the entire circumference of the conveyor 2 is divided into two. That is, the gripping body 5 of one of the gripping and releasing mechanism portions is arranged above and below the rotating frames 2a and 2b of the transport conveyor 2 by making four small rollers 22 on the metal plate smaller in the lower space than in the upper space. Two racks 23, 23 configured by mounting two racks on each
A connecting plate 24 is bridged between the individual racks 23, 23, and the grip body 5 is attached to the central position of the connecting plate 24 in the transport direction. Then, the connecting plate 24 is rotated by a wire driving mechanism (not shown) to rotate frames 2a, 2b of the conveyor 2.
I am trying to move along. The other gripping and releasing mechanism 5 has a similar structure, and is mounted so as not to interfere with the inspection light path from the light source 3 to the line CCD 4. An object to be inspected 10 is provided at the front stage of the conveyor 2.
A carry-in roller conveyor 26 for the inspection object 10 is provided, and a carry-out roller conveyor 27 for the object to be inspected 10 is provided at the subsequent stage of the transport conveyor 2. Here, the grip body 5 that constitutes the grip and release mechanism will be described in detail with reference to FIGS. 5 to 11. As shown in FIGS. 5 to 7, the grip body 5 includes a main body portion 30 attached to the connecting plate 24 and having a substantially rectangular parallelepiped shape as a whole, and an outside of the main body portion 30, for example, a main body portion as shown in FIG. It has an operating body 31 for performing a gripping operation and a gripping releasing operation which are projected downward from the bottom surface of 30. That is, in the present embodiment, the gripping and releasing mechanism section driven by the drive mechanism provided outside the transporting means is provided. The main body portion 30 is a rectangular upper plate 3
2, a pair of side plates 33a and 33b, a lower plate 3
4 are provided, and these required parts are joined and connected to each other using bolts 40 to form a rectangular parallelepiped space inside. The body portion 30 has side plates 33a and 33b, respectively.
A pair of linear guides 35 and 35 having both ends fitted between the upper plate 32 and the lower plate 34, which are located in the vicinity of, are attached in a vertical arrangement. A pair of linear guides 35, 35
Includes an upper chuck plate 36 and a lower chuck plate 37, which are vertically opposed to each other, and are arranged in parallel, and the linear guides 35 and 3 are respectively arranged.
5 are fitted to each other so as to be vertically slidable by using an annular bush 38. Further, in the region between the pair of linear guides 35, 35, the upper end is fitted to the lower surface of the upper chuck plate 36 and tightened and fixed by the bolt 40, and the intermediate portion is fixed to the lower chuck plate 3.
7 in a slidable penetrating state via an annular bush 38, and further, a lower end side of the operating shaft 3 penetrating the lower plate 34 in a loosely fitted state and protruding downward.
It has 9, 39. This pair of operation shafts 39,
To the lower end of 39, the upper end portions of the bracket 31a constituting the actuating body 31 are connected with bolts 40. The actuating body 31 is configured by rotatably supporting a roller 31c with respect to a bracket 31a via a shaft body 31b. On the other hand, a coil spring 51 that applies a spring force downward to the upper chuck plate 36 is provided between the upper plate 32 and the recessed portion provided in the center of the upper surface of the upper chuck plate 36. It is arranged using. 5 and 6 of the upper chuck plate 36.
In FIG. 5 and FIG. 6 of the lower chuck plate 37, the upper chuck piece 36 is on the left side of FIG.
As shown in FIG. 10, the gripping margin of the inspected body 10 is sandwiched between the upper chuck piece 36a and the lower chuck piece 37a. As shown in FIGS. 5 and 10, the operating member 3 is provided on the left side of the upper chuck plate 36 and the lower chuck plate 37 in FIGS. 5 and 6 (opposite side with the pair of linear guides 35, 35 interposed).
The upper chuck plate 36 and the lower chuck plate 37 are moved toward and away from each other in conjunction with the displacement of 1, that is, the annular bush 38 integral with the upper chuck plate 36 and the annular bush 38 integral with the lower chuck plate 37. A link portion 41 is provided to bring the joined state into a separated state. The link unit 41 will be described with reference to FIGS. 11 and 12. The link portion 41 includes a center shaft 42 that is rotatably installed between the side plates 33a and 33b using a bearing 43, a rotating body 44 that is fitted to the center shaft 42, the upper chuck plate 36, and the lower chuck plate 36. A pair of hinge brackets 45, 46 attached to the chuck plate 37 using bolts 40, respectively, and a protruding end of the hinge bracket 45 on the upper chuck plate 36 side,
An upper arm 47 whose both ends are rotatably attached to the outer peripheral portion of the rotating body 44, a protruding end of the hinge bracket 46 on the lower chuck plate 37 side, and the upper arm 47 on the outer peripheral portion of the rotating body 44. What is the mounting position? Center shaft 4
A lower arm 48 having both ends rotatably attached is provided between the two symmetrical positions. The operation of the transport inspection apparatus 1 described above will be described below. The object to be inspected 10 which is successively carried in by the carry-in roller conveyor 26 with good timing is delivered to the carrying conveyor 2 (FIG. 2), and at this time, by the gripping body 5 of the gripping and releasing mechanism section at a predetermined timing. The gripping margin portion at the central position in the transport direction is gripped and positioned. In other words, the force pushed out from the carry-in roller conveyor 26 is such that the gripping portion at the central position in the transport direction of the inspection object 10 for liquid crystal plate formation is pinched by the gripping body 5. More specifically, when the object to be inspected 10 is delivered to the transport conveyor 2, the gripping body 5 holds the gripping position with the upper chuck piece 36a and the lower chuck piece 37a closed as shown in FIG. At the gripping position, the pressing portion (not shown) pushes the roller 31c of the actuating body 31 upward. Then, the pair of operation shafts 39, 39 and the upper chuck plate 36 are also moved by the coil spring 51 in conjunction with the upward displacement of the roller 31c.
The upper arm 47 of the link part 41 rotates the rotating body 44 in the clockwise direction in FIG. 10, and the lower arm 48 is displaced to move the lower chuck plate 37. Lower it. As a result, the upper chuck piece 36
The lower chuck piece 37a and the lower chuck piece 37a are in a state shown in FIG.
The portion of the gripping margin at the central position in the transport direction of the device under test 10 is sandwiched between a. At this time, since the spring force of the coil spring 51 acts on the upper chuck plate 36, the object to be inspected 1
The sandwiched state of 0 is maintained. Then, as the carrier 2 moves in the direction of the arrow, the gripping body 5 also moves while gripping the object to be inspected 10, passes through the inspection optical path from the light source 3 to the line CCD 4 (FIG. 3), and the defect inspection step ends. After that, Figure 4
At the carry-out end, which is a little ahead of the position shown in
The gripping body 5 automatically releases the gripped state of the inspection object 10,
As a result, the inspection object 10 is moved to the carry-out roller conveyor 2
It is carried out to No. 7 and carried to the next process. Specifically, when the gripping body 5 grips the gripping margin portion of the inspected body 10 at the central position in the transport direction, a pressing portion (not shown) presses the roller 31c of the actuating body 31 at the stage of reaching the carry-out end. Push upwards. Then, the pair of operation shafts 39, 39 and the upper chuck plate 36 are interlocked with the upward displacement of the roller 31c.
Is also displaced upward, whereby the upper arm 47 of the link portion 41 rotates the rotating body 44 in the clockwise direction in FIG.
The lower arm 48 is displaced to lower the lower chuck plate 37. As a result, the upper chuck piece 36a and the lower chuck piece 37
a is in a state in which the upper chuck piece 3 and the upper chuck piece 3 are separated from each other.
6a, DUT 1 sandwiched between lower chuck piece 37a
0 is released. After the inspection object 10 is released,
Due to the spring force of the coil spring 51, the upper chuck piece 36
The lower chuck piece 37a returns to the original state shown in FIG. In this way, the transport inspection apparatus 1 of the present embodiment
According to the above, all wirings including the power of the gripping body 5 that grips the inspected object 10 in the so-called circulating type inspected object 10 for inspecting the inspected object 10 are provided outside the inspected object 1 (all including power). No wiring is provided inside the drive mechanism), the pipe or the wiring is twisted while the object to be inspected, such as the conventional glass substrate, is conveyed, which makes the conveyance impossible. In addition to eliminating such situations, the conventional wiring and piping are no longer required, which significantly reduces costs and dust generation.
The object to be inspected can be smoothly conveyed and inspected without being limited to a rectangular shape. Further, according to the transport inspection apparatus 1 of the present embodiment, positioning and transport of the inspection object 10 can be performed quickly and
In addition, the object to be inspected 10 as in the conventional example, which is smoothly operated
The post-returning process and the like are not required, and the defect inspection process can be automatically carried out to the next process. As a result, the inspection time can be significantly reduced. Further, since the fertilizer 5 quickly grips the portion of the gripping margin at the central position in the transport direction with respect to the object to be inspected 10 which is carried in, the object to be inspected as in the conventional example described above. It is not necessary to individually adjust and change the gripping position by the gripping body 102 that grips the glass substrate that is the object to be inspected, depending on the size of the glass substrate that is It is possible to prevent such damage)
The inspection object 10 can be carried out to the next step while maintaining its quality.

【発明の効果】本発明によれば、上述した構成としたこ
とにより、いわゆる循環型の被検査体の搬送検査装置に
おいて前記従来のような被検査体である例えばガラス基
板等を搬送している間に配管や配線の捩れが生じてしま
い搬送不可となってしまうような事態を解消できるとと
もに、従来のような配線、配管類が不要となることによ
り、コストやゴミの発生が大きく削減でき、また、被検
査体の形状を矩形に制限することなく円滑に搬送し検査
することができ、更に、搬送手段上に受け入れた例えば
液晶板のような被検査体の位置決め搬送を迅速、且つ、
円滑に行ない、被検査体の後戻し等も不要であり、欠陥
検査工程終了後自動的に次工程へ撒出できるので、検査
時間をの短縮化が図ることができる。また、本発明によ
れば、搬入されてくる被検査体に対して、被検査体の搬
入位置にて上チャック片、下チャック片によりその搬送
方向中央部位置の掴み代の部分を速やか把持し、また、
被検査体の搬出位置にて上チャック片、下チャック片に
より把持解除を行うようにしているので、被検査体であ
るガラス基板の大小に応じてその都度ガラス基板を各々
把持する把持体による掴み位置を個別に調整し変更する
必要がなく、如何なるサイズの被検査体であるガラス基
板にも即時に対応でき、掴みクラック(微少な破損で広
がるのでダメージが大きい)等の損傷を防止することも
できる。
According to the present invention, with the above-described structure, a so-called circulating type inspecting apparatus for inspecting an object, such as a glass substrate, which is an object to be inspected, is conveyed. It is possible to eliminate the situation that the pipes and wiring are twisted between them and it becomes impossible to carry, and because the conventional wiring and piping are not required, cost and dust generation can be greatly reduced, Further, it is possible to smoothly convey and inspect an object to be inspected without restricting the shape of the object to be rectangular, and to quickly and accurately position and convey the object to be inspected such as a liquid crystal plate received on the conveying means.
The inspection can be performed smoothly, and there is no need to return the inspected object to the next process automatically after the defect inspection process is completed, so that the inspection time can be shortened. Further, according to the present invention, with respect to the object to be inspected that is being carried in, the upper chuck piece and the lower chuck piece quickly grasp the portion of the gripping margin at the central position in the transport direction at the position where the object is inspected. ,Also,
Since the upper chuck piece and the lower chuck piece are used to release the grip at the unloading position of the object to be inspected, the glass substrate to be inspected is grasped by the gripping body that grips the glass substrate each time. There is no need to adjust and change the position individually, and it is possible to immediately respond to any size of glass substrate that is the object to be inspected, and prevent damage such as grip cracks (large damage because it spreads with minute damage) it can.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施の形態の被検査体の搬送検査装置
の概略構成を示すものである。
FIG. 1 is a diagram showing a schematic configuration of a conveyance inspection device for an inspection object according to an embodiment of the present invention.

【図2】本実施の形態の搬送検査装置の被検査体搬入時
の動作説明図である。
FIG. 2 is an operation explanatory diagram of the conveyance inspection device of the present embodiment when the inspection target is carried in.

【図3】本実施の形態の搬送検査装置の被検査体搬送途
中の動作説明図である。
FIG. 3 is an operation explanatory diagram of the conveyance inspection device of the present embodiment during conveyance of the object to be inspected.

【図4】本実施の形態の搬送検査装置の被検査体搬出直
前の動作説明図である。
FIG. 4 is an operation explanatory diagram of the transport inspection apparatus according to the present embodiment immediately before unloading an object to be inspected.

【図5】本実施の形態の把持体の平面図である。FIG. 5 is a plan view of the grip body according to the present embodiment.

【図6】図5のX−X断面図である。6 is a sectional view taken along line XX of FIG.

【図7】図5のY−Y断面図である。7 is a cross-sectional view taken along line YY of FIG.

【図8】図7のA−A断面図である。8 is a cross-sectional view taken along the line AA of FIG.

【図9】図7のB−B断面図である。9 is a sectional view taken along line BB of FIG.

【図10】本実施の形態の把持体の閉状態の断面図であ
る。
FIG. 10 is a cross-sectional view of a gripping body according to the present embodiment in a closed state.

【図11】本実施の形態の把持体のリンク部の平面図で
ある。
FIG. 11 is a plan view of a link portion of the grip body according to the present embodiment.

【図12】本実施の形態の把持体のリンク部の断面図で
ある。
FIG. 12 is a cross-sectional view of a link portion of the grip body according to the present embodiment.

【図13】従来の被検査体の搬送検査装置の構成を示す
概略平面図である。
FIG. 13 is a schematic plan view showing the configuration of a conventional conveyance inspection device for an object to be inspected.

【符号の説明】[Explanation of symbols]

1 搬送検査装置 2 搬送コンベア 3 光源 4 ラインCCD 5 把持体 10 被検査体 23 ラック 24 連結板 26 搬入ローラコンベア 27 搬出ローラコンベア 30 本体部 31 作動体 31a ブラケット 31b 軸体 31c ローラ 32 上プレート 33a 側プレート 33b 側プレート 34 下プレート 35 リニアガイド 36 上チャック板 36a 上チャック片 37 下チャック板 37a 下チャック片 38 環状ブッシュ 39 操作シャフト 40 ボルト 41 リンク部 42 センター軸 43 軸受 44 回動体 45 ヒンジブラケット 46 ヒンジブラケット 47 上アーム 48 下アーム 51 コイルバネ 52 抑え板 1 Transport inspection device 2 Conveyor 3 light sources 4-line CCD 5 gripping body 10 Inspected object 23 racks 24 Connecting plate 26 Carry-in roller conveyor 27 Unloading roller conveyor 30 body 31 Actuator 31a bracket 31b shaft 31c roller 32 upper plate 33a side plate 33b side plate 34 Lower plate 35 Linear guide 36 Upper chuck plate 36a Upper chuck piece 37 Lower chuck plate 37a Lower chuck piece 38 annular bush 39 Operation shaft 40 volts 41 Link 42 Center axis 43 bearing 44 Rotating body 45 hinge bracket 46 hinge bracket 47 upper arm 48 Lower arm 51 coil spring 52 Rest plate

───────────────────────────────────────────────────── フロントページの続き Fターム(参考) 2G051 AA90 AB02 CA03 DA01 DA06 2G086 EE10 2H088 FA11 FA16 FA17 FA30 HA01 HA08 HA12 MA20 5F031 CA05 GA15 GA16 GA51 GA53 MA33    ─────────────────────────────────────────────────── ─── Continued front page    F-term (reference) 2G051 AA90 AB02 CA03 DA01 DA06                 2G086 EE10                 2H088 FA11 FA16 FA17 FA30 HA01                       HA08 HA12 MA20                 5F031 CA05 GA15 GA16 GA51 GA53                       MA33

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】被検査体を搬送手段により搬送しつつ検査
光学系を用いて前記被検査体を走査することにより被検
査体の欠陥検査を行う被検査体の搬送検査装置であっ
て、 前記搬送手段による被検査体の搬送方向中央部位置に、
前記被検査体の搬入位置から搬出位置に至るまで前記被
検査体を位置決め把持し、搬出位置にて把持解除を行う
とともに、搬送手段の外方に具備した駆動機構により駆
動する把持及び解除機構部を設けたことを特徴とする被
検査体の搬送検査装置。
1. A conveyance inspection apparatus for a body to be inspected, which conveys the body to be inspected by a conveying means and scans the body to be inspected by using an inspection optical system, wherein At the central position in the transport direction of the object to be inspected by the transport means,
A gripping and releasing mechanism unit that positions and grips the object to be inspected from the carry-in position to the carry-out position of the object to be inspected, releases the grip at the carry-out position, and is driven by a drive mechanism provided outside the conveying means. An apparatus for inspecting and transporting an object to be inspected, comprising:
【請求項2】前記把持及び解除機構部は、被検査体の搬
送方向中央部位置に臨ませる上チャック片、下チャック
片を備えた本体部と、 本体部の外方に突出配置され、前記被検査体の搬入位
置、搬出位置にて押圧力が作用する作動体と、 前記本体部内に上下対向配置に、且つ、各々上下方向に
スライド可能に配置されるとともに前記上チャック片、
下チャック片に各々連結した上チャック板、下チャック
板と、 前記作動体に作用する押圧力を上チャック板に伝達する
操作シャフトと、 前記上チャック板、下チャック板間に亙って設けられ、
前記上チャック板に伝達される押圧力に連動して、前記
上チャック片、下チャック片間を被検査体の把持及び把
持解除可能な開状態とするリンク部と、 前記上チャック片に対して常時前記上チャック片、下チ
ャック片間の閉方向のばね力を付与する弾性体と、 を有することを特徴とする請求項1記載の被検査体の搬
送検査装置。
2. The gripping and releasing mechanism portion is a main body portion having an upper chuck piece and a lower chuck piece facing a central position in the conveyance direction of the object to be inspected, and is arranged so as to project outside the main body portion. An actuating body to which a pressing force is applied at the loading position and the unloading position of the object to be inspected; and an upper and lower chuck piece, which are vertically opposed to each other in the main body and slidable in the vertical direction.
An upper chuck plate and a lower chuck plate respectively connected to the lower chuck piece, an operation shaft for transmitting a pressing force acting on the actuating body to the upper chuck plate, and an operation shaft provided between the upper chuck plate and the lower chuck plate. ,
A link portion that interlocks with the pressing force transmitted to the upper chuck plate to open the space between the upper chuck piece and the lower chuck piece so that the object to be inspected can be gripped and released, and with respect to the upper chuck piece. 2. The conveyance inspection apparatus for an object to be inspected according to claim 1, further comprising: an elastic body that constantly applies a spring force in a closing direction between the upper chuck piece and the lower chuck piece.
JP2001229124A 2001-07-30 2001-07-30 Inspection device for conveyance of object to be inspected Pending JP2003042958A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001229124A JP2003042958A (en) 2001-07-30 2001-07-30 Inspection device for conveyance of object to be inspected

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001229124A JP2003042958A (en) 2001-07-30 2001-07-30 Inspection device for conveyance of object to be inspected

Publications (1)

Publication Number Publication Date
JP2003042958A true JP2003042958A (en) 2003-02-13

Family

ID=19061516

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001229124A Pending JP2003042958A (en) 2001-07-30 2001-07-30 Inspection device for conveyance of object to be inspected

Country Status (1)

Country Link
JP (1) JP2003042958A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011119635A (en) * 2009-11-30 2011-06-16 Schmid-Yaya Technology Co Ltd Conveyor table of wafer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011119635A (en) * 2009-11-30 2011-06-16 Schmid-Yaya Technology Co Ltd Conveyor table of wafer

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