JP2002525685A5 - - Google Patents

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Publication number
JP2002525685A5
JP2002525685A5 JP2000571400A JP2000571400A JP2002525685A5 JP 2002525685 A5 JP2002525685 A5 JP 2002525685A5 JP 2000571400 A JP2000571400 A JP 2000571400A JP 2000571400 A JP2000571400 A JP 2000571400A JP 2002525685 A5 JP2002525685 A5 JP 2002525685A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000571400A
Other languages
Japanese (ja)
Other versions
JP2002525685A (ja
Filing date
Publication date
Priority claimed from PCT/GB1998/002876 external-priority patent/WO2000017809A1/en
Application filed filed Critical
Publication of JP2002525685A publication Critical patent/JP2002525685A/ja
Publication of JP2002525685A5 publication Critical patent/JP2002525685A5/ja
Pending legal-status Critical Current

Links

JP2000571400A 1998-09-24 1999-09-24 プログラム可能レンズアッセンブリ及びこれを組み込んだ光学システム Pending JP2002525685A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
PCT/GB1998/002876 WO2000017809A1 (en) 1998-09-24 1998-09-24 Improvements relating to pattern recognition
GB98/02876 1998-09-24
PCT/GB1999/003000 WO2000017810A1 (en) 1998-09-24 1999-09-24 Programmable lens assemblies and optical systems incorporating them

Publications (2)

Publication Number Publication Date
JP2002525685A JP2002525685A (ja) 2002-08-13
JP2002525685A5 true JP2002525685A5 (enExample) 2006-11-24

Family

ID=10826798

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2000571399A Expired - Fee Related JP4197844B2 (ja) 1998-09-24 1998-09-24 パターン認識に関する改良
JP2000571400A Pending JP2002525685A (ja) 1998-09-24 1999-09-24 プログラム可能レンズアッセンブリ及びこれを組み込んだ光学システム

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP2000571399A Expired - Fee Related JP4197844B2 (ja) 1998-09-24 1998-09-24 パターン認識に関する改良

Country Status (11)

Country Link
US (1) US7067784B1 (enExample)
EP (2) EP1116169B1 (enExample)
JP (2) JP4197844B2 (enExample)
CN (1) CN1133952C (enExample)
AT (2) ATE246380T1 (enExample)
AU (2) AU9176398A (enExample)
CA (2) CA2345262A1 (enExample)
DE (2) DE69816876T2 (enExample)
MX (1) MXPA01003035A (enExample)
NO (1) NO20011519L (enExample)
WO (2) WO2000017809A1 (enExample)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
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US20020122595A1 (en) * 1999-06-04 2002-09-05 Rikk Crill Apparatus and method for radial and angular or rotational analysis of images for shape content and matching
US7103223B2 (en) 2000-03-27 2006-09-05 Look Dynamics, Inc. Apparatus and method for radial and angular or rotational analysis or images for shape content and matching
CA2349828A1 (en) * 2001-06-06 2002-12-06 Andrew M. Zador Method, apparatus, and system for extracting denoised, high-resolution images, texture, and velocity from a lower-resolution, noisy detector
IL174590A (en) * 2005-03-29 2015-03-31 Yoel Arieli A method and an imaging system for the analysis of optical properties of an object illuminated by a light source
US7634771B2 (en) * 2005-04-29 2009-12-15 Sap (Ag) Object generation in packages
GB0510470D0 (en) 2005-05-23 2005-06-29 Qinetiq Ltd Coded aperture imaging system
GB2434935A (en) 2006-02-06 2007-08-08 Qinetiq Ltd Coded aperture imager using reference object to form decoding pattern
GB2434877A (en) 2006-02-06 2007-08-08 Qinetiq Ltd MOEMS optical modulator
GB2434934A (en) 2006-02-06 2007-08-08 Qinetiq Ltd Processing coded aperture image data by applying weightings to aperture functions and data frames
GB2434937A (en) 2006-02-06 2007-08-08 Qinetiq Ltd Coded aperture imaging apparatus performing image enhancement
GB0602380D0 (en) 2006-02-06 2006-03-15 Qinetiq Ltd Imaging system
GB2434936A (en) 2006-02-06 2007-08-08 Qinetiq Ltd Imaging system having plural distinct coded aperture arrays at different mask locations
GB0615040D0 (en) 2006-07-28 2006-09-06 Qinetiq Ltd Processing method for coded apperture sensor
US8189172B2 (en) * 2007-06-14 2012-05-29 Asml Netherlands B.V. Lithographic apparatus and method
US8692974B2 (en) * 2007-06-14 2014-04-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method using pupil filling by telecentricity control
US7988297B2 (en) 2007-10-19 2011-08-02 Look Dynamics, Inc. Non-rigidly coupled, overlapping, non-feedback, optical systems for spatial filtering of fourier transform optical patterns and image shape content characterization
JP2012502275A (ja) * 2008-09-08 2012-01-26 アードート,ネド,エム. ディジタルビデオフィルタおよび画像処理
JP5423222B2 (ja) * 2009-08-07 2014-02-19 ソニー株式会社 位置検出装置および位置検出方法
JP5515848B2 (ja) * 2010-02-24 2014-06-11 大日本印刷株式会社 光学素子およびその製造方法
CN104884862B (zh) * 2012-10-24 2019-11-19 视瑞尔技术公司 照明设备
US9110240B2 (en) * 2013-03-05 2015-08-18 Rambus Inc. Phase gratings with odd symmetry for high-resolution lensed and lensless optical sensing
US20140267617A1 (en) * 2013-03-15 2014-09-18 Scott A. Krig Adaptive depth sensing
US10591870B2 (en) 2014-05-01 2020-03-17 Celloptic, Inc. Birefringent lens interferometer for use in microscopy and other applications
CN104091977B (zh) * 2014-05-06 2016-06-15 无锡日联科技股份有限公司 卷绕锂离子电池的检测方法
US10284825B2 (en) 2015-09-08 2019-05-07 Rambus Inc. Systems with integrated refractive and diffractive optics
CN108605086B (zh) * 2016-03-31 2020-10-27 松下知识产权经营株式会社 摄像装置
JP2019515354A (ja) * 2016-05-06 2019-06-06 セルオプティック、インコーポレイテッドCelloptic, Inc. 顕微鏡法及び他の応用例で使用するための複屈折レンズ干渉計
US10649118B2 (en) * 2016-09-26 2020-05-12 Hitachi, Ltd. Imaging device
US10620447B2 (en) 2017-01-19 2020-04-14 Cognex Corporation System and method for reduced-speckle laser line generation
IL273370B2 (en) 2017-09-20 2025-01-01 Look Dynamics Inc Photonic Neural Network System
US11665324B2 (en) * 2018-08-06 2023-05-30 University Of Maryland, College Park High fidelity configuration for two-photon SLM microscopy
EP3980846A1 (en) * 2019-06-06 2022-04-13 Optalysys Ltd Waveguide devices
CN118541638A (zh) * 2022-01-20 2024-08-23 株式会社藤仓 光运算装置以及光运算方法
CN116538949B (zh) * 2023-07-03 2023-09-15 湖南大学 一种基于时域超分辨的高速动态过程dic测量装置与方法
CN117593501B (zh) * 2023-11-24 2024-08-30 杭州隆硕科技有限公司 一种激光测距望远镜模式转换方法和系统

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2282505A (en) * 1993-09-23 1995-04-05 Sharp Kk Three dimensional imaging apparatus

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