JP2002500763A5 - - Google Patents
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- Publication number
- JP2002500763A5 JP2002500763A5 JP1999500349A JP50034999A JP2002500763A5 JP 2002500763 A5 JP2002500763 A5 JP 2002500763A5 JP 1999500349 A JP1999500349 A JP 1999500349A JP 50034999 A JP50034999 A JP 50034999A JP 2002500763 A5 JP2002500763 A5 JP 2002500763A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB9710843.5 | 1997-05-28 | ||
| GBGB9710843.5A GB9710843D0 (en) | 1997-05-28 | 1997-05-28 | A thermal detector array |
| PCT/GB1998/001379 WO1998054554A1 (en) | 1997-05-28 | 1998-05-14 | A thermal detector array |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002500763A JP2002500763A (ja) | 2002-01-08 |
| JP2002500763A5 true JP2002500763A5 (enExample) | 2005-12-08 |
| JP4063892B2 JP4063892B2 (ja) | 2008-03-19 |
Family
ID=10813076
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50034999A Expired - Fee Related JP4063892B2 (ja) | 1997-05-28 | 1998-05-14 | サーマルディテクタアレー |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US6388256B1 (enExample) |
| EP (1) | EP0985137B1 (enExample) |
| JP (1) | JP4063892B2 (enExample) |
| KR (1) | KR100530440B1 (enExample) |
| AU (1) | AU732258B2 (enExample) |
| CA (1) | CA2290541C (enExample) |
| DE (1) | DE69829658T2 (enExample) |
| GB (1) | GB9710843D0 (enExample) |
| WO (1) | WO1998054554A1 (enExample) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001153720A (ja) * | 1999-11-30 | 2001-06-08 | Nec Corp | 熱型赤外線検出器 |
| US6828545B1 (en) * | 2001-05-15 | 2004-12-07 | Raytheon Company | Hybrid microelectronic array structure having electrically isolated supported islands, and its fabrication |
| KR20030016866A (ko) * | 2001-08-22 | 2003-03-03 | 대우전자주식회사 | 적외선 흡수 볼로메터의 산화막 형성 방법 |
| KR100529130B1 (ko) * | 2001-08-22 | 2005-11-15 | 주식회사 대우일렉트로닉스 | 적외선 흡수 볼로메터 제조 방법 |
| GB2385199A (en) * | 2002-02-08 | 2003-08-13 | Qinetiq Ltd | Substrate with conducting vias |
| GB2392307B8 (en) * | 2002-07-26 | 2006-09-20 | Detection Technology Oy | Semiconductor structure for imaging detectors |
| US7564125B2 (en) * | 2002-12-06 | 2009-07-21 | General Electric Company | Electronic array and methods for fabricating same |
| JPWO2005078400A1 (ja) * | 2004-02-17 | 2007-08-30 | 松下電器産業株式会社 | 赤外線検出装置およびその製造方法 |
| RU2255315C1 (ru) * | 2004-07-16 | 2005-06-27 | Государственное образовательное учреждение высшего профессионального образования "Уральский государственный технический университет - УПИ" | Способ тепловизионной диагностики процессов теплоотдачи |
| EP2029984A2 (en) * | 2006-06-01 | 2009-03-04 | Université de Liège | A thermal detector |
| GB2449853B (en) * | 2007-06-04 | 2012-02-08 | Detection Technology Oy | Photodetector for imaging system |
| JP5137059B2 (ja) * | 2007-06-20 | 2013-02-06 | 新光電気工業株式会社 | 電子部品用パッケージ及びその製造方法と電子部品装置 |
| US8049310B2 (en) * | 2008-04-01 | 2011-11-01 | Qimonda Ag | Semiconductor device with an interconnect element and method for manufacture |
| MY147335A (en) * | 2009-10-27 | 2012-11-30 | Mimos Berhad | An integrated packaged environmental sensor and roic and a method of fabricating the same |
| US9918023B2 (en) | 2010-04-23 | 2018-03-13 | Flir Systems, Inc. | Segmented focal plane array architecture |
| US9948878B2 (en) | 2010-04-23 | 2018-04-17 | Flir Systems, Inc. | Abnormal clock rate detection in imaging sensor arrays |
| US8610070B2 (en) | 2010-04-28 | 2013-12-17 | L-3 Communications Corporation | Pixel-level optical elements for uncooled infrared detector devices |
| US8513605B2 (en) * | 2010-04-28 | 2013-08-20 | L-3 Communications Corporation | Optically transitioning thermal detector structures |
| US8227755B2 (en) | 2010-04-28 | 2012-07-24 | L-3 Communications Corporation | Pixel-level optically transitioning filter elements for detector devices |
| CN102798471B (zh) * | 2011-10-19 | 2015-08-12 | 清华大学 | 一种红外探测器及其制备方法 |
| CN204927290U (zh) * | 2012-12-14 | 2015-12-30 | 菲力尔系统公司 | 具有分段式焦平面阵列的系统 |
| FR2999805B1 (fr) * | 2012-12-17 | 2017-12-22 | Commissariat Energie Atomique | Procede de realisation d'un dispositif de detection infrarouge |
| KR102197069B1 (ko) | 2014-02-04 | 2020-12-30 | 삼성전자 주식회사 | 이미지 센서 및 이미지 처리 장치 |
| US10879202B1 (en) * | 2019-07-26 | 2020-12-29 | International Business Machines Corporation | System and method for forming solder bumps |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3816750A (en) * | 1971-06-04 | 1974-06-11 | Honeywell Inc | Pyroelectric detector |
| US4142207A (en) * | 1977-12-20 | 1979-02-27 | Texas Instruments Incorporated | Ferroelectric imaging system |
| EP0098318B1 (de) * | 1982-07-03 | 1987-02-11 | Ibm Deutschland Gmbh | Verfahren zum Herstellen von Gräben mit im wesentlichen vertikalen Seitenwänden in Silicium durch reaktives Ionenätzen |
| GB2163596B (en) | 1984-08-24 | 1988-02-03 | Philips Electronic Associated | A thermal imaging device and a method of manufacturing a thermal imaging device |
| US5450053A (en) * | 1985-09-30 | 1995-09-12 | Honeywell Inc. | Use of vanadium oxide in microbolometer sensors |
| GB8827661D0 (en) | 1988-11-26 | 1989-05-17 | Emi Plc Thorn | Thermal imaging devices |
| GB8829685D0 (en) | 1988-12-20 | 1989-02-15 | Emi Plc Thorn | Thermal imaging device |
| US4954313A (en) * | 1989-02-03 | 1990-09-04 | Amdahl Corporation | Method and apparatus for filling high density vias |
| US5070026A (en) * | 1989-06-26 | 1991-12-03 | Spire Corporation | Process of making a ferroelectric electronic component and product |
| GB2236016A (en) * | 1989-09-13 | 1991-03-20 | Philips Electronic Associated | Pyroelectric and other infrared detection devices with thin films |
| US5602043A (en) * | 1995-01-03 | 1997-02-11 | Texas Instruments Incorporated | Monolithic thermal detector with pyroelectric film and method |
| US5627082A (en) | 1995-03-29 | 1997-05-06 | Texas Instruments Incorporated | High thermal resistance backfill material for hybrid UFPA's |
| US5618752A (en) * | 1995-06-05 | 1997-04-08 | Harris Corporation | Method of fabrication of surface mountable integrated circuits |
-
1997
- 1997-05-28 GB GBGB9710843.5A patent/GB9710843D0/en not_active Ceased
-
1998
- 1998-05-14 KR KR10-1999-7011134A patent/KR100530440B1/ko not_active Expired - Fee Related
- 1998-05-14 JP JP50034999A patent/JP4063892B2/ja not_active Expired - Fee Related
- 1998-05-14 EP EP98921609A patent/EP0985137B1/en not_active Expired - Lifetime
- 1998-05-14 DE DE69829658T patent/DE69829658T2/de not_active Expired - Fee Related
- 1998-05-14 US US09/424,615 patent/US6388256B1/en not_active Expired - Fee Related
- 1998-05-14 WO PCT/GB1998/001379 patent/WO1998054554A1/en not_active Ceased
- 1998-05-14 AU AU74398/98A patent/AU732258B2/en not_active Ceased
- 1998-05-14 CA CA002290541A patent/CA2290541C/en not_active Expired - Fee Related