JP2002340765A - Equipment for evaluating/testing thermal fatigue lifetime - Google Patents
Equipment for evaluating/testing thermal fatigue lifetimeInfo
- Publication number
- JP2002340765A JP2002340765A JP2001142568A JP2001142568A JP2002340765A JP 2002340765 A JP2002340765 A JP 2002340765A JP 2001142568 A JP2001142568 A JP 2001142568A JP 2001142568 A JP2001142568 A JP 2001142568A JP 2002340765 A JP2002340765 A JP 2002340765A
- Authority
- JP
- Japan
- Prior art keywords
- hollow structure
- cooling
- thermal fatigue
- heating
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Landscapes
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、肉厚方向に大きな
温度勾配や大きな熱応力を繰り返し発生する中空構造物
の熱疲労寿命評価試験装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thermal fatigue life evaluation test apparatus for a hollow structure which repeatedly generates a large temperature gradient and a large thermal stress in a thickness direction.
【０００２】[0002]
【従来の技術】従来の熱疲労試験装置は、特開平９−１
８９６５１号公報に記載のように、中空円筒試験片のゲ
ージ部を座屈しない範囲で薄肉とし、内部に高圧加熱水
を流すことによって、軸方向及び肉厚方向に均一な温度
分布を与える構成となっていた。2. Description of the Related Art A conventional thermal fatigue test apparatus is disclosed in
As described in JP-A-899651, the gauge portion of the hollow cylindrical test piece is made thinner as long as it does not buckle, and high-pressure heating water is flowed inside to give a uniform temperature distribution in the axial direction and the thickness direction. Had become.
【０００３】[0003]
【発明が解決しようとする課題】上記従来技術は、中空
構造物の肉厚方向に大きな温度勾配や大きな熱応力が繰
り返し発生する場合の寿命評価には不向きであった。そ
こで、本発明の目的は、肉厚方向に大きな温度勾配や大
きな熱応力が繰り返し発生する中空構造物の寿命評価に
最適な試験装置を提供することにある。However, the above prior art is not suitable for evaluating the life of a hollow structure in the case where a large temperature gradient or a large thermal stress is repeatedly generated in the thickness direction of the hollow structure. Therefore, an object of the present invention is to provide a test apparatus that is optimal for evaluating the life of a hollow structure in which a large temperature gradient and a large thermal stress are repeatedly generated in the thickness direction.
【０００４】[0004]
【課題を解決するための手段】上記目的を達成するため
に、本発明は、中空構造物を取り付けるための試験台を
搭載した試験槽と、中空構造物を加熱するための加熱装
置と、加熱装置内部及び中空構造物を冷却媒体で冷却す
るための冷却ループと、加熱装置及び冷却ループの制御
盤で構成される。本構成により、内部冷却、外部加熱の
中空構造物、あるいは、内部加熱、外部冷却の中空構造
物の肉厚方向には、大きな温度勾配と大きな熱応力を発
生させることができる。また、プログラム制御の温度調
節器を用いることで、中空構造物に加熱・冷却を繰り返
し負荷することが可能である。SUMMARY OF THE INVENTION In order to achieve the above object, the present invention provides a test tank equipped with a test stand for mounting a hollow structure, a heating device for heating the hollow structure, and a heating device. It comprises a cooling loop for cooling the inside of the device and the hollow structure with a cooling medium, a heating device and a control panel for the cooling loop. With this configuration, a large temperature gradient and a large thermal stress can be generated in the thickness direction of the internal cooling and external heating hollow structure or the internal heating and external cooling hollow structure. Further, by using a temperature controller controlled by a program, it is possible to repeatedly apply heating and cooling to the hollow structure.
【０００５】[0005]
【発明の実施の形態】以下、本発明の実施例を、中空構
造物のモデルとして円筒試験片を、また、加熱手段とし
て高周波誘導加熱装置を使用し、更に、冷却媒体として
純水を使用した場合について説明する。本発明に基づく
熱疲労寿命評価試験装置の構成を図１に示す。本試験装
置は、円筒試験片１を取り付けるための試験台２０を搭
載した試験槽３０からなる試験ブロック１００、円筒試
験片１を外側から加熱するための高周波加熱コイル２０
０、純水循環装置３１、高周波発振器３２、マッチング
ボックス３３、カレントトランス３４、アダプタ３５か
らなる高周波加熱装置３００、高周波加熱装置３００の
内部冷却に使用する純水を循環させるための冷却ループ
４０１、円筒試験片１の内部冷却に使用する純水を循環
させるための冷却ループ４０２、加熱された円筒試験片
１の内部を通って出てきた温められた純水を冷やすため
のクーリングタワー４３、冷えた純水を溜めておく貯水
タンク４４等から成る冷却ループ４００、冷却ループ４
００の制御ユニット７１、高周波加熱装置３００の制御
ユニット７２、プログラム制御の温度調節器７３、イン
ターロック回路７４から成る制御盤５００で構成され
る。BEST MODE FOR CARRYING OUT THE INVENTION The embodiments of the present invention are described below in which a cylindrical test piece is used as a model of a hollow structure, a high-frequency induction heating device is used as a heating means, and pure water is used as a cooling medium. The case will be described. FIG. 1 shows the configuration of a thermal fatigue life evaluation test apparatus according to the present invention. The test apparatus includes a test block 100 including a test tank 30 on which a test table 20 for mounting the cylindrical test piece 1 is mounted, and a high-frequency heating coil 20 for heating the cylindrical test piece 1 from outside.
0, a high-frequency heating device 300 including a pure water circulation device 31, a high-frequency oscillator 32, a matching box 33, a current transformer 34, and an adapter 35; a cooling loop 401 for circulating pure water used for cooling the high-frequency heating device 300; A cooling loop 402 for circulating pure water used for cooling the inside of the cylindrical test piece 1, a cooling tower 43 for cooling heated pure water coming out of the heated cylindrical test piece 1, and a cooling tower 43. Cooling loop 400 and cooling loop 4 including a water storage tank 44 for storing pure water and the like.
00, a control unit 72 of the high-frequency heating device 300, a temperature controller 73 of program control, and a control panel 500 including an interlock circuit 74.
【０００６】冷却ループ４００は、高周波加熱装置３０
０を内部冷却するための冷却ループ４０１と、円筒試験
片１の内部を冷却するための冷却ループ４０２とからな
る。水道４６から純水カートリッジ４５を介して貯水タ
ンク４４に純水が供給される。The cooling loop 400 includes the high-frequency heating device 30
A cooling loop 401 for cooling the inside of the cylindrical test piece 1 and a cooling loop 402 for cooling the inside of the cylindrical test piece 1. Pure water is supplied from the water supply 46 to the water storage tank 44 via the pure water cartridge 45.
【０００７】高周波加熱装置３００の内部冷却を行う冷
却ループ４０１では、貯水タンク４４からの純水が逆止
バルブ４７、フィルタ４８を通った後、送水ポンプ４１
によって冷却ループ４０１に送り出される。送水の圧力
と流量は、圧力調整バルブ４９及びバイパス用バルブ５
０によって調節することが可能で、圧力指示計５１及び
流量検出スイッチ付流量指示計５２〜５６によって、所
定の圧力と流量が確認できる。また、冷却ループ４０１
にある流量検出スイッチ付流量指示計５２〜５６、高周
波加熱装置３００の内部にある冷却水の温度スイッチ５
７、高周波加熱装置３００本体に関連するアラーム関係
がインターロック回路７４に接続してあり、流量不足の
場合や水温が設定値よりも高くなった場合、高周波加熱
装置３００本体に異常が発生した場合には、インターロ
ック回路７４が作動して高周波加熱装置３００の出力を
停止し、高周波加熱コイル２００による円筒試験片１の
加熱を停止するような安全構造を設けている。高周波加
熱装置３００を構成する純水循環装置３１、高周波発振
器３２、マッチングボックス３３、カレントトランス３
４、アダプタ３５から出てきた純水は逆止バルブ５８を
通ってクーリングタワー４３に戻り、冷却されて貯水タ
ンク４４に供給される。[0007] In a cooling loop 401 for cooling the inside of the high-frequency heating device 300, pure water from the water storage tank 44 passes through the check valve 47 and the filter 48, and then is supplied to the water supply pump 41.
To the cooling loop 401. The pressure and flow rate of the water supply are controlled by the pressure regulating valve 49 and the bypass valve 5.
The pressure can be adjusted by 0, and a predetermined pressure and flow rate can be confirmed by the pressure indicator 51 and the flow indicators 52 to 56 with a flow rate detection switch. Also, the cooling loop 401
Flow rate indicators 52 to 56 with flow rate detection switches, and a temperature switch 5 for cooling water inside the high-frequency heating device 300
7. When the alarm related to the main body of the high frequency heating device 300 is connected to the interlock circuit 74, the flow rate is insufficient, the water temperature becomes higher than the set value, or the abnormality of the main body of the high frequency heating device 300 occurs. Is provided with a safety structure such that the interlock circuit 74 operates to stop the output of the high-frequency heating device 300 and stop the heating of the cylindrical test piece 1 by the high-frequency heating coil 200. The high frequency heating device 300 includes a pure water circulation device 31, a high frequency oscillator 32, a matching box 33, and a current transformer 3.
4. The pure water coming out of the adapter 35 returns to the cooling tower 43 through the check valve 58, is cooled, and is supplied to the water storage tank 44.
【０００８】円筒試験片１の内部冷却を行う冷却ループ
４０２では、貯水タンク４４からの純水が逆止バルブ５
９、フィルタ６０を通った後、送水ポンプ４２によって
冷却ループ４０２に送り出される。送水の圧力と流量
は、圧力調整バルブ６１及びバイパス用バルブ６２によ
って調節することが可能で、圧力指示計６３及び温度指
示計６４、流量検出スイッチ付流量指示計６５、圧力指
示計６６によって、水温及び所定の流量と圧力が確認で
きる。入口ノズル１１から加熱された円筒試験片１の中
を通って出てきた温められた純水は、出口ノズル１２か
ら排水され、圧力指示計６７、温度検出スイッチ付温度
指示計６８、逆止バルブ６９を通ってクーリングタワー
４３に戻り、冷却されて貯水タンク４４に供給される。
冷却ループ４０２にある流量検出スイッチ付流量指示計
６５、温度検出スイッチ付温度指示計６８及び試験槽内
に設置してある水漏れ検出スイッチ１３はインターロッ
ク回路７４に接続してあり、流量不足の場合や水温が設
定値よりも高くなった場合には、インターロック回路７
４が作動して高周波加熱装置３００の出力を停止し、高
周波加熱コイル２００による円筒試験片１の加熱を停止
する。また、円筒試験片１に大きなき裂が発生して純水
が外部に漏れ出す等、水漏れが発生した場合には、水漏
れ検出スイッチ１３によりインターロック回路７４が作
動して、冷却ループ４０２の送水を停止するような安全
構造を設けている。さらに、熱疲労試験に際しては、冷
却ループ４００が正常に起動しない限り、高周波加熱装
置３００が起動出来ないような安全構造としている。In a cooling loop 402 for cooling the inside of the cylindrical test piece 1, pure water from the water storage tank 44 is supplied to the check valve 5.
9. After passing through the filter 60, the water is sent to the cooling loop 402 by the water supply pump 42. The pressure and flow rate of the water supply can be adjusted by a pressure adjusting valve 61 and a bypass valve 62, and the water temperature is determined by a pressure indicator 63 and a temperature indicator 64, a flow indicator 65 with a flow rate detection switch, and a pressure indicator 66. And a predetermined flow rate and pressure can be confirmed. The heated pure water that has flowed through the heated cylindrical test piece 1 from the inlet nozzle 11 is drained from the outlet nozzle 12, and has a pressure indicator 67, a temperature indicator 68 with a temperature detection switch, and a check valve. After returning to the cooling tower 43 through 69, it is cooled and supplied to the water storage tank 44.
The flow indicator 65 with a flow detection switch in the cooling loop 402, the temperature indicator 68 with a temperature detection switch, and the water leak detection switch 13 installed in the test tank are connected to the interlock circuit 74, If the water temperature is higher than the set value, the interlock circuit 7
4, the output of the high-frequency heating device 300 is stopped, and the heating of the cylindrical test piece 1 by the high-frequency heating coil 200 is stopped. If a large crack is generated in the cylindrical test piece 1 and pure water leaks to the outside, for example, the water leak detection switch 13 activates the interlock circuit 74 to operate the cooling loop 402. A safety structure is provided to stop water supply. Further, in the thermal fatigue test, the safety structure is such that the high-frequency heating device 300 cannot be started unless the cooling loop 400 starts normally.
【０００９】試験ブロック１００は、試験台２０と内部
に水漏れ検出スイッチ１３を設けた試験槽３０で構成さ
れる。試験台２０は、天板２、ベース板３及び３本の支
柱４によって骨組みされたやぐらと上部取付け治具５、
下部取付け治具６、ロードセル７、シャフト全体にねじ
を設けてあるねじシャフト８、止めナット９、１０、入
口ノズル１１、出口ノズル１２からなる。円筒試験片１
は、試験台２０に固定された下部取付け治具６とロード
セル７、ねじシャフト８、止めナット９、１０が連結し
た上部取付け治具５によって試験台２０に取り付けられ
る。冷却ループ４０２を通った純水は、入口ノズル１１
から円筒試験片１の中を流れ、出口ノズル１２より排水
される。The test block 100 comprises a test stand 20 and a test tank 30 provided with a water leak detection switch 13 therein. The test table 20 is composed of a tower framed by a top plate 2, a base plate 3 and three columns 4 and an upper mounting jig 5,
It comprises a lower mounting jig 6, a load cell 7, a screw shaft 8 provided with screws on the entire shaft, lock nuts 9, 10, an inlet nozzle 11, and an outlet nozzle 12. Cylindrical test piece 1
Is attached to the test table 20 by the upper mounting jig 5 in which the lower mounting jig 6 fixed to the test table 20 and the load cell 7, the screw shaft 8, the lock nuts 9, 10 are connected. Pure water passing through the cooling loop 402 is supplied to the inlet nozzle 11
Flows through the cylindrical test piece 1 and is discharged from the outlet nozzle 12.
【００１０】天板２の中心には、ねじシャフト８よりひ
とまわり大きい穴があいており、この穴を通るねじシャ
フト８は、軸方向に対して自由な状態にある。従って、
円筒試験片１の軸方向に加熱、冷却に伴う伸縮が発生し
ても、円筒試験片１には拘束力が作用しない。従って、
熱疲労のみの寿命評価試験が可能である。At the center of the top plate 2, there is a hole one size larger than the screw shaft 8, and the screw shaft 8 passing through this hole is free in the axial direction. Therefore,
Even if the cylindrical test piece 1 expands and contracts due to heating and cooling in the axial direction, no binding force acts on the cylindrical test piece 1. Therefore,
A life evaluation test only for thermal fatigue is possible.
【００１１】その一方で、図２に示すように、止めナッ
ト９，１０をそれぞれ天板２に対して締め付けてねじシ
ャフト８を固定すると、円筒試験片１の加熱、冷却に伴
う伸縮が拘束されるため、ロードセル７を介して拘束力
（荷重）を測定することができる。このように、熱によ
る構造物の変形を模擬した試験条件の寿命評価が可能で
ある。On the other hand, as shown in FIG. 2, when the screw nuts 8 and 10 are fastened to the top plate 2 to fix the screw shaft 8, expansion and contraction of the cylindrical test piece 1 caused by heating and cooling is restricted. Therefore, the binding force (load) can be measured via the load cell 7. In this way, it is possible to evaluate the life under test conditions simulating deformation of a structure due to heat.
【００１２】本装置により、図４に示すように、円筒試
験片１の内部に純水２１を流して、常に円筒試験片１の
内側から冷却するようにしておいて、円筒試験片１の外
周にある高周波加熱コイル２００及び高周波加熱装置３
００で円筒試験片１を外面から加熱すると、円筒試験片
１の肉厚方向（深さ方向）には、図６に実線２３で示す
ように、外表面の温度が高く、内表面の温度が低い形
で、大きな温度分布（温度勾配）が発生する。また、図
５に示すように、円筒試験片１の外部に純水２１を流し
て、常に円筒試験片１の外側から冷却するようにしてお
いて、円筒試験片１の内部にある高周波加熱コイル２０
０及び高周波加熱装置３００により、円筒試験片１を内
面から加熱すると、円筒試験片１の肉厚方向（深さ方
向）には、図６に破線２４で示すように、外表面の温度
が低く、内表面の温度が高い形で、大きな温度分布（温
度勾配）が発生する。With this apparatus, as shown in FIG. 4, pure water 21 is allowed to flow inside the cylindrical test piece 1 so as to always cool from the inside of the cylindrical test piece 1. -Frequency heating coil 200 and high-frequency heating device 3
When the cylindrical test piece 1 is heated from the outer surface at 00, the outer surface temperature is higher and the inner surface temperature is higher in the thickness direction (depth direction) of the cylindrical test piece 1 as shown by a solid line 23 in FIG. In the low form, a large temperature distribution (temperature gradient) occurs. As shown in FIG. 5, pure water 21 is flown outside the cylindrical test piece 1 so as to always cool the cylindrical test piece 1 from the outside. 20
When the cylindrical test piece 1 is heated from the inner surface by the 0 and the high frequency heating device 300, the temperature of the outer surface is low in the thickness direction (depth direction) of the cylindrical test piece 1 as shown by a broken line 24 in FIG. In addition, a large temperature distribution (temperature gradient) occurs in a form in which the temperature of the inner surface is high.
【００１３】また、本装置により、図３に示す試験サイ
クルで、図４に示す円筒試験片１の外表面に、加熱、温
度保持、冷却を繰り返し与えると、図７の実線２５で示
すように、加熱時には外表面に大きな圧縮応力、内表面
に大きな引張応力が発生し、冷却時には外表面に引張応
力、内表面に圧縮応力が残留する形のヒステリシスルー
プを描く。同様に、図５に示す場合には、図７の破線２
６で示すように、加熱時には外表面に大きな引張応力、
内表面に大きな圧縮応力が発生し、冷却時には外表面に
圧縮応力、内表面に引張応力が残留する形のヒステリシ
スループを描く。このように、円筒試験片１を冷却しな
がら加熱、温度保持、冷却を繰り返し与えると、内表面
と外表面に大きな応力分布が発生する。When the apparatus is repeatedly subjected to heating, temperature holding, and cooling on the outer surface of the cylindrical test piece 1 shown in FIG. 4 in the test cycle shown in FIG. 3, as shown by a solid line 25 in FIG. During heating, a large compressive stress is generated on the outer surface and a large tensile stress is generated on the inner surface. During cooling, a hysteresis loop is formed in which a tensile stress is generated on the outer surface and a compressive stress remains on the inner surface. Similarly, in the case shown in FIG. 5, the broken line 2 in FIG.
As shown by 6, large tensile stress on the outer surface during heating,
A large compressive stress is generated on the inner surface, and when cooling, a hysteresis loop is formed in which a compressive stress remains on the outer surface and a tensile stress remains on the inner surface. As described above, when heating, temperature holding, and cooling are repeatedly applied while cooling the cylindrical test piece 1, a large stress distribution is generated on the inner surface and the outer surface.
【００１４】また、本装置により、図４または図５に示
すような構成で、加熱、温度保持、冷却を繰り返し与え
ると、熱疲労により円筒試験片１の表面にき裂が発生
し、このき裂は繰返し数とともに成長する。図８に示す
ように、このき裂の長さと繰返し数の関係を求めて評価
することで、熱疲労条件下における寿命評価が可能とな
る。When the apparatus is repeatedly heated, maintained at a temperature, and cooled in a configuration as shown in FIG. 4 or FIG. 5, a crack is generated on the surface of the cylindrical test piece 1 due to thermal fatigue. Fissures grow with the number of cycles. As shown in FIG. 8, by evaluating the relationship between the length of the crack and the number of repetitions, the life can be evaluated under the conditions of thermal fatigue.
【００１５】[0015]
【発明の効果】本発明によれば、中空構造物の肉厚方向
に大きな温度勾配や大きな熱応力を繰り返し発生させる
ことが可能なため、より実稼動条件に近い形の熱疲労寿
命評価を実施することが出来る。According to the present invention, since a large temperature gradient and a large thermal stress can be repeatedly generated in the thickness direction of the hollow structure, a thermal fatigue life evaluation closer to actual operating conditions is performed. You can do it.
【図１】熱疲労寿命評価試験装置全体の系統図。FIG. 1 is a system diagram of the entire thermal fatigue life evaluation test apparatus.
【図２】試験片伸縮拘束の説明図。FIG. 2 is an explanatory view of a test piece expansion and contraction constraint.
【図３】試験サイクル図。FIG. 3 is a test cycle diagram.
【図４】内部冷却、外部加熱の説明図。FIG. 4 is an explanatory diagram of internal cooling and external heating.
【図５】外部冷却、内部加熱の説明図。FIG. 5 is an explanatory diagram of external cooling and internal heating.
【図６】肉厚方向の温度分布の説明図。FIG. 6 is an explanatory diagram of a temperature distribution in a thickness direction.
【図７】肉厚方向の応力分布の説明図。FIG. 7 is an explanatory diagram of a stress distribution in a thickness direction.
【図８】表面き裂長さと繰り返し数の関係を示す説明
図。FIG. 8 is an explanatory diagram showing a relationship between a surface crack length and the number of repetitions.
１…円筒試験片、２…天板、３…ベース板、４…支柱、
５…上部取付け治具、６…下部取付け治具、７…ロード
セル、８…ねじシャフト、９、１０…止めナット、１１
…入口ノズル、１２…出口ノズル、１３…水漏れ検出ス
イッチ、２０…試験台、２１…純水（冷却水）、２２…
冷却管、２３、２５…実線、２４、２６…破線、３０…
試験槽、３１…純水循環装置、３２…高周波発振器、３
３…マッチングボックス、３４…カレントトランス、３
５…アダプタ、４１，４２…送水ポンプ、４３…クーリ
ングタワー、４４…貯水タンク、４５…純水カートリッ
ジ、４６…水道、４７、５８、５９、６９…逆止バル
ブ、４８，６０…フィルタ、４９，６１…圧力調整バル
ブ、５０，６２…バイパス用バルブ、５１、６３、６
６、６７…圧力指示計、５２〜５６、６５…流量検出ス
イッチ付流量指示計、５７…温度スイッチ、６４…温度
指示計、６８…温度検出スイッチ付温度指示計、７１、
７２…制御ユニット、７３…温度調節器、７４…インタ
ーロック回路、１００…試験ブロック、２００…高周波
加熱コイル、３００…高周波加熱装置、４００、４０
１、４０２…冷却ループ、５００…制御盤。1 ... cylindrical test piece, 2 ... top plate, 3 ... base plate, 4 ... support,
5 upper mounting jig, 6 lower mounting jig, 7 load cell, 8 screw shaft, 9, 10 locking nut, 11
... Inlet nozzle, 12 ... Outlet nozzle, 13 ... Water leak detection switch, 20 ... Test table, 21 ... Pure water (cooling water), 22 ...
Cooling pipes, 23, 25 ... solid lines, 24, 26 ... broken lines, 30 ...
Test tank, 31: pure water circulation device, 32: high frequency oscillator, 3
3 matching box, 34 current transformer, 3
5 Adapter, 41, 42 Water pump, 43 Cooling tower, 44 Storage tank, 45 Pure water cartridge, 46 Water supply, 47, 58, 59, 69 Check valve, 48, 60 Filter, 49, 61: pressure adjusting valve, 50, 62: bypass valve, 51, 63, 6
6, 67 ... pressure indicator, 52 to 56, 65 ... flow indicator with flow detection switch, 57 ... temperature switch, 64 ... temperature indicator, 68 ... temperature indicator with temperature detection switch, 71,
72 control unit, 73 temperature controller, 74 interlock circuit, 100 test block, 200 high-frequency heating coil, 300 high-frequency heating device, 400, 40
1, 402: cooling loop, 500: control panel.
フロントページの続き (72)発明者 松田 憲昭 茨城県日立市幸町三丁目２番１号 日立エ ンジニアリング株式会社内 (72)発明者 寄川 盛男 茨城県日立市幸町三丁目２番１号 日立エ ンジニアリング株式会社内Continued on the front page (72) Inventor Noriaki Matsuda 3-2-1 Sachimachi, Hitachi City, Ibaraki Prefecture Within Hitachi Engineering Co., Ltd. (72) Inventor Morio Yorikawa 3-2-1 Sachimachi, Hitachi City, Ibaraki Prefecture Hitachi Engineering Co., Ltd.
Claims (3)
を取り付ける試験台と、試験台に取り付けられた中空構
造物を加熱するための加熱装置とからなる熱疲労試験装
置において、中空構造物を冷却媒体で常時冷却すること
を目的として、中空構造物の上部及び下部に配置した取
り付け治具に、構造物端面の中空部分まで続く穴とノズ
ルを設け、このノズルから中空構造物内に冷却媒体を流
すための冷却ループを備えたことを特徴とする熱疲労寿
命評価試験装置。1. A thermal fatigue test apparatus comprising: a hollow structure such as a pipe; a test table for mounting the hollow structure; and a heating device for heating the hollow structure mounted on the test table. For the purpose of constantly cooling the object with a cooling medium, mounting jigs arranged at the upper and lower parts of the hollow structure are provided with holes and nozzles extending to the hollow part of the end face of the structure, and from this nozzle into the hollow structure A thermal fatigue life evaluation test device comprising a cooling loop for flowing a cooling medium.
り付け治具は試験台に固定し、上部取り付け治具は試験
台に固定しない構造として、中空構造物の加熱及び加熱
停止（冷却媒体による冷却）により生じる伸縮を拘束し
ないようにして、純粋に熱疲労による寿命評価を可能と
した熱疲労寿命評価試験装置。2. The method according to claim 1, wherein the lower mounting jig of the hollow structure is fixed to the test table, and the upper mounting jig is not fixed to the test table. A thermal fatigue life evaluation test apparatus that enables pure life evaluation by thermal fatigue without restricting expansion and contraction caused by cooling.
り付け治具及び上部取り付け治具を試験台に固定し、中
空構造物の加熱及び加熱停止（冷却媒体による冷却）に
より生じる伸縮を拘束することで、熱による構造物の変
形を模擬した試験条件の寿命評価を可能とした熱疲労寿
命評価試験装置。3. The method according to claim 1, wherein the lower mounting jig and the upper mounting jig of the hollow structure are fixed to a test table to restrain expansion and contraction caused by heating and stopping the heating of the hollow structure (cooling by a cooling medium). This is a thermal fatigue life evaluation test device that enables life evaluation under test conditions that simulate deformation of a structure due to heat.
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|---|---|---|---|
| JP2001142568A JP2002340765A (en) | 2001-05-14 | 2001-05-14 | Equipment for evaluating/testing thermal fatigue lifetime |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001142568A JP2002340765A (en) | 2001-05-14 | 2001-05-14 | Equipment for evaluating/testing thermal fatigue lifetime |
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|---|---|
| JP2002340765A true JP2002340765A (en) | 2002-11-27 |
Family
ID=18988848
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|---|---|---|---|
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| JP (1) | JP2002340765A (en) |
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| JP2004184238A (en) * | 2002-12-03 | 2004-07-02 | Mitsubishi Heavy Ind Ltd | Heating testing apparatus and heating testing method |
| JP2006283996A (en) * | 2005-03-31 | 2006-10-19 | Jfe Steel Kk | Cooling system of induction heating device |
| KR100782792B1 (en) | 2003-08-22 | 2007-12-05 | 한국원자력연구원 | Apparatus and method for controlling thermal stress generator in fatigue test machine |
| JP2008070228A (en) * | 2006-09-14 | 2008-03-27 | Tokyo Electric Power Co Inc:The | Device and method for testing thermal fatigue crack development, and test body used for the device |
| CN100439897C (en) * | 2004-12-23 | 2008-12-03 | 中国科学院金属研究所 | Thermal fatigue test method |
| CN100451604C (en) * | 2004-12-23 | 2009-01-14 | 中国科学院金属研究所 | Thermal fatigue tester |
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| JP2004184238A (en) * | 2002-12-03 | 2004-07-02 | Mitsubishi Heavy Ind Ltd | Heating testing apparatus and heating testing method |
| KR100782792B1 (en) | 2003-08-22 | 2007-12-05 | 한국원자력연구원 | Apparatus and method for controlling thermal stress generator in fatigue test machine |
| CN100451604C (en) * | 2004-12-23 | 2009-01-14 | 中国科学院金属研究所 | Thermal fatigue tester |
| CN100439897C (en) * | 2004-12-23 | 2008-12-03 | 中国科学院金属研究所 | Thermal fatigue test method |
| JP2006283996A (en) * | 2005-03-31 | 2006-10-19 | Jfe Steel Kk | Cooling system of induction heating device |
| CN100565178C (en) * | 2005-10-26 | 2009-12-02 | 中国科学院力学研究所 | A kind of experimental provision of laser induced piston heat fatigue and experimental technique |
| JP2008070228A (en) * | 2006-09-14 | 2008-03-27 | Tokyo Electric Power Co Inc:The | Device and method for testing thermal fatigue crack development, and test body used for the device |
| JP2009128171A (en) * | 2007-11-22 | 2009-06-11 | Toyota Motor Corp | Heat resistant material testing device, heat resistant material test method, and test piece |
| KR100916091B1 (en) * | 2007-11-28 | 2009-09-08 | 주식회사 포스코 | apparatus for measuring a thermal specific of test piece |
| CN102706766A (en) * | 2012-06-05 | 2012-10-03 | 中国兵器工业集团第七0研究所 | Molybdenum laser thermal fatigue test device |
| CN103278414A (en) * | 2013-05-10 | 2013-09-04 | 沈阳工业大学 | Thermal fatigue testing machine |
| CN103278414B (en) * | 2013-05-10 | 2015-04-08 | 沈阳工业大学 | Thermal fatigue testing machine |
| KR101658635B1 (en) * | 2015-06-01 | 2016-09-23 | 임종섭 | Apparatus for testing thermal shock |
| CN105842570A (en) * | 2016-06-03 | 2016-08-10 | 句容市博远电子有限公司 | Liquid cold and thermal shock device |
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