JP2002318253A5 - - Google Patents
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- JP2002318253A5 JP2002318253A5 JP2001124822A JP2001124822A JP2002318253A5 JP 2002318253 A5 JP2002318253 A5 JP 2002318253A5 JP 2001124822 A JP2001124822 A JP 2001124822A JP 2001124822 A JP2001124822 A JP 2001124822A JP 2002318253 A5 JP2002318253 A5 JP 2002318253A5
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- Prior art keywords
- noise
- image
- design
- information
- image display
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Description
【0013】
【課題を解決するための手段】
上記の課題を解決するために、本発明によるノイズ可視化システムにおいて、試験対象物から発生するノイズ情報を取得するノイズ情報取得手段と、前記試験対象物の設計情報を取得する設計情報取得手段と、前記設計情報に基づく設計画像上に、前記ノイズ情報に応じたノイズ発生画像を表示する画像表示手段とを備え、前記画像表示手段が、前記ノイズ発生画像の表示形態を画像表示条件に応じて変更するようにした。
[0013]
[Means for Solving the Problems]
In order to solve the above problems, in the noise visualization system according to the present invention, noise information acquisition means for acquiring noise information generated from a test object, and design information acquisition means for acquiring design information of the test object, on the design image based on the design information, the a table Shimesuru image display means noise generated image according to the noise information, the image display means, depending on the display mode of the noise image on the image display condition I changed it.
Claims (1)
前記試験対象物の設計情報を取得する設計情報取得手段と、
前記設計情報に基づく設計画像上に、前記ノイズ情報に応じたノイズ発生画像を表示する画像表示手段とを有し、
前記画像表示手段は、前記ノイズ発生画像の表示形態を画像表示条件に応じて変更するノイズ可視化システム。Noise information acquisition means for acquiring noise information generated from the test object;
Design information acquisition means for acquiring design information of the test object;
On the design image based on the design information, the noise image in accordance with the noise information and a table Shimesuru image display means,
A noise visualization system, wherein the image display means changes a display form of the noise generation image according to an image display condition.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001124822A JP3775999B2 (en) | 2001-04-23 | 2001-04-23 | Noise visualization system and display method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001124822A JP3775999B2 (en) | 2001-04-23 | 2001-04-23 | Noise visualization system and display method thereof |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2002318253A JP2002318253A (en) | 2002-10-31 |
JP2002318253A5 true JP2002318253A5 (en) | 2005-04-07 |
JP3775999B2 JP3775999B2 (en) | 2006-05-17 |
Family
ID=18974144
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2001124822A Expired - Fee Related JP3775999B2 (en) | 2001-04-23 | 2001-04-23 | Noise visualization system and display method thereof |
Country Status (1)
Country | Link |
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JP (1) | JP3775999B2 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7355413B2 (en) | 2005-01-31 | 2008-04-08 | Ricoh Company, Ltd. | Testing method/arrangement measuring electromagnetic interference of noise in a to-be-tested printed circuit board |
US7598747B2 (en) | 2006-01-27 | 2009-10-06 | Ricoh Company, Ltd. | Noise injection apparatus for printed circuit board |
JP5428469B2 (en) * | 2009-03-31 | 2014-02-26 | 富士通株式会社 | Shielding inspection method, shielding inspection apparatus, and shielding inspection program |
JP5921169B2 (en) * | 2010-12-13 | 2016-05-24 | 三菱電機株式会社 | Electromagnetic noise distribution detector |
JP5611875B2 (en) * | 2011-03-18 | 2014-10-22 | 株式会社Pfu | Information display device, information display method, and program |
JP5565493B2 (en) * | 2013-04-03 | 2014-08-06 | 富士通株式会社 | Circuit design apparatus and circuit design program |
JP6915780B2 (en) * | 2017-08-09 | 2021-08-04 | 日本電信電話株式会社 | Conduction noise visualization device and conduction noise visualization method |
CN107966643B (en) * | 2017-10-18 | 2020-09-29 | 中山大学 | Interactive visualization device for real-time test data and implementation method thereof |
CN113870256B (en) * | 2021-12-01 | 2022-02-11 | 成都数之联科技有限公司 | PCB defect evaluation method, device, equipment and medium |
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2001
- 2001-04-23 JP JP2001124822A patent/JP3775999B2/en not_active Expired - Fee Related
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