JP2002280197A - Igniter for generating plasma - Google Patents

Igniter for generating plasma

Info

Publication number
JP2002280197A
JP2002280197A JP2001073935A JP2001073935A JP2002280197A JP 2002280197 A JP2002280197 A JP 2002280197A JP 2001073935 A JP2001073935 A JP 2001073935A JP 2001073935 A JP2001073935 A JP 2001073935A JP 2002280197 A JP2002280197 A JP 2002280197A
Authority
JP
Japan
Prior art keywords
plasma
generating
magnetic field
microwave power
plasma generating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001073935A
Other languages
Japanese (ja)
Other versions
JP2002280197A5 (en
Inventor
Yuichi Sakamoto
雄一 坂本
Kazuaki Senda
和章 仙田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micro Denshi Co Ltd
Original Assignee
Micro Denshi Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micro Denshi Co Ltd filed Critical Micro Denshi Co Ltd
Priority to JP2001073935A priority Critical patent/JP2002280197A/en
Publication of JP2002280197A publication Critical patent/JP2002280197A/en
Publication of JP2002280197A5 publication Critical patent/JP2002280197A5/ja
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide an igniter capable of easily generating plasma even in a plasma generating chamber having a pressure as low as 10<-2> Torr, in the plasma generating device using a microwave. SOLUTION: A permanent magnet 27 is embedded in a part of the plasma generating chamber 21, a zone 28 for partial electronic cyclotron resonance is formed by the magnetic field of the permanent magnet 27 produced in the plasma generating chamber 21 and microwave power Po radiated into the plasma generating chamber 21, and surface wave plasma 29 is ignited with the zone 28 as seed plasma at the initial stage of supplying the microwave power.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、所定圧力に保持し
たプラズマ発生室にマイクロ波電力を供給してプラズマ
を発生させるプラズマ発生用の点火装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an ignition device for generating plasma by supplying microwave power to a plasma generation chamber maintained at a predetermined pressure to generate plasma.

【0002】[0002]

【従来の技術】金属、半導体、絶縁体等の表面をクリ−
ニングし、エッチングし、或いは、その表面に薄膜を堆
積させるなどの処理手段の一つにプラズマ発生装置があ
る。
2. Description of the Related Art Clean surfaces of metals, semiconductors, insulators, and the like.
One of processing means such as polishing, etching, or depositing a thin film on the surface is a plasma generator.

【0003】プラズマ発生装置としては様々な構成のも
のがあるが、その一例を図2に示す。図2に示すプラズ
マ発生装置は、マイクロ波電力Poを利用した表面波励
起型のプラズマ発生装置として知られている。
[0003] There are various types of plasma generators, one example of which is shown in FIG. The plasma generation device shown in FIG. 2 is known as a surface wave excitation type plasma generation device using microwave power Po.

【0004】このプラズマ発生装置は、プラズマ発生室
11と導波管12との境界に誘電体板13を備え、導波
管12から供給されるマイクロ波電力Poによって誘電
体板13のプラズマ発生室側に表面波を発生させ、この
表面波により気体分離してプラズマ14を発生させる構
成となっている。
This plasma generating apparatus includes a dielectric plate 13 at a boundary between a plasma generating chamber 11 and a waveguide 12, and the plasma generating chamber of the dielectric plate 13 is supplied with microwave power Po supplied from the waveguide 12. A surface wave is generated on the side, and gas is separated by the surface wave to generate plasma 14.

【0005】なお、誘電体板13はプラズマ発生室11
を大気と遮断するための誘電体窓を形成し、石英板やア
ルミナ板などが使用されている。その他、この図におい
て、15は真空ポンプ、16はガス供給配管である。
[0005] The dielectric plate 13 is connected to the plasma generation chamber 11.
A dielectric window for isolating the air from the atmosphere is formed, and a quartz plate, an alumina plate, or the like is used. In addition, in this figure, 15 is a vacuum pump, and 16 is a gas supply pipe.

【0006】[0006]

【発明が解決しようとする課題】上記したプラズマ発生
装置は、プラズマ発生室11にマイクロ波電力Poを供
給して気体分子を電離させプラズマを発生させるため、
プラズマ発生室11内を10−1Torr以上のガス圧
力に保つ必要がある。
The above-described plasma generating apparatus supplies microwave power Po to the plasma generating chamber 11 to ionize gas molecules and generate plasma.
It is necessary to maintain the gas pressure in the plasma generation chamber 11 at 10 −1 Torr or more.

【0007】しかし、10−1Torr以上のガス圧力
では、イオンや中性ラディカルの平均自由工程が数mm
以下となり、プラズマ発生装置の応用範囲が限られる。
このことから、プラズマ発生室11のガス圧力を約2桁
上げた条件下でも容易にプラズマを発生させることがで
き、その平均自由工程を数十mm〜数百mmとすること
ができるプラズマ発生装置が望まれている。
However, at a gas pressure of 10 −1 Torr or more, the mean free path of ions and neutral radicals is several mm.
As described below, the application range of the plasma generator is limited.
From this, a plasma generating apparatus capable of easily generating plasma even under conditions in which the gas pressure of the plasma generating chamber 11 is increased by about two orders of magnitude and having an average free path of several tens to several hundreds of mm Is desired.

【0008】本発明は上記した実情にかんがみ、10
−2Torr以下の低圧力としたプラズマ発生室におい
てプラズマを確実に発生させることができるプラズマ発
生用の点火装置を提供することを目的とする。
The present invention has been made in view of the above situation, and
An object of the present invention is to provide an ignition device for plasma generation that can reliably generate plasma in a plasma generation chamber having a low pressure of −2 Torr or less.

【0009】[0009]

【課題を解決するための手段】上記した目的を達成する
ため、本発明では、第1発明として、プラズマ発生室に
マイクロ波電力を供給してプラズマを発生させるプラズ
マ発生装置において、プラズマ発生室の一部に磁界発生
部材を備え、マイクロ波電力の供給初期において、その
磁界発生部材の磁界とマイクロ波電力とにより局部的な
電子サイクロトロン共鳴領域を生成する種プラズマ生成
手段を設け、種プラズマによってプラズマを点火させる
構成としたことを特徴とするプラズマ発生用の点火装置
を提案する。
According to a first aspect of the present invention, there is provided a plasma generating apparatus for generating a plasma by supplying microwave power to a plasma generating chamber. A magnetic field generating member is provided in part, and a seed plasma generating means for generating a local electron cyclotron resonance region by a magnetic field of the magnetic field generating member and the microwave power in an initial stage of supplying the microwave power is provided. The present invention proposes an ignition device for generating plasma characterized in that the ignition device is configured to ignite.

【0010】このプラズマ発生装置は、マイクロ波電力
が供給されると、その初期において種プラズマが生成さ
れることから、この種プラズマによって点火されたプラ
ズマが一挙に発生する。
In this plasma generator, when microwave power is supplied, a seed plasma is generated in the initial stage, so that plasma ignited by this seed plasma is generated at once.

【0011】プラズマ発生室のガス圧力が10−2To
rr以下の低圧力であってもプラズマが確実に発生す
る。したがって、イオンや中性ラディカルの平均自由工
程を増大させることができる。なお、一度プラズマが発
生した後は、プラズマ密度がマイクロ波電力の伝搬を許
さない遮断密度以上の密度となるため、マイクロ波電力
がプラズマに吸収されるから、磁界発生部材の磁界はプ
ラズマの特性には影響しない。
The gas pressure in the plasma generation chamber is 10 −2 To.
Plasma is reliably generated even at a low pressure of rr or less. Therefore, the mean free path of ions and neutral radicals can be increased. Once the plasma is generated, the plasma density becomes higher than the cut-off density that does not allow the propagation of microwave power, and the microwave power is absorbed by the plasma. Has no effect.

【0012】第2発明は、上記したプラズマ発生装置に
おいて、プラズマ発生室の一部に進退させる磁界発生部
材を備え、プラズマの点火後、その磁界発生部材をプラ
ズマ発生室外方に退出させる種プラズマ生成手段を設け
たことを特徴とするプラズマ発生用の点火装置を提案す
る。
According to a second aspect of the present invention, there is provided the above-described plasma generating apparatus, further comprising a magnetic field generating member for moving back and forth in a part of the plasma generating chamber, and after ignition of the plasma, seed plasma generating for moving the magnetic field generating member out of the plasma generating chamber. An ignition device for generating plasma characterized by providing means is proposed.

【0013】このプラズマ発生装置は、プラズマが点火
した後に磁界発生部材をプラズマ発生室外方に退出させ
ることにより、プラズマによって処理する被処理物に対
する磁界の影響を防止することができる。
In this plasma generator, the magnetic field generating member is moved out of the plasma generation chamber after the plasma is ignited, whereby the influence of the magnetic field on the object to be processed by the plasma can be prevented.

【0014】[0014]

【発明の実施の形態】次に、本発明の一実施形態につい
て図面に沿って説明する。図1は本発明を実施したプラ
ズマ発生装置の機構図を示し、プラズマ発生室21は、
ガス供給配管22より所定のガスが注入され、また、真
空ポンプ23によって10−2Torr程度のガス圧力
に保持される。
Next, an embodiment of the present invention will be described with reference to the drawings. FIG. 1 shows a mechanism diagram of a plasma generating apparatus embodying the present invention.
A predetermined gas is injected from the gas supply pipe 22 and is maintained at a gas pressure of about 10 −2 Torr by the vacuum pump 23.

【0015】また、プラズマ発生室21には、導波管2
4より送られるマイクロ波電力Poが結合孔25(マイ
クロ波放射孔)と誘電体窓26を通って放射される。な
お、誘電体窓26は従来例同様に石英板やアルミナ板な
どにより形成しプラズマ発生室21を大気圧から遮断す
る。
The waveguide 2 is provided in the plasma generation chamber 21.
4 is radiated through the coupling hole 25 (microwave radiation hole) and the dielectric window 26. Note that the dielectric window 26 is formed of a quartz plate, an alumina plate, or the like, as in the conventional example, and shields the plasma generation chamber 21 from atmospheric pressure.

【0016】一方、プラズマ発生室21の側壁には小型
の永久磁石27が埋設してある。この永久磁石27は、
プラズマ発生室21内に磁界を生じさせ、この磁界とマ
イクロ波電力とで電子サイクロトロン共鳴領域を生成す
る種プラズマ生成手段を構成するものである。なお、プ
ラズマ発生室21の形成壁は、ステンレス、アルミニウ
ムなどの比磁性材で形成されており、永久磁石27の磁
界を通過させる。
On the other hand, a small permanent magnet 27 is embedded in the side wall of the plasma generation chamber 21. This permanent magnet 27
A magnetic field is generated in the plasma generation chamber 21, and the magnetic field and the microwave power constitute a seed plasma generating means for generating an electron cyclotron resonance region. The wall of the plasma generation chamber 21 is made of a specific magnetic material such as stainless steel or aluminum, and allows the magnetic field of the permanent magnet 27 to pass therethrough.

【0017】このように構成したプラズマ発生装置は、
導波管24によりマイクロ波電力Poを供給すると、マ
イクロ波電力Poが結合孔25と誘電体窓26を通って
プラズマ発生室21内に放射される。
The plasma generator configured as described above has
When the microwave power Po is supplied by the waveguide 24, the microwave power Po is radiated into the plasma generation chamber 21 through the coupling hole 25 and the dielectric window 26.

【0018】したがって、永久磁石27の磁界とマイク
ロ波電力Poとによって電子サイクロトロン共鳴ゾ−ン
28がプラズマ発生室21内に局部的に生成する。
Therefore, the electron cyclotron resonance zone 28 is locally generated in the plasma generation chamber 21 by the magnetic field of the permanent magnet 27 and the microwave power Po.

【0019】なお、電子サイクロトロン共鳴とは、使用
しているマイクロ波電力Poの周波数fmと、永久磁石
27の磁束密度Bとが、fm=eB/2πmの関係に
あることである。ここで、eとmはそれぞれ電子の電
荷と質量であり、2.45GHzの場合875Gaus
sの磁界が対応する。
[0019] Note that the electron cyclotron resonance, and the frequency fm of the microwave power Po in use, and the magnetic flux density of the permanent magnet 27 B is that the relation of fm = eB / 2πm e. Here, e and m e is the charge and mass of each electron, when the 2.45 GHz 875Gaus
The s magnetic field corresponds.

【0020】上記のように生成された電子サイクロトロ
ン共鳴ゾ−ン28が種プラズマとなり、誘電体窓26の
室内側に表面波プラズマ29が一挙に点火される。
The electron cyclotron resonance zone 28 generated as described above becomes a seed plasma, and a surface wave plasma 29 is ignited at once at the room side of the dielectric window 26.

【0021】磁界の配位がプラズマの閉じ込めの最適条
件から離れていても、上記した共鳴条件が満足されてい
れば、10−2Torr程度の低ガス圧力でも点火が容
易に行なわれる。したがって、イオンや中性ラディカル
の平均自由工程を増大(例えば、数十mm〜数百mm)
させたプラズマを発生させることができ、プラズマ発生
装置の応用範囲を広げることができる。
Even if the configuration of the magnetic field is far from the optimum condition for confining the plasma, the ignition can be easily performed even at a low gas pressure of about 10 −2 Torr if the above-mentioned resonance condition is satisfied. Therefore, the mean free path of ions and neutral radicals is increased (for example, several tens mm to several hundred mm).
The generated plasma can be generated, and the application range of the plasma generator can be expanded.

【0022】上記したように、単一磁石(永久磁石27)
の磁界配位では、プラズマの閉じ込めの効果はなく、密
度の低いプラズマしか発生しないが、プラズマ発生室2
1の放電破壊を引き起す種プラズマとしては十分に機能
する。
As described above, a single magnet (permanent magnet 27)
In the magnetic field configuration described above, there is no effect of confining the plasma and only low-density plasma is generated.
1 sufficiently functions as a seed plasma causing discharge breakdown.

【0023】また、一度表面波プラズマ29が発生すれ
ば、プラズマの密度はマイクロ波電力Poの伝搬を許さ
ない遮断密度以上の密度となるから、マイクロ波電力P
oが誘電体窓26の近傍でプラズマによって吸収され、
永久磁石27の磁界がプラズマ特性に影響を及ぼすこと
がない。
Further, once the surface wave plasma 29 is generated, the density of the plasma becomes higher than the cut-off density which does not allow the propagation of the microwave power Po.
o is absorbed by the plasma near the dielectric window 26,
The magnetic field of the permanent magnet 27 does not affect the plasma characteristics.

【0024】なお、プラズマの遮断密度Ncは、(Nc
=4πε/e)fとなる。ただし、ε
真空の誘電率、fは周波数である。
The cut-off density Nc of the plasma is (Nc
= The 4π 2 ε o m e / e 2) f 2. Here, ε o is the dielectric constant of vacuum, and f is the frequency.

【0025】一方、本発明の他の実施形態としては、プ
ラズマ室21の一部に永久磁石27の嵌合凹部を設け、
永久磁石27をこの嵌合凹部内に進出させた位置とその
嵌合凹部から退出させた位置とに移動させる構成とす
る。
On the other hand, as another embodiment of the present invention, a fitting recess for the permanent magnet 27 is provided in a part of the plasma chamber 21,
The configuration is such that the permanent magnet 27 is moved to a position where the permanent magnet 27 is advanced into the fitting recess and a position where the permanent magnet 27 is retracted from the fitting recess.

【0026】すなわち、永久磁石27を進出させた状態
で上記のように種プラズマを生成し、プラズマ29が点
火された後はこの永久磁石27を退出させる。これによ
り、プラズマ29によって処理される被処理物が永久磁
石27の磁界による影響を受けることがない。
That is, the seed plasma is generated as described above with the permanent magnet 27 advanced, and after the plasma 29 is ignited, the permanent magnet 27 is withdrawn. Thus, the object to be processed by the plasma 29 is not affected by the magnetic field of the permanent magnet 27.

【0027】また、本発明は、磁界発生部材として永久
磁石27に換えて電磁石を備えても同様に種プラズマを
生成することができる。なお、本発明のプラズマ発生装
置において、エッチング加工する場合は、Cl 、F
などのガスを、薄膜堆積するときは、CH、C
などのガスをガス供給配管22より供給する。
Also, the present invention provides a permanent magnetic field generating member.
Even if an electromagnet is provided instead of the magnet 27, the seed plasma is similarly generated.
Can be generated. It should be noted that the plasma generator of the present invention
When performing the etching process, 2, F2
When depositing a gas such as4, C2H6
Such gas is supplied from a gas supply pipe 22.

【0028】[0028]

【発明の効果】上記した通り、本発明の点火装置は、プ
ラズマ発生室に備えた磁界発生部材の磁界とマイクロ波
電力とで局部的な電子サイクロトロン共鳴領域を生成
し、プラズマ発生室内に種プラズマを発生させる構成と
したので、10−2Torr程度の低圧力のプラズマ発
生室においても、プラズマがこの種プラズマによって確
実に点火される。
As described above, the ignition device of the present invention generates a local electron cyclotron resonance region using the magnetic field of the magnetic field generating member provided in the plasma generation chamber and the microwave power, and generates the seed plasma in the plasma generation chamber. Is generated, the plasma is reliably ignited by this kind of plasma even in a plasma generation chamber at a low pressure of about 10 −2 Torr.

【0029】この結果、マイクロ波を利用したプラズマ
発生装置の実施化が容易となると共に、応用範囲の広い
プラズマ発生装置となる。
As a result, it is easy to implement the plasma generator using microwaves, and the plasma generator has a wide range of application.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施形態として示したプラズマ発生
装置の機構図である。
FIG. 1 is a mechanism diagram of a plasma generator shown as one embodiment of the present invention.

【図2】従来例として示したプラズマ発生装置の機構図
である。
FIG. 2 is a mechanism diagram of a plasma generator shown as a conventional example.

【符号の説明】[Explanation of symbols]

21 プラズマ発生室 22 ガス供給配管 23 真空ポンプ 24 導波管 25 結合孔 26 誘電体窓 27 永久磁石 28 共鳴ゾ−ン 29 プラズマ Reference Signs List 21 Plasma generation chamber 22 Gas supply pipe 23 Vacuum pump 24 Waveguide 25 Coupling hole 26 Dielectric window 27 Permanent magnet 28 Resonant zone 29 Plasma

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 プラズマ発生室にマイクロ波電力を供給
してプラズマを発生させるプラズマ発生装置において、 プラズマ発生室の一部に磁界発生部材を備え、マイクロ
波電力の供給初期において、その磁界発生部材の磁界と
マイクロ波電力とにより局部的な電子サイクロトロン共
鳴領域を生成する種プラズマ生成手段を設け、 種プラズマによってプラズマを点火させる構成としたこ
とを特徴とするプラズマ発生用の点火装置。
1. A plasma generating apparatus for generating a plasma by supplying microwave power to a plasma generating chamber, comprising: a magnetic field generating member provided in a part of the plasma generating chamber; A seed plasma generating means for generating a local electron cyclotron resonance region by using the magnetic field and the microwave power, and igniting the plasma with the seed plasma.
【請求項2】 請求項1に記載したプラズマ発生用の点
火装置において、 プラズマ発生室の一部に進退させる磁界発生部材を備
え、プラズマの点火後、その磁界発生部材をプラズマ発
生室外方に退出させる種プラズマ生成手段を設けたこと
を特徴とするプラズマ発生用の点火装置。
2. The plasma generating ignition device according to claim 1, further comprising: a magnetic field generating member that moves forward and backward in a part of the plasma generating chamber, and after the plasma is ignited, the magnetic field generating member moves out of the plasma generating chamber. An ignition device for generating plasma, comprising a seed plasma generating means for causing generation.
JP2001073935A 2001-03-15 2001-03-15 Igniter for generating plasma Pending JP2002280197A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001073935A JP2002280197A (en) 2001-03-15 2001-03-15 Igniter for generating plasma

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001073935A JP2002280197A (en) 2001-03-15 2001-03-15 Igniter for generating plasma

Publications (2)

Publication Number Publication Date
JP2002280197A true JP2002280197A (en) 2002-09-27
JP2002280197A5 JP2002280197A5 (en) 2008-04-17

Family

ID=18931291

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001073935A Pending JP2002280197A (en) 2001-03-15 2001-03-15 Igniter for generating plasma

Country Status (1)

Country Link
JP (1) JP2002280197A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009283547A (en) * 2008-05-20 2009-12-03 Dainippon Printing Co Ltd Forming method and forming apparatus for conductive pattern, and conductive substrate
JP2019204661A (en) * 2018-05-23 2019-11-28 株式会社エスイー Plasma irradiation device and plasma irradiation method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05283196A (en) * 1992-03-31 1993-10-29 Sumitomo Metal Ind Ltd Plasma device and using method for its device
JPH09266096A (en) * 1996-03-28 1997-10-07 Hitachi Ltd Plasma treatment device, and plasma treatment method using it
JPH10229000A (en) * 1997-02-14 1998-08-25 Nissin Electric Co Ltd Plasma generator and ion source using it
JPH1126188A (en) * 1997-07-03 1999-01-29 Nec Corp Plasma device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05283196A (en) * 1992-03-31 1993-10-29 Sumitomo Metal Ind Ltd Plasma device and using method for its device
JPH09266096A (en) * 1996-03-28 1997-10-07 Hitachi Ltd Plasma treatment device, and plasma treatment method using it
JPH10229000A (en) * 1997-02-14 1998-08-25 Nissin Electric Co Ltd Plasma generator and ion source using it
JPH1126188A (en) * 1997-07-03 1999-01-29 Nec Corp Plasma device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009283547A (en) * 2008-05-20 2009-12-03 Dainippon Printing Co Ltd Forming method and forming apparatus for conductive pattern, and conductive substrate
JP2019204661A (en) * 2018-05-23 2019-11-28 株式会社エスイー Plasma irradiation device and plasma irradiation method
JP7043704B2 (en) 2018-05-23 2022-03-30 株式会社エスイー Plasma irradiation device

Similar Documents

Publication Publication Date Title
KR100291152B1 (en) Plasma generating apparatus
US6849857B2 (en) Beam processing apparatus
US6062163A (en) Plasma initiating assembly
US6642149B2 (en) Plasma processing method
KR920002864B1 (en) Apparatus for treating matrial by using plasma
KR100552645B1 (en) Plasma processing apparatus
US7034285B2 (en) Beam source and beam processing apparatus
US5686796A (en) Ion implantation helicon plasma source with magnetic dipoles
JP2002503289A (en) Method and apparatus for low pressure sputtering
EP0591975A1 (en) Two parallel plate electrode type dry etching apparatus
KR101191698B1 (en) Methods and apparatus for igniting a low pressure plasma
US6909086B2 (en) Neutral particle beam processing apparatus
JP2004047207A (en) Method and device of generating ground wave excitation plasma at conductor proximity area
JP2002533950A (en) Method for igniting a plasma in a plasma processing reactor
US20040074604A1 (en) Neutral particle beam processing apparatus
JP2002280197A (en) Igniter for generating plasma
JPH02174229A (en) Plasma device and usage thereof
JP2000243707A (en) Plasma treatment method and apparatus
JP2595128B2 (en) Microwave plasma processing equipment
JP3174699B2 (en) Ignition device for high-frequency discharge in a magnetic field
JP2629610B2 (en) Microwave plasma processing equipment
JP2800766B2 (en) Plasma processing method and apparatus
JPH0221296B2 (en)
JP3624986B2 (en) Beam processing method and apparatus
JP5094672B2 (en) Etching device

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080305

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20080305

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090519

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090626

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20090818