JP2002184839A5 - - Google Patents

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Publication number
JP2002184839A5
JP2002184839A5 JP2000381715A JP2000381715A JP2002184839A5 JP 2002184839 A5 JP2002184839 A5 JP 2002184839A5 JP 2000381715 A JP2000381715 A JP 2000381715A JP 2000381715 A JP2000381715 A JP 2000381715A JP 2002184839 A5 JP2002184839 A5 JP 2002184839A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000381715A
Other languages
Japanese (ja)
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JP2002184839A (ja
JP4079206B2 (ja
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Publication date
Application filed filed Critical
Priority to JP2000381715A priority Critical patent/JP4079206B2/ja
Priority claimed from JP2000381715A external-priority patent/JP4079206B2/ja
Publication of JP2002184839A publication Critical patent/JP2002184839A/ja
Publication of JP2002184839A5 publication Critical patent/JP2002184839A5/ja
Application granted granted Critical
Publication of JP4079206B2 publication Critical patent/JP4079206B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2000381715A 2000-12-15 2000-12-15 基板検査装置および基板検査方法ならびに基板検査装置を備えた液処理装置 Expired - Fee Related JP4079206B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000381715A JP4079206B2 (ja) 2000-12-15 2000-12-15 基板検査装置および基板検査方法ならびに基板検査装置を備えた液処理装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000381715A JP4079206B2 (ja) 2000-12-15 2000-12-15 基板検査装置および基板検査方法ならびに基板検査装置を備えた液処理装置

Publications (3)

Publication Number Publication Date
JP2002184839A JP2002184839A (ja) 2002-06-28
JP2002184839A5 true JP2002184839A5 (cg-RX-API-DMAC10.html) 2005-06-16
JP4079206B2 JP4079206B2 (ja) 2008-04-23

Family

ID=18849672

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000381715A Expired - Fee Related JP4079206B2 (ja) 2000-12-15 2000-12-15 基板検査装置および基板検査方法ならびに基板検査装置を備えた液処理装置

Country Status (1)

Country Link
JP (1) JP4079206B2 (cg-RX-API-DMAC10.html)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005072374A (ja) * 2003-08-26 2005-03-17 Dainippon Screen Mfg Co Ltd 基板処理装置
TW200609060A (en) 2004-07-02 2006-03-16 Sintokogio Ltd Method and facility for after-treatment of aluminum casting coarse material
JP2006140418A (ja) * 2004-11-15 2006-06-01 Kaijo Corp 被処理基板の検出システム
JP4863985B2 (ja) * 2007-12-20 2012-01-25 大日本スクリーン製造株式会社 基板処理装置
JP5059054B2 (ja) * 2009-05-25 2012-10-24 東京エレクトロン株式会社 基板処理システム、基板検出装置および基板検出方法
JP5579796B2 (ja) * 2012-07-23 2014-08-27 東京エレクトロン株式会社 基板処理システム、基板検出装置および基板検出方法
JP6128941B2 (ja) 2013-05-10 2017-05-17 ルネサスエレクトロニクス株式会社 半導体装置の製造方法及び半導体製造装置
CN109817509A (zh) * 2017-11-20 2019-05-28 顶程国际股份有限公司 晶圆侦测装置及晶圆清洗机
WO2021202029A1 (en) 2020-04-02 2021-10-07 Applied Materials, Inc. Inspection system
CN119229627B (zh) * 2024-11-29 2025-02-28 艾庞半导体科技(四川)有限公司 用于处理半导体晶片的控制系统

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