JP2002137157A - Polishing device for inner periphery of sleeve and wire for polishing sleeve used in the polishing device - Google Patents

Polishing device for inner periphery of sleeve and wire for polishing sleeve used in the polishing device

Info

Publication number
JP2002137157A
JP2002137157A JP2000329622A JP2000329622A JP2002137157A JP 2002137157 A JP2002137157 A JP 2002137157A JP 2000329622 A JP2000329622 A JP 2000329622A JP 2000329622 A JP2000329622 A JP 2000329622A JP 2002137157 A JP2002137157 A JP 2002137157A
Authority
JP
Japan
Prior art keywords
wire
polishing
sleeve
diameter
wound around
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000329622A
Other languages
Japanese (ja)
Inventor
Yoshihiro Kobayashi
善宏 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP2000329622A priority Critical patent/JP2002137157A/en
Publication of JP2002137157A publication Critical patent/JP2002137157A/en
Pending legal-status Critical Current

Links

Landscapes

  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Polishing Bodies And Polishing Tools (AREA)

Abstract

PROBLEM TO BE SOLVED: To enable provision of a sleeve 1 excellent in cylindricity of an inner periphery and to enable a decrease of a connection loss value optical characteristics essential to a photo connector. SOLUTION: By forming a polishing wire 11 in a shape that a fine wire 22 is wound around the outer periphery of a core wire 21, an inner periphery machining device provided with a main spindle 15 to hold and rotate a wire feed part 12, a wire winding part 16, a wire straight line guide part 14, and the sleeve 1 is used.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明が属する技術分野】本発明は、光通信等に使用さ
れる、スリーブの内周研磨装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inner peripheral polishing device for a sleeve, which is used for optical communication or the like.

【0002】[0002]

【従来の技術】光通信等に使用されるスリーブは、一対
の光ファイバを接続する光コネクタの中で用いられる割
スリーブと、半導体レーザと光コネクタを接続するため
のレセプタクルの中で用いられる精密スリーブがあげら
れる。いずれのスリーブも内周部でフェルールを保持す
る点では同じ機能をもつ。
2. Description of the Related Art A sleeve used for optical communication or the like is composed of a split sleeve used in an optical connector for connecting a pair of optical fibers and a precision sleeve used in a receptacle for connecting a semiconductor laser and an optical connector. Sleeves. Both sleeves have the same function in that they hold the ferrule at the inner periphery.

【0003】一般的な割スリーブは図5に示すように、
円筒形状をなし長手方向にスリット2が設けられ、その
貫通孔3は図示していないフェルールの外径よりわずか
に小さく精密研磨され(特開平2−231545号公報
参照)、そのバネ性で挿入されたフェルールを把持整列
させている。
A general split sleeve is shown in FIG.
A slit 2 is formed in the longitudinal direction in a cylindrical shape, and the through hole 3 is slightly polished slightly smaller than the outer diameter of a ferrule (not shown) (see JP-A-2-231545), and is inserted by its spring property. The ferrule is gripped and aligned.

【0004】この割スリーブ1は軸心に貫通孔3が穿設
されたワークを研磨加工することにより所定の内径を有
する円筒形に加工され、その後スリット2を入れられる
ことで製作される。
[0004] The split sleeve 1 is manufactured by polishing a work having a through hole 3 formed in the axis thereof into a cylindrical shape having a predetermined inner diameter, and then forming a slit 2 therein.

【0005】従来の割スリーブ1の内周研磨方法は、図
6に示すように回転するテーパ形状の研磨ワイヤ61に
ワークW(割スリーブ1)を挿通し、該ワークWを前後
に動かして貫通孔3の内周を円筒形状に研磨することで
割スリーブ1の製作が行われていた(特開平5−203
838号公報参照)。
In the conventional method for polishing the inner circumference of the split sleeve 1, as shown in FIG. 6, a work W (split sleeve 1) is inserted into a rotating tapered polishing wire 61, and the work W is moved back and forth to penetrate. The split sleeve 1 was manufactured by grinding the inner periphery of the hole 3 into a cylindrical shape (Japanese Patent Laid-Open No. 5-203).
No. 838).

【0006】又、フェル−ルの内周研磨方法は、図7に
示すようにテーパ形状の研磨ワイヤ71がワイヤ送り部
72に巻装されており、研磨ワイヤ71のワイヤ直線案
内部74には主軸75が配設され、該主軸75内にはワ
ークW(フェルールが保持されている。主軸75の下流
側にはワークWの貫通孔の内周を研磨した後の研磨ワイ
ヤ71を巻き取るワイヤ巻き取り部76が配設されてい
る。
Further, as shown in FIG. 7, a taper-shaped polishing wire 71 is wound around a wire feed portion 72, and a wire linear guide portion 74 of the polishing wire 71 A main shaft 75 is provided, and a work W (a ferrule is held in the main shaft 75. A wire for winding the polishing wire 71 after polishing the inner periphery of the through hole of the work W is provided downstream of the main shaft 75. A winding unit 76 is provided.

【0007】主軸75を周方向に回転させながら研磨ワ
イヤ71をワイヤ巻き取り部76に巻き取る。その際、
研磨ワイヤ71にダイヤモンド砥粒が供給され、研磨ワ
イヤ71が一定の速度で送られると、該研磨ワイヤ71
の外周面でフェルールの貫通孔の内周が円筒形状に研磨
される(特開平10−328985号公報参照)。
The polishing wire 71 is wound around a wire winding section 76 while rotating the main shaft 75 in the circumferential direction. that time,
When diamond abrasive grains are supplied to the polishing wire 71 and the polishing wire 71 is sent at a constant speed, the polishing wire 71
The inner circumference of the through hole of the ferrule is polished into a cylindrical shape on the outer peripheral surface of the ferrule (see Japanese Patent Application Laid-Open No. 10-328985).

【0008】[0008]

【発明が解決しようとする課題】上記従来の割スリーブ
の内周研磨装置は、研磨ワイヤ61の片側のみが支持さ
れた構造のため、ワークWを前後に動かす際、研磨ワイ
ヤ61の長手方向の中心軸に対して平行に移動すること
が困難であり、ワークWが横ぶれした状態で研磨されて
いく。その為に内周の円筒度が悪いという問題が生じ、
光コネクタにおいて重要な光学特性である接続損失値が
大きくなるという課題があった。
The above-described conventional inner sleeve polishing apparatus for a split sleeve has a structure in which only one side of the polishing wire 61 is supported. It is difficult to move in parallel to the central axis, and the workpiece W is polished in a state where it is running sideways. For this reason, the problem that the cylindricity of the inner circumference is bad occurs,
There is a problem that a connection loss value, which is an important optical characteristic in an optical connector, is increased.

【0009】又、図7に示すフェルールの内周研磨装置
を割スリーブに転用する方法も考えられるが、フェルー
ルの内径がφ0.125mmに対して割スリーブの内径
がφ2.5mmと太いために、これに応じた太い研磨用
ワイヤを用いなければならず、このような太いワイヤは
たわみにくいためワイヤ巻き取り部72に巻くことが出
来ず、この方法は全く使われていなかった。
A method of diverting the inner peripheral polishing device of the ferrule shown in FIG. 7 to a split sleeve is also conceivable. However, since the inner diameter of the ferrule is as large as φ0.125 mm and the inner diameter of the split sleeve is as large as φ2.5 mm, A thick polishing wire corresponding to this must be used, and such a thick wire is difficult to bend and cannot be wound around the wire winding portion 72, and this method has not been used at all.

【0010】[0010]

【課題を解決するための手段】上記に鑑みて本発明は、
円筒体の長手方向にスリットを設けた光通信用スリーブ
の内周研磨装置において、心線ワイヤの外周に細径ワイ
ヤを巻き付けた研磨ワイヤ、該ワイヤを巻装したワイヤ
送り部、ワイヤ巻き取り部、ワイヤ直線案内部、及びこ
のワイヤ直線案内部に配置されスリーブを保持して回転
させるための主軸を具備したことを特徴とする。
In view of the above, the present invention provides
In an inner peripheral polishing device for an optical communication sleeve provided with a slit in a longitudinal direction of a cylindrical body, a polishing wire in which a small diameter wire is wound around an outer periphery of a core wire, a wire feeding portion in which the wire is wound, and a wire winding portion , A wire linear guide, and a main shaft disposed on the wire linear guide for holding and rotating the sleeve.

【0011】又、スリーブ研磨用ワイヤにおいて、心線
ワイヤの外周に細径のワイヤを巻き付けたことを特徴と
する。
Further, in the wire for polishing a sleeve, a thin wire is wound around the outer periphery of the core wire.

【0012】更に、上記心線ワイヤをテーパ形状として
その外周に細径ワイヤを巻き付けたことを特徴とする。
Further, the present invention is characterized in that the core wire is tapered and a small diameter wire is wound around its outer periphery.

【0013】しかも、上記細径ワイヤの外周にダイヤモ
ンド砥粒を電着固化したことを特徴とする。
In addition, the present invention is characterized in that diamond abrasive grains are electrodeposited and solidified on the outer periphery of the small diameter wire.

【0014】即ち、本発明は研磨ワイヤを心線ワイヤの
外周に細径ワイヤを巻き付けた形状とすることにより、
従来使用不可能であったフェルールの内周研磨装置であ
るワイヤ送り部、ワイヤ巻き取り部、ワイヤ直線案内
部、及び割スリーブを回転させるための主軸を具備した
装置を用いることが出来、内周の円筒度の良好なスリー
ブを得ることが出来、光コネクタにおいて重要な光学特
性である接続損失値を小さくすることが出来た。
That is, according to the present invention, the polishing wire is formed by winding a small-diameter wire around the outer periphery of the core wire.
It is possible to use a device having a wire feeder, a wire take-up unit, a wire linear guide unit, and a main shaft for rotating a split sleeve, which is an inner peripheral polishing device of a ferrule which has not been conventionally usable. A sleeve with good cylindricity was obtained, and a connection loss value, which is an important optical characteristic in an optical connector, could be reduced.

【0015】[0015]

【発明の実施の形態】以下本発明の実施形態を図によっ
て説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described below with reference to the drawings.

【0016】図1は本発明の実施形態を示す割スリーブ
の内周研磨装置を示す概略構成図である。詳細を後述す
るテーパ形状の研磨ワイヤ11はワイヤ送り部12に巻
装されている。研磨ワイヤ11を直線状に敷設するため
にプーリ13が2個設けられそれらプーリ13の間のワ
イヤ直線案内部14には主軸15が配設され、該主軸1
5内にはワークW(割スリーブ)が保持されている。主
軸15の下流側にはワークWの貫通孔の内周を研磨した
後の研磨ワイヤ11を巻き取るワイヤ巻き取り部16が
配設されている。
FIG. 1 is a schematic diagram showing an apparatus for polishing the inner periphery of a split sleeve according to an embodiment of the present invention. A tapered polishing wire 11, which will be described in detail later, is wound around a wire feed portion 12. Two pulleys 13 are provided for laying the polishing wire 11 in a straight line, and a main shaft 15 is disposed in a wire linear guide portion 14 between the pulleys 13.
A work W (split sleeve) is held in 5. On the downstream side of the main shaft 15, a wire take-up section 16 for winding the polishing wire 11 after polishing the inner periphery of the through hole of the work W is provided.

【0017】主軸15を周方向に回転させながら研磨ワ
イヤ11をワイヤ巻き取り部16に巻き取る。その際、
研磨ワイヤ11にダイヤモンド砥粒が供給され、研磨ワ
イヤ11が一定の速度で送られると、該研磨ワイヤ11
の外周面でワークWの貫通孔の内周が円筒形状に研磨さ
れる。
The polishing wire 11 is wound around a wire winding section 16 while rotating the main shaft 15 in the circumferential direction. that time,
When diamond abrasive grains are supplied to the polishing wire 11 and the polishing wire 11 is fed at a constant speed, the polishing wire 11
The inner periphery of the through hole of the work W is polished into a cylindrical shape on the outer peripheral surface of the workpiece W.

【0018】ここで主軸15はワークWを固定し、さら
にワークWを回転させる構造である必要があり、例えば
チャック方式を用いても良いし、ゴムローラーを用いる
方法でもかまわない。又、ワークWを複数個固定する様
な構造であれば作業効率が良くなるためにより望まし
い。
Here, the main shaft 15 needs to have a structure for fixing the work W and rotating the work W. For example, a chuck method or a method using a rubber roller may be used. In addition, a structure in which a plurality of works W are fixed is more preferable because working efficiency is improved.

【0019】又、ワイヤ送り部12とワイヤ巻き取り部
16は巻き径の変化があっても研磨ワイヤ11が弛まな
い機構である必要がある。その為に研磨ワイヤ11の送
り速度と巻き取り速度を同期させるか、もしくはテンシ
ョンプーリを設けて研磨ワイヤ11の弛みをバネで押さ
えつける方法でもかまわない。
Further, the wire feeding section 12 and the wire winding section 16 need to have a mechanism that does not loosen the polishing wire 11 even if the winding diameter changes. For this purpose, a method of synchronizing the feeding speed and the winding speed of the polishing wire 11 or a method in which a tension pulley is provided and slackness of the polishing wire 11 is suppressed by a spring may be used.

【0020】プーリ13は研磨ワイヤ11が通る溝を付
けておく必要があり、形状はV溝もしくはU溝とし、溝
幅は研磨ワイヤ11が横ぶれしないように研磨ワイヤ1
1の外径より若干大きいことが望ましい。
The pulley 13 needs to be provided with a groove through which the polishing wire 11 passes. The pulley 13 has a V-shaped groove or a U-shaped groove, and has a groove width such that the polishing wire 11 does not move sideways.
It is desirable that the diameter is slightly larger than the outer diameter of No. 1.

【0021】ワイヤ送り部12,ワイヤ巻き取り部1
6,プーリ13の材質は金属、樹脂、セラミック等を用
いることが出来るが、溝の摩耗を考慮するとアルミナセ
ラミックスを用いることが望ましい。
The wire feeding section 12 and the wire winding section 1
6, the material of the pulley 13 can be metal, resin, ceramic, or the like, but it is preferable to use alumina ceramics in consideration of groove wear.

【0022】図1に示す本発明の割スリーブの内周研磨
装置はワークWの長手方向が縦向きに示しているが、横
向きであっても全く同一の効果を奏することが出来る。
In the apparatus for polishing the inner periphery of the split sleeve according to the present invention shown in FIG. 1, the longitudinal direction of the work W is shown to be vertical, but the same effect can be obtained even when it is horizontal.

【0023】次に研磨ワイヤ11について図2を用いて
説明する。
Next, the polishing wire 11 will be described with reference to FIG.

【0024】研磨用ワイヤ11は、中心の心線ワイヤ2
1を予めテーパ形状としておき外周に細径ワイヤ22を
巻き付けた構造をなしている。心線ワイヤ21と細径ワ
イヤ22は密着していることが望ましいが、細径ワイヤ
22の両端部と心線ワイヤ21のテーパ開始点の3カ所
を溶接、半田、メッキ等で固定しておく方法でも良い。
The polishing wire 11 is a central core wire 2
1 has a tapered shape in advance, and has a structure in which a small-diameter wire 22 is wound around the outer periphery. Although it is desirable that the core wire 21 and the small-diameter wire 22 are in close contact with each other, three places, that is, both ends of the small-diameter wire 22 and the taper start point of the core wire 21 are fixed by welding, soldering, plating, or the like. A method is also acceptable.

【0025】ここで研磨ワイヤ11をテーパ状としてお
くのは、割スリーブの内周を加工する際に挿入しやすく
するためである。
The reason why the polishing wire 11 is tapered is to make it easier to insert the polishing wire 11 when processing the inner periphery of the split sleeve.

【0026】心線ワイヤ21及び細径ワイヤ22の材質
は共に金属製であるが、心線ワイヤ21は張力がかかる
ので抗張力の鋼線を用い、細径ワイヤ22はダイヤモン
ド砥粒を食いつかせる役目なので銅合金や錫合金等の非
鉄金属線を用いることが望ましい。耐久性とコスト面か
ら心線ワイヤ22にピアノ線を、細径ワイヤにはリン青
銅線を用いることが特に望ましい。
The core wire 21 and the small diameter wire 22 are both made of metal. However, the core wire 21 is made of a high-strength steel wire because tension is applied, and the small diameter wire 22 has a function of eroding diamond abrasive grains. Therefore, it is desirable to use a non-ferrous metal wire such as a copper alloy or a tin alloy. From the viewpoint of durability and cost, it is particularly desirable to use a piano wire for the core wire 22 and a phosphor bronze wire for the small diameter wire.

【0027】このように研磨ワイヤ11を心線ワイヤ2
1の周囲に細径ワイヤを巻き付けて配置したことによっ
て、太くてもたわみやすくすることが出来、図1に示す
装置のワイヤ送り部12に良好に巻装することが出来
る。
Thus, the polishing wire 11 is connected to the core wire 2
By arranging a small diameter wire around the periphery of the wire 1, the wire can be easily bent even if the wire is thick, and can be satisfactorily wound around the wire feed portion 12 of the apparatus shown in FIG. 1.

【0028】心線ワイヤ21の外径はφ0.2mm〜
1.8mmを用いることが出来る。0.2mm未満であ
ると研磨機の張力に耐えきれず、加工中に切断する事が
あり、又1.8mmを越えるとプーリ13の溝に沿って
心線ワイヤ21が屈曲しなくなるからである。好ましく
はφ0.2mm〜1.5mmが良い。これはφ1.5m
mを越えると屈曲の曲率半径が大きくなるのでプーリ1
3の外径も大きくしなければならないからである。
The outer diameter of the core wire 21 is φ0.2 mm or more.
1.8 mm can be used. If it is less than 0.2 mm, it may not be able to withstand the tension of the polishing machine and may be cut during processing, and if it exceeds 1.8 mm, the core wire 21 does not bend along the groove of the pulley 13. . Preferably, φ0.2 mm to 1.5 mm is good. This is φ1.5m
m, the radius of curvature of the bend becomes large.
This is because the outer diameter of No. 3 must also be increased.

【0029】又、細径ワイヤ22の外径はφ0.1〜
1.2mmを用いることが出来る。0.1mm未満で
は、スリーブ1の研磨途中で摩耗しきってしまう場合が
あり、1.2mmを越えると心線ワイヤ21を細い径の
物を選定しなければならなくなり、研磨機の張力に耐え
きれなくなるからである。
The outer diameter of the small-diameter wire 22 is φ0.1 to
1.2 mm can be used. If it is less than 0.1 mm, the sleeve 1 may be worn out during polishing. Because it is gone.

【0030】一例として、φ2.5mmの割スリーブの
内周研磨の場合は、心線ワイヤ21の外径が0.9〜
1.5mmのピアノ線とし、細径ワイヤ22は0.5m
m〜0.8mmのリン青銅線とすれば良い。
As an example, in the case of polishing the inner circumference of a split sleeve of φ2.5 mm, the outer diameter of the core wire 21 is 0.9 to 0.9 mm.
A 1.5 mm piano wire, and the thin wire 22 is 0.5 m
A phosphor bronze wire of m to 0.8 mm may be used.

【0031】又、ここでは細径ワイヤ22として断面が
円形のものを用いているが断面が正方形、長方形、台形
等様々な断面形状を用いても良い。
Although a thin wire 22 having a circular cross section is used here, various cross sectional shapes such as a square, a rectangle, and a trapezoid may be used.

【0032】次に、本発明の研磨ワイヤの他の実施形態
を図3を用いて説明する。
Next, another embodiment of the polishing wire of the present invention will be described with reference to FIG.

【0033】図3(a)は11は、中心の心線ワイヤ3
1をテーパのつかない丸棒状態のままで、細径ワイヤ2
2の直径が順次細くなった構成である。又、図3(b)
は細径ワイヤ22を巻き付けた後にテーパ上に加工した
構成である。いずれも心線ワイヤ21に細径ワイヤ22
を巻き付けた形状であれば、本発明の効果を奏すること
が出来る。図3においても細径ワイヤ22を丸線で示し
ているが、断面が正方形、長方形、台形等様々な断面形
状を用いても良い。
In FIG. 3A, reference numeral 11 denotes a central core wire 3
1 is a small diameter wire 2
2 is a configuration in which the diameter is gradually reduced. FIG. 3 (b)
Is a configuration in which a small-diameter wire 22 is wound and then worked on a taper. In each case, the core wire 21 is attached to the small diameter wire 22.
The effect of the present invention can be obtained as long as the shape is wound. Although the small-diameter wire 22 is shown by a round wire in FIG. 3, various cross-sectional shapes such as a square, a rectangle, and a trapezoid may be used.

【0034】最後に図4を用いて研磨ワイヤの第三の実
施形態を説明する。
Finally, a third embodiment of the polishing wire will be described with reference to FIG.

【0035】及び、上記研磨用ワイヤ11において、心
線ワイヤ41と細径ワイヤ42との組み立て品の最外周
部にダイヤモンド砥粒43を金属のNiメッキ44等で
電着もしくは金属ボンドにより固着させた構成としてい
る。
In the polishing wire 11, the diamond abrasive grains 43 are fixed to the outermost peripheral portion of the assembly of the core wire 41 and the small diameter wire 42 by metal plating or the like by electrodeposition or metal bonding. Configuration.

【0036】電着した場合、ダイヤモンド砥粒43の約
4/5がNiメッキで覆われ、突出しているのが約1/
5となる。このようにダイヤモンド砥粒を固着させるこ
とにより、加工中にダイヤモンドペーストの飛散がなく
なり、研磨装置を汚染させることがなくなる。
In the case of electrodeposition, about 4/5 of the diamond abrasive grains 43 are covered with Ni plating, and
It becomes 5. By fixing the diamond abrasive grains in this manner, scattering of the diamond paste during processing is prevented, and the polishing apparatus is not contaminated.

【0037】以上より、本発明は研磨ワイヤを心線ワイ
ヤの外周に細径ワイヤを巻き付けた形状とすることによ
り、太い研磨ワイヤでも十分にたわませることができ、
従来使用不可能であったフェルールの内周研磨装置であ
るワイヤ送り部、ワイヤ巻き取り部、ワイヤ直線案内
部、及びスリーブを回転させるための主軸を具備した装
置を用いることによって、内周の円筒度の良好な割スリ
ーブを得ることが出来、光コネクタにおいて重要な光学
特性である接続損失値を小さくすることが出来る。
As described above, according to the present invention, by forming the polishing wire into a shape in which a small-diameter wire is wound around the core wire, a large polishing wire can be sufficiently bent.
By using a device equipped with a wire feeder, a wire take-up unit, a wire linear guide, and a main shaft for rotating a sleeve, which is an inner peripheral polishing device of a ferrule that has not been conventionally usable, an inner peripheral cylinder is formed. It is possible to obtain a split sleeve having a good degree, and to reduce a connection loss value, which is an important optical characteristic in an optical connector.

【0038】なお、以上割スリーブを例にして本発明を
説明してきたが、精密スリーブにも適用することが出来
る。
Although the present invention has been described with reference to the split sleeve as an example, the present invention can also be applied to a precision sleeve.

【0039】[0039]

【実施例】ここで、以下に示す方法で実験を行った。EXAMPLE Here, an experiment was conducted by the following method.

【0040】図2に示す本発明の心線ワイヤ21をφ
1.3mmのピアノ線とし、細径ワイヤ22をφ0.6
mmのリン青銅製のワイヤとした研磨ワイヤ11を用い
た図1に示す本発明の内周研磨装置と、比較例として図
6に示す内周加工装置を用いて、図5に示すジルコニア
セラミックス製の割スリーブ1の外径D=φ3.2m
m、長さL=11.4mm、貫通孔d=φ2.45mm
のワークWを40個用意し、各20個づつ加工した。加
工条件は共に、主軸15の回転数を300rpm、ワイ
ヤの送り速度を0.1m/sとした。
The core wire 21 of the present invention shown in FIG.
1.3 mm piano wire, and the fine wire 22 is φ0.6
The inner peripheral polishing apparatus of the present invention shown in FIG. 1 using a polishing wire 11 made of a phosphor bronze wire of 0.1 mm and the inner peripheral processing apparatus shown in FIG. Outer diameter D of the split sleeve 1 is φ3.2m
m, length L = 11.4 mm, through hole d = φ2.45 mm
Of the workpieces W were prepared and processed by 20 pieces each. The processing conditions were such that the rotation speed of the main shaft 15 was 300 rpm, and the wire feed speed was 0.1 m / s.

【0041】上記サンプルの加工した後の内周の長手方
向の真直度を測定した。測定方法は形状測定器をもちい
て触針でなぞる方法を用いた。
The straightness in the longitudinal direction of the inner periphery of the sample after processing was measured. As a measuring method, a method of tracing with a stylus using a shape measuring instrument was used.

【0042】その結果を表1に示す。Table 1 shows the results.

【0043】[0043]

【表1】 [Table 1]

【0044】この結果より、従来例である内周研磨装置
を用いると円筒度の平均値及びばらつきが0.79μ
m、0.114μmと悪いのに比較し、本発明の内周研
磨装置を用いると平均値及びばらつきが0.19μm、
0.046μmと非常に安定した値となっている。
From these results, it was found that the average value and the variation of the cylindricity were 0.79 μm when the inner peripheral polishing apparatus of the related art was used.
m, which is 0.114 μm, which is bad, the average value and variation are 0.19 μm,
This is a very stable value of 0.046 μm.

【0045】[0045]

【発明の効果】このように、本発明によれば研磨ワイヤ
を心線ワイヤの外周に細径ワイヤを巻き付けた構造とす
ることにより、従来使用不可能であったフェルールの内
周研磨装置であるワイヤ送り部、ワイヤ巻き取り部、ワ
イヤ直線案内部、及びスリーブを保持して回転させるた
めの主軸を具備した装置を用いることが出来、内周の円
筒度の良好なスリーブを得ることが出来る。その結果、
光コネクタにおいて重要な光学特性である接続損失値を
小さくすることが出来る。
As described above, according to the present invention, an inner peripheral polishing apparatus for a ferrule which cannot be used conventionally is obtained by using a structure in which a fine wire is wound around the outer periphery of a core wire. A device having a wire feeder, a wire take-up unit, a wire linear guide, and a main shaft for holding and rotating the sleeve can be used, and a sleeve having good inner peripheral cylindricity can be obtained. as a result,
A connection loss value, which is an important optical characteristic in an optical connector, can be reduced.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明のスリーブの内周研磨装置を示す概略構
成図である。
FIG. 1 is a schematic configuration diagram showing an inner peripheral polishing apparatus for a sleeve of the present invention.

【図2】本発明のスリーブ研磨用ワイヤを示す断面図で
ある。
FIG. 2 is a cross-sectional view showing a sleeve polishing wire of the present invention.

【図3】(a)及び(b)は本発明の他の実施形態であ
るスリーブ研磨用ワイヤを示す断面図である。
FIGS. 3A and 3B are cross-sectional views showing a sleeve polishing wire according to another embodiment of the present invention.

【図4】本発明のスリーブ研磨用ワイヤを示す断面図で
ある。
FIG. 4 is a cross-sectional view showing a sleeve polishing wire of the present invention.

【図5】一般的な割スリーブを示す斜視図であるFIG. 5 is a perspective view showing a general split sleeve.

【図6】従来の割スリーブの内周研磨の方法を示す概略
構成図である。
FIG. 6 is a schematic configuration diagram showing a conventional method for polishing the inner periphery of a split sleeve.

【図7】従来のフェルールの内周研磨装置を示す概略構
成図である。
FIG. 7 is a schematic configuration diagram showing a conventional inner peripheral polishing device for a ferrule.

【符号の説明】[Explanation of symbols]

1 割スリーブ 2 スリット 3 貫通孔 11 研磨ワイヤ 12 ワイヤ送り部 13 プーリ 14 ワイヤ直線案内部 15 主軸 16 ワイヤ巻き取り部 17 後端面取り部 21 心線ワイヤ 22 細径ワイヤ 31 心線ワイヤ 32 細径ワイヤ 41 心線ワイヤ 42 細径ワイヤ 43 ダイヤモンド砥粒 44 Niメッキ 61 研磨ワイヤ 71 研磨ワイヤ 72 ワイヤ送り部 74 ワイヤ直線案内部 75 主軸 76 ワイヤ巻き取り部 W ワーク 10 Split Sleeve 2 Slit 3 Through Hole 11 Polishing Wire 12 Wire Feeding Part 13 Pulley 14 Wire Linear Guide 15 Spindle 16 Wire Winding Part 17 Rear End Chamfer 21 Core Wire 22 Small Wire 31 Core Wire 32 Small Wire 41 Core Wire 42 Fine Wire 43 Diamond Abrasive 44 Ni Plating 61 Polishing Wire 71 Polishing Wire 72 Wire Feeding Part 74 Wire Linear Guide 75 Main Shaft 76 Wire Winding Part W Work

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】円筒体の長手方向にスリットを設けた光通
信用スリーブの内周研磨装置において、心線ワイヤの外
周に細径ワイヤを巻き付けた研磨ワイヤ、該ワイヤを巻
装したワイヤ送り部、ワイヤ巻き取り部、ワイヤ直線案
内部、及びこのワイヤ直線案内部に配置されスリーブを
保持して回転させるための主軸を具備したことを特徴と
するスリーブの内径研磨装置。
An inner peripheral polishing apparatus for an optical communication sleeve provided with a slit in a longitudinal direction of a cylindrical body, a polishing wire in which a small-diameter wire is wound around an outer periphery of a core wire, and a wire feeder in which the wire is wound. An inner diameter grinding device for a sleeve, comprising: a wire winding portion; a wire linear guide portion; and a main shaft arranged on the wire linear guide portion for holding and rotating the sleeve.
【請求項2】心線ワイヤの外周に細径のワイヤを巻き付
けたことを特徴とするスリーブ研磨用ワイヤ。
2. A sleeve polishing wire, wherein a small-diameter wire is wound around the outer periphery of a core wire.
【請求項3】上記心線ワイヤをテーパ形状としてその外
周に細径ワイヤを巻き付けたことを特徴とする請求項2
記載のスリーブ研磨用ワイヤ。
3. A tapered shape of the core wire and a small diameter wire wound around its outer periphery.
The wire for polishing a sleeve according to claim 1.
【請求項4】上記細径ワイヤの外周にダイヤモンド砥粒
を電着固化したことを特徴とする請求項2又は3記載の
スリーブ研磨用ワイヤ。
4. A wire for polishing a sleeve according to claim 2, wherein diamond abrasive grains are electrodeposited and solidified on the outer periphery of said small diameter wire.
JP2000329622A 2000-10-27 2000-10-27 Polishing device for inner periphery of sleeve and wire for polishing sleeve used in the polishing device Pending JP2002137157A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000329622A JP2002137157A (en) 2000-10-27 2000-10-27 Polishing device for inner periphery of sleeve and wire for polishing sleeve used in the polishing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000329622A JP2002137157A (en) 2000-10-27 2000-10-27 Polishing device for inner periphery of sleeve and wire for polishing sleeve used in the polishing device

Publications (1)

Publication Number Publication Date
JP2002137157A true JP2002137157A (en) 2002-05-14

Family

ID=18806265

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000329622A Pending JP2002137157A (en) 2000-10-27 2000-10-27 Polishing device for inner periphery of sleeve and wire for polishing sleeve used in the polishing device

Country Status (1)

Country Link
JP (1) JP2002137157A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006142229A (en) * 2004-11-22 2006-06-08 Sekisui Chem Co Ltd Renewal construction method for pipe line and drive device for polishing member used for the method
US7959492B2 (en) 2006-09-11 2011-06-14 Showa Denko K.K. Disk-shaped substrate inner circumference polishing method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006142229A (en) * 2004-11-22 2006-06-08 Sekisui Chem Co Ltd Renewal construction method for pipe line and drive device for polishing member used for the method
US7959492B2 (en) 2006-09-11 2011-06-14 Showa Denko K.K. Disk-shaped substrate inner circumference polishing method

Similar Documents

Publication Publication Date Title
JP4203353B2 (en) Wire tool and manufacturing method thereof
US7434289B2 (en) Polisher brush having wire-shaped grinding elements
JP6421291B2 (en) Abrasive brush
KR101205736B1 (en) Wheel holder, method for manufacturing the same, and cutter wheel holding mechanism using the same
JP4455096B2 (en) Saw wire cutting device
JP2002137157A (en) Polishing device for inner periphery of sleeve and wire for polishing sleeve used in the polishing device
JP2018039066A (en) Grinding wheel and method of manufacturing the same
TW201726323A (en) Fixed abrasive grain wire saw and method for dressing fixed abrasive grain wire that comprise a fixed abrasive grain wire, a workpiece supply table having a workpiece fixing section for fixing a workpiece, and a dressing stone
JP2001047345A (en) Fine hole machining method
JP5114701B2 (en) Micro tool grinding apparatus and method
JPH0420908A (en) Optical fiber connector terminal
JP2949213B2 (en) Method and apparatus for chamfering end edge of optical fiber and grindstone
JP3501350B2 (en) Method of manufacturing wire groove of groove roller for wire saw
JP2000135663A (en) Work autorotation type wire saw and manufacture of wafer
JP2002162536A (en) Ferrule for optical connector, and its manufacturing method
JP2004195575A (en) Grinding device and grinding method
JP2833617B2 (en) Surface processing method and apparatus
KR950009288B1 (en) Process and processing method of ceramic material having fine hole
JP3629662B2 (en) Core drill and core drill with holder
JPS60177866A (en) Polishing of inner hole
JP2005212007A (en) Inner diameter processing method of cylindrical body
JP4139278B2 (en) Optical communication sleeve and processing method thereof
JP3058077U (en) Wire for wire saw
JP3111704B2 (en) Polishing wire
JP2005153066A (en) Device for machining inner diameter of cylindrical body and method for machining inner diameter using the same