JP2002131196A5 - - Google Patents

Download PDF

Info

Publication number
JP2002131196A5
JP2002131196A5 JP2001290338A JP2001290338A JP2002131196A5 JP 2002131196 A5 JP2002131196 A5 JP 2002131196A5 JP 2001290338 A JP2001290338 A JP 2001290338A JP 2001290338 A JP2001290338 A JP 2001290338A JP 2002131196 A5 JP2002131196 A5 JP 2002131196A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2001290338A
Other languages
Japanese (ja)
Other versions
JP2002131196A (ja
Filing date
Publication date
Priority claimed from US09/670,452 external-priority patent/US6382036B1/en
Application filed filed Critical
Publication of JP2002131196A publication Critical patent/JP2002131196A/ja
Publication of JP2002131196A5 publication Critical patent/JP2002131196A5/ja
Ceased legal-status Critical Current

Links

JP2001290338A 2000-09-26 2001-09-25 表面の微粒子汚染物質を測定する装置 Ceased JP2002131196A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/670452 2000-09-26
US09/670,452 US6382036B1 (en) 2000-09-26 2000-09-26 Apparatus for measuring surface particulate contamination

Publications (2)

Publication Number Publication Date
JP2002131196A JP2002131196A (ja) 2002-05-09
JP2002131196A5 true JP2002131196A5 (OSRAM) 2008-11-06

Family

ID=24690451

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001290338A Ceased JP2002131196A (ja) 2000-09-26 2001-09-25 表面の微粒子汚染物質を測定する装置

Country Status (5)

Country Link
US (1) US6382036B1 (OSRAM)
EP (1) EP1191324B1 (OSRAM)
JP (1) JP2002131196A (OSRAM)
KR (1) KR100659802B1 (OSRAM)
CZ (1) CZ20012839A3 (OSRAM)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6397690B1 (en) * 2000-09-26 2002-06-04 General Electric Company Tools for measuring surface cleanliness
US8011258B2 (en) * 2003-08-28 2011-09-06 L-3 Communications Cyterra Corporation Explosive residue sampling
KR100910906B1 (ko) 2008-11-05 2009-08-05 (주)코스코텍 방사능 표면오염 측정을 위한 균일압력기
DE102008059112A1 (de) * 2008-11-26 2010-06-17 Eads Deutschland Gmbh Probensammler und Probensammeleinrichtung für eine Analyseeinrichtung sowie Verfahren zu dessen Betrieb
CA2696647A1 (en) * 2009-03-17 2010-09-17 The Procter & Gamble Company Demonstrative methods for paper towel products
EP2410317A1 (de) * 2010-07-13 2012-01-25 Krämer AG Bassersdorf Verfahren zum Beurteilen von an einem Körper anhaftenden Partikeln
KR101289473B1 (ko) 2013-01-22 2013-07-24 한국생산기술연구원 불균염 정량 시스템 및 이를 이용한 불균염 정량 방법
US10082452B2 (en) 2013-02-05 2018-09-25 Pocared Diagnostics Ltd. Filter arrangement and method for using the same
JP5924390B2 (ja) * 2014-10-01 2016-05-25 三浦工業株式会社 試料採取ペン
DE102016119628A1 (de) * 2016-10-14 2018-04-19 Minebea Intec GmbH Probensammler mit integriertem Kraftmesser
DE102016012369B3 (de) * 2016-10-15 2017-02-23 Bundesrepublik Deutschland, vertreten durch das Bundesministerium der Verteidigung, vertreten durch das Bundesamt für Ausrüstung, Informationstechnik und Nutzung der Bundeswehr Probennahmekit für eine CBRN-Probe
CN209400423U (zh) 2017-09-21 2019-09-17 贝克顿·迪金森公司 横向流测定物、测定物读取器装置和包括其的系统
CN111278565B (zh) 2017-09-21 2022-03-01 贝克顿·迪金森公司 用于有害污染物测试的增强现实装置
CN111278987B (zh) * 2017-09-21 2024-02-23 贝克顿·迪金森公司 以高拾取和脱落效率收集有害污染物的采样系统和技术
CA3075766A1 (en) 2017-09-21 2019-03-28 Becton, Dickinson And Company Hazardous contaminant collection kit and rapid testing
AU2018337648B2 (en) 2017-09-21 2024-04-18 Becton, Dickinson And Company Reactive demarcation template for hazardous contaminant testing
CN111107939B (zh) 2017-09-21 2022-04-12 贝克顿·迪金森公司 引导有害污染物样品的收集的系统和模板及使用其的方法
AU2018337030B2 (en) 2017-09-21 2025-04-10 Becton, Dickinson And Company Hazardous contaminant collection kit and rapid testing
CN108827686B (zh) * 2018-07-31 2023-07-25 河南师范大学 一种用于手掌灰尘样品采集以用于真皮暴露评估的手套
CN113383222A (zh) 2019-01-28 2021-09-10 贝克顿·迪金森公司 具有集成的拭子和测试装置的有害污染物收集装置
CN109946109A (zh) * 2019-03-20 2019-06-28 西安热工研究院有限公司 一种汽轮机叶片微量水溶性沉积物的取样和检测方法
CZ309251B6 (cs) * 2020-10-23 2022-06-22 Univerzita Karlova Způsob čištění a nedestruktivního sledování procesu čištění křemenných ampulí pro polovodičové technologie
JP2023105453A (ja) * 2022-01-19 2023-07-31 株式会社豊田中央研究所 生物由来核酸回収方法、および、生物由来核酸回収装置

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3074276A (en) * 1959-04-20 1963-01-22 Walter S Moos Radioactivity smear sampler
US3091967A (en) * 1960-05-13 1963-06-04 William R Hurdlow Swipe sampler
FR1535675A (fr) * 1967-06-28 1968-08-09 Commissariat Energie Atomique Dispositif de prélèvement, par frottement sur une surface, de traces de substances susceptibles d'être radioactives
JPS618388Y2 (OSRAM) * 1980-08-11 1986-03-14
JPS618389Y2 (OSRAM) * 1980-08-11 1986-03-14
JPS586290U (ja) * 1981-07-03 1983-01-14 株式会社東芝 放射性物質の試料採取装置
JPH0449595Y2 (OSRAM) * 1985-08-07 1992-11-20
JPS6235275U (OSRAM) * 1985-08-20 1987-03-02
JPS62143278U (OSRAM) * 1986-03-05 1987-09-09
JPS636375U (OSRAM) * 1986-06-26 1988-01-16
FR2622972B1 (fr) * 1987-11-09 1990-03-16 Inhni Procede de controle de proprete d'une surface et dispositif pour la mise en oeuvre dudit procede
US5373748A (en) * 1992-09-22 1994-12-20 University Of Medicine And Dentistry Of New Jersey Wipe template sampler
JPH075264A (ja) * 1993-06-16 1995-01-10 Fuji Electric Co Ltd 表面汚染検査装置、該検査装置のスミヤパッド及び該スミヤパッドのスミヤろ紙自動交換装置
CA2137604A1 (en) * 1994-12-08 1996-06-09 Gerald Drolet Apparatus and method for collecting samples for ims(ion mobility spectrometers) analyzers and the like
US5939647A (en) * 1996-01-16 1999-08-17 Applied Materials, Inc. Surface particle sampling head having a rotatable probe
US5859375A (en) * 1996-04-03 1999-01-12 Barringer Research Limited Apparatus for and method of collecting trace samples for analysis

Similar Documents

Publication Publication Date Title
BE2022C531I2 (OSRAM)
BE2022C547I2 (OSRAM)
BE2022C502I2 (OSRAM)
BE2017C059I2 (OSRAM)
BE2017C056I2 (OSRAM)
BE2017C051I2 (OSRAM)
BE2017C032I2 (OSRAM)
BE2014C052I2 (OSRAM)
AU2002307149A8 (OSRAM)
BE2011C034I2 (OSRAM)
JP2001289687A5 (OSRAM)
JP2002245723A5 (OSRAM)
JP2002136341A5 (OSRAM)
BRPI0209186B1 (OSRAM)
BE2017C050I2 (OSRAM)
JP2002180970A5 (OSRAM)
BRPI0204884A2 (OSRAM)
CH1379220H1 (OSRAM)
JP2002131196A5 (OSRAM)
BRPI0101486B8 (OSRAM)
JP2002243428A5 (OSRAM)
BRPI0210463A2 (OSRAM)
JP2002012375A5 (OSRAM)
AU2000280389A8 (OSRAM)
JP2002135617A5 (OSRAM)