JP2002098505A - Method and apparatus for measuring thickness of paint film - Google Patents

Method and apparatus for measuring thickness of paint film

Info

Publication number
JP2002098505A
JP2002098505A JP2000291937A JP2000291937A JP2002098505A JP 2002098505 A JP2002098505 A JP 2002098505A JP 2000291937 A JP2000291937 A JP 2000291937A JP 2000291937 A JP2000291937 A JP 2000291937A JP 2002098505 A JP2002098505 A JP 2002098505A
Authority
JP
Japan
Prior art keywords
film thickness
measured
measurement
thickness
arm
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000291937A
Other languages
Japanese (ja)
Other versions
JP3418166B2 (en
Inventor
Yoshifusa Uezono
義房 上薗
Tokio Kenmochi
冨紀夫 劔持
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SANKO DENSHI KENKYUSHO KK
Kurimoto Ltd
Sanko Electronic Laboratory Co Ltd
Original Assignee
SANKO DENSHI KENKYUSHO KK
Kurimoto Ltd
Sanko Electronic Laboratory Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SANKO DENSHI KENKYUSHO KK, Kurimoto Ltd, Sanko Electronic Laboratory Co Ltd filed Critical SANKO DENSHI KENKYUSHO KK
Priority to JP2000291937A priority Critical patent/JP3418166B2/en
Publication of JP2002098505A publication Critical patent/JP2002098505A/en
Application granted granted Critical
Publication of JP3418166B2 publication Critical patent/JP3418166B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a method and apparatus continuously and efficiently measuring the thickness of a paint film on a painted tube inner surface with high accuracy by completely removing the magnetic effect during the measurement. SOLUTION: An apparatus for measuring thickness of paint film A is composed of plural pairs of rotational rollers 12, 12 supporting tubes P that can be freely rotated, and a means for measuring the thickness of film 20 that includes a carriage 21 on which plural pairs of layer thickness measuring units 22 are mounted. A film thickness meter 27 attached on the edge of an arm 26 supported by a lifting guide 24 of the unit is inserted to inner surface of the tube P, and the film thickness meter 27 comes in contact with the surface to be measured at a determined position in the tube. After measuring the film thickness, the film thickness meter 27 is moved from the surface to be measured to a position having a determined distance where no magnetic effect occurs. A treatment for removing factors that deteriorate the accuracy of film thickness measurement is carried out in the condition without the magnetic effect while the tube P is turned to next measurement position, and then the next film thickness is measured.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は、鋳鉄管のような
管の内面に塗布された塗装膜厚を測定する方法及び装置
に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for measuring a coating film thickness applied to an inner surface of a pipe such as a cast iron pipe.

【0002】[0002]

【従来の技術】ダクタイル鋳鉄管(以下、鉄管と略称す
る)等については、一般に防錆処理のため鉄管内面にエ
ポキシ樹脂粉体塗装が施される。この塗装膜厚は、JI
S規格(JIS G 5528)では、0.3mm以上
とされ、最小膜厚は規定されているが最大膜厚の規定は
なく、経済的(必要最小限の塗料)な観点から最適な膜
厚が採用されている。従って、塗装膜厚を測定し適正な
塗装膜厚の確保が必要である。
2. Description of the Related Art Ductile cast iron pipes (hereinafter abbreviated as iron pipes) and the like are generally coated with an epoxy resin powder on the inner surface of the iron pipe for rust prevention treatment. This coating thickness is
In the S standard (JIS G 5528), the thickness is set to 0.3 mm or more, and the minimum film thickness is specified, but the maximum film thickness is not specified, and the optimum film thickness is determined from an economical (minimum necessary paint) viewpoint. Has been adopted. Therefore, it is necessary to measure the coating film thickness and secure an appropriate coating film thickness.

【0003】塗装膜厚が適正か否かを測定する装置とし
ては、一般に電磁式の膜厚プローブを有する膜厚計が使
用されている。この電磁式膜厚計は、強磁性の磁芯にコ
イルを巻回したものから成り、このコイルに所定の電流
を流して磁芯先端を塗装された金属体の表面に近づける
と、その表面からの距離に応じてコイルの自己インダク
タンスが増減することを利用し、その変化を検出回路に
おいて検出して皮膜の厚さを測定するものである。この
ような測定原理を利用した膜厚計の1つとして「一極式
二点調整形電磁式膜厚計」が知られている。
[0003] As a device for measuring whether or not the coating film thickness is appropriate, a film thickness meter having an electromagnetic film thickness probe is generally used. This electromagnetic film thickness meter consists of a coil wound around a ferromagnetic core, and when a predetermined current is passed through this coil to bring the tip of the magnetic core close to the surface of the painted metal body, Utilizing the fact that the self-inductance of the coil increases or decreases in accordance with the distance of the coil, the change is detected by a detection circuit to measure the thickness of the film. As one of the film thickness meters utilizing such a measurement principle, a "single-pole, two-point adjustment type electromagnetic film thickness meter" is known.

【0004】この膜厚計は、一般に検査員が手に持って
被測定面に膜厚計の磁芯先端を押し当てて使用するもの
である。このため、上記膜厚計は、被測定体の表面での
測定に限定され、検査員の手が届く許容範囲内でしか使
用できない。特に、鋼管や鋳鉄管等の内面に防錆処理と
して塗布されている塗装面には手が届かず、視認するこ
とができない奥行き内での測定には全く対応できない。
このため、このような管内面の塗装膜の測定に対処でき
る膜厚測定方法及び装置が特開平10−300412号
公報で提案されている。
In general, the thickness gauge is used by an inspector holding a hand and pressing a tip of a magnetic core of the thickness gauge against a surface to be measured. For this reason, the film thickness meter is limited to measurement on the surface of the object to be measured, and can be used only within an allowable range that can be reached by an inspector. In particular, a painted surface applied as a rust preventive treatment to the inner surface of a steel pipe, a cast iron pipe, or the like is inaccessible and cannot be measured at all in a depth that cannot be visually recognized.
For this reason, Japanese Patent Application Laid-Open No. H10-304122 proposes a method and an apparatus for measuring the thickness of a film capable of coping with the measurement of the coating film on the inner surface of the tube.

【0005】この特許公開公報による膜厚測定方法は、
上記測定原理による膜厚プローブと同様な膜厚プローブ
を有する膜厚計をロボットアームの先端に取り付けて管
内の奥行き方向及びこれと直交する方向に移動自在と
し、膜厚測定時には膜厚プローブの磁芯先端を管内の表
面に直角に押し当て磁芯先端が内壁に接し、測定可能状
態にあることを検出して回路を作動させ、膜厚を測定す
るというものである。
[0005] The method for measuring the film thickness according to this patent publication is
A film thickness gauge having a film thickness probe similar to the film thickness probe based on the above measurement principle is attached to the tip of the robot arm so that it can be freely moved in the depth direction inside the tube and in a direction perpendicular thereto. The tip of the core is pressed at right angles to the inner surface of the tube to detect that the tip of the magnetic core is in contact with the inner wall and is in a measurable state, activate the circuit, and measure the film thickness.

【0006】[0006]

【発明が解決しようとする課題】ところで、上記特許公
開公報による膜厚測定方法は管内面の塗装膜厚を人手を
介することなく自動的に測定できるという点で優れた膜
厚測定方法であるが、この公報による膜厚測定装置を用
いて実際に管内面の塗装膜厚を測定するには、なお次の
ような問題がある。
By the way, the film thickness measuring method according to the above-mentioned patent publication is an excellent film thickness measuring method in that the coating film thickness on the inner surface of the pipe can be automatically measured without manual operation. However, actually measuring the coating film thickness on the inner surface of the tube using the film thickness measuring device according to this publication still has the following problems.

【0007】上記膜厚測定方法では、前述のように、一
極式二点調整形の膜厚プローブが使用されており、この
二点調整形とは被測定体と同種の金属板を使用して膜厚
計の目盛りを「0点」に調整し、次に同じ金属板上に非
磁性材料の標準厚板を置くか、或は同じ金属板に既知の
厚さの被膜をコートした調整用素地板を固定してこれに
膜厚プローブ先端を当接させ、このときの厚さが2mm
であれば、膜厚計の測定値を2mmとすることにより予
め2点を調整した後実際の膜厚の測定を行なうものであ
る。
In the above-mentioned film thickness measuring method, as described above, a unipolar two-point adjustment type film thickness probe is used. The two-point adjustment type uses a metal plate of the same type as the object to be measured. Adjust the scale of the film thickness meter to “0 point” and then place a standard thick plate of non-magnetic material on the same metal plate, or coat the same metal plate with a coating of a known thickness. The base plate is fixed and the tip of the film thickness probe is brought into contact with it, and the thickness at this time is 2 mm
In this case, the actual value of the film thickness is measured after adjusting two points in advance by setting the measured value of the film thickness meter to 2 mm.

【0008】このようなゼロ調整と標準厚板(又は調整
用素地板)による調整作業は精度の高い測定を実施する
上で重要であるが、この他にも膜厚計を構成している膜
厚測定回路の電子部品等の各部の動作の経時変化や外部
から供給される電源電圧の変動、あるいは外部撹乱要因
等による影響を出来るだけ抑制することも重要である。
ここで、外部撹乱要因とは、測定対象物への当接時に膜
厚プローブの電磁コイルに対する磁気的変化が純粋に測
定対象物の物性に基づく以外の、地磁気の揺らぎのよう
な外的な要因による影響を受けて測定誤差を生じる要因
となることをいう。しかし、上記公報では上記影響をど
のようにして抑制するかについては具体的に説明されて
いない。
[0008] Such zero adjustment and adjustment work using a standard thick plate (or an adjustment base plate) are important in performing high-accuracy measurement, but other than that, a film constituting a film thickness gauge is also required. It is also important to suppress as much as possible the effects of temporal changes in the operation of various parts such as electronic components of the thickness measuring circuit, fluctuations in the power supply voltage supplied from the outside, and the effects of external disturbance factors.
Here, the external disturbance factor is an external factor such as fluctuation of geomagnetism, except that the magnetic change of the film thickness probe with respect to the electromagnetic coil at the time of contact with the measurement object is not based solely on the physical properties of the measurement object. Is a factor that causes measurement errors due to the influence of However, the above publication does not specifically describe how to suppress the above-mentioned effects.

【0009】このような影響の抑制対策として、膜厚プ
ローブが測定対象から離れた間に上記影響を自動的に排
除する処理が一般に行なわれる。しかし、上記公報では
膜厚プローブを測定対象の管内面からどれだけの距離位
置へ離せば影響を排除して高精度の測定ができるかにつ
いては説明されておらず、ロボットアームで膜厚プロー
ブを被測定体内で奥行き方向及び直交方向に移動自在と
するとのみ原理的に説明している。公報には測定信号の
送信についてまで記載されていないが、測定時には膜厚
プローブの磁芯の先端が被測定面に正しく圧接し測定可
能な状態になると膜厚計内のスイッチが作動し、膜厚計
から外部の中央処理装置へ「プローブ圧接オン」の信号
を送信する。中央処理装置がこの信号を受信すると「測
定値入力待ち」の信号を膜厚計に送出し、膜厚計がこの
信号を受信すると直ちに測定値を中央処理装置に送信す
る。中央処理装置は、測定値を受信すると膜厚プローブ
を被測定面から離す指示を送り、膜厚プローブが所定の
距離以上被測定面から離れると「プローブ圧接オフ」の
信号を送信するような仕組みとなっている。
As a countermeasure for suppressing such an effect, a process for automatically eliminating the above-mentioned effect while the film thickness probe is separated from the object to be measured is generally performed. However, the above publication does not describe how far the film thickness probe should be separated from the inner surface of the pipe to be measured to eliminate the effect and perform high-precision measurement. It is described in principle only that it is movable in the depth direction and the orthogonal direction in the measured object. Although the publication does not describe the transmission of the measurement signal, when the tip of the magnetic core of the film thickness probe is correctly pressed against the surface to be measured at the time of measurement and the measurement can be performed, the switch in the film thickness meter is activated, and the film is operated. The signal of "Probe pressure ON" is transmitted from the gage to the external central processing unit. When the central processing unit receives this signal, it sends a signal of "waiting for input of measured value" to the film thickness meter, and immediately transmits the measured value to the central processing unit when the film thickness meter receives this signal. The central processing unit sends an instruction to move the film thickness probe away from the surface to be measured when receiving the measurement value, and sends a signal of "probe pressure off" when the film thickness probe is more than a predetermined distance away from the surface to be measured. It has become.

【0010】従って、膜厚プローブの磁芯の先端が被測
定面から離れると、膜厚計は「プローブ圧接オフ」の信
号を送信し、測定精度を低下させる要因を排除する処理
が行なわれるが、被測定面からの距離が近接したままで
あると磁芯から発生している磁気が撹乱されたまま処理
が行なわれるため測定精度が低下することとなる。
Therefore, when the tip of the magnetic core of the film thickness probe moves away from the surface to be measured, the film thickness meter transmits a signal of "probe pressure contact off", and a process for eliminating a factor that reduces the measurement accuracy is performed. On the other hand, if the distance from the surface to be measured is kept short, the processing is performed while the magnetism generated from the magnetic core is disturbed, so that the measurement accuracy is reduced.

【0011】又、管内面の塗装膜厚を測定する場合、管
の長さ方向に複数箇所で、かつ各長さ方向の箇所毎に管
内周面に沿って複数点で膜厚を測定するのが一般的であ
るが、上記公報ではロボットアームの先端の膜厚計は、
管内で膜厚プローブが一定方向を向いたままであり、上
記のような管長さ方向の複数箇所あるいは管内周面の複
数点の測定箇所を測定する場合については具体的に説明
されていない。
When measuring the coating film thickness on the inner surface of the tube, the film thickness is measured at a plurality of points in the length direction of the tube and at a plurality of points along the inner surface of the tube at each point in each length direction. However, in the above publication, the thickness gauge at the tip of the robot arm is
No specific description is given of the case where the film thickness probe is kept facing in a fixed direction in the pipe and a plurality of measurement points in the pipe length direction or a plurality of measurement points on the inner circumferential surface of the pipe are measured as described above.

【0012】この発明は、上記の問題に留意して、塗装
が内面に施された鋳鉄管や鋼管のような管の内面の塗装
膜厚を、測定時に膜厚プローブに及ぼす磁気的影響によ
る測定誤差を完全に排除するような処理をし、管内面の
所定位置で連続して効率よくかつ高精度で測定し得る塗
装膜厚測定方法及び装置を提供することを課題とする。
In view of the above problems, the present invention measures the coating film thickness on the inner surface of a pipe such as a cast iron pipe or a steel pipe coated on the inner surface by a magnetic effect on a film thickness probe at the time of measurement. It is an object of the present invention to provide a method and an apparatus for measuring the thickness of a coating film, which can perform a process for completely eliminating an error and continuously and efficiently measure the same at a predetermined position on the inner surface of the tube.

【0013】[0013]

【課題を解決するための手段】この発明は、上記の課題
を解決する手段として、内面に塗装を施された管を回転
自在に支持し、管の端からその長手方向に電磁コイルを
有する電磁式膜厚プローブを所定長さ位置へ挿入し、膜
厚計を管内の被測定面へ移動、当接させて膜厚プローブ
が検出する磁気的変化から膜厚計で塗装膜厚を測定する
際に、膜厚プローブで膜厚を測定した後膜厚プローブを
被測定面から磁気的影響の及ばない所定の距離位置へ離
反させると共に、管を次の被測定面位置まで回転させ、
その間に磁気的影響のない状態で膜厚計に対する測定値
の精度を低下させる要因を排除する処理をした後次の膜
厚測定をし、上記測定を繰り返して管内複数箇所の塗装
膜厚を測定する塗装膜厚測定方法としたのである。
According to the present invention, as a means for solving the above-mentioned problems, there is provided an electromagnetic coil having an inner surface coated with a rotatable tube and an electromagnetic coil extending from the end of the tube in the longitudinal direction thereof. When the coating thickness probe is inserted into a predetermined length position, the thickness gauge is moved to the surface to be measured in the tube, and brought into contact with it to measure the coating thickness with the thickness gauge from the magnetic change detected by the thickness probe. Then, after measuring the film thickness with the film thickness probe, the film thickness probe is separated from the surface to be measured to a predetermined distance position that is not magnetically affected, and the tube is rotated to the next surface to be measured,
In the meantime, in the absence of magnetic influence, after processing to eliminate the factors that reduce the accuracy of the measured value for the film thickness meter, the next film thickness measurement is performed, and the above measurement is repeated to measure the coating film thickness at multiple locations in the pipe This is the method of measuring the coating film thickness.

【0014】上記の測定方法を実施する装置として、内
面に塗装を施された管を回転自在に支持する回転支持手
段と、上記管の長手方向に移動自在な台車を配置し、こ
の台車上にアームとこのアームを昇降自在に保持する昇
降手段とを設け、アーム先端には電磁コイルを有する電
磁式膜厚を備えた膜厚計を取付け、膜厚計は管内に挿入
した後アームを下降させて膜厚プローブを被測定面に当
接させ、膜厚プローブが検出する磁気的変化の信号から
塗装膜厚を測定するものとし、膜厚測定後昇降手段のア
ームを上昇させて膜厚プローブに対する磁気的影響の及
ばない所定の距離位置へ離反させると共に、回転支持手
段により管を次の被測定面位置まで回転させ、磁気的影
響のない状態で膜厚計に対する測定値の精度を低下させ
る要因を排除する処理をして次の膜厚測定をするように
構成した塗装膜厚測定装置を採用することができる。
As an apparatus for carrying out the above-described measuring method, there are provided a rotation supporting means for rotatably supporting a pipe having an inner surface coated thereon, and a bogie movable in the longitudinal direction of the pipe, and mounted on the bogie. An arm and an elevating means for holding the arm so as to be able to move up and down are provided.A film thickness gauge having an electromagnetic film thickness having an electromagnetic coil is attached to the tip of the arm. The film thickness probe is brought into contact with the surface to be measured, and the coating film thickness is measured from the magnetic change signal detected by the film thickness probe. A factor that reduces the accuracy of the measured value for the thickness gauge in the absence of magnetic influence, while moving the tube to the next measured surface position by rotating and supporting the tube to a predetermined distance position that is not magnetically affected Eliminate It can be a sense to adopt a coating film thickness measuring apparatus that is configured to the following thickness measurements.

【0015】上記膜厚測定方法及び装置によれば、管内
面に施された塗装膜厚が連続して測定される。膜厚計
は、管内面に管の長手方向に沿って移動して挿入され、
被測定面に対して直角方向に下降されて被測定面に当接
し、膜厚を測定する。測定が終わると膜厚計が離反して
上昇し、被測定面から磁気的影響の及ばない所定の距離
位置に停止する。この所定の距離位置に停止している間
に管を回転させて次の被測定位置を膜厚プローブに対向
させると共に、膜厚計に対する測定値の精度を低下させ
る要因を排除する処理を行った後、次の被測定面に対す
る測定を繰り返す。
According to the method and the apparatus for measuring the film thickness, the coating film thickness applied to the inner surface of the tube is continuously measured. The thickness gauge is inserted into the inner surface of the tube by moving along the length of the tube,
The film is lowered in a direction perpendicular to the surface to be measured and contacts the surface to be measured, and the film thickness is measured. When the measurement is completed, the film thickness gauge moves away and rises, and stops at a predetermined distance from the surface to be measured which is not magnetically affected. While stopping at the predetermined distance position, the tube was rotated so that the next position to be measured was opposed to the film thickness probe, and a process for eliminating a factor that reduced the accuracy of the measurement value for the film thickness meter was performed. Thereafter, the measurement for the next surface to be measured is repeated.

【0016】[0016]

【実施の形態】以下、この発明の実施の形態について図
面を参照して説明する。図1は実施形態の塗装膜厚測定
装置の前後の工程の装置を含む概略配置図である。図示
の塗装膜厚測定装置Aは、上流側の鋳鉄管製造装置(図
示せず)で製造されたダクタイル鋳鉄管(以下、鉄管と
いう)の内面に塗装装置(図示せず)でエポキシ樹脂粉
体塗装を施した後、ストック台D上に多数並置された鉄
管をまずピンホール検査装置Bでピンホールの有無を検
査した後上記内面の塗装膜厚が正常であるかを測定する
ように設けられている。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a schematic layout diagram including devices in processes before and after a coating film thickness measuring device according to an embodiment. The illustrated coating film thickness measuring apparatus A is an epoxy resin powder coating apparatus (not shown) on the inner surface of a ductile cast iron pipe (hereinafter referred to as an iron pipe) manufactured by an upstream cast iron pipe manufacturing apparatus (not shown). After coating, a large number of iron pipes arranged side by side on the stock table D are first inspected for the presence or absence of pinholes by the pinhole inspection device B, and then the coating thickness on the inner surface is measured to determine whether the coating thickness is normal. ing.

【0017】又、図示の塗装膜厚測定装置Aの設置範囲
内には塗装膜不良品捺印装置S(点線で示す)が設けら
れている。さらに、測定装置Aの下流側には塗装膜不良
品搬送装置Cが設けられている。なお、上記ストック台
D〜ピンホール検査装置B〜塗装膜厚測定装置A〜塗装
膜不良品搬送装置Cの下方にはそれぞれの装置間に亘っ
て鉄管を搬送する別の搬送装置C0 が設けられている。
又、符号Rは再加工品の戻り経路である。
A defective coating film marking device S (shown by a dotted line) is provided within the installation range of the coating film thickness measuring device A shown in the figure. Further, a coating film defective product conveying device C is provided downstream of the measuring device A. Incidentally, another conveying device C 0 for conveying the steel pipe over between the lower the stock table D~ pinhole inspection apparatus B~ paint film thickness measuring device A~ coating film defective conveying apparatus C each apparatus provided Have been.
The symbol R indicates a return path of the reworked product.

【0018】図2に塗装膜厚測定装置Aの(a)拡大平
面図、(b)拡大側面図を示す。図示の測定装置Aは、
前工程のピンホール検査を終了した複数本(図示の例で
は3本)の並行に送られて来る鉄管P,P,Pを図示の
位置に回転ローラで回転自在に支持する回転支持手段1
0と、台車上に設けたアーム先端に膜厚計を設けて鉄管
内面の被測定面に膜厚を測定する膜厚測定手段20とを
左右一対に設けて成る。回転支持手段10は、支持台1
1上に3本の鉄管P,P,Pのそれぞれを図3の矢視A
−Aからの断面図である図4に示すように、1対の回転
ローラ12、12の3組のそれぞれで回転自在に支持す
るように設けられている。
FIG. 2 shows (a) an enlarged plan view and (b) an enlarged side view of the coating film thickness measuring device A. The illustrated measuring device A is:
Rotation support means 1 for rotatably supporting a plurality of (three in the example shown) iron pipes P, P, P sent in parallel at a position shown in FIG.
0 and a pair of left and right film thickness measuring means 20 for measuring the film thickness on the surface to be measured on the inner surface of the iron pipe by providing a film thickness meter at the end of the arm provided on the carriage. The rotation support means 10 includes the support table 1
Each of the three iron pipes P, P, and P is placed on top of FIG.
As shown in FIG. 4 which is a cross-sectional view taken from the line -A, the pair of rotating rollers 12, 12 are provided so as to be rotatably supported by each of three sets.

【0019】なお、図1では3本の鉄管P,P,Pを左
右一対の回転支持手段10、10で支持する際に鉄管
P,P,Pの左側端より右側端が回転支持手段10より
少し長く突出する状態で支持しているが、後で説明する
ように対象の鉄管Pには長さが4m、5mの2種類あ
り、長さの短い鉄管Pの左側端も来るように送り込まれ
るからであり、図示の鉄管Pは長い方の鉄管Pを支持し
た状態を示している。従って、左側の膜厚測定手段20
の移動距離より右側の膜厚測定手段20の方が長い移動
距離を動けるよう移動台は設置されている。長さの異な
る鉄管Pを受入れて支持する際、それぞれの長さの鉄管
の中央を左右の回転支持手段10と10の中央に一致す
るように支持し、左右の膜厚支持手段20、20の移動
距離も異なる長さの鉄管Pに対し左右対称に設計しても
よい。
In FIG. 1, when the three iron pipes P, P, P are supported by the pair of left and right rotation support means 10, 10, the right end of the iron pipes P, P, P from the left end is more than the rotation support means 10. Although it is supported in a state of protruding a little longer, as described later, there are two types of iron pipes P having a length of 4 m and 5 m, and the iron pipe P is fed so that the left end of the short iron pipe P also comes. This is a state in which the illustrated iron pipe P supports the longer iron pipe P. Therefore, the film thickness measuring means 20 on the left side
The moving table is installed so that the film thickness measuring means 20 on the right side can move a longer moving distance than the moving distance. When receiving and supporting the iron pipes P having different lengths, the centers of the iron pipes of the respective lengths are supported so as to coincide with the centers of the left and right rotation support means 10 and 10, and the left and right film thickness support means 20, 20 are supported. The moving distance may be designed symmetrically with respect to the iron pipes P having different lengths.

【0020】片側の回転支持手段10には、図3に示す
ように、駆動部としてモータ13の出力をスプロケッ
ト、チェーンによる伝達手段14を介して2つの回転ロ
ーラ12、12へ伝達し、管を支持しながら回転させ
る。反対側(図2、図3の右側)の回転支持手段10は
駆動部がなく、回転ローラ12は鉄管Pの回転によりつ
れ回りする。一対の回転支持手段10と10の間に搬送
装置C0 の台車がレール上を車輪で走行するように設け
られ、その台車の上部の支持具で持上げて搬送して来た
鉄管Pを下ろして回転支持手段10、10上に鉄管Pを
載置するようになっている。
As shown in FIG. 3, the output of the motor 13 as a driving unit is transmitted to the two rotation rollers 12 and 12 via the transmission means 14 including a sprocket and a chain, and the tube is connected to the rotation support means 10 on one side. Rotate while supporting. The rotation support means 10 on the opposite side (the right side in FIGS. 2 and 3) does not have a driving unit, and the rotation roller 12 rotates by rotating the iron pipe P. Carriage of the transport apparatus C 0 between the pair of rotary support means 10 and 10 are provided so as to travel on a rail by the wheel, and lower the iron pipe P came conveyed lift in support of the upper part of the carriage The iron pipe P is mounted on the rotation supporting means 10, 10.

【0021】膜厚測定手段20は、図2の例では、搬送
装置C0 の台車とは別にこれと直角方向に移動する1台
の台車21上に3組の膜厚測定ユニット22が設けられ
て成る。台車21は、図5〜図7に示すように、固定台
21a上に2組の駆動源が設けられ、その上に昇降台2
1bが設けられ、固定台21aの下には走行用の車輪が
備えられている。駆動源の一方は車輪を回転させて自走
するため、もう一方は昇降台21bを昇降させるための
ものである。
The film thickness measuring means 20, in the example of FIG. 2, one truck 21 on the three sets of the film thickness measuring unit 22 to move to the direction perpendicular separately is provided a carriage transport device C 0 Consisting of As shown in FIGS. 5 to 7, the carriage 21 is provided with two sets of driving sources on a fixed base 21a,
1b is provided, and wheels for traveling are provided below the fixed base 21a. One of the driving sources is for self-running by rotating wheels, and the other is for raising and lowering the elevator 21b.

【0022】昇降台21b上の膜厚測定ユニット22
は、昇降台21bに固定されたブラケット23に取り付
けた昇降ガイド24に角度調整手段25を介して保持さ
れるアーム26の先端に膜厚計27を取り付けて成る。
昇降ガイド24はブラケット23の垂直端に沿ってリニ
アガイドを設け、その移動部材24aを上端の油圧シリ
ンダで昇降させるように形成されている。移動部材24
aの端には角度調整手段25の水平部材25aが取り付
けられている。水平部材25aの中間位置にアーム26
の基部が回転自在に取り付けられ、かつばねとねじロッ
ドでアーム26の水平部材25aに対する角度を調整し
て設定するようになっている。上記昇降台21bと昇降
ガイド24とにより昇降手段が形成される。
The film thickness measuring unit 22 on the elevator 21b
Is constituted by attaching a film thickness gauge 27 to the tip of an arm 26 held via an angle adjusting means 25 on an elevating guide 24 attached to a bracket 23 fixed to an elevating table 21b.
The elevating guide 24 is provided so that a linear guide is provided along the vertical end of the bracket 23, and the moving member 24a is moved up and down by a hydraulic cylinder at the upper end. Moving member 24
A horizontal member 25a of the angle adjusting means 25 is attached to an end of the line a. The arm 26 is located at an intermediate position of the horizontal member 25a.
Is rotatably mounted, and the angle of the arm 26 with respect to the horizontal member 25a is adjusted and set by a spring and a screw rod. An elevating means is formed by the elevating table 21b and the elevating guide 24.

【0023】又、水平部材25aの先端にはリミットス
イッチ25bが設けられ、アーム26の先端が鉄管内に
挿入中に誤操作などで移動部材24aを下げて角度が上
がり過ぎたときに移動部材の下降を停止するための信号
を出力し、誤操作による損傷を防止するようにしてい
る。角度調整手段25により、通常はアーム26の基部
寄りが水平に対して略4度上向きに設定され、これによ
り片持状のアーム26の先端が自重で下がっても先端位
置でアーム26の基部と同一レベル(水平)となるよう
に調整される。
A limit switch 25b is provided at the tip of the horizontal member 25a. When the tip of the arm 26 is inserted into the iron tube, the moving member 24a is lowered due to an erroneous operation or the like and the angle of the moving member is lowered. A signal for stopping the operation is output to prevent damage due to erroneous operation. By the angle adjusting means 25, the base of the arm 26 is normally set to be approximately 4 degrees upward with respect to the horizontal, so that even if the tip of the cantilevered arm 26 is lowered by its own weight, the base of the arm 26 remains at the tip end position. Adjustments are made so that they are at the same level (horizontal).

【0024】図8に膜厚計27の概略構成を示す。この
膜厚計27の構成は、基本的に特開平10−30041
2号に開示されたものと同じであり、ここでは簡単に説
明する。膜厚計27内にはその先端寄り位置に強磁性材
の磁芯31とその周りに巻回されるコイル33から成る
電磁誘導式の膜厚プローブ30がコイルケース32と共
に固定部材34に対して昇降自在に設けられている。膜
厚プローブ30は、弾性部材37で押圧されて常時下方
に突出するように設けられ、磁芯31と反対側にコイル
取付台35を介して設けた端子台36が接続される(信
号の検出、処理、送信をする)測定回路38に対し、膜
厚プローブ30が被測定面に押圧されて固定部材34内
に没入するとプローブ圧接信号発生用のスイッチ39が
オンとなり、膜厚プローブ30のコイルの自己インダク
タンスの変化に基づいてコイル33に生じる電流又は電
圧の変化から被測定面の塗装膜厚さを測定する。
FIG. 8 shows a schematic configuration of the film thickness meter 27. The configuration of the film thickness meter 27 is basically the same as disclosed in
This is the same as that disclosed in No. 2 and will be briefly described here. An electromagnetic induction type film thickness probe 30 comprising a magnetic core 31 of a ferromagnetic material and a coil 33 wound around the magnetic core 31 at a position near the tip of the film thickness meter 27 is fixed to a fixing member 34 together with a coil case 32. It is provided to be able to move up and down freely. The film thickness probe 30 is provided so as to always be projected downward by being pressed by the elastic member 37, and a terminal block 36 provided via a coil mount 35 on the opposite side to the magnetic core 31 is connected (signal detection). When the film thickness probe 30 is pressed against the surface to be measured and is immersed in the fixed member 34, a switch 39 for generating a probe pressure signal is turned on, and the coil of the film thickness probe 30 is turned on. The coating thickness of the surface to be measured is measured from a change in current or voltage generated in the coil 33 based on the change in self-inductance.

【0025】膜厚プローブ30で測定される膜厚信号は
測定回路へ送られ、そこで二値化信号に変換されて、さ
らに図示しない外部の中央処理装置のコンピュータへ送
られ、ここで膜厚が測定される。この膜厚プローブによ
る膜厚は、二点調整式の測定原理により測定されること
は、従来例で説明したのと同様である。
The film thickness signal measured by the film thickness probe 30 is sent to a measuring circuit, where it is converted into a binary signal, and further sent to an external central processing unit computer (not shown), where the film thickness is measured. Measured. The film thickness measured by the film thickness probe is measured according to the two-point adjustment type measurement principle, as in the case of the conventional example.

【0026】上記の構成の実施形態の塗装膜厚測定装置
により鉄管の内面の塗装膜厚が測定される。図示の塗装
膜厚測定装置Aにより測定される鉄管は、前述した鋳鉄
管製造ラインの直ぐ後方で塗装膜厚が測定されるが、こ
のラインでは鉄管の口径75、100、150、20
0、250φmmの5種類を対象としており、これら鉄
管は75、100φmmのものは長さ4m、150、2
00、250φでは長さ5mである。塗装膜厚の測定時
には3本の鉄管P,P,Pが支持台11の回転ローラ1
2上にそれぞれ載置されるが、支持台11と11の設置
間距離は一定であるから、前述したように4mの長さの
鉄管の場合より5mの長さの鉄管の測定時には鉄管の片
側端を基準として同位置に支持し他端が支持台11より
余分に1m突出した状態で測定される。
The coating thickness on the inner surface of the iron pipe is measured by the coating thickness measuring device of the embodiment having the above-described configuration. In the iron pipe measured by the illustrated coating film thickness measuring device A, the coating film thickness is measured immediately behind the above-described cast iron pipe manufacturing line. In this line, the iron pipe diameters are 75, 100, 150, and 20.
It is intended for five types of 0, 250 mm, and these iron tubes have a length of 75 m and a diameter of 100 mm.
For 00 and 250φ, the length is 5 m. At the time of measuring the coating film thickness, three iron pipes P, P, P
2 is fixed on each of the two supports. Since the distance between the supports 11 and 11 is constant, one side of the iron tube is measured when measuring a 5 m long iron tube as compared with the case of a 4 m long iron tube as described above. The measurement is performed in a state where the end is supported at the same position and the other end is projected extra 1 m from the support base 11.

【0027】各鉄管Pの長さ方向の測定位置は、図9の
(a)図に示すように、管の両端から100、900m
m入った(イ)、(ロ)、(ハ)、(ニ)の位置であ
る。但し、鉄管の受口部側では受口長さPJIS入った
位置から100、900mmの位置が(イ)、(ロ)と
なる。そして各長さ位置では、(b)図に示すように管
の内径に沿って90°ずつ位相が異なる〜の4点に
ついて膜厚を測定する。測定点〜を測定する場合、
この実施形態では、膜厚計27を回転させるのではな
く、回転ローラ12を回転させることにより、鉄管Pを
回転させて膜厚測定器27が対向する被測定面を〜
の順に移動させる(但し、回転方向は図示の方向と反対
向きとしてもよく、任意である)。
As shown in FIG. 9A, the measuring position in the length direction of each iron pipe P is 100, 900 m from both ends of the pipe.
(a), (b), (c), and (d) where m is entered. However, on the socket side of the iron pipe, positions (a) and (b) are 100 and 900 mm from the position where the socket length PJIS is included. Then, at each length position, the film thickness is measured at four points having a phase difference of 90 ° along the inner diameter of the tube as shown in FIG. When measuring the measurement point ~
In this embodiment, the iron pipe P is rotated by rotating the rotating roller 12 instead of rotating the film thickness meter 27, and the surface to be measured to which the film thickness measuring device 27 faces is changed to ~.
(However, the rotation direction may be opposite to the illustrated direction, and is arbitrary).

【0028】支持台11、11の回転ローラ12、12
上に3本の鉄管P,P,Pがそれぞれ載置されると、待
機位置に待機していた膜厚測定手段20の台車21を鉄
管Pの両端に接近させてアーム26の端の膜厚計27を
管内に挿入し、所定の長さ位置に停止させる。この場
合、膜厚計27の突出端が鉄管内の被測定面より少なく
とも20mm以上の距離だけ離れた位置で鉄管の長さ方
向に沿って挿入する。上記鉄管内の被測定面に対し管径
が例えば大きいものから小さいものへと大きく変化する
場合、上記所定の距離位置となるように予め台車21の
昇降台車21bを昇降させて調整し、調整距離の小さい
範囲では昇降ガイド24によってアーム26の保持高さ
を調整する。
The rotating rollers 12 and 12 of the supports 11 and 11
When the three iron pipes P, P, P are respectively placed on the iron pipe P, the carriage 21 of the film thickness measuring means 20 waiting at the standby position is brought close to both ends of the iron pipe P, and the film thickness at the end of the arm 26 is set. The total 27 is inserted into the tube and stopped at a predetermined length position. In this case, the protruding end of the film thickness gauge 27 is inserted along the length direction of the iron tube at a position at least 20 mm or more away from the surface to be measured in the iron tube. When the pipe diameter changes largely from, for example, a large diameter to a small diameter with respect to the surface to be measured in the iron pipe, the lifting and lowering carriage 21b of the carriage 21 is previously adjusted to be at the predetermined distance position, and the adjustment distance is adjusted. The holding height of the arm 26 is adjusted by the elevating guide 24 in the small range.

【0029】上記のようにして膜厚計27が鉄管内の被
測定面上に挿入されると、次に昇降ガイド24によりア
ーム26をさらに下降させて膜厚計27の突出端を被測
定面に対し直交する方向に(直角に)当接させて膜厚
を測定する。この場合、磁芯31が被測定面に当接して
コイルケース32の下端が固定部材34の下端内に押し
込まれると、スイッチ39がONとなり、測定回路38
が作動する。このため、コイル33に生じた自己インダ
クタンスの変化に基づいて測定される電流又は電圧変化
の信号が端子台36から測定回路38へ送られて膜厚が
測定される。膜厚の測定が二点調整データに基づいて行
われることは言うまでもない。
When the thickness gauge 27 is inserted on the surface to be measured in the iron tube as described above, the arm 26 is further lowered by the elevating guide 24 so that the protruding end of the thickness gauge 27 is moved to the surface to be measured. The film thickness is measured by abutting in a direction perpendicular (perpendicular) to the film thickness. In this case, when the magnetic core 31 contacts the surface to be measured and the lower end of the coil case 32 is pushed into the lower end of the fixing member 34, the switch 39 is turned on, and the measuring circuit 38 is turned on.
Operates. Therefore, a signal of a current or voltage change measured based on a change in self-inductance generated in the coil 33 is sent from the terminal block 36 to the measurement circuit 38, and the film thickness is measured. Needless to say, the film thickness is measured based on the two-point adjustment data.

【0030】測定された膜厚測定信号は測定回路38で
二値化信号に変換され、この信号が外部の中央処理装置
へ送られて膜厚が測定されることは前述した通りであ
る。この測定が終了すると主測定回路からの制御信号が
昇降ガイド24へ送られ、アーム26の先端の膜厚計2
7が被測定面から上昇し離れる。離れる距離位置は、被
測定面から少なくとも20mm又はそれ以上の位置であ
り、この距離位置まで上昇して停止させることが重要で
ある。その理由は次の通りである。
The measured film thickness measuring signal is converted into a binary signal by the measuring circuit 38, and this signal is sent to an external central processing unit to measure the film thickness as described above. When this measurement is completed, a control signal from the main measurement circuit is sent to the elevating guide 24, and the thickness meter 2 at the tip of the arm 26 is used.
7 rises away from the surface to be measured. The distance position is at least 20 mm or more from the surface to be measured, and it is important to ascend to this distance position and stop. The reason is as follows.

【0031】膜厚計27の測定回路は、先端が被測定面
に接触し、さらに押し付け(押付け時のストローク5m
m)られた状態からわずかな距離(ストローク4mm以
下になると)でも反対に離れる方向に上昇すると、スイ
ッチ39が作動し膜厚計27は「プローブ圧接オフ」の
信号を中央処理装置へ送信する。プローブ30内のコイ
ル33には常時所定の電流が流れており、磁芯31から
は磁界が発生している。被測定対象物が磁芯31の近く
にあると被測定対象物より磁界が撹乱される。膜厚計2
7は磁芯31が被測定対象物から離れた時点で測定精度
を低下させる要因による影響を排除する処理を開始する
が、測定精度を高く保持するためにはこの処理を行なっ
ている間は磁界が撹乱されないことが前提である。従っ
て、磁界が撹乱されたままでこの処理が開始されると磁
気撹乱の影響が含まれたままとなり、測定精度が低下す
る。
In the measuring circuit of the film thickness meter 27, the tip is brought into contact with the surface to be measured, and further pressed (with a stroke of 5 m during pressing).
m) When it rises in the opposite direction even if it is a small distance (when the stroke becomes 4 mm or less) from the state in which the switch is operated, the switch 39 is operated, and the film thickness meter 27 transmits a signal of "probe pressure contact OFF" to the central processing unit. A predetermined current always flows through the coil 33 in the probe 30, and a magnetic field is generated from the magnetic core 31. When the measured object is near the magnetic core 31, the magnetic field is disturbed by the measured object. Film thickness meter 2
7 starts a process of eliminating the influence of a factor that reduces the measurement accuracy when the magnetic core 31 is separated from the object to be measured, but in order to keep the measurement accuracy high, a magnetic field is applied during this process. Is not disturbed. Therefore, if this process is started with the magnetic field being disturbed, the influence of the magnetic disturbance is still included, and the measurement accuracy is reduced.

【0032】このような影響を測定値に与えない程度に
低下させるために、膜厚プローブ30の磁芯31の先端
を被測定面から少なくとも20mm又はそれ以上の距離
位置に停止させるのであるが、測定精度の設定条件によ
っては10mm又はそれ以上としてもよい。しかし、実
際の膜厚測定時には鉄管の自重により曲がり、あるいは
製作誤差による部分的な曲がりなどが生じているため、
少なくとも10mm又はそれ以上の距離位置に離して設
定したとしても、実際には膜厚計27の先端が10mm
以下に接近している場合も予測される。このため、実際
の測定時の設定誤差を含めると少なくとも20mm又は
それ以上であれば安定して磁気撹乱の影響を遮断できる
として定められた数値である。
In order to reduce such an influence so as not to affect the measured value, the tip of the magnetic core 31 of the film thickness probe 30 is stopped at a distance of at least 20 mm or more from the surface to be measured. Depending on the setting conditions of the measurement accuracy, it may be 10 mm or more. However, during actual film thickness measurement, the iron tube bends due to its own weight, or partial bending due to manufacturing errors has occurred.
Even if it is set at a distance of at least 10 mm or more, the tip of the thickness gauge 27 is actually 10 mm.
It is also anticipated that they are approaching: For this reason, the value is set to be at least 20 mm or more including the setting error at the time of the actual measurement, so that the influence of the magnetic disturbance can be stably cut off.

【0033】以上のように定められた所定距離位置へ膜
厚計27の先端が上昇して停止すると、回転ローラ1
2、12が回転し、測定点が膜厚プローブ30に対向
する位置へ鉄管Pが回転されて停止する。従って、鉄管
Pの回転は間歇動作である。測定点で上記と同様の
測定を行ない、再び膜厚プローブ30が上昇すると所定
距離位置で停止して配管Pを回転させ、次々と測定点
、の測定が行われる。
When the tip of the film thickness meter 27 rises and stops at a predetermined distance position determined as described above, the rotating roller 1
2 and 12 rotate, and the iron pipe P is rotated to a position where the measurement point faces the film thickness probe 30 and stopped. Therefore, the rotation of the iron pipe P is an intermittent operation. The same measurement as described above is performed at the measurement points, and when the film thickness probe 30 rises again, it stops at a predetermined distance position and rotates the pipe P, and the measurement points are measured one after another.

【0034】上記各測定点〜のいずれか1箇所でも
測定された膜厚が所定の厚さ(0.3mm)以下であれ
ば中央処理装置は不良品の判定をし、その判定に基づく
信号により塗装膜厚不良品捺印装置Sへ信号を送り、不
良品を示すマークを捺印する。又、上記の測定は、3本
で1組の鉄管P,P,Pのそれぞれについて図9の
(a)図の(イ)と(ハ)、(ロ)と(ニ)のそれぞれ
の長さ位置で左右ほぼ同時に並行処理される。
If the film thickness measured at any one of the above-mentioned measuring points 1 and 2 is not more than a predetermined thickness (0.3 mm), the central processing unit determines a defective product and outputs a signal based on the determination. A signal is sent to the coating film defective article marking device S, and a mark indicating the defective article is stamped. In addition, the above-described measurement is based on the length of each of (a) and (c) in FIG. 9 (a) and (b) and (d) in FIG. Parallel processing is performed almost simultaneously at the left and right positions.

【0035】以上の膜厚測定処理において、長尺の鉄管
P,P,Pは直線状であることが前提であるが、これら
の鉄管のうち、例えば75φmmの小径管などでは製作
精度が悪く長さ方向にうねりを生じたものが含まれるこ
とがある。この場合、膜厚プローブ30を図10の
(a)図のように鉄管P内に挿入しても、(b)図に示
すようにうねりの生じている部分では膜厚プローブ30
が鉄管の中心より左右いずれかへ例えば10mm程度ず
れて位置することがある。
In the film thickness measuring process described above, it is assumed that the long iron pipes P, P, P are linear, but among these iron pipes, for example, a small diameter pipe of 75 mm has a poor manufacturing accuracy and a long length. In some cases, undulation in the vertical direction may be included. In this case, even if the film thickness probe 30 is inserted into the iron pipe P as shown in FIG.
May be located to the right or left of the center of the iron tube, for example, being shifted by about 10 mm.

【0036】図示の膜厚プローブ30は、磁芯31が被
測定面に接触して膜厚計27内にストローク4mm押し
込まれると測定回路が作動し、ストローク5mm以上は
固定部材34により没入しないように設計されている。
従って、図10の(b)図のように、膜厚プローブ30
が鉄管Pの中心よりずれた状態であれば、膜厚プローブ
30を下降させても固定部材34のコーナ部が鉄管Pの
内面に当接し磁芯31が上記必要ストロークほど移動せ
ず、このため測定開始の信号が生じない。このような場
合は、中央処理装置はその鉄管を不良品として処理する
信号を出力する。なお、図9、図10の鉄管Pの内周の
太線は塗装面を示している。
In the illustrated film thickness probe 30, when the magnetic core 31 comes into contact with the surface to be measured and is pushed into the film thickness meter 27 by a stroke of 4 mm, the measuring circuit is activated, and the fixing member 34 does not sink the stroke of 5 mm or more. Designed for
Therefore, as shown in FIG.
Is shifted from the center of the iron tube P, even if the film thickness probe 30 is lowered, the corner portion of the fixing member 34 contacts the inner surface of the iron tube P, and the magnetic core 31 does not move as much as the necessary stroke. No signal to start measurement. In such a case, the central processing unit outputs a signal for processing the iron tube as a defective product. 9 and 10, the bold line on the inner periphery of the iron pipe P indicates the painted surface.

【0037】上記実施形態では、管を2つの回転ローラ
で回転自在に支持して回転させるようにしたが、回転支
持手段は回転ローラ方式でなくてもよい。例えば、半割
り式の軸受手段、あるいは管の長手方向に嵌合される軸
受手段などを用いてもよい。又、膜厚計は上記実施形態
の膜厚計27に限定されず、二点調整形電磁式膜厚計で
あればよいことは勿論である。
In the above embodiment, the tube is rotatably supported and rotated by the two rotating rollers, but the rotating support means may not be a rotating roller type. For example, a half-split type bearing means or a bearing means fitted in the longitudinal direction of the pipe may be used. Further, the thickness gauge is not limited to the thickness gauge 27 of the above embodiment, but may be any two-point adjustment type electromagnetic thickness gauge.

【0038】[0038]

【発明の効果】以上、詳細に説明したように、この発明
の膜厚測定方法及び装置では電磁式の膜厚プローブを被
測定面に当接させて膜厚を測定し、その際磁気の影響の
及ばない位置へ膜厚計を離反させて膜厚計への磁気的影
響がない状態で測定精度低下の要因を排除する処理をす
るようにしたから、次々と連続的に管を回転させること
により効率よく膜厚を測定し、かつ磁気撹乱の影響なく
測定できるため各測定位置での測定が高精度で得られる
という効果を奏する。
As described above in detail, in the film thickness measuring method and apparatus according to the present invention, the electromagnetic film thickness probe is brought into contact with the surface to be measured to measure the film thickness. The thickness gauge is moved away from the position where it cannot reach, and processing to eliminate the cause of the decrease in measurement accuracy without magnetic influence on the thickness gauge is performed. As a result, the film thickness can be measured more efficiently and the measurement can be performed without the influence of magnetic disturbance.

【図面の簡単な説明】[Brief description of the drawings]

【図1】鋳鉄管製造ラインの塗膜厚測定装置付近の概略
配置図
FIG. 1 is a schematic layout diagram in the vicinity of a coating film thickness measuring device of a cast iron pipe production line.

【図2】塗膜厚測定装置の平面図及び側面図FIG. 2 is a plan view and a side view of a coating film thickness measuring device.

【図3】図2の矢視III −III からの部分側面図FIG. 3 is a partial side view taken along the line III-III in FIG. 2;

【図4】図3の矢視A−Aからの部分拡大断面図FIG. 4 is a partially enlarged sectional view taken along the line AA in FIG. 3;

【図5】膜厚測定手段の側面図FIG. 5 is a side view of a film thickness measuring means.

【図6】同上の正面図FIG. 6 is a front view of the same.

【図7】同上の拡大斜視図FIG. 7 is an enlarged perspective view of the same.

【図8】膜厚計外形図及びその拡大断面図FIG. 8 is an external view of a film thickness gauge and an enlarged sectional view thereof.

【図9】測定方法の説明図FIG. 9 is an explanatory view of a measuring method.

【図10】測定方法の説明図FIG. 10 is an explanatory diagram of a measuring method.

【符号の説明】[Explanation of symbols]

10 回転支持手段 11 支持台 12 回転ローラ 13 モータ 14 伝達手段 20 膜厚測定手段 21 台車 21b 昇降台 22 膜厚測定ユニット 23 ブラケット 24 昇降ガイド 25 角度調整手段 26 アーム 27 膜厚計 30 膜厚プローブ 31 磁芯 32 コイルケース 33 コイル 34 固定部材 35 上部フランジ 36 端子台 37 弾性部材 38 測定回路 39 スイッチ DESCRIPTION OF SYMBOLS 10 Rotation support means 11 Support stand 12 Rotary roller 13 Motor 14 Transmission means 20 Thickness measuring means 21 Cart 21b Elevating base 22 Thickness measuring unit 23 Bracket 24 Elevating guide 25 Angle adjusting means 26 Arm 27 Thickness gauge 30 Thickness probe 31 Magnetic core 32 Coil case 33 Coil 34 Fixing member 35 Upper flange 36 Terminal block 37 Elastic member 38 Measurement circuit 39 Switch

───────────────────────────────────────────────────── フロントページの続き (72)発明者 劔持 冨紀夫 神奈川県川崎市高津区久末1677番地 株式 会社サンコウ電子研究所内 Fターム(参考) 2F063 AA16 BA30 BB08 BC02 BD01 BD12 BD13 CA08 CA11 DA02 DA05 DD02 DD04 DD06 EB19 GA01 KA01 LA19 ZA03  ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Fumio Tsurugimo 1677 Kusue, Takatsu-ku, Kawasaki-shi, Kanagawa F-term in Sanko Electronic Research Laboratory Co., Ltd. 2F063 AA16 BA30 BB08 BC02 BD01 BD12 BD13 CA08 CA11 DA02 DA05 DD02 DD04 DD06 EB19 GA01 KA01 LA19 ZA03

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 内面に塗装を施された管を回転自在に支
持し、管の端からその長手方向に電磁コイルを有する電
磁式膜厚プローブを備えた膜厚計を所定長さ位置へ挿入
し、膜厚計を管内の被測定面へ移動、当接させて膜厚プ
ローブが検出する磁気的変化から膜厚計で塗装膜厚を測
定する際に、膜厚計で膜厚を測定した後膜厚計を被測定
面から磁気的影響の及ばない所定の距離位置へ離反させ
ると共に、管を次の被測定面位置まで回転させ、その間
に磁気的影響のない状態で膜厚計に対する測定値の精度
を低下させる要因を排除する処理をした後次の膜厚測定
をし、上記測定を繰り返して管内複数箇所の塗装膜厚を
測定する塗装膜厚測定方法。
1. A thickness gauge provided with an electromagnetic thickness probe having an electromagnetic coil in the longitudinal direction thereof is inserted into a predetermined length position from an end of the pipe so as to rotatably support a pipe having an inner surface coated. Then, when moving the film thickness gauge to the surface to be measured in the tube and abutting the film thickness probe to measure the coating film thickness from the magnetic change detected by the film thickness probe, the film thickness was measured by the film thickness meter. After moving the film thickness meter away from the surface to be measured to a predetermined distance that is not magnetically affected, rotate the tube to the next surface to be measured, and then measure the film thickness with no magnetic effect. A coating film thickness measurement method in which the following film thickness measurement is performed after performing a process for eliminating a factor that lowers the value accuracy, and the above measurement is repeated to measure the coating film thickness at a plurality of locations in the pipe.
【請求項2】 前記所定の距離位置を少なくとも10m
m以上としたことを特徴とする請求項1に記載の塗装膜
厚測定方法。
2. The method according to claim 1, wherein the predetermined distance position is at least 10 m.
2. The method according to claim 1, wherein the thickness is at least m.
【請求項3】 前記所定の距離位置を少なくとも20m
m以上としたことを特徴とする請求項2に記載の塗装膜
厚測定方法。
3. The predetermined distance position is at least 20 m.
The coating thickness measuring method according to claim 2, wherein the thickness is not less than m.
【請求項4】 内面に塗装を施された管を回転自在に支
持する回転支持手段と、上記管の長手方向に移動自在な
台車を配置し、この台車上にアームとこのアームを昇降
自在に保持する昇降手段とを設け、アーム先端には電磁
コイルを有する電磁式膜厚プローブを備えた膜厚計を取
付け、膜厚計は管内に挿入した後アームを下降させて膜
厚プローブを被測定面に当接させ、膜厚プローブが検出
する磁気的変化の信号から塗装膜厚を測定するものと
し、膜厚測定後昇降手段のアームを上昇させて膜厚プロ
ーブに対する磁気的影響の及ばない所定の距離位置へ離
反させると共に、回転支持手段により管を次の被測定面
位置まで回転させ、磁気的影響のない状態で膜厚計に対
する測定値の精度を低下させる要因を排除する処理をし
て次の膜厚測定をするように構成した塗装膜厚測定装
置。
4. A rotary support means for rotatably supporting a pipe having an inner surface coated thereon, and a truck movable in a longitudinal direction of the pipe, and an arm and an arm which can be moved up and down on the cart. A lifting and lowering means for holding is provided, and a film thickness meter equipped with an electromagnetic film thickness probe with an electromagnetic coil is attached to the tip of the arm. The film thickness meter is inserted into the tube and the arm is lowered to measure the film thickness probe The coating thickness is measured from the signal of the magnetic change detected by the film thickness probe, and the arm of the elevating means is raised after the film thickness measurement, so that the magnetic effect is not exerted on the film thickness probe. At the same time, and rotate the tube to the next surface to be measured by the rotation support means, and remove the factor that reduces the accuracy of the measurement value for the film thickness meter without magnetic influence. Take the next film thickness measurement Coating thickness measuring device configured as described above.
【請求項5】 前記昇降手段が、移動自在な台車を形成
する固定台車に対して昇降自在に設けた昇降台車と、こ
の昇降台車上に設けられたアームを昇降自在とするアー
ム昇降ユニットとから成り、アームの昇降量を昇降台車
とアーム昇降ユニットにより調整するように構成されて
いることを特徴とする請求項4に記載の塗装膜厚測定装
置。
5. An elevating truck, wherein said elevating means is provided so as to be able to ascend and descend with respect to a fixed bogie which forms a movable bogie, and an arm elevating unit which makes an arm provided on said elevating cart capable of ascending and descending. 5. The coating film thickness measuring apparatus according to claim 4, wherein the lifting amount of the arm is adjusted by a lifting carriage and an arm lifting unit.
JP2000291937A 2000-09-26 2000-09-26 Paint film thickness measuring method and device Expired - Fee Related JP3418166B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000291937A JP3418166B2 (en) 2000-09-26 2000-09-26 Paint film thickness measuring method and device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000291937A JP3418166B2 (en) 2000-09-26 2000-09-26 Paint film thickness measuring method and device

Publications (2)

Publication Number Publication Date
JP2002098505A true JP2002098505A (en) 2002-04-05
JP3418166B2 JP3418166B2 (en) 2003-06-16

Family

ID=18774947

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
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Cited By (8)

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Publication number Priority date Publication date Assignee Title
US8259342B2 (en) 2005-07-04 2012-09-04 International Business Machines Corporation System, method and program for generating data for printing invisible information, and method of manufacturing physical medium whereupon invisible information is printed
US8659787B2 (en) 2005-07-04 2014-02-25 International Business Machines Corporation Manufacturing a physical medium configured to store data and obtaining additional information associated with an article in a book
US9001389B2 (en) 2005-07-04 2015-04-07 International Business Machines Corporation Manufacturing a physical medium configured to store data
US9230201B2 (en) 2005-07-04 2016-01-05 International Business Machines Corporation Computer system for manufacturing a physical medium configured to store data
US9454722B2 (en) 2005-07-04 2016-09-27 International Business Machines Corporation Manufacturing a physical medium configured to store data
US7520443B2 (en) 2005-12-16 2009-04-21 International Business Machines Corporation System, method, and program for extracting invisible information
CN109798859A (en) * 2019-04-02 2019-05-24 福建远创喷码系统科技有限公司 A kind of steel pipe automatic measurement system and steel pipe measurement method
CN109798859B (en) * 2019-04-02 2023-05-26 福建远创喷码系统科技有限公司 Automatic steel pipe measuring system and steel pipe measuring method

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