JP2002064041A - Method and device for sorting capacitor - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a method and device for sorting capacitor by which the product sorting costs of capacitors can be reduced. SOLUTION: The device for sorting capacitor comprises an aligning and supplying section 11 which supplies capacitors in an aligned state, a characteristic measuring sections 12 which measures the items to be measured, such as the capacitances, etc., of the capacitors, and a characteristic sorting section 13 which sorts the capacitors into nondefective capacitors and defective capacitors based on the measured results of the measuring section 12. The device also comprises a temperature measuring instrument 21 which measures the temperatures of the capacitors before characteristic measurement, an arithmetic processor 22, a storage device 23, and an output device 24. The sorting threshold of each item to be measured is set by finding a target center value corresponding to the temperatures of the capacitors, and the capacitors are sorted based on the sorting threshold.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

The present invention relates to a method and apparatus for selecting a capacitor.

[0002]

2. Description of the Related Art In recent years, with the spread of portable devices such as personal computers and mobile phones, the demand for electronic components used in the devices has been rapidly expanding. In addition to the automation of the manufacturing process, the inspection and sorting processes have been automated, and the processes from the production of electronic components to inspection and sorting have been rationalized.

For example, in the case of a capacitor, a product sent from a manufacturing process is inspected in a sorting process to determine whether capacitance, dielectric loss, insulation resistance and the like are within predetermined deviations. Automatically sorts out defective products and products.

FIG. 9 shows an example of such a conventional capacitor sorting apparatus. The capacitor selection device 30 includes an alignment supply unit 31 that aligns and supplies manufactured capacitors, and a characteristic measurement unit 32 that measures capacitance, dielectric loss, insulation resistance, and the like of the capacitor supplied from the alignment supply unit 31. A meter 3 for determining whether or not the measured value measured by the characteristic measuring unit 32 is within a predetermined allowable error range set in advance.
3, a characteristic selection unit 34 for selecting good or defective products based on the determination result of the meter 33.

[0005] Since the values of the capacitance, dielectric loss, insulation resistance and the like of a capacitor generally vary with temperature, the alignment supply unit 31, the characteristic measurement unit 32, and the meter 3
3 and the characteristic selection unit 34 are arranged in a dedicated booth 35 strictly controlled so that the internal temperature becomes a specified temperature, or a dedicated room strictly controlled to a specified temperature by a dedicated air conditioner. To be installed together.

[0006]

As described above, the conventional condenser sorting apparatus 30 requires a dedicated booth 35 whose temperature is strictly controlled, a dedicated room, and its air conditioning equipment, so that product inspection and inspection can be performed. There is a problem that the equipment cost for sorting and the operation cost for maintenance and management thereof increase, and accordingly, the unit price of the product also increases, and the rationalization does not proceed.

It is an object of the present invention to provide a capacitor sorting method and a capacitor sorting apparatus which can reduce the cost of sorting products.

[0008]

In order to achieve the above object, a method for selecting a capacitor according to the present invention comprises the steps of (a)
Measuring the temperature of the capacitor to be sorted, the temperature of a measuring terminal for measuring predetermined electrical characteristics of the capacitor to be sorted, or any one of the temperatures near the measuring terminal;
(B) setting a selection threshold value of a predetermined electrical characteristic of the selected capacitor based on the temperature characteristic data of the capacitor and the measured temperature; and (c) setting a predetermined electric characteristic of the selected capacitor. Measuring the properties; and (d)
Comparing the measured numerical value of the electrical characteristic of the selected capacitor with the selection threshold to select the selected capacitor.

Here, it is preferable that the temperature is measured before measuring predetermined electrical characteristics of the capacitors to be sorted or while measuring predetermined electrical characteristics of the capacitors to be sorted. The predetermined electrical characteristics of the capacitors to be sorted include capacitance characteristics, dielectric loss characteristics, and insulation resistance characteristics.

According to the above method, a selection threshold is set based on the measured temperature and the temperature characteristic data of the capacitor, and the capacitor is selected based on the set selection threshold. This eliminates the need for a dedicated booth, room and dedicated air conditioning equipment whose temperature is strictly controlled.

Further, the temperature is constantly measured, and a selection threshold value is set in real time according to the measured temperature, or the temperature is measured at predetermined intervals, and the measured temperature is measured. The selection threshold may be set at predetermined intervals according to the temperature. As a result, the timing of updating the selection threshold can be appropriately selected.

Further, the capacitor sorting apparatus according to the present invention may further comprise: (e) one of a temperature of the capacitor to be sorted, a temperature of a measuring terminal for measuring predetermined electrical characteristics of the capacitor to be sorted, and a temperature near the measuring terminal. A temperature measuring device for measuring one temperature, (f) a storage device for previously storing temperature characteristic data of the capacitor, and (g) a temperature characteristic data of the capacitor and the temperature measured by the temperature measuring device. Based on, an arithmetic processing device that automatically sets a selection threshold of a predetermined electrical characteristic of the selected capacitor,
(H) an electric characteristic measuring unit for measuring predetermined electric characteristics of the selected capacitor; and (i) a selection of the selected capacitor based on a comparison between a measured value of the electric characteristic of the selected capacitor and the selection threshold. A characteristic selection unit for selecting a capacitor.

With the above arrangement, the selection threshold value is automatically set, and the selection threshold value is automatically corrected based on the change in the measured temperature, so that the manual setting and correction work of the selection threshold value becomes unnecessary. . Further, if a non-contact type thermometer is used as the temperature measuring device, the degree of freedom of the installation position of the thermometer is increased, and the temperature measurement becomes simple and reliable. Further, by gradually shifting the selection threshold value by a preset width with respect to the measured temperature, the update of the selection threshold value is simplified, and the software of the arithmetic processing device is also simplified. Become.

[0014]

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a perspective view showing a first embodiment of a capacitor selecting method and a capacitor selecting apparatus according to the present invention;

[First Embodiment, FIGS. 1 to 5] FIG. 1 shows the configuration of one embodiment of a capacitor sorting apparatus according to the present invention. The capacitor selection device 10 measures an alignment supply unit 11 that supplies manufactured capacitors in an aligned manner, and measurement items such as capacitance, dielectric loss, and insulation resistance of the capacitor supplied from the alignment supply unit 11. Characteristic measurement unit 12
A characteristic selecting unit 13 for selecting a capacitor as a defective product or a product (non-defective product) based on the measurement result measured by the characteristic measuring unit 12, and a temperature measuring device 2 for measuring the temperature of the capacitor
1, an arithmetic processing unit 22, a storage device 23 such as a hard disk, and an output device 24 such as a meter, a printer, and a CRT display.

As the temperature measuring device 21, for example, a contact-type temperature sensor using a thermocouple or a non-contact-type temperature sensor such as an infrared radiation thermometer for converting infrared intensity into temperature can be used. The temperature sensor is selected from among the temperature sensors in consideration of the responsiveness to the temperature, restrictions on the installation space, and the like.

FIG. 2 shows an example of the arrangement of the temperature measuring device 21. FIG. 2 shows a contact-type temperature measuring device 2 using a thermocouple 21a.
1 is shown. The temperature measuring device 21 is arranged in a parts feeder (alignment supply unit) 11 that aligns the capacitors w to be sorted by vibration. Then, the tip of the thermocouple 21a is arranged in the mountain of the selected capacitor w in the parts feeder 11 so as not to hinder the conveyance of the selected capacitor w, and the temperature of the selected capacitor w is measured. The temperature data measured by the temperature measuring device 21 is read into the arithmetic processing unit 22 in FIG.

As described above, the capacitance, dielectric loss, insulation resistance, and the like of a capacitor change with temperature. For this reason, in the present embodiment, the temperature of the selected capacitor w is measured as described above, and based on the result,
The selection threshold value is set with reference to the capacitor temperature characteristic data stored in the storage device 23 in advance.

Here, the temperature characteristic data stored in the storage device 23 is obtained as follows. That is,
Extracting, for example, 50-100 samples from the product,
For each sample, measure the temperature characteristics of capacitance, temperature characteristics of dielectric loss, and temperature characteristics of insulation resistance.
The measurement result is statistically processed. FIG. 3 shows an example of the temperature characteristic curve L1 of the capacitance obtained by this statistical processing.

Next, based on the temperature characteristic curve L1,
Determine the target center value for each temperature. For example, the curve L1
Thus, when the temperature is t1 ° C., the target center value of the capacitance is C1, and when the temperature is t2 ° C., the target center value is C1.
Let it be 2. In this way, the target center value of the capacitance corresponding to each temperature is obtained over the normal temperature range (about 5 to 35 ° C.) and stored in the storage device 23 as temperature characteristic data.

Further, the values of the coefficients α and β for calculating the selection threshold are also stored in the storage device 23 as temperature characteristic data. The coefficients α and β are determined by the specifications of the capacitors to be sorted, and are expressed in percentage (%). Then, when the target center value of the capacitance is C, the upper and lower selection thresholds Ca and Cb are calculated by the following equations (1) and (2) using the coefficients α and β. You. Ca = C × (1 + α) (1) Cb = C × (1-β) (2)

Similarly, for the dielectric loss and the insulation resistance, the storage unit 23 stores the target center value for each temperature and the coefficient for calculating the selection threshold value as temperature characteristic data.

The arithmetic processing unit 22 includes the temperature measuring device 2
The temperature data of the selected capacitor w output from 1 is read at a predetermined timing set in advance. The arithmetic processing unit 22 sorts each of the temperature characteristic data of the capacitance, the temperature characteristic data of the dielectric loss, and the temperature characteristic data of the insulation resistance from the target center value corresponding to the read temperature of the selected capacitor w. A coefficient for calculating the threshold value is called from the storage device. Then, using the called target center value and coefficient, the upper and lower selection thresholds are calculated from the above equations (1) and (2),
Set the value automatically. For example, when the measured temperature of the selected capacitor w is t1 ° C., the target center value of the capacitance is C1, and the upper limit selection threshold is Ca.
= C1 × (1 + α), and the lower limit selection threshold is Cb
= C1 × (1−β) (see FIG. 3).

On the other hand, the capacitance, dielectric loss, and insulation resistance of the selected capacitor w are measured by the characteristic measuring unit 12, and the measured values are read into the arithmetic processing unit 22. The arithmetic processing unit 22 determines whether each numerical value measured by the characteristic measurement unit 12 is within the range of the calculated upper and lower selection thresholds, and transmits the determination result to the characteristic selection unit 13. I do. Based on the determination result, the characteristic selection unit 13 sets the selected capacitor w whose measured numerical value is within the range of the selection threshold as a product (non-defective product), and excludes other capacitors as defective products.

The timing of reading the temperature of the selected capacitor w and the interval thereof are determined in consideration of a change state of the ambient temperature surrounding the selected capacitor w supplied to the characteristic measuring unit 12. For example, the temperature may be constantly measured, and the selection threshold may be set in real time according to the measured temperature. Alternatively, the temperature may be measured at an arbitrarily set number or span within an arbitrarily set number of sorting processes or processing time. For example,
The temperature of the capacitor is measured every 10,000 while selecting 100,000 capacitors, or the temperature of the capacitor is measured every 10 minutes while the capacitor selecting device is operated for one hour. In addition, there is no need to divide the measurement time and the number of measurement processes equally,
For example, the temperature of the capacitor may be measured ten times per minute while the capacitor selection device operates for one hour.

Next, with respect to the obtained measured temperature data,
Statistical processing such as averaging and averaging of the remaining data excluding the maximum and minimum values is performed. Statistical value is treated as a representative value within the number of sorting processes or processing time arbitrarily set,
The setting of the selection threshold is updated based on the statistical value.
Therefore, in this case, the setting of the sorting threshold is updated every arbitrarily set sorting process number or processing time. By the statistical processing of the measured temperature data, the accuracy of the selection threshold value is increased, and more accurate selection can be performed.

When obtaining the temperature characteristic data, as shown in FIG. 4, the target center value may be determined every time the temperature changes by, for example, 5 ° C. based on the temperature characteristic curve L1. . In FIG. 4, when the temperature is 15 ° C. or more and less than 20 ° C., the target center value of the capacitance is C1, and when the temperature is 20 ° C. or more and less than 25 ° C., the target center value is C2.
And Thereby, when the measured temperature of the selected capacitor w is in the range of, for example, 20 ° C. or more and less than 25 ° C.
Since the target center value of the capacitance is C2, the upper limit selection threshold value is Ca = C2 × (1 + α), and the lower limit selection threshold value is Cb = C2 × (1−β). In this way, the selection threshold may be shifted stepwise.

Alternatively, as shown in FIG. 5, when the gradient of the temperature characteristic is different between the high temperature side and the low temperature side, the step width may be changed stepwise according to the temperature range. In other words, the step width is increased in an area where the change is small, and the step width is narrowed in an area where the change is large. As described above, if the selection threshold value is shifted stepwise by a predetermined width with respect to the measured temperature data, the setting and calculation of the selection threshold value is simplified, and the calculation required for it is performed. The software such as the processing device 22 is simplified, and the reliability is improved.

In the capacitor selection device 10 having such a configuration, each of the temperature characteristics of the capacitance, the temperature characteristics of the dielectric loss, and the temperature characteristics of the insulation resistance correspond to the temperature data of the selected capacitor w. Set (update) each sorting threshold from the target center value to be
The selected capacitor w is selected based on the set selection threshold. Therefore, unlike the conventional condenser sorting apparatus 30 (see FIG. 9), a dedicated booth 35 whose temperature is strictly controlled, a room and a dedicated air-conditioning facility are not required, and equipment costs for product inspection and sorting are reduced. The operation cost for the maintenance can be reduced, and the unit price of the product can be significantly reduced accordingly.

In addition, it is possible to select the capacitors without being affected by the ambient temperature, and it is sufficient to take a measure for simple thermal cutoff even if it is connected to a process having a heat source before and after. Becomes larger. Further, according to the above configuration, the selection threshold is automatically set, and the selection threshold is automatically set according to the change in the measured temperature, so that the setting and updating of the selection threshold by manual operation is unnecessary, The sorting process can be automated.

[Second Embodiment, FIGS. 6 to 8] FIG. 6 shows the configuration of another embodiment of the capacitor selection device according to the present invention. The capacitor selection device 10a is shown in FIGS.
In the capacitor sorting apparatus 10 of the first embodiment described with reference to FIG. 7, the temperature measuring device 21 is arranged as shown in FIG. 7 or FIG. 8 so that the temperature of the capacitor w to be sorted is indirectly measured. . That is, in the configuration shown in FIG. 7, the characteristic measuring section 12 includes a fixed measuring terminal T1 and a measuring terminal T2 with a spring. And the temperature measuring device 21
Thermocouple 21a contacts the mechanical component 26 supporting the measuring terminal T1, and the temperature of the mechanical component 26 (in other words, the temperature near the measuring terminal T1, and thus the measuring terminal T1
May be used instead of the temperature of the capacitor w to be sorted.

FIG. 8 shows a characteristic measuring section 1.
2 has a pair of measurement terminals T1 and T2 arranged in parallel. The selected capacitors w are arranged in alignment with the tape-shaped transfer holder 27, and their lead terminals are taped. On the other hand, the temperature measuring device 21 uses an infrared radiation thermometer, and measures the temperature of the measuring terminals T1 and T2 instead of the temperature of the capacitor w to be sorted. In FIG. 6, parts corresponding to those in FIG. 1 are denoted by corresponding reference numerals, and redundant description will be omitted.

With such a configuration, the temperature can be measured while measuring the electrical characteristics of the selected capacitor w, so that the selection threshold is set in real time according to the measured temperature. And more accurate sorting becomes possible. Further, there is no need to directly contact the temperature measuring device 21 with the selected capacitor w to measure the temperature, and the degree of freedom in installing the temperature measuring device 21 is increased.
Accordingly, the degree of freedom in designing the capacitor sorting device 10a is increased, and the miniaturization of the capacitor sorting device 10a is facilitated.

[Other Embodiments] The present invention is not limited to the above embodiment, but can be variously modified within the scope of the gist. For example, in the first and second embodiments, a dedicated computer system can be adopted, but a commercially available inexpensive personal computer can also be used.

[0035]

As is apparent from the above description, according to the present invention, the selection threshold is set based on the measured temperature of the capacitor to be selected and the temperature characteristic data of the capacitor. Since the capacitors are sorted based on the selected sorting threshold, there is no need for a dedicated booth, room or dedicated air-conditioning equipment whose temperature is strictly controlled, and equipment costs for product inspection and sorting are eliminated. In addition, the operating costs for maintenance and management can be reduced, and the unit price of products can be significantly reduced accordingly.

[Brief description of the drawings]

FIG. 1 is a schematic configuration diagram showing a first embodiment of a capacitor sorting device according to the present invention.

FIG. 2 is a perspective view showing an arrangement example of the temperature measuring device shown in FIG.

FIG. 3 is a graph showing a temperature characteristic of capacitance of a capacitor and a setting of a selection threshold.

FIG. 4 is a graph showing a modified example of setting a selection threshold.

FIG. 5 is a graph showing a modification of another selection threshold setting.

FIG. 6 is a schematic configuration diagram showing a second embodiment of the capacitor sorting device according to the present invention.

FIG. 7 is a plan view showing an arrangement example of the temperature measuring device shown in FIG. 6;

FIG. 8 is a plan view showing another arrangement example of the temperature measuring device shown in FIG. 6;

FIG. 9 is a schematic configuration diagram showing a conventional capacitor selection device.

[Explanation of symbols]

 10, 10a: Capacitor sorting device 11: Arrangement supply unit 12: Characteristic measuring unit 13: Property selecting unit 21: Temperature measuring device 22: Arithmetic processing unit 23: Storage device 24: Output device w: Capacitors to be selected T1, T2: Measurement Terminal

Claims (10)

[Claims] 1. A step of measuring a temperature of a capacitor to be selected, and a step of setting a selection threshold of predetermined electrical characteristics of the capacitor to be selected based on temperature characteristic data of the capacitor and the measured temperature. Measuring the predetermined electrical characteristics of the selected capacitors, and selecting the selected capacitors based on a comparison between the measured numerical value of the electrical characteristics of the selected capacitors and the selection threshold, A method for selecting a capacitor, comprising: A step of measuring one of a temperature of a measuring terminal for measuring predetermined electrical characteristics of the selected capacitor and a temperature in the vicinity of the measuring terminal; and measuring temperature characteristics data of the capacitor. Based on the temperature, a step of setting a selection threshold of a predetermined electrical characteristic of the capacitor to be selected; a step of measuring a predetermined electrical characteristic of the capacitor to be selected; A step of selecting the capacitors to be selected based on a comparison between a measured value and the selection threshold value. 3. The method according to claim 1, wherein the temperature is measured before measuring predetermined electrical characteristics of the capacitors to be selected. 4. The method according to claim 1, wherein the temperature is measured while measuring predetermined electrical characteristics of the capacitors to be selected. 5. The method according to claim 1, wherein the temperature is measured by a non-contact type thermometer. 6. The method according to claim 1, wherein the temperature is constantly measured, and the selection threshold is set in real time according to the measured temperature. 7. The temperature measurement is performed at predetermined intervals,
6. The method according to claim 1, wherein the selection threshold value is set at predetermined intervals according to the measured temperature. 8. The capacitor selection method according to claim 1, wherein the selection threshold is shifted stepwise by a predetermined width with respect to the measured temperature. 9. The method according to claim 1, wherein the predetermined electrical characteristic of the selected capacitor is at least one of a capacitance characteristic, a dielectric loss characteristic and an insulation resistance characteristic. Capacitor sorting method. 10. A temperature measuring device for measuring any one of a temperature of a selected capacitor, a temperature of a measuring terminal for measuring predetermined electrical characteristics of the selected capacitor, and a temperature near the measuring terminal, and a capacitor. A storage device for storing the temperature characteristic data of the capacitor in advance, and a selection threshold value of a predetermined electrical characteristic of the selected capacitor based on the temperature characteristic data of the capacitor and the temperature measured by the temperature measuring device. An arithmetic processing device that automatically sets a, an electric characteristic measuring unit that measures a predetermined electric characteristic of the selected capacitor, and a comparison between the measured numerical value of the electric characteristic of the selected capacitor and the selection threshold, And a characteristic selection unit for selecting the capacitors to be sorted.