JP2002040383A - Inspection tool for liquid crystal display device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an inspection tool capable of easily detecting common short-circuit in the liquid crystal cell inspection process or module inspection process of a liquid crystal display device. SOLUTION: When a transparent surface pressing part 18 is pressed to the surface of a liquid crystal cell 12 and a holding part 14 is pressurized against the energizing force of a coil spring 20, the surface pressing part 18 pressurizes the surface of the liquid crystal cell 12 by fixed weight and the common short- circuit is detected.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection tool used for inspecting a short circuit between an array substrate and a counter substrate in a liquid crystal cell inspection process or a module inspection process of a liquid crystal display device.

[0002]

2. Description of the Related Art After a liquid crystal cell is completed by combining an array substrate and a counter substrate, an inspection process for inspecting a common short circuit caused by conductive foreign matter between the array substrate and the counter substrate of the liquid crystal cell is performed. It is included in the liquid crystal cell inspection process.

In this case, the conventional inspection method performs an inspection by pressing the display surface of the liquid crystal cell with a human finger in a state where the liquid crystal cell is driven and lit, and when a bright spot occurs, a short circuit occurs. Was determined to be.

Further, a drive circuit and the like are attached to the liquid crystal cell,
In the module as the final product, the inspection was also performed by pressing the display surface using a cylindrical roller while the module was driven and lit, and if a bright spot occurred, it was determined that there was a defect. .

[0005]

However, in the inspection with a finger in the liquid crystal cell inspection process, there is a problem that the entire display surface cannot be pressed and the detection power is low.

[0006] Further, there is a problem that a stable inspection cannot be performed because the pressing force varies from person to person.

In the inspection using a roller in the module inspection process, a large local weight is applied to the display surface, so that the spacers inside the liquid crystal cell impact the alignment film, and a large stress is applied to the inspection probe of the cell final inspection device. And break it.

In view of the above problems, the present invention provides an inspection tool capable of easily detecting a common short in a liquid crystal cell inspection step or a module inspection step of a liquid crystal display device.

[0009]

According to the first aspect of the present invention, there is provided an inspection tool for a liquid crystal display device used in a liquid crystal cell inspection process or a module inspection process of a liquid crystal display device, the tool being held by an operator. A grip portion, a protruding portion that protrudes from the grip portion and can be pressed at a constant pressure in a protruding direction, and a surface pressing portion that is attached to a tip of the protruding portion and that is formed of a transparent plate that presses a display surface of the liquid crystal display device. And an inspection tool for a liquid crystal display device.

According to a second aspect of the present invention, a coil spring is built in the holding portion, and the coil spring urges the projecting portion at a constant pressure.
An inspection tool for the liquid crystal display device described in the above.

According to the inspection tool for a liquid crystal display device of the present invention, when the surface pressing portion is applied to the display surface of the liquid crystal cell of the liquid crystal display device and the operator presses the grip portion in the protruding direction, the surface pressing portion becomes constant. Press the display surface with pressure. This makes it possible to detect a common short between the array substrate of the liquid crystal cell and the opposing substrate.

[0012]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An inspection tool 10 according to one embodiment of the present invention will be described below with reference to FIGS.

FIG. 1 shows a state in which the inspection tool of the inspection tool 10 is pressed against the liquid crystal cell 12. FIG. 2 is a plan view thereof.

First, the structure of the inspection tool 10 will be described.

The inspection tool 10 has a cylindrical grip 14 for the operator to hold by hand, a protruding shaft 16 protruding from the lower surface of the grip 14, and a transparent shaft attached to the tip of the protruding shaft 16. It comprises a surface pressing portion 18 made of a plate.

A coil spring 2 is provided inside the holding portion 14.
0, which urges the protruding shaft 16 downward at a constant pressure in FIG.

The inspection tool 10 includes a coil spring 2
1, the surface pressing portion 18 is constantly urged downward in FIG. 1. Therefore, the surface pressing portion 18 is placed on the surface of the liquid crystal cell 12, and the operator presses the holding portion 14 to apply the urging force of the coil spring 20. When pressed, the surface pressing unit 18 can press the display surface of the liquid crystal cell 12 with a constant pressure.

This pressing force is applied to the coil spring 20.
Can be adjusted by adjusting the tension.

An inspection for detecting a common short between the array substrate 22 and the opposing substrate 24 in the cell inspection process of the liquid crystal cell 12 using the inspection tool 10 having the above configuration will be described.

The liquid crystal cell 12 is connected to an inspection probe (not shown) of a cell end checker and is driven and lit. That is, the liquid crystal cell 12 displays a normally white black screen.

In this state, the array substrate 22 and the opposing substrate 2
If there is a conductive foreign substance between the light emitting element and the light emitting element 4, a bright spot or a bright line will be generated. That is, this state is a common short. In order to detect this state, the surface pressing portion 18 of the inspection tool 10 is pressed against the surface of the liquid crystal cell 12 and the holding portion 14 is pressed.
Until it comes into contact with the surface pressing portion 18. In this case,
As described above, the surface pressing portion 18 always presses the display surface of the liquid crystal cell 12 with the same pressure by the urging force of the coil spring 20.

When there is the above-mentioned common short, a bright spot or a bright line is generated. If there is no common short, the screen is black.

If the size of the surface pressing portion 18 is set to about half the size of the liquid crystal cell 12 to be inspected, the inspection step of pressing one liquid crystal cell 12 twice may be completed. it can. Since the pressed surface 18 is transparent, even if there is a bright point or a bright line, the pressed surface can be found immediately.

By using the inspection tool 10 described above, the surface of the liquid crystal cell 12 can be pressed over a wide area at a time, so that the workability is high and the inspection is not performed as compared with the case where the inspection is performed by pushing with a finger. The area is much smaller. In addition, the coil spring 20 is built in the grip portion 14, so that any worker can press the surface of the liquid crystal cell 12 with the same pressure. Further, the surface pressing portion 18 is flat and the liquid crystal cell 1
Since the surface of No. 2 is pressed, the load per unit area becomes very small. As a result, the alignment film is not damaged by the spacer, and the test probe of the cell final inspection machine is not stressed or broken.

In the above embodiment, the inspection tool 10 is used in the cell inspection step of the liquid crystal cell 12, but the invention is not limited to this, and the inspection tool 10 can be used in the common short inspection in the module inspection step.

[0026]

As described above, according to the present invention, the workability is high because the surface of the liquid crystal cell can be pressed over a wide range at a time.
Further, the surface of the liquid crystal cell can be pressed with the same weight. Further, since the weight per unit area is very small, the liquid crystal cell is not broken.

[Brief description of the drawings]

FIG. 1 is a side view showing a state where a liquid crystal cell is pressed by an inspection tool.

FIG. 2 is a plan view of the same.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 10 Inspection tool 12 Liquid crystal cell 14 Grasping part 16 Protruding axis 18 Face pressing part 20 Coil spring 22 Array board 24 Opposite board

Claims (2)

[Claims] An inspection tool for a liquid crystal display device used in a liquid crystal cell inspection process or a module inspection process of a liquid crystal display device, comprising: a grip portion to be held by an operator's hand; A liquid crystal display device, comprising: a protrusion that can be pressed at a constant pressure in a direction; Inspection tools. 2. The inspection tool for a liquid crystal display device according to claim 1, wherein a coil spring is built in the grip portion, and the coil spring urges the projection with a constant pressure.