JP2002039953A - Glass substrate for storage medium and method and apparatus for detecting defect of glass vessel - Google Patents

Glass substrate for storage medium and method and apparatus for detecting defect of glass vessel

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Publication number
JP2002039953A
JP2002039953A JP2000220001A JP2000220001A JP2002039953A JP 2002039953 A JP2002039953 A JP 2002039953A JP 2000220001 A JP2000220001 A JP 2000220001A JP 2000220001 A JP2000220001 A JP 2000220001A JP 2002039953 A JP2002039953 A JP 2002039953A
Authority
JP
Japan
Prior art keywords
glass
light
glass substrate
defect
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000220001A
Other languages
Japanese (ja)
Other versions
JP3406578B2 (en
Inventor
Yoshio Yamaguchi
芳生 山口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyo Glass Co Ltd
Original Assignee
Toyo Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyo Glass Co Ltd filed Critical Toyo Glass Co Ltd
Priority to JP2000220001A priority Critical patent/JP3406578B2/en
Publication of JP2002039953A publication Critical patent/JP2002039953A/en
Application granted granted Critical
Publication of JP3406578B2 publication Critical patent/JP3406578B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PROBLEM TO BE SOLVED: To detect a defect in a glass or on the surface thereof stably with high accuracy regardless of dust on the glass surface without requiring a clean room. SOLUTION: Light is projected to the outer circumferential side face of a glass substrate or the end face at the mouth of a glass vessel and a component of the light diffuse reflected at a defect in the glass substrate or on the surface thereof and outgoing therefrom is detected thus detecting a defect of the glass substrate. Light can impinge on the outer circumferential side face or the end face at the mouth without striking the glass surface when a holder matching the shape of the glass substrate or the glass vessel under inspection is employed.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明が属する技術分野】本発明は、記憶媒体用ガラス
基板、並びに、ガラスびん、ガラス食器などのガラス容
器のガラス内部の泡、異物、シャーマーク(ガラスを切
断したときに発生する泡の連なり)、ガラス表面の傷な
どの欠点を検出する方法及び装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a glass substrate for a storage medium and bubbles, foreign matters, and shear marks (a series of bubbles generated when glass is cut) in a glass container such as a glass bottle and a glass tableware. ), A method and an apparatus for detecting defects such as scratches on the glass surface.

【0002】[0002]

【従来の技術】記憶媒体用ガラス基板では、クリーンル
ーム内で目視により検査を行っている。すなわち、ガラ
ス基板の表面に光を当ててキラッと光ったら不良品とい
う選別方法である。
2. Description of the Related Art A glass substrate for a storage medium is visually inspected in a clean room. In other words, this method is a method of selecting defective products when the surface of the glass substrate is illuminated by light.

【0003】びん、食器などの容器では、ガラス表面に
光を当てて透過光量を調べ、欠点があるところでは光が
遮光又は散乱されて透過光量が少なくなるので、これを
検出する方法、あるいは、反射光量を調べ、欠点がある
ところでは当該部分の反射光量が強くなるので、これを
検出する方法がある。
In containers such as bottles and tableware, the amount of transmitted light is checked by irradiating the glass surface with light, and where there is a defect, the light is blocked or scattered to reduce the amount of transmitted light. There is a method of examining the amount of reflected light, and detecting the reflected light amount where there is a defect, because the amount of reflected light at that portion increases.

【0004】[0004]

【発明が解決しようとする課題】上記従来の記録媒体用
ガラス基板の検出方法は、ガラス基板表面にチリ、ほこ
り、汚れが少しでも付着していると、当該部分が光って
しまうので、ガラス基板の表面のチリ、ほこり、汚れが
全くなくなるように処理することが不可欠であり、ま
た、クリーンルームを必要とするので、たいへんな設備
費やランニングコストがかかっていた。また、ガラスに
光を当てる際は、光を当てる角度によって検出精度が変
わるので、試行錯誤して光の当て方を調整しなければな
らい。さらに、検査員の個人差によって検出精度が変わ
るので、安定した検査ができないという問題がある。
According to the above-mentioned conventional method for detecting a glass substrate for a recording medium, if any dust, dirt or dirt adheres to the surface of the glass substrate, the portion shines. It is indispensable to remove the dust, dirt and dirt on the surface of the surface, and a clean room is required. In addition, when light is applied to the glass, the detection accuracy changes depending on the angle at which the light is applied, so that the method of applying the light must be adjusted by trial and error. Furthermore, since the detection accuracy changes depending on the individual difference of the inspector, there is a problem that stable inspection cannot be performed.

【0005】上記従来のガラス容器の検査方法は、ガラ
ス表面に付着しているチリ、ほこり、汚れなどがノイズ
となるので、現実には0.2mm以下の大きさの欠点の
検出はたいへん難しいという問題がある。
In the above-described conventional method for inspecting a glass container, dust, dirt, dirt, and the like adhering to the glass surface cause noise, so that it is actually very difficult to detect a defect having a size of 0.2 mm or less. There's a problem.

【0006】本発明は、ガラス表面のチリ・ほこりに影
響されず、クリーンルームも必要とせず、安定した高精
度でガラス内部又は表面の欠点を検出できるようにする
ことを課題としてなされたものである。
An object of the present invention is to make it possible to detect a defect inside or on the surface of glass with high accuracy in a stable manner without being affected by dust and dirt on the glass surface and without requiring a clean room. .

【0007】[0007]

【課題を解決するための手段】本発明は、ガラス基板の
外周側面に光を入射させ、その光のうちの、該ガラス基
板の内部又は表面の欠点で乱反射し、該ガラス基板の表
面から出てくる光を検出することで、ガラス基板の欠点
を検出することを特徴とする記憶媒体用ガラス基板の欠
点検出方法である。
According to the present invention, light is incident on the outer peripheral side surface of a glass substrate, and the light is irregularly reflected by a defect inside or on the surface of the glass substrate, and the light exits from the surface of the glass substrate. This is a method for detecting a defect of a glass substrate for a storage medium, wherein a defect of the glass substrate is detected by detecting incoming light.

【0008】また、本発明は、光源と、ガラス基板の外
周側面を包み込んで光源からの光が該ガラス基板の外周
側面以外に照射されるのを防止するホルダーとを有する
ことを特徴とする記憶媒体用ガラス基板の欠点検出装置
である。
According to another aspect of the present invention, there is provided a storage device comprising: a light source; and a holder which wraps the outer peripheral side surface of the glass substrate and prevents light from the light source from being irradiated to the outer peripheral side surface of the glass substrate. This is a device for detecting a defect of a glass substrate for a medium.

【0009】図4に示すように、光をガラス基板2の表
面に当てるのではなく、ホルダー4を介してガラス基板
表面には当たらないように横から(外周側面2aから)
ガラス内へ入射させる。ホルダー4の長さを適当な長さ
以上にすれば、レーザーシート光源や凹面鏡を背後に置
くタイプの厳密な平行光源でなくとも、投光器などを光
源として使用することができる。ガラス内に入射した光
は、矢印で示すように、ガラスの界面で全反射しなが
ら、ガラス内を反対側の外周側面に向かって進行する。
ガラスに欠点11(泡、異物、シャーマークなど)があ
ると、光は乱反射してガラス基板の表面からガラスの外
へ出てくる。ガラス表面には光を当てていないので、欠
点で乱反射して表面から出てくる光は明確に検出するこ
とができる。したがって、小さな欠点も見逃すことな
く、安定した検出が可能となる。シャーマークの位置や
大きさも明確に認識できる。また、表面に光を当てない
ので、ある程度のチリ・ほこりが表面に付着していても
差し支えなく、クリーンルームも必要ない。
As shown in FIG. 4, light is not applied to the surface of the glass substrate 2 but from the side (from the outer peripheral side surface 2a) so as not to impinge on the surface of the glass substrate via the holder 4.
Inject into glass. If the length of the holder 4 is set to an appropriate length or more, a light projector or the like can be used as a light source without using a strict parallel light source of a type in which a laser sheet light source or a concave mirror is placed behind. The light that has entered the glass travels through the glass toward the opposite outer peripheral surface while being totally reflected at the glass interface, as indicated by the arrows.
If the glass has a defect 11 (bubble, foreign matter, shear mark, etc.), the light diffusely reflects and comes out of the glass from the surface of the glass substrate. Since no light is applied to the glass surface, light that emerges from the surface due to irregular reflection due to defects can be clearly detected. Therefore, stable detection is possible without overlooking a small defect. The position and size of the shear mark can also be clearly recognized. In addition, since the surface is not exposed to light, a certain amount of dust and dirt may adhere to the surface, and a clean room is not required.

【0010】光源からの光がガラス基板の外周側面以外
に照射されるのを防止するためには、ガラス基板の外周
側面の全周のほぼ半分を包みこむホルダーにガラス基板
外周部を装着すればよい。ホルダーは筒状に形成し、そ
の中を光源からの光が通るようにすると便利である。ホ
ルダーのガラス基板と接触する部分には、ゴムなどのパ
ッキンを用いると、パッキンがガラスに密着して隙間か
ら光が漏れることがなくなる。
In order to prevent the light from the light source from being radiated to a portion other than the outer peripheral side surface of the glass substrate, the outer peripheral portion of the glass substrate is mounted on a holder that wraps around half of the entire outer peripheral side surface of the glass substrate. Good. It is convenient to form the holder into a cylindrical shape and allow light from a light source to pass therethrough. If packing such as rubber is used for a portion of the holder that contacts the glass substrate, the packing is in close contact with the glass and light does not leak from the gap.

【0011】欠点で乱反射しガラスの表面又は裏面から
出てくる光を検出する場合、CCDカメラなどの検出手
段を用いると、自動検出が可能となる。
In the case of detecting light that is diffusely reflected due to a defect and emerges from the front or rear surface of the glass, automatic detection becomes possible by using a detecting means such as a CCD camera.

【0012】また本発明は、ガラス容器の口部端面に光
を入射させ、その光のうちの、該ガラス容器のガラス内
部又は表面の欠点で乱反射し、該ガラス容器のガラス表
面から出てくる光を検出することで、ガラス容器の欠点
を検出することを特徴とするガラス容器の欠点検出方法
である。
Further, according to the present invention, light is incident on the end face of the mouth of the glass container, and the light is diffusely reflected by a defect inside or on the surface of the glass of the glass container and emerges from the glass surface of the glass container. This is a method for detecting a defect of a glass container, wherein the defect of the glass container is detected by detecting light.

【0013】また本発明は、光源と、ガラス容器の口部
を包み込んで光源からの光が該ガラス容器の口部端面以
外に照射されるのを防止するホルダーとを有することを
特徴とするガラス容器の欠点検出装置である。
Further, the present invention provides a glass having a light source and a holder which wraps around the mouth of the glass container and prevents light from the light source from being emitted to an area other than the end of the mouth of the glass container. It is a device for detecting a defect of a container.

【0014】光をガラス容器の表面に当てるのではな
く、ホルダーを介してガラス容器表面には当たらないよ
うに、口部上端面からガラス内へ入射させると、ガラス
基板の場合と同様に、光はガラスの界面で全反射しなが
ら、ガラス内を進行する。ガラス内に欠点があると、光
は乱反射してガラス表面からガラスの外へ出てくる。ガ
ラス表面には光を当てていないので、欠点で乱反射して
表面から出てくる光は明確に検出することができる。し
たがって、小さな欠点も見逃すことなく、安定した検出
が可能となる。また、ガラス表面には光を当てないの
で、ある程度のチリ・ほこりがガラス表面に付着してい
ても差し支えない。
When the light is incident on the glass from the upper end surface of the mouth so that the light does not impinge on the surface of the glass container via the holder, instead of irradiating the light on the surface of the glass container, the light is emitted similarly to the case of the glass substrate. Travels through the glass while undergoing total reflection at the glass interface. If there is a defect in the glass, the light diffusely reflects out of the glass surface and out of the glass. Since no light is applied to the glass surface, light that emerges from the surface due to irregular reflection due to defects can be clearly detected. Therefore, stable detection is possible without overlooking a small defect. Further, since no light is applied to the glass surface, some dust and dust may adhere to the glass surface.

【0015】光源からの光がガラス容器の口部端面以外
に照射されるのを防止するためには、ガラス容器の口部
の形状に適合するホルダーにガラス容器口部を包み込む
ように装着すればよい。ホルダーのガラス容器と接触す
る部分には、ゴムなどのパッキンを用いると、パッキン
がガラスに密着して隙間から光が漏れることがなくな
る。
In order to prevent the light from the light source from being emitted to the area other than the end face of the glass container, it is necessary to mount the glass container so as to enclose the glass container opening in a holder conforming to the shape of the opening of the glass container. Good. If packing such as rubber is used for a portion of the holder that contacts the glass container, the packing is in close contact with the glass and light does not leak from the gap.

【0016】欠点で乱反射しガラス容器の表面から出て
くる光を検出する場合、CCDカメラなどの検出手段を
用いると、自動検出が可能となる。
When detecting light that is diffusely reflected due to a defect and emerges from the surface of the glass container, automatic detection becomes possible by using a detecting means such as a CCD camera.

【0017】[0017]

【発明の実施の形態】以下、実施例を表した図面に基づ
いて本発明を詳細に説明する。図1は実施例の検出装置
1の平面図、図2は図1におけるAA線断面図、図3は
蓋7を取り除いたホルダー4の上面図、図4は本発明の
検出方法の説明図、図5は実施例の検出装置10の説明
図、図6はホルダー13の斜視図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail with reference to the drawings showing embodiments. FIG. 1 is a plan view of the detection device 1 of the embodiment, FIG. 2 is a cross-sectional view taken along the line AA in FIG. 1, FIG. 3 is a top view of the holder 4 with the lid 7 removed, FIG. FIG. 5 is an explanatory view of the detection device 10 according to the embodiment, and FIG. 6 is a perspective view of the holder 13.

【0018】図1〜4の検出装置1は記憶媒体用ガラス
基板の欠点検出装置で、光源3及びホルダー4を有す
る。光源3は線状の光源で、ケースの内部に格納されて
いる。ホルダー4は平たい筒状をなし、その一端は光源
3のケースに接続され、他端にはガラス基板2を装着す
る。光源3の光はホルダー4の内部を通りガラス基板2
の外周側面2aに入射する。図2、3に示すように、ホ
ルダー4のガラス基板を装着する部分は、半円状のパッ
キン5、6によって、ガラス基板2の外周部のほぼ半分
を包み込んでおり、光が漏れないようになっている。当
該部分には蓋7が設けられ、蓋7の下面にはパッキン6
が接着されている。ガラス2の装着は、蓋7を開け、ガ
ラス2の端部をパッキン5の上に載せ、蓋7を被せるこ
とにより行う。なお、ガラス基板を装着する部分におい
て、ガラス基板の表面から出てくる光を検出するため
に、ホルダー4本体と蓋7の双方が半円形の切欠部を有
するが、この切欠部は必ずしも本体と蓋の双方に必要な
わけではなく、そのどちらかにあればよい。
The detection device 1 shown in FIGS. 1 to 4 is a defect detection device for a glass substrate for a storage medium, and has a light source 3 and a holder 4. The light source 3 is a linear light source and is stored inside the case. The holder 4 has a flat cylindrical shape, one end of which is connected to the case of the light source 3 and the other end of which the glass substrate 2 is mounted. The light of the light source 3 passes through the inside of the holder 4 and the glass substrate 2
Incident on the outer peripheral side surface 2a. As shown in FIGS. 2 and 3, a portion of the holder 4 on which the glass substrate is mounted wraps substantially half of the outer peripheral portion of the glass substrate 2 by semicircular packings 5 and 6 so that light does not leak. Has become. A cover 7 is provided on the portion, and a packing 6 is provided on the lower surface of the cover 7.
Is glued. The mounting of the glass 2 is performed by opening the lid 7, placing the end of the glass 2 on the packing 5, and covering the lid 7. In addition, in the portion where the glass substrate is mounted, both the main body of the holder 4 and the lid 7 have a semicircular cutout in order to detect light coming out of the surface of the glass substrate. It is not required for both lids, but only for one of them.

【0019】図2に示すように、ガラス基板2は暗箱8
で囲われており、暗箱8の上部には検出手段9としてC
CDカメラがセットされる。光源3から出た光は矢印で
示すようにホルダー4の内部を通りガラス基板2の外周
側面2aに入射する。ガラス基板に欠点がない場合に
は、入射した光はガラスの界面で全反射しながらガラス
内部を通り抜け、反対側の出口8aから暗箱外部に出て
いく。この場合、ガラス表面から光が出ないので、検出
手段9は光を検出しない。ガラス基板に欠点がある場
合、ガラス基板内部を通る光が欠点で乱反射し、ガラス
基板の表面から出てくるので、検出手段9がその光を検
出し、ガラス基板に欠点があることが検出される。
As shown in FIG. 2, the glass substrate 2 is
The detection means 9 is provided above the dark box 8 as C.
The CD camera is set. Light emitted from the light source 3 passes through the inside of the holder 4 and enters the outer peripheral side surface 2a of the glass substrate 2 as indicated by an arrow. If there is no defect in the glass substrate, the incident light passes through the inside of the glass while being totally reflected at the interface of the glass, and goes out of the dark box through the exit 8a on the opposite side. In this case, since no light is emitted from the glass surface, the detecting means 9 does not detect the light. When the glass substrate has a defect, light passing through the inside of the glass substrate is irregularly reflected by the defect and emerges from the surface of the glass substrate. Therefore, the detecting means 9 detects the light, and it is detected that the glass substrate has the defect. You.

【0020】図5の検出装置10は、ガラスびん、ガラ
ス食器などのガラス容器の欠点検出装置で、光源12及
びホルダー13を有する。ホルダー13は、図6に示す
ように、光源12と光ファイバー14で接続され、下面
にリング状の発光部13aを有する。リング状の発光部
を有するこのような装置は一般に光リングガイドといわ
れる公知の装置である。ホルダー13の下面には、円盤
状のパッキン15及び、リング状のパッキン16が貼付
されており、パッキン15、16の間のリング状の部分
が前記の発光部13aとなっている。ガラス容器11の
口部はパッキン15、16の間のリング状の隙間に装着
される。ガラス容器11の側方には、検出手段9として
CCDカメラがセットされる。
The detection device 10 shown in FIG. 5 is a defect detection device for a glass container such as a glass bottle and a glass tableware, and has a light source 12 and a holder 13. As shown in FIG. 6, the holder 13 is connected to the light source 12 by an optical fiber 14, and has a ring-shaped light emitting portion 13a on the lower surface. Such a device having a ring-shaped light emitting portion is a known device generally called an optical ring guide. A disc-shaped packing 15 and a ring-shaped packing 16 are attached to the lower surface of the holder 13, and a ring-shaped portion between the packings 15 and 16 serves as the light emitting portion 13a. The mouth of the glass container 11 is mounted in a ring-shaped gap between the packings 15 and 16. A CCD camera is set on the side of the glass container 11 as the detection means 9.

【0021】光源12から出た光はホルダー13のリン
グ状の発光部13aを経てガラス容器11の口部端面1
1aに入射する。ガラス容器に欠点がない場合には、入
射した光はガラスの界面で全反射しながらガラス内部を
下方に向かって進み、ガラス容器の表面から光が出ない
ので、検出手段9は光を検出しない。ガラス容器に欠点
がある場合、ガラス内部を通る光が欠点で乱反射し、ガ
ラスの表面から出てくるので、検出手段9がその光を検
出し、ガラス容器に欠点があることが検出される。
The light emitted from the light source 12 passes through the ring-shaped light emitting portion 13a of the holder 13 and the end face 1 of the mouth of the glass container 11.
1a. If there is no defect in the glass container, the incident light travels downward inside the glass while being totally reflected at the interface of the glass, and no light is emitted from the surface of the glass container, so that the detecting means 9 does not detect the light. . If the glass container has a defect, light passing through the inside of the glass is irregularly reflected by the defect and emerges from the surface of the glass. The detecting means 9 detects the light and detects that the glass container has a defect.

【0022】図5のガラス容器11は、周壁部と底部の
境が90°に曲がっているので、ガラス内を通ってきた
光が当該部分で全反射せずに、ガラス表面から散乱する
ことがある。このような場合は底部付近にマスク18を
被せ、底部付近から散乱する光をが検出手段17に検出
されないようにすることが望ましい。なお、半球状の鉢
など、周壁部から底部に滑らかに移行する形状の場合に
は、ガラス内部を通る光は底部付近でも全反射してガラ
ス内を通過し、ガラス表面に出てくることはない。
In the glass container 11 shown in FIG. 5, since the boundary between the peripheral wall and the bottom is bent at 90 °, light that has passed through the glass may not be totally reflected at the relevant portion but scattered from the glass surface. is there. In such a case, it is desirable that the mask 18 be placed near the bottom so that light scattered from the vicinity of the bottom is not detected by the detection unit 17. In the case of a shape that transitions smoothly from the peripheral wall to the bottom, such as a hemispherical bowl, light passing through the inside of the glass is totally reflected even near the bottom, passes through the glass, and emerges on the glass surface. Absent.

【0023】このように、ガラス容器の口部の形状に合
わせた形状のホルダーを用いることで、種々の形状のガ
ラス容器の検査を行うことができる。
As described above, various shapes of glass containers can be inspected by using the holder having a shape corresponding to the shape of the mouth of the glass container.

【0024】実施例の検査装置は例示にすぎず、本発明
の検査装置は、特許請求の範囲に記載されている事項を
除き、実施例から種々の変更を行うことができるのはも
ちろんである。例えば、光源3は必ずしも線状のもので
なく点光源でもよい。光源のケースは必ずしも必要では
ない。ホルダー4の蓋7も必ずしも必要ではなく、ガラ
スをホルダー4の端部から差し込むようにしてもよい。
The inspection apparatus of the embodiment is merely an example, and the inspection apparatus of the present invention can be variously modified from the embodiment except for the matters described in the claims. . For example, the light source 3 is not necessarily a linear light source but may be a point light source. A light source case is not necessary. The lid 7 of the holder 4 is not always necessary, and glass may be inserted from the end of the holder 4.

【0025】[0025]

【発明の効果】本発明の欠点検出方法及び装置は、ガラ
ス基板やガラス容器表面のチリ・ほこりに影響されず、
クリーンルームを必要とせず、検査員の個人差に影響さ
れることなく、安定した高精度でガラス製品の欠点を検
出できる。また、CCDカメラなどの検出手段によって
自動検査を行うことも容易である。
The method and apparatus for detecting defects according to the present invention are not affected by dust and dirt on the surfaces of glass substrates and glass containers.
A clean room is not required, and the defect of the glass product can be detected stably and with high accuracy without being affected by individual differences among inspectors. In addition, it is easy to perform an automatic inspection by a detecting means such as a CCD camera.

【図面の簡単な説明】[Brief description of the drawings]

【図1】実施例の検出装置1の平面図である。FIG. 1 is a plan view of a detection device 1 according to an embodiment.

【図2】図1におけるAA線断面図である。FIG. 2 is a sectional view taken along line AA in FIG.

【図3】蓋7を取り除いたホルダー4の上面図である。FIG. 3 is a top view of the holder 4 with the lid 7 removed.

【図4】本発明の検出方法の説明図である。FIG. 4 is an explanatory diagram of a detection method of the present invention.

【図5】他の実施例の検出装置10の説明図である。FIG. 5 is an explanatory diagram of a detection device 10 according to another embodiment.

【図6】ホルダー13の斜視図である。FIG. 6 is a perspective view of a holder 13;

【符号の説明】[Explanation of symbols]

1 検出装置 2 ガラス基板 3 光源 4 ホルダー 5 パッキン 6 パッキン 7 蓋 8 暗箱 9 検出手段 10 検出装置 11 ガラス容器 12 光源 13 ホルダー 14 光ファイバー 15 パッキン 16 パッキン 17 検出手段 18 マスク F 欠点 DESCRIPTION OF SYMBOLS 1 Detector 2 Glass substrate 3 Light source 4 Holder 5 Packing 6 Packing 7 Lid 8 Dark box 9 Detecting means 10 Detector 11 Glass container 12 Light source 13 Holder 14 Optical fiber 15 Packing 16 Packing 17 Detecting means 18 Mask F Defect

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 ガラス基板の外周側面に光を入射させ、
その光のうちの、該ガラス基板の内部又は表面の欠点で
乱反射し、該ガラス基板の表面から出てくる光を検出す
ることで、ガラス基板の欠点を検出することを特徴とす
る記憶媒体用ガラス基板の欠点検出方法
1. Light is incident on the outer peripheral side surface of a glass substrate,
A storage medium characterized by detecting a defect of the glass substrate by detecting light out of the light, which is irregularly reflected by a defect inside or on the surface of the glass substrate and emerges from the surface of the glass substrate. Defect detection method for glass substrate
【請求項2】 光源と、ガラス基板の外周側面を包み込
んで光源からの光が該ガラス基板の外周側面以外に照射
されるのを防止するホルダーとを有することを特徴とす
る記憶媒体用ガラス基板の欠点検出装置
2. A glass substrate for a storage medium, comprising: a light source; and a holder that wraps around the outer peripheral side surface of the glass substrate and prevents light from the light source from being emitted to a portion other than the outer peripheral side surface of the glass substrate. Defect detection device
【請求項3】 請求項2の検出装置において、前記ガラ
ス基板の欠点で乱反射し該ガラス基板の表面から出てく
る光を検出する検出手段を備えることを特徴とする記憶
媒体用ガラス基板の欠点検出装置
3. The defect of the glass substrate for a storage medium according to claim 2, further comprising a detecting means for detecting light which is diffusely reflected by the defect of the glass substrate and emerges from the surface of the glass substrate. Detector
【請求項4】 ガラス容器の口部端面に光を入射させ、
その光のうちの、該ガラス容器のガラス内部又は表面の
欠点で乱反射し、該ガラス容器のガラス表面から出てく
る光を検出することで、ガラス容器の欠点を検出するこ
とを特徴とするガラス容器の欠点検出方法
4. Light is incident on the end face of the mouth of the glass container,
A glass characterized by detecting a defect of the glass container by detecting light out of the light, which is irregularly reflected by a defect inside or on the surface of the glass of the glass container and emerges from the glass surface of the glass container. Container defect detection method
【請求項5】 光源と、ガラス容器の口部を包み込んで
光源からの光が該ガラス容器の口部端面以外に照射され
るのを防止するホルダーとを有することを特徴とするガ
ラス容器の欠点検出装置
5. A disadvantage of a glass container comprising a light source and a holder which wraps around the opening of the glass container and prevents light from the light source from being emitted to the end of the glass container other than the end face of the glass container. Detector
【請求項6】 請求項5の検出装置において、前記ガラ
ス容器の欠点で乱反射し該ガラス容器の表面から出てく
る光を検出する検出手段を備えることを特徴とするガラ
ス容器の欠点検出装置
6. The detecting apparatus according to claim 5, further comprising detecting means for detecting light which is diffusely reflected by a defect of the glass container and emerges from the surface of the glass container.
JP2000220001A 2000-07-21 2000-07-21 Defect detection method and apparatus for glass container Expired - Fee Related JP3406578B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000220001A JP3406578B2 (en) 2000-07-21 2000-07-21 Defect detection method and apparatus for glass container

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000220001A JP3406578B2 (en) 2000-07-21 2000-07-21 Defect detection method and apparatus for glass container

Publications (2)

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JP2002039953A true JP2002039953A (en) 2002-02-06
JP3406578B2 JP3406578B2 (en) 2003-05-12

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ID=18714684

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Country Link
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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004150971A (en) * 2002-10-31 2004-05-27 Nitto Denko Corp Inspection method and inspection apparatus of film
JP2006337267A (en) * 2005-06-03 2006-12-14 Sharp Corp Method and apparatus for detecting defect of optical component
JP2006351669A (en) * 2005-06-14 2006-12-28 Mitsubishi Electric Corp Infrared inspection device and infrared inspection method, and method of manufacturing semiconductor wafer
JP2013527441A (en) * 2010-04-26 2013-06-27 ベクトン ディキンソン フランス Apparatus, kit and method for inspecting articles
JP2014053845A (en) * 2012-09-10 2014-03-20 Canon Inc Picture reading apparatus
JP2014224807A (en) * 2013-04-19 2014-12-04 キリンテクノシステム株式会社 Container inspection method and container inspection device
JP2017026605A (en) * 2015-07-17 2017-02-02 エムハート・グラス・ソシエテ・アノニム Multi-wavelength laser check detecting tool
CN107831172A (en) * 2017-08-02 2018-03-23 深圳市迪姆自动化有限公司 Full-automatic glass surface blemish detection machine

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004150971A (en) * 2002-10-31 2004-05-27 Nitto Denko Corp Inspection method and inspection apparatus of film
JP2006337267A (en) * 2005-06-03 2006-12-14 Sharp Corp Method and apparatus for detecting defect of optical component
JP2006351669A (en) * 2005-06-14 2006-12-28 Mitsubishi Electric Corp Infrared inspection device and infrared inspection method, and method of manufacturing semiconductor wafer
JP2013527441A (en) * 2010-04-26 2013-06-27 ベクトン ディキンソン フランス Apparatus, kit and method for inspecting articles
JP2014053845A (en) * 2012-09-10 2014-03-20 Canon Inc Picture reading apparatus
JP2014224807A (en) * 2013-04-19 2014-12-04 キリンテクノシステム株式会社 Container inspection method and container inspection device
JP2017026605A (en) * 2015-07-17 2017-02-02 エムハート・グラス・ソシエテ・アノニム Multi-wavelength laser check detecting tool
CN107831172A (en) * 2017-08-02 2018-03-23 深圳市迪姆自动化有限公司 Full-automatic glass surface blemish detection machine

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