JP2001324309A5 - - Google Patents
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- JP2001324309A5 JP2001324309A5 JP2000141298A JP2000141298A JP2001324309A5 JP 2001324309 A5 JP2001324309 A5 JP 2001324309A5 JP 2000141298 A JP2000141298 A JP 2000141298A JP 2000141298 A JP2000141298 A JP 2000141298A JP 2001324309 A5 JP2001324309 A5 JP 2001324309A5
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000141298A JP4434431B2 (ja) | 2000-05-15 | 2000-05-15 | 三次元形状測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000141298A JP4434431B2 (ja) | 2000-05-15 | 2000-05-15 | 三次元形状測定装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2001324309A JP2001324309A (ja) | 2001-11-22 |
JP2001324309A5 true JP2001324309A5 (de) | 2007-07-05 |
JP4434431B2 JP4434431B2 (ja) | 2010-03-17 |
Family
ID=18648432
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2000141298A Expired - Fee Related JP4434431B2 (ja) | 2000-05-15 | 2000-05-15 | 三次元形状測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4434431B2 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4047096B2 (ja) * | 2002-08-09 | 2008-02-13 | キヤノン株式会社 | 表面形状測定装置および方法 |
JP4500729B2 (ja) * | 2005-05-11 | 2010-07-14 | キヤノン株式会社 | 表面形状測定装置 |
KR100951221B1 (ko) | 2005-08-05 | 2010-04-05 | 미따까 고오끼 가부시끼가이샤 | 렌즈에 있어서의 표리면의 광축 편심량의 측정 방법 |
CN100465579C (zh) * | 2006-12-19 | 2009-03-04 | 中国航空工业第一集团公司北京长城计量测试技术研究所 | 一种激光平面坐标标准装置 |
JP2008209244A (ja) * | 2007-02-27 | 2008-09-11 | Nagoya Institute Of Technology | 3次元表面形状計測器による表面データからの立体形状の構築方法と板状物体の板厚計測法 |
TWI409518B (zh) * | 2007-11-23 | 2013-09-21 | Hon Hai Prec Ind Co Ltd | 扭矩測試裝置及扭矩測試方法 |
JP5113030B2 (ja) * | 2008-12-22 | 2013-01-09 | 株式会社成宗製作所 | 三次元形状計測方法及びその為の基準部材 |
JP2011117766A (ja) * | 2009-12-01 | 2011-06-16 | Canon Inc | 干渉計測方法 |
CN103453849B (zh) * | 2013-07-18 | 2016-01-20 | 黑龙江科技大学 | 多光学传感器协同的复杂曲面零件三维测量方法与系统 |
US10910786B2 (en) * | 2018-07-23 | 2021-02-02 | University Of Maryland, College Park | Laser cavity optical alignment |
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2000
- 2000-05-15 JP JP2000141298A patent/JP4434431B2/ja not_active Expired - Fee Related