JP2001223251A5 - - Google Patents

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Publication number
JP2001223251A5
JP2001223251A5 JP2000029806A JP2000029806A JP2001223251A5 JP 2001223251 A5 JP2001223251 A5 JP 2001223251A5 JP 2000029806 A JP2000029806 A JP 2000029806A JP 2000029806 A JP2000029806 A JP 2000029806A JP 2001223251 A5 JP2001223251 A5 JP 2001223251A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000029806A
Other languages
Japanese (ja)
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JP2001223251A (ja
JP4073138B2 (ja
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Publication date
Application filed filed Critical
Priority to JP2000029806A priority Critical patent/JP4073138B2/ja
Priority claimed from JP2000029806A external-priority patent/JP4073138B2/ja
Publication of JP2001223251A publication Critical patent/JP2001223251A/ja
Publication of JP2001223251A5 publication Critical patent/JP2001223251A5/ja
Application granted granted Critical
Publication of JP4073138B2 publication Critical patent/JP4073138B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2000029806A 2000-02-07 2000-02-07 石英中に含有される金属の分析方法 Expired - Fee Related JP4073138B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000029806A JP4073138B2 (ja) 2000-02-07 2000-02-07 石英中に含有される金属の分析方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000029806A JP4073138B2 (ja) 2000-02-07 2000-02-07 石英中に含有される金属の分析方法

Publications (3)

Publication Number Publication Date
JP2001223251A JP2001223251A (ja) 2001-08-17
JP2001223251A5 true JP2001223251A5 (de) 2006-03-23
JP4073138B2 JP4073138B2 (ja) 2008-04-09

Family

ID=18554904

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000029806A Expired - Fee Related JP4073138B2 (ja) 2000-02-07 2000-02-07 石英中に含有される金属の分析方法

Country Status (1)

Country Link
JP (1) JP4073138B2 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8021623B2 (en) 2003-10-08 2011-09-20 Tokyo Electron Limited Examination method and examination assistant device for quartz product of semiconductor processing apparatus
JP3890047B2 (ja) * 2003-10-08 2007-03-07 東京エレクトロン株式会社 石英中の金属分析方法及び分析用治具
JP4881656B2 (ja) * 2006-06-02 2012-02-22 東京エレクトロン株式会社 石英部材の分析方法
JP5101477B2 (ja) * 2008-12-09 2012-12-19 コバレントマテリアル株式会社 セラミックス部材の不純物分析方法
JP2011257436A (ja) * 2011-10-04 2011-12-22 Tokyo Electron Ltd 石英部材
JP6885287B2 (ja) * 2017-09-29 2021-06-09 株式会社Sumco 石英ルツボの不純物分析方法

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