JP2001213691A - Reflection material of single crystal growth equipment and melting method using its equipment - Google Patents

Reflection material of single crystal growth equipment and melting method using its equipment

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Publication number
JP2001213691A
JP2001213691A JP2000021117A JP2000021117A JP2001213691A JP 2001213691 A JP2001213691 A JP 2001213691A JP 2000021117 A JP2000021117 A JP 2000021117A JP 2000021117 A JP2000021117 A JP 2000021117A JP 2001213691 A JP2001213691 A JP 2001213691A
Authority
JP
Japan
Prior art keywords
silicon
crucible
seed crystal
furnace body
wire
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000021117A
Other languages
Japanese (ja)
Other versions
JP3873561B2 (en
Inventor
Kenji Hori
憲治 堀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Materials Silicon Corp
Original Assignee
Mitsubishi Materials Silicon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Materials Silicon Corp filed Critical Mitsubishi Materials Silicon Corp
Priority to JP2000021117A priority Critical patent/JP3873561B2/en
Publication of JP2001213691A publication Critical patent/JP2001213691A/en
Application granted granted Critical
Publication of JP3873561B2 publication Critical patent/JP3873561B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To melt silicon in a simple manner in a short time. SOLUTION: The reflection material 26 is equipped with the disk plate 27, having a mirror finished and bottom side surface and a higher melting point than silicon, and the rod 28, being installed vertically at center of the disk plate 27 supported by a holder 21 at the top. At melting silicon lumps or particles 29, the lumps or particles 29 are put in the pot 17 inside the furnace, the rod 28 of reflection material 26 is attached to the seed crystal holder 21 being hung with the wire 19 from the rotating/raising structure 18 installed at the top of the furnace 11, the disk plate 27 of the reflection material 26 is let down with the wire 19 and kept horizontally above the pot 17 in a way of covering the opening mouth of the pot 17 in part, and then, the pot 17 is heated. Polycrystal lumps or particles 24 are put in the pot 17 and melted by heating the pot.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、チョクラルスキー
法(以下、「CZ法」という。)によりシリコン単結晶
を育成する装置において、シリコンを融解する際に使用
する反射部材及びそれを用いたシリコンの融解方法に関
するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for growing a silicon single crystal by the Czochralski method (hereinafter referred to as "CZ method"), wherein a reflecting member used for melting silicon and a reflecting member used therefor. The present invention relates to a method for melting silicon.

【0002】[0002]

【従来の技術】従来、シリコン単結晶の育成方法として
ルツボ内のシリコン融液から半導体用の高純度シリコン
単結晶を成長させるCZ法が知られている。この方法
は、ルツボを内部に有する炉体の上部に設けられた回転
・引上げ機構からワイヤを介してルツボの上方の炉体内
部に吊り下げられた種結晶用ホルダに種結晶を取付け、
ワイヤを繰り出してその種結晶をシリコン融液に接触さ
せ、種結晶を引上げてシリコン融液から種絞り部分を作
製し、その後目的とするシリコン棒の直径まで結晶を徐
々に太らせて成長させることにより、必要な面方向を有
する無転位の単結晶インゴットを得ることができるもの
である。シリコン融液はルツボ内に融解されており、ル
ツボはカーボンヒータにより加熱される。
2. Description of the Related Art Conventionally, as a method for growing a silicon single crystal, a CZ method for growing a high-purity silicon single crystal for a semiconductor from a silicon melt in a crucible is known. This method attaches a seed crystal to a seed crystal holder suspended inside the furnace body above the crucible via a wire from a rotation / pulling mechanism provided at the top of the furnace body having a crucible inside,
Unwinding the wire, bringing the seed crystal into contact with the silicon melt, pulling up the seed crystal, creating a seed drawing portion from the silicon melt, and then gradually growing the crystal to the desired diameter of the silicon rod Thereby, a dislocation-free single crystal ingot having a necessary plane direction can be obtained. The silicon melt is melted in the crucible, and the crucible is heated by a carbon heater.

【0003】しかし多結晶シリコンの融解温度は約14
00℃であり、シリコン単結晶を育成させるため、ルツ
ボ内に当初充填された塊状物又は粒状物を完全に融解す
るには比較的多くの時間を必要とする。特に今日の育成
する単結晶の大口径化と長尺化に伴い比較的多量のシリ
コン融液を必要とし、このシリコンを融解する時間はシ
リコン単結晶インゴット育成工程における効率低下とい
う不具合を招いていた。この点を解消するために、育成
されるシリコン単結晶インゴットの通過部分を除いたル
ツボの上方部分に赤外線反射板を設けた装置が提案され
ている(例えば特公昭57−40119,特公平6−3
3218)。これらの装置では赤外線反射板で囲まれた
ルツボをカーボンヒータにより効率よく加熱することが
でき、ルツボに入れられたシリコンからなる塊状物又は
粒状物の融解を短時間で簡便に行うことができるように
なっている。
However, the melting temperature of polycrystalline silicon is about 14
Since the temperature is 00 ° C. and a silicon single crystal is grown, it takes a relatively long time to completely melt the mass or granular material initially filled in the crucible. In particular, a relatively large amount of silicon melt is required in accordance with the growing diameter and length of the single crystal to be grown today, and the time required to melt this silicon has led to a problem that the efficiency of the silicon single crystal ingot growing process is reduced. . In order to solve this problem, an apparatus has been proposed in which an infrared reflecting plate is provided above the crucible except for a portion through which a silicon single crystal ingot to be grown passes (for example, Japanese Patent Publication No. 57-40119, Japanese Patent Publication No. Hei 6-1994). 3
3218). In these devices, the crucible surrounded by the infrared reflecting plate can be efficiently heated by the carbon heater, so that the lump or granular material made of silicon put in the crucible can be melted easily in a short time. It has become.

【0004】[0004]

【発明が解決しようとする課題】しかし、上述した装置
では、育成される単結晶インゴットの通過部分には反射
板が設けられないため、その通過部分から熱が炉体上方
に放散し、塊状物又は粒状物を融解する時間の短縮を十
分に図ることができない不具合があった。また、反射板
をルツボ上方の全部分にまで設けた場合には、反射板が
単結晶インゴットの育成の障害になるために、塊状物又
は粒状物が融解した後にその反射板を取外して炉体から
取出す必要が生じ、反射板を取出すことの手間が増加す
る未だ解決しなければならない問題点が残存していた。
本発明の目的は、シリコンからなる塊状物又は粒状物の
融解を短時間で簡便に行うことができる単結晶育成装置
の反射部材及びそれを用いたシリコンの融解方法を提供
することにある。
However, in the above-described apparatus, since a reflector is not provided at a portion where a single crystal ingot to be grown passes, heat is radiated from the portion where the single crystal ingot passes to an upper portion of the furnace body, and a lump is formed. Alternatively, there was a problem that the time required to melt the granular material could not be sufficiently reduced. If the reflector is provided all over the crucible, the reflector may hinder the growth of the single crystal ingot. However, there is still a problem that needs to be solved.
An object of the present invention is to provide a reflecting member of a single crystal growing apparatus capable of melting a lump or granular substance made of silicon in a short time and simply, and a method for melting silicon using the same.

【0005】[0005]

【課題を解決するための手段】請求項1に係る発明は、
図1に示すように、ルツボ17を内部に有する炉体11
の上部に設けられた回転・引上げ機構18からワイヤ1
9を介してルツボ17の上方の炉体内部に吊り下げられ
た種結晶用ホルダ21に離脱可能に取付けられる反射部
材26であって、下面が鏡面仕上げされたシリコンの融
点以上の融点を有する円板27と、円板27の中央に立
設され上部がホルダ21に取付け可能に構成されたロッ
ド28とを備えた単結晶育成装置の反射部材である。請
求項2に係る発明は、シリコンからなる塊状物又は粒状
物29を炉体内部に設けられたルツボ17に入れ、炉体
11の上部に設けられた回転・引上げ機構18からワイ
ヤ19を介して吊り下げられた種結晶用ホルダ21に請
求項1記載の反射部材26のロッド28を取付け、ワイ
ヤ19を繰り出してルツボ17の上方でルツボ17の開
口部の一部を覆うように反射部材26の円板27を水平
に保持し、ルツボ17を加熱して塊状物又は粒状物29
を融解するシリコンの融解方法である。
The invention according to claim 1 is
As shown in FIG. 1, a furnace body 11 having a crucible 17 therein
Wire 1 from the rotation / pulling-up mechanism 18
A reflecting member 26 detachably attached to a seed crystal holder 21 suspended inside the furnace body above the crucible 17 via a crucible 9 and having a melting point equal to or higher than the melting point of silicon whose lower surface is mirror-finished; This is a reflecting member of a single crystal growing apparatus including a plate 27 and a rod 28 erected at the center of the disk 27 and whose upper portion is configured to be attachable to the holder 21. According to the second aspect of the present invention, a lump or granular material 29 made of silicon is put into a crucible 17 provided inside the furnace body, and is rotated via a wire 19 from a rotation / pulling-up mechanism 18 provided at an upper portion of the furnace body 11. The rod 28 of the reflecting member 26 according to claim 1 is attached to the suspended seed crystal holder 21, and the wire 19 is extended to cover a part of the opening of the crucible 17 above the crucible 17. The disk 27 is held horizontally and the crucible 17 is heated to remove
Is a method of melting silicon.

【0006】この請求項1に係る反射部材及び請求項2
に係る融解方法では、ルツボ17を加熱してシリコンの
融解が開始すると、図1及び図3の実線矢印で示すよう
に、融解が開始したシリコンのルツボ17上面から放出
する熱の放散を反射部材26の円板27が防止するとと
もにこの熱をシリコン24からなる塊状物又は粒状物に
向けて反射する。円板27により反射した熱が加わるこ
とにより、シリコンからなる塊状物又は粒状物の融解時
間は従来より短縮する。円板27の下面を鏡面仕上げす
るのは、円板27の下面が反射する熱量を大きくするた
めであり、鏡面仕上げにはミラーポリッシュ又はミラー
エッチングが挙げられる。
[0006] The reflecting member according to the first aspect and the second aspect.
In the melting method according to the above, when the crucible 17 is heated to start melting the silicon, as shown by solid arrows in FIGS. 1 and 3, the diffusion of the heat released from the upper surface of the crucible 17 of the melted silicon is reflected by the reflecting member. The disk 27 prevents the heat and reflects the heat toward the lump or granule made of the silicon 24. By applying the heat reflected by the disk 27, the melting time of the lump or granule made of silicon is shortened as compared with the related art. The reason why the lower surface of the disk 27 is mirror-finished is to increase the amount of heat reflected by the lower surface of the disk 27, and the mirror surface finishing includes mirror polishing or mirror etching.

【0007】[0007]

【発明の実施の形態】次に本発明の実施の形態を図面に
基づいて詳しく説明する。図1及び図2に示すように、
CZ法によるシリコン融液から単結晶を育成する装置で
は、炉体11の内部に炉体11と同心円状に断熱材12
とカーボンヒータ13が配置され、炉体11中央の回転
軸14の上端に固定された黒鉛サセプタ16に有底円筒
状の石英ルツボ17が嵌合される。炉体11の上部には
円筒状のチャンバ15を介して回転・引上げ機構18が
設けられ、ルツボ17の上方にはこの回転・引上げ機構
18からワイヤ19を介して種結晶用ホルダ21が吊り
下げられる。シリコン単結晶を育成させる際には、この
種結晶用ホルダ21に図示しない種結晶を取付け、回転
・引上げ機構18はその種結晶から成長した高純度のシ
リコン単結晶インゴットを回転しつつ引上げて種結晶の
下端に高純度のシリコン単結晶インゴットを成長させる
ようになっている。
Embodiments of the present invention will now be described in detail with reference to the drawings. As shown in FIGS. 1 and 2,
In an apparatus for growing a single crystal from a silicon melt by the CZ method, a heat insulating material 12 concentrically with the furnace body 11 is provided inside the furnace body 11.
And a carbon heater 13 are arranged, and a bottomed cylindrical quartz crucible 17 is fitted to a graphite susceptor 16 fixed to the upper end of a rotating shaft 14 at the center of the furnace body 11. A rotating / pulling-up mechanism 18 is provided above the furnace body 11 via a cylindrical chamber 15, and a seed crystal holder 21 is suspended above the crucible 17 from the rotating / pulling-up mechanism 18 via a wire 19. Can be When growing a silicon single crystal, a seed crystal (not shown) is attached to the seed crystal holder 21, and the rotation / pulling-up mechanism 18 pulls up a high-purity silicon single crystal ingot grown from the seed crystal while rotating the seed crystal. A high-purity silicon single crystal ingot is grown at the lower end of the crystal.

【0008】一方、炉体11とチャンバ15はヒンジ1
5aを介して取付けられ、チャンバ15が取付けられる
炉体11の上部には、その部分における開口部11aを
閉止可能な遮蔽板22が設けられる。遮蔽板22は炉体
11に設けられた収容部11bに収納状態でその開口部
11aを開放し、収容部11bから突出すると開口部1
1aを閉止するように構成される。また、断熱材12上
縁にはルツボ17及びカーボンヒータ13の上部を取り
囲むように内方に向って、円板状の赤外線反射板23が
配置され、その赤外線反射板23は育成される単結晶イ
ンゴットに当接しないようにその中央に育成される単結
晶インゴットの外形より僅かに大きい孔23aが設けら
れる。図4に示すように、種結晶用ホルダ21は、チャ
ック本体21dの底部に種結晶挿入穴21aが中心軸に
沿って形成され、この挿入穴21aに直交しかつ挿入穴
21aの軸心に対して偏倚してピン孔21bが形成され
る。ピン孔21bはピン孔21bの中央部分における断
面積が約半分程度挿入穴21aに重なるように形成され
る。シリコン単結晶を育成させる際の種結晶の取付け
は、図示しない種結晶を挿入穴21aに挿入して、種結
晶用ホルダ21のピン孔21bに係止ピン24を挿入す
ることにより行うようになっている。
On the other hand, the furnace body 11 and the chamber 15
At the upper part of the furnace body 11 to which the chamber 15 is mounted via the 5a, a shielding plate 22 capable of closing the opening 11a at that portion is provided. The shield plate 22 opens the opening 11a in a storage state in the storage part 11b provided in the furnace body 11 and projects from the storage part 11b to open the opening 1a.
1a is configured to be closed. At the upper edge of the heat insulating material 12, a disk-shaped infrared reflecting plate 23 is disposed inwardly so as to surround the crucible 17 and the upper portion of the carbon heater 13, and the infrared reflecting plate 23 is a single crystal to be grown. A hole 23a slightly larger than the outer shape of the single crystal ingot grown at the center thereof is provided so as not to come into contact with the ingot. As shown in FIG. 4, the seed crystal holder 21 has a seed crystal insertion hole 21a formed along the central axis at the bottom of the chuck body 21d, and is perpendicular to the insertion hole 21a and with respect to the axis of the insertion hole 21a. As a result, the pin hole 21b is formed. The pin hole 21b is formed so that the cross-sectional area at the center of the pin hole 21b overlaps the insertion hole 21a by about half. The seed crystal is attached when growing the silicon single crystal by inserting a seed crystal (not shown) into the insertion hole 21a and inserting the locking pin 24 into the pin hole 21b of the seed crystal holder 21. ing.

【0009】本発明の反射部材26は、この種結晶用ホ
ルダ21に離脱可能に取付けられるものであって、円板
27と上部がそのホルダ21に取付け可能に構成された
ロッド28とを備える。円板27はシリコンの融点以上
の融点を有するモリブデンにより作られ、赤外線反射板
23の孔23aより僅かに小さな外径を有する板材であ
る。この円板27の下面はミラーポリッシュ又はミラー
エッチング等の鏡面仕上げがなされる。ロッド28はモ
リブデンからなる断面円形の棒材であって、円板27の
中央に形成された図示しない装着孔に下端を圧入するこ
とによりその円板27の中央に立設される。ロッド28
は図示しない種結晶と類似の形状に作られる。即ち、ロ
ッド28は種結晶用ホルダ21の挿入穴21aに挿入可
能な外径を有し、ロッド28上部の側部には下方に向か
って深く切欠かれた切欠き面28aが形成される。
The reflecting member 26 of the present invention is detachably attached to the seed crystal holder 21 and includes a disk 27 and a rod 28 whose upper part is configured to be attachable to the holder 21. The disk 27 is a plate material made of molybdenum having a melting point equal to or higher than the melting point of silicon and having an outer diameter slightly smaller than the hole 23 a of the infrared reflecting plate 23. The lower surface of the disk 27 is mirror-finished such as mirror polish or mirror etching. The rod 28 is a rod made of molybdenum and having a circular cross section. The lower end of the rod 28 is press-fitted into a mounting hole (not shown) formed in the center of the disk 27 and is erected at the center of the disk 27. Rod 28
Is formed in a shape similar to a seed crystal not shown. That is, the rod 28 has an outer diameter that can be inserted into the insertion hole 21a of the seed crystal holder 21, and a notch surface 28a that is notched deeply downward is formed on the upper side of the rod 28.

【0010】ロッド28上部のホルダ21への取付け
は、図示しない種結晶の取付けと同様にロッド28の上
部を挿入穴21aに挿入した後、種結晶用ホルダ21の
ピン孔21bに係止ピン24を挿入することにより行わ
れる。ピン孔21bに挿入された係止ピン24の胴部は
ロッド27に形成された切欠き面28aに当接し、ロッ
ド28の挿入穴21aに対する移動が禁止され、係止ピ
ン24は反射部材26を種結晶用ホルダ21に取付ける
ように構成される。一方、ピン孔21bから係止ピン2
4を抜くと、ロッド28の挿入穴21aに対する移動が
許容され、反射部材26は種結晶用ホルダ21から取り
外すことができるように構成される。
The upper part of the rod 28 is attached to the holder 21 by inserting the upper part of the rod 28 into the insertion hole 21a in the same manner as the attachment of the seed crystal (not shown), and then the locking pin 24 is inserted into the pin hole 21b of the seed crystal holder 21. This is done by inserting The body of the locking pin 24 inserted into the pin hole 21b abuts a notch surface 28a formed in the rod 27, and the movement of the rod 28 with respect to the insertion hole 21a is prohibited. It is configured to be attached to the seed crystal holder 21. On the other hand, the locking pin 2 is inserted through the pin hole 21b.
When the rod 4 is removed, the rod 28 is allowed to move with respect to the insertion hole 21a, and the reflecting member 26 is configured to be detachable from the seed crystal holder 21.

【0011】次に、このような構成の反射部材を用いた
シリコンの融解方法を説明する。図2に示すように、先
ずシリコンからなる塊状物又は粒状物29を炉体内部に
設けられたルツボ17に入れる。この実施の形態におけ
るシリコンは粒状物からなる新規の多結晶シリコンであ
るが、シリコンは育成に失敗した単結晶を砕いたもので
あっても良く、またシリコンは塊状物であってもよい。
その後、炉体11の上部に設けられた回転・引上げ機構
18からワイヤ19を介して吊り下げられた種結晶用ホ
ルダ21に、係止ピン24を用いて反射部材26のロッ
ド28を取付ける。図2に示すように、反射部材26の
取付けは、炉体11に対してチャンバ15を傾動させて
チャンバ15の下端から種結晶用ホルダ21を引出した
状態で行われる。ロッド27を種結晶用ホルダ21に取
付けた後には、このチャンバ15を再び戻してその反射
部材26をルツボ17の上方に位置させる。
Next, a description will be given of a method of melting silicon using the reflecting member having such a configuration. As shown in FIG. 2, first, a lump or granule 29 made of silicon is put into a crucible 17 provided inside a furnace body. In this embodiment, silicon is a novel polycrystalline silicon made of a granular material. However, the silicon may be a crushed single crystal that has failed to grow, or the silicon may be a lump.
Thereafter, the rod 28 of the reflection member 26 is attached to the seed crystal holder 21 suspended via the wire 19 from the rotation / pulling-up mechanism 18 provided on the upper part of the furnace body 11 using the locking pin 24. As shown in FIG. 2, the attachment of the reflection member 26 is performed in a state where the chamber 15 is tilted with respect to the furnace body 11 and the seed crystal holder 21 is pulled out from the lower end of the chamber 15. After attaching the rod 27 to the seed crystal holder 21, the chamber 15 is returned again, and the reflecting member 26 is positioned above the crucible 17.

【0012】次に、ワイヤ19を繰り出してルツボ17
の上方でルツボ17の開口部の一部を覆うように反射部
材26の円板27を水平に保持させる。円板27は赤外
線反射板23の孔23aより小さな外径を有するので、
ワイヤ19を繰り出すと、反射部材26はその孔23a
を通過して下降する。反射部材26がルツボ17の近傍
に達した時点でワイヤ19の繰り出しを停止することに
より、図3に示すように、ルツボ17の開口部の一部を
覆うように反射部材26の円板27は水平に保持され
る。その後、カーボンヒータ13によりそのルツボ17
を加熱してそのルツボ17に入れられた塊状物又は粒状
物29を融解する。
Next, the wire 19 is paid out and the crucible 17 is drawn out.
The disk 27 of the reflecting member 26 is held horizontally so as to cover a part of the opening of the crucible 17 above. Since the disk 27 has an outer diameter smaller than the hole 23a of the infrared reflecting plate 23,
When the wire 19 is unwound, the reflection member 26 has its hole 23a.
And descends through. By stopping the feeding of the wire 19 when the reflecting member 26 reaches the vicinity of the crucible 17, as shown in FIG. 3, the disc 27 of the reflecting member 26 covers a part of the opening of the crucible 17. Holds horizontally. Thereafter, the crucible 17 is heated by the carbon heater 13.
Is heated to melt the lumps or granules 29 placed in the crucible 17.

【0013】ルツボ17の周囲に配置されたカーボンヒ
ータ13の熱により周囲からルツボ17に入れられた多
結晶シリコンからなる塊状物又は粒状物24の融解が開
始する。図1及び図3の実線矢印で示すように、融解が
開始した多結晶シリコンのルツボ17上面から放出する
熱の放散はこの反射部材26の円板27が防止するとと
もに、円板27はこの熱を塊状物又は粒状物24に向け
て反射する。特に鏡面仕上げした円板27下面の反射率
は鏡面仕上げしない場合と比較して向上しているので、
ルツボ17上面から放出する熱を有効に反射して、この
熱により多結晶シリコンの融解は更に速くなる。また、
育成されるシリコン単結晶インゴットの通過部分を除い
たルツボ17上方部分に赤外線反射板23を設けたこの
実施の形態では、図1に示すように、融解が開始したル
ツボ17上面からの熱の放散を、本発明の反射部材26
が赤外線反射板23がとともにより有効に防止する。こ
れにより、シリコンからなる塊状物又は粒状物の融解時
間はより一層短縮する。
The heat of the carbon heater 13 disposed around the crucible 17 causes the lump or granular material 24 made of polycrystalline silicon put into the crucible 17 from the periphery to start melting. As shown by the solid arrows in FIGS. 1 and 3, the dissipation of the heat released from the upper surface of the crucible 17 of the polycrystalline silicon in which the melting has started is prevented by the disk 27 of the reflecting member 26, and the disk 27 Is reflected toward the clumps or granules 24. In particular, the reflectivity of the lower surface of the mirror-finished disk 27 is improved as compared with the case without the mirror surface finish.
The heat emitted from the upper surface of the crucible 17 is effectively reflected, and the heat makes the melting of the polycrystalline silicon faster. Also,
In this embodiment in which the infrared reflecting plate 23 is provided above the crucible 17 excluding the portion through which the silicon single crystal ingot to be grown is passed, as shown in FIG. 1, heat dissipation from the upper surface of the crucible 17 where melting has started. The reflection member 26 of the present invention
Is more effectively prevented by the infrared reflector 23. As a result, the melting time of the lump or granule made of silicon is further reduced.

【0014】シリコンからなる塊状物又は粒状物が融解
した後、このシリコン融液31から半導体用の高純度シ
リコン単結晶を成長させる。この成長に際して、反射部
材26に代えて図示しない種結晶を種結晶用ホルダ21
に取付ける。反射部材26の取り外し及び種結晶の取付
けは、炉体11に対してチャンバ15を傾動させてチャ
ンバ15の下端から種結晶用ホルダ21を引出して行わ
れる。この際、図2に示すように、遮蔽板22を収容部
11bから突出させて炉体11の開口部11aを閉止す
ることにより炉体11内部が冷却されることを防止す
る。ロッド27を種結晶に代えた後、このチャンバ15
を再び戻すとともに、遮蔽板22を収容部11bに収納
して開口部11aを再び開放する。その後、種結晶をシ
リコン融液31に接触させ、回転・引上げ機構18はそ
の種結晶から成長した高純度のシリコン単結晶インゴッ
トを回転しつつ引上げて種結晶の下端に高純度のシリコ
ン単結晶インゴットを成長させる。
After the lump or granule made of silicon is melted, a high-purity silicon single crystal for a semiconductor is grown from the silicon melt 31. At the time of this growth, a seed crystal (not shown) is replaced with a seed crystal holder 21 instead of the reflection member 26.
Attach to The removal of the reflection member 26 and the attachment of the seed crystal are performed by tilting the chamber 15 with respect to the furnace body 11 and pulling out the seed crystal holder 21 from the lower end of the chamber 15. At this time, as shown in FIG. 2, the inside of the furnace body 11 is prevented from being cooled by protruding the shielding plate 22 from the housing portion 11 b and closing the opening 11 a of the furnace body 11. After replacing the rod 27 with a seed crystal, the chamber 15
Is returned, and the shielding plate 22 is housed in the housing portion 11b to open the opening 11a again. Thereafter, the seed crystal is brought into contact with the silicon melt 31, and the rotation / pulling-up mechanism 18 pulls up the high-purity silicon single crystal ingot grown from the seed crystal while rotating, and puts the high-purity silicon single crystal ingot on the lower end of the seed crystal. Grow.

【0015】なお、上述した実施の形態では、円板27
としてシリコンの融点以上の融点を有するモリブデンを
使用したが、円板27は、タングステンやシリコンウエ
ーハであってもよい。反射部材26をシリコンウエーハ
で作った場合には、るつぼ17に入れたシリコンが全て
融解した後、反射部材26をシリコンからなる塊状物又
は粒状物が融解したシリコン融液中に融解させることが
でき、反射部材26をシリコン融液に融解させれば、後
工程でこの反射部材26を炉体11から取出す作業を不
要にすることができる。
In the above-described embodiment, the disk 27
Although molybdenum having a melting point equal to or higher than the melting point of silicon was used, the disk 27 may be tungsten or a silicon wafer. When the reflecting member 26 is made of a silicon wafer, after all the silicon put in the crucible 17 is melted, the reflecting member 26 can be melted in a silicon melt in which a lump or granular material made of silicon is melted. If the reflecting member 26 is melted into the silicon melt, the operation of removing the reflecting member 26 from the furnace body 11 in a later step can be omitted.

【0016】[0016]

【発明の効果】以上述べたように、本発明によれば、下
面が鏡面仕上げされたシリコンの融点以上の融点を有す
る円板と、円板の中央に立設され上部がホルダに取付け
可能に構成されたロッドとを備えた単結晶育成装置の反
射部材を用い、シリコンからなる塊状物又は粒状物を炉
体内部に設けられたルツボに入れ、炉体の上部に設けら
れた回転・引上げ機構からワイヤを介して吊り下げられ
た種結晶用ホルダにそのロッドを取付け、ワイヤを繰り
出してルツボの上方でルツボの開口部の一部を覆うよう
に円板を水平に保持し、ルツボを加熱して塊状物又は粒
状物を融解するので、ルツボを加熱してシリコンの融解
が開始すると、ルツボ上面から放出する熱の放散を円板
が防止するとともにこの熱を反射する。円板により反射
した熱によりシリコンからなる塊状物又は粒状物の融解
時間を従来より短縮させることができる。
As described above, according to the present invention, a disk having a melting point equal to or higher than that of silicon whose lower surface is mirror-finished, and an upper portion which is erected at the center of the disk and can be attached to the holder can be attached. Using a reflecting member of a single crystal growing apparatus provided with a constituted rod, a lump or granule made of silicon is put into a crucible provided inside a furnace body, and a rotating / pulling mechanism provided at an upper part of the furnace body Attach the rod to the seed crystal holder suspended from the wire through the wire, pay out the wire, hold the disk horizontally so as to cover part of the crucible opening above the crucible, and heat the crucible When the crucible is heated and melting of the silicon starts, the disk prevents the heat released from the upper surface of the crucible from dissipating and reflects the heat. Due to the heat reflected by the disk, the melting time of the bulk or granular material made of silicon can be shortened as compared with the related art.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の反射部材を含む単結晶育成装置の概略
断面図。
FIG. 1 is a schematic sectional view of a single crystal growing apparatus including a reflecting member of the present invention.

【図2】そのチャンバが傾動した状態を示す図1に対応
する概略断面図。
FIG. 2 is a schematic sectional view corresponding to FIG. 1 and showing a state where the chamber is tilted.

【図3】反射部材をルツボの上方に配置させた状態を示
す断面図。
FIG. 3 is a sectional view showing a state in which a reflecting member is arranged above a crucible.

【図4】その反射部材をホルダに取付ける状態を示す斜
視図。
FIG. 4 is a perspective view showing a state in which the reflection member is attached to a holder.

【符号の説明】[Explanation of symbols]

11 炉体 17 ルツボ 18 回転・引上げ機構 19 ワイヤ 21 種結晶用ホルダ 26 反射部材 27 円板 28 ロッド 29 シリコンからなる塊状物又は粒状物 DESCRIPTION OF SYMBOLS 11 Furnace body 17 Crucible 18 Rotation / pulling-up mechanism 19 Wire 21 Seed crystal holder 26 Reflection member 27 Disk 28 Rod 29 Lumped or granular material made of silicon

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 ルツボ(17)を内部に有する炉体(11)の上
部に設けられた回転・引上げ機構(18)からワイヤ(19)を
介して前記ルツボ(17)の上方の炉体内部に吊り下げられ
た種結晶用ホルダ(21)に離脱可能に取付けられる反射部
材(26)であって、 下面が鏡面仕上げされたシリコンの融点以上の融点を有
する円板(27)と、 前記円板(27)の中央に立設され上部が前記ホルダ(21)に
取付け可能に構成されたロッド(28)とを備えた単結晶育
成装置の反射部材。
1. An inside of a furnace body above a crucible (17) via a wire (19) from a rotating / pulling-up mechanism (18) provided on an upper part of a furnace body (11) having a crucible (17) therein. A reflecting member (26) detachably attached to a seed crystal holder (21) suspended from the mirror, a disk (27) having a melting point equal to or higher than the melting point of silicon whose lower surface is mirror-finished; A reflecting member of a single crystal growing apparatus, comprising: a rod (28) that is provided upright at the center of a plate (27) and whose upper part is configured to be attachable to the holder (21).
【請求項2】 シリコンからなる塊状物又は粒状物(29)
を炉体内部に設けられたルツボ(17)に入れ、 前記炉体(11)の上部に設けられた回転・引上げ機構(18)
からワイヤ(19)を介して吊り下げられた種結晶用ホルダ
(21)に請求項1記載の反射部材(26)のロッド(28)を取付
け、 前記ワイヤ(19)を繰り出して前記ルツボ(17)の上方で前
記ルツボ(17)の開口部の一部を覆うように前記反射部材
(26)の円板(27)を水平に保持し、 前記ルツボ(17)を加熱して前記塊状物又は粒状物(29)を
融解するシリコンの融解方法。
2. Blocks or granules made of silicon (29)
Into a crucible (17) provided inside the furnace body, and a rotating / pulling-up mechanism (18) provided above the furnace body (11).
For seed crystal suspended from wire through wire (19)
The rod (28) of the reflecting member (26) according to claim 1 is attached to (21), and the wire (19) is fed out to partially open the crucible (17) above the crucible (17). The reflecting member to cover
A silicon melting method in which the disk (27) of (26) is held horizontally, and the crucible (17) is heated to melt the lump or the granular material (29).
JP2000021117A 2000-01-31 2000-01-31 Single crystal growth apparatus and silicon melting method using the same Expired - Fee Related JP3873561B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000021117A JP3873561B2 (en) 2000-01-31 2000-01-31 Single crystal growth apparatus and silicon melting method using the same

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Application Number Priority Date Filing Date Title
JP2000021117A JP3873561B2 (en) 2000-01-31 2000-01-31 Single crystal growth apparatus and silicon melting method using the same

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Publication Number Publication Date
JP2001213691A true JP2001213691A (en) 2001-08-07
JP3873561B2 JP3873561B2 (en) 2007-01-24

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Country Link
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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009081523A1 (en) * 2007-12-25 2009-07-02 Shin-Etsu Handotai Co., Ltd. Single-crystal manufacturing apparatus and manufacturing method
JP2009292673A (en) * 2008-06-04 2009-12-17 Sumco Corp Apparatus for growing silicon single crystal and method for melting silicon raw material
KR101193083B1 (en) 2010-12-17 2012-10-19 주식회사 엘지실트론 Insulating member and apparatus for manufacturing silicon single crystal ingot including the same
JP2015199653A (en) * 2014-04-03 2015-11-12 環球晶圓股▲ふん▼有限公司 Growth unit of crystal and heat insulation cover therefor
WO2022049034A1 (en) * 2020-09-01 2022-03-10 Globalwafers Co., Ltd. Crystal pulling systems having a cover member for covering the silicon charge and methods for growing a melt of silicon in a crucible assembly

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009081523A1 (en) * 2007-12-25 2009-07-02 Shin-Etsu Handotai Co., Ltd. Single-crystal manufacturing apparatus and manufacturing method
JP2009155131A (en) * 2007-12-25 2009-07-16 Shin Etsu Handotai Co Ltd Single-crystal manufacturing apparatus and manufacturing method
DE112008003322T5 (en) 2007-12-25 2010-11-25 Shin-Etsu Handotai Co., Ltd. Apparatus and method for producing a single crystal
US8337616B2 (en) 2007-12-25 2012-12-25 Shin-Etsu Handotai Co., Ltd. Apparatus and method for producing single crystal
KR101473788B1 (en) 2007-12-25 2014-12-17 신에쯔 한도타이 가부시키가이샤 Single-crystal manufacturing apparatus and manufacturing method
JP2009292673A (en) * 2008-06-04 2009-12-17 Sumco Corp Apparatus for growing silicon single crystal and method for melting silicon raw material
KR101193083B1 (en) 2010-12-17 2012-10-19 주식회사 엘지실트론 Insulating member and apparatus for manufacturing silicon single crystal ingot including the same
JP2015199653A (en) * 2014-04-03 2015-11-12 環球晶圓股▲ふん▼有限公司 Growth unit of crystal and heat insulation cover therefor
WO2022049034A1 (en) * 2020-09-01 2022-03-10 Globalwafers Co., Ltd. Crystal pulling systems having a cover member for covering the silicon charge and methods for growing a melt of silicon in a crucible assembly

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