JP2001194286A5 - - Google Patents

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Publication number
JP2001194286A5
JP2001194286A5 JP2000001026A JP2000001026A JP2001194286A5 JP 2001194286 A5 JP2001194286 A5 JP 2001194286A5 JP 2000001026 A JP2000001026 A JP 2000001026A JP 2000001026 A JP2000001026 A JP 2000001026A JP 2001194286 A5 JP2001194286 A5 JP 2001194286A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000001026A
Other languages
Japanese (ja)
Other versions
JP2001194286A (ja
JP4370032B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2000001026A priority Critical patent/JP4370032B2/ja
Priority claimed from JP2000001026A external-priority patent/JP4370032B2/ja
Priority to US09/550,255 priority patent/US6545276B1/en
Publication of JP2001194286A publication Critical patent/JP2001194286A/ja
Publication of JP2001194286A5 publication Critical patent/JP2001194286A5/ja
Application granted granted Critical
Publication of JP4370032B2 publication Critical patent/JP4370032B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2000001026A 1999-04-14 2000-01-06 近接場光学顕微鏡装置 Expired - Fee Related JP4370032B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2000001026A JP4370032B2 (ja) 2000-01-06 2000-01-06 近接場光学顕微鏡装置
US09/550,255 US6545276B1 (en) 1999-04-14 2000-04-14 Near field optical microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000001026A JP4370032B2 (ja) 2000-01-06 2000-01-06 近接場光学顕微鏡装置

Publications (3)

Publication Number Publication Date
JP2001194286A JP2001194286A (ja) 2001-07-19
JP2001194286A5 true JP2001194286A5 (fr) 2007-06-14
JP4370032B2 JP4370032B2 (ja) 2009-11-25

Family

ID=18530285

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000001026A Expired - Fee Related JP4370032B2 (ja) 1999-04-14 2000-01-06 近接場光学顕微鏡装置

Country Status (1)

Country Link
JP (1) JP4370032B2 (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4332644B2 (ja) * 2003-09-05 2009-09-16 独立行政法人産業技術総合研究所 光学測定方法および装置
JP4522884B2 (ja) * 2005-02-17 2010-08-11 株式会社資生堂 試料の光抽出性能の評価方法及び試料の光抽出性能の評価装置
JP4756270B2 (ja) * 2006-07-13 2011-08-24 独立行政法人産業技術総合研究所 光学分光測定方法及び装置
JP5033609B2 (ja) * 2007-03-12 2012-09-26 株式会社日立製作所 走査プローブ顕微鏡およびこれを用いた試料の観察方法
FR2920538B1 (fr) * 2007-09-04 2009-11-20 Centre Nat Rech Scient Dispositif de detection heterodyne pour l'imagerie d'un objet par retroinjection
JP5504418B2 (ja) * 2008-07-07 2014-05-28 株式会社東芝 プラズモン評価方法およびプラズモン評価装置
JP5802417B2 (ja) * 2011-04-04 2015-10-28 株式会社日立製作所 走査プローブ顕微鏡およびこれを用いた測定方法
KR101531102B1 (ko) * 2013-06-26 2015-06-24 한국과학기술원 빛의 산란을 이용한 근접장 제어 장치 및 방법

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