JP2001170796A - Resin flux cored solder and soldering method - Google Patents

Resin flux cored solder and soldering method

Info

Publication number
JP2001170796A
JP2001170796A JP35210399A JP35210399A JP2001170796A JP 2001170796 A JP2001170796 A JP 2001170796A JP 35210399 A JP35210399 A JP 35210399A JP 35210399 A JP35210399 A JP 35210399A JP 2001170796 A JP2001170796 A JP 2001170796A
Authority
JP
Japan
Prior art keywords
flux
weight
solder
vinyl acetate
ethylene
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP35210399A
Other languages
Japanese (ja)
Other versions
JP4307666B2 (en
Inventor
Yoshito Hamada
好人 浜田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Uchihashi Estec Co Ltd
Original Assignee
Uchihashi Estec Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Uchihashi Estec Co Ltd filed Critical Uchihashi Estec Co Ltd
Priority to JP35210399A priority Critical patent/JP4307666B2/en
Publication of JP2001170796A publication Critical patent/JP2001170796A/en
Application granted granted Critical
Publication of JP4307666B2 publication Critical patent/JP4307666B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Compositions Of Macromolecular Compounds (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide resin flux cored solder which is capable of sufficiently preventing migration and well preventing flux splashing and allows the effective utilization of flux residues as insulating films in soldering by the resin flux cored solder. SOLUTION: The flux containing 1 to 50 wt.%. more preferably 5 to 30 wt.% ethylene-vinyl acetate copolymer having a melt flow rate of >=500 g/10 min or/and 1 to 50 wt.%. more preferably 5 to 30 wt.% ethylene-vinyl acetate copolymer having a melt flow rate of >=500 g/10 min or/and 5 to 40 wt.% fatty acid amide or/and fatty acid bisamide and rosin or/and denatured rosin and activator is built into the solder.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明はやに入りはんだ及びその
やに入りはんだを用いたはんだ付け方法に関するもので
ある。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a cored solder and a soldering method using the cored solder.

【0002】[0002]

【従来の技術】はんだ付けには、フラックスが不可欠で
あり、電子・電気機器、特に民生用電子機器や精密電子
機器のはんだ付けには、フラックスを内蔵させた線状は
んだ、すなわち、やに入りはんだが多用されている。こ
のフラックスの作用は、母材表面の酸化膜を除去して清
浄にすること、母材表面やはんだ表面に空気遮断膜を形
成して酸化を防止すること、はんだの界面張力を減少し
て濡れ性を高めること等にある。
2. Description of the Related Art Flux is indispensable for soldering. For soldering of electronic and electric equipment, particularly for consumer electronic equipment and precision electronic equipment, a linear solder having a built-in flux, that is, a flux. Solder is frequently used. The effect of this flux is to remove the oxide film on the surface of the base material to clean it, to form an air barrier film on the surface of the base material and solder to prevent oxidation, and to reduce the interfacial tension of the solder and get wet. To improve the performance.

【0003】従来のやに入りはんだにおけるフラックス
には、主成分のロジンのみでは、活性力が弱く、上記の
作用を充分に達成し難いので、有機アミンのハロゲン化
水素酸塩、有機酸、有機酸と有機アミンの塩等の活性剤
を添加している。
[0003] Conventional flux in flux cored solder has a weak active power only with rosin as a main component, and it is difficult to sufficiently achieve the above-mentioned effects. Therefore, hydrohalides of organic amines, organic acids, Activators such as salts of acids and organic amines are added.

【0004】しかし、活性剤添加のもとでは、はんだ付
け後のフラックス残渣と母材との錯化物生成反応による
導体侵食が発生し易い。そこで、フラックス残渣による
母材(導体)の腐食を防止し得る耐腐食性フラックスの
提案(特開平3−238195号公報、特公4−335
57号公報等)、インサ−キットテスタのプロ−ブピン
接触不良回避のための低固形分化フラックスの提案等が
なされている。
However, under the addition of an activator, conductor erosion is likely to occur due to a reaction of forming a complex between the flux residue after soldering and the base material. Therefore, a corrosion-resistant flux capable of preventing the corrosion of the base material (conductor) due to the flux residue has been proposed (Japanese Unexamined Patent Publication No. Hei 3-238195, Japanese Patent Publication No. 4-335).
No. 57, etc.), and a low solid differentiation flux for avoiding poor probe pin contact of an in-circuit tester has been proposed.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、本発明
者においては、上記フラックス残渣に伴う問題として、
回路基板使用中でのヒ−トサイクルに基づくフラックス
残渣のクラックに起因して発生するマイグレ−ションが
重要であることを知った。
However, the present inventor has set forth the following problems associated with the flux residue.
It was found that the migration caused by cracking of the flux residue due to the heat cycle during use of the circuit board was important.

【0006】すなわち、回路基板使用中でのヒ−トサイ
クルによりフラックス残渣に熱応力クラックが発生し、
このクラックで吸湿水分とフラックス残渣からの溶出イ
オン(例えば、ハロゲンイオン)のために電解質溶液が
生成され、回路基板の電圧印加下、この電解質溶液に微
弱電流が流れ、その結果、陽極側の導体が電気分解反応
により溶出され、この溶出導体材イオンが陰極側導体に
おいて放電し析出し、この導体材原子が陽極側に向い樹
枝状に成長し、遂には、両導体間が短絡するに至る場合
がある
That is, heat stress cracks occur in the flux residue due to the heat cycle during use of the circuit board,
In the cracks, an electrolyte solution is generated due to moisture absorbed and ions eluted from the flux residue (eg, halogen ions), and a weak current flows through the electrolyte solution under the application of a voltage to a circuit board. Is eluted by the electrolysis reaction, and the eluted conductor material ions are discharged and precipitated in the cathode-side conductor, and the conductor material atoms grow in a dendritic shape toward the anode side, eventually causing a short circuit between both conductors. There is

【0007】而るに、上記耐腐食性フラックスでは、か
かるマイグレ−ションの効果的な防止が困難である。そ
こで、本発明者においては、かかるフラックス残渣のヒ
−トサイクル下でのクラックの発生を防止するための手
段を鋭意究明した結果、メルトフロ−レ−トが500g
/10min以上のエチレン・酢酸ビニル共重合体をフラッ
クスに含有させることが有効であることを知った。
However, it is difficult to effectively prevent such migration with the above corrosion-resistant flux. The inventor of the present invention has intensively studied means for preventing the generation of cracks in the heat cycle of the flux residue, and as a result, the melt flow rate was 500 g.
It has been found that it is effective to include an ethylene / vinyl acetate copolymer of / 10 min or more in the flux.

【0008】従来、メルトフロ−レ−トが低い高分子量
のエチレン・酢酸ビニル共重合体をフラックスの一成分
として使用することは公知である。例えば、特開昭55
−54298号公報や特開昭56−6798号公報に
は、「やに入りはんだ(フラックス内蔵線状はんだ)の
フラックスの熱膨張による爆裂飛散を防止するためにフ
ラックス層をはんだ表面に被覆したフラックス被覆線状
はんだにおいて、フラックスにエチレン・酢酸ビニル共
重合体を添加すること」が開示されている。
Hitherto, it has been known to use an ethylene / vinyl acetate copolymer having a low melt flow rate and a high molecular weight as one component of a flux. For example, Japanese Patent Application Laid-Open
JP-A-54298 and JP-A-56-6798 disclose a flux in which a flux layer is coated on a solder surface in order to prevent the explosion of the flux of a flux cored solder (linear solder with built-in flux) due to thermal expansion. Addition of an ethylene / vinyl acetate copolymer to a flux in a coated linear solder ”.

【0009】しかしながら、この場合は、フラックス被
覆線状はんだにある程度の耐接触摩耗性を付与する必要
があり、メルトフロ−レ−トが500g/10min以上の超
低分子量の低強度のエチレン・酢酸ビニル共重合体では
機械的強度が弱く不適当である。
However, in this case, it is necessary to impart a certain degree of contact wear resistance to the flux-coated linear solder, and the melt flow rate is 500 g / 10 min or more, an ultra-low molecular weight low-strength ethylene / vinyl acetate. Copolymers are unsuitable because of their low mechanical strength.

【0010】ところが、本発明者においてはメルトフロ
−レ−トが500g/10min以上のエチレン・酢酸ビニル
共重合体を通常のフラックスに添加すれば、上記フラッ
クス残渣のヒ−トサイクルによるクラックの発生を充分
に防止し得てマイグレ−ションを排除でき、しかもフラ
ックス残渣をその絶縁性を安定に維持させ得て有効な絶
縁皮膜として利用できること知った。また、従来のやに
入りはんだでは、はんだ付け作業時でのフラックス飛散
が避けられないが、メルトフロ−レ−ト500g/10min
以上のエチレン・酢酸ビニル共重合体の添加のもとで
は、その飛散をよく防止して上記絶縁皮膜としての利用
を効果的に達成できることを知った。
However, the present inventor has found that if an ethylene / vinyl acetate copolymer having a melt flow rate of 500 g / 10 min or more is added to a normal flux, the occurrence of cracks due to the heat cycle of the flux residue will be prevented. It has been found that migration can be sufficiently prevented, migration can be eliminated, and the flux residue can be used as an effective insulating film by maintaining its insulating property stably. In addition, in the case of the conventional cored solder, flux scatter during the soldering work cannot be avoided, but the melt flow rate is 500 g / 10 min.
With the addition of the ethylene / vinyl acetate copolymer described above, it has been found that the scattering can be prevented well and the use as the insulating film can be effectively achieved.

【0011】本発明の目的は、かかる知見を基礎とし、
やに入りはんだによるはんだ付けにおいて、マイグレ−
ションを充分に防止でき、かつフラックス飛散をよく防
止してフラックス残渣を絶縁皮膜として有効に利用でき
るやに入りはんだ及びそのやに入りはんだを使用しての
はんだ付け方法を提供することにある。
The object of the present invention is based on this finding,
When soldering with flaky solder,
It is an object of the present invention to provide a flux cored solder and a soldering method using the flux cored solder, which can sufficiently prevent the application of flux and effectively prevent the flux from scattering and can effectively utilize the flux residue as an insulating film.

【0012】[0012]

【課題を解決するための手段】本発明に係るやに入りは
んだは、メルトフロ−レ−ト500g/10min以上のエチ
レン・酢酸ビニル共重合体1〜50重量%、好ましくは
5〜30重量%とロジンまたは/および変性ロジンと活
性剤を含有するフラックス、またはメルトフロ−レ−ト
500g/10min以上のエチレン・酢酸ビニル共重合体1
〜50重量%、好ましくは5〜30重量%と脂肪酸アミ
ドまたは/および脂肪酸ビスアミド5〜40重量%、好
ましくは10〜25重量%とロジンまたは/および変性
ロジンと活性剤を含有するフラックスを内蔵させたこと
を特徴とする構成であり、メルトフロ−レ−ト500g
/10min以上のエチレン・酢酸ビニル共重合体1〜50
重量%、好ましくは5〜30重量%と残部がロジンまた
は/および変性ロジンと活性剤である組成を主成分とす
るフラックス、またはメルトフロ−レ−ト500g/10m
in以上のエチレン・酢酸ビニル共重合体1〜50重量
%、好ましくは5〜30重量%と脂肪酸アミドまたは/
および脂肪酸ビスアミド5〜40重量%、好ましくは1
0〜 25重量%と残部がロジンまたは/および変性
ロジンと活性剤である組成を主成分とするフラックスを
内蔵させた態様で実施することができる。
According to the present invention, the sheath solder contains 1 to 50% by weight, preferably 5 to 30% by weight of an ethylene / vinyl acetate copolymer having a melt flow rate of 500 g / 10 min or more. Flux containing rosin and / or modified rosin and activator, or ethylene / vinyl acetate copolymer 1 having a melt flow rate of 500 g / 10 min or more
A flux containing 5050% by weight, preferably 5-30% by weight, fatty acid amide or / and fatty acid amide 5-40% by weight, preferably 10-25% by weight, rosin or / and modified rosin and an activator; Melt flow rate 500 g
/ 10min or more ethylene-vinyl acetate copolymer 1-50
% By weight, preferably 5 to 30% by weight, with the balance being rosin and / or modified rosin and an activator as a main component, or a melt flow rate 500 g / 10 m
1 to 50% by weight, preferably 5 to 30% by weight of ethylene-vinyl acetate copolymer of at least
And fatty acid bisamide 5 to 40% by weight, preferably 1
It can be carried out in a mode in which a flux containing 0 to 25% by weight, the balance being rosin or / and modified rosin, and a composition which is an activator as a main component is incorporated.

【0013】本発明に係るはんだ付け方法は、上記のや
に入りはんだを用いてはんだ付けを行い、はんだ付け後
のフラックス残渣を絶縁皮膜として残すことを特徴とす
る構成である。
The soldering method according to the present invention is characterized in that soldering is performed using the above-mentioned solder for soldering, and the flux residue after soldering is left as an insulating film.

【0014】上記メルトフロ−レ−トは、JISK72
10−1976に基づき測定され、内径φ9.50±
0.03mmの貫通孔を有し、その孔の下端に内径φ
2.095±0.005mmのダイを装着したヒ−タ付
きシリンダ−の孔に試料を充填し、上端に錘を取り付け
たピストンの下端部を上記の孔に挿入する試験装置にを
使用して、錘の重量325gf{3.185N}とし、
試験温度を125℃としたときの10分間における押出
量X(g)を測定し、Xg/10分から求められる。
The above melt flow rate is JIS K72.
Measured based on 10-1976, inner diameter φ9.50 ±
It has a through hole of 0.03 mm, and the inner diameter φ
A sample is filled in the hole of a heater cylinder equipped with a 2.095 ± 0.005 mm die, and the lower end of a piston having a weight attached to the upper end is inserted into the above hole using a test apparatus. , Weight of weight 325gf {3.185N},
The amount of extrusion X (g) for 10 minutes when the test temperature is set to 125 ° C. is measured, and is obtained from Xg / 10 minutes.

【0015】上記の脂肪酸アミド/脂肪酸ビスアミド
は、フラックス残渣の粘着性を抑制すると共にフラック
ス切れ(やに入りはんだ内でのフラックス欠在箇所の発
生)を防止するために用いられ、例えば、ステアリン酸
アミド/ステアリン酸ビスアミド、パルミチン酸アミド
等の一種または二種以上を使用できる。
The above-mentioned fatty acid amide / fatty acid bisamide is used for suppressing the stickiness of the flux residue and for preventing the flux from being cut off (the occurrence of a flux deficient portion in the entangled solder). One or more kinds of amide / stearic acid bisamide, palmitic amide and the like can be used.

【0016】上記ロジンまたは/および変性ロジンに
は、天然ロジン、重合ロジン、フェノ−ル変性ロジン、
マレイン化ロジン、水素添加ロジン等を使用できる。
The rosin and / or modified rosin includes natural rosin, polymerized rosin, phenol-modified rosin,
Maleated rosin, hydrogenated rosin and the like can be used.

【0017】上記活性剤としては、有機アミンのハロゲ
ン化水素酸塩、有機酸、有機酸と有機アミンの塩等を使
用できる。例えば、ジエチルアミン塩酸塩、シクロヘキ
シルアミン塩酸塩、ジオクチルアミン塩酸塩、プロピル
アミン塩酸塩、ジエチルアミン臭化水素酸塩、シクロヘ
キシルアミン臭化水素酸塩、ジオクチルアミン臭化水素
酸塩、プロピルアミン臭化水素酸塩、グルタル酸、アジ
ピン酸、セバシン酸、メチルマレイン酸、アジピン酸シ
クロヘキシルアミン塩等を使用できる。
As the activator, a hydrohalide of an organic amine, an organic acid, a salt of an organic acid and an organic amine, and the like can be used. For example, diethylamine hydrochloride, cyclohexylamine hydrochloride, dioctylamine hydrochloride, propylamine hydrochloride, diethylamine hydrobromide, cyclohexylamine hydrobromide, dioctylamine hydrobromide, propylamine hydrobromide Salts, glutaric acid, adipic acid, sebacic acid, methyl maleic acid, cyclohexylamine adipate and the like can be used.

【0018】上記メルトフロ−レ−ト500g/10min以
上のエチレン・酢酸ビニル共重合体1〜50重量%、好
ましくは5〜30重量%とロジンまたは/および変性ロ
ジンと活性剤を含有するフラックス、またはメルトフロ
−レ−ト500g/10min以上のエチレン・酢酸ビニル共
重合体1〜50重量%、好ましくは5〜30重量%と脂
肪酸アミドまたは/および脂肪酸ビスアミド5〜40重
量%とロジンまたは/および変性ロジンと活性剤を含有
するフラックスには、必要に応じ添加剤を添加すること
もできる。たとえば、フラックス残渣による導体腐食を
抑制するための腐食抑制剤(例えば、フタル酸、ベンゾ
トリアゾ−ル化合物、没食子酸エステル例えば没食子酸
n−プロピル等)、酸化防止剤(例えば、ジブチルクレ
ゾール等)等を添加することもでき、その添加量は前記
主成分100重量部に対し1〜3重量部とされる。
A flux containing 1 to 50% by weight, preferably 5 to 30% by weight of an ethylene / vinyl acetate copolymer having a melt flow rate of 500 g / 10 min or more and rosin or / and modified rosin and an activator, or 1 to 50% by weight, preferably 5 to 30% by weight of an ethylene / vinyl acetate copolymer having a melt flow rate of 500 g / 10min or more, 5 to 40% by weight of a fatty acid amide or / and a fatty acid bisamide and rosin or / and modified rosin If necessary, an additive may be added to the flux containing the and the activator. For example, a corrosion inhibitor (for example, phthalic acid, benzotriazole compound, gallic acid ester such as n-propyl gallate, etc.) for suppressing conductor corrosion due to flux residue, an antioxidant (for example, dibutyl cresol, etc.) and the like are used. It can be added, and the amount of addition is 1 to 3 parts by weight based on 100 parts by weight of the main component.

【0019】本発明に係るやに入りはんだのはんだは、
特に限定されることがなく、Sn63重量%−残部Pb
の外、例えばSn60重量%−残部Pb、Sn50重量
%−残部Pb、Sn45重量%−残部Pb、Sn40重
量%−残部Pb、Sn62重量%−Ag2重量%−残部
Pb、Sn60重量%−Ag4重量%−残部Pb、Sn
46重量%−Bi8重量%−残部Pb、Sn57重量%
−Bi3重量%−残部Pb、Ag3.5重量%−Cu
0.75重量%−残部Sn、Sb5重量%−残部Sn等
も使用できる。
The solder of the cored solder according to the present invention is:
There is no particular limitation, and 63% by weight of Sn-remainder Pb
In addition, for example, Sn 60% by weight-balance Pb, Sn 50% by weight-balance Pb, Sn 45% by weight-balance Pb, Sn 40% by weight-balance Pb, Sn 62% by weight-Ag 2% by weight-balance Pb, Sn 60% by weight-Ag 4% by weight -Balance Pb, Sn
46% by weight-Bi 8% by weight-balance Pb, Sn 57% by weight
-Bi 3% by weight-Residual Pb, Ag 3.5% by weight-Cu
0.75% by weight-balance Sn, Sb 5% by weight-balance Sn and the like can also be used.

【0020】本発明に係るやに入りはんだの形状は、フ
ラックスを内蔵するものであれば、特に限定されず、ま
た、いわゆるVカットを形成することもできる。また、
フラックス量は、通常1.0重量%〜4.0重量%とさ
れ、標準品は2〜3重量%とされる。
The shape of the solder according to the present invention is not particularly limited as long as it has a built-in flux, and a so-called V-cut can also be formed. Also,
The flux amount is usually 1.0% by weight to 4.0% by weight, and the standard amount is 2 to 3% by weight.

【0021】本発明に係るやに入りはんだは、主に、鏝
を用いての電子機器のいわゆる後付けに使用され、フラ
ックス残渣が絶縁皮膜として残される。
The cored solder according to the present invention is mainly used for so-called retrofitting of electronic equipment using a trowel, and a flux residue is left as an insulating film.

【0022】本発明に係るやに入りはんだにおけるフラ
ックスに添加しているメルトフロ−レ−ト500g/10m
in以上のエチレン・酢酸ビニル共重合体は、分子量が極
めて低いために機械的強度が極めて低いが、酢酸ビニル
基のためにゴム弾性を呈して応力を吸収する機能を有す
るから、機械的強度が極めて低いにもかかわらず、応力
に対し分子鎖が破断し難く、繰返し加熱に対しクラック
の発生をよく防止できる。従って、ヒ−トサイクルに曝
されても、フラックス残渣の熱応力クラックの発生を充
分に防止でき、マイグレ−ションをよく排除できる。
The melt flow rate added to the flux in the cored solder according to the present invention is 500 g / 10 m.
The ethylene-vinyl acetate copolymer of in or more has extremely low mechanical strength due to its extremely low molecular weight, but has the function of absorbing rubber stress by exhibiting rubber elasticity due to the vinyl acetate group. Despite being extremely low, the molecular chains are hardly broken by stress, and cracks can be well prevented by repeated heating. Therefore, even when exposed to a heat cycle, the occurrence of thermal stress cracks in the flux residue can be sufficiently prevented, and migration can be eliminated well.

【0023】本発明に係るやに入りはんだを使用しては
んだ付けすると、はんだ付けの際でのフラックスの飛散
をよく防止できる。その理由は、フロ−レ−ト500g
/10min以上のエチレン・酢酸ビニル共重合体が、分子
量が極めて低いために融点が低いが、酢酸ビニル基のた
めにゴム弾性を呈し粘弾性を有するためと推定される。
When soldering is performed by using the core solder according to the present invention, scattering of the flux at the time of soldering can be prevented well. The reason is the flow rate 500g
It is presumed that the ethylene / vinyl acetate copolymer of / 10 min or more has a very low molecular weight and a low melting point, but exhibits rubber elasticity and viscoelasticity due to the vinyl acetate group.

【0024】上記エチレン・酢酸ビニル共重合体の酢酸
ビニル含有量は20〜40%とすることが好ましい(2
0%以下ではゴム的性質が不足しクラック発生防止に適
合せず、40%以上では粘着性が増してフラックス残渣
に埃が付着し易くなる)。
The ethylene / vinyl acetate copolymer preferably has a vinyl acetate content of 20 to 40% (2
If it is 0% or less, the rubber property is insufficient and it is not suitable for preventing the occurrence of cracks, and if it is 40% or more, the tackiness increases and dust easily adheres to the flux residue.)

【0025】本発明に係るやに入りはんだにおけるフラ
ックスは、エチレン・酢酸ビニル共重合体を添加してい
るにもかかわらず、メルトフロ−レ−トが500g/10m
in以上の流動性のエチレン・酢酸ビニル共重合体を使用
しているから、はんだの濡れをよく促進でき、はんだ付
けに要求される濡れ性も充分に保証できる。このエチレ
ン・酢酸ビニル共重合体のメルトフロ−レ−トの好まし
い範囲は、800〜2000g/10min以下である(20
00g/10min以上ではフラックス残渣に埃が付着し易く
なる)。
The flux in the cored solder according to the present invention has a melt flow rate of 500 g / 10 m2 despite the addition of the ethylene / vinyl acetate copolymer.
Since an ethylene / vinyl acetate copolymer having fluidity of in or more is used, the wettability of the solder can be promoted well, and the wettability required for soldering can be sufficiently ensured. The preferred range of the melt flow rate of the ethylene / vinyl acetate copolymer is 800 to 2000 g / 10 min or less (20
If it is more than 00 g / 10 min, dust easily adheres to the flux residue.)

【0026】上記フラックスのエチレン・酢酸ビニル共
重合体の添加量を1〜50重量%とする理由は、1%未
満ではフラックス残渣のクラック発生防止を満足に達成
し難く、50重量%を越えるとフラックス残渣に埃が付
着し易くこの付着埃の吸湿によるフラック残渣の表面抵
抗の低下が過大となるからである。
The reason why the addition amount of the ethylene / vinyl acetate copolymer in the above flux is 1 to 50% by weight is that if it is less than 1%, it is difficult to satisfactorily prevent the generation of cracks in the flux residue, and if it exceeds 50% by weight. This is because dust easily adheres to the flux residue, and the moisture absorption of the attached dust excessively reduces the surface resistance of the flux residue.

【0027】本発明に係るやに入りはんだにおけるフラ
ックスの残渣は、ロジン等に較べて絶縁抵抗に優れたエ
チレン・酢酸ビニル共重合体を含有しているから、上記
クラックレスのもとで充分に絶縁皮膜として機能させ
得、はんだ付け部を電解腐食等の発生無く安定に保持で
きる。従って、フラックス残渣を絶縁皮膜として有効に
使用してはんだ付けの信頼性を向上できる。
The flux residue in the flux cored solder according to the present invention contains an ethylene / vinyl acetate copolymer having excellent insulation resistance as compared with rosin or the like. It can function as an insulating film and can stably hold a soldered portion without occurrence of electrolytic corrosion or the like. Therefore, the reliability of soldering can be improved by effectively using the flux residue as an insulating film.

【0028】[0028]

【実施例】〔実施例1〕天然ロジン24重量%、水添ロ
ジン23重量%、ステアリン酸アミド30重量%、メル
トフロ−レ−ト1000g/10minのエチレン・酢酸ビニ
ル共重合体20重量%、シクロヘキシルアミン臭化水素
酸塩2重量%(活性剤)、ジブロモプロパノ−ル1重量
%(活性剤)の組成のフラックスをはんだロッド(Sn
63重量%−残部Pb)中に充填し、線引きによって線
径1.6mmφ、フラックス内蔵量2重量%のやに入り
はんだを製作した。
EXAMPLES Example 1 24% by weight of natural rosin, 23% by weight of hydrogenated rosin, 30% by weight of stearamide, 20% by weight of ethylene / vinyl acetate copolymer of melt flow rate 1000g / 10min, cyclohexyl A flux having a composition of 2% by weight of amine hydrobromide (activator) and 1% by weight of dibromopropanol (activator) was applied to a solder rod (Sn).
63% by weight-the remainder Pb) was filled, and a cored solder having a wire diameter of 1.6 mmφ and a built-in flux of 2% by weight was produced by wire drawing.

【0029】〔比較例1〕エチレン・酢酸ビニル共重合
体としメルトフロ−レ−ト400g/10minのものを使用
した以外、実施例1に同じとした。
Comparative Example 1 The procedure was the same as in Example 1 except that an ethylene / vinyl acetate copolymer having a melt flow rate of 400 g / 10 min was used.

【0030】〔比較例2〕実施例1に対し、天然ロジン
の配合量を34重量%、水添ロジンの配合量を33重量
%とし、エチレン・酢酸ビニル共重合体を無配合とした
以外、実施例1に同じとした。
Comparative Example 2 The procedure of Example 1 was repeated except that the blending amount of natural rosin was 34% by weight, the blending amount of hydrogenated rosin was 33% by weight, and the ethylene / vinyl acetate copolymer was not blended. Same as Example 1.

【0031】これらの実施例及び比較例につき、JIS
Z 3197−1986はんだ付け用樹脂系フラック
ス試験方法 6.10広がり試験に基づき広がり率を測
定したところ(各試料数は20個とした)、実施例品1
は92%、比較例2は93%、比較例1は87%であ
り、実施例1ではフラックスにエチレン・酢酸ビニル共
重合体を添加しているにもかかわらず、メルトフロ−レ
−トを500g/10min以上としているので、通常のフラ
ックス(比較例2)使用の場合と同程度の優れた濡れ性
を保証できた。
According to these Examples and Comparative Examples, JIS
Z 3197-1986 Resin flux test method for soldering 6.10 The spread rate was measured based on the spread test (the number of each sample was 20).
Is 92%, Comparative Example 2 is 93%, and Comparative Example 1 is 87%. In Example 1, 500 g of the melt flow rate was added even though the ethylene / vinyl acetate copolymer was added to the flux. Since it was / 10 min or more, the same excellent wettability as in the case of using a normal flux (Comparative Example 2) could be guaranteed.

【0032】また、上記やに入りはんだ(何れも、Vカ
ットなし)を用いて350℃のはんだ鏝で回路基板の銅
ランド上にはんだ付けしたところ(各試料数は20個と
した)、実施例1、比較例1ではフラックス飛散が全く
生じなかった。これに対し、比較例2では20箇中14
箇にフラックス飛散が生じた。
When soldering was performed on the copper lands of the circuit board with a soldering iron at 350 ° C. using the above-mentioned flared solder (both without V-cut) (the number of each sample was 20). In Example 1 and Comparative Example 1, no flux was scattered. On the other hand, in Comparative Example 2, 14 out of 20
Flux was scattered in the section.

【0033】更に、これらのはんだ付け試料について、
−30℃30分間,+60℃30分間を1サイクルとす
るヒ−トサイクル試験を1000回行ったところ(各試
料数は20個とした)、実施例1並びに比較例1のもの
ではフラックス残渣にクラック発生が全く観察されなか
ったのに対し、比較例2のものでは多数のクラックの発
生が観られた。
Further, regarding these soldering samples,
When a heat cycle test was performed 1000 times (30 samples for 30 minutes at + 30 ° C. and 30 minutes for 30 minutes at + 60 ° C. (the number of each sample was 20)), the flux residue was not found in Examples 1 and Comparative Example 1. While no crack generation was observed, a large number of cracks were generated in Comparative Example 2.

【0034】また、上記の実施例1及び比較例1、2の
各やに入りはんだを用いてはんだ付けしたものについて
(各試料数は20個とした)、フラックス残渣を付けた
ままで温度40℃×相対湿度92%×2000時間放置
したのち、表面絶縁抵抗値を測定したところ、実施例1
及び比較例1のものでは初期表面絶縁抵抗値に対し1桁
以内の低下にとどまっていたが、比較例2のものでは3
桁以上の低下であった。
In each of the above Examples 1 and Comparative Examples 1 and 2, each of which was soldered using a cored solder (the number of samples was 20), the temperature was 40 ° C. with the flux residue attached. × Relative humidity 92% × After leaving for 2,000 hours, the surface insulation resistance was measured.
And in the case of Comparative Example 1, the initial surface insulation resistance value was reduced by one digit or less, but in the case of Comparative Example 2, it was 3%.
It was a drop of more than an order of magnitude.

【0035】また、間隔が0.5mmの厚膜法による銀
電極間に、上記の実施例1及び比較例1、2で使用した
各フラックスを塗布し、温度40℃、相対湿度92%の
もとで、直流電圧100ボルトを1000時間印加後観
察したところ、実施例1及び比較例1でのフラックスで
はマイグレ−ションの発生が観られなかったが、比較例
2のものではマイグレ−ションの発生が認められた。
Each of the fluxes used in Example 1 and Comparative Examples 1 and 2 was applied between silver electrodes formed by a thick film method with an interval of 0.5 mm. When a DC voltage of 100 volts was applied for 1000 hours and observed, no migration was observed with the flux of Example 1 and Comparative Example 1, but the migration of Comparative Example 2 was observed. Was observed.

【0036】〔実施例2〕天然ロジン14重量%、水添
ロジン13重量%、ステアリン酸アミド30重量%、メ
ルトフロ−レ−ト1000g/10minのエチレン・酢酸ビ
ニル共重合体40重量%、シクロヘキシルアミン臭化水
素酸塩2重量%(活性剤)、ジブロモプロパノ−ル1重
量%(活性剤)の組成のフラックスをはんだロッド(S
n63重量%−残部Pb)中に充填し、線引きによって
線径1.6mmφ、フラックス内蔵量2重量%のやに入
りはんだを製作した。この実施例品につき上記と同様に
して試験を行ったところ、広がり率が90%、溶融フラ
ックス飛散個数が0、フラックス残渣のクラック発生個
数が0、温度40℃×相対湿度92%×2000時間放
置後の表面絶縁抵抗値率1桁以内であり、実施例1に充
分に匹敵する結果であった。
Example 2 14% by weight of natural rosin, 13% by weight of hydrogenated rosin, 30% by weight of stearamide, 40% by weight of ethylene / vinyl acetate copolymer of melt flow rate 1000g / 10min, cyclohexylamine A flux having a composition of 2% by weight of hydrobromide (activator) and 1% by weight of dibromopropanol (activator) was applied to a solder rod (S
n63% by weight-remainder Pb) was filled, and a drawn solder having a wire diameter of 1.6 mmφ and a built-in flux of 2% by weight was produced by wire drawing. When a test was conducted on this example product in the same manner as described above, the spreading rate was 90%, the number of scattered molten flux was 0, the number of cracks generated in the flux residue was 0, the temperature was 40 ° C., the relative humidity was 92%, and the sample was left for 2,000 hours. The subsequent surface insulation resistance value was within one digit, and the result was sufficiently comparable to that of Example 1.

【0037】〔実施例3〕天然ロジン32重量%、水添
ロジン30重量%、ステアリン酸アミド30重量%、メ
ルトフロ−レ−ト1000g/10minのエチレン・酢酸ビ
ニル共重合体5重量%、シクロヘキシルアミン臭化水素
酸塩2重量%(活性剤)、ジブロモプロパノ−ル1重量
%(活性剤)の組成のフラックスをはんだロッド(Sn
63重量%−残部Pb)中に充填し、線引きによって線
径1.6mmφ、フラックス内蔵量2重量%のやに入り
はんだを製作した。この実施例品につき上記と同様にし
て試験を行ったところ、広がり率が95%、フラックス
飛散個数が20箇中2個、フラックス残渣のクラック発
生個数が20個中1個、温度40℃×相対湿度92%×
2000時間放置後の表面絶縁抵抗値率1桁以内であ
り、実施例1に充分に匹敵する結果であった。
Example 3 32% by weight of natural rosin, 30% by weight of hydrogenated rosin, 30% by weight of stearamide, 5% by weight of ethylene / vinyl acetate copolymer of 1000 g / 10 min melt flow rate, cyclohexylamine A flux composed of 2% by weight of hydrobromide (activator) and 1% by weight of dibromopropanol (activator) was applied to a solder rod (Sn).
63% by weight-the remainder Pb) was filled, and a cored solder having a wire diameter of 1.6 mmφ and a built-in flux of 2% by weight was produced by wire drawing. When a test was performed on the product of this example in the same manner as described above, the spreading rate was 95%, the number of scattered fluxes was 2 out of 20, the number of cracks generated in the flux residue was 1 out of 20, and the temperature was 40 ° C. × relative. Humidity 92% ×
The surface insulation resistance value after leaving for 2,000 hours was within one digit, and the result was sufficiently comparable to that of Example 1.

【0038】[0038]

【発明の効果】本発明にやに入りはんだよれば、優れた
フラックスの濡れ性のために濡れ不良なく良好にはんだ
付けでき、また、はんだ付け後でのフラックス残渣がヒ
−トサイクルに曝されても、その残渣のクラック発生を
防止してマイグレ−ションを排除でき、しかも、そのフ
ラックス残渣が絶縁性に優れ、かつ、はんだ付けの際に
フラックスの飛散をよく抑えて行い得そのフラックス残
渣をはんだ付け箇所に残存させてその残渣の絶縁性をは
んだ付け箇所の絶縁に有効に利用できるから、優れた作
業性、安全性のもとでやに入りはんだによるはんだ付け
を行うことができる。
According to the solder of the present invention, good solderability can be obtained without poor wetting due to excellent flux wettability, and flux residue after soldering is exposed to a heat cycle. However, migration can be prevented by preventing the generation of cracks in the residue, and the flux residue is excellent in insulating properties and can be performed while suppressing the scattering of the flux during soldering. Since the insulating property of the residue can be effectively used for insulating the soldering portion by being left at the soldering portion, soldering with a soft solder can be performed with excellent workability and safety.

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) // B23K 101:36 B23K 101:36 ──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat ゛ (Reference) // B23K 101: 36 B23K 101: 36

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】メルトフロ−レ−ト500g/10min以上の
エチレン・酢酸ビニル共重合体1〜50重量%、ロジン
または/および変性ロジン、活性剤を含有するフラック
スを内蔵させたことを特徴とするやに入りはんだ。
1. A flux containing 1 to 50% by weight of an ethylene / vinyl acetate copolymer having a melt flow rate of 500 g / 10 min or more, rosin or / and a modified rosin, and an activator. Fatigue solder.
【請求項2】メルトフロ−レ−ト500g/10min以上の
エチレン・酢酸ビニル共重合体1〜50重量%、脂肪酸
アミドまたは/および脂肪酸ビスアミド5〜40重量
%、ロジンまたは/および変性ロジン、活性剤を含有す
るフラックスを内蔵させたことを特徴とするやに入りは
んだ。
2. An ethylene / vinyl acetate copolymer having a melt flow rate of 500 g / 10 min or more, 1 to 50% by weight, fatty acid amide and / or fatty acid bisamide 5 to 40% by weight, rosin or / and modified rosin, activator Flux-cored solder characterized by having a built-in flux.
【請求項3】請求項1または2記載のやに入りはんだを
用いてはんだ付けを行い、はんだ付け後のフラックス残
渣を絶縁皮膜として残すことを特徴とするはんだ付け方
法。
3. A soldering method, wherein soldering is performed using the solder for soldering according to claim 1 or 2, and a flux residue after soldering is left as an insulating film.
JP35210399A 1999-12-10 1999-12-10 Filled solder and soldering method Expired - Fee Related JP4307666B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP35210399A JP4307666B2 (en) 1999-12-10 1999-12-10 Filled solder and soldering method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP35210399A JP4307666B2 (en) 1999-12-10 1999-12-10 Filled solder and soldering method

Publications (2)

Publication Number Publication Date
JP2001170796A true JP2001170796A (en) 2001-06-26
JP4307666B2 JP4307666B2 (en) 2009-08-05

Family

ID=18421808

Family Applications (1)

Application Number Title Priority Date Filing Date
JP35210399A Expired - Fee Related JP4307666B2 (en) 1999-12-10 1999-12-10 Filled solder and soldering method

Country Status (1)

Country Link
JP (1) JP4307666B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010046687A (en) * 2008-08-21 2010-03-04 Uchihashi Estec Co Ltd Flux for soldering and resin flux cored solder
JP2010075960A (en) * 2008-09-25 2010-04-08 Nippon Genma:Kk Flux composition, resin flux-cored solder, and solder paste
WO2013108663A1 (en) * 2012-01-17 2013-07-25 千住金属工業株式会社 Flux for flux-cored solder, and flux-cored solder
CN103264241A (en) * 2013-06-17 2013-08-28 北京朝铂航科技有限公司 Cored solder wire solid soldering flux capable of reducing flyoff

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010046687A (en) * 2008-08-21 2010-03-04 Uchihashi Estec Co Ltd Flux for soldering and resin flux cored solder
JP2010075960A (en) * 2008-09-25 2010-04-08 Nippon Genma:Kk Flux composition, resin flux-cored solder, and solder paste
WO2013108663A1 (en) * 2012-01-17 2013-07-25 千住金属工業株式会社 Flux for flux-cored solder, and flux-cored solder
JP2013146740A (en) * 2012-01-17 2013-08-01 Denso Corp Flux for resin flux cored solder, and resin flux cored solder
EP2805792A1 (en) * 2012-01-17 2014-11-26 Senju Metal Industry Co., Ltd. Flux for flux-cored solder, and flux-cored solder
KR101472723B1 (en) * 2012-01-17 2014-12-12 센주긴조쿠고교 가부시키가이샤 Flux for flux-cored solder, and flux-cored solder
EP2805792A4 (en) * 2012-01-17 2015-09-02 Senju Metal Industry Co Flux for flux-cored solder, and flux-cored solder
CN103264241A (en) * 2013-06-17 2013-08-28 北京朝铂航科技有限公司 Cored solder wire solid soldering flux capable of reducing flyoff
CN103264241B (en) * 2013-06-17 2015-04-01 北京朝铂航科技有限公司 Cored solder wire solid soldering flux capable of reducing flyoff

Also Published As

Publication number Publication date
JP4307666B2 (en) 2009-08-05

Similar Documents

Publication Publication Date Title
CN101939130B (en) Solder bonding structure and soldering flux
KR101163427B1 (en) Flux for lead-free solder and method of soldering
EP0520686B1 (en) Solder paste
US20190210161A1 (en) Lead-free solder alloy, solder paste, and electronic circuit board
KR101472723B1 (en) Flux for flux-cored solder, and flux-cored solder
JP6222412B1 (en) flux
JP2008062252A (en) Flux for soldering, and solder paste composition
EP2826589A1 (en) Flux, solder composition and method for producing electronic circuit mounting substrate
JP2006289493A (en) Sn-zn based solder, lead-free solder, its solder work, solder paste, and electronic component-soldering substrate
JP3656213B2 (en) Solder paste composition for reflow soldering and circuit board
JP2000141079A (en) Leadless solder alloy
CN85102604A (en) Resina-type flux of brazing
JP2001170796A (en) Resin flux cored solder and soldering method
JP4396162B2 (en) Lead-free solder paste
JP3446517B2 (en) Pb-free solder material and electronic equipment using the same
KR100509545B1 (en) Flux and Solder Comprising Such a Flux
JP2018202436A (en) Solder paste and solder joint
JP2004154864A (en) Lead-free soldering alloy
WO1995034401A1 (en) High-strength solder alloy
CA1245475A (en) Soldering compositions, fluxes and methods of use
JP3619972B2 (en) Flux composition for soldering
JP2006088205A (en) Manufacturing method of jointing material, and jointing material obtained by the method
JP3886650B2 (en) Flux, solder paste using the flux, and soldering method
JP2007069258A (en) Flux composition for soldering, resin flux cored solder, and solder paste
JP2902572B2 (en) Flux for flux cored solder

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20060922

A977 Report on retrieval

Effective date: 20090421

Free format text: JAPANESE INTERMEDIATE CODE: A971007

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Effective date: 20090428

Free format text: JAPANESE INTERMEDIATE CODE: A01

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20090430

R150 Certificate of patent (=grant) or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (prs date is renewal date of database)

Year of fee payment: 3

Free format text: PAYMENT UNTIL: 20120515

LAPS Cancellation because of no payment of annual fees