JP2001153906A - Instrument and method for measuring antenna - Google Patents

Abstract

PROBLEM TO BE SOLVED: To shorten the time necessary for measurement, and to make it unnecessary to use an extremely high-precision driver in case of a millimeter wave or submillimeter wave and reduce the manufacturing cost by making it unnecessary to measure a large number of two-dimensional electric field distributions, when measurement of two-dimensional electric field distribution is required as in neighboring field measurement, and doing without a measuring distance varying apparatus which requires high driving precision at some measuring wavelength when measuring distance is varied. SOLUTION: The amplitude distribution and the phase distribution of a two-dimensional electric field are field-converted at an imaginary wave source position of an unnecessary wave, and unnecessary wave components contained in the amplitude distribution and the phase distribution of the two-dimensional electric field are computed, and the unnecessary wave components are removed from the amplitude distribution and the phase distribution of the two-dimensional electric field.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an antenna measuring device and an antenna measuring method for measuring and evaluating the radiation characteristics and aperture distribution of an antenna, and more particularly to an electric field near a planar array antenna and a planar radome antenna.
The present invention relates to an antenna measuring apparatus and an antenna measuring method for quickly and accurately evaluating a mirror error of a millimeter-wave submillimeter-wave reflector antenna.

[0002]

2. Description of the Related Art FIG. 11 shows a method of measuring a far-field radiation pattern for removing a reflected wave by changing a measurement distance, for example, IEICE Transactions (B-II), Vol. J80-BI
I, No. 3, pp. 248-256, is a configuration diagram showing a conventional antenna measuring apparatus shown in March 1997, wherein 1 is a transmitter, 2 is a test antenna connected to the transmitter 1, and 3 is a receiver. 4 is a measuring probe connected to 4, 4 is a receiver, 5 is a flat scanner that scans the measuring probe 3 two-dimensionally, 6 is a scanner control device that controls scanning of the flat scanner 5, 7 is a measuring probe 3 A pattern display that stores and visualizes the received electric field,
8 is a measurement distance variable mechanism that drives the test antenna 2 and changes the distance between the test antenna 2 and the measurement probe 3;
Reference numeral 9 denotes a measurement distance controller that controls the measurement distance variable mechanism 8 and repeats driving / resting of the test antenna 2. Reference numeral 10 denotes a pattern arithmetic processing unit that changes the measurement distance and performs a Fourier transform on the received electric field with respect to the measurement distance. It is.

Next, the operation will be described. The radio wave transmitted from the transmitter 1 is radiated from the test antenna 2. The radio wave radiated into this space is received by the measurement probe 3 and taken out by the receiver 4 as a reception signal.

[0004] This received signal contains various measurement errors. The reason is that, in a measurement environment where nothing exists other than the test antenna 2, the received signal when the radio wave radiated from the test antenna 2 is received by the measurement probe 3 becomes the original measurement amount. Looking at the measurement environment of
Since the transmitter 1, the receiver 4 and the plane scanner 5 exist as scatterers, and furthermore, radio waves are scattered by the influence of a building in indoor measurement and by the influence of the surrounding environment in outdoor measurement, various measurement errors occur in the received signal. included.

Therefore, the conventional device (hereinafter referred to as conventional device 1)
In order to remove the measurement error, the distance between the test antenna 2 and the measurement probe 3 is changed using the measurement distance variable mechanism 8 and the measurement distance controller 9, and the pattern calculation processor 10 is used. Performs a Fourier transform of the received electric field with respect to the measurement distance, extracts a component independent of the distance from the obtained spectrum component, and estimates a measurement value from which a measurement error has been removed. From the other spectrum components, the wave source of the surrounding reflected wave is estimated, that is, the measurement error is evaluated. The reason for changing the measurement distance is to change the amplitude and phase of the measurement error component by changing the surrounding environment. Therefore, measurement accuracy is improved by measuring the electric field a plurality of times under different conditions.

FIG. 12 is a block diagram showing a conventional apparatus (hereinafter referred to as conventional apparatus 2) different from the conventional apparatus 1. In the figure, the same reference numerals as those in FIG. 11 denote the same or corresponding parts, and a description thereof will be omitted. Reference numeral 11 denotes a power receiver that extracts only the amplitude component of the electric field received by the measurement probe 3 as a reception signal. Reference numeral 12 reconstructs a phase pattern by repeated calculation from power measurement values when the measurement distance is z = z1 and z2. It is a phase pattern restorer. In addition, the conventional device 2
"Far-field pattern pattern
ination from the near-fie
ld amplitude on two surfa
ce, “IEEE Trans., Antennas”
Propagat. , Vol. AP-38, no. 1
1, pp. 1772-1779, Nov. 1990.

Next, the operation will be described. The radio wave transmitted from the transmitter 1 is radiated from the test antenna 2. The radio wave radiated into this space is received by the measurement probe 3 and taken out by the power receiver 11 as a reception signal.

[0008] However, the received signal does not include the phase but only the amplitude of the electric field. The reason why the phase is not measured is that, in the measurement in the millimeter wave or the submillimeter wave, the phase fluctuation is large, so that the error is large and it is easy to measure only the power. However, in order to determine the far radiation pattern by field conversion, not only the amplitude of the near electric field,
A phase is also required. Therefore, the measurement distance variable mechanism 8 and the measurement distance controller 9 use different measurement distances z = z
The amplitude distribution of the two-dimensional electric field is measured at 1 and z2, and the phase pattern is estimated by the phase pattern restorer 12.

According to the measured value and the estimated phase pattern,
A far radiation pattern is obtained. When the planar scanner 5 that measures a two-dimensional distribution on a plane is used, a far-field radiation pattern is obtained from a nearby electric field by a plane wave expansion method. FIG.
The operation principle of the phase pattern restorer 12 based on the measurement distance will be described with reference to FIG.

First, an amplitude measurement value is obtained at z = z1 (step ST1), an initial value of the phase distribution is assumed by calculation, and a two-dimensional electric field distribution at z = z1 is assumed (step ST2). From the two-dimensional electric field distribution at the position of z = z1, the two-dimensional electric field distribution at the position of z = z2 is calculated by the plane wave expansion method, and the phase distribution at z = z2 is obtained (step ST3).

A measured value is used as the amplitude distribution at the position of z = z2 (step ST4), and a two-dimensional electric field distribution at z = z2 is assumed (step ST5). This z =
From the two-dimensional electric field distribution at the position z2, the two-dimensional electric field distribution at the position z = z1 is calculated by the plane wave expansion method, and z =
The phase distribution at the position of z1 is obtained (step ST6).

The difference between this phase distribution and the phase distribution assumed as the initial value is obtained. By repeating the above-described arithmetic processing, the difference between the phase distributions is made sufficiently small, and the phase distribution at that time is used as an estimated value (steps ST7 to ST9).
Since the two-dimensional electric field distribution can be obtained from the estimated phase distribution value and the measured amplitude distribution value, the far radiation pattern can be obtained by the plane wave expansion method. The phase is restored by measuring the electric field amplitude twice under different conditions. In other words, an error due to a phase change occurring in the millimeter wave or the submillimeter wave is removed, and the measurement accuracy is improved.

[0013]

Since the conventional antenna measuring apparatus is configured as described above, in the case of the conventional apparatus 1, a large number of electric fields must be measured under different measuring distances. When the measurement of the two-dimensional electric field distribution is required as in the near-field measurement, a large number of two-dimensional electric field distributions must be measured, so that there is a problem that the measurement requires a long time. In the case of the conventional device 2, the amplitude of the electric field has to be measured two-dimensionally twice under the condition that the measurement distance is different. In addition, the conventional devices 1 and 2 require a device for changing the measurement distance,
Driving accuracy when varying the measurement distance requires high accuracy according to the measurement wavelength. Therefore, an extremely high-precision driving device is required for the millimeter wave and the submillimeter wave, and there has been a problem that the manufacturing cost is increased.

SUMMARY OF THE INVENTION The present invention has been made to solve the above problems, and an antenna measuring apparatus and an antenna capable of performing high-accuracy measurement in a short time without providing a driving device for varying a measuring distance. The aim is to obtain a measuring method.

[0015]

The antenna measuring apparatus according to the present invention converts the amplitude distribution and the phase distribution of the two-dimensional electric field measured by the measuring means into a virtual wave source position of an unnecessary wave, and converts the field distribution into the two. An unnecessary wave removing means for calculating an unnecessary wave component included in the amplitude distribution and the phase distribution of the two-dimensional electric field and removing the unnecessary wave component from the amplitude distribution and the phase distribution of the two-dimensional electric field is provided.

The antenna measuring apparatus according to the present invention converts the amplitude distribution of the two-dimensional electric field measured by the measuring means to the position of the aperture surface of the antenna under test, and makes the amplitude distribution of the outer region on the aperture surface zero. The amplitude distribution replacing means to be replaced and the phase estimating means for converting the amplitude distribution of the two-dimensional electric field after the replacement into the position of the measuring surface of the probe in the measuring means and estimating the phase distribution on the measuring surface are provided. is there.

The antenna measuring apparatus according to the present invention converts the amplitude distribution and the phase distribution of the two-dimensional radiated electric field measured by the measuring means into a field of the aperture surface of the antenna under test, and the amplitude of the outer region on the aperture surface. An electric field replacing means for replacing the distribution and the phase distribution with zero, and a field conversion of the amplitude distribution and the phase distribution of the two-dimensional radiated electric field after the replacement into a measurement surface position of the measurement probe to thereby determine a measurement angle range of the measurement probe. Electric field estimating means for estimating the amplitude distribution and the phase distribution of the outer region.

The antenna measuring apparatus according to the present invention converts the amplitude distribution of the two-dimensional radiated electric field measured by the measuring means to the position of the aperture surface of the antenna under test, and reduces the amplitude distribution of the outer region on the aperture surface to zero. And a field conversion of the amplitude distribution of the two-dimensional radiated electric field after the replacement into the measurement surface position of the measurement probe,
Phase estimating means for estimating a phase distribution on the measurement surface.

According to the antenna measuring method of the present invention, the amplitude distribution and the phase distribution of the two-dimensional electric field are field-converted into the virtual wave source position of the unnecessary wave, and the unnecessary distribution included in the amplitude distribution and the phase distribution of the two-dimensional electric field is converted. The wave component is calculated, and unnecessary wave components are removed from the amplitude distribution and the phase distribution of the two-dimensional electric field.

In the antenna measuring method according to the present invention, the amplitude distribution of the two-dimensional electric field is field-converted to the position of the aperture of the antenna under test, and the amplitude distribution of the outer region in the aperture is replaced with zero. The amplitude distribution of the two-dimensional electric field is field-converted to the position of the measurement surface of the measurement probe, and the phase distribution on the measurement surface is estimated.

In the antenna measuring method according to the present invention, the amplitude distribution and the phase distribution of the two-dimensional radiated electric field are field-converted into the position of the aperture surface of the test antenna, and the amplitude distribution and the phase distribution of the outer region on the aperture surface are reduced to zero. And the field distribution of the amplitude distribution and phase distribution of the two-dimensional radiated electric field after the substitution into the measurement surface position of the measurement probe to estimate the amplitude distribution and phase distribution of the measurement probe outside the measurement angle range. It is something to do.

In the antenna measuring method according to the present invention, the amplitude distribution of the two-dimensional radiated electric field is field-converted to the position of the opening of the antenna under test, and the amplitude distribution of the outer region on the opening is replaced with zero. The field distribution of the amplitude distribution of the two-dimensional radiated electric field is converted to the position of the measurement surface of the measurement probe, and the phase distribution on the measurement surface is estimated.

[0023]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described below. Embodiment 1 FIG. FIG. 1 is a block diagram showing an antenna measuring apparatus according to Embodiment 1 of the present invention.
Is a transmitter for transmitting radio waves to the test antenna 22; 22 is a test antenna connected to the transmitter 21 for radiating the radio waves transmitted from the transmitter 21 into space; and 23 is the test antenna 22
Is a measuring probe for measuring the amplitude distribution and the phase distribution of the two-dimensional electric field at a position near the measuring probe.
Is a receiver that takes in the amplitude distribution and phase distribution of the two-dimensional electric field measured by the above as a received signal. Note that a measuring means is constituted by the measuring probe 23 and the receiver 24.

Reference numeral 25 denotes a flat scanner that scans the measurement probe 23 in two dimensions, 26 denotes a scanner controller that controls the scanning of the flat scanner 25, 27 denotes a pattern display that stores and visualizes a two-dimensional electric field, and 28 denotes a pattern display. The field distribution of the amplitude distribution and the phase distribution of the two-dimensional electric field is converted into the virtual wave source position of the unnecessary wave, and the unnecessary wave components included in the amplitude distribution and the phase distribution of the two-dimensional electric field are calculated, and the amplitude distribution of the two-dimensional electric field is calculated. An unnecessary wave removal processor (unnecessary wave removing means) for removing unnecessary wave components from the phase distribution, 29 is a scan of the flat scanner 25 in the x direction, and 30 is a scan of the flat scanner 25 in the y direction. FIG. 2 is a flowchart showing an antenna measuring method according to the first embodiment of the present invention.

Next, the operation will be described. The radio wave transmitted from the transmitter 21 is radiated from the test antenna 22.
The radio wave radiated into this space is received by the measurement probe 23 and taken out by the receiver 24 as a reception signal.

That is, the two-dimensional electric field distribution is received by the scanning 29 in the x direction and the scanning 30 in the y direction by the flat scanner 25 of the measuring probe 23 (step ST11).
Hereinafter, with reference to FIG.
The principle of removing unnecessary wave components from a received signal will be described.

First, assuming that the measurement surface of the measurement probe 23 is z = zm, the unnecessary wave removal arithmetic processor 28 measures a two-dimensional electric field distribution (amplitude distribution and phase distribution of the two-dimensional electric field) by a plane wave expansion method. The value is field-converted to a position (z = 0) on a plane including the aperture of the test antenna 22 to obtain a two-dimensional electric field distribution on the aperture of the test antenna 22 (step ST12).

Then, the unnecessary wave removal processor 28 changes the electric field (amplitude and phase) outside the aperture surface of the antenna under test 22 to 0, and obtains the electric field distribution inside the aperture surface (step ST13). . On the other hand, in order to obtain an unnecessary wave component included in the received signal, the electric field (amplitude, phase) inside the aperture surface of the antenna under test 22 is changed to 0, and the wave source of the unnecessary wave in the negative direction of z is obtained by the plane wave expansion method. Position (z =
zi) (step ST14). Here, since the wave source position of the unnecessary wave can be estimated by the beam waist, z = zi is set to the beam waist position. Although there is actually no wave source in this portion, it is considered that there is a virtual unnecessary wave source, so it will be referred to as an unnecessary wave image.

The unnecessary wave removal arithmetic processing unit 28 sets the electric field (amplitude and phase), which is the image of the unnecessary wave, to 0 in the two-dimensional electric field distribution field-transformed to the position of z = zi, and sets the position of z = zi. Z = 0 again from the two-dimensional electric field distribution at
, And the electric field distribution outside the aperture plane in the test antenna 22 is estimated (step ST1).
5).

Then, the unnecessary wave removal processor 28 combines the estimated value of the electric field distribution outside the aperture surface of the antenna under test 22 with the electric field distribution inside the aperture surface of the antenna under test 22 previously obtained. Then, a two-dimensional electric field distribution on the aperture surface of the test antenna 22 from which the unnecessary wave component has been removed is obtained (step ST16). Thus, the far-field radiation pattern can be obtained by performing field conversion by the plane wave expansion method without changing the distance between the test antenna 22 and the measurement probe 23.

FIG. 4 shows the results obtained by actual measurement. FIG. 4A shows the results in a horizontal plane and a vertical plane containing unnecessary waves obtained by direct field conversion from near-field measurement in an anechoic chamber. FIG. 6B shows a far-field radiation pattern in a horizontal plane and a vertical plane obtained by actually performing measurement in an anechoic chamber according to the first embodiment and performing field conversion.

For comparison, a distant radiation pattern in a horizontal plane measured directly in the far field by selecting an outdoor with a good measurement environment is shown by a dotted line. In FIG. 3A, the shape of the main beam is largely changed by the influence of the unnecessary wave, whereas in FIG. 3B, the main beam is in good agreement with the dotted line, and the unnecessary wave is removed. I understand.

As is clear from the above, the first embodiment
According to the above, the amplitude distribution and the phase distribution of the two-dimensional electric field are field-converted into the virtual wave source positions of the unnecessary waves, and the unnecessary wave components included in the amplitude distribution and the phase distribution of the two-dimensional electric field are calculated. Since the configuration is such that unnecessary wave components are removed from the amplitude distribution and the phase distribution of the dimensional electric field, there is an effect that high-precision measurement can be performed in a short time without providing a driving device for varying the measurement distance.

Embodiment 2 FIG. 5 is a configuration diagram showing an antenna measuring apparatus according to Embodiment 2 of the present invention. In the figure, the same reference numerals as those in FIG. 1 denote the same or corresponding parts, and a description thereof will be omitted. Numeral 31 denotes a power receiver (measuring means) for taking in the amplitude distribution of the two-dimensional electric field measured by the measuring probe 23 as a received signal, and numeral 32 denotes the amplitude distribution of the two-dimensional electric field output by the power receiver 31 of the antenna 22 under test. The field distribution is converted to the position of the opening surface to replace the amplitude distribution of the outer region in the opening surface with zero, and the amplitude distribution of the two-dimensional electric field after the substitution is field-converted to the position of the measurement surface of the measurement probe 23. It is a neighboring phase pattern restorer (amplitude distribution replacement means, phase estimation means) for estimating the phase distribution on the measurement plane. FIG. 6 is a flowchart showing an antenna measuring method according to Embodiment 2 of the present invention.

Next, the operation will be described. The radio wave transmitted from the transmitter 21 is radiated from the test antenna 22.
The radio wave radiated into this space is received by the measurement probe 23, and only the power (amplitude distribution) of the received electric field distribution is extracted as a signal by the power receiver 31.

The principle by which the near-phase pattern restorer 32 estimates the near-field phase pattern will be described below. First, when obtaining the amplitude measurement value at z = z1 (step ST21), the neighboring phase pattern restorer 32 assumes an initial value of the phase distribution by calculation, and assumes a two-dimensional electric field distribution (amplitude distribution) at z = z1. I do.

Then, the neighboring phase pattern restorer 32
From the two-dimensional electric field distribution at the position of z = z1, a two-dimensional electric field distribution at the position of z = 0 including the aperture of the test antenna 22 is calculated by the plane wave expansion method (step ST22).
The near-phase pattern restorer 32 changes the electric field (amplitude) of the area outside the aperture surface of the test antenna 22 to 0 (step ST23), performs field conversion to the position of z = z1 by the plane wave expansion method, and sets z = z1. The two-dimensional electric field distribution at the position of z1 is calculated, and the phase distribution at the position of z = z1 is obtained (step ST24).

The difference between this phase distribution and the phase distribution assumed as the initial value is determined. By repeating the above-described arithmetic processing, the difference between the phase distributions is sufficiently reduced, and the converged phase distribution is used as an estimated value (steps ST25 to ST2).
7). From the phase distribution estimation value and the amplitude distribution measurement value, z = z
Since the two-dimensional electric field distribution of 1 is obtained, the far radiation pattern can be obtained by the plane wave expansion method. As a result, an error due to a phase change occurring in the millimeter wave or the submillimeter wave is removed, and the measurement accuracy can be improved.

As is clear from the above, the second embodiment
According to the above, the amplitude distribution of the two-dimensional electric field is field-transformed to the position of the opening surface of the test antenna 22, the amplitude distribution of the outer region in the opening surface is replaced with zero, and the amplitude distribution of the two-dimensional electric field after the replacement is changed. Since the field distribution is converted to the measurement surface position of the measurement probe 23 and the phase distribution on the measurement surface is estimated, the phase distribution on the measurement surface of the measurement probe 23 can be reduced without providing a driving device for varying the measurement distance. The distribution can be estimated, and as a result, there is an effect that highly accurate measurement can be performed in a short time.

Embodiment 3 FIG. 7 is a configuration diagram showing an antenna measuring apparatus according to Embodiment 3 of the present invention. In the figure, the same reference numerals as those in FIG. 1 denote the same or corresponding parts, and a description thereof will be omitted. 41 is equipped with a test antenna 22,
A turntable for changing the posture with two axes, a turntable controller for controlling the drive of the turntable 41, an elevation scan of the turntable 41,
44 is an azimuth scan of the turntable 41, 45 is a field conversion of the amplitude distribution and the phase distribution of the two-dimensional radiated electric field output from the receiver 24 to the position of the opening surface of the test antenna 22, and In addition to replacing the amplitude distribution and the phase distribution with zero, the amplitude distribution and the phase distribution of the two-dimensional radiated electric field after the substitution are field-converted to the measurement surface position of the measurement probe 23, and the measurement angle range of the measurement probe 23 is changed. It is a resolution restorer (electric field replacement means, electric field estimation means) for estimating the amplitude distribution and the phase distribution of the outer region.

Next, the operation will be described. The radio wave transmitted from the transmitter 21 is radiated from the measurement probe 23. The radio wave radiated into this space is received by the test antenna 22 and taken out by the receiver 24 as a received signal.

By changing the attitude of the turntable 41 in two axes by the elevation scan 43 and the azimuth scan 44, the two-dimensional radiated electric field distribution (amplitude distribution and phase distribution) of the test antenna 22 is measured. The measurement angle range is finite taking into account the effects of ambient reflection and the measurement time.

The resolution restoring unit 45 estimates the radiated electric field in the angle range outside the measurement range from the measured value of the two-dimensional radiated electric field distribution, and acquires an aperture distribution with improved spatial resolution.
Hereinafter, the principle of improving the resolution on the aperture surface by the resolution restorer 45 will be described with reference to FIG.

First, the resolution restoration unit 45 calculates the distance R = Rm
The two-dimensional radiated electric field distribution (amplitude distribution and phase distribution) is measured on the spherical surface at. An initial value 0 is assumed as the radiation electric field in the region outside the measurement angle range. The two-dimensional radiated electric field distribution (including the initial value) in an angle range wider than the measurement angle range is field-transformed to the position of the aperture of the antenna 22 under test by the plane wave expansion method, and the in-plane including the aperture of the antenna 22 is measured. An aperture plane electric field distribution at z = 0 is obtained.

The resolution restoring unit 45 changes the electric field in the area outside the aperture surface of the antenna under test 22 to zero,
Again, field conversion is performed by the plane wave expansion method, and R = R
The radiation electric field distribution on the m spherical surface is obtained, and the radiation electric field distribution outside the measurement angle range is estimated. The resolution restoration unit 45 combines the estimated radiated electric field distribution and the measured radiated electric field distribution, and performs the arithmetic processing indicated by the thick arrow in the same figure until the estimated radiated electric field distribution outside the measurement angle range converges. Repeat.
Since the wide-angle electric field distribution is not affected by the ambient reflection due to such an estimated value, a high-resolution aperture plane distribution can be more accurately obtained based on this.

As is apparent from the above, the third embodiment
According to the method, the amplitude distribution and the phase distribution of the two-dimensional radiated electric field are field-converted to the position of the aperture surface of the test antenna 22, and the amplitude distribution and the phase distribution of the outer region on the aperture surface are replaced with zero. The amplitude distribution and the phase distribution of the two-dimensional radiated electric field are field-converted to the measurement surface position of the measurement probe 23, and the amplitude distribution and the phase distribution of the measurement probe 23 in the region outside the measurement angle range are estimated. Therefore, there is an effect that high-precision measurement can be performed in a short time without providing a driving device that varies the measurement distance.

Embodiment 4 FIG. 9 is a configuration diagram showing an antenna measuring apparatus according to Embodiment 4 of the present invention. In the figure, the same reference numerals as those in FIG. 7 denote the same or corresponding parts, and a description thereof will be omitted. 46 is the output 2 from the power receiver 31
The amplitude distribution of the three-dimensional radiated electric field is field-converted to the position of the opening surface of the test antenna 22, and the amplitude distribution of the outer region on the opening surface is replaced with zero.
A distant phase pattern restorer (amplitude distribution replacing means, phase estimating means) which converts the amplitude distribution of the two-dimensional radiation electric field into a field position of the measurement surface of the measurement probe 23 and estimates a phase distribution on the measurement surface. FIG. 10 is a flowchart showing an antenna measuring method according to Embodiment 4 of the present invention.

Next, the operation will be described. The radio wave transmitted from the transmitter 21 is radiated from the measurement probe 23. The radio wave radiated into this space is received by the test antenna 22, and only the power (amplitude distribution) of the received electric field is taken out as a signal by the power receiver 31. By changing the attitude of the turntable 41 in two axes by the elevation scan 43 and the azimuth scan 44, the two-dimensional electric field amplitude radiation pattern of the test antenna 22 is measured.

The principle by which the far-phase pattern reconstructor 46 estimates the far-field phase pattern will be described below. First, when obtaining the amplitude measurement value at R = R1 (step ST31), the distant phase pattern reconstructor 46 assumes the initial value of the phase distribution by calculation, and assumes the two-dimensional radiated electric field distribution at R = R1.

The distant phase pattern restorer 46
From the two-dimensional radiated electric field distribution at the position of R = R1, the two-dimensional radiated electric field distribution at the position of z = 0 including the aperture of the test antenna 22 is calculated by the plane wave expansion method (step ST).
32). The remote phase pattern restorer 46 changes the electric field (amplitude) of the area outside the aperture surface of the antenna under test 22 to 0 (step ST33), and R =
The field is converted to the position of R1, the two-dimensional radiated electric field distribution at the position of R = R1 is calculated, and the phase distribution at the position of R = R1 is obtained (step ST34).

The difference between this phase distribution and the phase distribution assumed as the initial value is obtained. By repeating the above-described arithmetic processing, the difference between the phase distributions is made sufficiently small, and the converged phase distribution is used as an estimated value (steps ST35 to ST3).
7). From the phase distribution estimation value and the amplitude distribution measurement value, R = R
Since the two-dimensional electric field distribution of 1 can be obtained, the aperture electric field distribution can be obtained by the plane wave expansion method. As a result, an error due to a phase change occurring in the millimeter wave or the submillimeter wave is removed, and the measurement accuracy can be improved.

As is clear from the above, this embodiment 4
According to the test antenna 2
2, the amplitude distribution of the outer region in the opening surface is replaced with zero, and the amplitude distribution of the two-dimensional radiated electric field after the replacement is field-converted to the measurement surface position of the measurement probe 23. Since the configuration is such that the phase distribution on the measurement surface is estimated, the phase distribution on the measurement surface of the measurement probe 23 can be estimated without providing a driving device that varies the measurement distance. As a result, This has the effect that highly accurate measurement can be performed in a short time.

[0053]

As described above, according to the present invention, the amplitude distribution and the phase distribution of the two-dimensional electric field measured by the measuring means are field-converted into the virtual wave source position of the unnecessary wave,
The configuration is such that unnecessary wave components included in the amplitude distribution and the phase distribution of the two-dimensional electric field are calculated, and unnecessary wave removing means for removing unnecessary wave components from the amplitude distribution and the phase distribution of the two-dimensional electric field is provided. There is an effect that highly accurate measurement can be performed in a short time without providing a driving device that changes the distance.

According to the present invention, the amplitude distribution of the two-dimensional electric field measured by the measuring means is field-converted into the position of the aperture surface of the antenna under test, and the amplitude distribution of the outer region in the aperture surface is replaced with zero. Since the replacement means and the phase estimation means for converting the amplitude distribution of the two-dimensional electric field after the replacement into the position of the measurement surface of the probe in the measurement means and estimating the phase distribution on the measurement surface are provided, The phase distribution on the measurement surface of the measurement probe can be estimated without providing a driving device that varies the measurement distance, and as a result, there is an effect that highly accurate measurement can be performed in a short time.

According to the present invention, the amplitude distribution and the phase distribution of the two-dimensional radiated electric field measured by the measuring means are field-converted to the position of the aperture surface of the antenna under test, and the amplitude distribution and the phase of the outer region in the aperture surface are measured. Electric field replacement means for replacing the distribution with zero, and field conversion of the amplitude distribution and the phase distribution of the two-dimensional radiated electric field after the replacement into the measurement surface position of the measurement probe, and Since the configuration is such that the electric field estimating means for estimating the amplitude distribution and the phase distribution is provided, there is an effect that high-precision measurement can be performed in a short time without providing a driving device for varying the measurement distance.

According to the present invention, the amplitude distribution of the two-dimensional radiated electric field measured by the measuring means is field-converted into the position of the aperture surface of the antenna under test, and the amplitude distribution of the outer region in the aperture surface is replaced with zero. Since the configuration is such that the distribution replacing means and the phase estimating means for field-converting the amplitude distribution of the two-dimensional radiated electric field after the replacement into the measurement surface position of the measurement probe and estimating the phase distribution on the measurement surface are provided. It is possible to estimate the phase distribution on the measurement surface of the measurement probe without providing a driving device that varies the measurement distance, and as a result, there is an effect that highly accurate measurement can be performed in a short time. .

According to the present invention, the amplitude distribution and the phase distribution of the two-dimensional electric field are field-transformed into the virtual wave source position of the unnecessary wave, and the unnecessary wave components included in the amplitude distribution and the phase distribution of the two-dimensional electric field are converted. It is configured to calculate and remove unnecessary wave components from the amplitude distribution and the phase distribution of the two-dimensional electric field. Therefore, without providing a driving device for varying the measurement distance,
There is an effect that highly accurate measurement can be performed in a short time.

According to the present invention, the amplitude distribution of the two-dimensional electric field is field-converted into the position of the aperture surface of the antenna under test, and the amplitude distribution of the outer region on the aperture surface is replaced with zero.
Since the amplitude distribution of the two-dimensional electric field after the replacement is field-converted to the position of the measurement surface of the measurement probe and the phase distribution on the measurement surface is estimated, there is no need to provide a driving device for varying the measurement distance. In addition, the phase distribution on the measurement surface of the measurement probe can be estimated, and as a result, there is an effect that highly accurate measurement can be performed in a short time.

According to the present invention, the amplitude distribution and the phase distribution of the two-dimensional radiated electric field are field-transformed to the position of the aperture surface of the test antenna, and the amplitude distribution and the phase distribution of the outer region on the aperture surface are replaced with zero. The amplitude distribution and the phase distribution of the two-dimensional radiated electric field after the replacement are field-converted to the measurement surface position of the measurement probe, and the amplitude distribution and the phase distribution of the measurement probe in the region outside the measurement angle range are estimated. With this configuration, there is an effect that high-precision measurement can be performed in a short time without providing a driving device that varies a measurement distance.

According to the present invention, the amplitude distribution of the two-dimensional radiated electric field is field-converted to the position of the aperture surface of the test antenna, the amplitude distribution of the outer region on the aperture surface is replaced with zero, The field distribution of the amplitude distribution of the radiated electric field is converted to the position of the measurement surface of the measurement probe, and the phase distribution on the measurement surface is estimated.Therefore, without providing a driving device for varying the measurement distance, the measurement probe The phase distribution on the measurement surface can be estimated, and as a result, there is an effect that highly accurate measurement can be performed in a short time.

[Brief description of the drawings]

FIG. 1 is a configuration diagram illustrating an antenna measurement device according to a first embodiment of the present invention.

FIG. 2 is a flowchart showing an antenna measuring method according to the first embodiment of the present invention.

FIG. 3 is an explanatory diagram showing an operation principle of an unnecessary wave removal arithmetic processing unit.

FIG. 4 is a graph showing a far radiation pattern in a horizontal plane and a vertical plane.

FIG. 5 is a configuration diagram illustrating an antenna measurement device according to a second embodiment of the present invention.

FIG. 6 is a flowchart illustrating an antenna measuring method according to a second embodiment of the present invention.

FIG. 7 is a configuration diagram illustrating an antenna measurement device according to a third embodiment of the present invention.

FIG. 8 is an explanatory diagram showing the operation principle of the resolution restoration device.

FIG. 9 is a configuration diagram showing an antenna measurement device according to a fourth embodiment of the present invention.

FIG. 10 is a flowchart illustrating an antenna measuring method according to a fourth embodiment of the present invention.

FIG. 11 is a configuration diagram showing a conventional antenna measuring device.

FIG. 12 is a configuration diagram showing a conventional antenna measuring device.

FIG. 13 is a flowchart showing the operation of the conventional antenna measuring device.

[Explanation of symbols]

Reference Signs List 21 transmitter, 22 antenna under test, 23 probe for measurement (measuring means), 24 receiver (measuring means), 25
Plane scanner, 26 scanner controller, 27 pattern display, 28 unnecessary wave removal arithmetic processing unit (unnecessary wave removal means), 29 scanning of plane scanner 25 in x direction, 30
Scanning in the y direction of the plane scanner 25, 31 power receiver (measuring means), 32 neighboring phase pattern reconstructor (amplitude distribution replacement means, phase estimating means), 41 turntable, 42 turntable controller, 43 turntable 41 Elevation scan, 44 turntable 4
1 azimuth scan, 45 resolution reconstructor (electric field replacement means,
Electric field estimation means), 46 distant phase pattern restorer (amplitude distribution replacement means, phase estimation means).

Claims (8)

[Claims] A measuring means for measuring an amplitude distribution and a phase distribution of a two-dimensional electric field in the vicinity of a test antenna; Unnecessary wave removing means for performing field conversion to a proper wave source position, calculating unnecessary wave components included in the amplitude distribution and phase distribution of the two-dimensional electric field, and removing unnecessary wave components from the amplitude distribution and phase distribution of the two-dimensional electric field An antenna measuring device comprising: 2. A measuring means for measuring an amplitude distribution of a two-dimensional electric field at a position near the antenna under test, and a field conversion of the amplitude distribution of the two-dimensional electric field measured by the measuring means into an aperture position of the antenna under test. And an amplitude distribution replacement means for replacing the amplitude distribution of the outer region on the opening surface with zero, and a field conversion of the amplitude distribution of the two-dimensional electric field after replacement by the amplitude distribution replacement means into a measurement surface position of the probe in the measurement means. And a phase estimating means for estimating a phase distribution on the measurement surface. 3. A measuring means for measuring an amplitude distribution and a phase distribution of a two-dimensional radiated electric field of the antenna under test, and an amplitude distribution and a phase distribution of the two-dimensional radiated electric field measured by the measuring means, the aperture of the antenna under test. An electric field replacing means for performing field conversion to a surface position and replacing the amplitude distribution and the phase distribution of the outer region in the opening plane with zero, and measuring the amplitude distribution and the phase distribution of the two-dimensional radiated electric field after the replacement by the electric field replacing means. Field conversion to the measurement surface position of the probe,
An antenna measuring apparatus comprising: an electric field estimating means for estimating an amplitude distribution and a phase distribution in a region outside a measurement angle range in the measurement probe. 4. A measuring means for measuring an amplitude distribution of a two-dimensional radiated electric field of the antenna under test, and a field conversion of the amplitude distribution of the two-dimensional radiated electric field measured by the measuring means into an aperture position of the antenna under test. Amplitude distribution replacing means for replacing the amplitude distribution of the outer region on the opening surface with zero,
An antenna measuring apparatus comprising: a phase estimating means for performing field conversion of an amplitude distribution of a two-dimensional radiated electric field after replacement by the amplitude distribution replacing means to a measurement surface position of a measurement probe and estimating a phase distribution on the measurement surface. 5. When the amplitude distribution and the phase distribution of the two-dimensional electric field in the vicinity of the antenna under test are measured, the amplitude distribution and the phase distribution of the two-dimensional electric field are field-transformed into a virtual source position of an unnecessary wave. An antenna measurement method for calculating an unnecessary wave component included in the amplitude distribution and the phase distribution of the two-dimensional electric field and removing the unnecessary wave component from the amplitude distribution and the phase distribution of the two-dimensional electric field. 6. When the amplitude distribution of a two-dimensional electric field in the vicinity of the antenna under test is measured, the amplitude distribution of the two-dimensional electric field is field-converted into the position of the aperture surface of the antenna under test, and the outer area in the aperture surface is measured. An antenna measurement method in which the amplitude distribution of the two-dimensional electric field after the replacement is replaced with zero, and the amplitude distribution of the two-dimensional electric field after the replacement is field-transformed to the position of the measurement surface of the measurement probe to estimate the phase distribution on the measurement surface. 7. When the amplitude distribution and the phase distribution of the two-dimensional radiated electric field of the antenna under test are measured, the amplitude distribution and the phase distribution of the two-dimensional radiated electric field are field-converted into the aperture position of the antenna under test. The amplitude distribution and the phase distribution of the outer region in the aperture plane are replaced with zero, the amplitude distribution and the phase distribution of the two-dimensional radiated electric field after the substitution are field-transformed to the measurement surface position of the measurement probe, and the measurement at the measurement probe is performed. An antenna measurement method for estimating an amplitude distribution and a phase distribution in a region outside an angle range. 8. When the amplitude distribution of the two-dimensional radiated electric field of the antenna under test is measured, the amplitude distribution of the two-dimensional radiated electric field is field-converted into the position of the aperture of the antenna under test, and the outer area of the aperture is measured. An antenna measurement method in which the amplitude distribution is replaced with zero, the amplitude distribution of the two-dimensional radiated electric field after the replacement is field-transformed to the position of the measurement surface of the measurement probe, and the phase distribution on the measurement surface is estimated.